JPH08271335A - Diffraction grating, and diffraction grating spectroscope using this diffraction grating - Google Patents

Diffraction grating, and diffraction grating spectroscope using this diffraction grating

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Publication number
JPH08271335A
JPH08271335A JP9954295A JP9954295A JPH08271335A JP H08271335 A JPH08271335 A JP H08271335A JP 9954295 A JP9954295 A JP 9954295A JP 9954295 A JP9954295 A JP 9954295A JP H08271335 A JPH08271335 A JP H08271335A
Authority
JP
Japan
Prior art keywords
diffraction grating
image
spectroscope
grating
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9954295A
Other languages
Japanese (ja)
Inventor
Yoshihiro Ueno
良弘 上野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP9954295A priority Critical patent/JPH08271335A/en
Publication of JPH08271335A publication Critical patent/JPH08271335A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To provide a spectroscope having no astigmatism by using a diffraction grating having a grating pattern recorded and formed by holographic exposure. CONSTITUTION: The grating pattern of a concave diffraction grating 1 having slightly different vertical and horizontal curvatures is formed by holographic exposure. A spectroscope is constituted in such a manner that the image of an incident slit 2 is directly formed on a spectrum image surface by the diffraction grating 1 itself without a collimator mirror. Namely, the part of a line S on a sample 4 is formed on the incident slit 2 by a lens 5. The image of the incident slit 2 is arranged in X-direction every wavelength on an image pickup element 3, the spectrum of each point laid along the line S on the sample 4, for example, a point P on the line S is formed along a line Q on the image pickup element 3. Since this diffraction grating 1 is a toroidal surface-like concave diffraction grating slightly more distorted than a spherical surface, and the grating pattern is formed by holographic exposure, the image can be formed without astigmatism on the end side of the incident slit 2.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用範囲】本発明は布地の色合の検査等面状
試料の分光測定に適する回析格子分光器に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a diffraction grating spectroscope suitable for spectroscopic measurement of an isometric sample for inspecting the color tone of fabric.

【0002】[0002]

【従来の技術】分光器は結像性のない光分散素子を用
い、コリメータ鏡とカメラ鏡を用いる型とこれらの鏡を
用いず分散素子自身に結像性を持たせた型とがある。コ
リメータ鏡等を用いる型ではコリメータ鏡とカメラ鏡が
共に光軸から傾けた配置となるので非点収差を持ってい
る。結像性回析格子を用いる型でも入射スリットの像を
出射スリットの位置に結像する結像作用に関しては普通
の鏡と異ならず、凹面鏡としての光軸から傾けた状態で
用いられているので、非点収差はまぬがれないものであ
る。しかし普通の分光分析では単一の試料が用いられる
ので、スリットの長さ方向に長くなる非点像が形成され
ても分解能には悪影響がないものである。
2. Description of the Related Art A spectroscope includes a type using a light dispersive element having no image forming property and using a collimator mirror and a camera mirror, and a type using a dispersive element itself without using these mirrors. The type using a collimator mirror or the like has astigmatism because both the collimator mirror and the camera mirror are arranged so as to be inclined from the optical axis. Even in the type using an image-forming diffraction grating, the image forming action of forming the image of the entrance slit at the position of the exit slit is not different from that of a normal mirror, and is used in a state of being tilted from the optical axis as a concave mirror. Astigmatism is inevitable. However, since a single sample is used in ordinary spectroscopic analysis, there is no adverse effect on the resolution even if an astigmatic image extending in the length direction of the slit is formed.

【0003】[0003]

【発明が解決しようとする課題】従来の分光器は分光分
析の対象の性質上、非点収差は余り問題にならなかった
が、面状試料の面分析とか多数試料の同時分析を考える
と、分光器の入射スリット上に面状試料の像を形成し
て、面状試料の一つの線に沿う分光特性の分布を測定す
ることになり、多数試料の同時測定でも、多数試料を一
列に並べてその像を入射スリット上に形成することにな
るので、入射スリットの長さ方向の各点が出射スリット
上の対応点に非点収差なしに結像されることが必要とな
り、従来のように分光器の非点収差に関して寛大である
ことができない。そこで本発明は結像性回析格子を用い
て非点収差のない分光器を提供しようとするものであ
る。
In the conventional spectroscope, astigmatism is not a serious problem due to the nature of the object of spectroscopic analysis, but considering surface analysis of planar samples and simultaneous analysis of multiple samples, An image of the planar sample is formed on the entrance slit of the spectroscope, and the distribution of the spectral characteristics along one line of the planar sample is measured. Since the image is formed on the entrance slit, each point in the length direction of the entrance slit needs to be imaged at a corresponding point on the exit slit without astigmatism. Cannot be generous with respect to the astigmatism of the vessel. Therefore, the present invention is intended to provide a spectroscope having no astigmatism by using an imaging diffraction grating.

【0004】[0004]

【課題を解決するための手段】縦横の曲率がわずかに異
る凹面回析格子で、格子パターンをホログラフィック露
光法によって形成し、その回析格子をコリメータ鏡なし
に、入射スリットの像を回析格子自身によって直接スペ
クトル像面上に形成させるように分光器を構成し、格子
パターン記録時の光源配置および分光器各部の配置のパ
ラメータの所期の目的が達成できる最適範囲、つまりパ
ラメータを多少変えても分光器の非点収差がほとんど変
わらない範囲を探索した。
[Means for Solving the Problems] A concave diffraction grating having slightly different vertical and horizontal curvatures is formed by a holographic exposure method, and the diffraction grating is used to scan an image of an entrance slit without a collimator mirror. The spectroscope is configured to be formed directly on the spectral image plane by the diffraction grating itself, and the optimum range of the parameters of the light source arrangement and the arrangement of each part of the spectrograph at the time of recording the grating pattern, that is, the optimum range, that is, the parameter We searched for a range in which the astigmatism of the spectroscope hardly changed even when the spectroscope was changed.

【0005】[0005]

【作用】本発明は球面よりわずか歪んだトロイダル面状
の凹面回析格子であるから、入射スリット上の各点と出
射スリット上の各点との間に物点像点の関係が成立し、
このような関係は球面でも成立つが、上述したような非
球面とし、かつホログラフィック露光法で格子パターン
を形成しているので、入射スリットの中央だけでなく端
の方でも非点収差なしに出射スリット上に結像される。
このような回析格子を用いているので、コリメータ鏡と
かカメラ鏡を要せず、入射スリット上の各点を夫々独立
の光源として各点毎にスペクトル分析ができることにな
る。
Since the present invention is the concave diffraction grating having a toroidal surface shape slightly distorted from the spherical surface, the object point image point relationship is established between each point on the entrance slit and each point on the exit slit.
Such a relationship holds true even for a spherical surface, but since the aspherical surface as described above is used and the grating pattern is formed by the holographic exposure method, the light is emitted without astigmatism not only at the center of the entrance slit but also at the end. An image is formed on the slit.
Since such a diffraction grating is used, it is not necessary to use a collimator mirror or a camera mirror, and each point on the entrance slit can be used as an independent light source for spectral analysis.

【0006】[0006]

【実施例】図1に本発明分光器の一実施例を示す。図で
1が本発明の主要部である回析格子、2は入射スリッ
ト、3はスペクトル像面に置かれた2次元撮像素子でサ
イズは15×15mmである。4は試料で試料上の線S
の部分がレンズ5によって入射スリット2上に形成され
る。この入射スリット2の像が撮像素子上に波長毎に図
示x方向に並んで形成され、試料上の線Sに沿う各点の
分光スペクトルが例えばS上のP点が撮像素子3上で線
Qに沿って展形される。
FIG. 1 shows an embodiment of the spectroscope of the present invention. In the figure, 1 is a diffraction grating, which is the main part of the present invention, 2 is an entrance slit, 3 is a two-dimensional image pickup device placed on the spectrum image plane, and the size is 15 × 15 mm. 4 is the sample and the line S on the sample
Is formed on the entrance slit 2 by the lens 5. The images of the entrance slits 2 are formed on the image pickup device side by side in the x direction in the figure for each wavelength, and the spectral spectrum of each point along the line S on the sample is, for example, the point P on S is the line Q on the image pickup device 3 on the image pickup device 3. Will be exhibited along.

【0007】図2は回析格子1の格子パターンを得るた
めのホログラフィック露光時の各種パラメータを示す図
である。この図で1は回析格子の素材で、この上に感光
レジスト層を設け、ホログラフィック露光で格子パター
ンを焼付け現像してエッチング処理を行うと図1におけ
る回析格子となる。この回析格子は図に示すように、格
子溝に平行な面即ちyz面内の曲率半径R2とxz平面
内の曲面半径R1が異っている。図2でC,Dは露光用
点光源でレーザ光源の出射ビームを2分割し、夫々を
C,D点に集光させたものであり、波長は457.93
nmである。下に露光に関する各パラメータの値を二つ
の例について示す。下記の数値で数字の後のE+1等と
あるのは数値に+1乗する。(E−2なら−2乗する)
と云うことを意味する。長さに関する数値は単位mmで
あるが、これは相対値と考えてよい。角度は度である。
また参考のため本発明とは離れたパラメータを設定した
場合についても検討したので、そのパラメータを3列目
に参照例として示す。 実施例 1 実施例 2 参照例 R1 1.0295E+2 1.0657E+2 1.2462E+2 R2 1.0252E+2 1.0529E+2 1.2254E+2 γ 2.8054E+1 −1.3201E−1 −2.6551E+0 rc 1.2007E+3 1.2000E+0 1.1426E+3 δ 1.7819E+1 8.0808E+0 5.5405E+0 rd 1.1992E+3 1.1999E+3 8.4085E+2
FIG. 2 is a diagram showing various parameters at the time of holographic exposure for obtaining the grating pattern of the diffraction grating 1. In FIG. 1, reference numeral 1 denotes a material of a diffraction grating, and a photosensitive resist layer is provided on the material, and the grating pattern is baked and developed by holographic exposure to perform etching treatment to obtain the diffraction grating in FIG. As shown in the figure, this diffraction grating has a radius of curvature R2 in a plane parallel to the lattice groove, that is, in the yz plane, and a radius of curvature R1 in the xz plane. In FIG. 2, C and D denote the point light sources for exposure, which are obtained by dividing the beam emitted from the laser light source into two and converging the beams at points C and D, respectively, and having a wavelength of 457.93.
nm. Below, the value of each parameter regarding exposure is shown about two examples. In the following numerical values, E + 1 after the numerical value is the numerical value plus 1. (If it's E-2, it's the -2 power)
Means to say. The numerical value regarding the length is in mm, but this may be considered as a relative value. The angle is in degrees.
Further, for reference, the case of setting a parameter apart from the present invention was also examined, and the parameter is shown as a reference example in the third column. Example 1 Example 2 Reference Example R1 1.0295E + 2 1.0657E + 2 1.2462E + 2 R2 1.0252E + 2 1.0529E + 2 1.2254E + 2 γ 2.8054E + 1-1.3201E-1 -2.6551E + 0 rc 1.2007E + 3 1.2000E + 01 .1426E + 3 δ 1.7819E + 1 8.0808E + 0 5.5405E + 0 rd 1.1992E + 3 1.1999E + 3 8.4085E + 2

【0008】上述したようにして製作された回析格子を
組込んだ分光器の各パラメータを図1に示してある。ス
ペクトル像の位置については、xz平面において2次元
撮像素子つまり像平面が切る直線をxz平面上の直線式
x=az+bとしてa,bの数値で示している。前記実
施例1,2と参照例とについて各パラメータの値を示
す。 実施例 1 実施例 2 参照例 a −3.4323E+0 −1.6652E+1 −5.5284E+0 b 3.0913E+2 1.5304E+3 6.4834E+2 ra 1.1483E+2 1.2339E+2 1.2590E+2 α 6.7963E+0 1.0014E+1 1.1596E+1
FIG. 1 shows each parameter of the spectroscope incorporating the diffraction grating manufactured as described above. Regarding the position of the spectral image, the two-dimensional image pickup element in the xz plane, that is, the straight line cut by the image plane is represented by the numerical values of a and b as a linear expression x = az + b on the xz plane. The value of each parameter is shown for the first and second embodiments and the reference example. Example 1 Example 2 Reference Example a-3.4323E + 0-1.6652E + 1-5.5284E + 0 b 3.0913E + 2 1.5304E + 3 6.4834E + 2 ra 1.1448E + 2 1.2339E + 2 1.2590E + 2 α 6.7963E + 0 1.014E + 1 1. 1596E + 1

【0009】図3は実施例1の分光器の波長380n
m,540nm,700nmの3波長についてのスペク
トル像で像面は高さ15mm,幅15mmの中に展開さ
れており、入射スリットの位置を縦軸上にとって入射ス
リット上の各点の像の形を示し、点像は入射スリット上
で1mm間隔にxz平面の上下に配した11点(うち一
つはxz面上の点)に対するものである。同様にして実
施例2について図4、参照例について図5に示す。
FIG. 3 shows the wavelength 380n of the spectroscope of the first embodiment.
In the spectral images for three wavelengths of m, 540 nm, and 700 nm, the image plane is developed within a height of 15 mm and a width of 15 mm, and the position of the entrance slit is on the vertical axis, and the shape of the image of each point on the entrance slit is shown. The point image is shown for 11 points (one of them is on the xz plane) arranged above and below the xz plane at 1 mm intervals on the entrance slit. Similarly, FIG. 4 shows the second embodiment and FIG. 5 shows the reference example.

【0010】図3,4,5を比較すると、実施例1と2
とで性能上ほとんど差がないことが分かる。これに対し
て参照例では全般に本発明より非点収差が大きく、短波
長側で特に非点収差が大きい。実施例1,2で示される
パラメータで撮像面の配置に関するa,bの値が大きく
異っているが、これは回析格子中心と入射スリットとの
間および撮像素子の中央と回析格子中心間の距離の設定
の仕方に関係するもので、実施例2は1よりもスペクト
ル像面が回析格子に近くなっている。一般的に、入射ス
リット位置を回析格子より遠ざけると、スペクトル像面
は回析格子に近づく。つまりa,b,raは分光器の外
形上の要求から選択される計上の選択要素で、これが実
施例の範囲でかなり大幅に変わっても他の諸パラメータ
を実施例1,2の値の範囲に採ることで非点収差軽減の
効果が得られることになる。
Comparing FIGS. 3, 4 and 5, Examples 1 and 2
It can be seen that there is almost no difference in performance between and. On the other hand, in the reference example, the astigmatism is generally larger than that of the present invention, and the astigmatism is particularly large on the short wavelength side. The values of a and b relating to the arrangement of the imaging surface are greatly different depending on the parameters shown in Examples 1 and 2, but this is between the diffraction grating center and the entrance slit and between the center of the image sensor and the diffraction grating center. This is related to the method of setting the distance between them, and the spectral image plane of Example 2 is closer to the diffraction grating than that of 1. Generally, when the entrance slit position is moved away from the diffraction grating, the spectral image plane approaches the diffraction grating. In other words, a, b, and ra are selection elements of the recorder selected from the requirements on the outer shape of the spectroscope, and even if this changes considerably within the range of the embodiment, other parameters are set within the range of the values of the first and second embodiments. The effect of reducing astigmatism can be obtained by adopting

【0011】実施例1,2を比較すると、効果の上でほ
とんど差がない。このことは実施例1,2に示された各
パラメータの値のその範囲の所に非点収差軽減に関して
一つの最良組合せの点があることを意味している。また
実施例1,2で効果にほとんど差がないので各パラメー
タとも実施例1,2の範囲を多少出ても実質的には本発
明の目的は達成されている。従って特許請求の範囲では
各パラメータは実施例の各値につき、大きい側は上から
5桁目を切り上げ、小さい側は5桁目を切捨てた値とし
ている。またR1,R2に関しては各値の大きい側と小
さい側をとって組合わせると曲率の大小関係が逆転する
ことになるが、格子の水平断面率半径R1の方がR2よ
り大であることが必要なので、R1/R2の値を規定し
てある。
Comparing Examples 1 and 2, there is almost no difference in effect. This means that there is one best combination point for astigmatism reduction in the range of the values of the parameters shown in Examples 1 and 2. Further, since there is almost no difference in the effect between the first and second embodiments, the object of the present invention is substantially achieved even if each parameter is slightly out of the range of the first and second embodiments. Therefore, in the claims, each parameter has a value with respect to each value of the embodiment, the larger side is rounded up from the fifth digit from the top, and the smaller side is rounded down from the fifth digit. Regarding R1 and R2, if the values are combined in such a way that the values are large and small, the relationship between the curvatures will be reversed, but the horizontal cross-section rate radius R1 of the lattice must be larger than R2. Therefore, the values of R1 / R2 are specified.

【0012】[0012]

【発明の効果】本発明回析格子は自身結像性を持ち他に
コリメータ鏡とかカメラ鏡を用いないで分光器が構成で
きるので、分光器が構造的に簡単にでき、かつ光分散方
向と直角の方向、つまり入出射スリット上の各点で非点
収差なしに入射スリット上の各点の像が出射スリット上
の対応点に形成されるので、試料面を一つの線に沿って
一度に分析でき、面全体の分光測定とか多数試料の分光
測定が能率的にできる効果がある。
The diffractive grating of the present invention has an image-forming property and can be constructed without using a collimator mirror or a camera mirror. Therefore, the spectroscope can be structurally simple and can be arranged in the direction of light dispersion. The image of each point on the entrance slit is formed at the corresponding point on the exit slit without any astigmatism in the direction of the right angle, that is, at each point on the entrance / exit slit, so that the sample surface is cut along one line at a time. It has the effect of being able to analyze and to efficiently perform spectroscopic measurement of the entire surface or spectroscopic measurement of a large number of samples.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例分光器の斜視図。FIG. 1 is a perspective view of a spectroscope according to an embodiment of the present invention.

【図2】上記分光器に用いられた回析格子の格子パター
ン記録時の斜視図。
FIG. 2 is a perspective view of a diffraction grating used in the spectroscope at the time of recording a grating pattern.

【図3】本発明の第1実施例のスペクトル像の図。FIG. 3 is a diagram of a spectrum image of the first embodiment of the present invention.

【図4】本発明の第2実施例のスペクトル像の図。FIG. 4 is a diagram of a spectrum image of a second embodiment of the present invention.

【図5】本発明分光器と異る各パラメータ値を持った分
光器のスペクトルの図。
FIG. 5 is a spectrum diagram of a spectroscope having different parameter values from the spectroscope of the present invention.

【符号の説明】[Explanation of symbols]

1 回析格子 2 入射スリット 3 撮像素子 4 試料 1 Diffraction grating 2 Incident slit 3 Image sensor 4 Sample

─────────────────────────────────────────────────────
─────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成7年7月20日[Submission date] July 20, 1995

【手続補正1】[Procedure Amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】発明の名称[Name of item to be amended] Title of invention

【補正方法】変更[Correction method] Change

【補正内容】[Correction content]

【発明の名称】 回折格子および同回折格
子を用いた回折格子分光器
Title: Diffraction grating and diffraction grating spectrometer using the same

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ホログラフィック露光法で格子パターン
を記録形成した回析格子で、格子面の格子溝と平行な面
内の曲率半径R2と格子溝と直交する面内の曲率半径R
1とが R1=102.9〜106.6 R2=102.5〜105.2 R1/R2=1.004〜1.010 で露光波長458nmの場合、回析格子中心Oと第1光
源との距離rc、Oと第2光源との距離rd、回析格子
中心法線と第1光源との離角γ、回析格子法線と第2光
源との離角δとして、 rc=1200〜1201 rd=1990〜1200 γ=−0.1320〜2.806 δ=8.080〜18.20 但し長さは相対値、角度は度であることを特徴とする回
析格子。
1. A diffractive grating in which a grating pattern is recorded and formed by a holographic exposure method, and a radius of curvature R2 in a plane parallel to a lattice groove of the lattice surface and a radius of curvature R in a plane orthogonal to the lattice groove.
1 is R1 = 102.9 to 106.6 R2 = 102.5 to 105.2 R1 / R2 = 1.004 to 1.010 and the exposure wavelength is 458 nm, the diffraction grating center O and the first light source are As the distance rc, the distance rd between the O and the second light source, the separation angle γ between the diffraction grating center normal and the first light source, and the separation angle δ between the diffraction grating normal and the second light source, rc = 1200 to 1201 rd = 1990 to 1200 γ = −0.1320 to 2.806 δ = 8.080 to 18.20 However, the length is a relative value and the angle is a diffraction grating characterized by being degrees.
【請求項2】 回析格子と入射スリットと、回析格子が
直接形成するスペクトル像面上に配置された出射スリッ
ト或は撮像素子とよりなり、回析格子として請求項1記
載のものを用い、分光器各部配置のパラメータを回析格
子中心Oと入射スリット中心との距離をra、入射スリ
ットの回析格子中心法線との離角をα、スペクトル像面
を回析格子中心法線をz軸とし、光分散方向でzと直交
する軸をx軸として、x=az+bで表わしたとき ra=114.8〜123.4 a=−3.432〜−16.66 b=309.1〜1531 α=6.796〜10.02 (但し長さは相対値、角度は度)であるようにしたこと
を特徴とする請求項1記載の回折格子を用いた回析格子
分光器。
2. A diffraction grating, an entrance slit, and an exit slit or an imaging device arranged on the spectrum image plane directly formed by the diffraction grating, wherein the diffraction grating according to claim 1 is used. , The parameter of the arrangement of each part of the spectroscope is the distance between the diffraction grating center O and the entrance slit center is ra, the angle of separation from the diffraction grating center normal of the entrance slit is α, and the spectrum image plane is the diffraction grating center normal. When z = axis and an axis orthogonal to z in the light dispersion direction is x-axis and expressed by x = az + b, ra = 114.8 to 123.4 a = -3.432 to -16.66 b = 309.1. The diffraction grating spectroscope using the diffraction grating according to claim 1, wherein .alpha. = 1531.alpha. = 6.796 to 10.02 (however, the length is a relative value and the angle is degree).
JP9954295A 1995-03-31 1995-03-31 Diffraction grating, and diffraction grating spectroscope using this diffraction grating Pending JPH08271335A (en)

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US20100284084A1 (en) * 2009-05-09 2010-11-11 Canon Kabushiki Kaisha Diffraction element, manufacturing method for diffraction element, and spectrometer using the same
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Publication number Priority date Publication date Assignee Title
JP2010181413A (en) * 1998-04-29 2010-08-19 Headwall Photonics Inc Corrected concentric spectrometer
JP2003028715A (en) * 2001-07-10 2003-01-29 Japan Atom Energy Res Inst Conical diffraction oblique-incidence spectroscope, and diffraction grating for the spectroscope
JP2008233248A (en) * 2007-03-16 2008-10-02 Konica Minolta Sensing Inc Concave diffraction mirror and spectral device using the same
US7916292B2 (en) 2007-03-16 2011-03-29 Konica Minolta Sensing, Inc. Concave diffraction grating device, reflective dispersion device, and spectral device
WO2010048073A3 (en) * 2008-10-20 2010-07-22 Ningbo Yuanlu Electro-Optics, Co., Ltd. Spectrometers with aberration-corrected concave diffraction gratings and transmissive aberration correctors
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US8767300B2 (en) * 2009-05-09 2014-07-01 Canon Kabushiki Kaisha Diffraction element, manufacturing method for diffraction element, and spectrometer using the same
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