JPH0760533A - Slitter overlap quantity measuring method and adjusting method - Google Patents

Abstract

PURPOSE:To correctly set overlap quantity of an upper cutting edge with a lower cutting edge of a slitter by measuring a biting width of the upper edge and the lower edge by an optical means, and determining the overlap quantity of the upper edge with the lower edge of the slitter based on a radius of the upper edge and a radius of the lower edge. CONSTITUTION:Parallel light beams are projected horizontally to biting parts of a dummy upper cutting edge 1a and a dummy lower cutting edge 2a by a projector 7, the beams are shielded by the dummy upper edge 1a and the dummy lower edge 2a, and a biting width (a) is detected based on a shielded width. In a computation device, overlap quantity (x) is determined by use of an expression based on the value of the biting width (a), and a radius r1 of the dummy upper edge (equal to a radius of an upper edge 1) and a radius r2 of the dummy lower edge 2a (equal to a radius of a lower edge 2) which are preliminarily inputted. A result is displayed in a display device 10.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for measuring the amount of overlap between an upper blade and a lower blade in a slitter for strip material, and a method for adjusting the amount of overlap using the same.

[0002]

2. Description of the Related Art A slitter rotates a disc-shaped upper blade and a lower blade to cut a strip, but the amount of overlap between the upper blade and the lower blade (biting depth, x in FIG. 1). Has a great influence on the cut shape and residual stress of the strip or the wear life of the blade, so it is important to set an appropriate value according to the thickness and material of the strip.

The amount of overlap between the upper blade and the lower blade is usually adjusted by the operator's intuition and experience, but as an example of using a measuring instrument, the axial distance between the upper blade and the lower blade is set. A method of measuring with a Magnescale is known (Japanese Patent Laid-Open No. 6-68242)
No. 1-20321). This method can directly measure the amount of change in the amount of overlap.To determine the amount of overlap from the measurement of the axial distance, either measure the diameters of the upper and lower blades in advance, or It is necessary to obtain the position of quantity zero accurately in advance.

Measurement of the inter-axis distance L and the diameter of the upper blade 2r ₁ ,
In the method of obtaining the overlap amount x from the measurement of the lower blade diameter 2r ₂ , the overlap amount x is calculated by the following formula.

[0005]

## EQU3 ## x = r ₁ + r ₂ -L

In the so-called "zero-adjustment" for obtaining the position where the overlap amount is zero, one of the upper blade and the lower blade is axially displaced by approximately the thickness of the blade, and the blade edges of the upper blade and the lower blade are brought into contact with each other. By doing.

[0007]

The overlap amount is generally set to a value proportional to the thickness of the strip to be cut. Therefore, when the thickness of the strip becomes thin, it becomes a very small value of 0.1 mm or less, and therefore extremely high accuracy is required for measuring the overlap amount.

However, in the conventional method for obtaining the overlap amount x from the measurement of the inter-axis distance L and the measurement of the diameter 2r _{1 of} the upper blade and the diameter 2r ₂ of the lower blade, as is clear from the formula 3, The measurement error of the diameter of the blade and the lower blade becomes the measurement error of the overlap amount as it is, and in the case of thin plate cutting for which it is necessary to set the overlap amount extremely small, the accuracy is insufficient.

Further, in the method of measuring the distance between the shafts and obtaining the amount of overlap by obtaining the position where the amount of overlap is zero, it is necessary to bring the upper blade and the lower blade into contact with each other for zero alignment. The blade edge may be damaged unless it is carefully and gently touched. Especially with thin-walled blades used for cutting thin plates, there is a high risk of damaging the blade edge, and contact with the blade edge should be avoided as much as possible.

Since the method of obtaining the overlap amount from the measurement of the axial distance has the above problems, it is difficult to accurately obtain the overlap amount. If the amount of overlap is not known accurately, the amount of overlap cannot be set properly and a good cutting state cannot be obtained.

In view of the above problems, an object of the present invention is to provide an overlap amount measuring method capable of accurately measuring the overlap amount of an upper blade and a lower blade, and an overlap amount adjustment using the same. To provide a method.

[0012]

As shown in FIG. 1, the upper blade 1 has a radius r ₁ , the lower blade 2 has a radius r ₂ , and the upper blade 1 and the lower blade 2 have a radius r ₂ .
The overlap amount x can be calculated by the following equation, where the biting width of is a.

[0013]

[Number 4] _{x = r 1 + r 2 -√} (r 1 2 -a 2/4) -√ (r 2 2 -a 2/4)

Therefore, in the overlap amount measuring method of the present invention, the biting width a of the disk-shaped upper blade 1 and the lower blade 2 is measured by optical means, and the biting width a and the radius of the upper blade are measured. r
It is characterized in that the overlap amount x is obtained from Formula 4 from ₁ and the radius r _{2 of the} lower blade.

Further, in the overlap amount adjusting method of the present invention, when adjusting the overlap amount of the upper blade and the lower blade of the slitter, the bite width a of the upper blade and the lower blade is measured by an optical means, From the biting width a, the radius r ₁ of the upper blade, and the radius r _{2 of the} lower blade, the amount of overlap x
Is obtained and the overlap amount is set to an appropriate value while referring to the value.

[0016]

In the method of the present invention, it is also necessary to measure the diameter 2r ₁ of the upper blade and the diameter 2r _{2 of the} lower blade, but r ₁ and r ₂ are sufficiently larger than a and the measurement of r ₁ and r ₂ is performed. The influence of the error on the overlap amount x in Expression 4 is small. For example, when r ₁ = 75 mm, r ₂ = 75 mm, and a = 10 mm are accurate values, r ₁ and r ₂ are erroneously measured 1 mm larger, and r ₁
= 76 mm, r ₂ = 76 mm, and a = 10 mm, the value of x is 0.3 mm, which is the same as in the case of accurate measurement.
On the other hand, in the case of Formula 3, the measurement error is added as it is to be 2.3 mm. Further, in the method of the present invention, since the change in the bite width a with the change in the overlap amount x is large, the measurement of a is easy. Therefore, according to the method of the present invention, it is possible to accurately measure the overlap amount,
Further, this makes it possible to accurately adjust the overlap amount.

[0017]

Embodiments of the present invention will now be described in detail with reference to the drawings. 2 and 3 show an embodiment of the present invention. In the figure, 1 is a disc-shaped upper blade, 1a is a dummy upper blade having the same diameter as the upper blade 1, 2 is a disc-shaped lower blade, 2a is a dummy lower blade having the same diameter as the lower blade 2, and 3 is an upper blade. Spacer ring that determines the interval between the blades 2, 4 is a spacer ring that determines the interval between the lower blades 2,
5 is an upper shaft supporting the upper blade 1, the spacer ring 3 and the dummy upper blade 1a, 6 is a lower shaft supporting the lower blade 2, the spacer ring 4 and the dummy lower blade 2a, 7 and 8 are dummy upper blades 1a and the dummy A light emitter and a light receiver arranged so as to sandwich the biting portion of the lower blade 2a, a computing device 9 for computing the overlap amount of the upper blade 1 and the lower blade 2 from the light receiving state of the light receiver 8, and 10 a display of the computation result. It is a device.

The dummy upper blade 1a and the dummy lower blade 2a are mounted on the extreme ends and are blades for measuring the amount of overlap that do not contribute to the cutting of the strip. The light projector 7 and the light receiver 8 are integrally provided with a mechanism capable of adjusting the vertical position,
By this mechanism, the optical axis can be accurately aligned with the biting portion of the dummy upper blade 1a and the dummy lower blade.

The light receiver 8 is a so-called one-dimensional CCD image sensor in which minute light receiving elements 11 are linearly arranged at minute intervals as shown in FIG. A parallel light beam is projected horizontally from the projector 7 to the biting portions of the dummy upper blade 1a and the dummy lower blade 2a, and the light is emitted from the dummy upper blade 1a and the dummy lower blade 2a.
Since the light is shielded by the
Can be detected. The output of the light receiver 8 is input to the arithmetic unit 9. In the arithmetic unit 9, the value of the bite width a input from the light receiver 8, the radius r ₁ of the dummy upper blade 1a (equal to the radius of the upper blade 1) and the radius r of the dummy lower blade 2a, which are input in advance, are calculated. ₂ (equal to the radius of the lower blade 2), the overlap amount x is calculated by the mathematical formula 4. The result is displayed on the display device 10.

When adjusting the overlap amount, the upper shaft 5 or the lower shaft 6 is moved in the vertical direction while referring to the value displayed on the display device 10 to set the overlap amount to an appropriate value. .

Next, the result of comparison between the method of the above embodiment and the conventional method will be described. The slitter has a diameter of both upper and lower blades of 150 mm and a copper strip with a thickness of 0.1 mm and a width of 30 mm at a rate of 1 per minute.
It is cut at a speed of 50 m. In the conventional method in which the operator visually sets the overlap amount, the average burr of the cut end of the copper strip was 0.02 mm.
The amount of overlap was measured by the method of the above example, and the result of cutting with the amount of overlap set to 0.08 mm was
The burr at the cut end of the copper strip was 0.01 mm or less on average, and improvement in quality was recognized.

Although the amount of overlap between the dummy upper blade 1a and the dummy lower blade 2a is measured in the above embodiment, the upper blade 1 and the lower blade 2a are not provided, and the upper blade 1 and the lower blade 2a are not provided. It is also possible to directly measure the overlap amount of 2. In that case, it is necessary to be able to remove the light projector 7 and the light receiver 8 when cutting the strip. Further, the vertical position adjustment mechanism of the light projector 7 and the light receiver 8 can be interlocked with the vertical position adjustment mechanism of the upper shaft 5 or the lower shaft 6.

The output of the light receiver 8 is continuously detected while moving the light emitter 7 and the light receiver 8 up or down in the vicinity of the biting portion of the dummy upper blade 1a and the dummy lower blade 2a, and the minimum detected output is obtained. The value can be the biting width a. Further, the display device 10 does not display the overlap amount x,
It is also possible to display the bite width a and use it as the control value of the overlap amount x.

Next, another embodiment of the present invention will be described with reference to FIG. In the figure, 1 is an upper blade, 2 is a lower blade, 3 and 4 are spacer rings, 5 is an upper shaft, and 6 is a lower shaft. Here, the dummy upper blade and the dummy lower blade are not used, and the biting portion of the uppermost blade 1 and the lower blade 2 at the end is installed right next to it.
The image is taken by the D camera 12. The CCD camera 12 is a two-dimensional CCD image sensor in which minute light receiving elements are arranged in a plane.

The image signal from the CCD camera 12 is input to the image processing device 13, where the contours of the upper blade 1 and the lower blade 2 are extracted, and the bite width a is calculated. The calculation of the overlap amount x from the bite width a by the equation 4 is the same as in the above embodiment. Calculated overlap amount x
Is displayed on the display device 14.

[0026]

As described above, according to the present invention, since the amount of overlap between the upper and lower blades of the slitter can be accurately measured, the amount of overlap between the upper and lower blades can be set accurately. The cutting quality of the strip can be improved.

[Brief description of drawings]

FIG. 1 is an explanatory diagram showing an overlap amount of an upper blade and a lower blade of a slitter.

FIG. 2 is an explanatory diagram showing an embodiment of an overlap amount measuring method according to the present invention.

FIG. 3 is a view taken along the line P-P in FIG.

FIG. 4 is an explanatory view showing another embodiment of the overlap amount measuring method according to the present invention.

[Explanation of symbols]

 1: Upper blade 1a: Dummy upper blade 2: Lower blade 2a: Dummy lower blade 3, 4: Spacer ring 5: Upper shaft 6: Lower shaft 7: Emitter 8: Light receiver 9: Arithmetic device 10: Display device 11: Light reception Element 12: CCD camera 13: Image processing device 14: Display device

Claims (2)

[Claims] 1. A bite width a of an upper blade and a lower blade of a slitter is measured by an optical means, and from the bite width a, an upper blade radius r ₁ and a lower blade radius r ₂ , A method for measuring the amount of overlap in a slitter, wherein the amount of overlap x is obtained by an equation. [Number 1] _{x = r 1 + r 2 -√} (r 1 2 -a 2/4) -√ (r 2 2 -a 2/4) 2. When adjusting the overlap amount of the upper blade and the lower blade of the slitter, the biting width a of the upper blade and the lower blade is measured by an optical means, and the biting width a and the upper blade Radius r
_{From 1} and the radius r _{2 of the} lower blade, the overlap amount x is calculated by the following formula, and the overlap amount is set to an appropriate value while referring to the value, and a slitter overlap amount adjusting method. . [Number 2] _{x = r 1 + r 2 -√} (r 1 2 -a 2/4) -√ (r 2 2 -a 2/4)