JPH09175890A - Liquid temperature control of furnace for pulling up single crystal - Google Patents

Liquid temperature control of furnace for pulling up single crystal

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Publication number
JPH09175890A
JPH09175890A JP33739695A JP33739695A JPH09175890A JP H09175890 A JPH09175890 A JP H09175890A JP 33739695 A JP33739695 A JP 33739695A JP 33739695 A JP33739695 A JP 33739695A JP H09175890 A JPH09175890 A JP H09175890A
Authority
JP
Japan
Prior art keywords
temperature
melt
heater
power
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33739695A
Other languages
Japanese (ja)
Other versions
JP2826085B2 (en
Inventor
Haruo Yamamura
春夫 山村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Sitix Corp
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Filing date
Publication date
Application filed by Sumitomo Sitix Corp filed Critical Sumitomo Sitix Corp
Priority to JP33739695A priority Critical patent/JP2826085B2/en
Publication of JPH09175890A publication Critical patent/JPH09175890A/en
Application granted granted Critical
Publication of JP2826085B2 publication Critical patent/JP2826085B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a method for controlling the liquid temperature by which the melt liquid temperature melted in a crucible can be controlled with good responsiveness in a furnace for pulling up a single crystal. SOLUTION: This method for controlling the liquid temperature is used in a furnace 1 for pulling up a single crystal equipped with a heater 3, a thermometer 5 for sensing the temperature of a melt surface, an arithmetic unit for determining a changed quantity of an applied electric power from the sensed temperature of the melt surface and the target value of the melt temperature and a device for controlling the electric power applied to the heater. The changed quantity of the applied electric power is N times that determined with the arithmetic unit (with the proviso that N is 2-5). The changed quantity of the electric power applied to the heater is made to coincide with that determined with the arithmetic unit after changing the temperature of the melt surface by a temperature corresponding to a constant ratio of a temperature difference between the sensed temperature of the melt surface and the target value of the melt temperature.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明が属する技術分野】本発明は、チョクラルスキー
法(以下、単に「CZ法」という)による単結晶引上炉
の液温制御方法に関し、さらに詳しくは引上炉内の坩堝
内で溶融される融液の液温を応答性良く制御する方法に
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for controlling a liquid temperature of a single crystal pulling furnace by the Czochralski method (hereinafter simply referred to as "CZ method"), and more particularly, to a method of melting a liquid in a crucible in the pulling furnace. The present invention relates to a method for controlling the liquid temperature of a melt to be controlled with good responsiveness.

【0002】[0002]

【従来の技術】単結晶の製造方法は種々あるが、なかで
も、シリコン単結晶の引上げ育成に関し、工業的に量産
が可能な方式で広く応用されているものとしてCZ法が
ある。
2. Description of the Related Art There are various methods for producing a single crystal. Among them, the CZ method is widely used in a method capable of industrial mass production for pulling and growing a silicon single crystal.

【0003】この方法においては、引上炉に収納された
坩堝内で溶融された結晶原料の融液の液面から単結晶を
引上げ育成するものであるから、融液の液温を応答性良
く制御することが重要になる。
In this method, a single crystal is pulled and grown from a liquid surface of a melt of a crystal raw material melted in a crucible housed in a pulling furnace. Control becomes important.

【0004】例えば、単結晶の引上過程の種結晶を融液
になじませる時、ネッキング工程において細い直径で引
上げる時、さらには直径を漸増させて肩部(ショルダー
部)の形状を成形する肩造り時および直胴部の引上げ時
において、融液の液温制御の応答性が引上げられる単結
晶の生産性や品質に影響を及ぼすことになる。
For example, when a seed crystal in the process of pulling a single crystal is adapted to a melt, when it is pulled up with a small diameter in a necking process, or when the diameter is gradually increased, the shape of a shoulder (shoulder) is formed. During shoulder construction and pulling of the straight body, the responsiveness of the liquid temperature control of the melt affects the productivity and quality of the pulled single crystal.

【0005】このように単結晶の引上過程において融液
の液温を応答性良く制御することが重要になるが、後述
するように、通常、引上炉における坩堝内の結晶原料の
融液の液温変更の応答は比較的遅いものとされていた。
このため、液温変更の応答時間を短縮すべく、従来から
種々の提案がなされている。
As described above, it is important to control the liquid temperature of the melt with good responsiveness in the process of pulling the single crystal. As will be described later, the melt of the crystal raw material in the crucible in the pulling furnace is usually used. The response to the change in liquid temperature was relatively slow.
For this reason, various proposals have hitherto been made to shorten the response time for changing the liquid temperature.

【0006】特開昭62−123091号公報では、融液の温度
とこれを加熱するヒータ温度との関係から液面温度を制
御する一般的な方法が提案されている。すなわち、まず
融液温度とヒータ温度の関係を示すデーターから融液温
度の目標値に対応するヒータ温度の目標値を求めてお
き、ヒータ温度を目標値に制御した場合に融液温度の実
績値と目標値に偏差があれば、その偏差に応じて再びヒ
ータ温度を変更して融液温度を制御する方法である。し
かし、提案の方法では、確かにヒータ温度を応答性良く
制御出来るが、坩堝内の融液の液温変化の応答が遅いの
で液面温度の制御として大きな効果が図れない。
Japanese Patent Application Laid-Open No. 62-123091 proposes a general method for controlling the liquid surface temperature from the relationship between the temperature of the melt and the temperature of a heater for heating the same. That is, first, the target value of the heater temperature corresponding to the target value of the melt temperature is obtained from the data showing the relationship between the melt temperature and the heater temperature, and when the heater temperature is controlled to the target value, the actual value of the melt temperature is obtained. If there is a deviation in the target value, the heater temperature is changed again according to the deviation to control the melt temperature. However, in the proposed method, although the heater temperature can be controlled with good responsiveness, the response of the change in the liquid temperature of the melt in the crucible is slow, so that a large effect cannot be achieved as the control of the liquid surface temperature.

【0007】一方、特開平4−325488号公報には、溶融
液面から放射される赤外線の2つの波長の放射エネルギ
ーの比率から液面温度を測定し、設定温度とのずれに応
じて加熱ヒーターの電力を調整することによって液面温
度を制御する方法が提案され、さらに応答時間の短縮を
図るため、液面温度と加熱ヒーターに投入される電力と
の伝達関数を求め、それに含まれる無駄時間の補償をす
るPID 制御系を形成する方法が開示されている。しか
し、開示された方法では操業条件に応じた条件設定が煩
雑であって、実操業への適用が困難であるという問題が
ある。
On the other hand, Japanese Patent Application Laid-Open No. 4-325488 discloses that a liquid surface temperature is measured from a ratio of radiant energies of two wavelengths of infrared rays radiated from a molten liquid surface, and a heater is heated in accordance with a deviation from a set temperature. A method of controlling the liquid surface temperature by adjusting the power of the liquid has been proposed. In order to further shorten the response time, a transfer function between the liquid surface temperature and the electric power supplied to the heater is obtained, and the dead time included in the transfer function is determined. A method for forming a PID control system for compensating the above is disclosed. However, the disclosed method has a problem that setting conditions according to operating conditions is complicated, and it is difficult to apply the method to actual operations.

【0008】[0008]

【発明が解決しようとする課題】一般的に、坩堝内の融
液を加熱するヒータの温度若しくはヒータに投入される
電力量を変更することによって融液の温度を制御する場
合、その制御性は坩堝への結晶原料のチャージ量、坩堝
の収納位置、または坩堝の回転速度などの操業条件によ
って大きく影響を受ける。また、上記の操業条件が一定
であっても、引上炉に施されている断熱材や加熱ヒータ
の経時劣化によっても影響を受ける。さらに、このよう
な影響に加え、引上炉に収容される坩堝内の融液温度を
制御する場合には、多層構造の坩堝を介した制御となる
ことから融液の温度変化の応答速度が遅くなる。このた
め、前述の融液温度の制御方法を含む従来方法では、単
結晶の引上過程において融液の液温を応答性良く制御す
ることが困難であった。
Generally, when the temperature of a melt is controlled by changing the temperature of a heater for heating the melt in a crucible or the amount of electric power supplied to the heater, the controllability is high. It is greatly affected by operating conditions such as the charge amount of the crystal raw material in the crucible, the storage position of the crucible, or the rotation speed of the crucible. Further, even if the above-mentioned operating conditions are constant, it is affected by the deterioration with time of the heat insulating material and the heater provided in the pulling furnace. Further, in addition to such an effect, when controlling the temperature of the melt in the crucible housed in the pulling furnace, since the control is performed through the crucible having a multilayer structure, the response speed of the temperature change of the melt is reduced. Become slow. For this reason, in the conventional method including the above-described method of controlling the melt temperature, it was difficult to control the liquid temperature of the melt with good responsiveness in the process of pulling the single crystal.

【0009】本発明は、上記の問題点を克服して、単結
晶の引上炉において融液の液温を応答性良く制御する方
法を確立することを課題としてなされたものである。
SUMMARY OF THE INVENTION It is an object of the present invention to overcome the above-mentioned problems and to establish a method for controlling the temperature of a melt with good responsiveness in a single crystal pulling furnace.

【0010】[0010]

【課題を解決するための手段】本発明者は、引上炉の上
部に設けられた窓から非接触にて融液表面の温度を計測
する温度計(例えば、放射温度計)を設けることを前提
として、融液液温の制御方法を鋭意検討した結果、下記
の知見を得ることができた。
Means for Solving the Problems The present inventor has provided a thermometer (for example, a radiation thermometer) for measuring the temperature of the melt surface in a non-contact manner from a window provided on the upper part of the pulling furnace. As a premise, as a result of intensive studies on a method of controlling the temperature of the melt, the following knowledge was obtained.

【0011】通常、坩堝内の融液温度を制御するには融
液を加熱するヒータに投入する電力が調整されるが、熱
平衡状態での融液温度と投入電力との間には一定の関係
が見られる。
Normally, the power supplied to the heater for heating the melt is adjusted to control the temperature of the melt in the crucible. However, there is a certain relationship between the temperature of the melt in the thermal equilibrium state and the supplied power. Can be seen.

【0012】図1は、操業条件等に応じた熱平衡状態で
の融液温度とヒータの投入電力との関係を示す図である
が、融液温度と投入電力との間には一定の関係が存在
し、その関係に基づいてヒータの投入電力を調整するこ
とによって融液温度を制御できることが分かる。しか
し、上記の関係は操業条件、引上炉条件等(以下、単に
「引上条件」という)に依存するものであり、図1中の
関係I(実線で示す)と関係II(点線で示す)とは引上
条件の相違を示している。例えば、図中の関係IIは、関
係Iに対し操業条件が同様であっても、断熱材や加熱ヒ
ータの経時劣化等の引上炉条件の影響を示している。
FIG. 1 is a diagram showing the relationship between the melt temperature and the power supplied to the heater in a thermal equilibrium state according to operating conditions and the like. A certain relationship exists between the melt temperature and the supplied power. It can be seen that the melt temperature can be controlled by adjusting the input power of the heater based on the relationship. However, the above relationship depends on operating conditions, hoisting furnace conditions, and the like (hereinafter, simply referred to as "pulling conditions"), and relationship I (shown by a solid line) and relationship II (shown by a dotted line) in FIG. ) Indicates a difference in pulling conditions. For example, the relationship II in the figure indicates the influence of the pulling furnace conditions such as the deterioration of the heat insulating material and the heater over time, even if the operating conditions are the same as the relationship I.

【0013】引上炉内が熱平衡状態となり坩堝内の融液
温度が安定してのち、図1中の関係Iに基づいて融液を
加熱するヒータに投入する電力をステップ状に変更して
液温を変化させる場合、坩堝内の融液温度は単一の指数
関数状に変化して、いわゆる一次遅れの応答特性を示
す。さらにヒータに投入する電力を複数回にわたりステ
ップ状に変更しても、融液温度の変化はこの一次遅れの
応答特性の組合せになる。
After the inside of the pulling furnace is in a state of thermal equilibrium and the temperature of the melt in the crucible is stabilized, the electric power supplied to the heater for heating the melt is changed stepwise based on the relation I in FIG. When the temperature is changed, the temperature of the melt in the crucible changes in a single exponential function, showing a so-called first-order lag response characteristic. Further, even if the electric power supplied to the heater is changed stepwise a plurality of times, the change in the melt temperature becomes a combination of the first-order lag response characteristics.

【0014】上記の現象を前提にして液温変化の応答時
間を短縮することができる。すなわち、図1中の関係I
に基づき、融液表面の実測温度(To )と融液温度の目
標値(Ti )とからそれぞれに対応するヒータに投入す
べき電力(P0 およびPi )を一義的に求めることがで
き、さらにP0 およびPi から投入電力の変更量(Δ
P)を決定することができる(すなわち、ΔP=Pi
0 となる)。次に決定された投入電力の変更量(Δ
P)を基準として、最初にヒータに投入する電力を求め
る。最初の投入電力は投入電力の変更量の数倍に対応す
る電力(P0 +N・ΔP)として、液温変化の応答性を
高める。融液温度の変化にともない、融液表面の温度が
実測温度(To )と目標温度(Ti )との温度差(ΔT
=Ti −To)の一定比率に相当する温度だけ変化した
ことを確認したのち、ヒータに投入される電力を適正な
電力(P0 +ΔP)に減じて設定する。このような操作
を繰り返すことによって、坩堝内の融液温度を目標温度
に応答性良く変化させることができる。
On the premise of the above phenomenon, the response time for a change in the liquid temperature can be shortened. That is, the relation I in FIG.
From the measured temperature (T o ) of the melt surface and the target value (T i ) of the melt temperature, the powers (P 0 and P i ) to be applied to the corresponding heaters can be uniquely obtained based on can further P 0 and P change amount of i from input power (delta
P) can be determined (ie, ΔP = P i
The P 0). Next, the determined change amount of the applied power (Δ
First, the power to be supplied to the heater is determined based on P). The initial input power is set to power (P 0 + N · ΔP) corresponding to several times the change amount of the input power to increase the responsiveness of the liquid temperature change. As the temperature of the melt changes, the temperature of the surface of the melt becomes the temperature difference (ΔT) between the actually measured temperature (T o ) and the target temperature (T i ).
= T i -T o ), and after confirming that the temperature has changed by a certain ratio, the electric power supplied to the heater is set to an appropriate electric power (P 0 + ΔP). By repeating such an operation, the temperature of the melt in the crucible can be changed to the target temperature with high responsiveness.

【0015】なお、ヒータに投入する電力に対する融液
温度の変化状況を示すために、「一次遅れの応答」また
は「高次遅れの応答」の表現を用いるが、以下の説明に
おいて一次遅れの応答とは、前述の通り、単一の指数関
数状の応答特性をいい、高次遅れの応答とは、それ以外
の高次の指数関数状の応答特性をいう。
In order to show the state of change of the melt temperature with respect to the electric power supplied to the heater, the expression of "first-order lag response" or "high-order lag response" is used. Refers to a single exponential response characteristic as described above, and a high-order lag response refers to other high-order exponential response characteristics.

【0016】本発明は上記の知見に基づいて完成された
ものであり、下記の単結晶引上炉の液温制御方法を要旨
としている(後述の図2参照)。
The present invention has been completed based on the above findings, and has as its gist a liquid temperature control method for a single crystal pulling furnace described below (see FIG. 2 described later).

【0017】すなわち、坩堝内の結晶融液を加熱するヒ
ータ3と、前記融液表面の温度を検出する温度計5と、
前記融液表面の検出温度と融液温度の目標値との温度差
からヒータに投入すべき電力量を算出し投入電力の変更
量を決定する演算装置と、前記投入電力の変更量に基づ
きヒータに投入される電力を制御する装置とを具備する
単結晶引上炉1において用いられる液温制御方法であっ
て、ヒータに投入される電力の変更量を前記演算装置で
決定された投入電力の変更量のN倍(但し、N=2〜5
とする)とし、融液表面の温度が前記融液表面の検出温
度と融液温度の目標値との温度差の一定比率に相当する
温度だけ変化したのち、前記ヒータに投入される電力の
変更量を前記演算装置で決定された投入電力の変更量に
合致させることを特徴とする単結晶引上炉の液温制御方
法である。
That is, a heater 3 for heating the crystal melt in the crucible, a thermometer 5 for detecting the temperature of the melt surface,
An arithmetic unit that calculates an amount of power to be supplied to the heater from a temperature difference between the detected temperature of the melt surface and a target value of the melt temperature and determines a change amount of the supplied power; and a heater based on the changed amount of the supplied power. A liquid temperature control method used in the single crystal pulling furnace 1 comprising a device for controlling the power supplied to the heater, wherein a change amount of the power supplied to the heater is determined by the input device determined by the arithmetic unit. N times the change amount (however, N = 2 to 5
After the temperature of the melt surface changes by a temperature corresponding to a certain ratio of a temperature difference between the detected temperature of the melt surface and a target value of the melt temperature, and then the power supplied to the heater is changed. A liquid temperature control method for a single crystal pulling furnace, wherein the amount is made to match a change amount of the input power determined by the arithmetic unit.

【0018】[0018]

【発明の実施の形態】図2は、本発明の液温制御方法を
実施するための単結晶引上炉の概略構成を説明する図で
ある。同図に示すように、対象となる引上炉1には投入
電力に応じて坩堝2内の結晶融液4を加熱するヒータ3
と、引上炉の上部に設けられた窓から非接触にて融液表
面の温度を計測する温度計5(例えば、放射温度計)
と、前記融液表面の検出温度と融液温度の目標値との温
度差からヒータに投入すべき電力を求めて投入電力の変
更量(ΔP)を決定する演算装置と、前記投入電力の変
更量に基づきヒータに投入される電力を制御する装置と
が具備されている。
FIG. 2 is a diagram illustrating a schematic configuration of a single crystal pulling furnace for carrying out the liquid temperature control method of the present invention. As shown in FIG. 1, a heater 3 for heating a crystal melt 4 in a crucible 2 in accordance with input electric power is provided in a target pulling furnace 1.
And a thermometer 5 (for example, a radiation thermometer) for measuring the temperature of the melt surface in a non-contact manner through a window provided at the upper part of the pulling furnace.
An arithmetic unit for determining power to be supplied to the heater from a temperature difference between a detected temperature of the melt surface and a target value of the melt temperature to determine a change amount (ΔP) of the supplied power; A device for controlling the electric power supplied to the heater based on the amount.

【0019】通常、単結晶引上炉において融液を加熱す
るヒータに投入する電力をステップ状に変更して液温を
変化させると、黒鉛坩堝と石英坩堝とから構成される多
層構造の坩堝を介して融液の温度制御がなされるもので
あるから、坩堝内の融液温度の変化は高次遅れの応答特
性を示すことが想定される。しかし、最近では、炉内に
収納される黒鉛坩堝および石英坩堝とも厚みが薄く製作
され、しかも気密に構成されるようになったので、融液
温度の応答特性が改善され、また融液自体も対流伝熱を
行っていることから温度変化の応答時間が著しく短縮さ
れていることが明らかとなった。
Normally, when the electric power supplied to the heater for heating the melt in the single crystal pulling furnace is changed stepwise to change the liquid temperature, a crucible having a multilayer structure composed of a graphite crucible and a quartz crucible is formed. Since the temperature of the melt is controlled via the above, it is assumed that the change in the melt temperature in the crucible exhibits a high-order delay response characteristic. However, recently, both graphite crucibles and quartz crucibles housed in the furnace have been manufactured to be thin and airtight, so that the response characteristics of the melt temperature have been improved, and the melt itself has been improved. The convection heat transfer revealed that the response time of the temperature change was significantly shortened.

【0020】後述する図4は、実機の引上炉において投
入電力をステップ状に変更した場合の融液温度の応答状
況を実測した結果の一例を示す図であるが、同図に示す
実測結果から、実際に単結晶の製造に用いられる引上炉
における坩堝内の融液温度の変化は高次遅れの応答を考
慮する必要がなく、ほぼ一次遅れの応答となることが確
認できる。
FIG. 4 to be described later is a diagram showing an example of the result of actually measuring the response state of the melt temperature when the input power is changed in a stepwise manner in the pulling furnace of the actual machine. From this, it can be confirmed that the change in the melt temperature in the crucible in the pulling furnace actually used for the production of a single crystal does not need to consider the response of the higher-order lag, and the response is almost the first-order lag.

【0021】そこで、引上炉における投入電力と融液温
度の応答との関係を詳細に検討するため、融液温度の応
答が一次遅れの応答となることを条件として、モデル化
を行い伝熱シミュレータを作成した。このシミュレータ
を用いて投入電力と融液温度の応答との関係を種々検討
して、下記、の点に着眼した。
Therefore, in order to examine in detail the relationship between the input power and the response of the melt temperature in the pulling furnace, modeling was performed under the condition that the response of the melt temperature was a first-order lag response, and the heat transfer was performed. Created a simulator. Using this simulator, the relationship between the input power and the response of the melt temperature was examined variously, and the following points were focused on.

【0022】融液温度の実測値と目標値とから決定さ
れる投入電力の変更量(ΔP)だけステップ状に投入電
力を変更した場合には、融液温度が目標温度と一定の温
度差以内に到達し、安定するまでに長時間を要する。
When the input power is changed in a stepwise manner by the change amount (ΔP) of the input power determined from the actually measured value of the melt temperature and the target value, the melt temperature is within a certain temperature difference from the target temperature. It takes a long time to reach and stabilize.

【0023】一方、ステップ状の投入電力を、投入電
力の変更量(ΔP)よりも大きな変更量として設定し
て、その後適正なタイミングで投入電力を投入電力の変
更量(ΔP)に一致させれば、融液温度が目標温度に到
達する応答時間を大幅に短縮できる。また、この場合に
難しいのは、投入電力を切り替えるタイミングを操業条
件、引上炉条件等の引上条件に関係なく決めることであ
るが、このタイミングを融液の実測温度と目標温度との
温度差の比率から決定することによって解決される。
On the other hand, the step-like input power is set as a change amount larger than the change amount (ΔP) of the input power, and thereafter the input power is made to coincide with the change amount (ΔP) of the input power at an appropriate timing. If this is the case, the response time for the melt temperature to reach the target temperature can be greatly reduced. In this case, it is difficult to determine the timing of switching the input power irrespective of operating conditions and hoisting conditions such as hoisting furnace conditions. This timing is determined by the temperature between the actually measured temperature of the melt and the target temperature. It is solved by determining from the difference ratio.

【0024】本発明者は、実際に単結晶の製造に用いら
れる引上炉内の融液温度の応答がほぼ一次遅れの応答と
なることを前提として、上記の着眼点を理論的に裏付け
ることとする。
The present inventor theoretically supports the above-mentioned point of view on the assumption that the response of the melt temperature in the pulling furnace actually used for the production of a single crystal is almost a first-order response. And

【0025】投入電力の変更量(ΔP)だけステップ状
に投入電力を変更した場合の応答〔h(t)〕は次式で
示される。
The response [h (t)] when the input power is changed stepwise by the change amount (ΔP) of the input power is expressed by the following equation.

【0026】 h(t)=1−e-t/T ・・・ 但し、t:経過時間 T:時定数 ここで、ΔPのN倍の投入電力に変更を行った場合の応
答〔f(t)〕は f(t)=N×(1−e-t/T) ・・・ となり、次にΔPの{−(N−1)}倍の投入電力に変
更を行った場合の応答〔g(t)〕は次式で示される。
H (t) = 1−e −t / T where t: elapsed time T: time constant Here, the response [f (t) when the input power is changed to N times ΔP )] Is f (t) = N × (1−e −t / T )... Next, the response [g] when the input power is changed to {− (N−1)} times ΔP is applied. (T)] is represented by the following equation.

【0027】 g(t)=−(N−1)×(1−e-t/T) ・・・ 式で示される応答〔f(t)〕が目標温度と一致する
時間をt0とすると、f(t0)=N×(1−e-to/T )=
1となり、下記の式の関係が得られる。
G (t) = − (N−1) × (1-e− t / T ) When a time when the response [f (t)] expressed by the equation matches the target temperature is t 0. , F (t 0 ) = N × (1−e −to / T ) =
1, and the following relationship is obtained.

【0028】 e-t0/T =1−1/N ・・・ 一方、〔f(t)〕を加えたt0時間後に式で示される
応答〔g(t)〕を加えた場合の合成関数の微分値は、
次の式となる。
[0028] e -t0 / T = 1-1 / N ··· On the other hand, the synthesis function in the case of adding the response of formula in t 0 hours after the addition of [f (t)] [g (t)] The derivative of is
The following equation is obtained.

【0029】 f'(t+t0)+g'(t)=N/T×e-(t+t0)/T −(N−1)/T×e-t/T ・・・ 上記式に、式を代入するとこの値は0(ゼロ)とな
る。
F ′ (t + t 0 ) + g ′ (t) = N / T × e− (t + t0) / T− (N−1) / T × e− t / T (3) By substituting, this value becomes 0 (zero).

【0030】すなわち、t0時間経過後、融液温度は一定
値を保持することになるので、ヒータに投入する電力に
投入電力の変更量(ΔP)のN倍に相当する電力を加え
てのち、今度はヒータに投入する電力に投入電力の変更
量(ΔP)の{−(N−1)}倍の電力を加えるように
すれば、融液温度の応答時間を大幅に短縮できる。ここ
で、ヒータに投入する電力に加える量をΔPのN倍の投
入電力からΔPの{−(N−1)}倍の投入電力に切り
替えるとは、下記式の関係から、ΔPのN倍の電力量
からΔPの電力量に切り替えることを意味する。
That is, after the elapse of the time t 0 , the melt temperature is maintained at a constant value. Therefore, after adding an electric power corresponding to N times the change amount (ΔP) of the input power to the power input to the heater, In this case, by adding {-(N-1)} times the amount of change (ΔP) to the electric power supplied to the heater, the response time of the melt temperature can be greatly reduced. Here, switching the amount to be added to the electric power supplied to the heater from the input power N times ΔP to the input power {− (N−1)} times ΔP means that N times ΔP from the following equation. This means switching from the electric energy to the electric energy of ΔP.

【0031】 〔ΔP・N+ΔP・{−(N−1)}〕=ΔP ・・・ 本発明において投入電力の変更量を決定する演算装置の
具体的な構成を、図3を用いて説明する。
[ΔP · N + ΔP · {− (N−1)}] = ΔP A specific configuration of the arithmetic unit that determines the change amount of the input power in the present invention will be described with reference to FIG.

【0032】図3は、本発明方法における投入電力の変
更量を決定する演算構成を示すフローチャートである
が、そのステップ順の構成は下記の通りである。
FIG. 3 is a flowchart showing a calculation configuration for determining the change amount of the input power in the method of the present invention. The configuration in the order of steps is as follows.

【0033】(ステップ1)融液温度の変更指令にとも
なって、温度計によって検出された融液表面の実測温度
(To )が入力される。
(Step 1) In response to a command to change the melt temperature, the measured temperature (T o ) of the melt surface detected by the thermometer is input.

【0034】(ステップ2)融液温度の目標値(Ti
が指令され、融液の実測温度(To )と融液温度の目標
値(Ti )との温度差(ΔT)が求められる。
(Step 2) Target value of melt temperature (T i )
And a temperature difference (ΔT) between the actual measured temperature of the melt (T o ) and the target value of the melt temperature (T i ) is obtained.

【0035】(ステップ3)融液の実測温度(To )、
融液温度の目標値(Ti )および温度差(ΔT)から、
ヒータに投入すべき電力、すなわち融液の実測温度(T
o )を維持するための投入電力(P0 )および融液を目
標温度(Ti )にするための投入電力(Pi )が算出さ
れ、さらに投入電力の差から投入電力の変更量(ΔP=
i −P0 )を決定される。
(Step 3) Measured temperature (T o ) of the melt
From the target value of the melt temperature (T i ) and the temperature difference (ΔT),
Electric power to be supplied to the heater, that is, the measured temperature of the melt (T
input power for maintaining o) (P 0) and melt the target temperature (T i) to order the input power (P i) is calculated, further amount of change from the difference between the input power input power ([Delta] P =
P i -P 0 ) is determined.

【0036】(ステップ4)決定された投入電力の変更
量(ΔP)に基づいて、まずヒータに投入する電力をこ
の投入電力の変更量のN倍に対応する電力分(N・Δ
P)増加するように投入電力の設定〔I〕が行われる
(設定電力:P0 +N・ΔP)。
(Step 4) Based on the determined input power change amount (ΔP), the power input to the heater is first reduced by an amount (N · Δ) corresponding to N times the input power change amount.
P) The input power setting [I] is performed so as to increase (set power: P 0 + N · ΔP).

【0037】(ステップ5)。つぎに融液表面の温度が
実測温度(To )と目標温度(Ti )との温度差(Δ
T)の一定比率に相当する温度だけ変化したときを投入
電力を切り替えるタイミングとする。
(Step 5) Next, the temperature of the melt surface is determined by the temperature difference (Δ) between the measured temperature (T o ) and the target temperature (T i ).
The timing when the applied power is switched when the temperature changes by a temperature corresponding to a certain ratio of T) is set.

【0038】(ステップ6)前記の切り替えタイミング
を確認したのち、ヒータに投入される電力が適正な電力
(設定電力:P0 +ΔP)に変更して投入電力の設定
〔II〕が行われ、坩堝内の融液温度を目標温度に応答性
良く変化させることができる。
(Step 6) After confirming the above switching timing, the electric power supplied to the heater is changed to an appropriate electric power (set electric power: P 0 + ΔP) to set the input electric power [II], and the crucible is set. The melt temperature in the inside can be changed to the target temperature with good responsiveness.

【0039】本発明において、Nを大きくすると制御精
度が悪化し、オーバーシュート等の発生が予想されるの
で、Nは2〜5の範囲にする。さらに望ましくは、Nは
2〜3の範囲にするのが望ましい。
In the present invention, when N is increased, the control accuracy is deteriorated and overshoot or the like is expected to occur. Therefore, N is set in the range of 2-5. More preferably, N is desirably in the range of 2-3.

【0040】投入電力を切り替えるタイミングは、融液
表面の温度が実測温度と目標温度との温度差の一定比率
に相当する温度だけ変化した時点としているが、この比
率は50〜70%の範囲にするのが望ましい。この比率は前
記の伝熱シミュレータを用いたシミュレーション結果に
基づいて検討している。
The input power is switched at a point in time when the temperature of the melt surface changes by a temperature corresponding to a certain ratio of the temperature difference between the actually measured temperature and the target temperature, and this ratio is in the range of 50 to 70%. It is desirable to do. This ratio is examined based on the simulation result using the heat transfer simulator.

【0041】融液温度が目標温度に到達する時間(目標
温度との差が2℃以内になる時間)が短縮でき、かつ液
温が目標温度を超えないことを条件とするシミュレーシ
ョン結果によれば、ヒータに投入される電力を投入電力
の変更量の2倍にする場合(Nを2とする場合)には上
記の比率を60〜70%とし、投入電力の変更量の3〜5倍
にする場合(Nを3〜5とする場合)には上記の比率を
50〜60%とするのが望ましいことが明らかとなった。
According to the simulation results on the condition that the time for the melt temperature to reach the target temperature (the time for the difference from the target temperature to be within 2 ° C.) can be shortened and the liquid temperature does not exceed the target temperature. When the power supplied to the heater is set to be twice as large as the change in the input power (when N is set to 2), the above ratio is set to 60 to 70%, and the change in the input power is set to 3 to 5 times. (When N is 3 to 5)
It became clear that it was desirable to set it to 50 to 60%.

【0042】本発明の引上炉でヒータに投入される電力
を制御する装置としては、通常用いられているサイリス
タを利用した制御装置であればよい。
As a device for controlling the electric power supplied to the heater in the pulling furnace of the present invention, a control device using a thyristor which is generally used may be used.

【0043】前述の通り、結晶原料のチャージ量、坩堝
の収納位置、または坩堝の回転速度などの操業条件が変
化した場合若しくは操業条件が同様であっても断熱材や
加熱ヒータが経時劣化してホットゾーン特性の悪化等の
引上炉条件が変化する場合でも、本発明方法では対応す
ることができる。すなわち、本発明方法においては、単
結晶の引上条件に応じて熱平衡状態での融液温度とヒー
タの投入電力との関係を修正すればよい。具体的には、
引上条件を変更したその都度若しくは定期的に融液温度
が安定状態(例えば、45分間の液温変化量が± 1.5℃以
内である状態)での融液温度とヒータの投入電力との関
係を実測し、その関係に基づいて前記図3(ステップ
3)におけるヒータに投入すべき電力(P0 および
i )と投入電力の変更量(ΔP=Pi −P0 )が決定
される演算構成を修正する。このような修正を加えるこ
とによって、常時、坩堝内の融液温度を応答性良く制御
することが可能になる。
As described above, when the operating conditions such as the charge amount of the crystal raw material, the storage position of the crucible, or the rotation speed of the crucible are changed, or the operating conditions are the same, the heat insulating material and the heater deteriorate with time. The method of the present invention can cope with a case where the pulling furnace condition changes such as deterioration of the hot zone characteristic. That is, in the method of the present invention, the relationship between the temperature of the melt in the thermal equilibrium state and the power supplied to the heater may be corrected according to the pulling conditions of the single crystal. In particular,
The relationship between the melt temperature and the power supplied to the heater when the temperature of the melt is stable (for example, the amount of change in the liquid temperature within 45 minutes is within ± 1.5 ° C) each time the lifting conditions are changed or periodically. Is calculated, and based on the relationship, the power (P 0 and P i ) to be supplied to the heater and the change amount (ΔP = P i −P 0 ) of the supplied power are determined in FIG. 3 (step 3). Modify the configuration. By making such a correction, the temperature of the melt in the crucible can always be controlled with good responsiveness.

【0044】[0044]

【実施例】本発明の単結晶引上炉の液温制御方法の効果
を実施例に基づいて、具体的に説明する。
EXAMPLES The effects of the liquid temperature control method for a single crystal pulling furnace according to the present invention will be specifically described based on examples.

【0045】(比較例)引上炉に収納された22″坩堝に
シリコン多結晶を 120Kgチャージし、完全に溶融させて
引上炉内を熱平衡状態にさせた。そののち、熱平衡状態
での融液温度(T0 )が1425℃から目標温度(Ti )が
1435℃になるように、投入電力をステップ状に変更して
融液の液温を上昇させ、融液温度の応答性を確認した。
Comparative Example 120 kg of polycrystalline silicon was charged into a 22 ″ crucible housed in a pulling furnace and completely melted to bring the inside of the pulling furnace into a thermal equilibrium state. From liquid temperature (T 0 ) of 1425 ° C to target temperature (T i )
The input power was changed in steps so that the temperature became 1435 ° C., the liquid temperature of the melt was increased, and the responsiveness of the melt temperature was confirmed.

【0046】実施例の操業条件における融液温度とヒー
タの投入電力との関係から、T0 を維持する電力
(P0 )は53.0KWとなり、T0 およびTi の温度差(Δ
T)から決定される投入電力の変更量(ΔP)は0.6KW
となるので、ステップ状の投入電力(P0 +ΔP)は5
3.6KWとした。
From the relationship between the melt temperature and the electric power supplied to the heater under the operating conditions of the embodiment, the electric power (P 0 ) for maintaining T 0 is 53.0 KW, and the temperature difference (Δ between T 0 and T i
The change amount (ΔP) of the input power determined from T) is 0.6 KW
Therefore, the step-like input power (P 0 + ΔP) is 5
3.6KW.

【0047】図4は、比較例における投入電力と融液温
度の変化状況を実測した結果を示す図であり、図中の投
入電力および融液温度の記号は上記で規定したものであ
る。
FIG. 4 is a diagram showing the results of actual measurement of changes in the applied power and the melt temperature in the comparative example. The symbols of the applied power and the melt temperature in the figure are those defined above.

【0048】実測結果では、融液液温が温度差(ΔT)
に対して63%に到達する時間は 110分程度と長時間を要
し、さらに目標温度との差が2℃以内になるには約 270
分が必要であった。融液温度は坩堝の中心から 100mmの
位置の温度を放射温度計にて測定し、対流の影響による
温度変動を除去するためにスムージングの処理を行っ
た。
As a result of the actual measurement, the temperature of the melt is equal to the temperature difference (ΔT).
It takes a long time of about 110 minutes to reach 63%, and it takes about 270 for the difference from the target temperature to be within 2 ° C.
Needed a minute. The temperature of the melt was measured at a position 100 mm from the center of the crucible with a radiation thermometer, and a smoothing treatment was performed to remove the temperature fluctuation due to the influence of convection.

【0049】(本発明例)比較例と同条件で融液温度の
応答性を確認した。
(Example of the Present Invention) Responsiveness of the melt temperature was confirmed under the same conditions as the comparative example.

【0050】図5は、本発明例における投入電力と融液
温度の変化状況を実測した結果を示す図である。本発明
例においても、T0 およびTi の温度差(ΔT)から決
定される投入電力の変更量(ΔP)は0.6KW であるか
ら、まずヒータに投入する電力をこの投入電力の変更量
の2倍に対応する電力54.2KW(P0 +2・ΔP)とし、
融液液温が温度差(ΔT)の60%に相当する温度だけ変
化した時点で、ヒータに投入する電力を53.6KW(P0
ΔP)に減じて設定した。このときの融液温度の変化状
況は、温度差(ΔT)の63%に達するのに60分の時間を
要し、さらに目標温度との差が2℃以内になるには約90
分が必要であった。比較例との対比から明らかなよう
に、本発明例によれば応答時間を比較例の 1/3程度に短
縮することができ、応答性良く液温制御ができる。
FIG. 5 is a view showing the results of actual measurement of changes in the applied power and the melt temperature in the example of the present invention. Also in the example of the present invention, the change amount (ΔP) of the input power determined from the temperature difference (ΔT) between T 0 and T i is 0.6 KW. 54.2KW (P 0 + 2 · ΔP) corresponding to double power,
When the melt temperature changes by a temperature corresponding to 60% of the temperature difference (ΔT), the power supplied to the heater is 53.6 KW (P 0 +
ΔP). At this time, it takes 60 minutes to reach 63% of the temperature difference (ΔT), and it takes about 90 minutes for the difference from the target temperature to be within 2 ° C.
Needed a minute. As is clear from comparison with the comparative example, according to the example of the present invention, the response time can be reduced to about 1/3 of the comparative example, and the liquid temperature can be controlled with good responsiveness.

【0051】[0051]

【発明の効果】本発明の液温制御方法によれば、単結晶
引上炉に収納される坩堝内の融液温度を応答性良く的確
に制御することができる。しかも、操業条件やホットゾ
ーン特性が変化した場合であっても優れた応答性で液温
制御が可能であるから、育成される単結晶の熱履歴が安
定し、品質の向上を図ることができる。
According to the liquid temperature control method of the present invention, the temperature of the melt in the crucible housed in the single crystal pulling furnace can be accurately controlled with good responsiveness. In addition, since the liquid temperature can be controlled with excellent responsiveness even when the operating conditions and the hot zone characteristics change, the thermal history of the grown single crystal is stabilized, and the quality can be improved. .

【図面の簡単な説明】[Brief description of the drawings]

【図1】引上条件に応じて求められる熱平衡状態での融
液温度とヒータの投入電力との関係を示す図である
FIG. 1 is a diagram showing a relationship between a melt temperature in a thermal equilibrium state obtained according to a pulling condition and a power supplied to a heater.

【図2】本発明の液温制御方法を実施するための単結晶
引上炉の概略構成を説明する図である。
FIG. 2 is a diagram illustrating a schematic configuration of a single crystal pulling furnace for implementing the liquid temperature control method of the present invention.

【図3】本発明方法における投入電力の変更量を決定す
る演算要領を示すフローチャートである。
FIG. 3 is a flowchart showing a calculation procedure for determining a change amount of input power in the method of the present invention.

【図4】比較例として、引上炉に投入される電力をステ
ップ状に変更した場合の融液温度の応答状況を実測した
結果示す図である。
FIG. 4 is a view showing the results of actual measurement of the response state of the melt temperature when the electric power supplied to the pulling furnace is changed stepwise as a comparative example.

【図5】本発明方法による投入電力と融液温度の変化状
況を実測した結果を示す図である。
FIG. 5 is a diagram showing the results of actual measurement of changes in applied power and melt temperature according to the method of the present invention.

【符号の説明】[Explanation of symbols]

1…引上炉、 2…坩堝、 3…ヒータ、 4…融液、
5…温度計
1 ... pulling furnace, 2 ... crucible, 3 ... heater, 4 ... melt,
5. Thermometer

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】坩堝内の結晶融液を加熱するヒータと、前
記融液表面の温度を検出する温度計と、前記融液表面の
検出温度と融液温度の目標値との温度差からヒータに投
入すべき電力量を算出し投入電力の変更量を決定する演
算装置と、前記投入電力の変更量に基づきヒータに投入
される電力を制御する装置とを具備する単結晶引上炉に
おいて用いられる液温制御方法であって、ヒータに投入
される電力の変更量を前記演算装置で決定された投入電
力の変更量のN倍とし、融液表面の温度が前記融液表面
の検出温度と融液温度の目標値との温度差の一定比率に
相当する温度だけ変化したのち、前記ヒータに投入され
る電力の変更量を前記演算装置で決定された投入電力の
変更量に合致させることを特徴とする単結晶引上炉の液
温制御方法。但し、上記Nは2〜5の範囲とする。
1. A heater for heating a crystal melt in a crucible, a thermometer for detecting a temperature of the melt surface, and a heater based on a temperature difference between a detected temperature of the melt surface and a target value of the melt temperature. Used in a single crystal pulling furnace comprising an arithmetic device for calculating the amount of power to be applied to the battery and determining the amount of change in the amount of power applied, and a device for controlling the amount of power applied to the heater based on the amount of change in the amount of power applied. Liquid temperature control method, wherein the amount of change in the power supplied to the heater is N times the amount of change in the supplied power determined by the arithmetic unit, and the temperature of the melt surface is the same as the detected temperature of the melt surface. After changing by a temperature corresponding to a certain ratio of the temperature difference from the target value of the melt temperature, the change amount of the power supplied to the heater is made to match the change amount of the supplied power determined by the arithmetic unit. A liquid temperature control method for a single crystal pulling furnace. However, N is in the range of 2 to 5.
JP33739695A 1995-12-25 1995-12-25 Liquid temperature control method for single crystal pulling furnace Expired - Fee Related JP2826085B2 (en)

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Application Number Priority Date Filing Date Title
JP33739695A JP2826085B2 (en) 1995-12-25 1995-12-25 Liquid temperature control method for single crystal pulling furnace

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Application Number Priority Date Filing Date Title
JP33739695A JP2826085B2 (en) 1995-12-25 1995-12-25 Liquid temperature control method for single crystal pulling furnace

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JPH09175890A true JPH09175890A (en) 1997-07-08
JP2826085B2 JP2826085B2 (en) 1998-11-18

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002010486A1 (en) * 2000-07-28 2002-02-07 Shin-Etsu Handotai Co., Ltd. Method for detecting completion of melting of polycrystalline silicone, method for setting temperature for contacting seed crystal with melt, and apparatus for producing silicon single crystal
KR101317198B1 (en) * 2011-10-24 2013-10-15 한국생산기술연구원 Monitoring apparatus for sapphire growth furnace
JP2019119674A (en) * 2018-01-09 2019-07-22 エスケー シルトロン カンパニー リミテッド Temperature controller for single crystal ingot growth and temperature control method applied thereto

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002010486A1 (en) * 2000-07-28 2002-02-07 Shin-Etsu Handotai Co., Ltd. Method for detecting completion of melting of polycrystalline silicone, method for setting temperature for contacting seed crystal with melt, and apparatus for producing silicon single crystal
KR101317198B1 (en) * 2011-10-24 2013-10-15 한국생산기술연구원 Monitoring apparatus for sapphire growth furnace
JP2019119674A (en) * 2018-01-09 2019-07-22 エスケー シルトロン カンパニー リミテッド Temperature controller for single crystal ingot growth and temperature control method applied thereto
US11198948B2 (en) 2018-01-09 2021-12-14 Sk Siltron Co., Ltd. Temperature control device for single crystal ingot growth and temperature control method applied thereto

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