JPH09119903A - Image pick-up type inspection device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an image pick-up type inspection device for reliably inspecting an object to be inspected and being speedily carried at an arbitrary interval. SOLUTION: In the case of a shutter trigger mode, the image pick-up type inspection device 100 internally generates a one-pulse shutter trigger signal when a position detection signal Sk of an object B to be inspected is inputted from a photo sensor S, picks up an image once according to the generation timing, and outputs a video signal VS corresponding to one frame by interlace scanning or non-interlace scanning. In the case of a restart reset trigger mode, the image pick-up type inspection device 10 internally generates a restart reset trigger signal where a plurality of pulses continue when the position detection signal Sk of the object B is inputted from the photo sensor PS, picks up an image just two times according to the generation timing of each pulse and obtains image pick-up information corresponding to odd and even fields, and outputs a video signal VS corresponding to one frame by interlace scanning.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an image pickup type inspection apparatus, and more particularly, to an image pickup type inspection apparatus improved to surely inspect an article to be inspected which is conveyed at high speed and at an arbitrary interval.

[0002]

2. Description of the Related Art FIG. 9 is a block diagram showing an example of a conventional imaging type inspection system. This imaging type inspection system S51
Is a CCD (Charge Coup) that picks up an image of the article B to be inspected, which is conveyed in one direction (the direction of the arrow shown in the figure) by the belt conveyor CV, at 1/60 second intervals and outputs a video signal VS.
led Device) camera unit 400, a photo sensor PS that detects that the article B to be inspected has arrived at a position immediately before entering the imaging field of view of the CCD camera unit 400, and outputs a position detection signal Sk, and the position detection signal Sk Is input, the video signal VS is captured and analyzed to generate and output a display signal Vo and a quality determination signal NG, and a processing unit 500 and the display signal Vo. And a display device unit 200 that displays an image based on the above. The camera unit 400, the processing device unit 500, and the display device unit 200 are separate devices, and are connected to each other via a cable.

CCD of the CCD camera unit 400
As the image sensor, for example, a 1 / 2-inch interline transfer type CCD with 250,000 pixels is used. Also, the C
The speed of the electronic shutter of the CD camera unit 400 (exposure time of the CCD image sensor) is automatically adjusted in the range of 1/60 second to 1/10000 second, for example, according to the ambient brightness.

The processing unit 500 includes the C
A horizontal position setting volume VR1 and a horizontal width setting volume VR used to set an inspection region window in the imaging field of view of the CD camera unit 400 (shown by a chain line).
2, a vertical position setting volume VRa and a vertical width setting volume VRb are provided.

As shown in FIG. 10, the display device unit 2
On the screen G of 00, the image in the imaging field of view and the inspection area window W are displayed in an overlapping manner, so that the operator
While looking at the screen G, the horizontal position setting volume VR1, the horizontal width setting volume VR2, the vertical position setting volume VRa
And the vertical width setting volume VRb is operated to set the inspection region window W.

If the processing unit 500 takes in the video signal VS when the entire inspection object window W has entered the inspection area window W and analyzes the image in the inspection area window W, An inspection can be performed.

[0007]

However, when a frame in which the entire article B to be inspected is contained in the inspection area window W cannot be captured by the processing apparatus unit 500, for example, in (a) or (b) of FIG. As shown, if the processing device unit 500 takes in a frame in which a part of the inspected article B protrudes from the inspection area window W, the inspection cannot be performed normally. Therefore, the transport speed is sufficiently reduced to sufficiently increase the probability that the frame in which the entire inspected article B is contained in the inspection area window W can be captured, or the interval between the inspected articles B is accurately maintained and the inspected article B is accurately maintained. It is necessary to synchronize the carrying position of the article B and the timing of imaging so that the frame in which the entire article B to be inspected is contained in the inspection area window W can be reliably taken in. However, if the conveying speed is lowered, the productivity cannot be improved, and maintaining the interval between the inspected articles B accurately causes a problem that the work load increases. Further, since the speed of the electronic shutter of the CCD camera 400 is forcibly automatically adjusted according to the ambient brightness, there is a problem that the image of the article B to be inspected is shaken when it is conveyed at a high speed. Therefore, an object of the present invention is to provide an imaging type inspection apparatus capable of surely inspecting an article to be inspected which is conveyed at high speed and at an arbitrary interval.

[0008]

According to a first aspect of the present invention, there is provided an image pickup means for picking up an image of a conveyed article to be inspected and outputting a video signal, and an inspection of the article to be inspected based on the video signal. In an imaging type inspection device having an inspection means for performing the above, the image pickup means is operated at a predetermined shutter trigger speed by a shutter trigger signal generated when the position of the inspected article is mechanically or electronically acquired. There is provided an imaging type inspection apparatus, which is characterized in that the imaging information which is substantially exposed and which is accumulated in the imaging unit or saved in the temporary storage unit is read. In the imaging inspection apparatus according to the first aspect, the timing of imaging is controlled by the shutter trigger signal generated when the position of the inspected article is mechanically or electronically acquired. Therefore, even when the transport speed is increased, it is possible to reliably capture an image when the article to be inspected enters the imaging field of view. In particular, when the inspection area is set, it becomes possible to take an image when the entire inspected article enters the inspection area, which is highly useful.

According to a second aspect, the present invention comprises an image pickup means for picking up an image of a conveyed article to be inspected and outputting a video signal, and an inspection means for inspecting the article to be inspected based on the video signal. In a provided imaging type inspection apparatus, the imaging means is predetermined at a plurality of timings different in time by a restart reset trigger signal generated when the position of the inspected article is mechanically or electronically acquired. The exposure is substantially performed only at the shutter speed, and the image pickup information of each timing accumulated in the image pickup means or the image pickup information of each timing accumulated in the temporary storage means is read as the image pickup information corresponding to one field, and the interlace scanning method is used. Provided is an imaging type inspection apparatus characterized by performing the scanning of. In the imaging inspection apparatus according to the second aspect, the restart reset trigger signal generated when the position of the article to be inspected is mechanically or electronically acquired causes the imaging means to be timed at a plurality of different timings. The image is exposed and imaged, the image pickup information at each timing is read as image pickup information corresponding to one field, and interlaced scanning is performed. Therefore, it is possible to perform complete interlaced scanning in which imaging is performed once for each of a plurality of fields.

According to a third aspect of the present invention, in the imaging type inspection apparatus having the above-mentioned structure, when a restart reset trigger signal continuously generated from the first shot to the fourth shot is input, the second shot is generated. Of the restart reset trigger signal, the first image pickup means is substantially exposed for a predetermined shutter speed to store image pickup information corresponding to the first field in the first image pickup means. Image capturing information corresponding to the second field by exposing the second image capturing means substantially for a predetermined shutter speed from the time when the third restart reset trigger signal is generated. Is stored in the second image pickup means or saved in the second temporary storage means and the image pickup information corresponding to the first field is read out, and the fourth restart reset is performed. To provide an imaging inspection apparatus which is characterized in the generation timing of the trigger signal by reading out the imaging information corresponding to the second field. The imaging inspection apparatus of the third aspect uses the restart reset trigger signal continuously generated from the first shot to the fourth shot. When the second restart reset trigger signal is generated, exposure is performed to acquire the image pickup information corresponding to the first field. When the third restart reset trigger signal is generated, exposure is performed to obtain the imaging information corresponding to the second field, and the imaging information corresponding to the first field is read. When the fourth restart reset trigger signal is generated, the image pickup information corresponding to the second field is read. Therefore, it is possible to perform interlaced scanning (frame accumulation interlaced scanning) for outputting one frame at a timing exactly delayed by one frame from the generation of the first restart reset trigger signal. As a result, it becomes easy to achieve frame synchronization completely, which is more convenient for post-processing (for example, processing for detecting an abnormal portion).

According to a fourth aspect of the present invention, in the imaging type inspection apparatus having the above-mentioned structure, when a restart reset trigger signal continuously generated from the first to the third shots is input, the first shot Of the restart reset trigger signal, the first image pickup means is substantially exposed for a predetermined shutter speed to store image pickup information corresponding to the first field in the first image pickup means. In the temporary storage means and substantially exposes the second image pickup means for a predetermined shutter speed from the time when the second restart reset trigger signal is generated, and the image pickup information corresponding to the second field is obtained. The image capture information corresponding to the first field is read out by accumulating in the second image pickup means or saved in the second temporary storage means, and the third restart reset To provide an imaging inspection apparatus characterized by reading out the imaging information corresponding to the second field from the time point of generation of gas signal. The imaging inspection apparatus according to the fourth aspect uses a restart reset trigger signal continuously generated from the first shot to the third shot. When the first restart reset trigger signal is generated, exposure is performed to acquire the imaging information corresponding to the first field.
When the second restart reset trigger signal is generated,
Exposure is performed to obtain imaging information corresponding to the second field, and imaging information corresponding to the first field is read. When the third restart reset trigger signal is generated, the imaging information corresponding to the second field is read. Therefore, immediately after the second restart reset trigger signal is generated, interlaced scanning (field storage interlaced scanning) for outputting one frame can be performed. As a result, the video signal can be output quickly, and the processing efficiency can be further improved.

[0012] In a fifth aspect, the present invention provides an imaging type inspection apparatus characterized in that the shutter trigger speed in the above configuration or the shutter speed in the above configuration can be set from the outside. In the imaging type inspection apparatus of the fifth aspect, the shutter trigger speed or shutter speed can be set externally. Therefore, even when the transportation speed is high, the image of the inspected article can be obtained in high quality without blurring.

In the above structure, "shutter trigger signal" or "restart reset trigger signal"
May be internally generated when the position detection signal of the article to be inspected is sent from the outside, or may be input from the outside. Further, in the above-mentioned configuration, "substantially exposing" may be a method of directly opening and closing the incident light to the image pickup means like a mechanical shutter method, or a predetermined exposure time like an electronic shutter method. This means that only the image pickup information (for example, electric charge) is accumulated and the image pickup information is released during the other period.

[0014]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in more detail with reference to the embodiments shown in the drawings. Note that the present invention is not limited by this.

FIG. 1 is a block diagram showing an image pickup type inspection system S1 including an image pickup type inspection apparatus according to an embodiment of the present invention. This imaging type inspection system S1 is a belt conveyor C.
A photosensor PS that detects that the article B to be inspected, which is conveyed in one direction (the arrow direction in the drawing) by V, has arrived at the position immediately before entering the imaging visual field of the imaging type inspection apparatus 100, and outputs a position detection signal Sk Then, the article B to be inspected is imaged at a timing triggered by the input of the position detection signal Sk to generate a video signal VS and a display signal Vo.
It is provided with an image pickup type inspection device 100 that outputs and outputs a quality determination signal NG and a display device unit 200 that displays an image by the display signal Vo. The imaging type inspection device 100 and the display device unit 200
And are separate devices, and are connected via a cable.

The video signal VS is a raw (no processing is performed) video signal obtained by image pickup, and the condition of scratches or foreign matter on the article B to be inspected is recorded as it is on a video tape recorder VTR or the like. Used to do.

The display signal Vo is a video signal which has been subjected to processing such as bright line display of the abnormal portion so that the detected position of the abnormal portion can be easily visually recognized (specific processing contents will be described in detail later). ).

The image pickup type inspection apparatus 100 has a built-in C
Horizontal position setting volume VR used to set the inspection region window within the imaging field of view of the CD imaging circuit (1 in FIG. 2)
1, horizontal width setting volume VR2, vertical position setting volume VRa1, vertical width setting volume VRb, shutter trigger speed setting digital switch 18, shutter speed setting digital switch 82, and mode selector switch 83 (18, 82, The function of 83 will be described later in detail). Further, the imaging type inspection device 1
00 is provided with a light emitting diode 101 which is turned on when an abnormal portion is detected in the inspection area.

The inspection area window may be set by the same method as that of the processing unit 500 of the conventional imaging type inspection system S51 (see FIG. 9), or the light emitting diode 1 may be used.
It may be performed by externally identifying the result of the quality judgment by blinking 01 (in the latter case, the display device unit 2
Even if 00 is not set, there is an advantage that it can be set.

FIG. 2 is a block diagram of the configuration of the imaging type inspection apparatus 100. This imaging type inspection apparatus 100 is a CC
D image pickup circuit 1 and shutter trigger signal generation circuit 19
A restart reset trigger signal generation circuit 81, an image processing unit 10, a synchronization signal generation circuit 8, a window setting unit 20, a window frame generation unit 30, and a binarization unit 40.
The abnormal part detection circuit 50 and the output unit 70 are basically housed in a single housing. Also, the C
A shutter trigger speed setting digital switch 18 and a shutter speed setting digital switch 82 are connected to the CD imaging circuit 1. Further, a mode selector switch 83 for selectively inputting the position detection signal Sk is connected to either one of the shutter trigger signal generating circuit 19 and the restart reset trigger signal generating circuit 81.

As shown in FIG. 3, the CCD image pickup circuit 1
Is a CCD image pickup device 111 and the CCD image pickup device 11
Latch circuit 113a for temporarily storing imaging information DPa corresponding to an odd field (odd-numbered scanning line) obtained by scanning 1 and an even field (even number) obtained by scanning the CCD image sensor 111 Latch circuit 11 for temporarily storing the imaging information DPb corresponding to the (th scanning line)
3b and the CCD image pickup device 11 using an electronic shutter system
A control circuit 114 for controlling the exposure of 1 or controlling the operation of each part, and a video signal generation circuit 115 for generating a video signal VS based on the imaging information DSa, DSb serially read from the latch circuits 113a, 113b. It is configured to include. The exposure time of the CCD image pickup device 111 can be set by the shutter trigger speed setting digital switch 18 or the shutter speed setting digital switch 82.

Returning to FIG. 2, the shutter trigger signal generating circuit 19 generates a one-pulse shutter trigger signal GS when the position detection signal Sk is sent from the photo sensor PS (see FIG. 1). In the shutter trigger mode, the CCD image pickup circuit 1 picks up an image when the shutter trigger signal GS is generated (details of the processing will be described later). The restart reset trigger signal generation circuit 81 is triggered by the position detection signal Sk sent from the photosensor PS to be a restart reset trigger signal G of continuous 3 pulses or continuous 4 pulses.
Generate R. In the restart reset trigger mode, the CCD image pickup circuit 1 picks up an image in response to the generation of the restart reset trigger signal GR (specific processing contents will be described in detail later).

The image processing section 10 processes the video signal VS input from the CCD image pickup circuit 1 to obtain a display signal Vo. The image processing unit 10 includes a delay coil 11, an amplifier 12, a window frame display video switch 13,
Anomaly detection position display video switch 14 and amplifier 15
And a line driver 16.
The sync signal generation circuit 8 outputs a blanking signal BL, a horizontal sync signal HD, and a vertical sync signal VD.

The window setting unit 20 includes a horizontal position setting volume VR1, a horizontal width setting volume VR2, a vertical position setting volume VRa, and a vertical width setting volume VRb.
A horizontal position setting circuit 21, a horizontal width setting circuit 22,
Vertical position setting circuit 23, vertical width setting circuit 24, AN
And a D circuit 25.

The window frame generation section 30 includes a right frame generation timer 31 and a left frame generation timer 32 for generating display signals for the upper, lower, left and right frames of the inspection area window.
, A lower frame generation timer 33, and an upper frame generation timer 34
And an OR circuit 35 for logically operating the outputs of those timers,
36 and 38 and an AND circuit 37.

The binarizing section 40 includes an amplifier 41 for amplifying the video signal VS, a differentiating circuit 42 for which the differentiating amount can be switched by the differentiating amount switch 43, and an integral for which the integral amount can be switched by the integral amount changing switch 45. It comprises a circuit 44, a binarization circuit 46 for binarizing with a predetermined threshold value to obtain a binary serial video signal SV, and an oscillator (for example, 6.29 MHz) 47.

The abnormal portion detecting circuit 50 detects an abnormal portion in the inspection area (see FIG. 4 for the configuration and operation).
See later for more details).

The output unit 70 is the abnormal portion detecting circuit 50.
When it is determined to be defective, the pass / fail determination signal NG is output.
The output unit 70 includes a light emitting diode 101 that lights up when it is determined to be defective, and a contactless relay 71 that outputs “ON” as a pass / fail determination signal NG when determined to be defective.
Are provided.

As described above, by accommodating each of the constituent elements in one housing, a plurality of independent devices (CCD camera unit 40) like the conventional imaging type inspection system S51 are provided.
0, processing device unit 500, display device unit 20
0) need not be installed or connected by a cable, and there is an advantage that installation labor and space can be saved. In addition, there is an advantage that usability can be improved.

FIG. 4 is a block diagram showing the configuration of the abnormal portion detection circuit 50. This abnormal part detection circuit 50 sets a digital switch 52 for setting a horizontal minimum count value of an abnormal part to be detected (minimum horizontal width regarded as an abnormal part), and a detected abnormal part count value (horizontal direction A horizontal detection width determination circuit 51 that outputs a trigger signal corresponding to a detection width) exceeding the minimum count value,
One horizontal scanning period timer 53 that outputs a pulse signal having a width of one horizontal scanning period by the trigger signal, and an AND circuit 54 that outputs a pulse signal of a logical product of the pulse signal and the horizontal synchronizing signal HD should be detected. The digital switch 57 for setting the vertical minimum count value of the abnormal portion (minimum vertical length to be considered as an abnormal portion), and the count value (vertical detection length) of the logical product pulse signal are the minimum counts. A vertical detection length determination circuit 56 that outputs a detection pulse signal corresponding to a value exceeding the value, a digital switch 60 that sets a minimum count value of the number of detected abnormal parts that should output a quality determination signal NG, and The detection number determination circuit 59 that outputs a trigger signal when the count value of the detection pulse signal exceeds the minimum count value, and the trigger signal No only constant time contact relay drive signal F
Is set to "L", and the abnormal detection position display video switch 14 is turned to a white level for a predetermined length (time) at the timing of the pulse signal of the logical product in order to display the detection position of the abnormal portion as a bright line. A detection position bright line display length setting circuit 55 that outputs a bright line display video switch switching signal SW to switch to Wo, and a logical sum of the detection pulse signal and the vertical synchronization signal VD are reset to the vertical direction detection length determination circuit 56. It is basically configured by including an OR circuit 58 which outputs as a signal.

Next, the operation of taking an image with the imaging type inspection apparatus 100 will be described in detail.

(1) Shutter Trigger Mode The shutter trigger mode is an image pickup mode in which an image is picked up once at a timing triggered by the generation of the position detection signal Sk (see FIG. 1) to perform interlaced scanning or non-interlaced scanning. Is. At this time, the mode selector switch 8
The shutter trigger signal generating circuit 19 receives the position detection signal Sk sent from the photo sensor PS (see FIG. 1).
(See FIG. 2).

First, referring to the time chart of FIG.
The case of performing interlaced scanning will be described. As shown in (a) of FIG. 5, when the position detection signal Sk is sent at time t1, the shutter trigger signal generating circuit 19 delays by a delay time td as shown in (b) of FIG. At t2, the shutter trigger signal GS is generated. The delay time td corresponds to the time from when the article B to be inspected is detected by the photosensor PS to when it is moved to substantially the center of the inspection area. Then, as shown in FIG. 5C, the CCD
The control circuit 114 of the image pickup circuit 1 substantially exposes the CCD image pickup element 111 for a predetermined shutter trigger speed ts from the time point (time t2) of generation of the shutter trigger signal GS (charge for a time corresponding to the shutter trigger speed ts). Is stored, and control is performed to release the charges during other periods). The shutter trigger speed ts is
By using the shutter trigger speed setting digital switch 18, for example, between 1/60 second and 1/1500 second, 12
It can be set in 00 stages.

As shown in FIG. 5D, at time t3 when the exposure ends, the image pickup information Dpa corresponding to the odd field is latched in the latch circuit 113a and the image pickup information Dpb corresponding to the even field is latched. Latch to. On the other hand, as shown in (e) of FIG. 5, the synchronization signal generation circuit 8 (see FIG. 2) causes the vertical synchronization signal V
D is generated, and a predetermined vertical synchronization cycle tv (for example, 1/6
At time t4 after 0 second), the next vertical synchronizing signal VD is generated.

As shown in FIG. 5 (f), the control circuit 114 of the CCD image pickup circuit 1 successively reads out the image pickup information DSa corresponding to the odd fields from the latch circuit 113a between time t3 and time t4. . Further, as shown in (g) of FIG. 5, after the time t4, the imaging information DSb corresponding to the even field from the latch circuit 113b.
Are read one after another with a predetermined read clock. The frequency of the read clock is, for example, 14.31818 MHz.
Therefore, as shown in (h) of FIG. 5, the video signal generation circuit 115 of the CCD image pickup circuit 1 generates an odd field from time t3 to time t4, and an even field after time t4. The video signal VS of one frame by race scanning is output.

Next, referring to the time chart of FIG.
The case of performing non-interlaced scanning will be described. As shown in (a) to (c) of FIG. 6, time t1 to time t3
Position detection signal Sk and shutter trigger signal GS,
The waveform of the exposure timing is the same as that of (a) to (c) of FIG. As shown in (d) of FIG. 6, the exposure end time t
In 3, the image pickup information Dpa corresponding to the odd field is latched in the latch circuit 113a, and the image pickup information Dpb corresponding to the even field is latched in the latch circuit 113b. On the other hand, as shown in (e) of FIG. 5, the synchronization signal generation circuit 8 (see FIG. 2) generates the vertical synchronization signal VD at time t3.

As shown in FIG. 6 (f), in FIG. 3, the control circuit 114 of the CCD image pickup circuit 1 is from time t3 to t6 (time t6 is, for example, time 1/30 seconds after time t3). During this period, the image pickup information DSa corresponding to odd fields is sequentially read from the latch circuit 113a, and the image pickup information DSb corresponding to even fields is read from the latch circuit 113b at a predetermined read clock (frequency is interlaced scanning). 1/2 is enough) to read one after another. Therefore, as shown in (h) of FIG. 6, the video signal generation circuit 115 of the CCD image pickup circuit 1 is
From time t3 to time t6, the video signal VS of one frame by non-interlaced scanning is output.

As described above, this imaging type inspection apparatus 100
Then, in the shutter trigger mode, the image capturing timing is controlled by the shutter trigger signal GS triggered by the acquisition of the position of the inspected article B by the photo sensor PS. Therefore, even if the conveyance speed by the belt conveyor CV is increased or the intervals between the articles B to be inspected are irregular, as shown in the state shown in FIG.
An image can be picked up so that the entire inspected article B can be put in, and the inspection can be surely performed.

(2) Restart reset trigger mode In the restart reset trigger mode, the position detection signal Sk
(See FIG. 1) is an imaging mode in which interlaced scanning is performed by performing imaging only twice at temporally different timings. At this time, the mode selector switch 83
Is set to a state in which the position detection signal Sk from the photo sensor PS (see FIG. 1) is input to the restart reset trigger signal generation circuit 81 (see FIG. 2).

First, referring to the time chart of FIG.
A case of performing frame accumulation interlaced scanning will be described. When the position detection signal Sk is sent at time t1 as shown in FIG. 7A, the restart reset trigger signal generation circuit 81 causes the restart reset trigger signal Sk to be output as shown in FIG. As GR, at times t2, t7,
At t8 and t9, the first to fourth pulses P1, P2, P
3 and P4 are generated. The delay time td corresponds to the time from when the article B to be inspected is detected by the photosensor PS to when it is moved to substantially the center of the inspection area. Also, the continuous 4
The generation period of the pulses P1 to P4 is equal to the vertical synchronization period tv (for example, 1/60 seconds).

As shown in FIG. 7C, the control circuit 114 of the CCD image pickup circuit 1 controls the CCD for a predetermined shutter speed tr from the time point (time t7) of the second pulse P2 of the shutter trigger signal GR. The element surface corresponding to the odd field of the image sensor 111 is substantially exposed (time t
Control is performed to release the electric charge accumulated from 2 to time t7). The shutter trigger speed tr is, for example, 1/60 sec, 1/125 sec, 1/250 sec, 1/5 by the shutter speed setting digital switch 82.
00 seconds, 1/1000 seconds, 1/2000 seconds, 1/400
It can be set to either 0 seconds or 1/10000 seconds.
Further, as shown in (d) of FIG. 7, the control circuit 114 of the CCD image pickup circuit 1 picks up the CCD image at a predetermined shutter speed tr from the generation time point (time t8) of the third pulse P3 of the shutter trigger signal GR. The element surface corresponding to the even field of the element 111 is substantially exposed (control is performed to release the charge accumulated from time t7 to time t8).

As shown in FIG. 7E, at the exposure end time t10, the image pickup information Dpa corresponding to the odd-numbered field.
Are latched in the latch circuit 113a. Further, at time t11 when the exposure ends, the imaging information Dp corresponding to the even field
b is latched in the latch circuit 113b.

On the other hand, as shown in (g) of FIG. 7, the synchronizing signal generating circuit 8 (see FIG. 2) generates the vertical synchronizing signal VD at time t8 in synchronization with the generation of the restart reset trigger signal GR. Then, the next vertical synchronizing signal VD is generated at time t9 after the predetermined vertical synchronizing period tv. As shown in FIG. 7H, the control circuit 11 of the CCD image pickup circuit 1
4 is the latch circuit 1 between the time t8 and the time t9.
The imaging information DSa corresponding to the odd fields is sequentially read from 13a. Further, as shown in (i) of FIG. 7, after the time t9, the image pickup information DSb corresponding to the even field is sequentially read from the latch circuit 113b at a predetermined read clock. Therefore, as shown in (j) of FIG. 7, the video signal generation circuit 115 of the CCD image pickup circuit 1 is
An odd field is generated from time t8 to time t9, and an even field is generated after time t9, and one frame of the video signal V by interlaced scanning is generated.
Output S.

As described above, this imaging type inspection apparatus 100
Then, when performing frame accumulation interlaced scanning in the restart reset trigger mode, one frame (accurately delayed by one frame after the first pulse P1 of the restart reset trigger signal GR is generated The video signal VS corresponding to the odd field and the even field is output. Therefore, it becomes easy to achieve frame synchronization completely, which is more convenient for inspection of the abnormal portion detection circuit 50 and the like.

Next, referring to the time chart of FIG.
A case of performing field storage interlaced scanning will be described. When the position detection signal Sk is sent at time t1 as shown in FIG. 8A, the restart reset trigger signal generation circuit 81 delays by the delay time td as shown in FIG. 8B. , Restart reset trigger signal GR
As a result, the first to third pulses are generated at times t2, t7, and t8. The delay time td corresponds to the time from when the article B to be inspected is detected by the photosensor PS to when it is moved to substantially the center of the inspection area. The generation period of the continuous three pulses P1 to P3 is equal to the vertical synchronization period tv (for example, 1/60 seconds).

As shown in FIG. 8C, the control circuit 114 of the CCD image pickup circuit 1 controls the CCD for a predetermined shutter speed tr from the time point (time t2) of the first pulse P1 of the shutter trigger signal GR. The element surface corresponding to the odd-numbered field of the image sensor 111 is substantially exposed (the charge is accumulated for a time corresponding to the shutter speed tr, and the charge is released during the other period). Further, as shown in (d) of FIG. 8, the CCD image pickup circuit 114 has an even number of CCD image pickup elements 111 for a predetermined shutter speed tr from the time when the second pulse P2 of the shutter trigger signal GR is generated (time t7). The field-corresponding element surface is substantially exposed (control is performed to release the charge accumulated between time t2 and time t7).

As shown in (e) of FIG. 8, at the exposure end time t21, the image pickup information Dpa corresponding to the odd-numbered field.
Are latched in the latch circuit 113a. Further, at time t22 when the exposure ends, the imaging information Dp corresponding to the even field is generated.
b is latched in the latch circuit 113b.

On the other hand, as shown in (g) of FIG. 8, the synchronizing signal generating circuit 8 (see FIG. 2) generates the vertical synchronizing signal VD at time t7 in synchronization with the generation of the restart reset trigger signal GR. Then, the next vertical synchronizing signal VD is generated at time t8 after the predetermined vertical synchronizing period tv. As shown in FIG. 8H, the control circuit 11 of the CCD image pickup circuit 1
4 is the latch circuit 1 between time t7 and time t8.
The imaging information DSa corresponding to the odd fields is sequentially read from 13a. Further, as shown in (i) of FIG. 8, after the time t8, the image pickup information DSb corresponding to the even field is sequentially read from the latch circuit 113b at a predetermined read clock. Therefore, as shown in (j) of FIG. 8, the video signal generation circuit 115 of the CCD image pickup circuit 1 is
An odd field is generated from time t7 to time t8, and an even field is generated after time t8, and one frame of video signal V by interlaced scanning is generated.
Output S.

As described above, this imaging type inspection apparatus 100
Then, when performing field storage interlaced scanning in the restart reset trigger mode, immediately after the second pulse P2 of the restart reset trigger signal GR is generated,
The video signal VS corresponding to one frame (odd field and even field) is output. Therefore, the video signal VS can be output quickly, and the processing efficiency can be further improved.

In the above embodiment, the shutter trigger signal GS and the restart are generated by the shutter trigger signal generation circuit 19 and the restart reset trigger signal generation circuit 81 (see FIG. 2) housed inside the image pickup type inspection apparatus 100. Although the reset trigger signal GR is generated, these may be generated externally. In this case,
There is an advantage that the structure of the imaging type inspection device 100 can be simplified and further downsized. In the above embodiment, the position of the inspected article B is electronically acquired using the photo sensor PS (see FIG. 1), but the position of the inspected article B is mechanically acquired using a mechanical sensor or the like. You may. Further, when an image is taken by the shutter trigger signal GS or the restart reset trigger signal GR, the video signal VS is held in a frame memory or the like (not shown), and an image corresponding to the next inspected article B is taken. Up to that point, the video signal VS may be continuously output as a fixed image (as a still image), or image pickup may be performed at each timing determined by the vertical synchronization signal VD and the video signal VS may be output in real time (as a moving image). .

[0051]

According to the imaging type inspection apparatus of the present invention, the articles to be inspected can be surely inspected while being conveyed at high speed and at arbitrary intervals, so that the processing efficiency can be improved and a large number of articles to be inspected in a short time. Be able to inspect. In addition, since the exposure time (shutter trigger speed, shutter speed) at the time of image capturing can be set from the outside, it is possible to prevent blurring when the image is conveyed at high speed and improve inspection accuracy.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of an imaging type inspection system including an imaging type inspection apparatus according to an embodiment of the present invention.

FIG. 2 is a configuration block diagram of an imaging type inspection apparatus according to an embodiment of the present invention.

3 is a configuration diagram of a CCD image pickup circuit in the image pickup type inspection apparatus of FIG.

4 is a configuration diagram of an abnormal portion detection circuit in the imaging type inspection apparatus of FIG.

5 is a time chart showing an operation in a shutter trigger mode in the imaging type inspection apparatus of FIG.

FIG. 6 is another time chart showing the operation in the shutter trigger mode in the imaging type inspection apparatus in FIG.

7 is a time chart showing the operation of the restart reset mode in the imaging type inspection apparatus of FIG.

8 is another time chart showing the operation of the restart reset mode in the imaging type inspection apparatus of FIG.

FIG. 9 is a configuration diagram showing an example of a conventional imaging type inspection system.

10 is an explanatory diagram showing an example of a screen when setting an inspection area in the imaging type inspection apparatus of FIG.

11 is an explanatory diagram showing a problem in the imaging type inspection apparatus of FIG. 9. FIG.

[Explanation of symbols]

100 image pickup type inspection device 1 CCD image pickup circuit 8 synchronization signal generation circuit 18 shutter trigger speed setting digital switch 19 shutter trigger signal generation circuit 20 window setting unit 30 window frame generation unit 50 abnormal part detection circuit 81 restart reset trigger signal generation circuit 82 Shutter speed setting digital switch 83 Mode change switch 111 CCD image sensor 113a Latch circuit 113b Latch circuit 114 Control circuit 115 Video signal generation circuit B Inspected article CV Belt conveyor PS Photo sensor S1 Image inspection system

Claims (5)

[Claims] 1. An imaging type inspection apparatus comprising: an image pickup means for picking up an image of a conveyed article to be inspected and outputting a video signal; and an inspection means for inspecting the article to be inspected based on the video signal. Whether the image pickup means is substantially exposed at a predetermined shutter trigger speed by a shutter trigger signal generated when the position of the inspected article is mechanically or electronically acquired, and is stored in the image pickup means? Alternatively, the imaging type inspection apparatus is characterized by reading the imaging information saved in the temporary storage means. 2. An image pickup type inspection apparatus comprising: an image pickup means for picking up an image of a conveyed inspection object and outputting a video signal; and an inspection means for inspecting the inspection object based on the video signal. The restart reset trigger signal generated upon mechanically or electronically acquiring the position of the article to be inspected causes the imaging means to be substantially exposed at a predetermined shutter speed at a plurality of timings different in time. ,
It is characterized in that the imaging information of each timing accumulated in the imaging means or the imaging information of each timing accumulated in the temporary storage means is read out as imaging information corresponding to one field, and scanning of the interlaced scanning method is performed. Imaging type inspection device. 3. The imaging type inspection apparatus according to claim 2, wherein when a restart reset trigger signal continuously generated from the first shot to the fourth shot is input, the restart reset trigger of the second shot is input. The first image pickup means is substantially exposed for a predetermined shutter speed from the time when the signal is generated, and the image pickup information corresponding to the first field is accumulated in the first image pickup means or is stored in the first temporary storage means. The second image pickup means is substantially exposed by the predetermined shutter speed from the time of generation of the third restart reset trigger signal, and the image pickup information corresponding to the second field is obtained as the second image pickup information. The point of time when the fourth restart reset trigger signal is generated, which is stored in the image pickup unit or saved in the second temporary storage unit and read out the image pickup information corresponding to the first field. An imaging type inspection apparatus, which reads out imaging information corresponding to the second field from the. 4. The imaging inspection apparatus according to claim 2, wherein when a restart reset trigger signal continuously generated from the first shot to the third shot is input, the restart reset trigger of the first shot is input. The first image pickup means is substantially exposed for a predetermined shutter speed from the time when the signal is generated, and the image pickup information corresponding to the first field is accumulated in the first image pickup means or is stored in the first temporary storage means. The second image pickup means is evacuated and the second image pickup means is substantially exposed for a predetermined shutter speed from the time when the second restart reset trigger signal is generated, and the image pickup information corresponding to the second field is obtained by the second image pickup means. Or at the time of generation of the third restart-reset trigger signal at the time of storing the image data in the second temporary storage means and reading the imaging information corresponding to the first field. The imaging type inspection device is characterized by reading imaging information corresponding to the second field. 5. An imaging type inspection apparatus, wherein the shutter trigger speed according to claim 1 or the shutter speed according to any one of claims 2 to 4 can be set from the outside.