JPH0794402A - Positioning device - Google Patents

Positioning device

Info

Publication number
JPH0794402A
JPH0794402A JP5239370A JP23937093A JPH0794402A JP H0794402 A JPH0794402 A JP H0794402A JP 5239370 A JP5239370 A JP 5239370A JP 23937093 A JP23937093 A JP 23937093A JP H0794402 A JPH0794402 A JP H0794402A
Authority
JP
Japan
Prior art keywords
fluid
positioning device
stool
heat
present
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5239370A
Other languages
Japanese (ja)
Inventor
Noriyuki Maekawa
典幸 前川
Isao Kobayashi
功 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5239370A priority Critical patent/JPH0794402A/en
Publication of JPH0794402A publication Critical patent/JPH0794402A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature

Abstract

PURPOSE:To reduce the heat resistance between mechanism members so as to make the temperature changes of members constituting a positioning mechanism system and positioning errors caused by thermal deformation smaller by enclosing a fluid having high heat conductivity in a space between the members constituting a positioning device. CONSTITUTION:A guide table 2 is fixed on a stool 1. Such a fluid 202 as mercury, helium, etc., having high heat conductivity is enclosed in a space between the stool 1 and table 2 by using a sealing material 201. As a result, the thermal contact resistance between the stool 1 and table 2 is reduced. Even when frictional heat, etc., is supplied to the table 2, in addition, the frictional heat, etc., is readily transferred to the stool 1, because the stool 1 is thermally stabilized due to a large heat capacity the stool 1 has and can be relatively easily controlled in temperature.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体リソグラフィ工程
で用いられる縮小投影露光装置,X線露光装置,電子線
描画装置等において用いられ、部材の温度変化が小さ
く、熱変形による位置決め誤差が小さい位置決め装置に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is used in a reduction projection exposure apparatus, an X-ray exposure apparatus, an electron beam drawing apparatus, etc. used in a semiconductor lithography process, and has a small temperature change of members and a positioning error due to thermal deformation. Regarding the device.

【0002】[0002]

【従来の技術】半導体リソグラフィ工程においては高精
細パターンを形成するため、ウエハなどの試料の位置決
めの高精度化が要求されている。試料や位置決め機構系
の熱変形は位置決め精度を劣化させる要因となってい
る。このため試料や位置決め機構系の温度変化を抑制す
るための従来技術として特開昭60−158626号公報が知ら
れている。これは、図12のように、ウエハ移動装置1
201内に熱交換媒体の流路1202を設け、温度制御
装置1203によって恒温化された熱交換媒体1204を循
環させるものである。
2. Description of the Related Art In a semiconductor lithography process, in order to form a high-definition pattern, it is required to position a sample such as a wafer with high accuracy. Thermal deformation of the sample and the positioning mechanism system is a factor that deteriorates the positioning accuracy. Therefore, Japanese Patent Laid-Open No. 60-158626 is known as a conventional technique for suppressing the temperature change of the sample and the positioning mechanism system. This is as shown in FIG.
A heat exchange medium flow path 1202 is provided in 201, and the heat exchange medium 1204 whose temperature is controlled by the temperature control device 1203 is circulated.

【0003】[0003]

【発明が解決しようとする課題】しかし、従来技術で
は、熱交換媒体の温度制御装置や、熱交換媒体を循環さ
せるための配管を可動部分へ設置することが必要であ
り、機構的に複雑になるという不具合がある。
However, in the prior art, it is necessary to install a temperature control device for the heat exchange medium and a pipe for circulating the heat exchange medium in the movable part, which is mechanically complicated. There is a problem that it becomes.

【0004】本発明の目的は、機構部材間の熱抵抗を低
減し、熱容量が大きいため熱的に安定であり、かつ、温
度制御が比較的容易である定盤への伝熱を促進すること
により、位置決め機構系を構成する部材の温度変化が小
さく、熱変形による位置決め誤差が小さい位置決め装置
を提供することにある。
An object of the present invention is to reduce the thermal resistance between the mechanical members, to promote heat transfer to a surface plate which is thermally stable because of its large heat capacity and whose temperature control is relatively easy. Accordingly, it is an object of the present invention to provide a positioning device in which the temperature change of the members constituting the positioning mechanism system is small and the positioning error due to thermal deformation is small.

【0005】[0005]

【課題を解決するための手段】本発明では、位置決め装
置を構成する部材間の接触部に熱伝導率の高い流体を封
入する。(請求項1) また、本発明では、位置決め装置を構成する部材間の接
触部に凹部または凸部を設け熱伝導率の高い流体を封入
する。(請求項2) また、本発明では、位置決め装置を構成するスクイズダ
ンパ用の粘性流体に熱伝導率の高い流体を用いる。(請
求項3) 更に、本発明では、位置決め装置を構成する一方の部材
に密閉された流体槽を設け、他方の部材を流体槽内の流
体に接触させる。
In the present invention, a fluid having a high thermal conductivity is sealed in the contact portion between the members constituting the positioning device. (Claim 1) Further, according to the present invention, a concave portion or a convex portion is provided in a contact portion between members constituting the positioning device, and a fluid having a high thermal conductivity is enclosed. (Claim 2) In the present invention, a fluid having a high thermal conductivity is used as the viscous fluid for the squeeze damper that constitutes the positioning device. (Claim 3) Furthermore, in the present invention, one member constituting the positioning device is provided with a sealed fluid tank, and the other member is brought into contact with the fluid in the fluid tank.

【0006】[0006]

【作用】機構部材間の熱抵抗を低減し、熱容量が大きい
ため熱的に安定であり、かつ、温度制御が必要な場合に
も、熱交換媒体の配管等の設置が比較的容易である定盤
への伝熱を促進することにより、部材の温度変化が小さ
く、熱変形による位置決め誤差が小さい位置決め装置が
得られる。
[Function] The thermal resistance between the mechanical members is reduced and the heat capacity is large, so that it is thermally stable, and even when temperature control is required, it is relatively easy to install a heat exchange medium pipe or the like. By promoting heat transfer to the board, it is possible to obtain a positioning device in which the temperature change of the member is small and the positioning error due to thermal deformation is small.

【0007】[0007]

【実施例】以下、図面を用いて本発明の実施例を詳細に
説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0008】図1は本発明の位置決め装置の一実施例の
概要を示す斜視図である。定盤1上に案内台2が固定さ
れる。移動台4はアクチュエータ9によりX軸方向に駆
動され、移動台4に固定された摺動部3は案内台2上を
摺動する。移動台4に固定された放熱部6は流体槽5内
の熱伝導率の高い流体に接触させる。流体槽5内の流体
はカバー8により密閉される。カバー8はX軸方向に可
動であり、放熱部6と共に流体槽上を移動する。押しつ
け装置7により、カバー8は放熱部6に押しつけられ、
流体層内5の流体は常に密閉される。
FIG. 1 is a perspective view showing the outline of an embodiment of a positioning device of the present invention. A guide 2 is fixed on the surface plate 1. The moving table 4 is driven in the X-axis direction by the actuator 9, and the sliding portion 3 fixed to the moving table 4 slides on the guide table 2. The heat radiating portion 6 fixed to the moving table 4 is brought into contact with the fluid having high thermal conductivity in the fluid tank 5. The fluid in the fluid tank 5 is sealed by the cover 8. The cover 8 is movable in the X-axis direction and moves together with the heat dissipation unit 6 on the fluid tank. The cover 8 is pressed against the heat dissipation portion 6 by the pressing device 7,
The fluid in the fluid layer 5 is always sealed.

【0009】図2は本発明の位置決め装置における案内
台2の定盤1への固定方法の一実施例を示す断面図であ
る。定盤1と案内台2の間に、水銀,ヘリウムなどの熱
伝導率の高い流体202を、シール材201を用いて封
入する。一般に部材と部材を接触させた場合、両者の真
実接触面積は見かけの接触面積の千分の一程度といわれ
ている。真空中におかれた部材間の伝熱は、わずかな真
実接触部での熱伝導、および部材間の間隙での輻射のみ
となるため、部材間の接触熱抵抗は非常に大きくなる。
そこで、上記のような固定方法を採ることにより、定盤
1と案内台2との接触熱抵抗が低減され、案内台2に摩
擦熱などが供給された場合でも、熱容量が大きく熱的に
安定であり、比較的に温度制御が容易である定盤1への
伝熱が促進される。このため案内台2や移動台(図示せ
ず)などの部材の温度変化が抑制される。
FIG. 2 is a sectional view showing an embodiment of a method of fixing the guide base 2 to the surface plate 1 in the positioning device of the present invention. A fluid 202 having a high thermal conductivity, such as mercury or helium, is enclosed between the surface plate 1 and the guide base 2 by using a sealing material 201. Generally, when members are brought into contact with each other, the true contact area between them is said to be about one thousandth of the apparent contact area. The heat transfer between the members placed in the vacuum is only the heat conduction at a slight real contact portion and the radiation in the gap between the members, so that the contact thermal resistance between the members becomes very large.
Therefore, by adopting the fixing method as described above, the contact thermal resistance between the surface plate 1 and the guide table 2 is reduced, and even when friction heat or the like is supplied to the guide table 2, the heat capacity is large and thermally stable. The heat transfer to the surface plate 1 whose temperature control is relatively easy is promoted. Therefore, the temperature change of members such as the guide table 2 and the moving table (not shown) is suppressed.

【0010】図3は案内台2の定盤1への固定方法の第
二の実施例を示す断面図である。定盤1と案内台2の間
に熱伝導率の高い流体202を、シール材201を用い
て封入する。このとき案内台2に案内台凸部301を設
ける。これにより、シール材201の径とは無関係に流
体202の層を最適な厚さとすることができ、定盤1と
案内台2との接触熱抵抗をさらに低減することができ
る。
FIG. 3 is a sectional view showing a second embodiment of a method of fixing the guide table 2 to the surface plate 1. A fluid 202 having high thermal conductivity is sealed between the surface plate 1 and the guide base 2 by using a sealing material 201. At this time, the guide stand 2 is provided with the guide stand convex portion 301. As a result, the layer of the fluid 202 can have an optimum thickness regardless of the diameter of the sealing material 201, and the contact thermal resistance between the surface plate 1 and the guide base 2 can be further reduced.

【0011】図4は案内台2の定盤1への固定方法の第
三の実施例を示す断面図である。定盤1と案内台2の間
に熱伝導率の高い流体202を、シール材201を用い
て封入する。このとき案内台2に案内台凹凸部401
a,401b,401cを設け、さらに定盤1に定盤凹
凸部402a,402b,402cを設ける。これによ
り、シール材201の径と無関係に流体202の層を最
適な厚さとすることができ、また、流体202を介した
伝熱面積が大きくとれるため、定盤1と案内台2との接
触熱抵抗をさらに低減することができる。なお案内台凹
凸部401及び定盤凹凸部402の形状は、流体202
を介した伝熱面積が大きくとれればよく、さらに多くの
凹凸を設けたり、曲面を用いたりしても良い。
FIG. 4 is a sectional view showing a third embodiment of a method of fixing the guide table 2 to the surface plate 1. A fluid 202 having high thermal conductivity is sealed between the surface plate 1 and the guide base 2 by using a sealing material 201. At this time, the guide board 2 is provided with the guide board uneven portion 401
a, 401b, 401c are provided, and the surface plate 1 is provided with surface plate uneven portions 402a, 402b, 402c. As a result, the layer of the fluid 202 can have an optimum thickness regardless of the diameter of the sealing material 201, and the heat transfer area through the fluid 202 can be large, so that the surface plate 1 and the guide table 2 can be in contact with each other. The thermal resistance can be further reduced. The shapes of the guide table uneven portion 401 and the surface plate uneven portion 402 are the same as those of the fluid 202.
It suffices that a large heat transfer area can be obtained through, and more irregularities may be provided or a curved surface may be used.

【0012】図2,図3及び図4で示した定盤1と案内
台2との固定方法を用いて、他の部材の固定を行っても
良い。例えば、図1において、摺動部3と移動台4との
固定や、移動台4と放熱部6との固定に、同様の方法を
採ることができる。これにより、移動台4に熱が供給さ
れた場合にも、各部の接触熱抵抗が小さいため、定盤1
への伝熱が促進されるため、移動台4の温度変化を抑制
することができる。
Other members may be fixed by using the method of fixing the surface plate 1 and the guide base 2 shown in FIGS. 2, 3 and 4. For example, in FIG. 1, the same method can be used for fixing the sliding unit 3 and the moving table 4 or fixing the moving table 4 and the heat radiating unit 6. As a result, even when heat is supplied to the moving table 4, the contact thermal resistance of each part is small, so that the surface plate 1
Since heat transfer to the moving table 4 is promoted, it is possible to suppress the temperature change of the moving table 4.

【0013】図5は本発明の位置決め装置における摺動
部の一実施例を示す断面図である。摺動部6として、粘
性減衰効果と弾性支持機能とを合わせ持つ、図5のよう
な構造の粘弾性案内が知られている。摺動材504が張
り付けられた摺動部6は、案内台2上をX軸方向に摺動
する。移動台4を停止させる際には、弾性ヒンジ502に
より、移動台4は案内台2に対してX軸方向について弾
性的に支持される。一方、Oリング501により封入さ
れた粘性流体503のスクイズ効果により、移動台4は
減衰力を受ける構造となっている。本発明では粘性流体
503として水銀などの熱伝導率の高いものを用いる。
これにより、移動台4から案内台2への摺動部6を介し
ての熱抵抗が低減される。
FIG. 5 is a sectional view showing an embodiment of a sliding portion in the positioning device of the present invention. As the sliding portion 6, a viscoelastic guide having a structure as shown in FIG. 5 that has both a viscous damping effect and an elastic supporting function is known. The sliding portion 6 to which the sliding member 504 is attached slides on the guide base 2 in the X-axis direction. When the movable table 4 is stopped, the movable table 4 is elastically supported by the elastic hinge 502 in the X-axis direction with respect to the guide table 2. On the other hand, due to the squeeze effect of the viscous fluid 503 enclosed by the O-ring 501, the moving table 4 is structured to receive a damping force. In the present invention, a viscous fluid 503 having a high thermal conductivity such as mercury is used.
Thereby, the thermal resistance from the moving table 4 to the guide table 2 via the sliding portion 6 is reduced.

【0014】図6は本発明の位置決め装置における放熱
部の一実施例を示す断面図である。定盤1には流体槽5
が設けられ、熱伝導率の高い流体602が、シール材6
01により封入される。移動台4に固定された放熱部6
は流体602に接触させる。これにより、移動台4から
定盤1への放熱部6を介しての伝熱が促され、移動台4
の温度変化が抑制される。
FIG. 6 is a sectional view showing an embodiment of a heat radiating section in the positioning device of the present invention. Fluid tank 5 on surface plate 1
And a fluid 602 having a high thermal conductivity is provided to the sealing material 6
It is enclosed by 01. Heat dissipation part 6 fixed to the moving table 4
Contacts the fluid 602. As a result, heat transfer from the moving table 4 to the surface plate 1 via the heat radiating portion 6 is promoted, and the moving table 4
Temperature change is suppressed.

【0015】図7は本発明の位置決め装置におけるカバ
ーの一実施例を示す斜視図である。放熱部6は移動台
(図示せず)と共にX軸方向に移動する。このときカバ
ー8a,8bには外力Fが加えられ、常に放熱部6に押
しつけられるため、定盤1に設けられた流体槽5内の流
体は常時密閉される。
FIG. 7 is a perspective view showing an embodiment of a cover in the positioning device of the present invention. The heat dissipation part 6 moves in the X-axis direction together with a moving table (not shown). At this time, an external force F is applied to the covers 8a and 8b and is constantly pressed against the heat radiating portion 6, so that the fluid in the fluid tank 5 provided on the surface plate 1 is constantly sealed.

【0016】図8は本発明の位置決め装置における押し
つけ装置の一実施例を示す平面図である。カバー8a,
8bの端部には、X軸方向に伸縮可能な伸縮管801
a,801bをとりつける。伸縮管801a,801b
は管802に接続され、内部に閉じた空間が作られる。
伸縮管801a,801b及び管802の内部には、雰
囲気よりも圧力の高い流体を封入する。これにより、カ
バー8a,8bの端部には常に押しつけ力Fが作用し、
放熱部6がどの位置にあっても、カバー8a,8bは放
熱部6に押しつけられているため、流体槽(図示せず)
内の流体の密閉状態が保たれる。よって位置決め装置が
真空中に置かれる場合でも、流体の飛散を防止し、流体
槽を設けることができる。
FIG. 8 is a plan view showing an embodiment of a pressing device in the positioning device of the present invention. Cover 8a,
A telescopic tube 801 capable of expanding and contracting in the X-axis direction is provided at the end of 8b.
Attach a and 801b. Telescopic tubes 801a, 801b
Is connected to a tube 802, which creates a closed space inside.
A fluid having a higher pressure than the atmosphere is sealed inside the expansion tubes 801a and 801b and the tube 802. As a result, the pressing force F always acts on the ends of the covers 8a and 8b,
Since the covers 8a and 8b are pressed against the heat dissipation part 6 regardless of the position of the heat dissipation part 6, a fluid tank (not shown)
The sealed state of the fluid inside is maintained. Therefore, even when the positioning device is placed in a vacuum, the fluid can be prevented from scattering and the fluid tank can be provided.

【0017】なお、以上では、X軸方向にのみ移動可能
な位置決め装置の実施例について述べたが、図1におい
て、移動台4の上に、他の軸方向にも移動可能な部材を
積み重ねることにより、空間6自由度の位置決め装置が
得られる。移動台4の上に積み重ねる部材について、図
2から図8で示した構造を応用しても良い。
In the above, the embodiment of the positioning device movable only in the X-axis direction has been described, but in FIG. 1, members movable in other axial directions are stacked on the moving base 4. Thereby, a positioning device having space 6 degrees of freedom is obtained. The structure shown in FIGS. 2 to 8 may be applied to the members stacked on the moving table 4.

【0018】図9は本発明の縮小投影露光装置の一実施
例を示す斜視図である。照明系901より発せられる光
は、回路パターンの描かれたレチクル902を通過し、
縮小レンズ903により縮小され、本発明の位置決め装
置904上に搭載された、ウエハ905上に、回路パタ
ーンの像を結ぶ。本縮小投影露光装置によれば、ウエハ
905に照射される露光による発熱,位置決め装置90
4内のアクチュエータからの発熱や摩擦熱などの影響に
よる、位置決め装置904の構成部材やウエハ905の
温度変化が小さく、熱変形が抑制されるため、回路パタ
ーンとウエハ905との高精度な位置合わせを行うこと
ができる。
FIG. 9 is a perspective view showing an embodiment of the reduction projection exposure apparatus of the present invention. The light emitted from the illumination system 901 passes through the reticle 902 on which a circuit pattern is drawn,
An image of the circuit pattern is formed on the wafer 905 which is reduced by the reduction lens 903 and mounted on the positioning device 904 of the present invention. According to the reduction projection exposure apparatus, the heat generation and positioning apparatus 90 by the exposure of the wafer 905 is exposed.
Since the temperature change of the constituent members of the positioning device 904 and the wafer 905 due to the influence of heat generated from the actuator in 4 and frictional heat is small and thermal deformation is suppressed, highly accurate alignment between the circuit pattern and the wafer 905 can be achieved. It can be performed.

【0019】図10は本発明のX線露光装置の一実施例
を示す斜視図である。X線源1001より発せられるX線
は、X線照明系1002を経て、回路パターンの描かれ
たマスク1003で反射し、結像系1004で縮小さ
れ、本発明の位置決め装置1005上に搭載された、ウエハ
1006上に、回路パターンの像を結ぶ。本X線露光装
置によれば、ウエハ1006に照射される露光による発
熱,位置決め装置1005内のアクチュエータからの発
熱や摩擦熱などの影響による位置決め装置1005の構
成部材やウエハ1006の温度変化が小さく、熱変形が
抑制されるため、回路パターンとウエハ1006との高
精度な位置合わせを行うことができる。
FIG. 10 is a perspective view showing an embodiment of the X-ray exposure apparatus of the present invention. The X-ray emitted from the X-ray source 1001 passes through the X-ray illumination system 1002, is reflected by the mask 1003 on which the circuit pattern is drawn, is reduced by the image forming system 1004, and is mounted on the positioning device 1005 of the present invention. An image of the circuit pattern is formed on the wafer 1006. According to the X-ray exposure apparatus, the temperature change of the components of the positioning apparatus 1005 and the wafer 1006 due to the heat generated by the exposure of the wafer 1006, the heat generated from the actuator in the positioning apparatus 1005, the frictional heat, and the like are small, Since the thermal deformation is suppressed, the circuit pattern and the wafer 1006 can be aligned with high accuracy.

【0020】図11は本発明の電子線描画装置の一実施
例を示す斜視図である。電子銃1101から発射された電子
線は、ビーム径可変光学系1102,ブランキング系11
03を通過し、収束偏光系1104等により偏向され、本
発明の位置決め装置1105上に搭載された、ウエハ1
106上に照射される。本電子線描画装置によれば、ウ
エハ1106に照射される電子線による発熱,位置決め
装置1105内のアクチュエータからの発熱や摩擦熱な
どの影響による、位置決め装置1105の構成部材やウ
エハ1106の温度変化が小さく、熱変形が抑制される
ため、回路パターンとウエハ1106との高精度な位置
合わせを行うことができる。
FIG. 11 is a perspective view showing an embodiment of the electron beam drawing apparatus of the present invention. The electron beam emitted from the electron gun 1101 is a beam diameter variable optical system 1102 and a blanking system 11
The wafer 1 that has passed through 03, is deflected by the converging polarization system 1104, and is mounted on the positioning device 1105 of the present invention.
106 is illuminated. According to the present electron beam drawing apparatus, the temperature change of the constituent members of the positioning device 1105 and the wafer 1106 due to the effects of heat generated by the electron beam applied to the wafer 1106, heat generated from the actuator in the positioning device 1105, frictional heat, and the like. Since it is small and thermal deformation is suppressed, highly accurate alignment between the circuit pattern and the wafer 1106 can be performed.

【0021】[0021]

【発明の効果】機構部材間の熱抵抗を低減し、熱容量が
大きいため熱的に安定であり、かつ熱交換媒体の配管等
の設置による温度制御が比較的容易である定盤への伝熱
を促進することにより、部材の温度変化が小さい位置決
め装置が得られる。
EFFECTS OF THE INVENTION Heat transfer to a surface plate, which reduces thermal resistance between mechanical members and is thermally stable due to its large heat capacity, and whose temperature control is relatively easy by installing a heat exchange medium pipe or the like. By accelerating the above, it is possible to obtain the positioning device in which the temperature change of the member is small.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の位置決め装置の一実施例の斜視図。FIG. 1 is a perspective view of an embodiment of a positioning device of the present invention.

【図2】本発明の位置決め装置における案内台の定盤へ
の固定方法の一実施例を説明するための断面図。
FIG. 2 is a cross-sectional view for explaining an example of a method of fixing the guide table to the surface plate in the positioning device of the present invention.

【図3】本発明の位置決め装置における案内台の定盤へ
の固定方法の第二の実施例を説明するための断面図。
FIG. 3 is a cross-sectional view for explaining a second embodiment of a method of fixing the guide table to the surface plate in the positioning device of the present invention.

【図4】本発明の位置決め装置における案内台の定盤へ
の固定方法の第三の実施例を説明するための断面図。
FIG. 4 is a cross-sectional view for explaining a third embodiment of a method of fixing the guide table to the surface plate in the positioning device of the present invention.

【図5】本発明の位置決め装置における摺動部の一実施
例の断面図。
FIG. 5 is a cross-sectional view of an example of a sliding portion in the positioning device of the present invention.

【図6】本発明の位置決め装置における放熱部の一実施
例の断面図。
FIG. 6 is a cross-sectional view of an embodiment of a heat radiating portion in the positioning device of the present invention.

【図7】本発明の位置決め装置におけるカバーの一実施
例の斜視図。
FIG. 7 is a perspective view of an embodiment of a cover in the positioning device of the present invention.

【図8】本発明の位置決め装置における押しつけ装置の
一実施例の平面図。
FIG. 8 is a plan view of an embodiment of a pressing device in the positioning device of the present invention.

【図9】本発明の縮小投影露光装置の一実施例の斜視
図。
FIG. 9 is a perspective view of an embodiment of a reduction projection exposure apparatus of the present invention.

【図10】本発明のX線露光装置の一実施例の斜視図。FIG. 10 is a perspective view of an example of the X-ray exposure apparatus of the present invention.

【図11】本発明の電子線描画装置の一実施例の斜視
図。
FIG. 11 is a perspective view of an embodiment of the electron beam drawing apparatus of the present invention.

【図12】従来の位置決め装置の説明図。FIG. 12 is an explanatory diagram of a conventional positioning device.

【符号の説明】[Explanation of symbols]

1…定盤、2a,2b…案内台、3a,3b…摺動部、
4…移動台、5…流体槽、6…放熱部、7a,7b…押
しつけ装置、8a,8b…カバー、9…アクチュエー
タ。
1 ... Surface plate, 2a, 2b ... Guide stand, 3a, 3b ... Sliding part,
4 ... moving table, 5 ... fluid tank, 6 ... radiating section, 7a, 7b ... pressing device, 8a, 8b ... cover, 9 ... actuator.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】位置決め機構系を構成する部材間の接触部
に熱伝導率の高い流体を封入することを特徴とする位置
決め装置。
1. A positioning device, characterized in that a fluid having a high thermal conductivity is sealed in a contact portion between members constituting a positioning mechanism system.
JP5239370A 1993-09-27 1993-09-27 Positioning device Pending JPH0794402A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5239370A JPH0794402A (en) 1993-09-27 1993-09-27 Positioning device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5239370A JPH0794402A (en) 1993-09-27 1993-09-27 Positioning device

Publications (1)

Publication Number Publication Date
JPH0794402A true JPH0794402A (en) 1995-04-07

Family

ID=17043765

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5239370A Pending JPH0794402A (en) 1993-09-27 1993-09-27 Positioning device

Country Status (1)

Country Link
JP (1) JPH0794402A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2014208634A1 (en) * 2013-06-28 2017-02-23 株式会社ニコン MOBILE DEVICE, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2014208634A1 (en) * 2013-06-28 2017-02-23 株式会社ニコン MOBILE DEVICE, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
US10048598B2 (en) 2013-06-28 2018-08-14 Nikon Corporation Movable body apparatus, exposure apparatus, and device manufacturing method
US10353300B2 (en) 2013-06-28 2019-07-16 Nikon Corporation Movable body apparatus, exposure apparatus, and device manufacturing method
US10788760B2 (en) 2013-06-28 2020-09-29 Nikon Corporation Movable body apparatus, exposure apparatus, and device manufacturing method
US11181832B2 (en) 2013-06-28 2021-11-23 Nikon Corporation Movable body apparatus, exposure apparatus, and device manufacturing method

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