JPH0814897B2 - Optical head device - Google Patents

Optical head device

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Publication number
JPH0814897B2
JPH0814897B2 JP29997189A JP29997189A JPH0814897B2 JP H0814897 B2 JPH0814897 B2 JP H0814897B2 JP 29997189 A JP29997189 A JP 29997189A JP 29997189 A JP29997189 A JP 29997189A JP H0814897 B2 JPH0814897 B2 JP H0814897B2
Authority
JP
Japan
Prior art keywords
photodetector
sub
pair
main beam
optical head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP29997189A
Other languages
Japanese (ja)
Other versions
JPH03160633A (en
Inventor
繁 内田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP29997189A priority Critical patent/JPH0814897B2/en
Publication of JPH03160633A publication Critical patent/JPH03160633A/en
Publication of JPH0814897B2 publication Critical patent/JPH0814897B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Optical Recording Or Reproduction (AREA)
  • Optical Head (AREA)

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は光学式情報記録再生装置に用いられる光ヘッ
ド装置に関するものである。
The present invention relates to an optical head device used in an optical information recording / reproducing apparatus.

〈発明の概要〉 本発明は、主ビームとその両側に配置した一対の副ビ
ームとを記録体に照射し、記録面で反射した戻り光から
ホログラム素子等の回折格子手段の回折作用によって回
折光を検出用ビームとして分岐させ、これを主ビーム用
光検出素子群と一対の副ビーム用光検出素子対とから成
る光検出器に入射し、主ビーム用光検出素子群で焦点誤
差と再生時の情報信号を、副ビーム用光検出素子対でト
ラッキング誤差を夫々検出する様にした光ヘッド装置に
おいて、上記副ビーム用光検出素子対をほぼ対称な形状
でかつ、上記主ビーム用光検出素子群の周囲を包囲する
形態に構成することにより、温度変動に起因するレーザ
の波長変動に基づく光検出器上のスポットの位置ずれ
と、光路中における記録体の傷に起因するスポットの伸
長が同時に発生した場合でも、トラッキング誤差信号に
ノイズを生じにくい様にしたものである。
<Summary of the Invention> The present invention irradiates a recording medium with a main beam and a pair of sub-beams arranged on both sides of the main beam, and diffracts the diffracted light from the return light reflected on the recording surface by a diffraction grating means such as a hologram element. Is split as a detection beam and is incident on a photodetector consisting of a main beam photodetection element group and a pair of sub-beam photodetection element pairs. In the optical head device in which the tracking error of each of the information signals is detected by the sub-beam photodetector element pair, the sub-beam photodetector element pair has a substantially symmetrical shape and the main-beam photodetector element is By configuring the group to surround the periphery of the group, the positional shift of the spot on the photodetector due to the wavelength variation of the laser caused by the temperature variation and the extension of the spot caused by the scratch on the recording medium in the optical path are the same. Even if it occurs occasionally, noise is less likely to occur in the tracking error signal.

〈従来の技術〉 光ヘッド装置は、光源から出射したビームを記録体に
照射し、その反射光を光検出手段で検出して焦点制御・
トラッキング制御を行いつつ情報信号を記録・再生する
が、反射光を照射光の経路から分岐して光検出手段に導
き、同時に焦点誤差検出のための処理を与える手段とし
てホログラム素子等の回折格子手段を用いることにより
構造の簡素化、装置の小型・軽量化を図ったものが開発
されている。この種の従来の光ヘッド装置を第2図乃至
第5図により説明する。第2図において、1はレーザダ
イオードであり、その出射光軸上に副ビーム生成用回折
格子2,ホログラム素子3,対物レンズ4が配置されてい
る。回折格子2はトナッキング誤差検出方法の一つであ
る3ビーム法を実現するための一要素であり、レーザダ
イオード1の出射ビームから、0次回折光を情報記録再
生用の主ビームとして、また±一次回折光をトラッキン
グ誤差検出用の一対の副ビームとして、これら三本のビ
ームが紙面に略垂直な方向に配列される様に生成する。
これら三本のビームはホログラム素子3を透過(0次回
折光として)した後、対物レンズ4により集束され、光
ディスク等の記録体5に3個のスポットを投影する。記
録体5で反射された戻り光は出射光路を逆にたどり対物
レンズ4を経由してホログラム素子3に至り、回折によ
る光路分岐作用を受けてその一部が光検出器6に入射さ
れるが、その詳細を以下に説明する。
<Prior Art> An optical head device irradiates a recording body with a beam emitted from a light source, detects the reflected light by a light detection unit, and performs focus control /
An information signal is recorded / reproduced while performing tracking control, but a diffraction grating means such as a hologram element is used as means for branching reflected light from the irradiation light path and guiding it to a light detection means, and at the same time giving processing for focus error detection Has been developed that simplifies the structure and reduces the size and weight of the device. A conventional optical head device of this type will be described with reference to FIGS. In FIG. 2, reference numeral 1 is a laser diode, and a sub-beam generating diffraction grating 2, a hologram element 3, and an objective lens 4 are arranged on the emission optical axis thereof. The diffraction grating 2 is one element for realizing the three-beam method which is one of the methods for detecting a racking error, and the 0th-order diffracted light from the emitted beam of the laser diode 1 is used as a main beam for information recording / reproduction and ± 1st-order The diffracted light is generated as a pair of sub-beams for tracking error detection so that these three beams are arranged in a direction substantially perpendicular to the paper surface.
These three beams pass through the hologram element 3 (as 0th-order diffracted light) and are then focused by an objective lens 4 to project three spots on a recording medium 5 such as an optical disk. The return light reflected by the recording medium 5 traces the outgoing optical path in reverse, reaches the hologram element 3 via the objective lens 4, and is partially incident on the photodetector 6 due to the optical path branching effect by diffraction. However, the details will be described below.

ホログラム素子3は第3図に示す様、光軸を通る領域
分割線lにより格子の形態の異る第一領域Iと第二領域
IIとから構成されている。記録体5で反射された三本の
戻り光は各領域I,II夫々で回折作用を受けるが夫々にお
いて透過した±一次回折光の一方が、出射角の異る二組
の検出用ビーム7−I,7−IIとして光検出器6に入射さ
れる。光検出器6は第4図にその平面図を示す様に、焦
点誤差検出に寄与する素子A・B及びこれらと共に再生
時の情報信号の読取りに用いられる素子Cから成る主ビ
ーム用光検出素子群と、その両側に配置され、トラッキ
ング誤差検出に寄与する素子D・Eから成る副ビーム用
光検出素子対とから構成される。同図に示す様に上述し
た二組の検出用ビームの内、7−Iの三本は(I)で示
す位置に、又7−IIの三本は(II)で示す位置に夫々焦
点を結ぶ。
As shown in FIG. 3, the hologram element 3 has a first region I and a second region which are different in the form of a lattice by a region dividing line 1 passing through the optical axis.
It is composed of II and. The three return lights reflected by the recording medium 5 are diffracted in each of the regions I and II, but one of the ± first-order diffracted lights transmitted through each of the regions I and II has two sets of detection beams 7- The light enters the photodetector 6 as I, 7-II. As shown in the plan view of FIG. 4, the photodetector 6 is a main beam photodetection device including elements A and B contributing to focus error detection and an element C used together with these elements for reading an information signal during reproduction. It is composed of a group and a pair of sub-beam photodetector elements which are arranged on both sides of the group and consist of elements D and E that contribute to tracking error detection. As shown in the figure, among the above-mentioned two sets of detection beams, three of 7-I are focused on the positions indicated by (I), and three of 7-II are focused on the positions indicated by (II). tie.

この状態で、各素子A,B,C,D,Eの夫々の出力から、焦
点誤差信号FEは周知の原理に基づき、 FE=A−B によって、トラッキング誤差信号TEは周知の3ビーム法
の原理に基づき、 TE=D−E によって、また再生時の情報信号RFは RF=A+B+C によって各々得られる。
In this state, from each output of each element A, B, C, D, E, the focus error signal FE is based on the well-known principle, and FE = A−B, and the tracking error signal TE is obtained by the well-known 3-beam method. Based on the principle, TE = DE, and the information signal RF during reproduction is obtained by RF = A + B + C.

〈発明が解決しようとする課題〉 回折格子の一種であるホログラム素子3は入射光に波
長の変動が生じた場合にはその回折角も変動してしま
う。即ち、レーザ光の波長λ,格子ピッチP,回折角θの
間には Sinθ=λ/P 故に、θ=Sin-1(λ/P) の関係があり、上述の様に波長λの変動により回折角θ
も変動する。一般に、用いられる光ビームの波長λはレ
ーザダイオード1に個有のものであるが、これはその動
作温度の変動に影響されて容易に変動してしまうため、
ホログラム素子3での回折角も温度に応じて変動する。
このため、温度変動があった場合、光検出器6上の各ス
ポットはホログラム素子3の格子に直角な方向、即ち第
4図中XX′方向とほぼ同じ方向に移動することになる。
<Problems to be Solved by the Invention> In the hologram element 3, which is a kind of diffraction grating, when the wavelength of incident light varies, the diffraction angle also varies. That is, there is a relationship of θ = Sin −1 (λ / P) because Sin θ = λ / P between the wavelength λ of the laser light, the grating pitch P, and the diffraction angle θ. Diffraction angle θ
Also fluctuates. Generally, the wavelength λ of the light beam used is unique to the laser diode 1, but it easily fluctuates because it is affected by fluctuations in its operating temperature.
The diffraction angle of the hologram element 3 also changes depending on the temperature.
Therefore, when there is a temperature change, each spot on the photodetector 6 moves in a direction perpendicular to the lattice of the hologram element 3, that is, in the same direction as the XX 'direction in FIG.

この温度変動に基づく光検出器6上でのスポットの移
動それ自体は、直接光ヘッドの機能に悪影響を及ぼすも
のではない。しかし、以下に詳述する記録体5上の傷に
基づくスポットの伸長が生じた場合、これとの相乗作用
でトラッキング誤差検出に異常を生じる場合がある。以
下、これについて第5図を中心に説明する。
The movement of the spot on the photodetector 6 due to this temperature fluctuation does not directly affect the function of the optical head. However, when a spot is elongated due to a scratch on the recording body 5 which will be described in detail below, a synergistic effect with the spot may cause an abnormality in tracking error detection. Hereinafter, this will be described mainly with reference to FIG.

記録体5は一般に情報ピットを形成した記録面を透明
樹脂で形成した保護層で覆った構造とされている。この
保護層は、記録面に直接、傷や汚損が生じるのを保護
し、また保護層自身の表面に傷等が生じたとしても、そ
の位置はビームの離焦位置であることから、直接的にビ
ームを阻害する虞れを低減する作用も有する。しかし、
保護層上の傷は次に述べる問題点の要因となる場合があ
る。一般に保護層上の傷は一本又は平行な複数本の溝の
一組として形成されることが多い。この様な傷をビーム
が通過すると、回折やまれに屈折・反射作用をも受け、
溝に直角な方向に本来の光軸から傾斜した散乱光束が生
じる。この散乱光束の出射角度や光量分布等、委細な形
態は傷の大きさ、本数や、断面、溝内面の形態等に基づ
くものであり一概に予測することはできないが、結果的
には第5図に破線で示す様に光検出器6上に傷に直角な
方向で本来のスポット形状を伸長変形させた状態が生じ
る。このスポットの伸長は、スポットが本来の基準位
置、即ち、第4図に(I),(II)で示す各位置にある
場合には、伸長の方向がいずれの方向であっても、光検
出器6の中心に対して対称な位置関係となるため、各信
号の検出に大きな悪影響を及ぼすことはない。しかし、
上述した波長変動によるスポットの位置ずれが同時に生
じた場合はその影響を無視できなくなる。
The recording body 5 generally has a structure in which a recording surface on which information pits are formed is covered with a protective layer formed of a transparent resin. This protective layer directly protects the recording surface from scratches and stains, and even if scratches or the like occur on the surface of the protective layer itself, the position is the defocus position of the beam. It also has the effect of reducing the risk of obstructing the beam. But,
The scratches on the protective layer may cause the following problems. In general, the scratches on the protective layer are often formed as a set of one groove or a plurality of parallel grooves. When the beam passes through such scratches, it is diffracted and rarely receives refraction and reflection,
A scattered light beam inclined from the original optical axis is generated in the direction perpendicular to the groove. The delicate form such as the emission angle and the light amount distribution of the scattered light flux is based on the size of the scratches, the number of the flaws, the cross section, the form of the groove inner surface, and the like and cannot be unconditionally predicted. As shown by the broken line in the figure, the original spot shape is stretched and deformed on the photodetector 6 in a direction perpendicular to the flaw. When the spot is at the original reference position, that is, at each position shown by (I) and (II) in FIG. Since the positional relationship is symmetrical with respect to the center of the container 6, there is no great adverse effect on the detection of each signal. But,
If the positional deviation of the spots due to the wavelength variation occurs at the same time, the effect cannot be ignored.

第5図に(I)′,(II)′で示す各スポットの位置
は第4図に表す様、波長変動によって本来の位置
(I),(II)から、距離m1,m2分、矢印X方向に移動
した状態を示している。この様な状態において傷による
スポットの伸長が第5図に示す様、各素子の配列に対し
て傾斜して(例えばθ≒45°)生じた場合、(I)′に
おけるスポットと(II)′におけるスポットとでは各素
子に占める照射面積に差が生じることになる。特に回折
格子2の0次回折光である主ビームのスポット8,9は、
一次回折光である副ビームのスポット10,11,12,13の夫
々に対して数倍の光量があり、その影響が大きい。第5
図に示す状態の場合、主ビームスポット8,9は、本来照
射すべき素子A,B及びCの他に、トラッキング誤差検出
用素子対である素子D,Eをも照射してしまう。この主ビ
ームスポット8及び9が素子E及びDに漏れ込む光量を
e及びdとすると、トラッキング誤差信号TEは上述の本
来の式に対し、 TE=(D+d)−(E+e) =D−E+(d−e) となり、本来の信号に(d−e)のノイズが付加される
ことになるが、第5図に示す様に、光量dとeとの間に
はスポットの位置ずれにより、d》eの光量差が生じて
おり、このノイズ(d−e)は非常に大きな値となる。
The positions of the spots indicated by (I) ′ and (II) ′ in FIG. 5 are, as shown in FIG. 4, distances m 1 and m 2 from the original positions (I) and (II) due to wavelength fluctuations. The figure shows the state of movement in the arrow X direction. In such a state, when the spot extension due to the scratch occurs at an inclination (eg, θ≈45 °) with respect to the array of the elements as shown in FIG. 5, the spot in (I) 'and the spot in (II)' There will be a difference in the irradiation area occupied by each element from the spot in FIG. Especially, the spots 8 and 9 of the main beam, which is the 0th-order diffracted light of the diffraction grating 2,
Each of the spots 10, 11, 12, and 13 of the sub-beam that is the first-order diffracted light has a light amount several times as large as that of the first-order diffracted light, and the influence thereof is great. Fifth
In the case of the state shown in the figure, the main beam spots 8 and 9 irradiate not only the elements A, B and C to be originally irradiated, but also the elements D and E which are a pair of tracking error detecting elements. Letting e and d be the amounts of light that the main beam spots 8 and 9 leak into the elements E and D, the tracking error signal TE is TE = (D + d) − (E + e) = D−E + ( d-e), and the noise of (d-e) is added to the original signal. However, as shown in FIG. 5, due to the positional shift of the spot between the light amounts d and e, d >> There is a light amount difference of e, and this noise (d−e) has a very large value.

以上の結果、波長変動による光検出器上のスポットの
位置ずれと、記録体の傷によるスポットの伸長が同じに
生じた場合、傷の方向によってはトラッキング制御を正
常に行うことができなくなる場合が生じ光ヘッドとして
の機能に重大な支障を来たすことになっていた。
As a result, when the positional shift of the spot on the photodetector due to the wavelength variation and the extension of the spot due to the scratch on the recording medium occur in the same way, the tracking control may not be normally performed depending on the scratch direction. This caused a serious hindrance to the function of the optical head.

本発明は上記問題点に着目し、上述の様な状態が生じ
てもトラッキング制御を正常に行うことができる光ヘッ
ド装置を提供することを目的とする。
The present invention focuses on the above problems, and an object thereof is to provide an optical head device capable of normally performing tracking control even when the above-described state occurs.

〈課題を解決するための手段〉 本発明は、主ビームとその両側に配置した少くとも一
対の副ビームとを記録体に照射し、記録面で反射した戻
り光を回折格子手段に入射し、その回折作用を用いて検
出用ビームを分岐させ、該検出用ビームを主ビーム用光
検出素子群と一対の副ビーム用光検出素子対とから成る
光検出来に導き上記主ビーム用光検出素子群で焦点誤差
又は情報信号を、上記副ビーム用光検出素子対でトラッ
キング誤差を夫々検出する様にした光ヘッド装置におい
て、上記副ビーム用光検出素子対をほぼ対称な形状でか
つ、上記主ビーム用光検出素子群の周囲を包囲する形態
に構成したものである。
<Means for Solving the Problems> The present invention irradiates a recording medium with a main beam and at least a pair of sub-beams arranged on both sides thereof, and makes return light reflected on a recording surface enter a diffraction grating means, The diffraction beam is used to split the detection beam, and the detection beam is guided to a photodetection device including a main beam photodetection element group and a pair of sub-beam photodetection element pairs. In an optical head device in which a focus error or an information signal is detected by a group and a tracking error is detected by the sub-beam photodetection element pair, the sub-beam photodetection element pair has a substantially symmetrical shape and the main beam is detected. The configuration is such that the periphery of the photodetection element group for beams is surrounded.

〈作用〉 上記の構成によれば、副ビーム用光検出素子対が、主
ビーム用光検出素子群の周囲を包囲する状態であること
から、波長変動による光検出器上でのスポットの移動
と、記録体上の傷によるスポットの伸長が同時に生じた
場合、伸長の方向がいずれの方向であっても主ビームス
ポットの副ビーム用光検出素子対の夫々への漏れは、互
いにほぼ対称な光量分布となり、トラッキング誤差信号
の演算によりこれが相殺されるため、ノイズとして生じ
ることがなくなる。
<Operation> According to the above configuration, since the sub-beam photodetection element pair is in a state of surrounding the main beam photodetection element group, movement of the spot on the photodetector due to wavelength fluctuation When the spots on the recording medium are simultaneously elongated by the scratches, the leakage of the main beam spot to each of the sub-beam photodetector element pairs, even if the directions of extension are in any direction, are such that the light amounts are almost symmetrical to each other. It becomes a distribution and is canceled by the calculation of the tracking error signal, so that it does not occur as noise.

〈実施例〉 以下、本発明の実施例を第1図を参照して詳細に説明
する。
<Example> Hereinafter, an example of the present invention will be described in detail with reference to FIG.

本発明は光検出器の構造を工夫したものでありそれ以
外の構成については、第2図,第3図に示した上述の従
来技術と同一であるので説明は省略する。
The present invention is one in which the structure of the photodetector is devised, and the other configurations are the same as those of the above-described conventional technique shown in FIGS.

第1図は本発明を適用した光ヘッド装置の光検出器
6′の平面図を示す。光検出器6′は従来技術と同様
に、焦点誤差検出に寄与する素子A′,B′及びこれらと
共に再生時の情報信号の読取りに用いられる素子C′か
ら成る主ビーム用光検出素子群と、トラッキング誤差検
出に寄与する素子D′,E′から成る副ビーム用光検出素
子対D′,E′は、互いに対称な形状で、かつ主ビーム用
光検出素子群A′,B′,C′を取り囲む様に形づくられて
いる。
FIG. 1 shows a plan view of a photodetector 6'of an optical head device to which the present invention is applied. Similarly to the prior art, the photodetector 6'is a main beam photodetection element group consisting of elements A'and B'that contribute to focus error detection and together with these elements C'used for reading an information signal during reproduction. , A pair of sub-beam photodetector elements D ', E'consisting of tracking error detection elements D', E'are symmetrical to each other and have main beam photodetector elements A ', B', C. It is shaped so as to surround the ‘

この装置において、従来技術である第5図の例と同様
に波長変動による光検出器6′上でのスポットのX方向
への移動と、記録体上の傷によるスポットの伸長が同時
に発生した場合を考える。第1図に示す様に、スポット
の伸長が第5図同様に各素子の配列に対して傾斜した方
向に生じたとすると、主ビームスポット8′,9′は夫々
素子E′及びD′に漏れ込むことになる。この時の漏れ
込む光量をe′及びd′とすると、トラッキング誤差信
号TEは本来の式に対し、従来技術同様に TE=(D′+d′)−(E′+e′) =D′−E′+(d′−e′) となり、本来の信号に(d′−e′)を加えることにな
るが、第1図から分かる様に、素子D及びEはいずれも
主ビーム用光検出素子群A′,B′,C′を包囲する形態に
形づくられているため、漏れ込む量は互いにほぼ等しく
なり、d′≒e′の関係が成立している。従って、上式
から TE=D′−E′+(d′−e′) =D′−E′+0 =D′−E′ が成り立ち、トラッキングエラー信号TEは、ほとんどノ
イズを生じることなく、獲得することができる。この関
係はスポットの伸長がいずれの方向であっても、即ち記
録体上の傷の方向にかかわらず常に成立するので、この
様な場合のトラッキング誤差信号へのノイズの混入をほ
とんど皆無とすることができる。
In this apparatus, when the spot movement on the photodetector 6'due to the wavelength variation in the X direction and the spot extension due to a scratch on the recording medium occur at the same time as in the prior art example shown in FIG. think of. As shown in FIG. 1, if the spots are elongated in the direction inclined with respect to the arrangement of the elements as in FIG. 5, the main beam spots 8'and 9'are leaked to the elements E'and D ', respectively. It will be crowded. Assuming that the amounts of light leaking at this time are e'and d ', the tracking error signal TE is TE = (D' + d ')-(E' + e ') = D'-E, as in the prior art, with respect to the original equation. ′ + (D′−e ′), and (d′−e ′) is added to the original signal. As can be seen from FIG. 1, the elements D and E are both main beam photodetection elements. Since they are shaped so as to surround the groups A ', B', and C ', the leak amounts are substantially equal to each other, and the relationship of d'.apprxeq.e' is established. Therefore, from the above formula, TE = D'-E '+ (d'-e') = D'-E '+ 0 = D'-E' holds, and the tracking error signal TE is obtained with almost no noise. can do. This relationship is always established regardless of the direction of the spot extension, that is, regardless of the direction of the scratch on the recording medium. Therefore, in this case, almost no noise is mixed into the tracking error signal. You can

なお、上記した実施例では、ホログラム素子による戻
り光の分岐時に検出用ビームを光軸を通る分割線lで2
組に分割し、焦点誤差信号をナイフエッジ法の原理によ
って得る例を適用しているが本発明はこれに限られるも
のではなく、検出用ビームを分割することなく、ホログ
ラム素子等によって非点収差を与え、四象限分割の光検
出素子群で焦点誤差信号を検出する非点収差法等、ビー
ム分割を行わない手法のものにも応用が可能である。
In the above-described embodiment, the detection beam is divided into two by the dividing line 1 passing through the optical axis when the return light is branched by the hologram element.
Although an example in which the focus error signal is obtained by dividing the focus error signal by the principle of the knife edge method is applied, the present invention is not limited to this, and the detection beam is not divided, and astigmatism is generated by the hologram element or the like. Can be applied to a method that does not perform beam splitting, such as an astigmatism method in which a focus error signal is detected by a four-quadrant split photodetector element group.

〈発明の効果〉 以上説明した様に本発明によれば、波長変動による光
検出器上でのスポットの移動と、記録体上の傷によるス
ポットの伸長とが同時に生じた場合でも、伸長の方向に
かかわらず、トラッキング誤差信号へのノイズの混入を
ほとんど皆無とすることができ、温度変化や記録体の傷
に強い光ヘッド装置を構成することができる。
<Effects of the Invention> As described above, according to the present invention, even when the movement of the spot on the photodetector due to wavelength fluctuation and the extension of the spot due to scratches on the recording medium occur at the same time, the direction of extension However, it is possible to prevent almost no noise from being mixed into the tracking error signal, and it is possible to configure an optical head device that is resistant to temperature changes and scratches on the recording medium.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明適用した光ヘッド装置の光検出器の一実
施例を示す平面図、第2図及び第3図はホログラム素子
利用光ヘッド装置の光路図及びホログラム素子の平面
図、第4図及び第5図は従来技術における光検出器の平
面図を示す。 1……レーザダイオード、2……回折格子(3ビーム生
成用)、3……ホログラム素子(回折格子手段)、5…
…記録体、6′……光検出器、7−I・7−II……検出
用ビーム、A′,B′,C′……主ビーム用光検出素子群、
D′,E′……副ビーム用光検出素子対。
FIG. 1 is a plan view showing an embodiment of a photodetector of an optical head device to which the present invention is applied, FIGS. 2 and 3 are optical path diagrams of a hologram element utilizing optical head device and plan views of a hologram element, and FIG. FIG. 5 and FIG. 5 show plan views of photodetectors in the prior art. 1 ... Laser diode, 2 ... Diffraction grating (for generating three beams), 3 ... Hologram element (diffraction grating means), 5 ...
... Recording body, 6 '... Photodetector, 7-I, 7-II ... Detection beam, A', B ', C' ... Main beam photodetection element group,
D ', E' ... A pair of sub-beam photodetector elements.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】主ビームとその両側に配置した少くとも一
対の副ビームとを記録体に照射し、記録面で反射した戻
り光を回折格子手段に入射し、その回折作用を用いて検
出用ビームを分岐させ、該検出用ビームを主ビーム用光
検出素子群と一対の戻りビーム用光検出素子対とから成
る光検出器に導き、上記主ビーム用光検出素子群で焦点
誤差又は情報信号を、上記副ビーム用光検出素子対でト
ラッキング誤差を夫々検出する様にした光ヘッド装置に
おいて、 上記副ビーム用光検出素子対はほぼ対称な形状でかつ、
上記主ビーム用光検出素子群の周囲を包囲する形態に構
成したことを特徴とする光ヘッド装置。
1. A recording medium is irradiated with a main beam and at least a pair of sub-beams arranged on both sides of the recording medium, and the return light reflected by the recording surface is incident on a diffraction grating means for detection using the diffraction action. The beam is branched, and the detection beam is guided to a photodetector composed of a main beam photodetection element group and a pair of return beam photodetection element pairs, and a focus error or information signal is generated in the main beam photodetection element group. In the optical head device configured to detect the tracking error by the sub-beam photodetector element pair, the sub-beam photodetector element pair has a substantially symmetrical shape, and
An optical head device characterized in that it is configured to surround the periphery of the main beam photodetection element group.
JP29997189A 1989-11-17 1989-11-17 Optical head device Expired - Fee Related JPH0814897B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29997189A JPH0814897B2 (en) 1989-11-17 1989-11-17 Optical head device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29997189A JPH0814897B2 (en) 1989-11-17 1989-11-17 Optical head device

Publications (2)

Publication Number Publication Date
JPH03160633A JPH03160633A (en) 1991-07-10
JPH0814897B2 true JPH0814897B2 (en) 1996-02-14

Family

ID=17879187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29997189A Expired - Fee Related JPH0814897B2 (en) 1989-11-17 1989-11-17 Optical head device

Country Status (1)

Country Link
JP (1) JPH0814897B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2605600B2 (en) * 1993-10-18 1997-04-30 日本電気株式会社 Light head

Also Published As

Publication number Publication date
JPH03160633A (en) 1991-07-10

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