JPH0766851B2 - I / O pin repair method - Google Patents

I / O pin repair method

Info

Publication number
JPH0766851B2
JPH0766851B2 JP18115789A JP18115789A JPH0766851B2 JP H0766851 B2 JPH0766851 B2 JP H0766851B2 JP 18115789 A JP18115789 A JP 18115789A JP 18115789 A JP18115789 A JP 18115789A JP H0766851 B2 JPH0766851 B2 JP H0766851B2
Authority
JP
Japan
Prior art keywords
pin
repair
substrate
repairing
ceramic substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP18115789A
Other languages
Japanese (ja)
Other versions
JPH0346780A (en
Inventor
清 ▲桑▼原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18115789A priority Critical patent/JPH0766851B2/en
Publication of JPH0346780A publication Critical patent/JPH0346780A/en
Publication of JPH0766851B2 publication Critical patent/JPH0766851B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Manufacturing Of Electrical Connectors (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Description

【発明の詳細な説明】 〔概 要〕 セラミック基板上に配置されたI/Oピンの修復を行う際
に適用されるI/Oピンの修復方法に関し、 I/Oピンの修復を効率的に実行し得る修復方法の提供を
目的とし、 I/Oピンの配設ピッチ対応に設けられた少なくとも3個
のI/Oピン挿通孔を装備してなる修復用基板と、前記I/O
ピン挿通孔内にほぼ嵌合状態で係入する修復ピンとによ
ってI/Oピン修復用の部材を構成し、前記I/Oピン挿通孔
中の一つに前記修復ピンを実装した修復用基板を、当該
修復ピンが前記修復対象I/Oピンの除去跡に位置する形
で,かつ修復を必要としない前記I/Oピンがこの修復用
基板の他のI/Oピン挿通孔内に係入する形でセラミック
基板に実装してI/Oピンの修復を行う構成を特徴とす
る。
DETAILED DESCRIPTION OF THE INVENTION [Outline] A method of repairing an I / O pin that is applied when repairing an I / O pin arranged on a ceramic substrate. A repair substrate provided with at least three I / O pin insertion holes provided corresponding to the arrangement pitch of I / O pins for the purpose of providing a viable repair method, and the I / O.
A member for repairing an I / O pin is configured by a repair pin that is fitted into the pin insertion hole in a substantially fitted state, and a repair substrate having the repair pin mounted in one of the I / O pin insertion holes is provided. , The repair pin is located at the removal mark of the I / O pin to be repaired, and the I / O pin that does not require repair is inserted into another I / O pin insertion hole of the repair substrate. The feature is that the I / O pins are repaired by mounting them on a ceramic substrate in the form of

〔産業上の利用分野〕[Industrial application field]

本発明はセラミック基板上に配置されたI/Oピンの修復
を行う際に適用されるI/Oピンの修復方法に関する。
The present invention relates to a method of repairing I / O pins applied when repairing I / O pins arranged on a ceramic substrate.

〔従来の技術〕[Conventional technology]

第3図(a)と(b)はセラミック基板の構造を示す要
部斜視図と要部側断面図である。
FIGS. 3 (a) and 3 (b) are a perspective view and a side sectional view of the main part showing the structure of the ceramic substrate.

第3図(a)と(b)に示すように、セラミック基板20
には互いに基準ピッチPを隔てて基準パッド18が設けら
れ、それら各基準パッド18上には信号入出力用,或いは
電源供給用のI/Oピン1がそれぞれ一本宛直立状態で配
置されている。これらI/Oピン1は、高温ろう材(電子
部品の実装に用いる半田よりも溶融温度の高い半田)を
用いて各基準パッド18にろう付け(半田付け)されてい
る。図中、21は基準パッド18と内層配線22を電気的に接
続するビアである。
As shown in FIGS. 3A and 3B, the ceramic substrate 20
Are provided with reference pads 18 at a reference pitch P from each other, and I / O pins 1 for signal input / output or power supply are arranged on each of the reference pads 18 in an upright state. There is. These I / O pins 1 are brazed (soldered) to the respective reference pads 18 using a high temperature brazing material (solder having a higher melting temperature than the solder used for mounting electronic components). In the figure, 21 is a via for electrically connecting the reference pad 18 and the inner layer wiring 22.

これらI/Oピン1は通常の状態で使用されている場合は
特に問題はないが、これに対して大きな外力が作用した
りするとその衝撃によって損傷する場合がある。このI/
Oピン1が損傷すると当然これを修復することになるが
その時に下記の問題点が生じる。
These I / O pins 1 are not particularly problematic when they are used in a normal state, but if a large external force acts on them, they may be damaged by the impact. This I /
Of course, if the O-pin 1 is damaged, it will be repaired, but at that time, the following problems occur.

〔発明が解決しようとする課題〕[Problems to be Solved by the Invention]

即ち前記I/Oピン1の損傷が単なる折損であったり,基
準パッド18からの剥離である場合は、別のI/Oピン1を
準備してこれを基準パッド18に再度半田付けすれば良い
(この場合でもセラミック基板20を局部的に加熱するこ
とになるので品質的に好ましくないことはいうまでもな
い)。
That is, if the damage to the I / O pin 1 is mere breakage or peeling from the reference pad 18, another I / O pin 1 may be prepared and re-soldered to the reference pad 18. (Even in this case, it goes without saying that the ceramic substrate 20 is locally heated, which is not preferable in terms of quality).

しかしながら、当該I/Oピン1の損傷が、例えば第4図
に示すように、I/Oピン1と基準パッド18が同時にセラ
ミック基板20から剥離してしまった場合等は、これを接
着剤を用いてセラミック基板20に接着すると共に、その
基準パッド18に修復用のワイヤ(以下修復ワイヤと呼
ぶ)6を接続(この修復ワイヤ6は修復対象I/Oピン1
対応に設けられているビア21および内層配線22と図示以
外の個所で接続されている)して修復を行っていた。し
かし、基準パッド18諸共にセラミック基板20から離脱し
たこのI/Oピン1を元の位置に正しく位置決めすること
は技術的に不可能であるため、実質的にこの場合は修復
が不可能とされていた。
However, when the damage to the I / O pin 1 is caused by the I / O pin 1 and the reference pad 18 being simultaneously peeled off from the ceramic substrate 20 as shown in FIG. It is adhered to the ceramic substrate 20 by using it and a repairing wire (hereinafter referred to as a repairing wire) 6 is connected to the reference pad 18 thereof (this repairing wire 6 is the I / O pin 1 to be repaired).
(Corresponding vias 21 and inner layer wirings 22 provided correspondingly are connected at locations other than those shown) for repairing. However, it is technically impossible to correctly position the I / O pin 1 that has been separated from the ceramic substrate 20 in the reference pads 18 from each other. Was there.

本発明は、第4図に示すような故障が発生した場合にこ
れを効果的に修復できる方法を提供するものである。
The present invention provides a method for effectively repairing a failure such as that shown in FIG.

〔課題を解決するための手段〕[Means for Solving the Problems]

本発明によるI/Oピンの修復方法(以下ピン修復方法と
呼ぶ)は、第1図と第2図に示すように、I/Oピン1の
配設ピッチP対応に設けられた少なくとも3個のI/Oピ
ン挿通孔8を装備してなる修復用基板10と、前記I/Oピ
ン挿通孔8内にほぼ嵌合状態で係入する修復ピン5とに
よってI/Oピン修復用部材を構成し、前記I/Oピン挿通孔
8中の一つに修復対象I/Oピン1に代わる前記修復ピン
5を実装した修復用基板10を、当該修復ピン5が前記修
復対象I/Oピン1の除去跡に位置する形で,かつ修復を
必要としない前記I/Oピン1がこの修復用基板10の他のI
/Oピン挿通孔8内に係入する形でこの修復用基板10をセ
ラミック基板20に実装してピンの修復を行う構成になっ
ている。
As shown in FIGS. 1 and 2, an I / O pin restoration method according to the present invention (hereinafter referred to as “pin restoration method”) has at least three I / O pins 1 corresponding to the arrangement pitch P of the I / O pins 1. The repair substrate 10 having the I / O pin insertion hole 8 and the repair pin 5 inserted into the I / O pin insertion hole 8 in a substantially fitted state form an I / O pin repair member. A repair substrate 10 having the repair pin 5 in place of the I / O pin 1 to be repaired is mounted in one of the I / O pin insertion holes 8, and the repair pin 5 is used to repair the I / O pin to be repaired. The I / O pin 1 which is located at the removal trace of No. 1 and does not require repair is the other I of the repair substrate 10.
The repairing substrate 10 is mounted on the ceramic substrate 20 so as to be inserted into the / O pin insertion hole 8 to repair the pins.

〔作 用〕[Work]

本発明によるピン修復方法は、修復対象I/Oピン1に代
わる修復ピン5を装備した修復用基板10をセラミック基
板20に実装することによって,即ち実質的に修復対象I/
Oピン1と修復ピン5を取り替えることによってI/Oピン
の修復を行う構成になっており、かつこの修復ピン5の
位置決め手段として正常なI/Oピン1をガイドとして利
用する構成になっていることから、修復ピン5の位置決
め精度を著しく高めることができる。
The pin repairing method according to the present invention comprises mounting the repairing substrate 10 equipped with the repairing pin 5 in place of the I / O pin 1 to be repaired on the ceramic substrate 20, that is, the I / O pin to be repaired substantially.
The I / O pin is repaired by replacing the O pin 1 with the repair pin 5, and the normal I / O pin 1 is used as a guide for positioning the repair pin 5. Therefore, the positioning accuracy of the repair pin 5 can be significantly improved.

〔実 施 例〕〔Example〕

以下実施例図に基づいて本発明を詳細に説明する。 The present invention will be described in detail below with reference to the accompanying drawings.

第1図(a)と(b)は本発明に用いる修復用基板の一
構造例を示す模式的斜視図とそのA−A線断面図、第2
図(a)と(b)と(c)は本発明の一実施例を示す要
部側断面図であるが、前記第3図,第4図と同一部分に
は同一符号を付している。
FIGS. 1 (a) and 1 (b) are a schematic perspective view showing a structural example of a repair substrate used in the present invention and a cross-sectional view taken along line AA, and FIG.
FIGS. (A), (b) and (c) are side sectional views of the essential part showing one embodiment of the present invention, in which the same parts as those in FIGS. 3 and 4 are designated by the same reference numerals. .

第1図(a)と(b)に示すように、修復用基板10は、
例えばセラミック等で構成され、互いに基準ピッチPを
隔てて設けられた3個のI/Oピン挿通孔8と、該I/Oピン
挿通孔8の周辺部分に形成されたメタライズパッド15と
ボンディングパッド11を装備している。なお、これらメ
タライズパッド15およびボンディングパッド11の寸法或
いは形状については設計段階できめられるので特定しな
い。
As shown in FIGS. 1A and 1B, the repair substrate 10 is
For example, three I / O pin insertion holes 8 made of ceramic or the like and provided at a reference pitch P from each other, and a metallized pad 15 and a bonding pad formed in the peripheral portion of the I / O pin insertion hole 8. Equipped with 11. The size or shape of the metallized pad 15 and the bonding pad 11 will not be specified because they can be determined at the design stage.

以下、第2図(a)と(b)と(c)を用いて本発明の
実施例を工程順序に従って説明する。なお、この実施例
は、I/Oピンが前記第4図に示すような状態になった場
合を対象としている。
An embodiment of the present invention will be described below in the order of steps with reference to FIGS. 2 (a), 2 (b) and 2 (c). This embodiment is intended for the case where the I / O pin is in the state shown in FIG.

(1).第1工程〔第2図(a)参照〕 この工程は脱落したI/Oピン1の跡に例えばセラミック
材と接着材を混合した絶縁体7を埋め込む工程であっ
て、絶縁体7の表面はセラミック基板20の面と同一平面
になるように仕上げられる。
(1). First Step [Refer to FIG. 2 (a)] This step is a step of embedding an insulator 7 in which, for example, a ceramic material and an adhesive material are mixed in the mark of the dropped I / O pin 1, and the surface of the insulator 7 is It is finished so as to be flush with the surface of the ceramic substrate 20.

(2).第2工程〔第2図(b)参照〕 この工程は前記第1図に示した修復用基板10に修復ピン
5を実装する工程である。この工程では第2図(b)に
示すように修復ピン5がピン挿通孔8の中の中央のピン
挿通孔8内に嵌合状態で挿入され、その後半田40を用い
てメタライズパッド15に半田付けされる。この時の修復
ピン5とその両側に設けられているI/Oピン挿通孔8と
の間隔はそれぞれ基準ピッチPとなる。
(2). Second Step [See FIG. 2 (b)] This step is a step of mounting the repair pin 5 on the repair substrate 10 shown in FIG. In this step, as shown in FIG. 2B, the repair pin 5 is inserted into the pin insertion hole 8 at the center of the pin insertion hole 8 in a fitted state, and then the solder 40 is used to solder the metallized pad 15 to the metallized pad 15. Attached. At this time, the distance between the restoration pin 5 and the I / O pin insertion holes 8 provided on both sides of the restoration pin 5 is the reference pitch P.

(3).第3工程〔第2図(c)参照〕 この工程は修復ピン5の実装が終わった修復用基板10
を、修復対象I/Oピン1の跡にこの修復ピン5が位置す
るようにセラミック基板20に取りつける工程であって、
この時,セラミック基板20側の2本のI/Oピン1は修復
用基板10側のI/Oピン挿通孔8内にそれぞれ嵌合状態で
係入される。この操作が終わるとセラミック基板20側の
I/Oピン1は修復用基板10側に設けられたメタライズパ
ッド15に半田40を用いてそれぞれ半田付けされる。
(3). Third step [see FIG. 2 (c)] In this step, the repair substrate 10 on which the repair pins 5 are mounted is finished.
Is attached to the ceramic substrate 20 so that the repair pin 5 is located at the mark of the I / O pin 1 to be repaired,
At this time, the two I / O pins 1 on the ceramic substrate 20 side are fitted into the I / O pin insertion holes 8 on the restoration substrate 10 side in a fitted state. After this operation, the ceramic substrate 20 side
The I / O pins 1 are soldered to the metallized pads 15 provided on the repair substrate 10 side using solder 40, respectively.

このようにしてI/Oピン1の修復作業が終わると、今度
は修復ピン5が実装されているボンディングパッド11に
修復ワイヤ6が接続される。
When the repair work of the I / O pin 1 is completed in this way, the repair wire 6 is connected to the bonding pad 11 on which the repair pin 5 is mounted.

本発明によるピン修復方法は、修復対象I/Oピンの両側
に配置されている正常なI/Oピン1を位置決め用のガイ
ドにして修復ピン5を装着する構成であることから、修
復ピン5の位置決め精度が従来の方法に比して著しく高
い。
The pin repair method according to the present invention has a configuration in which the normal I / O pins 1 arranged on both sides of the I / O pin to be repaired are used as positioning guides and the repair pin 5 is mounted. The positioning accuracy is extremely higher than that of the conventional method.

〔発明の効果〕〔The invention's effect〕

以上の説明から明らかなように本発明によれば、修復対
象I/Oピンの代替として新たに実装される修復ピン5の
位置的精度を著しく向上させることができ,かつその作
業が著しく容易化されることからI/Oピンの修復作業の
信頼性とその作業効率を大幅に向上し得るといった優れ
た工業的効果がある。
As is apparent from the above description, according to the present invention, the positional accuracy of the repair pin 5 newly mounted as an alternative to the I / O pin to be repaired can be remarkably improved, and its work is remarkably facilitated. Therefore, there is an excellent industrial effect that the reliability of I / O pin repair work and the work efficiency can be greatly improved.

【図面の簡単な説明】 第1図(a)と(b)は本発明に用いる修復用基板の一
構造例を示す模式的斜視図とそのA−A線断面図、 第2図(a)と(b)と(c)は本発明の一実施例を示
す要部側断面図、 第3図(a)と(b)はセラミック基板の構造を示す要
部斜視図と要部側断面図、 第4図はI/Oピンの損傷例を示す一部破断した要部斜視
図である。 図において、1はI/Oピン、 5は修復ピン、 6は修復ワイヤ、 7は絶縁体、 8はI/Oピン連通孔、 10は修復用基板、 11はボンディングパッド、 15はメタライズパッド、 18は基準パッド、 20はセラミック基板、 21はビア、 22は内層配線、 40半田、 をそれぞれ示す。
BRIEF DESCRIPTION OF THE DRAWINGS FIGS. 1 (a) and 1 (b) are schematic perspective views showing a structural example of a repair substrate used in the present invention and a cross-sectional view taken along the line AA, and FIG. 2 (a). 1, (b) and (c) are cross-sectional views of an essential part showing an embodiment of the present invention, and FIGS. 3 (a) and (b) are a perspective view and a cross-sectional view of a main part showing a structure of a ceramic substrate. FIG. 4 is a partially broken perspective view showing an example of damage to the I / O pin. In the figure, 1 is an I / O pin, 5 is a repair pin, 6 is a repair wire, 7 is an insulator, 8 is an I / O pin communication hole, 10 is a repair substrate, 11 is a bonding pad, 15 is a metallized pad, Reference numeral 18 is a reference pad, 20 is a ceramic substrate, 21 is a via, 22 is an inner layer wiring, and 40 is solder.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】セラミック基板(20)上に配置されたI/O
ピン(1)の修復時に適用される方法であって、 I/Oピン(1)の配設ピッチ(P)対応に設けられた少
なくとも3個のI/Oピン挿通孔(8)を装備してなる修
復用基板(10)と、前記I/Oピン挿通孔(8)内にほぼ
嵌合状態で係入する修復ピン(5)とによってI/Oピン
修復用の部材を構成し、 前記I/Oピン挿通孔(8)中の一つに前記修復ピン
(5)を実装した修復用基板(10)を、当該修復ピン
(5)が前記修復対象I/Oピン(1)の除去跡に位置す
る形で,かつ修復を必要としない前記I/Oピン(1)が
この修復用基板(10)の他のI/Oピン挿通孔(8)内に
係入する形でセラミック基板(20)に実装してI/Oピン
(1)の修復を行う構成を特徴とするI/Oピンの修復方
法。
1. An I / O arranged on a ceramic substrate (20).
This is a method applied when repairing the pin (1), and is equipped with at least three I / O pin insertion holes (8) provided corresponding to the arrangement pitch (P) of the I / O pins (1). And a repair substrate (10) and a repair pin (5) which is fitted into the I / O pin insertion hole (8) in a substantially fitted state to form an I / O pin repair member. A repair substrate (10) having the repair pin (5) mounted in one of the I / O pin insertion holes (8) is removed by the repair pin (5) to remove the repair target I / O pin (1). The ceramic substrate in such a manner that it is located in the trace and the I / O pin (1) that does not require repair is inserted into the other I / O pin insertion hole (8) of the repair substrate (10). A method of repairing an I / O pin, characterized by being mounted on (20) to repair the I / O pin (1).
JP18115789A 1989-07-12 1989-07-12 I / O pin repair method Expired - Lifetime JPH0766851B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18115789A JPH0766851B2 (en) 1989-07-12 1989-07-12 I / O pin repair method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18115789A JPH0766851B2 (en) 1989-07-12 1989-07-12 I / O pin repair method

Publications (2)

Publication Number Publication Date
JPH0346780A JPH0346780A (en) 1991-02-28
JPH0766851B2 true JPH0766851B2 (en) 1995-07-19

Family

ID=16095886

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18115789A Expired - Lifetime JPH0766851B2 (en) 1989-07-12 1989-07-12 I / O pin repair method

Country Status (1)

Country Link
JP (1) JPH0766851B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2796394B2 (en) * 1990-01-17 1998-09-10 株式会社日立製作所 Repair connection method for input / output pins
JP2658672B2 (en) * 1991-10-11 1997-09-30 日本電気株式会社 I / O pin repair structure and repair method
JP2007071434A (en) * 2005-09-06 2007-03-22 Tokyo Roki Co Ltd Laminated heat exchanger

Also Published As

Publication number Publication date
JPH0346780A (en) 1991-02-28

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