JPH08236510A - Microwave plasma processing device and processing method - Google Patents

Microwave plasma processing device and processing method

Info

Publication number
JPH08236510A
JPH08236510A JP7324567A JP32456795A JPH08236510A JP H08236510 A JPH08236510 A JP H08236510A JP 7324567 A JP7324567 A JP 7324567A JP 32456795 A JP32456795 A JP 32456795A JP H08236510 A JPH08236510 A JP H08236510A
Authority
JP
Japan
Prior art keywords
magnetic field
sample
microwave
mounting surface
vacuum container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7324567A
Other languages
Japanese (ja)
Other versions
JP2714547B2 (en
Inventor
Masaharu Saikai
正治 西海
Takashi Fujii
敬 藤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7324567A priority Critical patent/JP2714547B2/en
Publication of JPH08236510A publication Critical patent/JPH08236510A/en
Application granted granted Critical
Publication of JP2714547B2 publication Critical patent/JP2714547B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE: To realize uniform plasma treatments by applying a magnetic field in the vertical direction by using an electric field caused by microwaves and an air-core coil to generate a high density plasma, and controlling the direction of magnetic line of force caused by a magnetic field generation means installed near a sample so as to become almost parallel on the sample. CONSTITUTION: In the case where the dimension of an inside diameter of an air-core coil 6 which is a magnetic field generation means, is large enough compared with the diameter of a sample 1, the sample 1 is laid out at a spot parallel to a magnetic line of force generated with the air-core coil 6. The ions contained in the plasma of a processing gas in a vacuum chamber 3 which is generated by a synergism between the electric field produced by microwaves and the magnetic field produced by the coil 6, is introduced in a spiral motion to the sample 1 in such a fashion that the ions may be coiled around the magnetic field substantially vertical and parallel to the sample 1 or more specifically, around the magnetic field whose flux density is substantially uniform so that they may be reacted with the sample 1 and processed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明はマイクロ波を用いて
生成したプラズマにより試料を処理する、マイクロ波プ
ラズマ処理装置および処理方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microwave plasma processing apparatus and processing method for processing a sample with plasma generated using microwaves.

【0002】[0002]

【従来の技術】従来の装置は、特公昭53−34461
号に記載のように磁界発生手段による磁界の端部等に試
料が配置されており、図2に示すように、破線で示す磁
力線が試料の中央部と周辺部で入射角度が異なってい
た。
2. Description of the Related Art A conventional apparatus is disclosed in Japanese Examined Patent Publication Sho 53-34461.
The sample is arranged at the end of the magnetic field by the magnetic field generating means as described in No. 6, and the incident angle of the magnetic force line indicated by the broken line differs between the central part and the peripheral part of the sample as shown in FIG.

【0003】[0003]

【発明が解決しようとする課題】上記従来技術は、被加
工物である試料を発散磁界中に配置し、試料表面に入射
する磁力線の入射角度や磁力線密度の粗密については考
慮がなされておらず、次の問題があった。
In the above prior art, the sample to be processed is arranged in a divergent magnetic field, and the incident angle of the magnetic force lines incident on the sample surface and the density of the magnetic force line density are not taken into consideration. , Had the following problems.

【0004】プラズマ中のイオンは磁力線に巻きつくよ
うに螺旋運動し、試料に作用する電位が磁場に対して小
さい場合に、磁力線によって強制された角度で試料に入
射する。このことは、磁界が発散磁界を形成する場合、
ウェハ中心部と周辺部ではイオンの入射角度が異なるこ
とになり、加工特性に違いが生ずることになる。
Ions in the plasma spiral so as to be wrapped around the magnetic field lines, and when the potential acting on the sample is small with respect to the magnetic field, they enter the sample at an angle forced by the magnetic field lines. This means that if the magnetic field forms a diverging magnetic field,
The incident angle of ions is different between the central part and the peripheral part of the wafer, which causes a difference in processing characteristics.

【0005】本発明の目的は、イオンが主体となって反
応が生じるプラズマ処理において、加工特性の均質化を
図ることのできるマイクロ波プラズマ処理装置および処
理方法を提供することにある。
An object of the present invention is to provide a microwave plasma processing apparatus and a processing method capable of homogenizing processing characteristics in plasma processing in which ions are the main constituent and a reaction occurs.

【0006】[0006]

【課題を解決するための手段】本発明の特徴は、真空容
器と、該真空容器内設けられ試料を保持する試料載置面
を有する試料台と、該真空容器内を減圧排気する排気手
段と、前記真空容器内に処理ガスを供給する処理ガス供
給手段と、マイクロ波発生手段と、該マイクロ波発生手
段で発生したマイクロ波を前記真空容器内に導入するマ
イクロ波導入手段とを備えたマイクロ波プラズマ処理装
置において、前記マイクロ波の導入方向に沿って前記真
空容器の外側に配置された空心コイルと前記試料載置面
の近傍に配置された磁界発生手段とを含み、磁力線の方
向が前記マイクロ波導入手段から前記試料載置面までの
間該試料載置面に対して垂直な垂直磁界を、該試料載置
面の全面にわたって形成する垂直磁界形成手段と、前記
マイクロ波による電界と前記垂直磁界との相乗作用によ
り前記真空容器内の処理ガスをプラズマ化してイオンを
生成し、該イオンを前記垂直磁界に沿った方向に揃えて
移動させ、前記試料載置面の全面にわたって入射させる
プラズマ発生手段、とを備えたことにある。
The features of the present invention are: a vacuum container, a sample stage provided in the vacuum container and having a sample mounting surface for holding a sample, and an evacuation means for evacuating the inside of the vacuum container under reduced pressure. A microwave provided with a processing gas supply means for supplying a processing gas into the vacuum container, a microwave generation means, and a microwave introduction means for introducing the microwave generated by the microwave generation means into the vacuum container. In a microwave plasma processing apparatus, an air-core coil arranged outside the vacuum container along a direction of introduction of the microwave and a magnetic field generating means arranged in the vicinity of the sample mounting surface, and the direction of magnetic field lines is A vertical magnetic field forming means for forming a vertical magnetic field perpendicular to the sample mounting surface from the microwave introducing means to the sample mounting surface over the entire surface of the sample mounting surface; Field and the vertical magnetic field synergize the processing gas in the vacuum container to generate ions, and the ions are moved in the direction along the vertical magnetic field so as to move over the entire surface of the sample mounting surface. And a plasma generating means for making the incident.

【0007】本発明の他の特徴は、マイクロ波発生手段
で発生したマイクロ波をマイクロ波導入手段を経て真空
容器に導入し、該マイクロ波による電界と磁界形成手段
により形成される磁界との相乗作用により前記真空容器
内の処理ガスをプラズマ化し、該プラズマにより前記真
空容器内の試料台に設けられた試料載置面上の試料を処
理する方法において、前記磁界形成手段は、前記マイク
ロ波の導入方向に沿って前記真空容器の外側に配置され
た空心コイルと前記試料載置面の近傍に配置された磁界
発生手段とを含み、該空心コイルと該磁界発生手段によ
り、磁力線の方向がマイクロ波導入手段から前記試料載
置面までの間該試料載置面に対して垂直な垂直磁界を、
該試料載置面の全面にわたって形成し、前記マイクロ波
による電界と前記垂直磁界との相乗作用により前記真空
容器内の処理ガスをプラズマ化してイオンを生成し、該
イオンを、前記垂直磁界に沿った方向に揃えて移動さ
せ、前記試料載置面の全面にわたって入射させ、該イオ
ンにより前記試料の被処理面を処理することにある。
Another feature of the present invention is that the microwave generated by the microwave generating means is introduced into the vacuum container through the microwave introducing means, and the electric field generated by the microwave and the magnetic field formed by the magnetic field forming means are synergistic. In the method of converting the processing gas in the vacuum container into plasma by the action, and processing the sample on the sample mounting surface provided on the sample table in the vacuum container by the plasma, the magnetic field forming means includes An air-core coil arranged outside the vacuum container along the introduction direction and a magnetic field generating means arranged in the vicinity of the sample mounting surface, the direction of the magnetic force lines being micro by the air-core coil and the magnetic field generating means. A vertical magnetic field perpendicular to the sample mounting surface from the wave introducing means to the sample mounting surface,
It is formed over the entire surface of the sample mounting surface, and the processing gas in the vacuum container is plasmatized by the synergistic action of the electric field by the microwave and the vertical magnetic field to generate ions, which are generated along the vertical magnetic field. In this case, the surface to be processed of the sample is treated with the ions by causing the ions to move over the entire surface of the sample mounting surface while being aligned in the same direction.

【0008】本発明によれば、マイクロ波による電界に
空心コイルにより、垂直方向の磁界を作用させて高密度
なガスプラズマを発生させ、試料近傍に設置された磁界
発生手段により、磁力線の向きが試料上で略平行になる
ように制御する。これにより、磁力線の方向がマイクロ
波導入手段から前記試料載置面までの間該試料載置面に
対して垂直な垂直磁界を、該試料載置面の全面にわたっ
て形成することが出来る。 磁力線を試料に対して略垂
直でかつ平行な状態にすることにより、プラズマ中で解
離されたイオンは磁力線に沿って試料に入射する。試料
を磁界の略均一部に配置することにより、磁力線が試料
に対して略垂直となり、この略垂直な磁力線に沿ってイ
オンが試料に入射するので、均一な加工が可能となる。
According to the present invention, the magnetic field in the vertical direction is applied to the electric field generated by the microwave by the air-core coil to generate the high density gas plasma, and the magnetic field generating means installed near the sample changes the direction of the magnetic force lines. The sample is controlled so as to be substantially parallel to it. Thereby, a vertical magnetic field in which the direction of the line of magnetic force is perpendicular to the sample mounting surface from the microwave introducing means to the sample mounting surface can be formed over the entire surface of the sample mounting surface. By making the lines of magnetic force substantially vertical and parallel to the sample, the ions dissociated in the plasma enter the sample along the lines of magnetic force. By arranging the sample in the substantially uniform portion of the magnetic field, the magnetic force lines are substantially perpendicular to the sample, and the ions are incident on the sample along the substantially perpendicular magnetic force lines, which enables uniform processing.

【0009】[0009]

【発明の実施の形態】以下、本発明の一実施例を図1に
より説明する。試料1は試料台2の上の試料載置面に載
置され、試料台2は真空室(真空容器)3に設置され
る。真空室3の上部には、マイクロ波を透過する絶縁物
で成形されたベルジャー4が取り付けられる。ベルジャ
ー4の外周には、円形導波管5が設けられ、その外側に
磁場を発生する磁界発生手段である空芯コイル6が配置
される。7は図示しないマイクロ波発生源からのマイク
ロ波を導入するマイクロ波導入手段としてのマイクロ波
導入口である。8は図示しない処理ガス供給源に接続さ
れ真空室3内に処理ガスを供給するガス供給口である。
9は真空室3内を所定圧に減圧排気するための図示しな
い排気装置につながる真空排気口である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to FIG. The sample 1 is mounted on the sample mounting surface on the sample table 2, and the sample table 2 is installed in the vacuum chamber (vacuum container) 3. A bell jar 4 formed of an insulating material that transmits microwaves is attached to the upper portion of the vacuum chamber 3. A circular waveguide 5 is provided on the outer periphery of the bell jar 4, and an air-core coil 6 which is a magnetic field generating means for generating a magnetic field is arranged outside the circular waveguide 5. Reference numeral 7 denotes a microwave introduction port as a microwave introduction means for introducing a microwave from a microwave generation source (not shown). A gas supply port 8 is connected to a processing gas supply source (not shown) and supplies the processing gas into the vacuum chamber 3.
Reference numeral 9 denotes a vacuum exhaust port connected to an exhaust device (not shown) for reducing the pressure inside the vacuum chamber 3 to a predetermined pressure.

【0010】上記構成の装置により、磁界発生手段であ
る空芯コイル6の内径寸法が試料の直径に比べて充分な
大きさを備えている場合は、空芯コイル6により発生す
る磁力線の平行な場所に試料を配置することによって、
マイクロ波による電界と空芯コイル6による磁界との相
乗作用によって発生した真空室3内の処理ガスのプラズ
マの中のイオンが、試料に対してほぼ垂直でかつ平行な
磁界、すなわち、磁束密度が略均一な磁界に巻きつくよ
うに螺旋運動して、試料に導かれ、試料と反応して処理
が行なわれる。
When the inner diameter of the air-core coil 6 which is the magnetic field generating means is sufficiently larger than the diameter of the sample by the apparatus having the above-mentioned structure, the lines of magnetic force generated by the air-core coil 6 are parallel to each other. By placing the sample in place,
Ions in the plasma of the processing gas in the vacuum chamber 3 generated by the synergistic action of the electric field generated by the microwave and the magnetic field generated by the air-core coil 6 have a magnetic field substantially perpendicular and parallel to the sample, that is, a magnetic flux density of It is spirally wound around a substantially uniform magnetic field, is guided to the sample, and reacts with the sample to be processed.

【0011】以上、本一実施例によれば、空芯コイル6
によって発生した磁界中で磁力線の方向が揃った場所
に、試料1を配置することにより、マイクロ波による電
界と空芯コイル6による磁界との相乗作用で発生するガ
スプラズマ中のイオンを試料1に垂直に導くので、イオ
ンによる均一な加工ができる効果がある。
As described above, according to the present embodiment, the air-core coil 6
By arranging the sample 1 in a place where the directions of magnetic force lines are aligned in the magnetic field generated by, the ions in the gas plasma generated by the synergistic action of the electric field by the microwave and the magnetic field by the air-core coil 6 Since it is guided vertically, there is an effect that uniform processing can be performed with ions.

【0012】なお、本一実施例では、空芯コイル6の内
径寸法が大きい場合について述べたが、空芯コイル6の
内径が試料1の直径に近いかまたは前記一実施例の空芯
コイル6より小さい場合は、試料近傍に別の磁界発生手
段を配置し、磁力線の向きが試料1上で略平行になるよ
うに制御するか、非透磁材料による絞り効果を利用して
磁力線の向きを試料上で略平行にすることにより、同様
な効果を得ることができる。
In this embodiment, the case where the inner diameter of the air-core coil 6 is large has been described, but the inner diameter of the air-core coil 6 is close to the diameter of the sample 1 or the air-core coil 6 of the above-mentioned embodiment. If it is smaller, another magnetic field generating means is arranged near the sample and the direction of the magnetic force lines is controlled to be substantially parallel on the sample 1, or the direction of the magnetic force lines is changed by utilizing the diaphragm effect of the non-magnetic material. Similar effects can be obtained by making them substantially parallel to each other on the sample.

【0013】[0013]

【発明の効果】本発明によれば、マイクロ波による電界
と磁界発生手段による磁界との相乗作用によってプラズ
マを発生し、試料をプラズマ処理する装置において、試
料を磁界の略均一部に配置することにより、磁束密度が
ほぼ均一な部分の略垂直な磁界に導かれて、プラズマ中
のイオンが試料に入射して試料と反応するので、加工特
性の均質化を図ることができるという効果がある。
According to the present invention, a sample is plasma-treated by a synergistic effect of an electric field generated by a microwave and a magnetic field generated by a magnetic field generating means, and the sample is arranged in a substantially uniform magnetic field. As a result, the magnetic field is guided to a substantially vertical magnetic field in a portion where the magnetic flux density is substantially uniform, and the ions in the plasma enter the sample and react with the sample, so that the processing characteristics can be homogenized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示すマイクロ波プラズマ処
理装置の縦断面図である。
FIG. 1 is a vertical sectional view of a microwave plasma processing apparatus showing an embodiment of the present invention.

【図2】従来のマイクロ波プラズマ処理装置を示す縦断
面図である。
FIG. 2 is a vertical sectional view showing a conventional microwave plasma processing apparatus.

【符号の説明】[Explanation of symbols]

1…試料、2…試料台、3…真空室、4…ベルジャー、
5…円形導波管、6…空芯コイル、7…マイクロ波導入
口、8…ガス供給口、9…真空排気口
1 ... sample, 2 ... sample stage, 3 ... vacuum chamber, 4 ... bell jar,
5 ... Circular waveguide, 6 ... Air core coil, 7 ... Microwave inlet, 8 ... Gas supply port, 9 ... Vacuum exhaust port

フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 // C23F 4/00 C23F 4/00 C G D Continuation of front page (51) Int.Cl. 6 Identification number Office reference number FI technical display location // C23F 4/00 C23F 4/00 C G D

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】真空容器と、該真空容器内設けられ試料を
保持する試料載置面を有する試料台と、該真空容器内を
減圧排気する排気手段と、前記真空容器内に処理ガスを
供給する処理ガス供給手段と、マイクロ波発生手段と、
該マイクロ波発生手段で発生したマイクロ波を前記真空
容器内に導入するマイクロ波導入手段とを備えたマイク
ロ波プラズマ処理装置において、 前記マイクロ波の導入方向に沿って前記真空容器の外側
に配置された空心コイルと前記試料載置面の近傍に配置
された磁界発生手段とを含み、磁力線の方向が前記マイ
クロ波導入手段から前記試料載置面までの間該試料載置
面に対して垂直な垂直磁界を、該試料載置面の全面にわ
たって形成する垂直磁界形成手段と、 前記マイクロ波による電界と前記垂直磁界との相乗作用
により前記真空容器内の処理ガスをプラズマ化してイオ
ンを生成し、該イオンを前記垂直磁界に沿った方向に揃
えて移動させ、前記試料載置面の全面にわたって入射さ
せるプラズマ発生手段、 とを備えたことを特徴とするマイクロ波プラズマ処理装
置。
1. A vacuum container, a sample stage provided in the vacuum container and having a sample mounting surface for holding a sample, exhaust means for decompressing and exhausting the inside of the vacuum container, and supplying a processing gas into the vacuum container. Processing gas supply means, microwave generation means,
A microwave plasma processing apparatus comprising: a microwave introducing unit that introduces a microwave generated by the microwave generating unit into the vacuum container, wherein the microwave plasma processing device is arranged outside the vacuum container along a direction in which the microwave is introduced. An air-core coil and magnetic field generating means arranged in the vicinity of the sample mounting surface, and the direction of the lines of magnetic force is perpendicular to the sample mounting surface from the microwave introducing means to the sample mounting surface. A vertical magnetic field, a vertical magnetic field forming means for forming the entire surface of the sample mounting surface, and a synergistic action of the electric field by the microwave and the vertical magnetic field to plasmaize the processing gas in the vacuum container to generate ions, Plasma generating means for causing the ions to move in a direction along the vertical magnetic field so as to be incident on the entire surface of the sample mounting surface. Black wave plasma processing apparatus.
【請求項2】マイクロ波発生手段で発生したマイクロ波
をマイクロ波導入手段を経て真空容器に導入し、該マイ
クロ波による電界と磁界形成手段により形成される磁界
との相乗作用により前記真空容器内の処理ガスをプラズ
マ化し、該プラズマにより前記真空容器内の試料台に設
けられた試料載置面上の試料を処理する方法において、
前記磁界形成手段は、前記マイクロ波の導入方向に沿
って前記真空容器の外側に配置された空心コイルと前記
試料載置面の近傍に配置された磁界発生手段とを含み、
該空心コイルと該磁界発生手段により、磁力線の方向が
前記マイクロ波導入手段から前記試料載置面までの間該
試料載置面に対して垂直な垂直磁界を、該試料載置面の
全面にわたって形成し、 前記マイクロ波による電界と前記垂直磁界との相乗作用
により前記真空容器内の処理ガスをプラズマ化してイオ
ンを生成し、 該イオンを、前記垂直磁界に沿った方向に揃えて移動さ
せ、前記試料載置面の全面にわたって入射させ、該イオ
ンにより前記試料の被処理面を処理することを特徴とす
るマイクロ波プラズマ処理方法。
2. A microwave generated by the microwave generating means is introduced into the vacuum container through the microwave introducing means, and the electric field generated by the microwave and the magnetic field formed by the magnetic field forming means synergistically act in the vacuum container. In the method of converting the processing gas into a plasma, and processing the sample on the sample mounting surface provided on the sample table in the vacuum container by the plasma,
The magnetic field forming means includes an air-core coil arranged outside the vacuum container along the introduction direction of the microwave and a magnetic field generating means arranged near the sample mounting surface,
By the air-core coil and the magnetic field generating means, a vertical magnetic field whose direction of magnetic force lines is perpendicular to the sample mounting surface from the microwave introducing means to the sample mounting surface is applied to the entire surface of the sample mounting surface. Forming a plasma of the processing gas in the vacuum container by the synergistic action of the electric field generated by the microwave and the vertical magnetic field to generate ions, and the ions are moved in a direction along the vertical magnetic field. A microwave plasma processing method, characterized in that the surface to be processed of the sample is processed by being made incident on the entire surface of the sample mounting surface.
JP7324567A 1995-12-13 1995-12-13 Microwave plasma processing apparatus and processing method Expired - Lifetime JP2714547B2 (en)

Priority Applications (1)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59202635A (en) * 1983-05-04 1984-11-16 Hitachi Ltd Plasma treating device
JPS60134423A (en) * 1983-12-23 1985-07-17 Hitachi Ltd Microwave plasma etching device
JPS60154620A (en) * 1984-01-25 1985-08-14 Hitachi Ltd Treatment of microwave plasma
JPS61267324A (en) * 1985-05-21 1986-11-26 Fuji Electric Co Ltd Dry thin film processing device
JPS63148638A (en) * 1986-12-12 1988-06-21 Oki Electric Ind Co Ltd Manufacture of semiconductor device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59202635A (en) * 1983-05-04 1984-11-16 Hitachi Ltd Plasma treating device
JPS60134423A (en) * 1983-12-23 1985-07-17 Hitachi Ltd Microwave plasma etching device
JPS60154620A (en) * 1984-01-25 1985-08-14 Hitachi Ltd Treatment of microwave plasma
JPS61267324A (en) * 1985-05-21 1986-11-26 Fuji Electric Co Ltd Dry thin film processing device
JPS63148638A (en) * 1986-12-12 1988-06-21 Oki Electric Ind Co Ltd Manufacture of semiconductor device

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