JPH0822091B2 - Imaging device test method and test device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a time delay integration (Time Delay Integration: T) used as a sensor for attitude control of a spin satellite.
The present invention relates to a test method and a test device for performing an evaluation test of a star imaging device such as a star tracker adopting the DI) method.

[Conventional technology]

In the conventional evaluation test of this type, a star imager was attached to a spin table that rotates at the same speed as the artificial satellite's spin speed, and the imager was aligned near the spin table to simulate the star image. A star simulator with continuous fixed lighting was installed and the star image data was acquired.

[Problems to be Solved by the Invention]

In the evaluation test using the conventional spin table method described above, the image capturing device of the star, which is the device under test, is continuously rotating, so if the star image data of the star simulator could not be obtained, Since it is not possible to investigate using the measuring instruments such as an oscilloscope, where is the problem inside the imaging device being acquired,
The cause of the failure could not be found efficiently.

[Means for solving the problem]

Employs a time-delay integral imaging method according to the present invention
In the non-spin table type star imaging device test method used for attitude control of spin type artificial satellites using CCD image sensor, the light spot corresponding to the star is blinking in synchronization with the spin speed of the artificial satellite. The CCD image sensor receives the moving light spot in a fixed state, and the star imager receives the moving light spot, converts it into electric charge, and transfers the electric charge to a V-direction shift register in the CCD image sensor. , Transferring and integrating all the charges obtained by receiving light during the movement of the light spot on the V-direction shift register in synchronization with the light spot moving in synchronization with the spin speed of the artificial satellite By doing so, the star image data is obtained.

〔Example〕

 Next, the present invention will be described with reference to the drawings.

First, the test method according to the present invention and the time-delay integral imaging method used in the imaging device for the star that is the device under test of the test apparatus will be described with reference to the time-delay integration diagram of FIG. In the interlace method, which is an imaging method used in conventional video cameras, etc., the exposure time is equivalent to 1/30 second because the movement is as if a continuous image was taken with a shutter of 1/30 second. Imaging of dark stars such as stars is difficult. Therefore, if you try to extend the exposure time, the image will be blurred because the artificial satellite is spinning this time, and as a result it is impossible to capture the image of a dark star such as a second star without blurring. Therefore, a time-integrated imaging method is adopted which has a high sensitivity as a start tracker for spin satellites, and therefore has a high degree of design freedom as a start tracker.

In FIG. 2, reference numeral 21 denotes a CCD (charge coupled device) image pickup device, which includes a photocell unit 22 and a shift register unit 23. Now, the star image 24 is moving on the CCD image pickup device 21 according to a predetermined spin speed of the artificial satellite. This star image 24
In synchronism with the moving speed of the star image 24, the electric charge 25a charged in the photocell 25 on the photocell unit 1 of the CCD image pickup device 21 by the light input of the star image 24 is transferred to the V direction shift register 26 and the star image 24 Transfer in the direction of movement. Similarly, the charge 27a charged in the adjacent photocell 27 as the star image 24 moves
Are transferred to the V direction shift register 28, the charges 25a and 27a are added to the V direction shift register 28. Similarly, in order to synchronize the movement of the star image 24 and the movement of the V direction shift register 28 in the same manner, a movement integral clock signal is generated from the information of the spin speed, and a CCD drive signal synchronized with this movement integral clock signal is subjected to CCD imaging. By supplying it to the device 21, all electric charges until the star image moves from one end of the CCD image pickup device 21 to the opposite end thereof are shifted in the V direction shift register 28.
Because it can be integrated and charged, the point-shaped star image data with high sensitivity and no blur can be acquired.

FIG. 1 is a diagram showing a test apparatus for an image pickup apparatus according to the present invention and a test system diagram thereof. The CCD driver unit 1 generates a moving integral clock signal synchronized with a predetermined spin speed of an artificial satellite, and supplies a CCD drive signal synchronized with this signal to the image pickup device 3 by a cable 8. 4 is an optical simulator simulating a star image viewed from an artificial satellite. The optical simulator 4 has a mask 6 attached on the screen surface 5 in a linear shape with precise dimensions, and a light emitting diode (not shown) is attached to the back side of the mask 6. Through the parallel light lens 7 focused on the screen surface 5, the light of the light emitting diode becomes parallel light and is input to the image pickup device 3. The light of the light emitting diode blinks by the light emitting diode blinking control signal from the CCD driver unit 1 supplied via the cable 8.

FIG. 3 shows light spots 31 to 35 produced by holes formed in the mask 6 on the screen surface 5 of the optical simulator 4 and CC.
FIG. 3 is a relationship diagram of positions 31b to 35b of a star image generated by the projection onto the photocell unit 22 on the D image pickup device 21.

Now, tentatively make 5 holes linearly on the mask 6 and the light spot 31
˜35, and the corresponding light emitting diodes 31a to 35a are attached to the back side of the mask 6, respectively. The horizontal dimension of the screen surface 5 is 50 mm. On the other hand, V of the CCD image pickup device 21
There are 500 photo cells in the same direction, and the CCD image sensor
The dimension of 21 in the V direction is 5 mm. The point where the light of each of the light emitting diodes 31a to 35a passes through the parallel light lens 7 and the lens system (not shown) of the image pickup device 3 (not shown) and forms an image on the CCD image pickup element 21 (position of the star image) is left. From 31b to 35b. Now, assuming that the right end of the mask 6 is the base point 36 and starts from 0 mm, the light spot 31 is a point 5 mm from the base point 36, and the light spot 32 is the light spot 3.
The light emitting diodes 31a to 35a are mounted by precisely punching holes in the mask 6 up to the light spots 35 at intervals of 10 mm such as points from 1 to 10 mm.

On the other hand, the photo cell at the left end of the CCD image pickup device 21 is designated as 37, this photo cell No. is designated as photo cell No. 1, and the photo cell 29 at the right end is designated as photo cell No. 500. Now, alignment is performed so that the screen surface 5 of the optical simulator 4 and the surface of the CCD image pickup device 21 face each other. As a result, the light emitting diode 31
The star image by lighting a is formed on 31b, and this point is photocell No.50. Similarly, when the light emitting diode 32a is turned on, the photocell No. 150 on the position 32b of the star image is turned on, and when the light emitting diode 35a is turned on, the photocell No. 4 on the position 35b of the star image is turned on.
The charge will be accumulated in each 50.

FIG. 4 is a moving integral clock signal diagram. 41 is the first clock, 42 is the second clock, 43 is the 50th clock, and so on, and 47 is the 450th clock. The CCD driver unit 1 lights the light emitting diode 31a only during the timing "H" level of 43 which is the 50th clock of the moving integral clock signal. This charges the photocell No. 50 at the position 31b of the star image in FIG. Next, at the timing of the clock 43, the light emitting diode 32a is turned on only during the "H" level. As a result, the photocell No. 150 at the position 32b of the star image in FIG. 3 is charged, but at this time, the charge charged by the lighting of the light emitting diode 31a is shifted in the V direction below the photocell No. 150. It has been transferred to the register 6, and when the lighting of the light emitting diode 32a is completed, the charged amount is added to the V direction register unit 6 and added to the charged amount due to the lighting of the light emitting diode 31a. Thereafter, the addition of charges is repeated in the same manner, and finally the charges are pushed out to the shift register (not shown) in the H direction at the timing of the 501st clock, and the star image is passed through the cable 9 to the image data processing unit 10. 24 is displayed.

〔The invention's effect〕

As described above, according to the present invention, in the evaluation test of the star imaging device used for the attitude control of the artificial satellite, the method of moving and blinking the star image and integrating and adding the electric charges is adopted. There is no need to rotate all the test equipment and the DUT shown in FIG. Therefore, it is possible to easily monitor the signal inside the image pickup device of the star under test using a measuring instrument such as an oscilloscope. In addition, since the star image data is electrically controlled, it is easy to repeatedly irradiate, so it is possible to check the internal operation repeatedly, and it is easy and efficient to investigate the cause of failure when it does not operate normally. There is an advantage.

[Brief description of drawings]

FIG. 1 is a diagram of a test device and a test system of an image pickup device according to the present invention, FIG. 2 is an explanatory diagram of time delay integration, and FIG. 3 is a mask hole (light spot) and a CCD on a screen of an optical simulator.
FIG. 4 is a moving integration clock signal diagram, which is a relational diagram of the projection of the light spot on the image pickup device. 1 ... CCD driver part, 2,8,9 ... cable, 3 ... imaging device,
4 ... Optical simulator, 5 ... Screen surface, 6 ... Mask, 7 ... Parallel light lens, 10 ... Image data processing unit, 21 ... CC
D image sensor, 22 ... Photocell part, 23 ... Shift register part, 24 ... Star image, 25, 27 ... Photocell, 25a, 27a ... Electric charge, 2
6, 28 ... V direction shift register, 31 to 35 ... Light spot (position of mask hole), 31a to 35b ... Light emitting diode, 31b to 35b ... Star image position, 36 ... Base point, 37 ... Photo cell at left end, 38 ... Photo cell at the right end, 41-47 ... Timing indicating the number on the moving integral clock.

Claims (3)

[Claims] 1. A CCD adopting a time delay integration imaging method.
In a test method of a star imaging device used for attitude control of a spin-type artificial satellite using an imaging device, a light spot corresponding to a star is moved while blinking in synchronization with the spin speed of the artificial satellite, and the imaging device is fixed. In this state, the moving light spot is received by the CCD image pickup device, converted into an electric charge, and the electric charge is transferred to a V direction shift register in the CCD image pickup device, and during the movement period of the light spot. It is possible to obtain the star image data by transferring all the electric charges obtained by receiving the light on the V direction shift register in synchronization with the light spot that moves in synchronization with the spin speed of the artificial satellite, and integrating the light. Characteristic imaging device test method. 2. A CCD adopting a time delay integration imaging method.
An image pickup device using an image pickup device, a CCD driver unit that supplies a CCD drive signal synchronized with a moving integral clock signal generated based on spin velocity information of a predetermined artificial satellite, and in synchronization with the CCD drive signal. And an image data processing unit for inputting and displaying star image data output from the image pickup apparatus, and The image pickup device and the optical simulator, the light emitted from the optical simulator is received by the photocell in the CCD image pickup device in synchronization with the CCD drive signal, and the charge obtained by the light reception is in the CCD image pickup device. Alignment is performed so that the V direction register moves on the CCD image pickup device in such a direction and distance as to be integrated in synchronism with the CCD drive signal. Imaging device testing apparatus, characterized in that it is. 3. A screen having a large number of small holes formed in a straight line, a light source that blinks and is scanned in synchronization with the spin speed of an artificial satellite, and is irradiated through the small holes, and is irradiated from the light source. An optical simulator comprising a parallel light lens for outputting parallel light as parallel light to the outside.