JPH08221291A - Test support system - Google Patents

Abstract

PURPOSE: To provide a test support system which can easily set the processing procedure of a test suitable for each one even if there are various tested object devices or tested items. CONSTITUTION: This system is provided with a command definition processing part 5 which displays a definition picture, and defines individually a command to be used for the test of the tested object device by the attribute and the command data sequence of the set command and the data sequence of a parameter, a command execution picture generation processing part 6 which displays a command execution picture to show the list of each defined command, and selects one or plural commands to be used for the test on the picture, and sets sequence to show the execution order of the selected command, and a test processing part 7 which manages the command function of execute form corresponding to each defined command together with the command data sequence and the parameter of each defined command, and executes every command instructed to execute successively on the basis of the set sequence by extracting the corresponding command data sequence, parameter data sequence and command function.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test support system, and more particularly, to a test support system that facilitates execution and management of tests of input / output devices of data processing devices.

Data processing devices typically include a plurality of input / output devices. In order to improve the reliability of the data processing device, it is necessary to test each of the plurality of input / output devices.

[0003]

2. Description of the Related Art When a certain input / output device is tested, a program for this test is created. The test program has a content of executing a predetermined process suitable for confirming the operation of the input / output device by using the input / output device to be tested.

For example, when the input / output device to be tested is an external storage device such as an optical disc device, a process of moving predetermined data in the optical disc device to another external storage device (which is supposed to operate correctly). A test program for executing the above is created and executed. This makes it possible to know whether the optical disk device is operating correctly.

In the prior art, it was necessary to create one test program for each target device to be tested and each test item. For example, even for the same test item, different I / O devices to be tested have different commands and interface characteristics, and therefore different test programs must be created. Even if the test target is the same I / O device, if the test items are different, the type of command used and the presence / absence of data input / output will change. There must be.

Therefore, there is a problem that the number of man-hours required for creating the program becomes large and the burden on the development personnel and cost becomes large. Further, as a result, the number of programs increases, which makes it difficult to manage the programs, and there is a problem that the memory capacity for storing the programs becomes huge. Further, there is a problem that a laborious analysis work is required to determine the test execution result for many test target devices and test items.

[0007]

SUMMARY OF THE INVENTION The present invention is intended to facilitate the execution and management of a test, and in particular, even if the device to be tested and the test items are diverse, the test processing procedure adapted to each device It is an object of the present invention to provide a test support system capable of easily setting test results, reducing the amount of test result management data, and easily grasping the results of test processing.

[0008]

SUMMARY OF THE INVENTION The present invention separately manages execution-type commands (referred to as command functions here) depending on the model of the device under test (herein referred to as command functions) and manages each command function used for the test. The contents can be easily set on the definition screen, an appropriate command set according to the device under test and test items is defined, and a list of the defined commands is displayed on the screen to set the execution order. Therefore, it is characterized by a configuration in which a command is selected, an arbitrary test processing procedure is created with a sequence of selected commands, and each defined command is converted into a command function and executed each time the sequence is executed. Also, when the test fails, the test will display a suitable error message corresponding to the error, and the test will When data is input from an image processing device, it is characterized in that the correctness of the input data is displayed so that it can be identified by a partial portion in the data string, and error analysis is simplified. Is.

FIG. 1 is a block diagram showing the principle of the present invention, in which 1 is an input / output device for test processing operation, 2 is a screen, and 3 is a screen.
Is a processing device, 4 is a test support system according to the present invention, 5
Is a command definition processing unit, 6 is a command execution screen creation processing unit, 7 is a test processing unit, 7a is an input mode analysis unit, and 7b.
Is a command execution unit, 7c is a command function library, 8
Is an error processing unit, 8a is an error message definition processing unit,
8b is an error generation processing unit, 8c is a parameter data string comparison processing unit, 8d is a parameter data string display unit, and 9 is a test target input / output device.

The command definition processing section 5 displays a command and parameter definition screen on the screen 2 at the time of command definition,
The attribute of the command, the data string of the command and its parameter, the variable part and the fixed value part are set and defined. The command attribute includes the command name, the number of bytes in the command data string, the data attribute indicating whether the command is accompanied by parameter data and, if accompanied, the data in / data out, and the parameter data string Includes number of bytes, data format, command description, etc. Also, the command data string includes the logical unit number of the test target input / output device, a flag, and the like.

The command execution screen creation processing unit 6 displays a command execution screen showing a list of commands defined by the command definition processing unit 5 on the screen 2, and manages the commands selected on the command list in the order of selection. However, in the test process in the automatic test mode, which will be described later, the commands in this selection order are sequentially executed. If there is a parameter (variable part) that has not been set when the command is selected, set it here.
For example, the device to be tested is specified by setting a parameter at this stage.

The command names of the defined commands are collected in a table and the input mode analysis unit 7a of the test processing unit 7 is used.
Is used for the process of detecting the command name from the input character string. A command function corresponding to each defined command is composed of a command data string and a parameter data string set by the command definition processing unit 5, and is stored in the command function library 7c.

The test processing unit 7 has a command unit test mode in which a test process is performed for each command input, a combination test mode in which a plurality of commands are combined and input using a command map, and a simple language test mode in which a simple language is used for input. The operation can be performed in a plurality of types of test modes such as an automatic test mode that automatically executes the sequence of commands selected on the command execution screen. The input mode analysis unit 7a inputs and identifies a command according to the set command input mode, extracts the corresponding command function from the command function library 7c, and causes the command execution unit 7b to execute it.

The error processing unit 8 has a function of displaying a message that clearly shows the error content when an error occurs during the test processing by the test processing unit 7, and displays the definition screen in advance in the error message definition processing unit 8a. Error message to be displayed corresponding to the error status is defined, and when an error occurs, the error occurrence processing unit 8b
The error message corresponding to the error status is fetched and displayed.

The error processing unit 8 also has a function of monitoring whether the data input from the test target input / output device 9 is correct or not, and the parameter data string comparison processing unit 8c inputs data from the test target input / output device 9. The data string is compared with the expected value data string set in advance in the command parameter, and if there is a mismatch, the parameter data string display section 8d displays the mismatch in the data string.

[0016]

According to the present invention, the processing of each command to be executed in the test is described based on the predefined command, and the execution is stored in advance in the command function library 7c as a command function. Therefore, the test process to be executed can be described separately from the model of the specific test target input / output device 9. The I / O device 9 to be tested is specified by setting the logical unit number of the specific I / O device in the command data string. Change the logical unit number setting on the command data string definition screen. By doing so, it is possible to easily change to a test process for another input / output device.

Therefore, when the same test process is executed for input / output devices of different models, it can be dealt with by exchanging the logical machine number and the contents of the command function library.
Further, for the same input / output device, if commands and parameters are first defined for each command type, it is possible to execute arbitrary test item processing simply by specifying command names in combination.

Further, since an appropriate error message can be defined in advance according to the error type, even if an error occurs during the test processing, the content can be easily known from the error message. Furthermore, the expected value of the data string input from the device under test is set in the command parameter, and the input data string and the parameter data string are compared when the command is executed, and if there is a match or mismatch, the mismatch part is detected and displayed. Therefore, detailed diagnosis is possible.

In this way, the operator can easily select the processing to be executed as a test or necessary for the test and perform the test processing. As described above, it is possible to execute the test by substantially omitting the creation of the test program, and it is possible to eliminate the need for capacity for program management and storage.

[0020]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS In FIG. 1, the processing device 3 comprises a CPU (central processing unit) and a (main) memory in terms of hardware configuration. The processing device 3 is connected to a display device for operator operation, a keyboard, an input / output device 1 including a mouse, and a plurality of test target input / output devices 9. The display device of the input / output device 1 has a screen 2 for displaying a test menu, for example. The test target input / output device 9 usually comprises an external (auxiliary) storage device, and is, for example, an optical disk device, a magnetic disk device or the like.

The test support system 4 is provided in the processing device 3 and tests the test target input / output device 9. The test support system 4 includes a CPU and a test support program existing in the main memory, and includes a command definition processing section 5, a command execution screen creation processing section 6, a test processing section 7,
It is composed of the error processing unit 8. The test processing unit 7 further includes an input mode analysis unit 7a, a command execution unit 7b, and a command function library 7c, and an error processing unit 8 includes an error message definition processing unit 8a, an error occurrence processing unit 8b, a parameter data string comparison processing unit 8c, A parameter data string display unit 8d is provided.

The functions of the test support system 4 are roughly divided into a command definition function, an execution command designation function, a test execution function, an error processing function, and a help function. The command definition function is a function realized by the command definition processing unit 5. The commands and parameters used in the test processing are the attributes of the test target input / output device 9 such as the logical machine number and data format, and the contents of the test items. It is a function that is defined by adapting to. Since it is possible to know in advance the processes necessary for the test, a command (name) is assigned to each process on the definition screen, and its format and parameters are predetermined. The defined format of each command cannot be directly decoded by the device under test, and is converted into a command function of an execution format suitable for the device under test and executed. The command function can be automatically generated. Each command name is table-managed by the input mode analysis unit 7a, and the command function is stored for each command in the command function library 7c.

The execution command designation function displays a command menu screen, a command execution screen, etc., which will be described later,
It is a function of designating a single command to be executed or a combination of a plurality of commands and a sequence, and is realized by the command execution screen creation processing unit 6 and the input mode analysis unit 7a.

The test execution function is realized by the test processing unit 7. When a character string of a command name designated for execution is input, the input mode analysis unit 7a identifies the command, and the command execution unit 7b Command function library 7
The corresponding command function is fetched from c and executed via the driver for the test target I / O device or the like.

The error processing function is realized by the error processing unit 8, and when an error status is returned from the test target I / O device 9 when the command function is executed, the error status and error message are displayed on the screen 2. It is a function to display the next item and proceed to the next process.

The help function is a function for displaying a description of the command and its parameters on the screen 2 for reference before the command is designated and input to execute a certain command function. The input mode analysis unit 7a has that function.

The test support system 4 has four test modes as described above. Command unit test mode with only one command (hereinafter unit mode),
It is a command combination test mode using a plurality of commands (hereinafter, combination mode), a simple language test mode using simple language (hereinafter, simple language mode), and an automatic test mode in which a command sequence is specified on a command execution screen.

These four modes are selected by the operator's input from the input / output device 1. To this end, the test support system 4 displays on the screen 2 a selection menu for selecting one of these four modes.
The test processing in each test mode will be described below.

First, the test processing in the single mode will be described with reference to FIGS. When the single mode is selected, the input mode analysis unit 7a displays a test menu as shown in FIG. 2 on the screen 2. This test menu is prepared in advance, and the input command name and the command are displayed in correspondence with the selection designation number (test number). The input command name and the command are the command information in this case.

For example, the input command name of the number "5" is "move (p1, p2)", and the command is "MO".
VE MEDIUM ”. This command is a test source input / output device 9 of the movement source determined by the parameter p1.
To move the data to the test target input / output device 9 that is the move destination determined by the parameter p2. As can be seen from this test menu, some commands do not have parameters.

When the operator presses a predetermined key (execution key or line feed key) after inputting the number "5" on the screen where the test menu on the screen 2 is displayed, the input / output device 1 displays this number. "5" is input to the input mode analysis unit 7a as a character string designating the test content. As a result, the command "MOVE MEDIUM" is selected.

Since the command has parameters, the input mode analysis unit 7a shifts to the parameter setting mode.
Key input of parameters p1 and p2 is permitted. That is, the input mode analysis unit 7a displays the parameter setting screen shown in FIG. On this screen, when the operator inputs "1" next to the source number by key input and presses the execution key or the like, the parameter p1 is input from the input / output device 1 to the input mode analysis unit 7a and the destination number is input. Next, enter "10" and press the Enter key, etc. to enter parameter p2.
Is entered. The parameters "1" and "10" are also character strings that specify the test content.

The above is an example of inputting a character string that specifies the test contents in the number input mode, but it is also possible to input in the command input mode. For example, from the input / output device 1,
Input "move (1, 10)" by key input and press the execution key or the like. That is, the command name and parameter of the test menu may be input. As a result, the command “MOVE MEDIUM” is specified together with the parameter (1, 10) as in the case described above.

[0034] It should be noted that the input mode analysis section 7a, the cursor is positioned to the number of the test menu "5", when the character key "h (h elp)" and the execution key or the like is pressed to continue, the above-mentioned help function The help screen of the command corresponding to the number “5” is displayed on the screen 2.

The input mode analysis unit 7a analyzes the character string designating the test contents input as described above. For example, the number “5” or the character string “move” is analyzed to determine that the command “MOVE MEDIUM” is the command to be executed. Input mode analysis unit 7a
Sends the analysis result and the parameter to the command execution screen creation processing unit 6.

The command execution screen creation processing unit 6 searches the command function library 7c using the command "MOVEMEDIUM" which is the analysis result, selects the command function corresponding to the command, and uses the received parameter. To execute. That is, the processing described as the command function is executed using the received parameters.

When the command execution unit 7b or the test support system 4 returns an error status from the test target input / output device 9 by the execution of the command function, the error processing unit 8 executes the execution of the command function on the screen 2. The error status and the corresponding error message are displayed and the input / output device 1 waits for an instruction input to proceed to the next process.

For example, in the above example, the test target input / output device 9 having the device number “1” to the device number “10”.
The data is moved to the input / output device of. As a result, the test for the data transfer of the test target input / output device 9 having the device number “1” and / or “10” is executed. If any error occurs in this test, the error status is sent from the test target input / output device 9 in which the error has occurred to the command execution unit 7b, and this is displayed on the screen 2.

FIG. 4 is a test processing flow in the single mode. The operator looks at the test menu on screen 2
A character string designating the test content is input from the input / output device 1 in the number input mode or the command input mode. The input mode analysis unit 7a receives these character strings sent from the input / output device 1 (S1).

The input mode analysis unit 7a analyzes the received character string to obtain the command to be executed, and sends the analysis result together with the parameter to the command execution unit 7b (S2). The command execution unit 7b refers to the command function library 7c, selects the command function corresponding to the command to be executed, and executes it using the parameter (S3). That is, the test is executed.

The command execution unit 7b or the test support system 4 checks whether or not there is an error status from the test target input / output device 9 which is the target of the test (S4).
If there is no error status, the process returns to S1 (waiting state).

If there is an error status, the command execution section 7b or the test support system 4 displays the error status on the screen 2 and waits for any key input (S5). If there is a key input, Proceed to the next process (repeat S1 and subsequent steps).

Next, the test processing in the combination mode will be described with reference to FIGS. Input mode analysis unit 7a
When the combination mode is selected, displays the command map shown in FIG. 5 on the screen 2 (instead of the test menu) by the processing execution function described above.

The command map is prepared in advance, and numbers used for selective input, input command names, and commands are grouped and displayed in one frame. As can be seen from the comparison with FIG. 2, the command map is substantially the same in content as the test menu, but the correlation between commands is shown by the data sharing relationship in the central part. This allows
The operator can know these correlations, and can be used as a reference when combining and executing a plurality of commands.

On the screen where the command map is displayed on the screen 2, after the operator inputs the numbers "1", "3" and "5" in this order, predetermined keys (execution key or line feed key)
When you press, this specifies the test string "1:"
3: 5 ". Each character forming the character string is sent from the input / output device 1 to the input mode analysis unit 7a each time the key is input.

When a character corresponding to a command having a parameter, for example, "5" is input, the input mode analysis unit 7a shifts to the parameter setting mode each time, and FIG.
Display the parameter setting screen shown in. The parameter setting screen shown in FIG. 6A corresponds to FIG.
As in the case of FIG. 3, parameters such as “1”,
"10" is input.

In the case of the combination mode, the input mode analysis unit 7a accepts the input of the characters forming the above-mentioned character string each time and analyzes them, while the command execution unit 7a
The execution by b is performed after inputting (and after parsing) all character strings including parameters. That is, it is performed after the execution key or the like is pressed after inputting the character string. Therefore, the character string that specifies the test content is a character string that specifies one or more commands, or a character string that specifies one or more commands and their respective parameters.

The above is an example of inputting a character string for designating the test contents in the number input mode, but it is also possible to input in the command input mode as in the single mode. For example, by inputting a key from the input / output device 1, "inq: r
Enter "qs: move (1,10)" and press the enter key or the like.

Here, the test contents illustrated above will be briefly described. The command "INQUIRY" corresponding to the numbers "1" and "inq" executes a process of sucking up product information. The product information is stored in the file in advance as "INQUIRY data". By executing this command, product information about the input / output device 9 to be tested can be obtained.

The command "REQUEST SENSE" corresponding to the numbers "3" and "rqs" executes a process for sucking up error information. The error information is stored in the file as “sense data (device error information)”.
By executing this command, error information about the error that occurred up to the start of the test can be obtained.

Therefore, the test contents are obtained by first obtaining product information about the test target input / output device 9 and then obtaining error information about these, and then actually specifying the device to obtain the data. It is to move.

The command executing section 7b uses the character string "1: 3:
Based on the analysis of the input mode analysis unit 7a for "5", the corresponding command functions are executed in this order. By this, the processing in the order described above will be executed,
A series of test processes in which a plurality of commands are combined in a desired order is executed.

In this process, if an error occurs,
The error generation processing unit 8b displays the error display screen shown in FIG. 6B on the screen 2. This error display screen is
By highlighting "rqs" (indicated by diagonal lines), it is indicated that the command function corresponding to this is executed and an error has occurred. Also, the timing of error occurrence, the flow of the entire processing, the error status, and the error message are displayed as shown in the figure.

FIG. 7 is a test processing flow in the combination mode. Similar to S1 of FIG. 4, the input mode analysis unit 7a first receives the character string from the input / output device 1 (S1).
6).

The input mode analysis unit 7a analyzes the character string to obtain each command, and stores the analysis result in the memory (command execution table) (S7). Specifically, the command name is identified from the input character string, the identified command name is converted into a predetermined symbol associated with the command function, and stored from the beginning of the memory in the order specified by the character string. The memory area is, for example, 0, 1
It is said that. If there is a parameter, it is stored together with the symbol of the corresponding command function.

When there is an input by pressing the execution key or the like after the input of the character string, the input mode analysis unit 7a sets i = 0 and requests the command execution unit 7b to execute the operation (S).
8). The command execution unit 7b refers to the memory and selects the command function corresponding to the symbol stored in the i-th area from the command function library 7c and executes it (S9). If there is a parameter in the i-th area,
Use this.

The command executing section 7b uses S4 and S4 in FIG.
The same error processing as 5 is performed (S10). This allows
The display as shown in FIG. 6B is made. Next, the command execution unit 7b sets i = i + 1 (S11), and checks whether i is larger than N (S12). Here, N is all command functions to be executed, which are specified by the character string.

If i is not larger than N, S9 and subsequent steps are repeated. If i is larger than N, the process returns to S1 (standby state). Next, the test processing in the simple language mode will be described with reference to FIG.

When the simple language mode is selected, the test support system 4 executes the processing in the order shown in FIG. First, the input mode analysis unit 7a displays the test menu shown in FIG. 8B on the screen 2. In this state, when the operator inputs a number "1" on the screen 2 and then presses a predetermined key (execution key or line feed key), the "mechanical operation confirmation" test is selected.

Therefore, the input mode analysis unit 7a further
The mode selection menu shown in FIG. 8C is shown on the screen 2. The mode selection menu is a screen lower than the test menu and forms a part of the test menu. When the operator inputs the number "1" on the screen 2 in this state and then presses the execution key or the like, it means that "creation" of the mechanical operation confirmation test is selected.

Therefore, the input mode analysis unit 7a further
A creation screen (not shown) is displayed on screen 2. A character string is input to this screen in the number input mode or the command input mode shown in FIGS. When the operator presses an execution key or the like at the end of creation, the test menu is returned to.

When "mechanical operation confirmation" is selected again on the screen 2 of this test menu and "execution" is selected on the mode selection menu, the command execution screen creation processing section 6 is the currently selected (latest) "mechanical operation" screen. Execute the command function that follows the character string of "Operation check".

Upon completion of the execution, the test menu is returned to, and when "Delete" of "Mechanical operation confirmation" is selected in sequence, the command execution unit 7b deletes the currently selected "Mechanical operation confirmation" character string and displays it in the test menu. Return.

On the other hand, when the end mode is selected by the "end" key instead of the "delete", all the test command strings currently stored in the memory are saved in the file and the process is ended.

If "correction" is selected instead of "delete", the character string previously created is displayed on the creation screen. Therefore, the operator
It is possible to modify the previously created character string or command string to create a mechanical operation test with new contents.

Next, the test processing in the automatic test mode will be described with reference to FIGS. 9 to 19. FIG. 9 is a configuration diagram of the processing mechanism in the automatic test mode. In the figure, a command definition processing unit 5 includes a command attribute definition processing unit 5a for defining command attributes, a command data string definition processing unit 5b for defining command data strings, and a parameter data string definition for defining parameter data strings. The processing unit 5c is provided. Further, in the memory 10, each definition processing unit 5a, 5
Command areas 11-1, ..., 11-i, which collectively store the command attributes, command data strings, and parameter data strings defined by b and 5c for each command
, And an error message area 12 that stores each error message character string defined by the error message definition processing unit 8a, and a sequence of execution commands set in the command execution screen displayed by the command execution screen creation processing unit 6 are stored. The command execution table 13 is provided.

FIG. 10 is an overall flow of the automatic test mode, and the steps (S13 to S1) in this flow will be described below.
9 '), the general operation of the configuration shown in FIG. 9 will be described. If necessary, the command attribute definition screen of FIG. 11, the command data string definition screen of FIG. 12, the parameter data string definition screen for data-in of FIG. 13, the parameter data string definition screen for data-out of FIG. The error definition screen of 15 is referred to.

When the automatic test mode is set, first, the command attribute definition processing section 5a is activated, the command attribute definition screen shown in FIG. 11 is displayed, and the command attribute input is set (S13). The command attributes include the command name, the number of bytes of the command, and if the command involves in and out of parameter data, the data in and data out phases, the number of parameter data bytes, and the parameter data format (binary number) / Hexadecimal / AS
CII, etc.) There is a description of the command, and the command attribute that has been input and set is the memory 10 that is allocated for each command.
Are stored in a predetermined one of the plurality of command areas 11-1, ..., 11-i ,.

Next, the command data string definition processing section 5b is activated, the command data string screen shown in FIG. 12 is displayed, the command data string is set and input, and the corresponding command areas 11-1, ..., 11-i, ... (S14). The command data string definition screen of FIG. 12 is created based on the command name “TEST UNIT READY” and the number of bytes “6” set and input on the command attribute definition screen of FIG. 11. In the illustrated example, a fixed value (0) is input to the 6-byte command data string input area and the variable value portions U, F, L are specified, and the variable values U, F, L are set to the range of possible values. Parameter name "LU
"N", "Flag", and "Link" are set. The value of the variable value portion is input on the command execution screen described later. Here, the variable value U is used to specify the logical unit number of the input device under test with 3 bits,
F is used as a control flag and L is used as a bit indicating whether or not a command is continuously transmitted.

When the data-in or data-out phase is specified in the command attribute that has been input and set, the parameter data string definition processing unit 5c is activated next, and in the data-in phase, it is shown in FIG. Parameter data string definition screen for data-in is displayed, and in the data-out phase, the parameter data string definition screen for data-out shown in FIG. 14 is displayed, and the setting input of the parameter data string is performed in each. Corresponding command areas 11-1, ..., 11-
It is stored in i, ... (S15).

The example of the parameter data string definition screen for data-in of FIG. 13 is based on the command attribute definition of the command name "REQUEST SENSE" different from the example of FIG. This command is a command for sucking up detailed error information when an error occurs, and an 18-byte parameter data string is defined. The values 0 and 1 in the figure are fixed value parts of the set parameters, P1 is a variable value part, and P2 and P3 are fixed value parts, but the parameter data string expected to be input from the device under test is It shows the part to be set. After setting these parameter data strings, parameter names for P1, P2 and P3 are set.

An example of the parameter data string definition screen for data out shown in FIG. 14 is the command name "LOG SELECT."
It corresponds to the "T" command, and the fixed value part indicated by the value of 0 and 1 and the variable value part indicated by P1 are set in the 10-byte parameter data string, and thereafter the parameter name of P1 is similarly set. Is set.

Next, the error message definition processing section 8a is activated, and the error definition screen shown in FIG. 15 is displayed.
Here, for each error number, the error status SENSEK
An error message to be displayed is input corresponding to the value of EY / ADSC / ADSCQ and stored in the error message area 12 of the memory 10 (S16).

This completes the command and error message definition processing, and then the command execution screen creation processing unit 6
Is started to display a command execution screen as shown in FIG. 16, and a command sequence to be executed for test processing is set (S17).

In the command execution screen of FIG. 16, parameters (variable value part) that have not been set in the order of command definition are set on successive lines.
The number of and the command name (parameter name) are arranged.
The process of creating the screen is shown in FIG. 17, and the command name character strings 1, ... I, ... Of each command input using the command attribute definition screen of FIG. 11 and FIG.
No. 2 of the parameter of the variable value part in the command data string defined on the command character string definition screen of No. 2 and its parameter name, and the parameter data defined on the parameter data string definition screen for data out of FIG. 14 for each command. The command area 11 of FIG.
-1, ..., 11-i, ... are taken out and assembled.

On the command execution screen of FIG. 16, 1, 2,
One to three "0" s are displayed in the lines with line numbers 4, 5, and 6, and the number of "0s" indicates the number of variable value parts of the parameters that need to be set here. . First, select the line number of the required command according to the content of the test process you want to execute (press the number key corresponding to the number, and then press the S key) as many as "0" are displayed. The parameters are input and set (S17). Parameter input settings are made by calling a separate setting screen (dialog). Next, the line numbers of the required commands are designated in the order of execution (the number key corresponding to the number is pressed) and the execute (E) key is pressed. As a result, the input mode analysis unit 7
a analyzes the character string keyed in, creates command sequence information, and stores it in the command execution table 13 of the memory 10 (S18). This sequence information is an array of addresses of corresponding command areas of the command areas 11-1, ..., 11-i, ... Of the memory 10 in the order of commands to be executed.

Next, the command executing section 7b takes out the sequence information of the execution command from the command execution table 13, and from the command areas 11-1, ..., 11-i ,. Is read out and the corresponding command function is retrieved from the command function library 7c and executed (S19). After executing the last command instructed by the sequence information, the command execution screen creation processing unit 6 is called again, and the parameter setting and execution command for the next test processing (different test target input / output device, different test item) is executed. The operation of designating the sequence is repeated (S19-S17).

Further, during the command execution, the error occurrence processing section 8b performs error monitoring, and when an error status is returned, analyzes the error status, extracts the corresponding error message from the error message area 12, and displays it, or The in-data data string from the device to be tested is compared with the parameter data string of the expected value in the parameter data string comparison processing unit 8c in bit correspondence, and they match,
A mismatch is detected, and the result is displayed by the parameter data string display section 8d (S19 ').

FIG. 18 is a detailed flow of command execution and error processing, showing the detailed operation of the command execution section 7b and error processing section 8 and the data flow. When the command execution unit 7b determines the command to be executed next from the sequence information, the command data string set in the command data string definition screen of FIG.
From the parameter of the variable value part input on the command execution screen of, to the command data string i corresponding to the command i,
A command data string creation process for setting a parameter group corresponding to the command i is performed (S19'-1).

It is determined whether or not the data out phase is designated by the command attribute (S19-2). In the case of the data out phase, parameter data string creation for setting the parameter data string i of the variable value portion input on the command execution screen to the parameter data string i of the command i set on the parameter data string definition screen of FIG. Processing is performed (S19-3).

Using the command data sequence and parameter data sequence that have already been set, a command issuing process for setting a command to the interface such as a SCSI driver with the I / O device 9 under test is executed (S19-4).

When there is an error response from the SCSI driver or the like of the interface, the REQUEST SENSE command is issued to fetch the detailed error information, and the error generation processing for displaying the error message is performed (S19'-
1).

It is determined whether or not the data-in phase of the command attribute is designated (S19'-2). In the data-in phase, the parameter data string input from the interface is compared with the expected value of the parameter data string of the command i (S19'-3).

If a mismatch is detected as a result of the comparison, the mismatched parameter data string is highlighted and the parameter of the variable value portion is also displayed at another position (S19'-).
4). Next, the sequence control of the execution command will be described with reference to FIG. FIG. 19A shows a simplified command execution screen. Each line is composed of the command name, the number of parameters, and the parameter field of the defined command. The sequence of execution commands is
It is specified as "2: 3: 4: 1" using the test number (row number).

FIG. 19B shows the structure of the command area. The contents of the command are stored in the command area as follows. First, the command name (command symbol) "A" is stored at the head address i of the command area. As a result, the area following is for the command name "A", that is, the command area 11-A. Next, the number of parameters “3” is stored in the next address i + 1, and the parameters “0”, “200H”, and so on are sequentially stored in the next addresses i + 2 to i + 4.
"100H" is stored. As a result, when executing the command function with the command name "A", necessary parameters can be obtained by sequentially referring to consecutive addresses. After that, the command name “B” is stored in the next address i + 5 of the command area. As a result, the area following the above becomes the command memory 10B. Similarly, the command areas 11-A, 11-B, 11
-C, 11-D, ... Are completed.

The command execution table 13 shown in FIG. 19C is created based on these command areas and the sequence input on the command execution screen. The command execution screen creation processing unit 6 first captures the sequence “2: 3: 4: 1” set in the command execution screen in FIG. Next, the command name “B” corresponding to the number “2” existing at the beginning of the captured sequence is obtained, and the command area 1 in FIG. 19B corresponding to the command name “B”
The start address i + 5 is obtained by referring to 1-B. Further, the obtained address is stored in the head address j of the command execution table 13 of FIG.

Thereafter, similar processing is performed for the number "2" and the number "3" connected by the connector ":". As a result, at the next address j + 1 in the command execution table 13,
Start address i + of command memory with command name "C"
8 is stored. Thereafter, similarly, the next address j + 2
Addresses i + 10 and i are stored in and j + 3, and the command execution table 13 is completed.

When the command execution table 13 is completed,
The command execution screen creation processing unit 6 includes a command execution unit 7b.
Ask to perform the test. In response to this request, the command execution unit 7b executes the command selected from the command function library 7c while referring to the parameters of the command memory 11-A, ... In the order stored in the command execution table 13.

Upon receiving this request, the command execution section 7b first analyzes the command execution table 13 by referring to the command area 11. The command execution unit 7b acquires a work area in the memory, obtains the address i + 5 of the command to be executed first by referring to the start address j of the command execution table 13, and uses this to calculate the command area 11
-See B. Then, the contents of the command area 11-B below the address i + 5 are copied and expanded in order from the beginning of the work area.

After that, the next address j + 1 of the command execution table 13 is referred to, and the contents of the command area 11-C below the address i + 8 are expanded in order from the next address of the work area. Thereafter, in the same manner, addresses j + 2 and j + 3
The contents of the command areas 11-D and 11-A are expanded on the work area in that order by using the contents of. As a result, the analysis of the command execution table 13 is completed, and the test program is obtained on the work area. This test program is still written using command symbols.

When the analysis of the command execution table 13 is completed, the test program on the work area is executed with reference to the command function library 7c. As a result, the test is executed.

The command executing section 7b executes the test programs on the work area in order from the beginning. According to the example of FIG. 19, the command symbol “B” exists at the head address. Therefore, using this command symbol "B",
Corresponding command from command function library 7c "R
"EQUEST SENSE" is selected and called.

Next, the command executing section 7b gives the command as an argument the parameter "18" which is further present at the address corresponding to the number "1" of parameters which is present at the next address of the work area. As a result, the command becomes executable and is executed. Hereinafter, similarly, each command is executed according to the sequence.

As described above, the commands are executed in the order defined in the command execution table 13, and the command area 1
The parameters defined by 1-1, ..., 11-i, ... will be referred to as arguments. Then, the command defined in the command execution table 13 is selected from the command function library 7c.

When an error occurs in the test target input / output device 9 due to execution of each command, the error is reported to the command executing section 7b. When the execution of each command in the sequence ends, the command execution unit 7b notifies the error occurrence processing unit 8b to that effect. The error generation processing unit 8b checks whether or not an error report is received in the sequence. When there is a reception, the error occurrence processing unit 8b displays a predetermined error status and error message on the screen 2. After that, the error generation processing unit 8b passes control to the command execution unit 7b.

The command execution section 7b, to which control is passed from the error generation processing section 8b, returns the end of test execution as a response to the test execution request from the previous command execution screen creation processing section 6.

When this response is received, test data such as test contents and test results including error messages are recorded in a file in accordance with an instruction from the input / output device 1 by the operator.

Since the test data recorded in the file need only be the contents of the command areas 11-1, ..., 11-i, ... And the command execution table 13, the capacity thereof can be small. If there is no error, the capacity can be further reduced by recording only that fact. If there is an error, command areas 11-1, ..., 11
It is sufficient to record the error content together with -i, ... And the command execution table 13, and in this case as well, the capacity can be small.

In this embodiment, the command execution table 13 may be provided with an area for storing the number of command executions so that the command repeat processing can be instructed by a character string.

That is, in the case of the example of FIG. 19A, the test sequence is, for example, "2 * 3: 3 * 5: 4: 1 * 100" instead of "2: 3: 4: 1". input.
As a result, the command with the number “2” is executed three times, the command with the number “3” is executed five times thereafter, the command with the number “4” is executed once, and the command with the number “1” is then executed. The command is executed 100 times.

The number of times of repetition is stored in a predetermined position in the command execution table 13 based on the test sequence. The number of repetitions in the command execution table 13 is reflected in the test program created in the work area. Therefore, the command execution unit 7b can repeatedly execute the command.

In this case, the test program can be created very easily as compared with the conventional one, and the storage capacity of the test data can be made extremely small.

[0103]

As described above, according to the present invention,
In the test support system, commands on the definition screen,
By defining parameters and specifying the test target device and command sequence on the command execution screen, you can flexibly respond to various test target devices and test contents.Once you create the command function library, As long as the same command function is used, it is possible to save the trouble of creating a program thereafter, and it is also possible to eliminate the trouble of management and the increase of capacity due to the increase in the number of programs.

[Brief description of drawings]

FIG. 1 is a principle configuration diagram of the present invention.

FIG. 2 is an explanatory diagram of a test menu.

FIG. 3 is an explanatory diagram of a single mode.

FIG. 4 is a single mode processing flow.

FIG. 5 is an explanatory diagram of a command map.

FIG. 6 is an explanatory diagram of a combination mode.

FIG. 7 is a combination mode processing flow.

FIG. 8 is an explanatory diagram of a simple language mode.

FIG. 9 is a configuration diagram of a processing mechanism in an automatic test mode.

FIG. 10 is an overall flow of an automatic test mode.

FIG. 11 is an explanatory diagram of a command attribute definition screen.

FIG. 12 is an explanatory diagram of a command data string definition screen.

FIG. 13 is an explanatory diagram of a definition screen of a parameter data string for data-in.

FIG. 14 is an explanatory diagram of a parameter data string definition screen for data out.

FIG. 15 is an explanatory diagram of an error definition screen.

FIG. 16 is an explanatory diagram of a command execution screen.

FIG. 17 is an explanatory diagram of a command execution screen creation process.

FIG. 18 is a detailed flow of command execution and error processing.

FIG. 19 is an explanatory diagram of sequence control of execution commands.

[Explanation of symbols]

 1 Input / Output Device 2 Screen 3 Processing Device (CPU / Memory) 4 Test Support System 5 Command Definition Processing Unit 6 Command Execution Screen Creation Processing Unit 7 Test Processing Unit 7a Input Mode Analysis Unit 7b Command Execution Unit 7c Command Function Library 8 Error Handling Part 8a Error message definition processing part 8b Error occurrence processing part 8c Parameter data string comparison processing part 8d Parameter data string display part 9 Test target input / output device

Claims (3)

[Claims] 1. A definition screen is displayed and used for testing the device under test by the set command attribute and the variable / fixed value part of the command data string and the variable / fixed value part of each data string of the parameter. The command definition processing part that individually defines commands and the command execution screen that shows a list of each defined command are displayed, and one or more commands to be used for the test are selected on the screen and the selected command is executed. The command execution screen creation processing unit that sets the sequence that indicates the order, the command data string and parameter data string of each defined command, and the command function of the execution format corresponding to each defined command are managed, and the command execution screen is managed. For each command instructed to be executed in sequence based on the sequence set by the creation processor, the corresponding command data is Data column, test support system characterized by comprising a test processing unit retrieves and executes the parameter data stream. 2. The error message definition processing unit according to claim 1, which defines an error message to be output corresponding to an error state, and the error state when an error occurs as a result of executing a command by the test processing unit. A test support system comprising: an error occurrence processing unit that displays an error message on the screen; 3. The parameter data string according to claim 1, wherein when the test processing unit executes a command, and a parameter data string is input from the device under test, the input parameter data string is expected. And a parameter data string comparison processing unit for comparing with the parameter data string, and a parameter data string display unit for displaying the comparison result of the parameter data string in a case where there is a mismatched portion in the parameter data string, which can be identified. A test support system characterized by.