JPH087103A - Signal processor - Google Patents

Abstract

PURPOSE:To enable high-speed processing by performing detailed inspection only for an inspection required signal, for which necessity to perform the detailed inspection is judged by a simplified inspection means, among input signals. CONSTITUTION:Concerning respective partial image signals divided by an image dividing means 8, whether it is necessary to perform the detailed inspection is first inspected by the simplified inspection means composed of a threshold value processing part 11, binary image storage part 12, horizontal shading part 13, vertical shading part 14 and selecting part 15. This processing can be performed at comparatively high speed. Only for the partial image signal as the inspection required signal for which necessity to perform the detailed inspection is decided by the simplified inspection means, the detailed inspection is performed by a detailed inspection means composed of a higher-order flaw detecting part 16 so as to exactly detect any flaw although it takes comparatively long time. Therefore, since the detailed inspection not to be finished in real time is put at the higher-order flaw detecting part 16 for an inspection object for which probability to make the flaw existent in the inspection image is low, the amount of object signals to perform the detailed inspection can be suppressed at an irreducible minimum.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a signal inspection device for inspecting signals such as image signals and audio signals.

[0002]

2. Description of the Related Art FIG. 6 shows a conventional image inspection apparatus shown in, for example, a high-speed image processing apparatus in the 43rd system control information workshop "Multidimensional image measurement and object recognition". ) Input devices 2, 3, 4, 5 are image processors that perform pipeline processing, 6 is output data, and 7 is a typical internal structure of each image processor.

Next, the operation will be described. The image processor 2 that receives the input image signal from the image input device 1 and the subsequent image processors 3, 4, and 5 store it, and perform feature extraction and pattern matching as shown in 7 on all data. Then, the result is sequentially output to the image processor of the next stage, and the process is repeated for the process of a new image signal.

[0004]

Since a conventional signal processing apparatus such as an image processing apparatus is generally constructed as described above, the same processing must be carried out for all inputs, and especially the actual processing is performed. In order to perform the time processing, all processing parts must be completed in real time, and there is a problem that high speed processing is difficult.

The present invention has been made to solve the above problems, and an object thereof is to obtain a signal processing device capable of executing high-speed processing.

[0006]

A signal processing apparatus according to a first aspect of the present invention is an apparatus for receiving an input signal and performing a detailed inspection for the input signal, which requires a relatively long time. A simple inspection means for performing a simple inspection requiring relatively little time, and extracting a required inspection signal out of the input signals for which the detailed inspection needs to be performed, and the detailed inspection for the required inspection signal. And detailed inspection means for performing the inspection.

According to a second aspect of the present invention, the input signal is an image signal corresponding to a predetermined image, and the simple inspection means receives the image signal and outputs a plurality of the image signals. Image division means for dividing into a plurality of partial image signals, wherein the plurality of partial image signals correspond to respective partial images obtained by dividing the predetermined image into a plurality of rectangular areas,
Image binarizing means for binarizing the partial image signal and outputting a binarized partial image signal, and a signal inspection for obtaining signal inspection information based on the horizontal projection and the vertical projection of each of the binarized partial image signals. The partial image signal corresponding to the binarized partial image signal which is determined to be necessary to perform the simple inspection by verifying the information inspection means and the signal inspection information It may be configured to further include a partial image signal inspecting unit that uses a signal.

According to a third aspect of the present invention, the input signal is an image signal corresponding to a predetermined image, and the simple inspection means receives the image signal and outputs a plurality of the image signals. Image division means for dividing into a plurality of partial image signals, wherein the plurality of partial image signals correspond to respective partial images obtained by dividing the predetermined image into a plurality of rectangular areas,
An image binarization unit that binarizes the partial image signal to output a binarized partial image signal, and the simple inspection by comparing the binarized partial image signal and a predetermined binarized reference signal A partial image signal inspecting unit may be further provided, which uses the partial image signal corresponding to the binarized partial image signal determined to require the detailed inspection as the inspection required signal.

According to a fourth aspect of the present invention, the input signal is an image signal corresponding to a predetermined image, and the simple inspection means receives the image signal and outputs a plurality of the image signals. Image division means for dividing into a plurality of partial image signals, wherein the plurality of partial image signals correspond to respective partial images obtained by dividing the predetermined image into a plurality of rectangular areas,
It is necessary to perform convolution filtering processing on the partial image signal to output a filtered partial image signal, and the simple inspection using the filtered partial image signal as verification material, and the detailed inspection. It may be configured to further include a partial image signal inspecting unit that uses the partial image signal corresponding to the determined filtered partial image signal as the inspection required signal.

According to a fifth aspect of the present invention, the input signal is a voice signal, the simple inspection means receives the voice signal, and the voice signal is at least one of a time axis and a spectrum axis. A voice division means for dividing into partial voice signals obtained by dividing on one axis, a start of phoneme for the partial voice signal is detected, and a signal of a predetermined length from the start of phoneme of the partial voice signal is obtained as the essential point. It may be configured by including an audio inspection unit that uses an inspection signal.

Further, as in the signal processing device according to the sixth aspect of the present invention, it further comprises a storage means capable of reading and writing the required inspection signal, and the simple inspection means performs the simple inspection and then outputs the required inspection signal. The detailed inspection means may be configured to sequentially write to the storage means, and the detailed inspection means to sequentially read out the inspection required signals from the storage means to perform the detailed inspection.

[0012]

The signal processing apparatus according to the first aspect of the present invention performs a simple inspection for an input signal, which requires relatively little time, and extracts a required inspection signal out of the input signals for which a detailed inspection needs to be performed. And a detailed inspection means for performing a detailed inspection that requires a relatively long time for a required inspection signal.

Therefore, the detailed inspection is performed by the detailed inspection means only on the required inspection signal which is considered to be required to be inspected by the simple inspection means among the input signals.

The signal processing apparatus according to the second aspect of the present invention, as the simple inspection means, performs the simple inspection by verifying the image dividing means, the image binarizing means, the signal inspection information creating means and the signal inspection information. And a partial image signal inspecting unit that uses a partial image signal corresponding to the binarized partial image signal determined to require inspection as a required inspection signal.

Further, the signal processing apparatus according to the third aspect of the present invention comprises, as the simple inspection means, by comparing the image dividing means, the image binarizing means and the binarized partial image signal with a predetermined binarizing reference signal. And a partial image signal inspecting unit that uses a partial image signal corresponding to the binarized partial image signal determined to require the simple inspection and the detailed inspection as a required inspection signal.

Further, the signal processing device according to claim 4 is required to perform a detailed inspection as a simple inspection means using the image dividing means, the filtering means, and the filtered partial image signal as verification material to perform a detailed inspection. And a partial image signal inspecting unit that uses a partial image signal corresponding to the determined filtered partial image signal as a required inspection signal.

Therefore, in the signal processing device according to any one of claims 2 to 4, it is necessary to perform a detailed inspection by the simple inspection means among the partial image signals for the signal processing of the image signal having a relatively large capacity. The detailed inspection by the detailed inspection means is performed only on the inspection-required signal which is a signal considered to be present.

Further, the signal processing apparatus according to the fifth aspect of the present invention, as the simple inspection means, detects the beginning of the phoneme for the voice dividing means and the partial voice signal, and requires a signal of a predetermined length from the beginning of the phoneme of the partial voice signal. And an audio inspecting means for producing an inspection signal.

Therefore, in the signal processing of the audio signal, the detailed inspection by the detailed inspection means is performed only on the required inspection signal, which is the signal deemed necessary to be inspected by the simple inspection means in the audio signal. Be seen.

Further, the signal processing device according to claim 6 further comprises a storage means capable of reading and writing the required inspection signal, and the simple inspection means performs the simple inspection and then sequentially writes the required inspection signal in the storage means. Since the detailed inspection means is configured to sequentially read out inspection-required signals from the storage means and perform the detailed inspection, the simple inspection means can perform the simple inspection almost independently of the detailed inspection means.

[0021]

【Example】

<First Embodiment> FIG. 1 is a block diagram showing the arrangement of an image processing apparatus according to the first embodiment of the present invention. The image processing apparatus of the first embodiment is used for verifying the surface flaw of the inspection object based on the image information.

As shown in FIG. 1, the image input means 1 inputs the image signal which is the image information of the inspection object and outputs it to the image dividing means 8 one after another. When the control signal of the flaw detection unit 9 indicates the transfer permission, the image division unit 8 divides the grayscale image into rectangular regions of appropriate size based on the image signal and adds the positional information thereof to the partial image signal. Flaw detection means 9
Transfer to.

The flaw detecting means 9 includes a grayscale image storage unit 10, a threshold value processing unit 11, a binary image storage unit 12, and a horizontal projection unit 1.
3, a vertical projection unit 14, a selection unit 15, and a high-order scratch detection unit 16.

The grayscale image storage unit 10 stores the partial image signal. The threshold processing unit 11 sequentially takes in the partial image signals from the grayscale image storage unit 10, binarizes the partial image signals by comparing each pixel value with a predetermined threshold value, and outputs the binarized partial image signals as the binary image storage unit 12. To output and store. The binarized partial image signals stored in the binary image storage unit 12 are read into the horizontal projection unit 13 and the vertical projection unit 14, respectively.

The horizontal projection unit 13 is a binary image storage unit 1.
The sum of all pixel values at each horizontal position of the rectangular image represented by the binarized partial image signal stored in 2 is calculated, and the value is thresholded, and the resulting vector is the horizontal projection vector. Is output to the selection unit 15.

The vertical projection unit 14 is a binary image storage unit 1.
The sum of all pixel values at each vertical position of the rectangular image represented by the binarized partial image signal stored in 2 is calculated, and the value is thresholded, and the resulting vector is the vertical projection vector. Is output to the selection unit 15.

The selection unit 15 has a reference vector which is determined based on the shape of the scratch on the inspection object and serves as a determination reference in advance. The selection unit 15 compares the reference vector with the horizontal projection vector and the vertical projection vector in terms of size, inner product, and the like, so that the image represented by the binarized partial image signal may have a flaw to be inspected. Judge the sex at high speed.

When it is determined that the scratch is not clearly present, it is determined that the detailed inspection is not necessary, and the image dividing means 8 is instructed to transfer the next partial image signal as a control signal of the scratch detecting means 9. give. On the other hand, when it is determined that a flaw may exist and detailed inspection needs to be performed, the higher-order flaw detection unit 16 corresponds to the binarized partial image signal determined to need detailed inspection. A control signal for instructing the partial image signal as a signal requiring inspection is given.

The high-order scratch detection section 16 is a grayscale image storage section 10.
From this, a partial image signal indicated by the control signal of the selection unit 15 as a signal requiring inspection is read, feature extraction is performed on the partial image signal by a pattern matching method or a convolution filter such as a Gabor filter, and the amount of these feature extractions is performed. By applying a linear discriminant method, a discriminant method using a neural network, or the like, the presence / absence of a flaw is determined, and when it is determined that there is a flaw, the position information is output to the output means 17.

The output means 17 outputs the scratch detection information which can be visually recognized based on the position information obtained from the higher order scratch detection section 16.

In the image processing apparatus of the first embodiment having such a configuration, each partial image signal divided by the image dividing means 8 is divided into a threshold processing unit 11, a binary image storage unit 12, and a horizontal projection unit. First, the simple inspection unit including the vertical projection unit 14, the vertical projection unit 14, and the selection unit 15 first inspects the necessity of detailed inspection. This process can be performed relatively quickly.

Then, it takes a relatively long time by the detailed inspection means composed of the high-order scratch detection section 16 only for the partial image signal which is the inspection-required signal determined to be required to be inspected by the simple inspection means. A detailed inspection is performed that can accurately detect the scratches.

Therefore, the high-order scratch detection unit 16 performs a detailed inspection that does not end in real time on an inspection object having a property that the existence of scratches in the inspection image is small.
The time limit allowed for it to finish processing can be extended over the processing time of the simple inspection of a plurality of partial image signals.

As a result, it is possible to incorporate, in an image processing apparatus that requires high-speed or real-time processing, processing that requires a large amount of calculation time that requires highly accurate inspection and processing that does not require reduction or real-time processing. .

In other words, by suppressing the amount of signals to be subjected to the detailed inspection by the detailed inspection means, which requires a relatively long time, to the necessary minimum, it is possible to speed up the whole process.

<Second Embodiment> FIG. 2 is a block diagram showing the arrangement of an image processing apparatus according to the second embodiment of the present invention. The image processing apparatus according to the second embodiment is used for verifying the surface flaw of the inspection object based on the image information of the inspection object, as in the first embodiment.

As shown in FIG. 2, a high-order scratch detection unit 16 is provided outside the scratch detection unit 9, and a grayscale image storage unit 18 is interposed between the scratch detection unit 9 and the high-order scratch detection unit 16. Similar to the first embodiment, the selection unit 15 of the flaw detection unit 9 compares the magnitudes of the reference vector and the horizontal projection vector and the vertical projection vector, the amount of inner product, and the like to determine the binarized partial image signal. The possibility that there is a scratch to be inspected in the image to be expressed, that is, the necessity of performing a detailed inspection, is quickly determined.

When it is determined that the scratch is not clearly present and the detailed inspection is not necessary, the image splitting means 8 is instructed to transfer the next partial image signal as a control signal of the scratch detecting means 9. give. On the other hand, if it is determined that there may be a scratch and it is necessary to perform a detailed inspection, a partial image signal corresponding to the binarized partial image signal determined to require a detailed inspection is used as a required inspection signal. As a control signal, the grayscale image storage means 1 is instructed to write the inspection required signal.
Give to eight.

The grayscale image storage means 18 sequentially stores only the partial image signals designated by the selection section 15 as the inspection required signals.

The high-order flaw detection section 16 is a grayscale image storage means 1.
The partial image signal that is the inspection-required signal is sequentially read from 8, and the feature extraction is performed on the partial image signal by a pattern matching method or a convolution filter such as a Gabor filter. The presence or absence of a flaw is determined by applying a discrimination method using a network, and if it is determined that there is a flaw, the position information is output to the output means 17.

The rest of the configuration and the operation thereof are the same as those of the image processing apparatus of the first embodiment, so the explanation will be omitted.

In the image processing apparatus of the second embodiment having such a configuration, each partial image signal divided by the image dividing means 8 has a threshold processing unit 11, a binary image storage unit 12, and a horizontal projection unit. Whether or not there is a need for detailed inspection is inspected by a simple inspecting unit including the vertical projection unit 13, the vertical projection unit 14, and the selection unit 15. This process can be performed relatively quickly.

Then, only the partial image signal, which is the required inspection signal determined by the simple inspection means to be required to perform the detailed inspection, is written in the grayscale image storage means 18.

On the other hand, the detailed inspection means including the high-order scratch detection section 16 requires a relatively long time, but a detailed inspection capable of accurately detecting the scratch is applied to the partial image signal read from the grayscale image storage means 18. It is carried out sequentially.

As a result, as in the first embodiment, the speed of the entire process can be increased by suppressing the signal amount of the object of detailed inspection by the detailed inspection means, which requires a relatively long time, to the necessary minimum.

Further, in the case of the first embodiment, the high-order scratch detection section 16 operates almost correctly when the probability of existence of a scratch that is required is low, but the scratch exists in the image solidly. In the case of such a property, the higher-order flaw detection unit 16 is continuously activated, so that the real-time property is not guaranteed.

On the other hand, in the second embodiment, since the images that need to be processed by the high-order scratch detection section 16 are sequentially stored in the grayscale image storage means 18, a detailed inspection by the high-order scratch detection section 16 is required. Even when various images are continuously input, the simple inspection means in the flaw detection means 9 can continue the simple inspection in real time.

As a result, it is possible to prevent the simple inspection from being delayed due to the progress of the detailed inspection, so that it is possible to perform higher speed processing.

<Third Embodiment> FIG. 3 is a block diagram showing the arrangement of an image processing apparatus according to the third embodiment of the present invention. The image processing apparatus according to the third embodiment is used for verifying the surface scratches on the basis of the image information of the inspection object, as in the first and second embodiments.

As shown in FIG. 3, the template matching unit 2
9 receives the binarized partial image signal from the binary image storage unit 12 and the template signal which is the reference binarized data stored in the template data storage unit 30.

Then, the template matching unit 29 compares the reference binarized data and the template data, and based on the comparison result, the image represented by the binarized partial image signal has a flaw to be inspected. Quickly determine the feasibility, ie the need for detailed inspection. When it is determined that it is not necessary to perform the detailed inspection, the image division unit 8 is instructed to transfer the next partial image signal as a control signal for the flaw detection unit 9. On the other hand, when it is determined that the detailed inspection needs to be performed, a partial image signal corresponding to the binarized partial image signal is set as a required inspection signal, and a control signal for instructing writing is given to the grayscale image storage unit 18. .

The other structure and operation are the same as those of the image processing apparatus of the second embodiment, and the explanation thereof is omitted.

In the image processing apparatus of the third embodiment having such a configuration, each partial image signal divided by the image dividing means 8 has a threshold processing unit 11, a binary image storage unit 12, and a template matching unit 29, respectively. Also, the simple inspection unit including the template data storage unit 30 inspects whether or not it is necessary to perform a detailed inspection. This process can be performed relatively quickly.

Then, only the partial image signal, which is the inspection required signal determined by the simple inspection means to be necessary for the detailed inspection, is written in the grayscale image storage means 18.

On the other hand, the detailed inspection means including the high-order flaw detection section 16 requires a relatively long time, but a detailed inspection capable of accurately detecting the flaws is performed on the partial image signal read from the grayscale image storage means 18. It is carried out sequentially.

As a result, as in the first and second embodiments, the amount of signals to be subjected to the detailed inspection by the detailed inspection means, which requires a relatively long time, is suppressed to the necessary minimum, and the speed of the whole process is increased. You can

Further, the flaw detecting means 9 and the high-order flaw detecting section 16
By inserting the grayscale image storage means 18 between
As in the second embodiment, since the simple inspection is prevented from being delayed due to the progress of the detailed inspection, it is possible to perform higher speed processing.

<Fourth Embodiment> FIG. 4 is a block diagram showing the arrangement of an image processing apparatus according to the fourth embodiment of the present invention. The image processing apparatus according to the fourth embodiment includes the first to third
Similar to the above embodiment, it is used for verifying the surface flaw of the inspection object based on the image information.

As shown in FIG. 4, the convolution filter group 3
Reference numeral 1 sequentially fetches partial image signals from the grayscale image storage unit 10, performs convolution filtering processing such as weighting each pixel represented by the partial image signals, and outputs the filtered partial image signals to the primary identification unit 32.

The primary identifying section 32 performs a relatively simple identifying process on the filtered partial image signal so that the image represented by the filtered partial image signal may have a flaw to be inspected, that is, a detailed inspection. Determine the need to do fast. When it is determined that the scratch is not clearly present and the detailed inspection is not necessary, the image dividing unit 8 is instructed to transfer the next partial image signal as a control signal of the scratch detecting unit 9. On the other hand, if it is determined that there may be a scratch and it is necessary to perform a detailed inspection,
A partial image signal corresponding to the filtered partial image signal is used as a required inspection signal, and a control signal for instructing writing is given to the grayscale image storage means 18.

The rest of the configuration and the operation thereof are the same as those of the image processing apparatus of the second embodiment, so the explanation will be omitted.

In the image processing apparatus of the fourth embodiment having such a configuration, each partial image signal divided by the image dividing means 8 is subjected to a simple inspection means consisting of a convolution filter group 31 and a primary discriminator 32, respectively. It is inspected whether it is necessary to perform a detailed inspection. This process can be performed relatively quickly.

Then, only the partial image signal, which is the inspection-required signal determined to require the detailed inspection by the simple inspection means, is written in the grayscale image storage means 18.

On the other hand, the detailed inspection means including the high-order scratch detection section 16 requires a relatively long time, but a detailed inspection capable of accurately detecting the scratch is applied to the partial image signal read from the grayscale image storage means 18. It is carried out sequentially.

As a result, as in the first to third embodiments, the speed of the entire process can be increased by minimizing the amount of signals to be subjected to the detailed inspection by the detailed inspection means, which requires a relatively long time. You can

Further, the flaw detecting means 9 and the high-order flaw detecting section 16
By inserting the grayscale image storage means 18 between
Similar to the second and third embodiments, it is possible to prevent the simple inspection from being delayed due to the progress of the detailed inspection. Therefore, it is possible to perform a further high speed processing.

<Fifth Embodiment> FIG. 5 is a block diagram showing the arrangement of a speech processing apparatus according to the fifth embodiment of the present invention. The voice processing device of the fifth embodiment is used to determine the voice of the inspection object.

As shown in FIG. 5, the voice input means 19 inputs the voice signal from the inspection object and receives the A / D conversion means 20.
Output to. The A / D conversion means 20 A / D converts the audio signal and outputs a digital audio signal to the frequency analysis means 21.

The frequency analyzing means 21 frequency-analyzes the digital audio signal, extracts the frequency component thereof, and outputs the frequency component audio signal S21 to the audio signal dividing means 22 and the audio inspecting means 23.

The audio signal dividing means 22 divides the frequency component audio signal S21 into appropriate time intervals and outputs the partial frequency component audio signal S22 to the audio signal storage section 24.

Audio signal storage unit 24 in the audio inspection means 23
Stores the frequency component audio signal S21 and the partial frequency component audio signal S22, and outputs the partial frequency component audio signal S22 to the phoneme detection unit 25.

The phoneme detecting section 25 in the voice inspecting means 23 is
If the beginning of the phoneme is received from the partial frequency component voice signal S22 upon reception of the partial frequency component voice signal S22, it is determined that it is a signal portion for performing the voice discrimination processing (detailed inspection), and a frequency component of a predetermined length from the beginning of the phoneme. The voice signal S21 and the partial frequency component voice signal S22 are used as inspection-required signals, and a control signal for instructing the writing of these inspection-required signals is given to the voice signal storage means 26. When it is judged that it is not necessary to carry out, a control signal for instructing the write inhibition is given to the audio signal storage means 26.

Therefore, the voice signal storage means 26 sequentially stores only the frequency component voice signal S21 and the partial frequency component voice signal S22 which the phoneme detecting section 25 indicates as the inspection required signal.

The voice discriminating means 27 is the voice signal storing means 2
Frequency component audio signal S2, which is a required inspection signal, from 6 onwards
The 1 and partial frequency component audio signals S22 are fetched, the inspection-required signal is analyzed in detail, and its type and property are output to the output means 28.

In the speech processing apparatus of the fifth embodiment having such a configuration, the speech signals fetched by the image input means 1 are the speech signal storage section 24 and the phoneme detection section 2, respectively.
By the simple inspection means (voice inspection means 23) consisting of 5,
It is checked whether or not voice discrimination is necessary. This process can be performed relatively quickly.

Then, only the inspection-required signal, which is determined by the simple inspection means to be required to perform the detailed inspection (voice discrimination processing), is written in the voice signal storage means 26.

On the other hand, the detailed inspection, which requires a relatively long time by the detailed inspection means composed of the voice discrimination means 27, enables the accurate voice discrimination to be sequentially performed on the required inspection signals read from the voice signal storage means 26. Done.

As a result, the speed of the entire process can be increased by suppressing the amount of signals to be subjected to the detailed inspection by the detailed inspection means, which requires a relatively long time, to the necessary minimum.

That is, when the portion included in the voice signal necessary for voice discrimination (phoneme inspection) is not stochastically large, it is fast to select only the signal required for voice discrimination and perform detailed analysis processing on it. It will be possible in real time.

Further, since the inspection-required signals which need to be processed by the voice discriminating means 27 are sequentially stored in the voice signal storing means 26, when the voice signals which need the processing of the higher order flaw detecting section 16 are continuously input. Also, in the simple inspection means, the simple inspection can be continued in real time.

As a result, it is possible to prevent the simple inspection from being delayed due to the progress of the detailed inspection, so that it is possible to perform higher speed processing.

In the fifth embodiment, the phoneme detecting section 25
Is a frequency component speech signal S21 of a predetermined length from the beginning of the phoneme.
Although the partial frequency component voice signal S22 is used as the inspection required signal, the determination end signal for instructing the end of the determination process for the inspection required signal is received from the voice determination unit 27, and from the beginning of the phoneme until the determination end signal is received. The frequency component audio signal S21 and the partial frequency component audio signal S22 may be configured to be required inspection signals.

<Others> The above-described first to fifth embodiments have been described with respect to the signal processing device for the image signal or the audio signal, but not limited to these signals, other general signals may be used. It goes without saying that the present invention can be applied to all signal processing devices that inspect patterns of some signals included in signals to be inspected or other properties.

[0084]

As described above, the signal processing device according to the first aspect of the present invention needs to perform a simple inspection that takes relatively little time on an input signal and perform a detailed inspection of the input signal. A simple inspection means for extracting a required inspection signal and a detailed inspection means for performing a detailed inspection which requires a relatively long time for the inspection required signal are provided.

Therefore, the detailed inspection by the detailed inspection means is carried out only on the required inspection signal of the input signals which is deemed necessary to be subjected to the detailed inspection by the simple inspection means.

As a result, the amount of signals to be subjected to the detailed inspection, which requires a relatively long time, can be suppressed to the necessary minimum, so that the high-speed processing can be executed.

Further, the signal processing apparatus according to the second aspect performs, as the simple inspection means, the image division means, the image binarization means, the signal inspection information creating means and the simple inspection by verifying the signal inspection information. And a partial image signal inspecting unit that uses a partial image signal corresponding to the binarized partial image signal determined to require inspection as a required inspection signal.

Further, the signal processing apparatus according to the third aspect of the present invention comprises, as the simple inspection means, by comparing the image dividing means, the image binarizing means and the binarized partial image signal with a predetermined binarized reference signal. And a partial image signal inspecting unit that uses a partial image signal corresponding to the binarized partial image signal determined to require the simple inspection and the detailed inspection as a required inspection signal.

Further, the signal processing device according to claim 4 needs to perform a simple inspection as a simple inspection means using the image dividing means, the filtering means and the filtered partial image signal as a verification material to perform a detailed inspection. And a partial image signal inspecting unit that uses a partial image signal corresponding to the determined filtered partial image signal as a required inspection signal.

Therefore, in the signal processing device according to any one of claims 2 to 4, it is necessary to perform a detailed inspection of the partial image signal by the simple inspection means for the signal processing of the image signal having a relatively large capacity. The detailed inspection by the detailed inspection means is performed only on the inspection-required signal which is a signal considered to be present.

Further, the signal processing apparatus according to the fifth aspect detects, as a simple inspection means, a phoneme start of the voice division means and the partial voice signal, and requires a signal of a predetermined length from the start of the phoneme of the partial voice signal. And an audio inspecting means for producing an inspection signal.

Therefore, in the signal processing of the audio signal, the detailed inspection by the detailed inspection means is performed only on the required inspection signal which is the signal of the audio signals which is considered necessary to be inspected by the simple inspection means. Be seen.

Further, the signal processing apparatus according to the present invention further comprises a storage means capable of reading and writing the required inspection signal, and the simple inspection means performs the simple inspection and then sequentially writes the required inspection signal into the storage means. Since the detailed inspection means is configured to sequentially read out inspection-required signals from the storage means and perform the detailed inspection, the simple inspection means can perform the simple inspection almost independently of the detailed inspection means.

As a result, it is possible to prevent the simple inspection from being delayed due to the progress of the detailed inspection, so that it is possible to perform higher speed processing.

[Brief description of drawings]

FIG. 1 is a block diagram showing a configuration of an image processing apparatus according to a first embodiment of the present invention.

FIG. 2 is a block diagram showing a configuration of an image processing apparatus which is a second embodiment of the present invention.

FIG. 3 is a block diagram showing a configuration of an image processing apparatus that is a third embodiment of the present invention.

FIG. 4 is a block diagram showing a configuration of an image processing apparatus which is a fourth embodiment of the present invention.

FIG. 5 is a block diagram showing a configuration of a voice processing device according to a fifth embodiment of the present invention.

FIG. 6 is a block diagram showing a configuration of a conventional image processing apparatus.

[Explanation of symbols]

8 image division means, 9 flaw detection means, 10 grayscale image storage section, 11 threshold processing section, 12 binary image storage section, 13
Horizontal projection unit, 14 Vertical projection unit, 15 Screening unit, 16 High-order flaw detection unit, 17 Output means, 18 Grayscale image storage means, 19 Voice input means, 20 A / D conversion means, 21 Frequency analysis means, 22 Audio signal dividing means, 23 audio inspection means, 24 audio signal storage section, 25
Phoneme detector, 26 voice signal storage means, 27 voice discrimination means, 28 output means.

Claims (6)

[Claims] 1. A signal processing device for receiving an input signal and performing a detailed inspection for the input signal, which requires a relatively long time. A signal processing device comprising: a simple inspection unit that extracts a required inspection signal from which a detailed inspection needs to be performed; and a detailed inspection unit that performs the detailed inspection on the required inspection signal. 2. The input signal is an image signal corresponding to a predetermined image, and the simple inspection means includes image division means for receiving the image signal and dividing the image signal into a plurality of partial image signals. , The plurality of partial image signals correspond to respective partial images in which the predetermined image is divided into a plurality of rectangular areas, and image binarization for binarizing the partial image signals and outputting a binarized partial image signal Means, signal inspection information generating means for obtaining signal inspection information based on horizontal projection and vertical projection of each of the binarized partial image signals, and the simple inspection by verifying the signal inspection information, The partial image signal inspecting means, which uses the partial image signal corresponding to the binarized partial image signal determined to require inspection as the inspection required signal, further comprising: No. processing apparatus. 3. The input signal is an image signal corresponding to a predetermined image, and the simple inspection means includes image division means for receiving the image signal and dividing the image signal into a plurality of partial image signals. , The plurality of partial image signals correspond to respective partial images in which the predetermined image is divided into a plurality of rectangular areas, and image binarization for binarizing the partial image signals and outputting a binarized partial image signal Means, the binarized partial image signal determined to need to perform the detailed inspection, by performing the simple inspection by comparing the binarized partial image signal and a predetermined binarized reference signal The signal processing device according to claim 1, further comprising a partial image signal inspection unit that uses a corresponding partial image signal as the inspection required signal. 4. The input signal is an image signal corresponding to a predetermined image, and the simple inspection means includes an image division means for receiving the image signal and dividing the image signal into a plurality of partial image signals. The plurality of partial image signals correspond to each of the partial images obtained by dividing the predetermined image into a plurality of rectangular regions, and a convolution filtering process is performed on the partial image signals to output a filtered partial image signal. And a portion in which the partial image signal corresponding to the filtered partial image signal determined to be necessary to perform the detailed inspection using the filtered partial image signal as the verification material is the required inspection signal The signal processing device according to claim 1, further comprising image signal inspection means. 5. The partial audio obtained by receiving the audio signal and dividing the audio signal on at least one of a time axis and a spectrum axis, the input signal being an audio signal. A voice splitting unit for splitting the signal into a signal; and a voice checking unit for detecting a phoneme start of the partial voice signal, and a signal having a predetermined length from the start of the phoneme of the partial voice signal as the test-needed signal. Item 1. The signal processing device according to item 1. 6. The storage device capable of reading and writing the inspection-required signal is further provided, wherein the simple inspection device writes the inspection-required signal in sequence in the storage device after performing the simple inspection, and the detailed inspection device includes: 6. The signal processing device according to claim 1, wherein the inspection-required signals are sequentially read out from the storage unit to perform the detailed inspection.