JPH08248089A - Connector terminal inspector - Google Patents

Connector terminal inspector

Info

Publication number
JPH08248089A
JPH08248089A JP7050770A JP5077095A JPH08248089A JP H08248089 A JPH08248089 A JP H08248089A JP 7050770 A JP7050770 A JP 7050770A JP 5077095 A JP5077095 A JP 5077095A JP H08248089 A JPH08248089 A JP H08248089A
Authority
JP
Japan
Prior art keywords
terminal
connector
probe
contact
receiving portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7050770A
Other languages
Japanese (ja)
Inventor
Takayuki Sato
隆之 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yazaki Corp
Original Assignee
Yazaki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yazaki Corp filed Critical Yazaki Corp
Priority to JP7050770A priority Critical patent/JPH08248089A/en
Publication of JPH08248089A publication Critical patent/JPH08248089A/en
Pending legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE: To effectively inspect a connector terminal by the snug contact of an inspecting probe with the end of the terminal by providing a terminal receiver which makes a continuity in contact with the end of the connector at the end of the probe. CONSTITUTION: The connector terminal inspector comprises a terminal receiver 1 for the end of a connector terminal at the end of a forward probe in an inspecting probe. For example, a V-shaped groove 11 of the receiver 1 for a male terminal is formed in a rectangular equilateral triangular shape at the bottom from a quadrangular prism (vertical u, lateral v, height w) 2 in the shape in which a triangular prism is cut out with the height equal to the vertical u of the quadrangular prism 2. The cut-out part is symmetrical with respect to the central surface. The end of the terminal is brought into contact with the cutout surface 3. The surface 3 is shaped so that two flat surfaces 3', 3" cross. The upper flat surface 3' and the lower flat surface 3" of the surface 3 are brought into contact with the outer periphery of the terminal. A coiled spring has sufficiently larger spring force than the contact resistance of the terminal with a connector housing.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、コネクタに対する端子
の挿入状態及び導通状態を検査するのに用いるコネクタ
端子検査具に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a connector terminal inspection tool used for inspecting the insertion state and conduction state of a terminal with respect to a connector.

【0002】[0002]

【従来の技術】図5〜7は、従来のコネクタ端子検査具
を示すものである。このコネクタ端子検査具Aは、図5
に示す如く、フレーム20の一端側に、取付板21によ
って固定された、コネクタBに対する受部22と、他端
側に、フレーム20に対して回動自在に固定された操作
部23と、操作部23の回動によって前進及び後退する
検査器本体24とで構成されている。
2. Description of the Related Art FIGS. 5 to 7 show a conventional connector terminal inspection tool. This connector terminal inspection tool A is shown in FIG.
As shown in FIG. 4, a receiving portion 22 for the connector B fixed by a mounting plate 21 to one end side of the frame 20, an operation portion 23 rotatably fixed to the frame 20 to the other end side, The inspection unit main body 24 is moved forward and backward by the rotation of the portion 23.

【0003】検査器本体24は、受部22側にコネクタ
Bに対する嵌合凹部25と、嵌合凹部25内にコネクタ
Bの端子26に対する検査プローブCとを有し操作部2
3側に検査プローブCと、検査プローブCに接続される
電線(図示しない)との接続を保護する保護カバー27
とから成る。一対のリンク29の先端29aが検査器本
体24の両側壁24′,24′に、及び後端29bが操
作部23の両側壁23′,23′にそれぞれ回動自在に
軸支されている。
The inspector body 24 has a fitting recess 25 for the connector B on the receiving portion 22 side and an inspection probe C for the terminal 26 of the connector B in the fitting recess 25.
Protective cover 27 for protecting the connection between the inspection probe C and an electric wire (not shown) connected to the inspection probe C on the 3 side
It consists of and. The tip ends 29a of the pair of links 29 are rotatably supported on both side walls 24 'and 24' of the inspector body 24, and the rear ends 29b are supported on both side walls 23 'and 23' of the operating portion 23 so as to be rotatable.

【0004】これにより、操作部23の回動運動が検査
器本体24の前後運動に移行される。また、受部22の
下側からフレーム20の固定板(図示しない)へ向け
て、一対の案内シャフト(図示しない)が平行に検査器
本体24を貫通して架設されている。なお、検査プロー
ブCは、検査すべきコネクタBに挿着された端子26の
位置と個数とに対応して多数配列してある。
As a result, the rotational movement of the operating portion 23 is transferred to the back-and-forth movement of the inspector main body 24. Further, a pair of guide shafts (not shown) are installed in parallel from the lower side of the receiving portion 22 toward a fixing plate (not shown) of the frame 20 so as to pass through the inspector body 24 in parallel. It should be noted that a large number of inspection probes C are arranged corresponding to the positions and the number of terminals 26 inserted into the connector B to be inspected.

【0005】検査器本体24に挿着された検査プローブ
Cについて記述する。図6に示す如く、検査プローブC
は、端子26(図5)に対する前方プローブ31と、前
方プローブ31に接触し、図示しない電線に繋がる後方
プローブ32と、前方プローブ31の後半部分と後方プ
ローブ32の前半部分とを内部に収納する筒体33とか
ら構成される。
The inspection probe C inserted in the inspection device body 24 will be described. As shown in FIG. 6, the inspection probe C
Accommodates the front probe 31 for the terminal 26 (FIG. 5), the rear probe 32 that contacts the front probe 31 and is connected to an electric wire (not shown), and the rear half of the front probe 31 and the front half of the rear probe 32. It is composed of a cylindrical body 33.

【0006】前方プローブ31は、大中小径の三種類の
ピン31a,31b,31cを直列に連結して成り、大
ピン31aの先端で端子26(図5)に接触し、大ピン
31aの後端と中ピン31bの先端との間に鍔部34を
有し、筒体33の内周面に筒状に形成されたスペーサ3
5の孔36に小ピン31cの先端部を摺動自在に配置
し、鍔部34の後端とスペーサ35の先端との間にコイ
ルバネ37を挟み、コイルバネ37内に中ピン31bと
小ピン31cとを挿通させて成る。
The front probe 31 is formed by connecting three types of pins 31a, 31b and 31c of large, medium and small diameters in series. The tip of the large pin 31a contacts the terminal 26 (FIG. 5) and the rear of the large pin 31a. A spacer 3 that has a flange 34 between the end and the tip of the middle pin 31b and is formed in a cylindrical shape on the inner peripheral surface of the cylindrical body 33.
5, the tip of the small pin 31c is slidably arranged, the coil spring 37 is sandwiched between the rear end of the flange 34 and the tip of the spacer 35, and the middle pin 31b and the small pin 31c are inserted in the coil spring 37. It is made by inserting and.

【0007】後方プローブ32は、筒体33の内部に挿
着されたリング38の孔39に嵌着されている外套部4
0と、外套部40の先端40aに設けられた支え41を
介して外套部40の内部に摺動自在な内部ピン42とか
ら成り、更に、外套部40の後端40bの内側と内部ピ
ン42の後端42bとの間にコイルバネ43を有し、外
套部40の中央に外側から内側へ内部ピン42の移動に
対する抜止め44を形成し、内部ピン42の内側に内部
ピン42の過剰な前進および後退を阻止する前止め45
aと後止め45bとを設け、スペーサ35の孔36内で
内部ピン42の先端42aを摺動自在に、且つ、前方プ
ローブ31の小ピン31cの後端31′と隙間46を介
して配置されて成る。
The rear probe 32 is fitted in a hole 39 of a ring 38 which is inserted in the cylindrical body 33, and the outer cover portion 4 is attached.
0 and an inner pin 42 slidable inside the outer jacket 40 via a support 41 provided at the tip 40a of the outer jacket 40, and further, inside the rear end 40b of the outer jacket 40 and the inner pin 42. A coil spring 43 is provided between the rear end 42b, and a retaining member 44 is formed at the center of the outer jacket portion 40 against the movement of the inner pin 42 from the outer side to the inner side. And front stop 45 to prevent backward movement
a and a rear stopper 45b are provided, the tip 42a of the internal pin 42 is slidable in the hole 36 of the spacer 35, and the rear pin 31c of the small pin 31c of the front probe 31 is arranged with a gap 46 therebetween. Consists of

【0008】検査プローブCの作動について記述する。
図5に示す如く、受部22に挿着されたコネクタBへ向
けて検査器本体24を前進させることにより、図7に示
す如く、コネクタB内の端子26に向けて検査プローブ
Cが前進する。端子26の先端が検査プローブCの前方
プローブ31の先端に接触し、検査プローブCが更に前
進すると、図6に示す如く、前方プローブ31がコイル
バネ37に抗して後退し、前方プローブ31の小ピン3
1cの後端31′がスペーサ35内で後方プローブ32
の内部ピン42の先端42aに接触し、小ピン31cが
後退するのに伴って内部ピン42がコイルバネ43に抗
して後退する。
The operation of the inspection probe C will be described.
As shown in FIG. 5, by moving the inspector body 24 forward toward the connector B inserted in the receiving portion 22, the inspection probe C advances toward the terminal 26 in the connector B as shown in FIG. . When the tip of the terminal 26 comes into contact with the tip of the front probe 31 of the inspection probe C and the inspection probe C further advances, the front probe 31 retreats against the coil spring 37 as shown in FIG. Pin 3
The rear end 31 'of the 1c is located in the spacer 35 and the rear probe 32
The inner pin 42 comes into contact with the tip 42a of the inner pin 42 and the inner pin 42 retreats against the coil spring 43 as the small pin 31c retreats.

【0009】前方プローブ31の小ピン31cと後方プ
ローブ32の内部ピン42とが接触する(小ピン31c
と内部ピン42との接触がスイッチの役目を果してい
る)と、後方プローブ32の外套部40に接続された電
線(図示しない)と、コネクタBに挿着された電線19
とが図示しない検査回路を介して接続され、導通検査が
行われる。これにより、コネクタハウジング26′に対
する端子26の挿入状態および端子抜けを検査する。
The small pin 31c of the front probe 31 comes into contact with the internal pin 42 of the rear probe 32 (the small pin 31c.
The contact between the inner pin 42 and the inner pin 42 serves as a switch), the electric wire (not shown) connected to the outer cover portion 40 of the rear probe 32, and the electric wire 19 attached to the connector B.
And are connected via a test circuit (not shown), and a continuity test is performed. Thereby, the insertion state of the terminal 26 into the connector housing 26 'and the terminal disconnection are inspected.

【0010】[0010]

【発明が解決しようとする課題】しかしながら、検査プ
ローブの大ピンの先端面が平面に形成されているので、
端子の先端が大ピンの先端面上でぴたっと接触しない、
という問題点があった。また、コネクタに対して端子の
不完全挿入や端子抜け等が起こっている場合でも、検査
プローブ内のコイルバネのバネ圧が弱い(例えば、20
0g )ため、コネクタに対する端子の導通検査に合格し
てしまう、という問題点があった。
However, since the tip surface of the large pin of the inspection probe is formed flat,
The tip of the terminal does not come into direct contact with the tip of the large pin,
There was a problem. Further, even when the terminal is imperfectly inserted into the connector or the terminal is disconnected, the spring pressure of the coil spring in the inspection probe is weak (for example, 20
Therefore, there is a problem in that it passes the continuity test of the terminal with respect to the connector.

【0011】本発明は、上記した点に鑑み、検査プロー
ブの大ピンと端子の先端とをぴたっと接触させ、コネク
タに対して端子の不完全挿入および端子抜け等を確実に
検査するコネクタ端子検査具を提供することを目的とす
る。
In view of the above points, the present invention provides a connector terminal inspecting tool for surely inspecting a connector for incomplete insertion of a terminal, disconnection of a terminal or the like by bringing a large pin of an inspection probe into close contact with a tip of a terminal. The purpose is to provide.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するため
に、本発明は、検査すべきコネクタを挿入する受部と、
該受部に挿入されたコネクタに向けて進退可能に設けら
れ、該コネクタの端子に対する検査プローブを有する検
査器本体とから成り、該検査プローブが、筒体にコイル
バネを介して摺動可能に収容された前方プローブを有す
るコネクタ端子検査具において、前記コイルバネが、コ
ネクタハウジングに対する前記端子の接触抵抗より充分
大きいバネ力を有するコネクタ端子検査具を基本とす
る。また、前記前方プローブの先端が、前記コネクタの
端子に接触導通する端子受部を有する構造や、前記端子
受部が、オス型端子に対する係合凹部や、メス型端子に
対する係合凸部を有する構造も有効である。
In order to achieve the above object, the present invention provides a receiving portion for inserting a connector to be inspected,
The tester main body is provided so as to be capable of moving forward and backward toward the connector inserted in the receiving portion and has a test probe for the terminal of the connector, and the test probe is slidably accommodated in the cylindrical body via a coil spring. In the connector terminal inspection tool having the above-mentioned front probe, the coil terminal spring is basically a connector terminal inspection tool having a spring force sufficiently larger than the contact resistance of the terminal with respect to the connector housing. Further, the tip of the front probe has a structure having a terminal receiving portion that is in contact with the terminal of the connector for conduction, and the terminal receiving portion has an engaging concave portion for a male terminal and an engaging convex portion for a female terminal. The structure is also effective.

【0013】[0013]

【作用】請求項1によれば、端子がコネクタハウジング
内に留まろうとする抵抗力よりコイルバネが端子に及ぼ
す弾性力の方が強いために、検査プローブが前進するに
つれて端子がコイルバネの弾性力で後退する。請求項2
によれば、端子受部が端子に接触して当接すると共に、
端子受部と端子とが導通する。
According to the present invention, since the elastic force exerted on the terminal by the coil spring is stronger than the resistance force by which the terminal tries to stay in the connector housing, the terminal receives the elastic force of the coil spring as the inspection probe advances. fall back. Claim 2
According to the above, the terminal receiving portion comes into contact with and abuts the terminal,
The terminal receiving portion and the terminal are electrically connected.

【0014】請求項3によれば、端子受部がオス型端子
用とメス型端子用との二種類に対応する。オス型端子の
先端が係合凹部に接触する。あるいは、メス型端子の先
端が係合凸部に接触する。これにより、オス型又はメス
型端子が端子受部に接触し、導通する。
According to the third aspect, the terminal receiving portion corresponds to two types, one for the male type terminal and one for the female type terminal. The tip of the male terminal contacts the engaging recess. Alternatively, the tip of the female terminal contacts the engaging protrusion. As a result, the male or female terminal comes into contact with the terminal receiving portion and becomes conductive.

【0015】[0015]

【実施例】図1〜4は、本発明に係るコネクタ端子検査
具を示すものである。このコネクタ端子検査具は、検査
プローブ内の前方プローブの先端に、端子の先端に対す
る端子受部1から成る。端子受部は、オス型端子に対す
る係合凹部や、メス型端子に対する係合凸部を有する。
1 to 4 show a connector terminal inspection tool according to the present invention. This connector terminal inspection tool comprises a terminal receiving portion 1 for the tip of the terminal at the tip of the front probe in the inspection probe. The terminal receiving portion has an engaging concave portion for the male terminal and an engaging convex portion for the female terminal.

【0016】なお、コネクタ端子検査具のうち、端子受
部1以外はすべて従来例と同じなので詳細な説明を省略
し、従来例と同一符号を用いる。ところで、本実施例で
は、コイルバネのバネ圧が従来のバネ圧(200g )よ
り強く(例えば、2kg)設定されている。その理由は、
コネクタハウジングに対する端子の接触抵抗より大きく
するため、即ち、バネ圧が弱いと、「端子の不完全挿入
及び端子抜け」状態でも検査に「合格」してしまうから
である。
The connector terminal inspection tool is the same as the conventional example except for the terminal receiving portion 1, so detailed description thereof will be omitted and the same reference numerals as those of the conventional example will be used. By the way, in this embodiment, the spring pressure of the coil spring is set to be stronger (for example, 2 kg) than the conventional spring pressure (200 g). The reason is,
This is because the contact resistance of the terminal with respect to the connector housing is made larger, that is, when the spring pressure is weak, the inspection is “passed” even in the state of “incomplete insertion of the terminal and disconnection of the terminal”.

【0017】図1は、第一実施例を示すものである。こ
の端子受部1は、オス型端子に対する端子受部1であっ
て、図1(a)に示す如く、V字状の溝(係合凹部)1
1である。この溝11は、四角柱(縦u、横v、高さ
w)2から、底面を直角二等辺三角形(各辺の長さを
v,x,x)とし、高さを四角柱2の縦(長さをu)に
等しくした三角柱(図示しない)を、四角柱2の中心面
と三角柱の中心面とを一致させて切り欠いた形状をして
おり、図1(b)に示す如く、切り欠かれた部分は中心
面に関して左右対称である。そして、端子の先端と切り
欠かれた切欠面3とを当接させる。
FIG. 1 shows a first embodiment. The terminal receiving portion 1 is a terminal receiving portion 1 for a male terminal, and has a V-shaped groove (engagement recess) 1 as shown in FIG.
It is 1. The groove 11 has a rectangular prism (vertical u, horizontal v, height w) 2 and a base having an isosceles right triangle (length of each side is v, x, x), and the height of the rectangular prism 2 is vertical. A triangular prism (not shown) having a length equal to (u) is notched so that the central surface of the rectangular prism 2 and the central surface of the triangular prism match each other, and as shown in FIG. The cutout portion is symmetrical with respect to the center plane. Then, the tip of the terminal and the notched surface 3 are brought into contact with each other.

【0018】切り欠いた切欠面3は、図1(b),
(c)に示す如く、二つの平面3′,3″が交線をもつ
ような形状をしている。そして、切欠面3の上平面3′
と下平面3″とが端子の先端の外周に接触する。なお、
切欠面3が端子の先端に当接すれば、四角柱2から切り
欠く三角柱の大きさは大小を問わない。
The notched surface 3 is shown in FIG.
As shown in (c), the two flat surfaces 3 ', 3 "are shaped so as to intersect with each other.
And the lower flat surface 3 ″ come into contact with the outer circumference of the tip of the terminal.
The size of the triangular prism cut out from the quadrangular prism 2 can be any size as long as the notch surface 3 contacts the tip of the terminal.

【0019】図2は、第二実施例を示すものである。こ
の端子受部4は、オス型端子に対する端子受部4であっ
て、図2(a)に示す如く、円錐状の溝(係合凹部)1
2である。この溝12は、円筒体(直径r、高さh)5
から、底面を円(円筒の直径と同じ直径r)とし、高さ
をh′(h′<h)とした中心角90°の円錐(図示し
ない)を、円筒体5の中心線と円錐の中心線とを一致さ
せて切り欠いた形状をしている。
FIG. 2 shows a second embodiment. The terminal receiving portion 4 is a terminal receiving portion 4 for a male terminal, and as shown in FIG. 2A, a conical groove (engaging recess) 1 is formed.
It is 2. This groove 12 is a cylindrical body (diameter r, height h) 5
Therefore, a cone (not shown) whose center angle is 90 ° and whose bottom surface is a circle (diameter r which is the same as the diameter of the cylinder) and whose height is h ′ (h ′ <h) is It has a notched shape that matches the center line.

【0020】図2(b),(c)に示す如く、切り欠か
れた部分は中心線に対して対称である。そして、端子の
先端に切り欠かれた切欠面6を当接させる。なお、切欠
面6が端子の先端に当接すれば、円筒体5から切り欠く
円錐の大きさは大小を問わない。
As shown in FIGS. 2B and 2C, the cutout portion is symmetrical with respect to the center line. Then, the notched surface 6 that is notched is brought into contact with the tip of the terminal. If the notch surface 6 contacts the tip of the terminal, the size of the cone cut out from the cylindrical body 5 may be any size.

【0021】図3は、第三実施例を示すものである。こ
の端子受部7は、メス型端子に対する端子受部7であっ
て、図3(a)に示す如く、係合突部(係合凸部)9を
有している。この係合突部9は、平板8の中心にメス型
端子に対して、垂直に突設されて成り、図3(b),
(c)に示す如く、平板8の中心線と係合突部9の中心
線とは一致している。そして、係合突部9の外部とメス
型端子の内部とを遊挿または嵌合させて成る。
FIG. 3 shows a third embodiment. The terminal receiving portion 7 is a terminal receiving portion 7 for a female terminal, and has an engaging protrusion (engaging protrusion) 9 as shown in FIG. The engaging projection 9 is formed at the center of the flat plate 8 so as to project perpendicularly to the female terminal, as shown in FIG.
As shown in (c), the center line of the flat plate 8 and the center line of the engaging projection 9 are coincident with each other. The outside of the engagement protrusion 9 and the inside of the female terminal are loosely inserted or fitted.

【0022】なお、係合突部9がメス型端子に遊挿し、
メス型端子の先端が平板8に当接すれば、係合突部9の
大きさは大小を問わない。また、平板8の代わりに円板
であってもよいし、その他の形状でもよい。そして、係
合突部9がメス型端子に遊挿する大きさであるならば、
平板8上のどこにあってもよい。
The engagement projection 9 is loosely inserted in the female terminal,
As long as the tip of the female terminal comes into contact with the flat plate 8, the size of the engaging projection 9 does not matter. Further, instead of the flat plate 8, a circular plate may be used, or another shape may be used. If the engaging projection 9 has a size that allows loose insertion into the female terminal,
It may be anywhere on the flat plate 8.

【0023】次に、端子に対する端子受部の作動につい
て説明する。なお、実施例1,2及び3にすべて当ては
まるので、実施例1についてだけ記述する。図5に示す
如く、コネクタ端子検査具Aの受部22にコネクタBを
挿着させ、操作部23のレバー28によって、検査器本
体24の嵌合凹部25内で垂直に突設された検査プロー
ブCを、図4(a)に示す如く、コネクタBに向けて前
進させる。
Next, the operation of the terminal receiving portion for the terminal will be described. It should be noted that only the first embodiment will be described because it applies to all the first, second and third embodiments. As shown in FIG. 5, the connector B is inserted into the receiving portion 22 of the connector terminal inspecting tool A, and the lever 28 of the operating portion 23 vertically protrudes in the fitting recess 25 of the inspector body 24. C is advanced toward the connector B as shown in FIG.

【0024】検査プローブC内のコイルバネ37(図
6)のバネ圧が従来より強い(例えば、2Kg)ので、端
子26がコネクタハウジング26′に対して不完全挿入
(コネクタB内の係止ランス10に端子26が係合して
いない)のとき、図4(b)に示す如く、検査プローブ
Cが端子26の先端に接触し、端子26がコネクタBの
端子収容室内に留まろうとする力(係止状態を保とうと
する力)より検査プローブCが端子26を押す力の方が
強いために、検査プローブCが端子26をコネクタハウ
ジング26′に対して端子の挿入方向とは反対方向に後
退させる。
Since the spring pressure of the coil spring 37 (FIG. 6) in the inspection probe C is stronger than before (for example, 2 kg), the terminal 26 is imperfectly inserted into the connector housing 26 '(the locking lance 10 in the connector B). 4 (b), the inspection probe C contacts the tip of the terminal 26 and the terminal 26 tries to stay in the terminal accommodating chamber of the connector B ( Since the force of the inspection probe C pushing the terminal 26 is stronger than the force of keeping the locked state), the inspection probe C retracts the terminal 26 with respect to the connector housing 26 'in the direction opposite to the insertion direction of the terminal. Let

【0025】これにより、検査プローブCが端子26に
当接しないので、コネクタBから電線19と検査プロー
ブCからの電線(図示しない)とが図示しない導通検査
回路を介して繋がらない。即ち、コネクタ端子検査具A
によって「不合格」と判定される。
As a result, the inspection probe C does not come into contact with the terminal 26, so that the electric wire 19 from the connector B and the electric wire (not shown) from the inspection probe C are not connected via the continuity inspection circuit not shown. That is, the connector terminal inspection tool A
Is judged as “fail”.

【0026】このように、コネクタ端子検査具Aによっ
て、コネクタBに対する端子26の挿入状態と共に端子
26の導通状態を検出することができる。あるいは、端
子26が検査プローブCによって後退させられた時に
は、コネクタ端子検査具Aの他に、検査員(作業者)と
図示しない導通検査判定器(YCチェッカー)とでもコ
ネクタBに対する端子26の挿入状態と導通状態とを検
出でき、二重チェックが可能である。
As described above, the connector terminal inspection tool A can detect the insertion state of the terminal 26 into the connector B and the conduction state of the terminal 26. Alternatively, when the terminal 26 is retracted by the inspection probe C, in addition to the connector terminal inspecting tool A, an inspector (worker) and a continuity inspection deciding device (YC checker) not shown insert the terminal 26 into the connector B. The state and the conduction state can be detected, and double check is possible.

【0027】また、コネクタ19が端子抜けを有してい
る場合には、検査プローブCが端子19の先端に接触す
ることがないので、コネクタBからの電線19と検査プ
ローブCからの電線19とが図示しない導通検査回路を
介して繋がらない。即ち、コネクタ端子検査具Aによっ
て「不合格」と判定される。従って、コネクタ端子検査
具Aを使用した場合に、「不合格」の判定は端子19の
「不完全挿入」あるいは「端子抜け」を意味する。
When the connector 19 has a missing terminal, the inspection probe C does not come into contact with the tip of the terminal 19, so that the electric wire 19 from the connector B and the electric wire 19 from the inspection probe C are connected. Are not connected via a continuity check circuit (not shown). That is, the connector terminal inspecting tool A determines "fail". Therefore, when the connector terminal inspecting tool A is used, the determination of "fail" means "imperfect insertion" or "terminal missing" of the terminal 19.

【0028】[0028]

【発明の効果】以上の如くに、本発明によれば、端子が
コネクタ内で不完全挿入状態のとき、端子受部が前進す
るにつれて端子がコイルバネの弾性力で後退し、端子と
端子受部とが導通せず、また、端子がコネクタ内で端子
抜けを起こしているとき、端子と端子受部とが接触せ
ず、導通もしないから、コネクタに対する端子の挿入状
態及び導通状態を同時にチェックできる。更に、端子が
コネクタ内で不完全挿入状態のときには、端子受部によ
り端子が後退するから作業者の目視によっても端子の挿
入状態及び導通状態をチェックできる。
As described above, according to the present invention, when the terminal is incompletely inserted in the connector, the terminal is retracted by the elastic force of the coil spring as the terminal receiving section advances, and the terminal and the terminal receiving section are moved. Does not conduct, and when the terminal is missing in the connector, the terminal does not contact the terminal receiving part and does not conduct, so the insertion state and conduction state of the terminal to the connector can be checked at the same time. . Further, when the terminal is incompletely inserted in the connector, the terminal is retracted by the terminal receiving portion, so that the operator can visually check the inserted state and the conductive state of the terminal.

【0029】更に、端子受部の、メス型端子に対する係
合凹部、あるいはメス型端子に対する係合凸部が、各端
子の先端に接触するから、各端子が端子受部から容易に
解離することがなく、これにより、端子の先端と端子受
部との接触状態に対する信頼度が増し、検査精度が向上
する。そして、端子受部を交換すれば、オス型及びメス
型端子に対応することが可能であり、また、検査器本体
の検査プローブの位置を移動すれば、多種類のコネクタ
に対応することが可能であるから、設備コストを削減す
ることができる。
Furthermore, since the engaging concave portion of the terminal receiving portion with respect to the female terminal or the engaging convex portion with respect to the female terminal contacts the tip of each terminal, each terminal can be easily disengaged from the terminal receiving portion. Therefore, the reliability of the contact state between the tip of the terminal and the terminal receiving portion is increased, and the inspection accuracy is improved. And by exchanging the terminal receiving part, it is possible to correspond to male and female terminals, and by moving the position of the inspection probe of the inspector body, it is possible to correspond to various types of connectors. Therefore, the equipment cost can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係るコネクタ端子検査具の端子受部の
第一実施例を示し、(a)は斜視図であり、(b)は側
面図であり、(c)はX方向の要部正面図である。
FIG. 1 shows a first embodiment of a terminal receiving portion of a connector terminal inspection tool according to the present invention, (a) is a perspective view, (b) is a side view, and (c) is a view in the X direction. FIG.

【図2】同じく端子受部の第二実施例を示し、(a)は
斜視図であり、(b)は側面図であり、(c)はY方向
の要部正面図である。
2A and 2B also show a second embodiment of the terminal receiving portion, FIG. 2A is a perspective view, FIG. 2B is a side view, and FIG. 2C is a front view of a main part in the Y direction.

【図3】同じく端子受部の第三実施例を示し、(a)は
斜視図であり、(b)は側面図であり、(c)はZ方向
の要部正面図である。
3A and 3B also show a third embodiment of the terminal receiving portion, FIG. 3A is a perspective view, FIG. 3B is a side view, and FIG. 3C is a front view of a main part in the Z direction.

【図4】同じく第一実施例で、(a)は端子と端子受部
との接触状態を示す縦断面図であり、(b)は端子と端
子受部との接触後の状態を示す縦断面図である。
FIG. 4 is a vertical sectional view showing a contact state between the terminal and the terminal receiving portion, and FIG. 4B is a vertical cross-sectional view showing a state after the contact between the terminal and the terminal receiving portion. It is a side view.

【図5】従来のコネクタ端子検査具の斜視図である。FIG. 5 is a perspective view of a conventional connector terminal inspection tool.

【図6】同じく検査プローブの縦断面図である。FIG. 6 is a longitudinal sectional view of the inspection probe of the same.

【図7】同じく端子と検査プローブとの接触状態を示す
縦断面図である。
FIG. 7 is a vertical sectional view showing a contact state between the terminal and the inspection probe.

【符号の説明】[Explanation of symbols]

1,4,7 端子受部 9 係合凸部 11,12 係合凹部 A コネクタ端子検査具 B コネクタ C 検査プローブ 1, 4, 7 Terminal receiving part 9 Engaging convex part 11, 12 Engaging concave part A connector terminal inspection tool B connector C inspection probe

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 検査すべきコネクタを挿入する受部と、
該受部に挿入されたコネクタに向けて進退可能に設けら
れ、該コネクタの端子に対する検査プローブを有する検
査器本体とから成り、該検査プローブが、筒体にコイル
バネを介して摺動可能に収容された前方プローブを有す
るコネクタ端子検査具において、前記コイルバネが、コ
ネクタハウジングに対する前記端子の接触抵抗より充分
大きいバネ力を有することを特徴とするコネクタ端子検
査具。
1. A receiving part for inserting a connector to be inspected,
The tester main body is provided so as to be capable of moving forward and backward toward the connector inserted in the receiving portion and has a test probe for the terminal of the connector, and the test probe is slidably accommodated in the cylindrical body via a coil spring. In the connector terminal inspection tool having the above-mentioned front probe, the coil spring has a spring force sufficiently larger than a contact resistance of the terminal to the connector housing.
【請求項2】 前記前方プローブの先端が、前記コネク
タの端子に接触導通する端子受部を有することを特徴と
する請求項1記載のコネクタ端子検査具。
2. The connector terminal inspection tool according to claim 1, wherein the front end of the front probe has a terminal receiving portion that is in contact with and electrically connected to a terminal of the connector.
【請求項3】 前記端子受部が、オス型端子に対する係
合凹部や、メス型端子に対する係合凸部を有することを
特徴とする請求項1又は2記載のコネクタ端子検査具。
3. The connector terminal inspection tool according to claim 1, wherein the terminal receiving portion has an engaging concave portion for a male terminal and an engaging convex portion for a female terminal.
JP7050770A 1995-03-10 1995-03-10 Connector terminal inspector Pending JPH08248089A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7050770A JPH08248089A (en) 1995-03-10 1995-03-10 Connector terminal inspector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7050770A JPH08248089A (en) 1995-03-10 1995-03-10 Connector terminal inspector

Publications (1)

Publication Number Publication Date
JPH08248089A true JPH08248089A (en) 1996-09-27

Family

ID=12868074

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7050770A Pending JPH08248089A (en) 1995-03-10 1995-03-10 Connector terminal inspector

Country Status (1)

Country Link
JP (1) JPH08248089A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1120661A2 (en) * 2000-01-26 2001-08-01 Yazaki Corporation Connector continuity checking device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1120661A2 (en) * 2000-01-26 2001-08-01 Yazaki Corporation Connector continuity checking device
EP1120661A3 (en) * 2000-01-26 2001-08-22 Yazaki Corporation Connector continuity checking device
US6476616B2 (en) 2000-01-26 2002-11-05 Yazaki Corporation Connector continuity checking device

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