JPH09165673A - Thin film forming device and thin film forming method - Google Patents

Thin film forming device and thin film forming method

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Publication number
JPH09165673A
JPH09165673A JP34743095A JP34743095A JPH09165673A JP H09165673 A JPH09165673 A JP H09165673A JP 34743095 A JP34743095 A JP 34743095A JP 34743095 A JP34743095 A JP 34743095A JP H09165673 A JPH09165673 A JP H09165673A
Authority
JP
Japan
Prior art keywords
cathode
thin film
film forming
trigger
anode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP34743095A
Other languages
Japanese (ja)
Other versions
JP2857743B2 (en
Inventor
Akiyoshi Chiyatanibara
昭義 茶谷原
Kaneshige Fujii
兼栄 藤井
Yuji Horino
裕治 堀野
Atsushi Kinomura
淳 木野村
Nobuteru Tsubouchi
信輝 坪内
Yoshiaki Mokuno
由明 杢野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP34743095A priority Critical patent/JP2857743B2/en
Publication of JPH09165673A publication Critical patent/JPH09165673A/en
Application granted granted Critical
Publication of JP2857743B2 publication Critical patent/JP2857743B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a novel technique capable of forming thin films without contg. raw material particulates at the time of forming the thin films by a vacuum arc vapor deposition method. SOLUTION: 1. This device has a condenser as a main discharge power source which is constituted by arranging a cylindrical anode around a target as a cathode and arranging trigger electrodes near the cathode and executes a pulse electric discharge between the cathode spot generated by a trigger electric discharge and the anode. 2. The trigger electric discharge is generated by applying high-voltage pulses between the trigger electrodes and the target material by using the thin film forming device constituted by arranging the cylindrical anode around the target material as the cathode and arranging the trigger electrodes near the cathode. The electrons and ions generated by the main electric discharge between the cathode spot generated on the target material and the anode are thereafter accelerated and moved toward the substrate, by which the metallic thin films are formed on the substrate.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、薄膜形成装置およ
び薄膜形成方法に関する。
TECHNICAL FIELD The present invention relates to a thin film forming apparatus and a thin film forming method.

【0002】[0002]

【従来の技術】薄膜形成方法としては、種々の物理的お
よび化学的蒸着方法が知られている。
2. Description of the Related Art Various physical and chemical vapor deposition methods are known as thin film forming methods.

【0003】例えば、真空中でのアーク放電により薄膜
形成原料が殆ど溶融することなく、カソードスポットと
呼ばれる領域に放電電流の集中が起こる形態の真空アー
ク蒸着法がある。従来、真空アーク蒸着法では、蒸着源
として基板に対向した円盤状のターゲットが用いられ、
アークスポットをその表面で移動させている。この様な
真空アーク蒸着法による薄膜形成においては、カソード
スポットで生じた原料液滴が飛散し、これが基板に直接
到達するので、粒子が形成され、薄膜中に混入して平坦
な成膜が形成されない場合がある。
For example, there is a vacuum arc vapor deposition method in which discharge current is concentrated in a region called a cathode spot while the thin film forming raw material is hardly melted by arc discharge in a vacuum. Conventionally, in the vacuum arc vapor deposition method, a disk-shaped target facing the substrate is used as a vapor deposition source,
The arc spot is moving on its surface. In thin film formation by such vacuum arc evaporation method, the material droplets generated at the cathode spot scatter and reach the substrate directly, so particles are formed and mixed into the thin film to form a flat film. It may not be done.

【0004】[0004]

【発明が解決しようとする課題】本発明は、真空アーク
蒸着法による薄膜形成に際して、原料微粒子を含まない
緻密で平滑な薄膜を形成しうる新たな技術を提供するこ
とを主な目的とする。
SUMMARY OF THE INVENTION It is a principal object of the present invention to provide a new technique capable of forming a dense and smooth thin film containing no raw material fine particles when forming a thin film by a vacuum arc vapor deposition method.

【0005】[0005]

【課題を解決するための手段】本発明者は、上記のよう
な従来技術の現状に鑑みて研究を進めた結果、真空アー
ク蒸着装置におけるアーク放電電極の構造を改善するこ
とにより、上記の目的を達成しうることを見出した。
The present inventor has conducted research in view of the above-mentioned state of the art, and as a result, improved the structure of an arc discharge electrode in a vacuum arc vapor deposition apparatus to achieve the above object. It has been found that

【0006】即ち、本発明は、下記の薄膜形成装置およ
び薄膜形成方法を提供するものである。
That is, the present invention provides the following thin film forming apparatus and thin film forming method.

【0007】1.カソードとしてのターゲット材料の周
囲に円筒状のアノードを配置し、カソード近辺にトリガ
電極を配置し、トリガ放電により発生するカソードスポ
ットとアノード間でパルス放電を行うための主放電電源
としてコンデンサを備えたことを特徴とする薄膜形成装
置。
[0007] 1. A cylindrical anode was placed around the target material as the cathode, a trigger electrode was placed near the cathode, and a capacitor was provided as the main discharge power source for performing pulse discharge between the cathode spot generated by the trigger discharge and the anode. A thin film forming apparatus characterized by the above.

【0008】2.カソードとしてのターゲット材料の周
囲に円筒状のアノードを配置し、カソード近辺にトリガ
電極を配置してなる薄膜形成装置を使用して、トリガ電
極とターゲット材料との間に高電圧パルスを加えてトリ
ガ放電させた後、ターゲット材料上に発生するカソード
スポットとアノードとの間での主放電により発生した電
子およびイオンを基板方向に加速移動させて基板上に金
属薄膜を形成させることを特徴とする薄膜形成方法。
[0008] 2. Using a thin-film forming device in which a cylindrical anode is placed around the target material as the cathode and a trigger electrode is placed near the cathode, a high voltage pulse is applied between the trigger electrode and the target material to trigger. After discharging, a thin film characterized by forming a metal thin film on the substrate by accelerating and moving electrons and ions generated by the main discharge between the cathode spot and the anode generated on the target material toward the substrate. Forming method.

【0009】3.主放電をコンデンサを電源とするパル
ス放電により行う上記項2に記載の薄膜形成方法。
3. 3. The thin film forming method as described in 2 above, wherein the main discharge is pulse discharge using a capacitor as a power source.

【0010】[0010]

【発明の実施の形態】以下図面に示す実施態様を参照し
つつ、本発明をさらに詳細に説明する。
BEST MODE FOR CARRYING OUT THE INVENTION The present invention will be described in more detail with reference to the embodiments shown in the drawings.

【0011】図1に示す様に、本発明による装置におい
ては、真空アーク放電のカソード(ターゲット材料)の
周囲に円筒状のアノードを設け、カソード近傍に配置し
たトリガ電極とカソードとの間に高電圧パルスを加え
て、トリガ放電させる。このトリガ放電により、カソー
ド上に電流が集中する点乃至領域(カソードスポット)
が発生し、次いで、このカソードスポットとアノードと
の間で主放電が始まって、カソードスポットの成長と移
動が起こり、カソードスポット中で生成した原子、イオ
ンおよび液滴が放出される。
As shown in FIG. 1, in the apparatus according to the present invention, a cylindrical anode is provided around the cathode (target material) of the vacuum arc discharge, and a high voltage is provided between the trigger electrode and the cathode arranged near the cathode. A voltage pulse is applied to trigger discharge. The point or region (cathode spot) where current is concentrated on the cathode due to this trigger discharge.
Then, a main discharge is started between the cathode spot and the anode to grow and move the cathode spot, and the atoms, ions and droplets generated in the cathode spot are emitted.

【0012】主放電が連続して長時間継続すると、カソ
ードが加熱されてついには溶融し、通常の溶融蒸着法
(抵抗通電、電子ビーム、高周波誘導などを利用する溶
融蒸着法)に近い現象を生じて、粒子を含む膜が形成さ
れるので、カソードが溶融する前に主放電を終えておく
ことが必要である。このためには、充電したコンデンサ
を主放電電源として使用する。操作の制御を良好に行う
ためには、パルス電源を用いることが好ましい。
When the main discharge is continuously continued for a long time, the cathode is heated and finally melted, which causes a phenomenon similar to a normal melt vapor deposition method (melt vapor deposition method utilizing resistance conduction, electron beam, high frequency induction, etc.). As a result, a film containing particles is formed, and it is necessary to finish the main discharge before the cathode is melted. For this purpose, the charged capacitor is used as the main discharge power source. A pulsed power source is preferably used for good control of the operation.

【0013】本発明においては、カソードの溶融を防止
するために、1回のアーク放電時間が制限されるので、
所望の膜厚を有する薄膜が形成されるまで、必要な回数
アーク放電を繰り返し行う。
In the present invention, in order to prevent melting of the cathode, the time of one arc discharge is limited.
Arc discharge is repeated as many times as necessary until a thin film having a desired film thickness is formed.

【0014】本発明においても、カソードスポットにお
いて原料液滴が形成されるが、これは、その箇所から直
線的に到達できる主にアノード上に堆積する。これに対
し、アノード−カソード間の空間で生じた原子およびイ
オンは、プラズマ流として基板の配置された方向に進ん
で、基板上に堆積し、膜を形成する。この際、アノード
電極へ流れる電流により、アノード電極を中心にして同
心円状に磁界が発生する。この磁界とカソードからアノ
ードへ向かう電流とは直交するので、この電流成分であ
るイオンと電子とには電磁力が働いて、これらは基板方
向に加速され、基板上に堆積して、膜を形成する。これ
に対し、原子およびイオンに比して遙かに重い原料液滴
は、電磁力の影響を殆ど受けないので、基板方向には加
速されず、膜内に取り込まれることはない。従って、基
板上に形成される膜は、平滑なものとなる。
Also in the present invention, the raw material droplets are formed at the cathode spot, and they are deposited mainly on the anode, which can be linearly reached from the spot. On the other hand, the atoms and ions generated in the space between the anode and the cathode travel as a plasma flow in the direction in which the substrate is arranged and are deposited on the substrate to form a film. At this time, a magnetic field is generated concentrically around the anode electrode by the current flowing to the anode electrode. Since this magnetic field and the current flowing from the cathode to the anode are orthogonal to each other, an electromagnetic force acts on the current components, ions and electrons, which accelerate them toward the substrate and deposit them on the substrate to form a film. To do. On the other hand, the raw material droplets, which are much heavier than the atoms and ions, are hardly affected by the electromagnetic force, and thus are not accelerated toward the substrate and are not taken into the film. Therefore, the film formed on the substrate becomes smooth.

【0015】なお、絶縁性化合物からなる薄膜を形成す
る場合には、ターゲット材料として導電性物質を使用
し、雰囲気に酸素、窒素などを供給することにより、酸
化物、窒化物などの絶縁性化合物を形成させれば良い。
When forming a thin film of an insulating compound, a conductive substance is used as a target material, and oxygen, nitrogen or the like is supplied to the atmosphere, so that an insulating compound such as an oxide or a nitride is formed. Should be formed.

【0016】[0016]

【発明の効果】【The invention's effect】

1.本発明によれば、平坦な成膜が得られるので、真空
アーク法による蒸着が広く利用可能となる。
1. According to the present invention, since a flat film can be obtained, vapor deposition by the vacuum arc method can be widely used.

【0017】2.通常の蒸着方法では、ターゲットの殆
どを溶融させるのに対し、本発明ではその必要がないの
で、炭素、タングステンなどの高融点金属膜を容易に成
膜することができ、加熱に使用するエネルギーを減少さ
せ、電源装置の簡素化が可能となる。
2. In the usual vapor deposition method, most of the targets are melted, but in the present invention, it is not necessary, so that a refractory metal film such as carbon or tungsten can be easily formed, and the energy used for heating can be reduced. It is possible to reduce the number and simplify the power supply device.

【0018】3.通常の蒸着法とは異なり、高温の原料
融液からの輻射熱がないので、耐熱性に劣る安価な基板
を使用することができる。
3. Unlike ordinary vapor deposition methods, since there is no radiant heat from the high temperature raw material melt, an inexpensive substrate with poor heat resistance can be used.

【0019】4.原料融液が存在しないので、重力に対
して蒸着方向が制限されず、真空槽への取り付けを自由
に行いうる。また、無重力下でも、実施できる。
4. Since the raw material melt does not exist, the vapor deposition direction is not restricted by gravity, and the vacuum chamber can be freely attached. It can also be performed under zero gravity.

【0020】5.加熱の必要がないので、加熱に伴う脱
ガスによる蒸着操作中の真空度低下に対処する設備を必
要とせず、しかも高純度膜生成を行いうる。
[5] Since there is no need for heating, it is possible to produce a high-purity film without the need for equipment for dealing with a decrease in the degree of vacuum during the vapor deposition operation due to degassing accompanying heating.

【0021】6.短時間パルスにより主放電を行う場合
には、瞬間の蒸発速度が極めて早いので、残留ガスの取
り込みによる純度の劣化が少ない。
6. When the main discharge is performed by the short-time pulse, the instantaneous evaporation rate is extremely high, and therefore the deterioration of the purity due to the intake of the residual gas is small.

【0022】7.アーク放電は、イオン化率の非常に高
い放電形態なので、イオンを利用した基板バイアス、イ
オンプレーティング、イオン源用プラズマなどに好適で
ある。
7. Since the arc discharge has a very high ionization rate, it is suitable for a substrate bias using ions, ion plating, plasma for an ion source, and the like.

【0023】8.上記の様な多くの利点を備えた本発明
方法は、半導体などの電子材料の作製、光学薄膜の形
成、防食・装飾などを目的とする表面改質などに有用で
ある。
8. The method of the present invention having many advantages as described above is useful for production of electronic materials such as semiconductors, formation of optical thin films, and surface modification for the purpose of anticorrosion and decoration.

【0024】[0024]

【実施例】以下に実施例を示し、本発明の特徴とすると
ころをより一層明確にする。
EXAMPLES Examples are shown below to further clarify the features of the present invention.

【0025】実施例1 図1に示す装置において、下記の条件で真空アーク放電
を行い、高分子材料(商標“カプトン”、デュポン社
製)フィルム上に鉄薄膜(0.03μm)を形成させ
た。
Example 1 In the apparatus shown in FIG. 1, vacuum arc discharge was performed under the following conditions to form an iron thin film (0.03 μm) on a polymer material (trademark “Kapton” manufactured by DuPont) film. .

【0026】*トリガ部:電源5kV、抵抗50MΩ、
コンデンサ0.33μF *主放電部:電源90V、コンデンサ8800μF *ターゲット:鉄、直径8mm *真空度:10-7Torr 得られた鉄薄膜表面を2次電子顕微鏡(SEM)像によ
り観察したところ、緻密で平滑な薄膜が得られているこ
とが確認できた。
* Trigger part: power supply 5 kV, resistance 50 MΩ,
Capacitor 0.33μF * Main discharge part: Power supply 90V, Capacitor 8800μF * Target: Iron, Diameter 8mm * Vacuum level: 10 -7 Torr The surface of the obtained iron thin film was observed by a secondary electron microscope (SEM) image, and it was dense. It was confirmed that a smooth thin film was obtained.

【0027】これに対し、従来の真空アーク放電法によ
り得られた鉄薄膜表面をSEM像により観察したとこ
ろ、原料液滴に由来する粒子が存在し、平滑性に劣るこ
とが確認された。
On the other hand, when the surface of the iron thin film obtained by the conventional vacuum arc discharge method was observed by the SEM image, it was confirmed that particles derived from the raw material droplets were present and the smoothness was poor.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発による薄膜形成装置の一例を示す概念図で
ある。
FIG. 1 is a conceptual diagram showing an example of a thin film forming apparatus according to the present invention.

フロントページの続き (72)発明者 木野村 淳 大阪府池田市緑丘1丁目8番31号 工業技 術院大阪工業技術研究所内 (72)発明者 坪内 信輝 大阪府池田市緑丘1丁目8番31号 工業技 術院大阪工業技術研究所内 (72)発明者 杢野 由明 大阪府池田市緑丘1丁目8番31号 工業技 術院大阪工業技術研究所内Front page continued (72) Inventor Jun Kinomura 1-831 Midorigaoka, Ikeda, Osaka Prefecture Industrial Technology Institute, Osaka Institute of Industrial Technology (72) Inventor Nobuteru Tsubouchi 1-831, Midorigaoka, Ikeda, Osaka Industry Institute of Industrial Science and Technology, Osaka Institute of Technology (72) Inventor Yoshiaki Ayano 1-38, Midorigaoka, Ikeda, Osaka Prefecture

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】カソードとしてのターゲット材料の周囲に
円筒状のアノードを配置し、カソード近辺にトリガ電極
を配置し、トリガ放電により発生するカソードスポット
とアノード間でパルス放電を行うための主放電電源とし
てコンデンサを備えたことを特徴とする薄膜形成装置。
1. A main discharge power source for arranging a cylindrical anode around a target material as a cathode and a trigger electrode in the vicinity of the cathode to perform pulse discharge between a cathode spot generated by trigger discharge and the anode. A thin film forming apparatus comprising a capacitor as the above.
【請求項2】カソードとしてのターゲット材料の周囲に
円筒状のアノードを配置し、カソード近辺にトリガ電極
を配置してなる薄膜形成装置を使用して、トリガ電極と
ターゲット材料との間に高電圧パルスを加えてトリガ放
電させた後、ターゲット材料上に発生するカソードスポ
ットとアノードとの間での主放電により発生した電子お
よびイオンを基板方向に加速移動させて基板上に金属薄
膜を形成させることを特徴とする薄膜形成方法。
2. A thin film forming apparatus in which a cylindrical anode is arranged around a target material as a cathode and a trigger electrode is arranged near the cathode, and a high voltage is applied between the trigger electrode and the target material. Electrons and ions generated by the main discharge between the cathode spot and the anode generated on the target material are accelerated and moved toward the substrate after a pulsed trigger discharge to form a metal thin film on the substrate. And a method for forming a thin film.
【請求項3】主放電をコンデンサを電源とするパルス放
電により行う請求項2に記載の薄膜形成方法。
3. The thin film forming method according to claim 2, wherein the main discharge is performed by pulse discharge using a capacitor as a power source.
JP34743095A 1995-12-13 1995-12-13 Thin film forming apparatus and thin film forming method Expired - Lifetime JP2857743B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34743095A JP2857743B2 (en) 1995-12-13 1995-12-13 Thin film forming apparatus and thin film forming method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34743095A JP2857743B2 (en) 1995-12-13 1995-12-13 Thin film forming apparatus and thin film forming method

Publications (2)

Publication Number Publication Date
JPH09165673A true JPH09165673A (en) 1997-06-24
JP2857743B2 JP2857743B2 (en) 1999-02-17

Family

ID=18390183

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2857743B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008037690A (en) * 2006-08-04 2008-02-21 Ulvac Japan Ltd Apparatus for forming carbon nanotube
JP2008253096A (en) * 2007-03-30 2008-10-16 Origin Electric Co Ltd Power supply for discharge load
JP2008291319A (en) * 2007-05-25 2008-12-04 Ulvac Japan Ltd Method for producing fine particle film
JP2009001914A (en) * 2008-09-22 2009-01-08 Ulvac Japan Ltd Vapor deposition source and vapor deposition system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008037690A (en) * 2006-08-04 2008-02-21 Ulvac Japan Ltd Apparatus for forming carbon nanotube
JP2008253096A (en) * 2007-03-30 2008-10-16 Origin Electric Co Ltd Power supply for discharge load
JP2008291319A (en) * 2007-05-25 2008-12-04 Ulvac Japan Ltd Method for producing fine particle film
JP2009001914A (en) * 2008-09-22 2009-01-08 Ulvac Japan Ltd Vapor deposition source and vapor deposition system

Also Published As

Publication number Publication date
JP2857743B2 (en) 1999-02-17

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