JPH0836010A - Relay testing converter - Google Patents

Abstract

PURPOSE:To enable the test of a test relay circuit in the non-voltage condition without removing wiring. CONSTITUTION:This relay testing converter is provided with a pair of input leads 17a, 17b, which are connected to two terminals to be tested of a test relay circuit freely to be disconnected, an input and output insulating photo coupler 22, in which a light emitting diode 25a is lighted by the voltage between both the input leads 17a, 17b, and a non-voltage converting output transistor 27 to be switched by ON/OFF of a light receiving photo transistor 25b of the photo coupler 22, and a pair of non-voltage test terminals 30a, 30b respectively connected to a pair of output terminals of the output transistor 27.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a relay test for use in testing the opening and closing of a relay contact in a voltage-applied state of a relay circuit by a non-voltage input tester (measuring instrument) such as a non-voltage relay tester. Regarding the converter.

[0002]

2. Description of the Related Art Conventionally, in a test of a protective relay circuit of a switchboard, a non-voltage relay tester is used for a test of operation time (operation time limit) and the like.

In particular, when the protection relay circuit is a fixed type instead of a pull-out type, the open / close of each relay contact is tested by the non-voltage relay tester in a non-voltage state, so that each required relay circuit under test is tested. The wiring of the terminals is removed, and the two terminals corresponding to both ends of the relay contact to be tested are placed in a non-voltage state, and then the pair of input leads of the relay tester are connected to these two terminals to perform the test.

Next, a conventional test using the non-voltage relay tester of the protection relay circuit 1 of FIG. 6 provided on the switchboard will be described. The protection relay circuit 1 operates with either a DC power supply or an AC power supply. In the figure, 2 is a case body of the protection relay circuit 1, 3 is a first terminal portion of the case body 2, and a plurality of terminals 4a, 4b. , ... are provided.

Reference numeral 4c denotes a positive power supply terminal of the first terminal portion 3 for supplying power to the auxiliary power supply portion 5 of the protection relay circuit 1 shown in FIG. 7, which is a positive electrode (P) of the DC power supply or a non-grounded end (X of the AC power supply). ) Via wiring. Reference numeral 4d denotes a negative power supply terminal of the first terminal portion 3 that supplies power to the auxiliary power supply unit 5, and is connected to the negative electrode (N) of the DC power supply or the ground end (Y) of the AC power supply via a wire.

Reference numerals 4e and 4f are two contact terminals of the first terminal portion 3, and are connected to one end of each of the relay contacts 6a and 6b of FIG. 7 which are a contacts of the overcurrent relay or the like of the protection relay circuit 1. . 4g is a common terminal of the first terminal portion 3,
It is connected to the other ends of the relay contacts 6a and 6b, and is connected to the positive power supply terminal 4c via wiring.

A second terminal portion 7 of the case body 2 is provided with a plurality of test terminals 8a, 8b, ... To which test currents from various transformer circuits are applied. Further, when the protection relay circuit 1 is provided as a protection relay circuit of a circuit breaker, it is wired as shown in FIG. 7 and accommodated in a switchboard.

In FIG. 7, reference numerals 9p and 9n denote positive (P) and negative (N) power supply terminals of the DC power supply, to which the positive and negative power supply terminals 4c and 4d of the protection relay circuit 1 are connected. 10 is a circuit breaker, 11 is a contact 12 of which one end is "off" operation
The timer relay of the circuit breaker 10 connected to the power supply terminal 9p via the power supply terminal 9n and the other end of the timer relay 11 and the power supply terminal 9n.
And a circuit breaker contact provided between and.

Reference numeral 14 is a contact terminal 4e of the protection relay circuit 1,
It is a blocking relay provided between 4f and the other end of the timer relay 11. When testing the operating time of the relay contacts 6a, 6b, etc., the terminal 4c,
Since 4g and the like are in the voltage-applied state, the wiring of the required terminals 4d, 4e, 4f, 4g, ... Is removed as shown in FIG. 8, and the terminals 4e, 4f, 4g ,.

Next, as shown in FIG. 9, a pair of input leads 15a, 15b of the non-voltage relay tester are connected to the terminals 4g, 4e in the non-voltage state via their plugs so as to be freely connected and disconnected. . Then, each terminal 8a of the second terminal portion 7,
Relay contact 6 by selective test current feeding of 8b, ...
a is opened and closed, and the operation time and the like are tested in a non-voltage state.

Reference numeral 16 in FIG. 9 is a crossover wire for securing a power source, one end of which is connected to the terminal 4c. In addition, relay contact 6
When the test of a is completed, the input lead 15b is removed from the terminal 4e and connected to the terminal 4f, and the relay contact 6a is tested in a non-voltage state. Thereafter, each relay contact is similarly tested. Be seen. When the test is completed, the terminals 4d, 4e, 4f, 4g, ... Are re-wired and returned to the original state of FIG.

[0012]

When the relay circuit is tested as in the prior art, the wiring of each required terminal is removed and the test is performed, and after the test is completed, when the wiring is returned to the original state, the wiring is removed. There is a problem that the complicated work of the return connection is required, and the test cannot be efficiently performed in a short time.

In addition, when rewiring by the return connection, a wiring error is likely to occur, and there is a problem that reliability and the like cannot be improved. An object of the present invention is to enable testing of a relay circuit in a non-voltage state without removing wiring or the like.

[0014]

In order to achieve the above-mentioned object, in the relay test converter of the present invention, a pair of terminals to be contacted and separated from two terminals to be tested of the relay circuit under test are connected. An input lead and a photocoupler for input / output insulation in which a light emitting diode is lit by a voltage between both input leads,
An output transistor for non-voltage conversion, which is switched by turning on and off a phototransistor for receiving light of the photocoupler, and a pair of non-voltage test terminals connected to a pair of non-voltage output terminals of the output transistor, respectively. .

[0015]

In the case of the relay test converter of the present invention configured as described above, the pair of terminals to be tested are paired in a voltage-applied state without removing the wiring of the relay circuit under test during the test. Input leads are connected.

Then, a voltage between the two terminals, which is intermittent according to the opening and closing of the relay contact, is generated between both input leads, and the light emitting diode of the photocoupler is lit by this voltage.
Further, the phototransistor for light reception is turned on and off by turning on and off the light emitting diode, and the output transistor is switched according to the turning on and off.

Then, a pair of non-voltage test terminals are connected to a pair of output terminals of the output transistor, and the switching between the output transistors turns on and off both the non-voltage test terminals. Therefore, if you connect a pair of input leads of a non-voltage input tester such as a non-voltage relay tester to both non-voltage test terminals, you can test the no-voltage state without disconnecting the wiring of the relay circuit under test. Can be done.

[0018]

EXAMPLES Examples will be described with reference to FIGS. 1 to 5. (First Embodiment) First, referring to FIGS.
Will be described with reference to. In FIG. 1 showing the circuit connection,
Reference numerals 17a and 17b denote a pair of input leads having clips 18a and 18b attached to their tips, 19a and 19b are input terminals connected to the ends of the input leads 17a and 17b on the base side, and 20 denotes diodes 21a to 21d. A rectifying unit formed by bridge connection, and a pair of AC terminals ac and a
c'is connected to the input terminals 19a and 19b.

Reference numeral 22 is a photocoupler for input / output insulation in the latter stage of the rectifying unit 20, and a pair of DC terminals d of the rectifying unit 20.
A light emitting diode 25a is provided between c and dc 'via voltage dividing resistors 23 and 24. Reference numeral 26 is a zener diode for overvoltage suppression, which is connected in parallel with a series circuit of a resistor 24 and a light emitting diode 25a.

Reference numeral 27 is an output transistor for non-voltage conversion in which the phototransistor 25b of the photocoupler 22 is provided in the base circuit, and the collector and emitter of the phototransistor 25b are connected to the base and emitter.

Reference numeral 28 denotes a DC power supply for driving the transistors 25b and 27, which is formed by a battery, the positive electrode of which is connected to the collector of the transistor 25b and the base of the transistor 27 via a current limiting resistor 29, and the negative electrode of which is the transistor 25b. , 27 emitters.

Reference numerals 30a and 30b are a pair of non-voltage test terminals. One terminal 30a is connected to the collector as one output terminal of the output transistor 27 via the diode 31, and the other terminal 30b is connected to the output transistor 27. Is connected to the emitter as the other output terminal of the.

32a and 32b are a pair of output leads whose ends on the base side are connected to the non-voltage test terminals 30a and 30b,
Reference numeral 33 denotes an adapter circuit section having a two-dot chain line configuration, and this circuit section 33 and input / output leads 17a, 17b, 32a, 3
A relay test transducer is formed by 2b. Three
Reference numeral 4 is a non-voltage relay tester, for example, 1
The output lead 32 is connected to the pair of operating time measuring terminals 35a and 35b.
The tip portions of a and 32b are connected so as to be freely contactable and separable.

Next, FIG. 2 shows the external appearance. In FIG. 2, 36 is a case body accommodating the adapter circuit portion 33 of FIG. 1, and 37 is a case body provided with a portion of the adapter circuit portion 33 excluding the battery 28. A printed circuit board in 36.

When the operation time of the protection relay circuit 1 of FIG. 6 mounted on the switchboard is tested, the wiring of the terminals 4d, 4e, ... Of the protection relay circuit 1 should be removed as shown in FIG. Instead, the input leads 17a and 17b are connected to and separated from the two terminals to be tested, for example, the terminals 4e and 4d, via the clips 18a and 18b.

The output leads 32a and 32b are connected to the measurement terminals 35a and 35b of the non-voltage relay tester 34. At this time, the circuit connection is as shown in FIG. 4, in which reference numeral 38 is a separate tester power supply device for supplying power to the relay tester 34.

By the way, the input leads 17a and 17b are connected to the terminals 4e and 4d by opening and closing the contact 6a.
This is for detecting from the presence or absence of the voltage of e. That is, in the case of this embodiment, when the opening / closing of the contact 6a is detected and the operation time thereof is tested, the input lead 17 is conventionally used.
Instead of connecting the terminals a and 17b to the terminals 4g and 4e for testing, the input leads 17a and 17b are connected to the terminals 4e and 4d, and the open / close state of the contact 6a is detected based on the presence / absence of the voltage at the terminal 4e for testing.

When the input leads 17a, 17b are connected to the terminals 4e, 4d, a voltage is generated between the terminals 4e, 4d only when the relay contact 6a is closed, and this voltage is passed through the rectifier 20 to the photocoupler. 22 is applied to the light emitting diode 25a, and the light emitting diode 25a is turned on.

Further, when the light emitting diode 25a is turned on, the phototransistor 25b is turned on and the output transistor 27 is inverted from off to on. By this inversion,
Between the measurement terminals 35a and 35b of the non-voltage relay tester 34 is inverted from open to closed via the diode 31 and the output transistor 27.

At this time, the photocoupler 22 insulates the input terminals 19a and 19b side from the non-voltage test terminals 30a and 30b side, and even if the output transistor 27 is switched, no voltage is generated between its collector and emitter. ,
The measurement terminals 35a and 35b are opened / closed in a no-voltage state according to the opening / closing of the relay contact 6a.

Therefore, the test using the non-voltage relay tester 34 can be performed without removing the wiring of the protection relay circuit 1 as in the case where the conventional wiring is removed and the test is performed in a non-voltage state.

The work of removing the wiring before the test and the work of rewiring after the test, that is, the work of removing and attaching the wiring is not required, and the test can be performed efficiently and in a short time. There is no such thing, and the reliability etc. are remarkably improved.

In addition, the rectifying section 2 is provided in the preceding stage of the photocoupler 22.
0 is provided, and the AC input is full-wave rectified by this rectification unit 20 and converted into DC, so that the test can be performed without any trouble even when the relay circuit under test such as the protection relay circuit 1 operates with an AC power supply. You can do it.

(Other Embodiments) Next, other embodiments will be described with reference to FIG. In the figure, the same reference numerals as those in FIG. 1 indicate the same elements, and the points different from FIG. 1 are the following points (i) and (ii).

(I) A half-wave rectification unit consisting of one diode 39 is provided instead of the rectification unit 20 of FIG. 1, and the diode 39, the light emitting diode 25, and the current limiting resistor 40 are provided between the input terminals 19a and 19b. Is provided in series, and the diodes 21a to 21d, the resistors 23 and 24, and the zener diode 26 of FIG. 1 are omitted.

(Ii) The base of the output transistor 27 is connected to the emitter of the phototransistor 25b, and the emitter of the output transistor 27 is connected to the negative electrode of the battery 28 and the no-voltage test terminal 30b.

Also in this embodiment, the photocoupler 22 electrically insulates and separates the input terminals 19a and 19b from the non-voltage test terminals 30a and 30b, and the switching of the output transistor 27 is the same as in the first embodiment. The test can be carried out in the no-voltage state, and the same efficiency as in the case of the first embodiment occurs. Moreover, since the rectifying section is formed only by the diode 39, the number of parts is smaller than in the case of FIG.
There is also an advantage that it can be formed at low cost.

By the way, in both of the above embodiments, the rectifying section 20 or the diode 39 is provided in order to be used for both the direct current and the direct current. However, in the case of DC only, the rectifying section 20, the diode 39 and the like can be omitted. Yes, in this case even simpler,
It will be cheaper.

The configuration of each section is not limited to those of the both embodiments, and it goes without saying that the output transistor 27 can be formed of various switching semiconductors such as FETs. Further, the adapter circuit section 33 may be incorporated in the non-voltage relay tester 34 or the like and incorporated therein.

[0040]

Since the present invention is configured as described above, it has the following effects. Without removing the wiring of the relay circuit under test 1 at the time of the test, a pair of input leads 1 with a voltage applied to the two terminals to be tested.
When 7a and 17b are connected, the voltage between the two terminals that continues according to the opening and closing of the relay contact causes the input leads 17a and 1b.
7b, and this voltage turns on the light emitting diode 25a of the photocoupler 22.

Furthermore, the phototransistor 25b for receiving light is turned on and off by turning on and off the light emitting diode 25a, and the output transistor 27 is switched according to the turning on and off, and by this switching, both non-voltage test terminals 30a, 30b. Turns on and off.

Therefore, the non-voltage test terminals 30a, 30
If a tester with a non-voltage input such as a non-voltage relay tester is connected to b, the operating time of the circuit under test can be tested in a no-voltage state without removing the wiring of the relay circuit under test 1, and wiring of the wiring under test can be performed. The test can be performed efficiently in a short time by omitting the removal work, and further, the occurrence of wiring mistakes due to rewiring can be prevented and the reliability and the like can be improved.

[Brief description of drawings]

FIG. 1 is a circuit diagram of an embodiment of the present invention.

FIG. 2 is a perspective view of an embodiment of the present invention.

FIG. 3 is a connection diagram of a relay circuit under test according to an embodiment of the present invention.

FIG. 4 is a connection diagram during a test of one example of the present invention.

FIG. 5 is a circuit diagram of another embodiment of the present invention.

FIG. 6 is an explanatory diagram of terminal wiring of a relay circuit under test.

7 is a connection diagram of FIG.

FIG. 8 is an explanatory diagram of a process before a test of a conventional example.

FIG. 9 is a connection diagram of a relay circuit under test at the time of a test of a conventional example.

[Explanation of symbols]

 1 Relay circuit under test 4a, 4b, ... Terminals of relay circuit under test 17a, 17b Input lead 22 Photocoupler 25a Light emitting diode 25b Phototransistor 27 Output transistor 30a, 30b Non-voltage test terminal

Claims (1)

[Claims] 1. A pair of input leads, which are connected to two terminals to be tested of a relay circuit under test so as to be able to come into contact with and separate from each other, and a photocoupler for input / output insulation in which a light emitting diode is lit by a voltage between the two input leads. A non-voltage converting output transistor that switches by turning on and off a light receiving phototransistor of the photocoupler, and a pair of no-voltage test terminals connected to the pair of output terminals of the output transistor, respectively. A relay test converter characterized by being provided.