JPH0743369A - Analyzer with liquid level sensor - Google Patents

Analyzer with liquid level sensor

Info

Publication number
JPH0743369A
JPH0743369A JP5185817A JP18581793A JPH0743369A JP H0743369 A JPH0743369 A JP H0743369A JP 5185817 A JP5185817 A JP 5185817A JP 18581793 A JP18581793 A JP 18581793A JP H0743369 A JPH0743369 A JP H0743369A
Authority
JP
Japan
Prior art keywords
probe
liquid
liquid level
dispensing probe
metal pipe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5185817A
Other languages
Japanese (ja)
Inventor
Masahito Ishizawa
雅人 石沢
Toshiaki Yokobayashi
敏昭 横林
Katsuaki Takahashi
克明 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5185817A priority Critical patent/JPH0743369A/en
Publication of JPH0743369A publication Critical patent/JPH0743369A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To ensure detection of liquid level by coating the outer periphery of a dispenser probe, except one end thereof, and the inner/outer peripheries of a metal pipe with insulation coating and sustaining a stabilized insulation resistance between the dispenser probe and an outer peripheral conductor thereby eliminating the influence of disturbing elements. CONSTITUTION:A dispenser probe 8 is coated on the outer periphery, except the forward end thereof, with a dielectric coating material 6 in order to increase the surface resistance and connected with a liquid level detecting substrate. The probe 8 is further covered with an insulating material 7 which is covered with a metal pipe 5 having coated inner and outer peripheries. The metal pipe 5 is grounded and the probe 8 is shielded except the forward end thereof so that it is not susceptible to disturbance noise. Since the outer periphery of the probe 8 and the inner/outer peripheries of the metal pipe 5 are applied with coating 6, insulation resistance between the probe 8 and the metal pipe 5 does not decrease even if the surface resistance of the insulation material 7 decreases due to adhesion of liquid to the entire probe resulting in the stabilized shielding effect.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は液面検出機能を備えた分
注機構を有する分析装置に係わり、特に分注プローブが
液面に接触した時の静電容量の変化から液面を検出する
分析装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an analyzer having a dispensing mechanism having a liquid level detecting function, and more particularly to detecting a liquid level from a change in capacitance when a dispensing probe comes into contact with the liquid level. Regarding analytical equipment.

【0002】[0002]

【従来の技術】本発明に関連する技術、特に本発明を適
用可能な技術として、一本の分注プローブにより液体収
容容器内の静電容量を検出し、液面検出を行う先行技術
としては、特開昭62−218818号および米国特許第4,970,
468 号などが知られている。
2. Description of the Related Art As a technique related to the present invention, particularly a technique to which the present invention can be applied, as a prior art for detecting the liquid level by detecting the capacitance in a liquid container with a single dispensing probe, JP-A-62-218818 and U.S. Pat. No. 4,970,
No. 468 is known.

【0003】[0003]

【発明が解決しようとする課題】上記静電容量式液面セ
ンサに使用される金属製分注プローブは導電部が分注プ
ローブ全体であるため、外周導体により外乱ノイズや浮
遊容量の影響を受けない構成となっているが分注プロー
ブと外周導体間に挿入される絶縁材の表面に付着する汚
れ、あるいは、絶縁材の吸湿等により、分注プローブと
外周導体間の絶縁抵抗が外乱要素により急激に変化する
可能性を有していた。本発明の目的は、分注プローブと
外周導体間の絶縁抵抗を常に安定に保ち、外乱要素の影
響を遮断し容器内液体の液面を確実に検出する分析装置
を提供することにある。
Since the conductive portion of the metal dispensing probe used in the capacitance type liquid level sensor is the entire dispensing probe, it is affected by disturbance noise and stray capacitance by the outer conductor. Although there is no configuration, the insulation resistance between the dispensing probe and the outer conductor may be disturbed by a disturbance element due to dirt adhering to the surface of the insulating material inserted between the dispensing probe and the outer conductor, or moisture absorption of the insulating material. It had the potential to change rapidly. An object of the present invention is to provide an analyzer that constantly maintains the insulation resistance between the dispensing probe and the outer peripheral conductor, blocks the influence of disturbance elements, and reliably detects the liquid level of the liquid in the container.

【0004】[0004]

【課題を解決するための手段】本発明では分注プローブ
の一端を除く外周、及び金属管の内外周を絶縁コーティ
ングする構造とした。
According to the present invention, the outer periphery of the dispensing probe excluding one end and the inner and outer periphery of the metal tube are coated with an insulating coating.

【0005】[0005]

【作用】金属製分注プローブは、外側の金属管により分
注プローブの先端数cm(センチメートル)以外、絶縁材
を介し全て覆われるため分注プローブ−金属管間の絶縁
抵抗は直流的に有限ではあるが、無視することが可能な
くらい大きな抵抗値(一般的にはDC500V印加時1
000MΩ以上の抵抗値)となり、分注プローブ−金属
管間は絶縁状態となる。
[Function] Since the metal dispensing probe is entirely covered by the outer metal tube except the tip of the dispensing probe, which is a few centimeters (cm), through the insulating material, the insulation resistance between the dispensing probe and the metal tube is DC. The resistance value is finite but large enough to be ignored (generally, when DC500V is applied, 1
000 MΩ or more), and the dispensing probe and the metal tube are insulated.

【0006】しかし、本発明を適用しない構成の場合、
プローブ全周に水適,汚れなどが付着すると、プローブ
全周の表面抵抗が低下し、分注プローブ−金属管間の絶
縁抵抗が低下する。
However, in the case of the configuration to which the present invention is not applied,
If water suitability or dirt adheres to the entire circumference of the probe, the surface resistance of the entire circumference of the probe decreases, and the insulation resistance between the dispensing probe and the metal tube decreases.

【0007】本発明によるプローブを用いると、プロー
ブ全周に水適,汚れなどが付着してもプローブ−金属管
間の絶縁抵抗を保ち、金属管による安定したシールド効
果が得られるため、試料容器内の液体の持つ静電容量を
確実に検出し試料容器内の液面を確実に検出することが
可能となる。
When the probe according to the present invention is used, the insulation resistance between the probe and the metal tube is maintained even if water suitability or dirt adheres to the entire circumference of the probe, and a stable shield effect due to the metal tube is obtained. It is possible to reliably detect the electrostatic capacity of the liquid inside and to reliably detect the liquid level in the sample container.

【0008】[0008]

【実施例】本発明の一実施例を図面を参照して説明す
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to the drawings.

【0009】図1は本発明によるセンサ一体型プローブ
10の構造図を示す。
FIG. 1 shows a structural diagram of a sensor-integrated probe 10 according to the present invention.

【0010】分注プローブ8は先端の数mm(ミリメート
ル)以外、絶縁コーティング材6により外周をコーティ
ングされ分注プローブ8の外周の表面抵抗が高められて
いる。
The dispensing probe 8 is coated on its outer periphery with an insulating coating material 6 except the tip of several mm (millimeters) to increase the surface resistance of the outer periphery of the dispensing probe 8.

【0011】又、分注プローブ8は液面検知基板に接続
され、液面検知基板はサンプリング機構1の液面検知動
作を制御する。
Further, the dispensing probe 8 is connected to the liquid level detection substrate, and the liquid level detection substrate controls the liquid level detection operation of the sampling mechanism 1.

【0012】分注プローブ8の外周は絶縁材7で覆わ
れ、絶縁材7の外周は内外周を絶縁コーティング材6で
コーティングされ、内外周の表面抵抗が高められた金属
管5で覆われる。
The outer circumference of the dispensing probe 8 is covered with an insulating material 7, the outer circumference of the insulating material 7 is coated with an insulating coating material 6 on the inner and outer circumferences, and is covered with a metal tube 5 having an increased surface resistance on the inner and outer circumferences.

【0013】又、金属管5はGND(グランド)に接続
され、分注プローブ8の先端の数cm(センチメートル)
以外は金属管5によりシールドされ外乱ノイズや浮遊容
量などの影響を受けない構造となっている。
The metal tube 5 is connected to GND (ground), and the tip of the dispensing probe 8 is several cm (centimeter).
Other than the above, the structure is shielded by the metal tube 5 and is not affected by disturbance noise or stray capacitance.

【0014】図2はセンサ一体型プローブ10の先端を
水,試料,試薬などの液体12に浸漬させた時の外観図
を示す。
FIG. 2 shows an external view when the tip of the sensor-integrated probe 10 is dipped in a liquid 12 such as water, a sample or a reagent.

【0015】プローブ10の外周全体、特に先端部に水
適,汚れ、などが付着した場合、本発明による分注プロ
ーブ8では、分注プローブ8の外周、及び、金属管5の
内外周は絶縁コーティング材6でコーティングされてい
るため、液体12付着により絶縁材7の表面抵抗が低下
しても分注プローブ8−金属管5間の絶縁抵抗は低下す
る事が無い。
When the entire outer circumference of the probe 10, particularly the tip portion, is suitable for water, dirt, etc., the outer circumference of the dispensing probe 8 and the inner and outer circumferences of the metal tube 5 are insulated in the dispensing probe 8 according to the present invention. Since it is coated with the coating material 6, the insulation resistance between the dispensing probe 8 and the metal tube 5 does not decrease even if the surface resistance of the insulation material 7 decreases due to the adhesion of the liquid 12.

【0016】分注プローブ8の外周、及び、金属管5の
内外周が絶縁コーティング材6でコーティングされてい
ない場合は液体12の付着により絶縁材7の表面抵抗が
低下し、分注プローブ8−金属管5間の絶縁抵抗が急激
に低下する可能性を有している。
When the outer circumference of the dispensing probe 8 and the inner and outer circumferences of the metal tube 5 are not coated with the insulating coating material 6, the surface resistance of the insulating material 7 is lowered due to the adhesion of the liquid 12, and the dispensing probe 8- There is a possibility that the insulation resistance between the metal tubes 5 will drop sharply.

【0017】図3は本発明を適用した自動分析装置の分
注機構概略構成図を示す。
FIG. 3 is a schematic diagram of the dispensing mechanism of the automatic analyzer to which the present invention is applied.

【0018】サンプリング機構1のサンプリングアーム
2は上下,回転しサンプリングアーム2に取り付けられ
たプローブ10により、サンプルディスク9に配置され
た試料容器3内の試料4の液面を検出し、かつ吸引吐出
動作を行う。
The sampling arm 2 of the sampling mechanism 1 rotates up and down, and the probe 10 attached to the sampling arm 2 detects the liquid level of the sample 4 in the sample container 3 placed on the sample disk 9 and sucks and discharges it. Take action.

【0019】図4は分注プローブ−金属管間の絶縁抵抗
特性測定時の構成図を示す。
FIG. 4 is a configuration diagram when measuring the insulation resistance characteristic between the dispensing probe and the metal tube.

【0020】図4は試料容器3として試験管11を使用
し、試験管11の内壁が試料4により濡れており、か
つ、試験管11内の湿度が高い状態でプローブ10が試
験管11内を下降した場合の分注プローブ8−金属管5
間の絶縁抵抗変動量の測定図を示す。
In FIG. 4, the test tube 11 is used as the sample container 3, the inner wall of the test tube 11 is wet by the sample 4, and the probe 10 moves inside the test tube 11 in a high humidity state. Dispensing probe 8-metal tube 5 when descending
The measurement figure of the amount of insulation resistance fluctuations between is shown.

【0021】プローブ10が下降し、分注プローブ8の
先端が試験管11の上部を通過する位置をx3 、プロー
ブ10が更に下降し、分注プローブ8の先端が試験管1
1の内壁が濡れている部分を通過する位置をx2 、プロ
ーブ10が更に下降し分注プローブ8の先端が試験管1
1内の試料4に接触した位置をx1 とする。
When the probe 10 descends and the tip of the dispensing probe 8 passes the upper part of the test tube 11 at x 3 , the probe 10 further descends, and the tip of the dispensing probe 8 becomes the test tube 1.
The position where the inner wall of 1 passes through the wet part is x 2 , the probe 10 further descends, and the tip of the dispensing probe 8 becomes the test tube 1
The position within 1 in contact with the sample 4 is x 1 .

【0022】図5はR(分注プローブ−金属管間の絶縁
抵抗)−X(分注プローブ先端−容器下部間の距離)特
性を示す。
FIG. 5 shows the characteristics of R (insulation resistance between dispensing probe and metal tube) -X (distance between dispensing probe tip and lower part of container).

【0023】プローブ10の外周全体に水滴,酸化膜な
どの汚れが付着していた場合、プローブ10の外周に付
着していた汚れが、試験管11内の雰囲気の影響を受
け、分注プローブ8−金属管5間の絶縁抵抗は分注プロ
ーブ8の先端位置がx3,x2,x1 と試験管11の下部
になるにつれて、絶縁抵抗は減少していく。
If water droplets, oxide film, or other dirt is attached to the entire outer circumference of the probe 10, the dirt attached to the outer circumference of the probe 10 is affected by the atmosphere in the test tube 11 and the dispensing probe 8 is used. The insulation resistance between the metal tubes 5 decreases as the tip position of the dispensing probe 8 becomes x 3 , x 2 , x 1 and the lower part of the test tube 11.

【0024】本発明によるプローブ10にも、同様に外
周全体に水滴,酸化膜などの汚れを付着させ、試験管1
1内に下降させた場合、外周に付着した汚れが試験管1
1内の雰囲気の影響を受け、プローブ10外周全体の表
面抵抗を低下させても、分注プローブ8−金属管5間の
絶縁は絶縁コーティング材6により、確実に保たれてい
るため、周囲の外乱の影響を受けることなく、分注プロ
ーブ8−金属管5間の絶縁抵抗は常に一定の抵抗値を保
ちつづける。
Similarly to the probe 10 according to the present invention, the test tube 1 is prepared by attaching dirt such as water droplets or oxide film to the entire outer periphery.
If the test tube 1
Even if the surface resistance of the entire outer periphery of the probe 10 is reduced due to the influence of the atmosphere inside the pipe 1, the insulation between the dispensing probe 8 and the metal tube 5 is reliably maintained by the insulating coating material 6. The insulation resistance between the dispensing probe 8 and the metal tube 5 always keeps a constant resistance value without being affected by disturbance.

【0025】よって、本発明により、分注プローブ8−
金属管5間には、常に安定した絶縁抵抗値を得ることが
でき、金属管5による分注プローブ8の安定したシール
ド効果が得ることが可能となる。
Therefore, according to the present invention, the dispensing probe 8-
A stable insulation resistance value can always be obtained between the metal tubes 5, and a stable shielding effect of the dispensing probe 8 by the metal tubes 5 can be obtained.

【0026】[0026]

【発明の効果】以上説明したように本発明によれば、プ
ローブ全周に付着する水適,汚れ、又、外乱の雰囲気な
どの影響による、分注プローブ−金属管間の絶縁抵抗低
下を防ぐことが可能となり、金属管による分注プローブ
のシールド効果が常に保たれるため試料、及び、試薬容
器内の液面を確実、かつ、安定に検出することが可能と
なり、大幅な信頼性の向上に寄与することが可能とな
る。
As described above, according to the present invention, it is possible to prevent the insulation resistance between the dispensing probe and the metal tube from being lowered due to the influence of water suitability, dirt attached to the entire circumference of the probe, and the atmosphere of disturbance. Since the shielding effect of the dispensing probe by the metal tube is always maintained, the sample and the liquid level in the reagent container can be detected reliably and stably, and the reliability is greatly improved. It is possible to contribute to.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例におけるプローブの構造図で
ある。
FIG. 1 is a structural diagram of a probe according to an embodiment of the present invention.

【図2】本発明による分注プローブを液体に浸漬させた
時の外観図である。
FIG. 2 is an external view when the dispensing probe according to the present invention is immersed in a liquid.

【図3】本発明の一実施例の動作を説明する図である。FIG. 3 is a diagram for explaining the operation of the embodiment of the present invention.

【図4】試料収容容器内の内壁が液体で濡れたときの分
注プローブ−金属管間の絶縁抵抗特性図である。
FIG. 4 is an insulation resistance characteristic diagram between the dispensing probe and the metal tube when the inner wall of the sample container is wet with a liquid.

【図5】同じく絶縁抵抗特性図である。FIG. 5 is also an insulation resistance characteristic diagram.

【符号の説明】[Explanation of symbols]

5…金属管、6…絶縁コーティング材、7…絶縁材、8
…分注プローブ。
5 ... Metal tube, 6 ... Insulation coating material, 7 ... Insulation material, 8
… Dispensing probe.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】試料、又は試薬液を収容した液体収容容器
から反応容器へ液を分注するプローブを液面検出用電極
として働かせ、上記プローブが上記液体収容容器内の液
に接触した時に液面を検出する様に構成した分析装置に
おいて、該プローブの外周に絶縁材を介してプローブの
先端以外を覆う様に構成した金属管の内外周を絶縁コー
ティングすることを特徴とする液面センサを備えた分析
装置。
1. A probe for dispensing a liquid from a liquid containing container containing a sample or a reagent liquid to a reaction container is used as a liquid level detecting electrode, and when the probe comes into contact with the liquid in the liquid containing container, the liquid In an analyzer configured to detect a surface, a liquid level sensor characterized by insulatingly coating the inner and outer circumferences of a metal tube configured to cover a portion other than the tip of the probe through an insulating material on the outer circumference of the probe. Equipped analyzer.
JP5185817A 1993-07-28 1993-07-28 Analyzer with liquid level sensor Pending JPH0743369A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5185817A JPH0743369A (en) 1993-07-28 1993-07-28 Analyzer with liquid level sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5185817A JPH0743369A (en) 1993-07-28 1993-07-28 Analyzer with liquid level sensor

Publications (1)

Publication Number Publication Date
JPH0743369A true JPH0743369A (en) 1995-02-14

Family

ID=16177404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5185817A Pending JPH0743369A (en) 1993-07-28 1993-07-28 Analyzer with liquid level sensor

Country Status (1)

Country Link
JP (1) JPH0743369A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0819942A2 (en) * 1996-07-19 1998-01-21 Hitachi, Ltd. Apparatus for transferring liquid having liquid level sensing function
JP2011122964A (en) * 2009-12-11 2011-06-23 Hitachi High-Technologies Corp Dispensing nozzle for automatic analyzer, and automatic analyzer loaded therewith
JP2018096843A (en) * 2016-12-13 2018-06-21 株式会社日立製作所 Dispensing device and method for dispensing
JP2019138765A (en) * 2018-02-09 2019-08-22 キヤノンメディカルシステムズ株式会社 Autoanalyzer
US11372014B2 (en) * 2016-05-12 2022-06-28 Siemens Healthcare Diagnostics Inc. Clinical analyzer probe crash detection mechanism and process

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0819942A2 (en) * 1996-07-19 1998-01-21 Hitachi, Ltd. Apparatus for transferring liquid having liquid level sensing function
EP0819942A3 (en) * 1996-07-19 1998-09-23 Hitachi, Ltd. Apparatus for transferring liquid having liquid level sensing function
US5855851A (en) * 1996-07-19 1999-01-05 Hitachi, Ltd. Apparatus for trasferring liquid having liquid level sensing function
JP2011122964A (en) * 2009-12-11 2011-06-23 Hitachi High-Technologies Corp Dispensing nozzle for automatic analyzer, and automatic analyzer loaded therewith
US11372014B2 (en) * 2016-05-12 2022-06-28 Siemens Healthcare Diagnostics Inc. Clinical analyzer probe crash detection mechanism and process
JP2018096843A (en) * 2016-12-13 2018-06-21 株式会社日立製作所 Dispensing device and method for dispensing
WO2018110052A1 (en) * 2016-12-13 2018-06-21 株式会社日立製作所 Dispensing device and dispensing method
US11199479B2 (en) 2016-12-13 2021-12-14 Hitachi, Ltd. Dispensing device and dispensing method
JP2019138765A (en) * 2018-02-09 2019-08-22 キヤノンメディカルシステムズ株式会社 Autoanalyzer

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