JPH0854430A - Insulation resistance measuring instrument - Google Patents

Insulation resistance measuring instrument

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Publication number
JPH0854430A
JPH0854430A JP6209292A JP20929294A JPH0854430A JP H0854430 A JPH0854430 A JP H0854430A JP 6209292 A JP6209292 A JP 6209292A JP 20929294 A JP20929294 A JP 20929294A JP H0854430 A JPH0854430 A JP H0854430A
Authority
JP
Japan
Prior art keywords
temperature
humidity
insulation resistance
sample
constant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6209292A
Other languages
Japanese (ja)
Inventor
Hitoshi Arita
均 有田
Fumiko Miura
フミ子 三浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP6209292A priority Critical patent/JPH0854430A/en
Publication of JPH0854430A publication Critical patent/JPH0854430A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To provide a stable temperature/humidity environment with consistent reproducibility of measurement data for an insulation resistance measuring instrument when evaluating insulation resistance recovery characteristics by forming dew at normal temperatures after leaving a substrate at a low temperature. CONSTITUTION:A temperature/humidity retainer 2 for housing a sample withdrawn from a constant-temperature/constant-humidity bath 1 is provided in the measurement system and insulation resistance is measured inside. The container 2 is formed from an aluminum material and a bad influence to measurement due to electromagnetic wave is excluded. Humidity from a humidifier 5 is supplied into the container and a specific temperature/humidity environment is achieved by a temperature/humidity controller 6 on the basis of the current temperature/humidity data detected by a temperature/humidity meter 4. The detected insulation resistance data are processed by a scanner 9 and are externally outputted to a personal computer 11 or a printer 10.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えばプリント基板の
低温放置後の絶縁抵抗を測定して絶縁抵抗回復特性を評
価する絶縁抵抗測定装置に関し、特に得られる測定デー
タの信頼性を向上することができる絶縁抵抗測定装置に
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an insulation resistance measuring apparatus for evaluating insulation resistance recovery characteristics by measuring insulation resistance of a printed circuit board after being left at a low temperature, and particularly to improving reliability of obtained measurement data. The present invention relates to an insulation resistance measuring device capable of

【0002】[0002]

【従来の技術】例えば、銅張り積層板などの導体間ある
いは穴間の絶縁抵抗は、基板の品質上、基本的に重要な
特性の一つではあるが、通常、より意義のあることは、
ある特定の環境条件のもとにおける抵抗の変化である。
即ち、この種の試料の絶縁抵抗試験は、用いる試料が実
際に使用されるときと同じ環境条件のもとで行われると
き、最も大きな価値をもつ。
2. Description of the Related Art For example, the insulation resistance between conductors or holes such as a copper-clad laminate is one of the basically important characteristics in terms of the quality of the board, but usually, it is more significant.
It is the change in resistance under certain environmental conditions.
That is, the insulation resistance test of this type of sample has the greatest value when it is carried out under the same environmental conditions as when the sample used is actually used.

【0003】この絶縁抵抗試験には、基板を所定の低温
条件下に放置した後に、一定の常温環境に戻して試料表
面を結露させ、その際の試料の絶縁抵抗回復特性を評価
するものがある。
In this insulation resistance test, after leaving the substrate under a predetermined low temperature condition, it is returned to a constant room temperature environment to cause dew condensation on the sample surface, and the insulation resistance recovery characteristic of the sample at that time is evaluated. .

【0004】[0004]

【発明が解決しようとする課題】しかしながら、現在行
われている絶縁抵抗回復特性試験は、低温放置後、温湿
度の不安定な環境に試料を取り出した状態で絶縁抵抗を
測定しているため、結果として得られる絶縁抵抗値に大
きなバラツキを生じ、測定データの信頼性が極めて低い
という問題がある。
However, in the insulation resistance recovery characteristic test currently performed, the insulation resistance is measured after the sample is taken out in an environment where temperature and humidity are unstable after being left at a low temperature. As a result, there is a problem that the obtained insulation resistance value greatly varies and the reliability of the measurement data is extremely low.

【0005】本発明は、かかる現状に鑑み、なされたも
のであって、低温放置後、安定した温湿度環境で試料の
絶縁抵抗回復特性を測定することができる絶縁抵抗測定
装置を提供することを目的とする。
The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide an insulation resistance measuring apparatus capable of measuring the insulation resistance recovery characteristic of a sample in a stable temperature and humidity environment after being left at a low temperature. To aim.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するた
め、本発明による絶縁抵抗測定装置は、試料を収容して
低温環境を形成することができる恒温恒湿槽と、低温放
置後の試料を収容する温湿度保持容器と、前記温湿度保
持容器に連通して容器内に水分供給する加湿器と、前記
加湿器を駆動制御して温湿度保持容器内空間を前記一定
の常温環境に保持する温湿度調節手段と、温湿度保持容
器内に収容された試料の絶縁抵抗を測定する絶縁抵抗計
と、を備えることを特徴としている。
In order to achieve the above object, an insulation resistance measuring apparatus according to the present invention comprises a constant temperature and humidity chamber capable of accommodating a sample and forming a low temperature environment, and a sample after being left at a low temperature. A temperature / humidity holding container to be housed, a humidifier that communicates with the temperature / humidity holding container to supply water into the container, and drive-controls the humidifier to hold the temperature / humidity holding container internal space at the constant room temperature environment. It is characterized by comprising a temperature / humidity adjusting means and an insulation resistance meter for measuring the insulation resistance of the sample contained in the temperature / humidity holding container.

【0007】また、好ましい実施形態によれば、前記絶
縁抵抗測定装置において、温湿度保持容器は、恒温恒湿
槽の内部に置かれる。
According to a preferred embodiment, in the insulation resistance measuring apparatus, the temperature / humidity holding container is placed inside a constant temperature and constant humidity tank.

【0008】更に、別の実施形態では温湿度保持容器
は、恒温恒湿槽に隣接してその外部に置かれ、電磁波障
壁材より形成される。
Further, in another embodiment, the temperature / humidity storage container is placed adjacent to the constant temperature / constant humidity bath outside the container and is formed of an electromagnetic wave barrier material.

【0009】また、更に好ましくは、温湿度保持容器
に、容器内温度を上げるためのヒータが設けられ、前記
温湿度調節手段によってその作動が制御される。
Further, more preferably, the temperature and humidity holding container is provided with a heater for raising the temperature inside the container, and the operation is controlled by the temperature and humidity adjusting means.

【0010】[0010]

【作用】温湿度が不安定な外界に試料を取り出して結露
・測定するのに代わって、外界より隔離された温湿度保
持容器に試料を入れ、ここで試料表面を結露させるた
め、安定した測定環境のもとで絶縁抵抗が測定でき、同
じ種類の試料については測定された絶縁抵抗値がばらつ
かない、所謂、一貫再現性の良い結果を得ることができ
る。この時、加湿器と温湿度調節手段は、温湿度保持容
器内部の湿度を、予め定められた値に保持するべく作動
する。
[Function] Instead of taking out the sample to the outside where temperature and humidity are unstable and performing dew condensation / measurement, put the sample in a temperature / humidity holding container isolated from the outside and let the sample surface condense here, so stable measurement is possible. The insulation resistance can be measured under the environment, and the measured insulation resistance values of the same type of sample do not vary, so-called consistent reproducible results can be obtained. At this time, the humidifier and the temperature / humidity adjusting means operate to maintain the humidity inside the temperature / humidity holding container at a predetermined value.

【0011】また、温湿度保持容器を恒温恒湿槽の内部
に置く場合、空気中の電磁波による絶縁抵抗測定値への
影響を低減でき、測定自体の信頼性を向上することがで
きる。
Further, when the temperature and humidity holding container is placed inside the constant temperature and humidity chamber, the influence of electromagnetic waves in the air on the measured insulation resistance value can be reduced, and the reliability of the measurement itself can be improved.

【0012】また、これとは逆に、温湿度保持容器を恒
温恒湿槽の外部に置いた場合でも、容器自体を電磁波障
壁材で形成することで、電磁波の容器内部への進入を阻
止することができ、測定データへの電磁波の悪影響を無
くすことができる。
On the contrary, even when the temperature / humidity holding container is placed outside the constant temperature and constant humidity chamber, the container itself is formed of the electromagnetic wave barrier material to prevent the electromagnetic waves from entering the container. Therefore, the adverse effect of electromagnetic waves on the measurement data can be eliminated.

【0013】更に好ましくは、温湿度保持容器にヒータ
を設け、前記温湿度調節手段によってヒータの作動を制
御するようにすると、測定時の温度を、よりバラツキの
少ない一定条件に保持することができ、測定値の信頼性
を一層向上させることができる。
More preferably, if a heater is provided in the temperature / humidity holding container and the operation of the heater is controlled by the temperature / humidity adjusting means, the temperature at the time of measurement can be held at a constant condition with less variation. The reliability of the measured value can be further improved.

【0014】[0014]

【実施例】以下図面を参照しながら本発明の絶縁抵抗測
定装置を説明する。図1は恒温恒湿槽に隣接して温湿度
保持容器を配置する第1実施例としての絶縁抵抗測定装
置を示す概略構成図である。図1において、1は試料を
収容して所定の低温環境を生成する恒温恒湿槽、2は低
温放置後の試料を収容する温湿度保持容器、3は恒温恒
湿槽1や温湿度保持容器2に収納された試料の表面抵抗
を検出する表面絶縁抵抗計である。温湿度保持容器2
は、アルミニウムなどの電磁波障壁材料より形成され、
例えば300×500×150mmの寸法からなる筺体
として、恒温恒湿槽1に隣接して配置される。また、そ
の内部には、容器内部の温度および湿度を検出する温湿
度計4を備えている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An insulation resistance measuring apparatus of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic configuration diagram showing an insulation resistance measuring apparatus as a first embodiment in which a temperature and humidity holding container is arranged adjacent to a constant temperature and humidity chamber. In FIG. 1, 1 is a constant temperature and humidity chamber for containing a sample to generate a predetermined low temperature environment, 2 is a temperature and humidity holding container for storing a sample after being left at a low temperature, 3 is a constant temperature and humidity chamber 1 and a temperature and humidity holding container 2 is a surface insulation resistance meter that detects the surface resistance of the sample stored in 2. Temperature and humidity holding container 2
Is formed of an electromagnetic wave barrier material such as aluminum,
For example, it is arranged adjacent to the constant temperature and humidity chamber 1 as a housing having dimensions of 300 × 500 × 150 mm. Further, a thermo-hygrometer 4 for detecting the temperature and humidity inside the container is provided inside thereof.

【0015】温湿度保持容器2には、容器内部に水蒸気
を供給して湿度を上げる加湿器5が接続される。この加
湿器5の作動は、温湿度計4によって得られた容器内温
度データおよび湿度データに基づき、温湿度コントロー
ラ6によって制御される。
A humidifier 5 is connected to the temperature / humidity holding container 2 to supply water vapor into the container to raise the humidity. The operation of the humidifier 5 is controlled by the temperature / humidity controller 6 based on the in-container temperature data and the humidity data obtained by the temperature / humidity meter 4.

【0016】また、7は恒温恒湿槽1で低温環境に放置
された後、そのまま即座に温湿度保持容器2内に移送さ
れる試料台であって、その上には測定対象となる絶縁抵
抗試験片8が配置される。表面絶縁抵抗計3によって検
出された抵抗値データは、データ処理ユニットとしての
スキャナ9に転送され、ここで所定の演算処理等がなさ
れて、プリンタ10やパソコン11のCRT12上に出
力されることになる。なお、本装置では、温湿度コント
ローラ6によって制御される温湿度保持容器2内の温湿
度データもまた、スキャナ9に入力されて外部出力でき
るようになっている。
Reference numeral 7 denotes a sample table which is left in a constant temperature and humidity chamber 1 in a low temperature environment and then immediately transferred into the temperature and humidity holding container 2 on which an insulation resistance to be measured is placed. The test piece 8 is arranged. The resistance value data detected by the surface insulation resistance tester 3 is transferred to the scanner 9 as a data processing unit, where predetermined arithmetic processing and the like are performed and output to the CRT 12 of the printer 10 or the personal computer 11. Become. In the present apparatus, the temperature / humidity data in the temperature / humidity holding container 2 controlled by the temperature / humidity controller 6 can also be input to the scanner 9 and externally output.

【0017】このように、本実施例による絶縁抵抗測定
装置は、複数のユニットからなる絶縁抵抗測定システム
として構成され、絶縁抵抗測定はアルミニウムからなる
温湿度保持容器2内で行われるようにしたため、電磁波
や風による悪影響や、塵・埃の付着による悪影響がなく
なり、このような外乱を排除して純粋な絶縁抵抗を測定
することができる。更に本実施例では、温湿度保持容器
2に湿気を供給する加湿器5を設け、保持容器2に設け
られた温湿度計4からの温湿度データに基づいて温湿度
コントローラ6によって加湿器5の作動を適宜制御する
ようにしたため、温湿度保持容器2内の測定環境を常に
一定に保持することができ、得られるデータの信頼性を
高めることができる。なお、この変形例としては、図示
した加湿器5の他に、温湿度保持容器2内の温度を上昇
させるヒータ(図示せず)を設け、その作動を温湿度コ
ントローラ6に委ねるようにしても良い。
As described above, the insulation resistance measuring apparatus according to the present embodiment is configured as an insulation resistance measuring system including a plurality of units, and the insulation resistance measurement is performed in the temperature and humidity holding container 2 made of aluminum. The adverse effects of electromagnetic waves and winds and the adverse effects of dust and dirt are eliminated, and such disturbances can be eliminated and pure insulation resistance can be measured. Further, in the present embodiment, a humidifier 5 for supplying humidity to the temperature / humidity holding container 2 is provided, and the temperature / humidity controller 6 controls the humidifier 5 based on the temperature / humidity data from the temperature / humidity meter 4 provided in the holding container 2. Since the operation is controlled appropriately, the measurement environment in the temperature / humidity storage container 2 can be constantly maintained, and the reliability of the obtained data can be improved. As a modification, in addition to the illustrated humidifier 5, a heater (not shown) that raises the temperature in the temperature / humidity holding container 2 is provided, and the operation is entrusted to the temperature / humidity controller 6. good.

【0018】図2に、本発明の第2実施例としての絶縁
抵抗測定装置を示す。なお、本実施例において、先の実
施例と同様な構成要素は同一番号を付すこととする。先
の実施例が、恒温恒湿槽1に隣接して温湿度保持容器2
を配置したのに対し、第2実施例では、恒温恒湿槽1の
内部に温湿度保持容器2が配置される。
FIG. 2 shows an insulation resistance measuring device as a second embodiment of the present invention. In this embodiment, the same components as those in the previous embodiment are designated by the same reference numerals. In the previous embodiment, the temperature and humidity holding container 2 is provided adjacent to the constant temperature and humidity chamber 1.
On the other hand, in the second embodiment, the temperature and humidity holding container 2 is arranged inside the constant temperature and humidity chamber 1.

【0019】この温湿度保持容器2は、先のアルミ材に
代わってアクリル材により形成されており、第1実施例
同様、その内部へは加湿器5からの蒸気が供給されるよ
うになっている。また、温湿度保持容器2の底部にはヒ
ータ13が設けられ、加湿器5同様その作動は温湿度コ
ントローラ6によって制御される。
The temperature / humidity holding container 2 is made of an acrylic material in place of the above aluminum material, and the steam from the humidifier 5 is supplied to the inside thereof as in the first embodiment. There is. A heater 13 is provided at the bottom of the temperature / humidity holding container 2, and its operation is controlled by the temperature / humidity controller 6 like the humidifier 5.

【0020】しかして、絶縁抵抗測定は、まず恒温恒湿
槽1で絶縁抵抗試験片8を所定時間低温環境に放置した
後、プッシャ(図示せず)などの手段を用いて試料台8
をそのまま温湿度保持容器2側へと押し込む。本実施例
における温湿度保持容器2は、図示するように内側傾倒
式のウイング14を備えているため、試料台7によって
押されることで、容器入り口が自動的に開くこととな
り、これにより試験片8の投入が達成される。容器内の
固定部材15上への試料台7のセットとともに、ほぼ時
を同じくして温湿度保持容器2のウイング14が閉じる
こととなり、これにより恒温恒湿槽1内空間と温湿度保
持容器2内空間とが遮断され、所定の常温環境(測定条
件)が得られることとなる。図示した他の構成要素の作
動は、先の実施例のそれと全く同様であるため、ここで
は説明を省略する。
In order to measure the insulation resistance, first, the insulation resistance test piece 8 is left in a constant temperature and humidity chamber 1 in a low temperature environment for a predetermined time, and then a sample table 8 is used by means such as a pusher (not shown).
Is pushed into the temperature and humidity holding container 2 side as it is. Since the temperature / humidity holding container 2 in the present embodiment is provided with the inwardly tilting wing 14 as shown in the drawing, when it is pushed by the sample table 7, the container entrance is automatically opened. Eight inputs are achieved. Along with the setting of the sample table 7 on the fixing member 15 in the container, the wing 14 of the temperature / humidity holding container 2 is closed at about the same time, whereby the space inside the constant temperature and humidity chamber 1 and the temperature / humidity holding container 2 are closed. The internal space is cut off, and a predetermined room temperature environment (measurement condition) is obtained. The operation of the other components shown in the figure is exactly the same as that of the previous embodiment, so the description thereof is omitted here.

【0021】このように本発明の第2実施例によれば、
恒温恒湿槽1それ自体の内部に温湿度保持容器2を収納
することで、試験片8を温湿度保持容器2と恒温恒湿槽
1とで2重にブロックした状態で絶縁抵抗測定すること
ができ、電磁波シールド用として容器2をアルミ材料で
形成しなくとも、アクリルなどの一般材料で、電磁波に
よる悪影響を低減することができる。また、内部移送
(スライド)式であるため作業者の手が試験片8に接触
することがなく、汚染による抵抗変動成分をゼロとする
ことができる。当然、この2重シールドに伴って、振動
や風、あるいは埃・塵などによる測定誤差成分を低減す
ることができ、測定値の信頼性を格段に向上することが
できる。
As described above, according to the second embodiment of the present invention,
By storing the temperature / humidity holding container 2 inside the constant temperature / humidity tank 1 itself, the insulation resistance is measured while the test piece 8 is doubly blocked by the temperature / humidity holding container 2 and the constant temperature / humidity tank 1. Therefore, even if the container 2 for electromagnetic wave shielding is not formed of an aluminum material, a general material such as acrylic can be used to reduce the adverse effects of electromagnetic waves. Further, since it is an internal transfer (slide) type, the operator's hand does not come into contact with the test piece 8, and the resistance fluctuation component due to contamination can be made zero. Naturally, with this double shield, measurement error components due to vibration, wind, dust, dust, etc. can be reduced, and the reliability of measured values can be significantly improved.

【0022】(確認試験)以上のように構成された絶縁
抵抗測定装置の試験精度を確認するため、以下の機器お
よび材料を用いて試料の低温放置後の絶縁抵抗回復特性
を測定した。
(Confirmation Test) In order to confirm the test accuracy of the insulation resistance measuring device configured as described above, the insulation resistance recovery characteristics of the sample after being left at a low temperature were measured using the following equipment and materials.

【0023】絶縁抵抗計 : 絶縁抵抗測定範囲 10
〜3×106Ω(測定電圧100V時) 使用機器 : 株式会社アドバンテスト製ハイレジスタ
ンスメータR8340A 恒温恒湿槽 : 楠本化成株式会社製エタックF×21
0P(専用端子ボックス付き) 温湿度範囲;−20℃〜100℃,20%〜98%RH 測定演算部 : NEC製PC9801FS 測定ケーブル: 低雑音2重シールドタイプテフロン
(商標)ケーブル 試料 : ガラス布基材エポキシ樹脂・銅張り積
層板GE−4F,GE−4(JIS C 6480) 又は、合成繊維布基材エポキシ樹脂SE−1を基板とす
る櫛形電極基板 導体幅:0.318(mm) 導体間隔:0.318(mm) 重ね代: 15.75 (mm) 洗浄剤 : イソプロピルアルコール(JIS K 8
839) また、試験は以下の手順で行った。
Insulation resistance meter: Insulation resistance measurement range 10
~ 3 × 106Ω (at measurement voltage 100V) Equipment used: High resistance meter R8340A manufactured by Advantest Co., Ltd. Constant temperature and humidity chamber: ETAC F * 21 manufactured by Kusumoto Kasei Co., Ltd.
0P (with dedicated terminal box) Temperature / humidity range; -20 ° C to 100 ° C, 20% to 98% RH Measurement calculation unit: NEC PC9801FS measurement cable: Low noise double shield type Teflon (trademark) cable Sample: Glass cloth base Material Epoxy resin / copper-clad laminate GE-4F, GE-4 (JIS C 6480) or a comb-shaped electrode substrate using synthetic fiber cloth base material epoxy resin SE-1 as a conductor Conductor width: 0.318 (mm) Conductor spacing : 0.318 (mm) Stacking margin: 15.75 (mm) Cleaning agent: Isopropyl alcohol (JIS K 8
839) Further, the test was conducted in the following procedure.

【0024】(1) 基板表面をイソプロピルアルコー
ルで清浄処理した後、十分乾燥する。 (2) 基板1枚当たりフラックス0.05mlを均一
に塗布した後、以下の条件ではんだ付けを行う。
(1) After cleaning the surface of the substrate with isopropyl alcohol, it is sufficiently dried. (2) After uniformly applying 0.05 ml of flux per substrate, soldering is performed under the following conditions.

【0025】 はんだ付け条件:IPC SF−818に準拠 フラックス:JS−64MSS*(弘輝製) はんだ組成:60/40(Sn/Pb) はんだ温度:232±6℃ はんだ付け時間:5〜10sec (3) はんだ付け後、室温まで冷却した基板の絶縁抵
抗値を以下の測定条件で測定し、1×1013Ω以上の絶
縁抵抗値を有する基板を試験片とする。
Soldering conditions: In accordance with IPC SF-818 Flux: JS-64MSS * (manufactured by Hiroki) Solder composition: 60/40 (Sn / Pb) Solder temperature: 232 ± 6 ° C. Soldering time: 5-10 sec (3 ) After soldering, the insulation resistance value of the board cooled to room temperature is measured under the following measurement conditions, and a board having an insulation resistance value of 1 × 10 13 Ω or more is used as a test piece.

【0026】測定条件 測定電圧:100V 測定環境:標準試験室(23℃,55%RH) 標準試験ボックス(温湿度保持容器:23℃,55%
RH) エアコンOFF時の室内 (4) 恒温恒湿槽の温湿度を−20℃,0%RHに設
定し、温度−20±5℃で試料を投入し、60±5分間
放置する。
Measurement conditions Measurement voltage: 100 V Measurement environment: Standard test room (23 ° C., 55% RH) Standard test box (temperature and humidity holding container: 23 ° C., 55%)
RH) Indoors when the air conditioner is off (4) Set the temperature and humidity of the constant temperature and humidity chamber to -20 ° C and 0% RH, insert the sample at a temperature of -20 ± 5 ° C, and leave it for 60 ± 5 minutes.

【0027】(5) 恒温恒湿槽より試料を取り出し、
以下の各要領にて10秒後、30秒後、1分後〜10分
後(この間1分おき)、20分後〜60分後(この間1
0分おき)、2時間後、3時間後の絶縁抵抗を測定す
る。
(5) Remove the sample from the constant temperature and humidity chamber,
In each of the following procedures, 10 seconds, 30 seconds, 1 minute to 10 minutes later (every 1 minute during this period), 20 minutes to 60 minutes later (1 hour during this period)
Insulation resistance is measured after 2 hours and 3 hours.

【0028】(試験1)恒温恒湿槽から試料を取り出
し、JS−64MSS*の試料の内、絶縁抵抗値の高い
ほうから各6枚づつのI,II,III,IVのグルー
プに分け、標準試験室(23℃,55%RH)および
標準試験ボックス(23℃,55%RH)で絶縁抵抗
値をマニュアル測定した。結果を図3に示す。
(Test 1) Samples were taken out from the constant temperature and humidity chamber, and among the JS-64MSS * samples, the ones with the highest insulation resistance values were divided into groups of I, II, III, and IV, each of which had a standard value of 6 pieces. The insulation resistance value was manually measured in a test room (23 ° C., 55% RH) and a standard test box (23 ° C., 55% RH). The results are shown in Fig. 3.

【0029】図は、両者間には顕著な差がなく、標準試
験室の測定値と同様な値が得られることを示している。
The figure shows that there is no noticeable difference between the two, and that values similar to those measured by the standard laboratory are obtained.

【0030】(試験2)恒温恒湿槽内が25℃,75%
RHから−20℃,0%RHに降下するようにパソコン
制御された測定システムを使用し、約2時間で−20
℃,0%RHを達成後、その後試料を外に出し、標準
試験ボックス(23℃,55%RH)に入れて試料表面
を結露させ、その後の絶縁抵抗回復特性を測定した。結
果を図4に示す。なお図中カッコ内矢印の説明は、その
時点で−20℃,0%RHから23℃,55%RHの環
境に試料を取り出して基板を結露させたことを示してい
る。以降のグラフについても同様である。試料のフラッ
クスはJS−64MSS*とJS80MSが用いられ、
3回の測定ではほぼ同じ値が得られている。
(Test 2) 25 ° C., 75% in constant temperature and humidity chamber
Use a measurement system that is controlled by a personal computer so that the temperature drops from RH to -20 ° C and 0% RH.
After achieving 0 ° C. and 0% RH, the sample was then taken out, put in a standard test box (23 ° C., 55% RH) to cause dew condensation on the sample surface, and thereafter the insulation resistance recovery characteristics were measured. FIG. 4 shows the results. The explanation of the arrow in the parentheses in the figure indicates that the sample was taken out from the environment of −20 ° C., 0% RH to 23 ° C., 55% RH at that time to condense the substrate. The same applies to the subsequent graphs. As the sample flux, JS-64MSS * and JS80MS are used.
Almost the same value was obtained in three measurements.

【0031】(試験3)試験2同様、パソコン制御によ
って、約2時間で−10℃,0%RHを達成後、その後
試料を外に出し、標準試験ボックス(25℃,75%
RH)に入れて試料表面を結露させ、その後の絶縁抵抗
回復特性を測定した。結果を図5に示す。試料のフラッ
クスはJS−64MSS*とA90が用いられ、3回の
測定ではほぼ同じ値が得られた。
(Test 3) As in Test 2, after controlling the personal computer to achieve -10 ° C. and 0% RH in about 2 hours, the sample was taken out and the standard test box (25 ° C., 75%) was used.
RH) to cause dew condensation on the surface of the sample, and thereafter the insulation resistance recovery characteristic was measured. Results are shown in FIG. As the flux of the sample, JS-64MSS * and A90 were used, and almost the same value was obtained in three measurements.

【0032】(試験4)試験2同様、パソコン制御によ
って、約2時間で−20℃,0%RHを達成後、その後
試料を外に出すことなく恒温恒湿槽内の標準試験ボック
ス(23℃,55%RH)に入れて試料表面を結露さ
せ、その後の絶縁抵抗回復特性を測定した。結果を図6
に示す。試料のフラックスはJS−64MSS*とJS
80MSが用いられ、3回の測定ではほぼ同じ値が得ら
れた。以上、各試験1〜4の試験条件および温度条件を
以下の表にまとめる。
(Test 4) As in Test 2, after controlling -20 ° C. and 0% RH in about 2 hours by controlling a personal computer, the standard test box (23 ° C.) in the constant temperature and humidity chamber was kept without taking out the sample. , 55% RH) to cause dew condensation on the sample surface, and thereafter the insulation resistance recovery characteristics were measured. The result is shown in Fig. 6.
Shown in Sample flux is JS-64MSS * and JS
80MS was used and three measurements gave almost the same values. The test conditions and temperature conditions of the tests 1 to 4 are summarized in the table below.

【0033】[0033]

【表1】 [Table 1]

【0034】本発明の絶縁抵抗測定装置の効果を確認す
るため、比較例として従来より行われている各種絶縁抵
抗回復特性評価テストを以下の要領で行った。
In order to confirm the effect of the insulation resistance measuring apparatus of the present invention, various insulation resistance recovery characteristic evaluation tests which have been conventionally performed as comparative examples were conducted in the following manner.

【0035】(比較試験1)恒温恒湿槽から試料を取り
出し、JS−64MSSの試料の内、絶縁抵抗値の高い
ほうから各6枚づつのI,II,IIIのグループに分
け、エアコンOFF時の室内で絶縁抵抗値をマニュア
ル測定した。結果を図7に示す。図は、I,II,II
Iのグループ間では差が認められるが、各グループ内で
は値が大きくばらつくことを示している。
(Comparative Test 1) Samples were taken out from the constant temperature and humidity chamber, and among the JS-64MSS samples, the ones each having a higher insulation resistance value were divided into I, II, and III groups of 6 sheets each, and the air conditioner was turned off. The insulation resistance value was manually measured in the room. FIG. 7 shows the results. The figure shows I, II, II
Although the difference is recognized between the groups of I, it shows that the values greatly vary within each group.

【0036】(比較試験2)恒温恒湿槽内が25℃,7
5%RHから−20℃,0%RHに降下するようにパソ
コン制御された測定システムを使用し、約2時間で−2
0℃,0%RHを達成後、その後試料を外に出し、標準
試験ボックスを使用せずエアコン不作動状態で試料表面
を結露させ、その後の絶縁抵抗回復特性を測定した。結
果を図8に示す。図は、空気中の電磁波の影響を受けて
3回の測定結果が大きくばらつくことを示している。
(Comparative Test 2) The inside of the constant temperature and humidity chamber was 25 ° C. and 7
Using a measuring system that is controlled by a personal computer so that the temperature drops from 5% RH to -20 ° C and 0% RH, it will be -2 in about 2 hours.
After achieving 0 ° C. and 0% RH, the sample was then taken out, and the surface of the sample was condensed in the air conditioner inoperative state without using the standard test box, and then the insulation resistance recovery characteristics were measured. The results are shown in Fig. 8. The figure shows that the results of three measurements greatly vary under the influence of electromagnetic waves in the air.

【0037】(比較試験3)恒温恒湿槽内が25℃,7
5%RHから−20℃,0%RHに降下するようにパソ
コン制御された測定システムを使用し、約2時間で−2
0℃,0%RHを達成後、その後試料を外に出し、空気
中に塵、埃が散乱する状態で試料表面を結露させ、その
後の絶縁抵抗回復特性を測定した。結果を図9に示す。
図は、比較試験2同様、3回の測定結果が大きくばらつ
くことを示している。
(Comparative Test 3) The inside of the constant temperature and humidity chamber was 25 ° C. and 7
Using a measuring system that is controlled by a personal computer so that the temperature drops from 5% RH to -20 ° C and 0% RH, it will be -2 in about 2 hours.
After achieving 0 ° C. and 0% RH, the sample was then taken out, and the sample surface was condensed with dust scattered in the air, and then the insulation resistance recovery characteristics were measured. The results are shown in Fig. 9.
The figure shows that, similarly to the comparative test 2, the measurement results of three times greatly vary.

【0038】(比較試験4)比較試験2と同様に試料を
外に取り出し絶縁抵抗回復特性を評価した。但し、測定
途中でエアコンを入れ、測定環境を14℃,55%RH
に変えた。結果を図10に示す。図は、温湿度の変化に
伴って、3回の測定結果が大きくばらつくことを示して
いる。
(Comparative Test 4) Similar to Comparative Test 2, the sample was taken out and the insulation resistance recovery characteristic was evaluated. However, the air conditioner is turned on during the measurement and the measurement environment is 14 ° C and 55% RH.
Changed to. The results are shown in Fig. 10. The figure shows that the measurement results of three times greatly vary with changes in temperature and humidity.

【0039】(比較試験5)比較試験2と同様に試料を
外に取り出し絶縁抵抗回復特性を評価した。但し、測定
途中で試料に対し振動、風を与えた。結果を図11に示
す。図は、3回の測定結果が大きくばらつくことを示し
ている。以上、各比較試験1〜5の試験条件および温度
条件を以下の表にまとめる。
(Comparative Test 5) Similar to Comparative Test 2, the sample was taken out and the insulation resistance recovery characteristic was evaluated. However, vibration and wind were applied to the sample during the measurement. The results are shown in Fig. 11. The figure shows that the results of three measurements vary greatly. The test conditions and temperature conditions of each of the comparative tests 1 to 5 are summarized in the table below.

【0040】[0040]

【表2】 [Table 2]

【0041】以上の測定から、標準試験ボックスを使用
した試験1〜4においては、得られる絶縁抵抗回復特性
も、繰り返しテスト間でほぼ一定に安定していることが
認められた。これに対し、標準試験ボックスを使用しな
い比較試験1〜5においては、得られる絶縁抵抗回復特
性も繰り返しテスト間でバラツキが大きく、仮に平均値
でその回復特性と代表しても、データ自体の信頼性が極
めて低いことが裏付けられた。
From the above measurements, it was confirmed that in Tests 1 to 4 using the standard test box, the obtained insulation resistance recovery characteristics were also almost constant and stable between repeated tests. On the other hand, in Comparative Tests 1 to 5 that do not use the standard test box, the obtained insulation resistance recovery characteristics also vary widely between repeated tests, and even if the average value represents the recovery characteristics, the reliability of the data itself is reduced. This proves that the sex is extremely low.

【0042】[0042]

【発明の効果】以上説明したように、本発明による絶縁
抵抗測定装置は、これまでの恒温恒湿槽に加えて、低温
放置後の試料を収容するとともにその内部で試料の絶縁
抵抗を測定可能な温湿度保持容器を備えるため、外界と
の接触が一切断たれた一定の環境条件下で、試料表面を
結露させ絶縁抵抗を測定でき、測定データの信頼性を向
上することができる。また、温湿度保持容器に試料を収
納した状態で測定するため、測定データへの電磁波や振
動および風の影響を無くし、また試料への塵・埃の付着
を無くすことができ、測定の信頼性を向上することがで
きる。
As described above, the insulation resistance measuring device according to the present invention is capable of accommodating a sample after being left at a low temperature and measuring the insulation resistance of the sample in addition to the conventional constant temperature and humidity chamber. Since the temperature and humidity holding container is provided, the insulation resistance can be measured by dew condensation on the sample surface under a constant environmental condition where the contact with the outside is cut off, and the reliability of the measurement data can be improved. In addition, since the sample is stored in a temperature and humidity holding container, the influence of electromagnetic waves, vibrations and wind on the measurement data can be eliminated, and the adhesion of dust and dirt to the sample can be eliminated. Can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1実施例による絶縁抵抗測定装置の
概略構成図である。
FIG. 1 is a schematic configuration diagram of an insulation resistance measuring device according to a first embodiment of the present invention.

【図2】本発明の第2実施例による絶縁抵抗測定装置の
概略構成図である。
FIG. 2 is a schematic configuration diagram of an insulation resistance measuring device according to a second embodiment of the present invention.

【図3】本発明の温湿度保持容器(標準試験ボックス)
および標準試験室を使用した試験1(マニュアル測定)
の結果を示し、表面絶縁抵抗の回復特性を示す図であ
る。
FIG. 3 is a temperature and humidity holding container of the present invention (standard test box)
And test 1 using a standard laboratory (manual measurement)
FIG. 5 is a diagram showing the results of the above and showing the recovery characteristics of surface insulation resistance.

【図4】本発明の温湿度保持容器(標準試験ボックス)
を使用した試験2(自動測定)の結果を示し、絶縁抵抗
の回復特性を示す図である。
FIG. 4 is a container for holding temperature and humidity of the present invention (standard test box)
It is a figure which shows the result of the test 2 (automatic measurement) which used the above, and shows the recovery characteristic of insulation resistance.

【図5】本発明の温湿度保持容器(標準試験ボックス)
を使用した試験3(自動測定)の結果を示し、絶縁抵抗
の回復特性を示す図である。
FIG. 5: Temperature and humidity storage container of the present invention (standard test box)
It is a figure which shows the result of the test 3 (automatic measurement) which used the above, and shows the recovery characteristic of insulation resistance.

【図6】本発明の温湿度保持容器(標準試験ボックス)
を使用した試験4(自動測定)の結果を示し、絶縁抵抗
の回復特性を示す図である。
FIG. 6 is a container for holding temperature and humidity of the present invention (standard test box)
It is a figure which shows the result of the test 4 (automatic measurement) which used the above, and shows the recovery characteristic of insulation resistance.

【図7】エアコンOFF時の室内でマニュアル測定した
比較試験1の絶縁抵抗回復特性を示す図である。
FIG. 7 is a diagram showing an insulation resistance recovery characteristic of a comparative test 1 measured manually in a room when the air conditioner is off.

【図8】エアコンOFF時の室内で自動測定した比較試
験2の絶縁抵抗回復特性を示す図である。
FIG. 8 is a diagram showing insulation resistance recovery characteristics of comparative test 2 automatically measured in a room when the air conditioner is off.

【図9】空気中に塵埃が散乱する状態で試料表面を結露
させ、その際の絶縁抵抗値性を自動測定した比較試験3
の結果を示す図である。
FIG. 9 is a comparative test 3 in which the surface of the sample is condensed in a state where dust is scattered in the air, and the insulation resistance value at that time is automatically measured.
It is a figure which shows the result of.

【図10】比較試験2と同様に試料を外に取り出し、測
定途中でエアコンを入れた際の絶縁抵抗値を自動測定し
た比較試験4の結果を示す図である。
FIG. 10 is a diagram showing the result of a comparative test 4 in which the sample is taken out and the insulation resistance value is automatically measured when the air conditioner is turned on during the measurement as in the comparative test 2.

【図11】比較試験2と同様に試料を外に取り出し、測
定途中で振動・風を与えた際の絶縁抵抗値を自動測定し
た比較試験5の結果を示す図である。
FIG. 11 is a diagram showing a result of a comparative test 5 in which the sample is taken out like the comparative test 2 and the insulation resistance value when the vibration and the wind are applied during the measurement is automatically measured.

【符号の説明】[Explanation of symbols]

1 恒温恒湿槽 2 温湿度保持容器 3 表面絶縁抵抗計 4 温湿度計 5 加湿器 6 温湿度コントローラ 7 試料台 8 絶縁抵抗試験片 9 スキャナ 10 プリンタ 11 パソコン 12 CRT 13 ヒータ 1 Constant Temperature and Humidity Tank 2 Temperature and Humidity Storage Container 3 Surface Insulation Resistance Meter 4 Temperature and Humidity Meter 5 Humidifier 6 Temperature and Humidity Controller 7 Sample Stand 8 Insulation Resistance Test Piece 9 Scanner 10 Printer 11 Personal Computer 12 CRT 13 Heater

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 試料を所定の低温環境に放置した後、一
定の常温環境に戻して試料表面を結露させ、その際の試
料の絶縁抵抗を測定して絶縁抵抗回復特性を評価する絶
縁抵抗測定装置であって、 前記試料を収容して前記低温環境を形成することができ
る恒温恒湿槽と、低温放置後の試料を収容する温湿度保
持容器と、前記温湿度保持容器に連通して容器内に水分
供給する加湿器と、前記加湿器を駆動制御して温湿度保
持容器内空間を前記一定の常温環境に保持する温湿度調
節手段と、試料の絶縁抵抗を測定する絶縁抵抗計と、を
備えてなる絶縁抵抗測定装置。
1. An insulation resistance measurement in which a sample is left in a predetermined low temperature environment, then returned to a constant room temperature environment to cause dew condensation on the surface of the sample, and the insulation resistance of the sample is measured to evaluate insulation resistance recovery characteristics. A device, which is a thermo-hygrostat capable of accommodating the sample to form the low temperature environment, a temperature / humidity holding container for accommodating the sample after being left at a low temperature, and a container communicating with the temperature / humidity holding container. A humidifier for supplying water to the inside, a temperature and humidity adjusting means for driving and controlling the humidifier to hold the temperature and humidity holding container inner space in the constant room temperature environment, an insulation resistance meter for measuring the insulation resistance of the sample, An insulation resistance measuring device comprising:
【請求項2】 前記温湿度保持容器は、前記恒温恒湿槽
の内部に置かれることを特徴とする請求項1に記載の絶
縁抵抗測定装置。
2. The insulation resistance measuring device according to claim 1, wherein the temperature and humidity holding container is placed inside the constant temperature and constant humidity chamber.
【請求項3】 前記温湿度保持容器は、前記恒温恒湿槽
に隣接してその外部に置かれ、電磁波障壁材より形成さ
れることを特徴とする請求項1に記載の絶縁抵抗測定装
置。
3. The insulation resistance measuring device according to claim 1, wherein the temperature / humidity storage container is placed adjacent to the constant temperature and constant humidity chamber and is formed of an electromagnetic wave barrier material.
【請求項4】 前記温湿度保持容器は、容器内温度を上
げるためのヒータを備え、前記温湿度調節手段は前記ヒ
ータの作動も制御することを特徴とする請求項1または
2に記載の絶縁抵抗測定装置。
4. The insulation according to claim 1, wherein the temperature / humidity holding container includes a heater for raising the temperature inside the container, and the temperature / humidity adjusting means also controls the operation of the heater. Resistance measuring device.
JP6209292A 1994-08-10 1994-08-10 Insulation resistance measuring instrument Pending JPH0854430A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6209292A JPH0854430A (en) 1994-08-10 1994-08-10 Insulation resistance measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6209292A JPH0854430A (en) 1994-08-10 1994-08-10 Insulation resistance measuring instrument

Publications (1)

Publication Number Publication Date
JPH0854430A true JPH0854430A (en) 1996-02-27

Family

ID=16570532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6209292A Pending JPH0854430A (en) 1994-08-10 1994-08-10 Insulation resistance measuring instrument

Country Status (1)

Country Link
JP (1) JPH0854430A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105944974A (en) * 2016-06-28 2016-09-21 江苏时瑞电子科技有限公司 High-precision measurement device for thermistor finished products in air medium
CN108362743A (en) * 2018-04-03 2018-08-03 中国工程物理研究院激光聚变研究中心 Low-temperature resistivity measuring device and its installation method
CN109581058A (en) * 2018-11-15 2019-04-05 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Test device for insulation resistance

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105944974A (en) * 2016-06-28 2016-09-21 江苏时瑞电子科技有限公司 High-precision measurement device for thermistor finished products in air medium
CN108362743A (en) * 2018-04-03 2018-08-03 中国工程物理研究院激光聚变研究中心 Low-temperature resistivity measuring device and its installation method
CN109581058A (en) * 2018-11-15 2019-04-05 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Test device for insulation resistance

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