JPH09214698A - Light receiving element mounting location adjusting mechanism - Google Patents

Light receiving element mounting location adjusting mechanism

Info

Publication number
JPH09214698A
JPH09214698A JP8018594A JP1859496A JPH09214698A JP H09214698 A JPH09214698 A JP H09214698A JP 8018594 A JP8018594 A JP 8018594A JP 1859496 A JP1859496 A JP 1859496A JP H09214698 A JPH09214698 A JP H09214698A
Authority
JP
Japan
Prior art keywords
light receiving
receiving element
light
base
micrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP8018594A
Other languages
Japanese (ja)
Inventor
Akira Ito
明 伊東
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Engineering Ltd
Original Assignee
NEC Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Engineering Ltd filed Critical NEC Engineering Ltd
Priority to JP8018594A priority Critical patent/JPH09214698A/en
Publication of JPH09214698A publication Critical patent/JPH09214698A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To perform adjustment so that recording light may easily and accurately pass the center of the light receiving surface of a light receiving element, in addition to a writing starting location adjustment. SOLUTION: In a state that a fixing screw 21 is loosened, a movable bracket 18 is temporarily fastened. In this state, a polygon driving motor 6 is rotated and laser light is scanned. A state that the scanning surface of laser light is completely separated from a light receiving element 16 is made by turning a micrometer 28. The micrometer 28 is gradually moved from this state. After the value (x1) of the micrometer 28 in which a waveform starts to appear and the subsequent value (x2) of the micrometer 28 when the micrometer is moved till the waveform can not be observed are determined, the light receiving element 16 is adjusted to an optimum location by adjusting the micrometer 28 to the central value (x1+x2)/2 and fastening the fixing screw 21.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、例えば光ビームに
よる走査記録を行う画像記録装置に用いられ、走査毎に
光ビームの通過を検出し、その検出タイミングから書き
出し位置のタイミングを調整するための位相センサに係
り、特にその受光素子を最適位置に固定するための取付
位置調整機構に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is used, for example, in an image recording apparatus for performing scanning recording with a light beam, detects the passage of the light beam for each scanning, and adjusts the timing of the writing position from the detection timing. The present invention relates to a phase sensor, and more particularly to a mounting position adjusting mechanism for fixing the light receiving element at an optimum position.

【0002】[0002]

【従来の技術】一般に、画像データにより光ビームを変
調し走査することによってフィルム、印画紙等の感材に
画像を記録する画像記録装置にあっては、走査毎の書き
出し位置のタイミング調整に位相センサを用いている。
位相センサは、光ビームの走査範囲端部に受光素子を配
置し、この受光素子によって走査毎に光ビームの通過を
検出し、その検出タイミングを基準に画素クロックをカ
ウントするもので、このカウント値から走査毎の書き出
し位置を決定することができる。したがって、位相セン
サの受光素子の取付位置は、書き出し位置の精度に影響
するため、極めて高精度に調整する必要がある。
2. Description of the Related Art Generally, in an image recording apparatus for recording an image on a light-sensitive material such as a film or a photographic paper by modulating and scanning a light beam with image data, it is necessary to adjust the timing of a writing start position for each scanning. It uses a sensor.
The phase sensor has a light receiving element arranged at the end of the scanning range of the light beam, detects the passage of the light beam at each scanning by this light receiving element, and counts the pixel clock based on the detection timing. The write start position for each scan can be determined from. Therefore, the mounting position of the light receiving element of the phase sensor affects the accuracy of the writing start position, and it is necessary to adjust the position with extremely high accuracy.

【0003】この問題を解決する従来技術としては、特
開昭4−251814号公報(先行技術1)に上記位相
センサとして機能する走査開始位置センサを可動ブラケ
ットに実装して書き出し位置を調整できるようにするこ
とで、書き出し位置調整用の電気回路を不要とし、ま
た、位相センサを可動ブラケットに着脱自在に取り付け
るようにすることで、位相センサの交換、清掃を無調整
で行えるようにした「ラスタ走査装置」が開示されてい
る。
As a conventional technique for solving this problem, Japanese Patent Laid-Open Publication No. 4-251814 (Prior Art 1) discloses that a scanning start position sensor functioning as the phase sensor is mounted on a movable bracket so that a writing start position can be adjusted. This eliminates the need for an electric circuit for adjusting the writing position, and the phase sensor is detachably attached to the movable bracket so that the phase sensor can be replaced and cleaned without adjustment. A scanning device "is disclosed.

【0004】すなわち、この装置では、位相センサを着
脱自在のブラケットに取り付け、そのブラケットを可動
ブラケットに取り付ける。可動ブラケットは長穴により
可動できるようになっており、ねじで可動ブラケットを
仮止めし、位置調整後、ねじを締めて固定するようにし
ている。
That is, in this apparatus, the phase sensor is attached to a detachable bracket, and the bracket is attached to the movable bracket. The movable bracket can be moved by a long hole, and the movable bracket is temporarily fixed with a screw, and after adjusting the position, the screw is tightened and fixed.

【0005】その他、従来技術として、特開昭61−2
42160号公報(先行技術2)に、受光素子を走査方
向及び走査方向に直交する方向に移動することにより、
画像書込み同期光検出用受光素子を簡単かつ高い精度で
位置決めすることができ、カウンタ等を要せずに画像書
込みタイミングを決定可能にする「画像書込み同期光検
出装置」が開示されている。
[0005] In addition, as the prior art, Japanese Patent Laid-Open No. 61-2
No. 42160 (Prior Art 2), by moving a light receiving element in a scanning direction and a direction orthogonal to the scanning direction,
There is disclosed an "image writing synchronous light detection device" which can position a light receiving element for detecting the image writing synchronous light easily and with high accuracy and can determine an image writing timing without requiring a counter or the like.

【0006】また、実開平2−41219号公報(先行
技術3)に受光素子位置調整機構により受光素子をスラ
イドし、固定機構により固定することで、受光素子の固
定位置を調整でき、制御回路において遅延時間を調整す
る必要がなくなり、制御回路の回路構成を簡単化でき、
低廉性が向上する「光ビーム走査位置検出装置」が開示
されている。
Further, in Japanese Utility Model Application Laid-Open No. 2-41219 (Prior Art 3), the light receiving element position adjusting mechanism slides the light receiving element and the fixing mechanism fixes the fixed position of the light receiving element. There is no need to adjust the delay time, the circuit configuration of the control circuit can be simplified,
A "light beam scanning position detecting device" having improved low cost is disclosed.

【0007】しかしながら、上記のような先行技術1〜
3に示される従来技術の構成では、位相センサの受光素
子取付位置を調整できるようにしただけで、実際の位置
調整は目視で行わなければならない。実際に位置調整を
行うには、記録光が受光素子の受光面中央を通るように
調整する必要がある。このため、記録光が可視光でない
赤外光などの場合は、赤外線スコープ等の特別な装置が
必要となり、非常に調整が困難となる。また、可視光で
あっても、光量が少ない場合には同じように調整は困難
なものとなる。
However, the above-mentioned prior arts 1 to
In the configuration of the related art shown in FIG. 3, the light receiving element mounting position of the phase sensor is only adjusted, and the actual position adjustment must be performed visually. In order to actually adjust the position, it is necessary to adjust the recording light so as to pass through the center of the light receiving surface of the light receiving element. Therefore, when the recording light is infrared light that is not visible light, a special device such as an infrared scope is required, which makes adjustment very difficult. Further, even with visible light, if the amount of light is small, the adjustment becomes similarly difficult.

【0008】上記問題がない場合でも、位相センサの受
光素子は比較的小さいので、調整された位置でどれくら
いのマージンがあるかは目視で記録光が位相センサの受
光素子の外形上の位置で判断するしかなく、実際の受光
素子が有する規定感度の範囲とは異なってしまうという
問題がある。また、記録光がレーザ光であるため、パワ
ーが大きい場合には、目視の調整は失明の危険が伴い、
調整者の熟練が必要である。
Even if the above problem does not occur, since the light receiving element of the phase sensor is relatively small, the recording light is visually determined by the position on the outer shape of the light receiving element of the phase sensor to determine how much margin there is at the adjusted position. However, there is a problem that it is different from the range of the specified sensitivity of the actual light receiving element. Further, since the recording light is laser light, when the power is large, visual adjustment involves the risk of blindness,
Coordinator skill is required.

【0009】[0009]

【発明が解決しようとする課題】以上述べたように従来
の取付位置調整機構では、主に書き出し位置の調整によ
り電気回路の簡略化をメインとしていたが、そのために
記録光が受光素子の受光面中央を通るための微妙な調整
機能としての考慮が足りなかった。
As described above, in the conventional mounting position adjusting mechanism, the main purpose is to simplify the electric circuit by adjusting the writing position. Therefore, the recording light is the light receiving surface of the light receiving element. There was not enough consideration as a subtle adjustment function for passing through the center.

【0010】本発明の課題は、上記の問題を解決し、書
き出し位置の調整のみならず、記録光が簡単にかつ精度
よく受光素子の受光面中央を通るように調整できる受光
素子取付位置調整機構を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems and not only adjust the writing position but also adjust the recording light so that the recording light can easily and accurately pass through the center of the light receiving surface of the light receiving element. To provide.

【0011】[0011]

【課題を解決するための手段】上記の課題を解決するた
めに本発明は、走査光が受光面の中央を通過するように
受光素子の取付位置を調整する受光素子取付位置調整機
構において、前記受光素子が基台上に載置され、当該基
台を前記走査光に対して垂直方向に可動自在な可動ブラ
ケットと、前記可動ブラケットの基台を定量的に微動す
る微動機構と、この微動機構により可動ブラケットの基
台を移動させたときに、前記受光面が走査光を横切る間
の受光素子出力のピークレベルの変化と移動量を計測す
る計測手段と、この計測手段で得られた計測結果から前
記受光素子の最適位置を判別する最適位置判別手段とを
具備し、前記受光素子が前記最適位置判別手段で判別さ
れた位置にくるように前記微動機構を通じて前記基台の
位置調整を行うようにしたものである。
In order to solve the above problems, the present invention provides a light receiving element mounting position adjusting mechanism for adjusting the mounting position of a light receiving element so that scanning light passes through the center of a light receiving surface. A light-receiving element is mounted on a base, a movable bracket that can move the base vertically with respect to the scanning light, a fine movement mechanism that quantitatively finely moves the base of the movable bracket, and this fine movement mechanism. When the base of the movable bracket is moved by the measuring means for measuring the change in the peak level of the light receiving element output and the amount of movement while the light receiving surface traverses the scanning light, the measurement result obtained by this measuring means. From the optimum position determining means for determining the optimum position of the light receiving element, the position of the base is adjusted through the fine movement mechanism so that the light receiving element comes to the position determined by the optimum position determining means. It is obtained by the.

【0012】特に、前記微動機構は、マイクロメータを
用いて前記可動ブラケットの基台を移動させることを特
徴とする。
In particular, the fine movement mechanism is characterized in that the base of the movable bracket is moved by using a micrometer.

【0013】また、前記可動ブラケットは、前記基台に
前記走査光に対して一垂直方向に弾性力を与える弾性部
材と、前記受光素子が最適位置にきたとき前記基台を固
定する固定手段とを備え、前記微動機構は、前記弾性力
に抗して前記可動ブラケットの基台を押圧移動させるこ
とを特徴とする。
Also, the movable bracket includes an elastic member for applying an elastic force to the base in a direction perpendicular to the scanning light, and a fixing means for fixing the base when the light receiving element reaches an optimum position. The fine movement mechanism presses the base of the movable bracket against the elastic force.

【0014】さらに、前記最適位置判別手段は、前記受
光素子の出力が立ち上がってから立ち下がるまでの範囲
を求め、その中間位置を最適位置と判定することを特徴
とする。
Further, the optimum position discriminating means is characterized in that a range from the rise of the output of the light receiving element to the fall thereof is obtained, and the intermediate position thereof is decided as the optimum position.

【0015】[0015]

【作用】上記構成による受光素子取付位置調整機構で
は、受光素子からの信号をオシロスコープ等の測定で監
視し、徐々に微動機構で受光素子を移動させていけば、
どの範囲で受光素子が反応するかが把握でき、最終的に
は受光素子が受光し始める微動機構の調整値と受光素子
が反応しなくなる微動機構の調整値との中央の位置に受
光素子を位置調整すれば調整は終了する。
In the light-receiving element mounting position adjusting mechanism having the above structure, the signal from the light-receiving element is monitored by measurement with an oscilloscope, and the light-receiving element is gradually moved by the fine movement mechanism.
It is possible to know in what range the light receiving element responds, and finally position the light receiving element at the center position between the adjustment value of the fine movement mechanism where the light receiving element starts receiving light and the adjustment value of the fine movement mechanism where the light receiving element does not respond. If adjustment is done, the adjustment ends.

【0016】上記の方法により、目視での調整がいっさ
い必要なくなり、調整マージン、失明の危険性、微動機
構がないため、調整困難という問題が全て解決される。
The above method eliminates the need for any visual adjustment, and solves all the problems of difficulty in adjustment because there is no adjustment margin, the risk of blindness, and no fine movement mechanism.

【0017】[0017]

【発明の実施の形態】以下、図面を参照して本発明の一
実施形態を詳細に説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

【0018】図1は本発明が適用されるレーザによる走
査記録装置の一実施形態の構成を示す斜視図である。
FIG. 1 is a perspective view showing the configuration of an embodiment of a laser scanning recording apparatus to which the present invention is applied.

【0019】同図において、1は半導体レーザであり、
この半導体レーザ1から出射されるレーザ光はコリメー
タレンズ2で平行光に調整され、集光レンズ3で絞り込
まれ、反射ミラー4でポリゴンミラー5に導かれる。ポ
リゴンミラー5はポリゴン駆動モータ6により一定速度
で回転しており、レーザ光はfθレンズ7によって左右
に振られた形で反射される。
In the figure, 1 is a semiconductor laser,
Laser light emitted from the semiconductor laser 1 is adjusted to parallel light by a collimator lens 2, narrowed down by a condenser lens 3, and guided to a polygon mirror 5 by a reflection mirror 4. The polygon mirror 5 is rotated at a constant speed by the polygon drive motor 6, and the laser light is reflected by the fθ lens 7 in a form of being swung left and right.

【0020】fθレンズ7はレーザ光の移動速度を一定
にするためのものであり、反射ミラー8を経て記録紙9
に走査記録される。記録紙9は移動テーブル10に吸着
されており、移動テーブル10が移動することにより画
像を記録することができる。移動テーブル10は送りね
じ11に固定されており、副走査モータ12により副走
査方向に移動される。
The fθ lens 7 serves to keep the moving speed of the laser light constant, and passes through the reflection mirror 8 and the recording paper 9
Are scanned and recorded. The recording paper 9 is attracted to the moving table 10, and an image can be recorded by moving the moving table 10. The moving table 10 is fixed to the feed screw 11, and is moved in the sub scanning direction by the sub scanning motor 12.

【0021】各走査の書き出しタイミングは、ポリゴン
駆動モータ6の回転精度、ポリゴンミラー5の面精度等
の光学的要因などでずれないように、位相センサを用い
て走査毎にレーザ光を検出し、その検出時点から一定時
間後から書き出すように調整する必要がある。そのた
め、反射ミラー13で移動テーブル10の脇に配置され
た位相センサ部14にレーザ光を導いている。
A laser beam is detected for each scan using a phase sensor so that the writing timing of each scan does not shift due to optical factors such as the rotation accuracy of the polygon drive motor 6 and the surface accuracy of the polygon mirror 5. It is necessary to make adjustments so that the data is written out after a fixed time from the time of detection. Therefore, the reflection mirror 13 guides the laser light to the phase sensor unit 14 arranged beside the moving table 10.

【0022】この実施形態において、上記位相センサ部
14は、調整前は図2に示すようにレーザ光の走査面1
5が受光素子16の受光面中央と一致していない。この
ため、受光面の中央位置17を走査面15が通るように
受光素子16を移動する必要がある。そのために、図3
に示す可動ブラケット18に受光素子16を取り付け
る。
In this embodiment, the phase sensor unit 14 is adjusted by the laser beam scanning surface 1 before adjustment as shown in FIG.
5 does not coincide with the center of the light receiving surface of the light receiving element 16. Therefore, it is necessary to move the light receiving element 16 so that the scanning surface 15 passes through the center position 17 of the light receiving surface. To that end, FIG.
The light receiving element 16 is attached to the movable bracket 18 shown in FIG.

【0023】可動ブラケット18はベース20に長穴2
2を通して4本の固定ねじ21で取り付けられている。
また、可動ブラケット18のばね27とマイクロメータ
28の軸23によって左右に移動できるようになってい
る。マイクロメータ28は固定ブラケット24にねじ2
5で固定され、固定ブラケット24はねじ26でベース
20に固定される。
The movable bracket 18 has a base 20 and an elongated hole 2
It is attached with four fixing screws 21 through 2.
Further, the spring 27 of the movable bracket 18 and the shaft 23 of the micrometer 28 can be moved left and right. The micrometer 28 is fixed to the fixing bracket 24 with screws 2
The fixing bracket 24 is fixed to the base 20 with screws 26.

【0024】実際の調整手順を図3から図5を用いて説
明する。
The actual adjustment procedure will be described with reference to FIGS. 3 to 5.

【0025】まず、最初に可動ブラケット18を止めて
いる固定ねじ21の4本をゆるめた状態で仮止めし、可
動ブラケット18が動く状態とする。次に、ポリゴン駆
動モータ6を回転させてレーザ光を走査させる。マイク
ロメータ28を回して完全に受光素子16からレーザ光
の走査面がはずれた状態にする(図4のx0 の位置)。
そのときの受光素子16の出力波形をオシロスコープ
(図示せず)で見ると、走査光が当たっていないので、
当然図4のaのような波形となる。
First, the four fixing screws 21 for fixing the movable bracket 18 are temporarily loosened and temporarily fixed to make the movable bracket 18 move. Next, the polygon drive motor 6 is rotated to scan the laser light. The micrometer 28 is rotated so that the scanning plane of the laser beam is completely deviated from the light receiving element 16 (position x0 in FIG. 4).
When the output waveform of the light receiving element 16 at that time is viewed with an oscilloscope (not shown), since the scanning light is not hit,
Naturally, the waveform is as shown in FIG.

【0026】この状態で徐々にマイクロメータ28を回
転させて受光素子16を移動させると、受光素子16の
受光面にレーザ光が走査され、オシロスコープに波形が
観測される(図4のbからd)。このようにマイクロメ
ータ28を用いて受光素子16を徐々に移動させた時の
波形のピーク値をグラフにとると、図5に示すように、
x1の位置でレベルが検出され、x2の位置でレベルが
検出できなくなる。この波形から、x1とx2の中央の
位置が一番安定して検出できる位置だということがわか
る。
When the light receiving element 16 is moved by gradually rotating the micrometer 28 in this state, the light receiving surface of the light receiving element 16 is scanned with laser light and a waveform is observed on the oscilloscope (b to d in FIG. 4). ). When the peak value of the waveform when the light receiving element 16 is gradually moved by using the micrometer 28 in this way is plotted, as shown in FIG.
The level is detected at the position of x1, and the level cannot be detected at the position of x2. From this waveform, it can be seen that the center position between x1 and x2 is the most stable position that can be detected.

【0027】したがって、受光素子16を走査面からは
ずした状態からマイクロメータ28で徐々に移動させて
いき、波形が出現し始めるマイクロメータ28の値x1
と、その後、波形が観測できなくなるまで移動させたと
きのマイクロメータ28の値x2を求めた後、その中央
の値(x1+x2)/2の値にマイクロメータ28を調
整して4本の固定ねじ21を締めれば、受光素子16を
最適の位置に調整することができる。
Therefore, the value x1 of the micrometer 28 when the light receiving element 16 is removed from the scanning surface is gradually moved by the micrometer 28 and a waveform starts to appear.
After that, after obtaining the value x2 of the micrometer 28 when it is moved until the waveform cannot be observed, the micrometer 28 is adjusted to the central value (x1 + x2) / 2 and the four fixing screws By tightening 21, the light receiving element 16 can be adjusted to the optimum position.

【0028】以上のように本発明は、位相センサの受光
素子を可動ブラケットに実装し、その可動ブラケットを
マイクロメータ等の微動装置で移動させるようにしてい
るので、調整を目視で行わずにすみ、安全かつ定量的に
判断できる。また、微動装置がついているために調整が
簡単になる。
As described above, according to the present invention, the light receiving element of the phase sensor is mounted on the movable bracket, and the movable bracket is moved by the fine movement device such as a micrometer. It can be judged safely and quantitatively. Further, the fine movement device is provided, so that the adjustment becomes easy.

【0029】[0029]

【発明の効果】以上のように本発明によれば、書き出し
位置の調整のみならず、記録光が簡単にかつ精度よく受
光素子の受光面中央を通るように調整できる受光素子取
付位置調整機構を提供することができる。
As described above, according to the present invention, there is provided a light receiving element mounting position adjusting mechanism capable of not only adjusting the writing position but also adjusting the recording light so as to easily and accurately pass through the center of the light receiving surface of the light receiving element. Can be provided.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る受光素子取付位置調整機構の一実
施形態として、本機構を備えたレーザによる走査記録装
置の構成を示す斜視図。
FIG. 1 is a perspective view showing a configuration of a laser scanning recording apparatus provided with this mechanism as an embodiment of a light receiving element attachment position adjusting mechanism according to the present invention.

【図2】同実施形態の受光素子に対する走査面のずれを
説明するための図。
FIG. 2 is a diagram for explaining a shift of a scanning surface with respect to the light receiving element of the same embodiment.

【図3】同実施形態の受光素子微動機構の構成を示す
図。
FIG. 3 is a diagram showing a configuration of a light receiving element fine movement mechanism of the same embodiment.

【図4】同実施形態の受光素子出力波形を示す波形図。FIG. 4 is a waveform chart showing an output waveform of a light receiving element of the same embodiment.

【図5】同実施形態の受光素子の位置と受光素子出力波
形ピーク時の関係を示す図。
FIG. 5 is a diagram showing the relationship between the position of the light receiving element and the peak of the output waveform of the light receiving element in the same embodiment.

【符号の説明】[Explanation of symbols]

1 半導体レーザ 2 コリメータレンズ 3 集光レンズ 4 反射ミラー 5 ポリゴンミラー 6 ポリゴン駆動モータ 7 fθレンズ 8 反射ミラー 9 記録紙 10 移動テーブル 11 送りねじ 12 副走査モータ 13 反射ミラー 14 位相センサ部 15 レーザ光走査面 16 受光素子 17 受光面中央位置 18 可動ブラケット 20 ベース 21 固定ねじ 22 長穴 23 マイクロメータ軸 24 固定ブラケット 25,26 ねじ 27 ばね 28 マイクロメータ 1 Semiconductor Laser 2 Collimator Lens 3 Condenser Lens 4 Reflection Mirror 5 Polygon Mirror 6 Polygon Drive Motor 7 fθ Lens 8 Reflection Mirror 9 Recording Paper 10 Moving Table 11 Feed Screw 12 Sub-scanning Motor 13 Reflection Mirror 14 Phase Sensor 15 Laser Light Scanning Surface 16 Light receiving element 17 Light receiving surface center position 18 Movable bracket 20 Base 21 Fixing screw 22 Long hole 23 Micrometer shaft 24 Fixing bracket 25, 26 Screw 27 Spring 28 Micrometer

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 走査光が受光面の中央を通過するように
受光素子の取付位置を調整する受光素子取付位置調整機
構において、 前記受光素子が基台上に載置され、当該基台を前記走査
光に対して垂直方向に可動自在な可動ブラケットと、 前記可動ブラケットの基台を定量的に微動する微動機構
と、 この微動機構により可動ブラケットの基台を移動させた
ときに、前記受光面が走査光を横切る間の受光素子出力
のピークレベルの変化と移動量を計測する計測手段と、 この計測手段で得られた計測結果から前記受光素子の最
適位置を判別する最適位置判別手段とを具備し、 前記受光素子が前記最適位置判別手段で判別された位置
にくるように前記微動機構を通じて前記基台の位置調整
を行うことを特徴とする受光素子取付位置調整機構。
1. A light receiving element mounting position adjusting mechanism for adjusting a mounting position of a light receiving element so that scanning light passes through the center of a light receiving surface, wherein the light receiving element is mounted on a base and the base is mounted on the base. A movable bracket that is movable in the vertical direction to the scanning light, a fine movement mechanism that quantitatively finely moves the base of the movable bracket, and the light receiving surface when the base of the movable bracket is moved by this fine movement mechanism. A measuring means for measuring the change in the peak level of the light receiving element output and the amount of movement while the scanning light crosses the scanning light; and an optimum position determining means for determining the optimum position of the light receiving element from the measurement result obtained by this measuring means. A light receiving element mounting position adjusting mechanism, comprising: adjusting the position of the base through the fine movement mechanism so that the light receiving element is located at the position determined by the optimum position determining means.
【請求項2】 前記微動機構は、マイクロメータを用い
て前記可動ブラケットの基台を移動させることを特徴と
する請求項1記載の受光素子取付位置調整機構。
2. The light receiving element mounting position adjusting mechanism according to claim 1, wherein the fine movement mechanism moves a base of the movable bracket by using a micrometer.
【請求項3】 前記可動ブラケットは、前記基台に前記
走査光に対して一垂直方向に弾性力を与える弾性部材
と、前記受光素子が最適位置にきたとき前記基台を固定
する固定手段とを備え、 前記微動機構は、前記弾性力に抗して前記可動ブラケッ
トの基台を押圧移動させることを特徴とする請求項1記
載の受光素子取付位置調整機構。
3. The movable bracket includes an elastic member that applies an elastic force to the base in a direction perpendicular to the scanning light, and a fixing unit that fixes the base when the light receiving element reaches an optimum position. The light receiving element mounting position adjusting mechanism according to claim 1, wherein the fine movement mechanism presses and moves the base of the movable bracket against the elastic force.
【請求項4】 前記最適位置判別手段は、前記受光素子
の出力が立ち上がってから立ち下がるまでの範囲を求
め、その中間位置を最適位置と判定することを特徴とす
る請求項1記載の受光素子取付位置調整機構。
4. The light receiving element according to claim 1, wherein the optimum position determining means obtains a range from a rise of the light receiving element to a fall of the output, and determines an intermediate position thereof as an optimum position. Mounting position adjustment mechanism.
JP8018594A 1996-02-05 1996-02-05 Light receiving element mounting location adjusting mechanism Withdrawn JPH09214698A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8018594A JPH09214698A (en) 1996-02-05 1996-02-05 Light receiving element mounting location adjusting mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8018594A JPH09214698A (en) 1996-02-05 1996-02-05 Light receiving element mounting location adjusting mechanism

Publications (1)

Publication Number Publication Date
JPH09214698A true JPH09214698A (en) 1997-08-15

Family

ID=11975973

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8018594A Withdrawn JPH09214698A (en) 1996-02-05 1996-02-05 Light receiving element mounting location adjusting mechanism

Country Status (1)

Country Link
JP (1) JPH09214698A (en)

Similar Documents

Publication Publication Date Title
US4243294A (en) Method and apparatus for generating synchronizing signal for a beam scanner
US4800270A (en) Galvanometric optical scanning system having a pair of closely located synchronization
JP3445691B2 (en) Optical scanning device and adjustment method thereof
JPH09230276A (en) Optical scanner
CA2067887C (en) Raster output scanner with process direction spot position control
JPH09214698A (en) Light receiving element mounting location adjusting mechanism
JP3787877B2 (en) Optical scanning device
US4302096A (en) Graphic forms overlay apparatus
JP2004240275A (en) Laser scanning device
JP2575570Y2 (en) Optical scanning device
JPS62174718A (en) Optical scanning device
JPH06102087A (en) Laser beam diameter measuring device
JP2702750B2 (en) Laser beam scanning device
JPH07253552A (en) Image forming device
JP3653806B2 (en) Optical scanning device
CN1259682A (en) Method and device for determining scanning light beam starting/ending position and power there with on recording medium
JP2940962B2 (en) Jitter measurement device for polygon scanner
JP3462177B2 (en) Device for detecting the position of a rotating object
JP2001100137A (en) Scanning optical device
JPH0234363B2 (en)
JP3009070B2 (en) Optical scanning measurement device and measurement method
JPS61242160A (en) Image writing synchronous photodetecting device
JPH04219713A (en) Writing position adjusting method
JPH04204623A (en) Method for adjusting being-to-write position
JPH07281112A (en) Image recorder

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 20030506