JPH08905A - Washing apparatus and method having defoaming function - Google Patents

Washing apparatus and method having defoaming function

Info

Publication number
JPH08905A
JPH08905A JP13712494A JP13712494A JPH08905A JP H08905 A JPH08905 A JP H08905A JP 13712494 A JP13712494 A JP 13712494A JP 13712494 A JP13712494 A JP 13712494A JP H08905 A JPH08905 A JP H08905A
Authority
JP
Japan
Prior art keywords
cleaning
liquid
pipe
defoaming
defoaming device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP13712494A
Other languages
Japanese (ja)
Inventor
Fumiyoshi Shinomiya
文義 四ノ宮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP13712494A priority Critical patent/JPH08905A/en
Publication of JPH08905A publication Critical patent/JPH08905A/en
Withdrawn legal-status Critical Current

Links

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  • Cleaning By Liquid Or Steam (AREA)
  • Degasification And Air Bubble Elimination (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To realize a washing apparatus and method having defoaming function capable of removing air bubbles in a washing soln. CONSTITUTION:This washing apparatus consists of an overflow type washing tank and a circulating filter mechanism containing a filter and a defoaming device 11 and the defoaming device 11 is constituted by partially inserting a liquid inlet pipe 13 and an exhaust pipe 12 in the upper part of a hermetically closed container 12, and a liquid outlet pipe 15 is provided to the lower part of the container 12 and the leading end of the liquid inlet pipe 13 is closed, and a plurality of small holes 16 allowing a liquid to flow out are provided to the upper circumferential part of the pipe 13.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は脱泡機能を有する洗浄装
置及び洗浄方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning device having a defoaming function and a cleaning method.

【0002】従来より半導体装置は半導体技術の進歩に
伴って高集積化が進み、そのパターンは精細化している
が、その製造過程において、不良率に大きな影響を与え
る半導体基板洗浄時に、基板に付着していた金属やパー
ティクルの除去不良や再付着による汚染を防止すること
が重要な課題となっている。
2. Description of the Related Art Conventionally, semiconductor devices have been highly integrated with the progress of semiconductor technology, and their patterns have become finer. It has become an important issue to prevent contamination due to poor removal of metal and particles and redeposition.

【0003】[0003]

【従来の技術】図4は従来の半導体基板洗浄装置を示す
模式図である。同図において1はオーバーフロー式洗浄
槽であり、1bは洗浄槽1aからオーバーフローした洗
浄液を溜めるオーバーフロー受けである。このオーバー
フロー受け1bはパイプ2で液送ポンプ3の吸込口に接
続され、該液送ポンプの吐出口はパイプ4、フィルター
5、及びパイプ6により洗浄槽1に接続され、これらに
より循環濾過機構が構成されている。
2. Description of the Related Art FIG. 4 is a schematic view showing a conventional semiconductor substrate cleaning apparatus. In the figure, 1 is an overflow type cleaning tank, and 1b is an overflow receiver for storing the cleaning liquid overflowing from the cleaning tank 1a. The overflow receiver 1b is connected to the suction port of the liquid feed pump 3 by the pipe 2, and the discharge port of the liquid feed pump is connected to the cleaning tank 1 by the pipe 4, the filter 5, and the pipe 6, which form a circulation filtration mechanism. It is configured.

【0004】そして、半導体基板7は洗浄槽1に満たさ
れた洗浄液8に浸漬されて洗浄される。半導体基板7を
洗浄した洗浄液8は洗浄槽1aからオーバーフローし、
パイプ2を通って液送ポンプ3によりフィルター5に送
られ、ここでパーティクル等を濾過された洗浄液はパイ
プ6により洗浄槽1に戻される。このようにして洗浄液
8は循環して用いられる。
Then, the semiconductor substrate 7 is immersed in the cleaning liquid 8 filled in the cleaning tank 1 for cleaning. The cleaning liquid 8 for cleaning the semiconductor substrate 7 overflows from the cleaning tank 1a,
The cleaning liquid sent to the filter 5 through the pipe 2 by the liquid supply pump 3 and filtered for particles and the like therein is returned to the cleaning tank 1 by the pipe 6. In this way, the cleaning liquid 8 is circulated and used.

【0005】[0005]

【発明が解決しようとする課題】上記従来の半導体基板
洗浄装置では、洗浄工程の前に行なわれた薬品処理工程
で残留した処理液の影響(特に発泡剤を含む場合)によ
り洗浄液8中に気泡9が発生する。また、洗浄液中に溶
け込んでいた気体がフィルター5を通過する際の圧力変
化により分離して気泡となる。
In the conventional semiconductor substrate cleaning apparatus described above, bubbles are generated in the cleaning liquid 8 due to the influence of the processing liquid remaining in the chemical treatment process performed before the cleaning process (especially when a foaming agent is included). 9 is generated. In addition, the gas dissolved in the cleaning liquid is separated into bubbles by the pressure change when passing through the filter 5.

【0006】このような気泡が洗浄槽内にあると、この
気泡は半導体基板に付着する。パーティクルは気相と液
相の境に集り易いという性質上、パーティクルは気泡と
共に半導体基板に付着し、該半導体基板を汚染するとい
う問題を生ずる。
When such bubbles are present in the cleaning tank, the bubbles adhere to the semiconductor substrate. Due to the property that particles tend to collect at the boundary between the gas phase and the liquid phase, the particles adhere to the semiconductor substrate together with the air bubbles and cause a problem of contaminating the semiconductor substrate.

【0007】本発明は洗浄液内の気泡を除去することが
できる脱泡機能を有する洗浄装置及び洗浄方法を実現し
ようとする。
The present invention aims to realize a cleaning device and a cleaning method having a defoaming function capable of removing bubbles in a cleaning liquid.

【0008】[0008]

【課題を解決するための手段】本発明の脱泡機能を有す
る洗浄装置に於いては、オーバーフロー式洗浄槽1と、
フィルター5及び脱泡装置11を含む循環濾過機構とよ
りなり、前記脱泡装置11は密閉容器12の上部に一部
を挿入した液体入口パイプ13と排気パイプ14とが設
けられ、該容器12の下部には液体出口パイプ15が設
けられ、且つ前記液体入口パイプ13の先端は閉塞さ
れ、その上部円周上に液体流出用の複数の小孔16が穿
設されて成ることを特徴とする。
In a cleaning apparatus having a defoaming function of the present invention, an overflow type cleaning tank 1 is provided,
The defoaming device 11 is provided with a liquid inlet pipe 13 and an exhaust pipe 14 which are partially inserted in the upper part of a closed container 12, and the circulation filtering mechanism includes a filter 5 and a defoaming device 11. A liquid outlet pipe 15 is provided in the lower portion, the tip of the liquid inlet pipe 13 is closed, and a plurality of small holes 16 for liquid outflow are formed on the upper circumference thereof.

【0009】また、本発明の洗浄方法に於いては、洗浄
液8中に発生する気泡9を脱泡手段11により除去しつ
つ被洗浄物を洗浄液8に浸漬して洗浄することを特徴と
する。
Further, the cleaning method of the present invention is characterized in that the object to be cleaned is immersed in the cleaning liquid 8 for cleaning while the air bubbles 9 generated in the cleaning liquid 8 are removed by the defoaming means 11.

【0010】この構成を採ることにより、洗浄液内の気
泡を除去することができる脱泡機能を有する洗浄装置及
び洗浄方法が得られる。
By adopting this configuration, it is possible to obtain a cleaning device and a cleaning method having a defoaming function capable of removing bubbles in the cleaning liquid.

【0011】[0011]

【作用】図1に示すように、洗浄槽1aからオーバーフ
ローした洗浄液8はパイプ2、液送ポンプ3、パイプ
4、フィルター5、及びパイプ10を通って脱泡装置1
1に送られる。脱泡装置11では図3の如く、液体入口
パイプ13に設けられた複数の小孔16から洗浄液が密
閉容器12の空間部を通って下部へ流出し、この間で脱
泡される。また密閉容器12の下部に溜った洗浄液から
も気泡は浮き上り脱泡する。これら脱泡した気体は排気
パイプ14から外部へ排出される。また脱泡された洗浄
液はパイプ6を通って洗浄槽1aへ戻される。このよう
に洗浄液は循環しながら脱泡装置11で脱泡される。
As shown in FIG. 1, the cleaning liquid 8 overflowing from the cleaning tank 1a passes through the pipe 2, the liquid feed pump 3, the pipe 4, the filter 5, and the pipe 10 to remove the defoaming device 1
Sent to 1. In the defoaming device 11, as shown in FIG. 3, the cleaning liquid flows out from the plurality of small holes 16 provided in the liquid inlet pipe 13 to the lower part through the space of the closed container 12, and is defoamed during this time. Further, air bubbles also float from the cleaning liquid accumulated in the lower part of the closed container 12 and are defoamed. The degassed gas is discharged to the outside through the exhaust pipe 14. The defoamed cleaning liquid is returned to the cleaning tank 1a through the pipe 6. Thus, the cleaning liquid is defoamed by the defoaming device 11 while circulating.

【0012】[0012]

【実施例】図1は本発明の脱泡機能を有する洗浄装置の
実施例を示す模式図である。同図において、1はオーバ
ーフロー式洗浄槽であり、洗浄槽1aと該洗浄槽1aか
らオーバーフローした洗浄液を受けるオーバーフロー受
け1bを有し、該オーバーフロー受け1bはパイプ2に
より液送ポンプ3に接続している。液送ポンプ3からは
パイプ4を介してフィルター5と、さらにパイプ10を
介して脱泡装置11が接続され、該脱泡装置11はパイ
プ6を介して洗浄槽1に接続している。
EXAMPLE FIG. 1 is a schematic view showing an example of a cleaning apparatus having a defoaming function of the present invention. In FIG. 1, reference numeral 1 denotes an overflow type cleaning tank, which has a cleaning tank 1a and an overflow receiver 1b for receiving the cleaning liquid overflowing from the cleaning tank 1a. There is. The liquid delivery pump 3 is connected to the filter 5 via the pipe 4 and the defoaming device 11 via the pipe 10, and the defoaming device 11 is connected to the cleaning tank 1 via the pipe 6.

【0013】脱泡装置11は図2に示すように、円筒形
の密閉容器12が設けられ、その上部には液体入口パイ
プ13と排気パイプ14とがそれぞれ容器内部に通ずる
ように設けられ、密閉容器12の下部には液体出口パイ
プ15が容器内部に通ずるように設けられている。そし
て、前記液体入口パイプ13は先端の一部が密閉容器1
2の中に挿入され、且つその先端は袋状に閉塞され、そ
の上方円周上には液体流出用の小孔16が複数個穿設さ
れている。
As shown in FIG. 2, the defoaming device 11 is provided with a cylindrical hermetically sealed container 12, and a liquid inlet pipe 13 and an exhaust pipe 14 are provided on the upper portion thereof so as to communicate with the interior of the container, respectively, and hermetically sealed. A liquid outlet pipe 15 is provided at the bottom of the container 12 so as to communicate with the inside of the container. And, the liquid inlet pipe 13 has a part of the end thereof in the closed container 1.
2, and the tip is closed like a bag, and a plurality of small holes 16 for liquid outflow are formed on the upper circumference thereof.

【0014】このように構成された本実施例の作用を図
1及び図3により説明する。図1において、洗浄槽1a
からオーバーフロー受け1bにオーバーフローした洗浄
液8はパイプ2を通って液送ポンプ3に吸入され吐出口
から送り出される。送り出された洗浄液はパイプ4を通
ってフィルター5へ送られ、ここで金属、パーティクル
等の汚染物が除去される。次いで汚染物を除去された洗
浄液はパイプ10を通って脱泡装置11へ送られる。
The operation of this embodiment thus constructed will be described with reference to FIGS. In FIG. 1, the cleaning tank 1a
The cleaning liquid 8 that has overflowed from the overflow receiver 1b is sucked into the liquid feed pump 3 through the pipe 2 and sent out from the discharge port. The cleaning liquid sent out is sent to the filter 5 through the pipe 4, where contaminants such as metal and particles are removed. Next, the cleaning liquid from which contaminants have been removed is sent to the defoaming device 11 through the pipe 10.

【0015】脱泡装置11では、図3のように、洗浄液
は液体入口パイプ13を通って先端の小孔16から密閉
容器12内に流入し、空間を通って底部に溜っている洗
浄液8に落下する。この空間を落下している間に洗浄液
中の気泡は洗浄液から分離する。また密閉容器12の底
部に溜った洗浄液8からも気泡は浮上り洗浄液から分離
する。これらの分離した気体は排気パイプ14から外部
に排出される。
In the defoaming device 11, as shown in FIG. 3, the cleaning liquid flows into the closed container 12 through the small hole 16 at the tip through the liquid inlet pipe 13, and passes through the space to the cleaning liquid 8 accumulated at the bottom. To fall. Air bubbles in the cleaning liquid separate from the cleaning liquid while falling in this space. Further, bubbles also float from the cleaning liquid 8 accumulated at the bottom of the closed container 12 and are separated from the cleaning liquid. These separated gases are discharged to the outside through the exhaust pipe 14.

【0016】この一連の動作は液送ポンプの脈動により
常にくり返され、脱泡された洗浄液8はパイプ6を通っ
て元の洗浄槽1aに戻される。このようにして洗浄液は
循環して用いられ、その途中で汚染物の除去及び脱泡が
行なわれる。これにより洗浄槽1aの中の洗浄液8に存
在する気泡は抑制され、洗浄される半導体基板7等の被
洗浄物の汚染は防止される。
This series of operations is constantly repeated by the pulsation of the liquid feed pump, and the defoamed cleaning liquid 8 is returned to the original cleaning tank 1a through the pipe 6. In this way, the cleaning liquid is circulated and used, and contaminants are removed and defoamed during the process. As a result, bubbles existing in the cleaning liquid 8 in the cleaning tank 1a are suppressed, and contamination of an object to be cleaned such as the semiconductor substrate 7 to be cleaned is prevented.

【0017】なお脱泡装置11は、その密閉容器12内
に脱泡作用を行う空間が常に必要であり、この空間は排
気パイプ14を通して大気に開放されているので、密閉
容器12内の洗浄液8の液面8aは洗浄槽1aの液面と
ほぼ同じ高さとなる。従って脱泡装置11は所要の空間
ができるように考慮して設置する必要がある。
The defoaming device 11 always needs a space for performing a defoaming action in the closed container 12, and since this space is opened to the atmosphere through the exhaust pipe 14, the cleaning liquid 8 in the closed container 12 is opened. The liquid level 8a of the liquid is substantially the same as the liquid level of the cleaning tank 1a. Therefore, the defoaming device 11 needs to be installed in consideration of the required space.

【0018】[0018]

【発明の効果】本発明に依れば、洗浄槽内または循環機
構内で発生した気泡を除去することにより、気泡に集ま
るパーティクルによる被洗浄物の汚染を防止することが
でき、洗浄効果の向上に寄与するところ大である。
According to the present invention, by removing the bubbles generated in the cleaning tank or the circulation mechanism, it is possible to prevent contamination of the object to be cleaned by particles collected in the bubbles and improve the cleaning effect. It greatly contributes to.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の脱泡機能を有する洗浄装置の実施例を
示す模式図である。
FIG. 1 is a schematic view showing an embodiment of a cleaning device having a defoaming function of the present invention.

【図2】本発明の脱泡機能を有する洗浄装置の実施例に
おける脱泡装置を示す斜視図である。
FIG. 2 is a perspective view showing a defoaming device in an embodiment of a cleaning device having a defoaming function of the present invention.

【図3】図2の脱泡装置の作用を説明するための断面図
である。
FIG. 3 is a cross-sectional view for explaining the operation of the defoaming device of FIG.

【図4】従来の半導体基板洗浄装置を示す模式図であ
る。
FIG. 4 is a schematic view showing a conventional semiconductor substrate cleaning apparatus.

【符号の説明】[Explanation of symbols]

1…オーバーフロー式洗浄槽 2,4,6,10…パイプ 3…液送ポンプ 5…フィルター 7…半導体基板 8…洗浄液 11…脱泡装置 12…密閉容器 13…液体入口パイプ 14…排気パイプ 15…液体出口パイプ 16…小孔 1 ... Overflow type cleaning tank 2, 4, 6, 10 ... Pipe 3 ... Liquid feed pump 5 ... Filter 7 ... Semiconductor substrate 8 ... Cleaning liquid 11 ... Defoaming device 12 ... Airtight container 13 ... Liquid inlet pipe 14 ... Exhaust pipe 15 ... Liquid outlet pipe 16 ... Small hole

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 オーバーフロー式洗浄槽(1)と、フィ
ルター(5)及び脱泡装置(11)を含む循環濾過機構
とよりなり、 前記脱泡装置(11)は、密閉容器(12)の上部に一
部を挿入した液体入口パイプ(13)と排気パイプ(1
4)とが設けられ、該容器(12)の下部には液体出口
パイプ(15)が設けられ、且つ前記液体入口パイプ
(13)の先端は閉塞され、その上部円周上に液体流出
用の複数の小孔(16)が穿設されて成ることを特徴と
する脱泡機能を有する洗浄装置。
1. An overflow type washing tank (1) and a circulation filtration mechanism including a filter (5) and a defoaming device (11), wherein the defoaming device (11) is an upper part of a closed container (12). Liquid inlet pipe (13) and exhaust pipe (1)
4) is provided, a liquid outlet pipe (15) is provided in the lower portion of the container (12), and the tip of the liquid inlet pipe (13) is closed, and a liquid outlet pipe (15) is provided on the upper circumference thereof. A cleaning device having a defoaming function, characterized in that a plurality of small holes (16) are formed.
【請求項2】 洗浄液(8)中に発生する気泡(9)を
脱泡手段(11)により除去しつつ被洗浄物を洗浄液
(8)に浸漬して洗浄することを特徴とする洗浄方法。
2. A cleaning method characterized by immersing and cleaning an object to be cleaned while removing air bubbles (9) generated in the cleaning liquid (8) by a defoaming means (11).
JP13712494A 1994-06-20 1994-06-20 Washing apparatus and method having defoaming function Withdrawn JPH08905A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13712494A JPH08905A (en) 1994-06-20 1994-06-20 Washing apparatus and method having defoaming function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13712494A JPH08905A (en) 1994-06-20 1994-06-20 Washing apparatus and method having defoaming function

Publications (1)

Publication Number Publication Date
JPH08905A true JPH08905A (en) 1996-01-09

Family

ID=15191385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13712494A Withdrawn JPH08905A (en) 1994-06-20 1994-06-20 Washing apparatus and method having defoaming function

Country Status (1)

Country Link
JP (1) JPH08905A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014017533A (en) * 2003-07-09 2014-01-30 Nikon Corp Exposure device and device manufacturing method
US8666684B2 (en) 2010-03-10 2014-03-04 Lg Electronics Inc. Air conditioning system and method for calculating amount of filling refrigerants of the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014017533A (en) * 2003-07-09 2014-01-30 Nikon Corp Exposure device and device manufacturing method
JP2014090189A (en) * 2003-07-09 2014-05-15 Nikon Corp Exposure device and device manufacturing method
US9097988B2 (en) 2003-07-09 2015-08-04 Nikon Corporation Exposure apparatus and device manufacturing method
US9977352B2 (en) 2003-07-09 2018-05-22 Nikon Corporation Exposure apparatus and device manufacturing method
US8666684B2 (en) 2010-03-10 2014-03-04 Lg Electronics Inc. Air conditioning system and method for calculating amount of filling refrigerants of the same

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Effective date: 20010904