JPH0894468A - Capacitive pressure sensor - Google Patents

Capacitive pressure sensor

Info

Publication number
JPH0894468A
JPH0894468A JP22691194A JP22691194A JPH0894468A JP H0894468 A JPH0894468 A JP H0894468A JP 22691194 A JP22691194 A JP 22691194A JP 22691194 A JP22691194 A JP 22691194A JP H0894468 A JPH0894468 A JP H0894468A
Authority
JP
Japan
Prior art keywords
pressure
sensor chip
pressure sensor
sensor
shield material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP22691194A
Other languages
Japanese (ja)
Inventor
Kiyoshi Miura
清 三浦
Masahiro Sato
正博 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokin Corp
Original Assignee
Tokin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokin Corp filed Critical Tokin Corp
Priority to JP22691194A priority Critical patent/JPH0894468A/en
Publication of JPH0894468A publication Critical patent/JPH0894468A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Landscapes

  • Measuring Fluid Pressure (AREA)

Abstract

PURPOSE: To obtain a capacitive pressure sensor which is not susceptible to stray capacity and external field and can detect the pressure accurately. CONSTITUTION: The capacitive pressure sensor comprises a sensor chip 15. The sensor chip 15 comprises a silicon substrate 11 provided with an electrode part 16 and a glass substrate 12 provided with a diaphragm part 13 which is deformed depending on the pressure. The diaphragm part 13 and the electrode part 16 are disposed oppositely through a gap and the silicon substrate 11 is bonded to the glass substrate 12. The pressure sensor detects the pressure based on the variation of capacitance between the diaphragm part 13 and the electrode part 16 due to variation in the width of the gap caused by the pressure being applied to the diaphragm part 13. The sensor chip 15 is mounted on a shield member, also serves as a lead terminal 31, disposed in a sealed housing.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は,静電容量型圧力センサ
に関し,特に,シリコン基板とガラス基板とにそれぞれ
電極を成形して各電極面を対向させてシリコン基板とガ
ラス基板とを接合した静電容量型圧力センサに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a capacitance type pressure sensor, and in particular, electrodes are formed on a silicon substrate and a glass substrate respectively, and the electrode surfaces are opposed to each other to bond the silicon substrate and the glass substrate. The present invention relates to a capacitance type pressure sensor.

【0002】[0002]

【従来の技術】一般に,この種の静電容量型圧力センサ
として,図2に示す圧力センサが知られている。図2に
示す圧力センサは静電容量型圧力センサであって,シリ
コン基板11には,圧力に応じて変形するダイアフラム
部13が形成され,ガラス基板12上には固定電極16
が形成されている。シリコン基板11とガラス基板12
とはその一部において接合されており,これによって,
ダイアフラム部13の下側にはキャビティー部14が形
成されることになる。これらシリコン基板11及びガラ
ス基板12によってセンサチップ15が構成され,セン
サチップ15はガラス基板12によって台座23上に接
着されている。また,センサチップ15を構成するガラ
ス基板12及びセンサチップ15が配置された台座23
に大気圧導入用,または被測定圧力と比較する圧力を導
入する為の通路19及び20が形成されている。台座2
3には,モールド成型時に一緒に作成されたリード端子
24が配置されており,リード端子24と固定電極16
とはリード線18によって電気的に接続されている。
2. Description of the Related Art Generally, a pressure sensor shown in FIG. 2 is known as this type of capacitance type pressure sensor. The pressure sensor shown in FIG. 2 is a capacitance type pressure sensor, in which a silicon substrate 11 is formed with a diaphragm portion 13 that deforms in response to pressure, and a fixed electrode 16 is formed on a glass substrate 12.
Are formed. Silicon substrate 11 and glass substrate 12
And are joined at a part of them, and
A cavity portion 14 is formed below the diaphragm portion 13. The silicon substrate 11 and the glass substrate 12 form a sensor chip 15, and the sensor chip 15 is bonded to the pedestal 23 by the glass substrate 12. Further, the glass substrate 12 forming the sensor chip 15 and the pedestal 23 on which the sensor chip 15 is arranged
There are formed passages 19 and 20 for introducing atmospheric pressure or for introducing a pressure to be compared with the measured pressure. Pedestal 2
3, lead terminals 24, which are formed together at the time of molding, are arranged.
And are electrically connected by a lead wire 18.

【0003】センサチップ15には横穴が設けられ,こ
れによって固定電極16が外部に引き出される。その
後,キャビティー14とセンサチップ外領域とを隔離す
るため,横穴は封止剤17によって封止される。そし
て,台座23と被測定圧力導入の為の通路21を設けた
カバー部材としてのモールド材のキャップ22とは超音
波溶着によってシールされる。
The sensor chip 15 is provided with a lateral hole, by which the fixed electrode 16 is drawn out. After that, the lateral hole is sealed with a sealant 17 in order to separate the cavity 14 from the area outside the sensor chip. Then, the pedestal 23 and the cap 22 of the molding material as the cover member provided with the passage 21 for introducing the measured pressure are sealed by ultrasonic welding.

【0004】図示の静電容量型圧力センサでは,ダイア
フラム部13に圧力が加わると,圧力の大きさに応じて
ダイアフラム部13が変形する。ダイアフラム部13の
変形によって,ダイアフラム部13と固定電極16との
間のギャップが変化することになる。ここで,ダイアフ
ラム部13と固定電極16との間には,c=ξ(A/
d)の関係がある。なお,cは静電容量,ξは空気の誘
電率,Aは電極面積,dは電極間ギャップ幅である。
In the illustrated capacitance type pressure sensor, when pressure is applied to the diaphragm portion 13, the diaphragm portion 13 is deformed according to the magnitude of the pressure. The deformation of the diaphragm portion 13 changes the gap between the diaphragm portion 13 and the fixed electrode 16. Here, between the diaphragm portion 13 and the fixed electrode 16, c = ξ (A /
There is a relationship of d). Note that c is capacitance, ξ is the dielectric constant of air, A is the electrode area, and d is the interelectrode gap width.

【0005】従って,ギャップ幅の変化によって静電容
量が変化することになり,さらに,力とギャップとの間
には一定の相関関係があるから,静電容量を検出するこ
とによって圧力を知ることができる。
Therefore, the capacitance changes due to the change in the gap width, and since there is a certain correlation between the force and the gap, the pressure can be known by detecting the capacitance. You can

【0006】[0006]

【発明が解決しようとする課題】しかしながら,前述し
た従来の静電容量形圧力センサでは,検出する圧力によ
って変化する静電容量は,1乃至2pFと微小で,浮遊
容量の影響を受けやすい為検出すべき圧力以外の影響が
大きく正確な圧力を検出することが不可能であった。ま
た,圧力センサの測定位置を変化させただけでも外界の
電界が変化して検出圧力が変化してしまうという欠点が
ある。
However, in the above-mentioned conventional capacitance type pressure sensor, the capacitance which changes depending on the pressure to be detected is as small as 1 to 2 pF and is easily affected by the stray capacitance. It was impossible to detect an accurate pressure because the influence other than the pressure to be applied was large. Moreover, even if the measurement position of the pressure sensor is changed, the electric field in the outside world changes and the detected pressure also changes.

【0007】そこで,本発明の技術的課題は,浮遊容
量,外界の電界の影響を受けにくく,正確な圧力検出を
行うことのできる静電容量型圧力センサを提供すること
にある。
Therefore, a technical object of the present invention is to provide an electrostatic capacitance type pressure sensor which is not easily affected by stray capacitance and external electric field and which can perform accurate pressure detection.

【0008】[0008]

【課題を解決するための手段】本発明によれば,電極部
が形成された第1の基板と,圧力に応じて変形するダイ
アフラム部が形成された第2の基板とを有し前記ダイア
フラム部と前記電極部とがギャップをおいて互いに対向
する関係となるように前記第1及び前記第2の基板とが
接合されたセンサチップを備え,前記ダイアフラム部に
加わる圧力に応じて前記ギャップのギャップ幅を変化さ
せて該ギャップ幅の変化による前記ダイアフラム部と前
記電極部との間の静電容量の変化によって前記圧力を検
出するようにした静電容量型圧力センサにおいて,前記
センサチップが,封止筐体内のリード端子を兼ねたシー
ルド材上に配置されている。また,前記センサチップを
封止筐体内のシールド材により,立体的に覆い,前記シ
ールド材をリード端子が兼ねていることを特徴とする静
電容量型圧力センサが得られる。
According to the present invention, the diaphragm portion has a first substrate on which an electrode portion is formed and a second substrate on which a diaphragm portion that deforms in response to pressure is formed. And a gap between the electrodes according to pressure applied to the diaphragm portion, the sensor chip being joined to the first and second substrates so that the electrodes and the electrode portion are opposed to each other with a gap therebetween. In a capacitance type pressure sensor in which the pressure is detected by changing the width and changing the capacitance between the diaphragm portion and the electrode portion due to the change in the gap width, It is arranged on the shield material that also serves as the lead terminal in the stationary housing. Further, there is obtained an electrostatic capacitance type pressure sensor characterized in that the sensor chip is three-dimensionally covered with a shield material in a sealed casing, and the shield material is also used as a lead terminal.

【0009】[0009]

【作用】本発明では,センサチップを封止筐体内のシー
ルド材により,立体的に覆い,前記シールド材をリード
端子が兼ねている。このように,センサチップを封止筐
体内のシールド材により,立体的に覆うことにより,浮
遊容量,外界の電界をシールドする事により影響を受け
なくなり,正確な圧力検出を行う事が出来る。
In the present invention, the sensor chip is three-dimensionally covered with the shield material in the sealed casing, and the lead material also serves as the shield material. As described above, by covering the sensor chip three-dimensionally with the shield material in the sealed casing, it is not affected by shielding the stray capacitance and the external electric field, and accurate pressure detection can be performed.

【0010】[0010]

【実施例】以下,本発明に係る静電容量型圧力センサの
実施例について図面に基づき説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a capacitance type pressure sensor according to the present invention will be described below with reference to the drawings.

【0011】図1は本発明の静電容量型圧力センサの概
要の一例を示す断面図である。図1に示すように,測定
用圧力センサは,被測定圧力により変形する可動電極を
構成するダイアフラム部13及びその下に設けたキャビ
ティ部14を有するシリコン基板11と,固定電極1
6,及び,大気圧導入用または,被測定圧力の比較とな
る圧力を導入する穴19を有するガラス基板12とから
構成されるセンサチップ15を備えている。前記センサ
チップには,前記固定電極16の引出しのために,シリ
コン基板11とガラス基板12との間に横穴が形成され
ている。センサチップ15の横穴によって,固定電極1
6が外部に引き出される。その後,キャビティー14と
センサチップ外領域をと隔離するため,横穴は封止剤1
7によって封止される。このセンサチップ15は,シル
ード材を兼ねているリード端子31上に接着されてい
る。前記リード端子24と前記固定電極16はリード線
18により電気的に接続されている。センサチップ15
を封止筐体内のシールド材により,立体的に覆い,前記
シールド材はリード端子31が兼ねている。前記リード
端子31,シールド材を兼ねているリード端子31はモ
ールド材により成型される台座23と一緒に作成されて
いる。このシールド材を兼ねているリード端子31は,
図示しない回路回路基板上でアースされる。そして,台
座23と被測定圧力導入の為の圧力導入孔21を設けた
カバー部材としてのモールド材キャップ22とは超音波
溶着によってシールされている。
FIG. 1 is a sectional view showing an example of the outline of the capacitance type pressure sensor of the present invention. As shown in FIG. 1, a pressure sensor for measurement includes a silicon substrate 11 having a diaphragm portion 13 forming a movable electrode that is deformed by a pressure to be measured and a cavity portion 14 provided below the diaphragm portion 13, and a fixed electrode 1.
6, and a sensor chip 15 composed of a glass substrate 12 for introducing atmospheric pressure or a hole 19 for introducing a pressure to be compared with the measured pressure. A lateral hole is formed in the sensor chip between the silicon substrate 11 and the glass substrate 12 in order to pull out the fixed electrode 16. The fixed hole 1 is formed by the lateral hole of the sensor chip 15.
6 is drawn out. Then, in order to isolate the cavity 14 and the area outside the sensor chip, the lateral holes are used as the sealant 1.
It is sealed by 7. The sensor chip 15 is bonded onto the lead terminal 31 which also serves as a shield material. The lead terminal 24 and the fixed electrode 16 are electrically connected by a lead wire 18. Sensor chip 15
Is three-dimensionally covered by a shield material in the sealed casing, and the lead terminal 31 also serves as the shield material. The lead terminal 31 and the lead terminal 31 which also serves as a shield material are formed together with the pedestal 23 molded by a molding material. The lead terminal 31 also serving as the shield material is
Grounded on a circuit board (not shown). The pedestal 23 and the molding material cap 22 as a cover member having the pressure introducing hole 21 for introducing the measured pressure are sealed by ultrasonic welding.

【0012】尚,本発明の実施例に係る静電容量型圧力
センサの動作については,従来と同様であるので,説明
を省略するが,本発明の実施例に係る静電容量型圧力セ
ンサは,センサチップ15を封止筐体内のシールド材に
より,立体的に覆うことにより,浮遊容量,外界の電界
をシールドする事により影響を受けなくなり,正確な圧
力検出を行う事が出来る。
The operation of the capacitance type pressure sensor according to the embodiment of the present invention is the same as that of the conventional one, so the description thereof will be omitted. However, the capacitance type pressure sensor according to the embodiment of the present invention will not be described. By three-dimensionally covering the sensor chip 15 with the shield material in the sealed casing, it is not affected by shielding the stray capacitance and the external electric field, and accurate pressure detection can be performed.

【0013】[0013]

【発明の効果】以上説明したように,本発明ではセンサ
チップを封止筐体内のシールド材により,立体的に覆
い,前記シールド材をリード端子が兼ねている。このよ
うに,本発明においては,センサチップを封止筐体内の
シールド材により,立体的に覆うことにより,浮遊容
量,外界の電界をシールドする事により影響を受けなく
なり,正確な圧力検出を行う事が出来る静電容量型圧力
センサを提供することができる。
As described above, according to the present invention, the sensor chip is three-dimensionally covered by the shield material in the sealed casing, and the lead terminal also serves as the shield material. As described above, according to the present invention, the sensor chip is three-dimensionally covered by the shield material in the sealed casing, so that the stray capacitance and the external electric field are not affected by shielding, and accurate pressure detection is performed. It is possible to provide an electrostatic capacitance type pressure sensor capable of doing so.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の静電容量型圧力センサの概要の一例を
示す断面図である。
FIG. 1 is a sectional view showing an example of an outline of a capacitance type pressure sensor of the present invention.

【図2】従来の静電容量型圧力センサの概要の一例を示
す断面図である。
FIG. 2 is a cross-sectional view showing an example of an outline of a conventional capacitance type pressure sensor.

【符号の説明】[Explanation of symbols]

11 シリコン基板 12 ガラス基板 13 ダイアフラム部 14 キャビティー部 15 センサチップ 16 固定電極 17 封止材 18 リード線 19 貫通孔 20 貫通孔 21 圧力導入孔 22 キャップ部 23 台座 24 リード端子 31 シールド材を兼ねているリード端子 11 Silicon Substrate 12 Glass Substrate 13 Diaphragm Part 14 Cavity Part 15 Sensor Chip 16 Fixed Electrode 17 Sealing Material 18 Lead Wire 19 Through Hole 20 Through Hole 21 Pressure Introducing Hole 22 Cap Part 23 Pedestal 24 Lead Terminal 31 Also as a Shielding Material Existing lead terminal

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 電極部が形成された第1の基板と,圧力
に応じて変形するダイアフラム部が形成された第2の基
板とを有し前記ダイアフラム部と前記電極部とがギャッ
プをおいて互いに対向する関係となるように前記第1及
び前記第2の基板とが接合されたセンサチップを備え,
前記ダイアフラム部に加わる圧力に応じて前記ギャップ
のギャップ幅を変化させて該ギャップ幅の変化による前
記ダイアフラム部と前記電極部との間の静電容量の変化
によって前記圧力を検出するようにした静電容量型圧力
センサにおいて,前記センサチップが,封止筐体内のリ
ード端子を兼ねたシールド材上に配置されたことを特徴
とする静電容量型圧力センサ。
1. A first substrate on which an electrode portion is formed and a second substrate on which a diaphragm portion that deforms in response to pressure is formed, and a gap is formed between the diaphragm portion and the electrode portion. A sensor chip bonded to the first and second substrates so as to face each other,
The gap width of the gap is changed according to the pressure applied to the diaphragm portion, and the pressure is detected by the change of the electrostatic capacitance between the diaphragm portion and the electrode portion due to the change of the gap width. A capacitance type pressure sensor, wherein the sensor chip is arranged on a shield material also serving as a lead terminal in a sealed casing.
【請求項2】 前記センサチップを封止筐体内のシール
ド材により,立体的に覆い,前記シールド材をリード端
子が兼ねていることを特徴とする請求項1記載の静電容
量型圧力センサ。
2. The capacitance type pressure sensor according to claim 1, wherein the sensor chip is three-dimensionally covered with a shield material in a sealed casing, and the lead terminal also serves as the shield material.
JP22691194A 1994-09-21 1994-09-21 Capacitive pressure sensor Withdrawn JPH0894468A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22691194A JPH0894468A (en) 1994-09-21 1994-09-21 Capacitive pressure sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22691194A JPH0894468A (en) 1994-09-21 1994-09-21 Capacitive pressure sensor

Publications (1)

Publication Number Publication Date
JPH0894468A true JPH0894468A (en) 1996-04-12

Family

ID=16852537

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22691194A Withdrawn JPH0894468A (en) 1994-09-21 1994-09-21 Capacitive pressure sensor

Country Status (1)

Country Link
JP (1) JPH0894468A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6966227B2 (en) 2003-02-12 2005-11-22 Pacific Industrial Co., Ltd. Pressure sensor, transmitter, and tire condition monitoring apparatus
US7015804B2 (en) 2003-02-12 2006-03-21 Pacific Industrial Co., Ltd. Pressure sensor, transmitter, and tire condition monitoring apparatus
JP2007199049A (en) * 2005-12-27 2007-08-09 Yamaha Corp Semiconductor device
US7992445B2 (en) 2006-10-02 2011-08-09 Panasonic Electric Works Co., Ltd. Pressure sensor

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6966227B2 (en) 2003-02-12 2005-11-22 Pacific Industrial Co., Ltd. Pressure sensor, transmitter, and tire condition monitoring apparatus
US7015804B2 (en) 2003-02-12 2006-03-21 Pacific Industrial Co., Ltd. Pressure sensor, transmitter, and tire condition monitoring apparatus
JP2007199049A (en) * 2005-12-27 2007-08-09 Yamaha Corp Semiconductor device
US7992445B2 (en) 2006-10-02 2011-08-09 Panasonic Electric Works Co., Ltd. Pressure sensor

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