JPH08123543A - System and method for inspecting electronic equipment - Google Patents

Abstract

PURPOSE: To improve productivity and to secure quality at the same time by changing an inspection period and realizing the inspection corresponding to the skillness of an inspector or the timing of production. CONSTITUTION: When executing an inspection control mode for impressing driving signals (inspection signals) successively to plural inspecting objects such as LED in a prescribed inspection period ΔT, a signal at a level decided in advance is applied to the control part of a microwave oven. At such a time, when the level of the applied signal is settled within a first range ΔL1, second range ΔL2 or third range ΔL3, the inspection period ΔT is decided to a first inspection period ΔT1, second inspection period ΔT2 or third inspection period ΔT3 respectively (S21-S26). On the other hand, when that level is not settled within the first - third ranges ΔL1-ΔL3, the inspection period ΔT is decided to a fourth inspection period ΔT4 (S27). Then, the driving signals are successively impressed to the inspection objects in the decided inspection period ΔT.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic device inspection system and an electronic device inspection method for inspecting whether or not each function of an electronic device such as a microwave oven operates normally.

[0002]

2. Description of the Related Art Conventionally, a manufacturing process of an electronic device such as a microwave oven includes an inspection process for inspecting whether or not each function of the electronic device operates normally in order to ensure product quality. Is common. The inspection items in the inspection process include, for example, LED (light emitting diode) lighting confirmation and motor rotation confirmation. These tests are usually
It is carried out by professional inspectors.

In order to support the above inspection process, the control unit provided in the electronic equipment has a normal control mode in addition to the normal control mode.
A dedicated inspection control mode is set. An example of a method of shifting to the inspection control mode is proposed, for example, in Japanese Patent Application No. 6-92469 filed previously by the present applicant. In the above proposed technique, the transition to the inspection control mode is achieved by inputting a signal of a specific level different from the level of the signal to be input from the predetermined input terminal of the control unit in the normal control mode, from the predetermined input terminal. It

When the mode is shifted to the inspection control mode in this way, the control unit sequentially applies the drive signal to the inspection target at each predetermined inspection cycle. The above inspection targets include
For example, when the electronic device to be inspected is a microwave oven, a plurality of LEDs (light emitting diodes) for displaying the remaining time,
Includes interior lights and fan motors. The inspection is performed by the inspector confirming the lighting state of the LED or the interior light, the rotating state of the fan motor, or the like.

[0005]

By the way, in the prior art including the above-mentioned proposed technology, the inspection cycle is fixed. On the other hand, the productivity improves as the inspection cycle becomes shorter. Therefore, in view of productivity, it is desirable that the inspection cycle be as short as possible. However, when a relatively short inspection cycle is set, even if an inspector who is skilled can perform a reliable inspection without any problem, an inexperienced inspector may not be able to perform a reliable inspection. Further, even a skilled inspector may not be able to perform a reliable inspection at a time when the inspection item is not surely mastered, such as the start-up period of production. Therefore, in such a case, the quality of the product may not be ensured.

On the other hand, in consideration of ensuring the quality, it is necessary to set the inspection cycle relatively long so that even an inexperienced inspector can make a reliable inspection, and therefore productivity is sacrificed.
Thus, according to the conventional techniques including the above-mentioned proposed technique,
You had to sacrifice either productivity or quality. Therefore, an object of the present invention is to provide an electronic device inspection system and an electronic device inspection method which can solve the above-mentioned technical problems and can achieve improvement in productivity and quality at the same time.

[0007]

The electronic device inspection system according to the present invention for achieving the above object has a configuration viewed from a first viewpoint, and a control device and a device connected to the control device are provided from the control device. A system for inspecting electronic equipment including a plurality of function execution units controlled by a control signal, the signal input unit being capable of inputting a plurality of signals having different values, and the value of the signal input from the signal input unit. Discriminating means for discriminating whether or not is a value within a predetermined range, and in this discriminating means, the input signal value is judged to be within a predetermined range, and an inspection mode transition signal is generated. Responsive to the plurality of function executing units connected to the control device, the inspection mode executing means for outputting the inspection signal and the signal value determined by the determining means are sequentially corresponded. So it is characterized by including a period changing means for changing the signal output period in which the inspection mode executing means outputs to each function executing unit.

Further, according to the configuration of the electronic equipment inspection system of the present invention seen from the second viewpoint, the signal input means is attachable to and detachable from a predetermined portion of the electronic equipment, and includes a plurality of switches. It is characterized in that voltage signals of different values can be input by selectively switching between. Further, according to the configuration of the electronic device inspection system of the present invention seen from the third viewpoint, the discrimination means generates the inspection mode transition signal when the value of the input signal is within a predetermined range. It is characterized by being a thing.

The configuration of the electronic equipment inspection system of the present invention seen from the fourth aspect is characterized in that the signal input means is a key input section for data input provided in the electronic equipment. Further, according to the configuration of the electronic device inspection system of the present invention seen from the fifth viewpoint, the discrimination means generates the inspection mode shift signal by operating a specific key in the key input section. It is characterized by being.

Further, the electronic device inspection method of the present invention includes a control device and a plurality of function execution parts which are connected to the control device and are controlled by a control signal given from the control device. The signal having an arbitrary value among a plurality of signals having mutually different values is input, and it is determined whether or not the value of the input signal is within a predetermined range. When it is determined that the value is within a predetermined range, and the inspection mode transition signal is generated, the cycle for outputting the inspection signal is determined in accordance with the input signal value, and the inspection signal is connected to the control device. The inspection signal is sequentially output to the determined plurality of function executing units at the determined cycle.

[0011]

In the structure seen from the first aspect, the signal input means can input a plurality of signals having different values. When a signal having an arbitrary value is input from the plurality of different signals from the signal input means, the determination means determines whether or not the input signal value is within a predetermined range. When it is determined that the input signal value is within a predetermined range, for example, as in the configuration viewed from the third aspect, the determining means generates the inspection mode transition signal.

In the inspection mode executing means, it is determined that the input signal value is within a predetermined range, and in response to the generation of the inspection mode transition signal, a plurality of units connected to the control device are connected. The inspection signals are sequentially output to the function executing units of. At this time, the cycle for outputting the inspection signal is changed in accordance with the input signal value.

Therefore, for example, when an inspector with a low degree of skill inspects or when the production is just started, a signal having a value such that the cycle for outputting the inspection signal becomes relatively long is input. By doing so, a reliable inspection can be performed. Further, in the case where an inspector with a high degree of skill inspects when the production is on track, by inputting a signal having a value such that the cycle for outputting the inspection signal is relatively short, The time required for inspection can be shortened while ensuring quality.

As described above, according to the above configuration, the cycle in which the inspection signal is to be output can be changed, so that the inspection can be performed according to the skill of the inspector or the production time. Therefore, the improvement of productivity and the assurance of quality can be achieved at the same time. Further, in the configuration viewed from the second viewpoint, the signal input means includes a plurality of switches that can be attached to and detached from a predetermined part of the electronic device, and voltage signals of different values can be input by selectively switching each switch. It is a thing. Further, the inspection mode transition signal is generated, for example, when the discrimination means discriminates that the input signal value is within a predetermined range as described above. Therefore, when shifting to the inspection mode, it suffices to mount the signal input means on the electronic device and select the switch, so that it is possible to easily shift to the inspection mode.

Further, in the configuration seen from the fourth aspect, the signal input means is a key input section for data input provided in the electronic device. The inspection mode transition signal is
For example, as in the configuration seen from the fifth viewpoint, it is generated by operating a specific key in the key input section. Therefore, when shifting to the inspection mode, it is only necessary to operate a specific key in the key input section, and thus it is possible to easily shift to the inspection mode.

[0016]

Embodiments of the present invention will be described below in detail with reference to the accompanying drawings. FIG. 4 shows a first example to which the electronic device inspection system or the electronic device inspection method of the present invention is applied.
It is a block diagram which shows the electric constitution of the microwave oven of an Example. The microwave oven includes a control unit 1 that controls heating and cooking according to a predetermined operation program. Control device 1
Is composed of, for example, a microcomputer including a CPU, a ROM, and a RAM, and functions as a discriminating means, an inspection mode executing means, a cycle changing means, and the like. The control device 1 is set with a normal control mode for performing normal heating and cooking and an inspection control mode as control modes.

The manufacturing process of the microwave oven includes an inspection process in which an inspector inspects to ensure the quality of the product. In the inspection process, the microwave oven needs a process different from the normal cooking such as sequentially applying a drive signal to an inspection target such as an LED (light emitting diode) at a predetermined inspection period ΔT. Therefore, the inspection control mode is set as a mode in which the drive signal is sequentially applied to the inspection target at a predetermined inspection period ΔT.

The control device 1 includes, for example, a clock key 2a for setting a control mode to a cooking time setting mode, a numeric key 2b for inputting a cooking time, and a key input section 2 including a start key 2c for starting heating and a door. The open / close detection unit 3 is connected. Further, the control device 1 includes, as a function executing unit, an interior lamp 4, a fan motor 5, a heater 6, a magnetron 7, a display unit 8 for displaying cooking time and the like, and an LED display unit for displaying a cooking menu and the like. 9 is connected.

FIG. 5 is a cross-sectional view showing the structure of the door open / close detection unit 3. The door open / close detection unit 3 has a door switch 31 which is turned on in response to the door being closed because the power supply line of the magnetron 7 (see FIG. 4) is turned on only when the door is closed. It is equipped. Specifically, when the door is closed, the end of the door hook F1 presses the contact of the door switch 31 via the passage hole H1. As a result, the door switch 31 is turned on.

Further, the door opening / closing detector 3 forcibly shuts off the power supply to the magnetron 7 when the door is opened, which may cause microwave leakage, so that the monitor is turned off in response to the opening of the door. A switch 32 is provided. Specifically, when the door is opened, the shoulder portion of the door hook F2 passes through the passage hole H2 and the monitor switch 32.
Press the contact of. As a result, the monitor switch 32
Is turned off.

Further, the door opening / closing detector 3 has a control device 1
In order to determine whether or not the door is completely closed, the door sensing switch 33 that is turned on in response to the door being completely closed is provided. Specifically, when the door is closed, the end of the door hook F2 presses the contact of the door sensing switch 33 via the passage hole H2. As a result, the door sensing switch 33 is turned on.

A connector CN1 is connected to the door sensing switch 33 via a connection cord 33a.
The connector CN1 is configured so that it can be fitted into a socket mounted on a control board described later. FIG. 6 is an electric circuit diagram showing the door opening / closing detector 3.
As shown in FIGS. 6 (a) and 6 (b), the socket S mounted on the control board CB on which the control device 1 is mounted is connected to a power source (5 (V)) and has a resistor R1. It is connected to the AD _IN terminal of the control device 1 via. One end of the voltage dividing resistor R2 is connected to the resistor R1. Voltage dividing resistor R
The other end of 2 is grounded.

The socket S has a connector CN1 connected to the door sensing switch 33 shown in FIG. 6 (a) and pseudo resistors Rd1, Rd2, R shown in FIG. 6 (b).
Switching switches SW1, SW2, SW that can be manually operated when selecting either d3, Rd4 (hereinafter, referred to as "pseudo resistance Rd" collectively) or each pseudo resistance Rd.
3, SW4 (When collectively referred to as "selection switch SW"
Is referred to as a connector CN2 to which the connector CN2 is connected.

In the control device 1, the condition for executing the normal control mode is that the connector CN1 to which the door sensing switch 33 is connected is fitted in the socket S as shown in FIG. 6 (a). That is. in this case,
The door is opened and the door sensing switch 33 is turned off.
Then (the state shown in FIG. 6A), the AD of the controller 1
_{The IN} terminal has a relatively low level L _L (for example, L _L = 0
(V) to 1 (V)) signals are given.

On the contrary, the door is closed and the door sensing is performed.
When the switch 33 is turned on, the AD of the control device 1_INTerminal
Is connected to the voltage dividing resistor R2 and the door sensing switch 33.
The signal of level L divided by the contact resistance (about several Ω) is given.
available. Here, the voltage dividing resistor R2 is, for example, a door.
The contact resistance of the sensing switch 33 is several hundred times (
For example, the size is R2 = 10 (KΩ). That
Therefore, the AD of the control device 1 _INThe terminal has a relatively high level L
_H(Eg L_H= 4 (V) to 5 (V)) signals are given.

As described above, when the normal control mode is executed, the control device 1 is _{supplied with} the signal of the relatively low level L _L or the relatively high level L _H. On the other hand, in the control device 1, the condition for executing the inspection control mode is
As shown in FIG. 6B, the connector CN2 to which the pseudo resistance Rd and the changeover switch SW are connected is fitted. That is, in the inspection process, the inspector replaces the connector CN1 to which the sensing switch 33 is connected, instead of the pseudo resistor Rd and the changeover switch S.
The connector CN2 to which W is connected is fitted into the socket S. As a result, the pseudo resistor Rd and the voltage dividing resistor R2 selected by the changeover switch SW are connected to the AD _IN terminal of the control device 1.
A signal of level L divided by and is given.

As a condition for executing the inspection control mode, instead of fitting the connector CN2, to which the plurality of pseudo resistors Rd and the changeover switch SW are connected, into the socket S, only each pseudo resistor Rd is connected. Socket S
You may decide to fit in. The pseudo resistances Rd can give signals to the control device 1 at different levels from each other and at levels other than the levels L _L and L _{H of the} signals given to the AD _IN terminal of the control device 1 in the normal control mode. Selected to be able to. Specifically, the pseudo resistances Rd1, Rd2, Rd3, and Rd4 are each 18 (k
Ω), 12 (KΩ), 8.2 (kΩ), and 5.6 (kΩ).

Therefore, the inspection control mode is executed.
In this case, the pseudo resistances Rd1 and R
When d2, Rd3 and Rd4 are selected, the control device 1
AD _INThe level L of the signal to be applied to the terminal is
If anti-R2 is 10 (KΩ), for example, 1.78 (V)
 , 2.27 (V), 2.75 (V), 3.21 (V). like this
In addition, the AD of the control device 1_INThe inspection control mode is actually
Level at which normal control mode is executed, if performed
Medium level L other than_M(Eg L_M= 1.78
(V) to 3.21 (V)) signal is given.

As is apparent from the above description, in this embodiment, the pseudo resistor Rd and the changeover switch S are used.
Connector CN2 to which W is connected, socket S, power supply (5
(V)), the resistor R1 and the voltage dividing resistor R2 correspond to the signal input means. FIG. 3 is a flowchart showing a control mode execution process in the control device 1. This control mode execution process is started in response to the power being turned on.

When the power is turned on, first, in order to determine whether to execute the normal control mode or the inspection control mode, is the level of the signal applied to the AD _IN terminal at the intermediate level L _M ? It is determined whether or not (step S1). As a result, when it is determined that it is not the middle level L _M , that is, the low level L _L or the high level L _H , the normal control mode execution processing is performed (step S2). On the other hand, when it is determined that the level is the medium level L _M , first, the inspection cycle determination process is performed (step S3). Next, the inspection control mode execution process is performed (step S4).

FIG. 1 is a flow chart for explaining the inspection cycle determining process. The inspection cycle determination process is performed by the inspection cycle ΔT in which a drive signal should be sequentially applied to a plurality of inspection targets.
Is a process for determining the value of L.sub.IN based on the level L of the signal applied to the AD _IN terminal. More specifically, first, it is determined whether or not the level L of the signal given to the AD _IN terminal is in the first range ΔL1 (for example, 1.5 (V) ≦ ΔL1 <2.0 (V)) (step S21). ).

As a result, the level L is in the first range ΔL1.
If it is determined that the pseudo resistance Rd1 is
It is considered that the connector CN2 having been selected is inserted, and the inspection period ΔT is determined to be the first inspection period ΔT1 (for example, ΔT1 = 1 (sec)) (step S22).
On the other hand, when it is determined that the level L is not the first range ΔL1, the level L is then changed to the second range ΔL2 (for example,
It is determined whether or not 2.0 (V) ≦ ΔVL <2.5 (V)) (step S23).

As a result, the level L is in the second range ΔL2.
If it is determined that the pseudo resistance Rd2
It is considered that the selected connector CN2 is inserted, and the inspection period ΔT is determined to be the second inspection period ΔT2 (for example, ΔT2 = 0.8 (sec)) (step S2).
4). On the other hand, if it is determined that the level L is not within the second range ΔL2, then it is determined whether the level L is within the third range ΔL3 (for example, 2.5 (V) ≦ ΔL3 <3.0 (V)). (Step S25).

As a result, the level L is in the third range ΔL3.
If it is determined that the pseudo resistance Rd3 is
It is considered that the connector CN2 having been selected is inserted, and the inspection period ΔT is determined to be the third inspection period ΔT3 (for example, ΔT3 = 0.6 (sec)) (step S2).
6). On the other hand, when it is determined that the level L is not in the third range ΔL3, it is automatically considered that the connector CN2 in which the pseudo resistance Rd4 is selected is fitted in the socket S, and the inspection cycle ΔT is the fourth. Period ΔT4 (for example, ΔT4 =
0.4 (sec)) is determined (step S27).

As a result, the inspection cycle determination process is achieved. FIG. 2 is a flowchart for explaining the inspection control mode execution processing. In the inspection control mode execution processing, processing (initialization) for determining the inspection target is performed (step S31). The inspection target includes the inside lamp 4, the fan motor 5, the heater 6, the magnetron 7, the display unit 8 and the LED display unit 9. The order in which the plurality of inspection objects should be inspected is predetermined. In step S31, inspection targets are sequentially determined according to the determined order.

When the inspection object is determined, application of the drive signal (inspection signal) to the inspection object is started (step S32). At the same time, the counter (not shown) provided in the control device 1 starts counting the inspection period ΔT (step S33). At this time, the inspection period ΔT to be counted is the inspection period ΔT determined in the inspection period determination process. When the counting of the inspection period ΔT by the counter is completed (step S34), the count value of the counter is cleared and the application of the drive signal to the determined inspection target is stopped (step S35).

The above process is repeated until all inspection objects are processed (step S36). The inspector confirms whether or not each inspection target is functioning normally while the inspection control mode execution process is performed. For example, it is confirmed whether the inside lamp 4 and the LED display unit 9 are surely turned on, or whether the fan (not shown) driven by the fan motor 5 is surely rotating. The inspection is completed when this confirmation work is completed.

As described above, according to the microwave oven of this embodiment, it is possible to easily change the inspection period ΔT to which the drive signal is sequentially applied to each inspection target, so that the inspection according to the skill level of the inspector or the production period can be performed. The inspection can be performed with the period ΔT. Therefore, a reliable inspection can be performed. Therefore, the quality of the product can be secured. At the same time, in the inspection performed by a skilled inspector, the quality of the product can be secured even with a relatively short inspection period ΔT, so that the productivity can be improved as compared with the conventional case.

FIG. 7 is a flow chart for explaining the inspection cycle determination processing in the microwave oven of the second embodiment to which the electronic equipment inspection system or the electronic equipment inspection method of the present invention is applied. In addition, in FIG. 7, in FIG.
The same code | symbol is used about the same function part as the microwave oven shown in FIG. This inspection cycle determination processing utilizes the cooking time setting processing in normal heating and cooking (normal control mode). The setting of the cooking time in normal heating and cooking (step P31) is achieved by sequentially performing the following operations (1) to (3).

Turn on the clock key 2a (YES in step P21). Input the cooking time with the number keys 2b (step P22).
YES) The clock key 2a is turned ON again (YES in Step P30). In the setting of the cooking time, in the case of shifting to the inspection cycle determination process, the inspector first turns ON the clock key 2a (the above-mentioned step). (YES in P21), enter a predetermined number from the number keys 2b (step P above).
22 YES). For example, enter a number such as "1:11,""2:22," or "3:33."

Then, as described above, the timepiece key 2a is turned O.
Instead of N, the start key 2c is turned on (YES in step P23). In the control device 1, after the number is input, the clock key 2a is not turned on and the start key 2
If it is determined that c is turned on, it is considered that the process is to shift to the inspection cycle determination process, and it is determined which of the plurality of predetermined numbers is input in step P22 (steps P24 and P26). , P28).

As a result of the above discrimination, the inputted number is "1: 1
If “1”, “2:22” or “3:33”, the inspection cycle ΔT is the first cycle ΔT1, the second cycle ΔT2 or the third cycle, respectively.
Determined to cycle ΔT3 (steps P25, P27, P
29). On the other hand, the entered numbers are "1:11" and "2: 2" above.
If neither "2" or "3:33", then step P
The process from 21 is restarted.

As described above, also in the microwave oven of this embodiment, since the inspection period ΔT is changed, the quality can be secured and the productivity can be improved as compared with the conventional one. The embodiment of the present invention is as described above,
The present invention is not limited to the above embodiments. For example, in the above-mentioned first and second embodiments, the case where the microwave oven is applied as the electronic device has been described as an example. However, even when the washing machine, the clothes dryer or the automatic dishwasher is applied as the electronic device, the present invention can be applied. Applicable.

In the second embodiment, the inspection period ΔT is determined based on whether the input number is included in a plurality of predetermined numbers. For example, the level of the input signal is predetermined. The inspection cycle ΔT may be determined based on whether or not it is within the range. Various other design changes can be made within the scope described in the claims.

[0045]

As described above, according to the electronic equipment inspection system or the electronic equipment inspection method of the present invention, the cycle in which the inspection signal is sequentially output to the plurality of function executing units is changed, so that the skill of the inspector can be improved. Inspection can be performed according to the degree or production time. Therefore, improvement in productivity and ensuring of quality can be achieved at the same time. Therefore, inexpensive and high quality products can be provided to the market.

[Brief description of drawings]

FIG. 1 is a flowchart for explaining an inspection cycle determination process which is a part of a control mode execution process in a microwave oven of a first embodiment to which an electronic device inspection system or an electronic device inspection method of the present invention is applied.

FIG. 2 is a flowchart for explaining an inspection control mode execution process which is a part of the control mode execution process.

FIG. 3 is a flowchart for explaining the control mode execution process.

FIG. 4 is a block diagram showing an electrical configuration of the microwave oven.

FIG. 5 is a cross-sectional view showing a structure of a door open / close detection unit which constitutes a part of the microwave oven.

FIG. 6 is an electric circuit diagram of the microwave oven.

FIG. 7 is a flowchart for explaining an inspection cycle determination process which is a part of the control mode execution process in the microwave oven of the second embodiment to which the electronic device inspection system or the electronic device inspection method of the present invention is applied.

[Explanation of symbols]

 1 Controller 2 Key Input Unit 2a Clock Key 2b Numeric Key 2c Start Key 4 Interior Light 5 Fan Motor 6 Heater 7 Magnetron 8 Display 9 LED Display Rd, Rd1, Rd2, Rd3, Rd4 Pseudo Resistance SW, SW1, SW2 , SW3, SW4 selector switch

Claims (6)

[Claims] 1. An inspection system for electronic equipment, comprising: a control device; and a plurality of function execution units connected to the control device and controlled by a control signal supplied from the control device. Signal input means capable of inputting the signal of, and a determination means for determining whether or not the value of the signal input from the signal input means is within a predetermined range, and in the determination means, the input signal value is In response to the determination that the value is within the predetermined range and the inspection mode transition signal is generated, the inspection signal is sequentially output to the plurality of function execution units connected to the control device. In association with the inspection mode executing means and the signal value determined by the determining means,
An electronic device inspection system, comprising: cycle changing means for changing a signal output cycle output by the inspection mode executing means to each function executing section. 2. The signal input means is attachable to and detachable from a predetermined portion of an electronic device, includes a plurality of switches, and is capable of inputting voltage signals of different values by selectively switching each of these switches. The electronic device inspection system according to claim 1, wherein: 3. The electronic device according to claim 2, wherein the discriminating means generates an inspection mode transition signal when the value of the input signal is within a predetermined range. Inspection system. 4. The electronic device inspection system according to claim 1, wherein the signal input means is a key input unit for data input provided in the electronic device. 5. The electronic device inspection system according to claim 4, wherein the discrimination means generates an inspection mode transition signal when a specific key in the key input section is operated. . 6. A method of inspecting an electronic device, comprising: a control device; and a plurality of function execution units which are connected to the control device and are controlled by a control signal given from the control device. Signal of any value among the above signals is input, it is determined whether or not the value of the input signal is within a predetermined range, and the input signal value is within the predetermined range. When it is determined and the inspection mode transition signal is generated, the cycle in which the inspection signal should be output is determined in accordance with the input signal value, and the plurality of function execution units connected to the control device are hand,
An inspection method for an electronic device, comprising: sequentially outputting an inspection signal at the determined cycle.