JPH0740027B2 - Elemental analysis method - Google Patents

Elemental analysis method

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Publication number
JPH0740027B2
JPH0740027B2 JP1064061A JP6406189A JPH0740027B2 JP H0740027 B2 JPH0740027 B2 JP H0740027B2 JP 1064061 A JP1064061 A JP 1064061A JP 6406189 A JP6406189 A JP 6406189A JP H0740027 B2 JPH0740027 B2 JP H0740027B2
Authority
JP
Japan
Prior art keywords
sample
graphite crucible
elemental analysis
lid
elemental
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1064061A
Other languages
Japanese (ja)
Other versions
JPH02242152A (en
Inventor
正博 谷本
彰弘 平野
修司 高松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP1064061A priority Critical patent/JPH0740027B2/en
Publication of JPH02242152A publication Critical patent/JPH02242152A/en
Publication of JPH0740027B2 publication Critical patent/JPH0740027B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、黒鉛るつぼを用いて試料中の元素を分析する
方法に関する。
TECHNICAL FIELD The present invention relates to a method for analyzing an element in a sample by using a graphite crucible.

〔従来の技術〕 上記黒鉛るつぼを用いて元素分析を行うに際して従来
は、元素分析装置内部の上下の電極間に黒鉛るつぼを挿
入して、当該黒鉛るつぼを前記上下の電極で挟持させる
と共に、金属等の試料を試料投入機に供給し、かつ、元
素分析装置をガスシール下に置いた状態で、前記黒鉛る
つぼを電気的に加熱して脱ガス処理すると共に、該黒鉛
るつぼに試料を投入して当該試料を溶融し、発生したガ
スを基にして前記試料中の元素を分析している。
[Prior Art] Conventionally, when performing elemental analysis using the graphite crucible, a graphite crucible is inserted between upper and lower electrodes inside an elemental analyzer, and the graphite crucible is sandwiched between the upper and lower electrodes, and a metal Samples such as the above are supplied to a sample feeder, and in a state where the elemental analyzer is placed under a gas seal, the graphite crucible is electrically heated for degassing, and the sample is placed in the graphite crucible. Then, the sample is melted and the elements in the sample are analyzed based on the generated gas.

そして、上記の元素分析を終えた時点で使用済みの黒鉛
るつぼを取り出し、以後、上記した手段を繰り返すこと
で複数個の試料に対する元素分析を行っている。
Then, when the above elemental analysis is completed, the used graphite crucible is taken out, and thereafter, the above-described means is repeated to perform elemental analysis on a plurality of samples.

〔発明が解決しようとする課題〕[Problems to be Solved by the Invention]

しかし、元素分析の度に黒鉛るつぼを交換しているので
ランニングコストが高くつく上、黒鉛るつぼの交換と試
料投入機への試料の供給をその都度行うことから、複数
個の試料の元素分析に多大の時間を必要とした。
However, since the graphite crucible is replaced every time elemental analysis is performed, the running cost is high, and since the graphite crucible is replaced and the sample is supplied to the sample feeder each time, elemental analysis of multiple samples is required. It took a lot of time.

また、元素分析対象がセラミックス等である場合には、
前記黒鉛るつぼにフラックスが投入されるが、分析に供
したフラックスが未だ機能的に有効である場合があるに
も拘わらず、これを黒鉛るつぼと共に廃棄しており、非
常に無駄であった。
When the elemental analysis target is ceramics, etc.,
Flux was added to the graphite crucible, and although the flux used for the analysis may still be functionally effective, it was discarded together with the graphite crucible, which was very wasteful.

本発明は、上記の実情に鑑みて発案されたものであっ
て、ランニングコストの低減化と分析時間の短縮化を図
るに至った元素分析方法を提供することを目的としてい
る。
The present invention has been devised in view of the above circumstances, and an object thereof is to provide an elemental analysis method that achieves a reduction in running cost and a reduction in analysis time.

〔課題を解決するための手段〕[Means for Solving the Problems]

上記の目的を達成するために、本発明の元素分析方法
は、黒鉛るつぼを上下方向から挟持する上部電極および
下部電極を有し、前記黒鉛るつぼに対する複数個の試料
投入機を上下に並置してなり、各試料投入機に備わって
いるホッパーに夫々試料を供給するとともに、前記各ホ
ッパーへの試料供給孔を開閉する蓋体を有する元素分析
装置を用い、前記黒鉛るつぼを電気的に加熱して当該黒
鉛るつぼに供給された試料を溶融し、該試料中の元素を
分析する方法であって、前記蓋体を開き、かつ、前記下
部電極の電極面上に当該黒鉛るつぼを載置し、続いて、
前記複数個の試料投入機に各試料供給孔を介して夫々試
料を供給した後、前記蓋体を閉じて元素分析装置をガス
シール下に置いた状態で、前記黒鉛るつぼを脱ガス処理
すると共に、最下位のホッパーをスライドさせて前記黒
鉛るつぼに連通する試料投入孔の直上に前記供給されて
いる試料を位置させ、該試料を当該黒鉛るつぼに投入し
て元素分析を行い、続いて、下から2番目以降のホッパ
ーに供給されている試料を順次投入して元素分析を行
い、もって、上記の黒鉛るつぼを繰り返し使用して上記
各試料の元素分析を行うことを特徴としている。
In order to achieve the above object, the elemental analysis method of the present invention has an upper electrode and a lower electrode that sandwich a graphite crucible from above and below, and a plurality of sample feeders for the graphite crucible are arranged in parallel vertically. In addition, while supplying each sample to the hopper provided in each sample feeder, using an elemental analyzer having a lid that opens and closes the sample supply hole to each hopper, electrically heat the graphite crucible. A method of melting a sample supplied to the graphite crucible and analyzing an element in the sample, wherein the lid is opened, and the graphite crucible is placed on the electrode surface of the lower electrode, and hand,
After supplying a sample to each of the plurality of sample feeders through each sample supply hole, degassing the graphite crucible while the lid is closed and the elemental analyzer is placed under a gas seal. , The lowest sample is slid to position the sample being supplied directly above the sample charging hole communicating with the graphite crucible, and the sample is charged into the graphite crucible for elemental analysis. It is characterized in that the samples supplied to the second and subsequent hoppers are sequentially charged for elemental analysis, and that the above-mentioned graphite crucible is repeatedly used for elemental analysis of each sample.

〔作用〕[Action]

黒鉛るつぼを上下方向から挟持する上部電極および下部
電極を有し、前記黒鉛るつぼに対する複数個の試料投入
機を上下に並置してなり、各試料投入機に備わっている
ホッパーに夫々試料を供給するとともに、前記各ホッパ
ーへの試料供給孔を開閉する蓋体を有する元素分析装置
を用いたので、複数個の試料投入機に対して一度に試料
を供給し、かつ、黒鉛るつぼを繰り返し使用すること
で、複数個の試料の元素分析を連続的に行うことができ
る。
It has an upper electrode and a lower electrode that sandwich the graphite crucible from above and below, and a plurality of sample feeders for the graphite crucible are arranged side by side vertically, and each sample is supplied to a hopper equipped in each sample feeder. In addition, since an elemental analyzer having a lid that opens and closes the sample supply hole to each of the hoppers was used, it is possible to supply the samples at once to a plurality of sample feeders and repeatedly use the graphite crucible. Thus, elemental analysis of a plurality of samples can be continuously performed.

そして、各試料投入機に備わっているホッパーのいずれ
かにフラックスを供給することで、本願発明による元素
分析を、フラックスを用いて行うことができ、必要に応
じて該フラックスを再使用する状態で、複数個の試料の
元素分析を連続的に行うことができる。
Then, by supplying the flux to one of the hoppers provided in each sample feeder, the elemental analysis according to the present invention can be performed using the flux, and the flux can be reused as necessary. The elemental analysis of a plurality of samples can be continuously performed.

〔実施例〕〔Example〕

先ず、本発明方法を実施する上で必要な元素分析装置の
一例を第1図に基づいて説明する。
First, an example of an elemental analysis device necessary for carrying out the method of the present invention will be described with reference to FIG.

図において、1はベース2への取付部材で、遊端側に筒
状部材3が設けられている。4は前記取付部材1の遊端
側に垂下連設された上部電極で、前記筒状部材3に連通
する試料投入口5と、該試料投入孔5に連通する黒鉛る
つぼ収容空間Pとが形成され、かつ、前記試料投入口5
の周部下面が電極面6に形成されている。7は前記空間
Pに対して出退自在な下部電極で上面が電極面8に形成
されている。9は前記上下の電極4,7の電極面6,8で挟持
された黒鉛るつぼで、前記電極4,7に通電されることで
電気的に加熱される。
In the figure, reference numeral 1 is a mounting member to the base 2, and a tubular member 3 is provided on the free end side. Reference numeral 4 denotes an upper electrode that is hung continuously on the free end side of the mounting member 1, and forms a sample inlet 5 that communicates with the tubular member 3 and a graphite crucible storage space P that communicates with the sample inlet 5. And the sample inlet 5
The lower surface of the peripheral portion is formed on the electrode surface 6. Reference numeral 7 denotes a lower electrode which can freely move in and out of the space P, and its upper surface is formed as an electrode surface 8. Reference numeral 9 is a graphite crucible sandwiched between the electrode surfaces 6 and 8 of the upper and lower electrodes 4 and 7, and is electrically heated by energizing the electrodes 4 and 7.

10は前記取付部材1の遊端側に設置された第1試料投入
機で、次のように構成されている。
Reference numeral 10 denotes a first sample feeder installed on the free end side of the mounting member 1 and is configured as follows.

即ち、前記筒状部材3に連通する下孔aと該下孔aと同
芯状の上孔bおよび試料通過孔cを第1筒体11に形成す
ると共に、該第1筒体11の内部に第2筒体12をスライド
自在に設け、この第2筒体12の上下部分に、スライドに
伴って前記上孔bと試料通過孔cとに各別を連通する互
いに同芯状の上記の試料投下孔d,eを形成すると共に、
更に、前記第2筒体12の内部に、前記上下の試料投入孔
d,eを連通状態と閉塞状態とに切り換える試料貯留用の
第1ホッパー13を設けて成る。
That is, a lower hole a communicating with the cylindrical member 3, an upper hole b concentric with the lower hole a, and a sample passage hole c are formed in the first cylinder 11 and the inside of the first cylinder 11 is formed. A second cylindrical body 12 is slidably provided on the upper and lower portions of the second cylindrical body 12, and the upper hole b and the sample passage hole c are communicated with each other as the slide moves. While forming the sample dropping holes d and e,
Further, inside the second cylindrical body 12, the upper and lower sample charging holes are provided.
A first hopper 13 for sample storage is provided for switching d and e between a communication state and a closed state.

上記試料貯留用ホッパー13は、第2筒体12の内部に固設
した固定部材13aと、該固定部材13aに対して当接離間自
在な可動部材13bから成り、かつ、当該両部材13a,13bの
相対応する面部の上部には夫々ホッパー面部が形成され
ており、そして前記第2筒体12と可動部材13bには夫
々、スライド操作用の第1及び第2の駆動手段14,15が
連設されている。
The sample storage hopper 13 is composed of a fixed member 13a fixedly provided inside the second cylindrical body 12 and a movable member 13b which can be brought into contact with and separated from the fixed member 13a, and both the members 13a and 13b. Hopper surface portions are formed on the upper portions of the corresponding surface portions, and the second cylindrical body 12 and the movable member 13b are respectively connected to the first and second driving means 14 and 15 for slide operation. It is set up.

次に、図中の16は第2の試料投入機で、前記第1試料投
入機10の上部に設置され、次のように構成されている。
Next, 16 in the drawing is a second sample throwing machine, which is installed on the upper part of the first sample throwing machine 10 and is configured as follows.

即ち、前記第1筒体11の上部に第3の筒体17を設けると
共に、前記第1筒体11の上孔bに連通する互いに同芯状
の上下の孔f,gと、第1筒体11の試料通過孔cに連通す
る試料供給孔hを、前記第3筒体17に形成し、かつ、相
対面部の上部にホッパー面部が形成された一方が固定部
材18aで他方が可動部材18bである第2の試料貯留用ホッ
パー18を、前記第3の筒体17に内蔵すると共に、前記可
動部材18bをスライド操作するための第3の駆動手段19
を該可動部材18bに連設し、更に、前記試料供給孔hと
上孔fを開閉するための蓋体20を設けると共に、当該蓋
体20に黒鉛るつぼ内部を監視するためのモニター窓21を
設けて成る。
That is, the third tubular body 17 is provided on the upper portion of the first tubular body 11, and upper and lower holes f and g which are concentric with each other and communicate with the upper hole b of the first tubular body 11, and the first tubular body 11. A sample supply hole h communicating with the sample passage hole c of the body 11 is formed in the third cylindrical body 17, and a hopper surface portion is formed above the relative surface portion. One is a fixed member 18a and the other is a movable member 18b. The second sample storage hopper 18 which is a third drive means 19 for incorporating the second sample storage hopper 18 into the third cylindrical body 17 and slidingly operating the movable member 18b.
And a lid 20 for opening and closing the sample supply hole h and the upper hole f, and a monitor window 21 for monitoring the inside of the graphite crucible. It is provided.

尚、各種構成部材の当接面部間にはガスシール用のパッ
キンが設けられている。
Gas seal packing is provided between the contact surfaces of the various components.

次に、上記構成の元素分析装置を用いて行われる試料中
の元素分析の一手順について説明する。
Next, a procedure of elemental analysis of a sample performed using the elemental analysis device having the above-described configuration will be described.

先ず第2図(A)に示すように、前記蓋体20を開き、か
つ、前記下部電極7の電極面8上に黒鉛るつぼ9を載置
する。
First, as shown in FIG. 2A, the lid 20 is opened, and the graphite crucible 9 is placed on the electrode surface 8 of the lower electrode 7.

次に第2図(B)に示すように、前記下部電極7を上部
電極4の空間P内に突入させて、前記黒鉛るつぼ9を当
該下部電極7と前記上部電極4とで挟持させ、前記第1
及び第2の試料投入機10,16のホッパー13,18に試料n1,n
2を供給する。
Next, as shown in FIG. 2 (B), the lower electrode 7 is projected into the space P of the upper electrode 4 to sandwich the graphite crucible 9 between the lower electrode 7 and the upper electrode 4, and First
And the samples n 1 and n in the hoppers 13 and 18 of the second sample feeders 10 and 16, respectively.
Supply 2 .

次に第2図(C)に示すように、前記蓋体20を閉じて元
素分析装置をガスシール下に置くと共に装置内部を不活
性ガスでパージし、かつ、前記上下の電極4,7に電流を
流して黒鉛るつぼ9を電気的に加熱して、該黒鉛るつぼ
9を脱ガス処理すると共に、当該黒鉛るつぼ9のブラン
ク値を測定する。
Next, as shown in FIG. 2 (C), the lid 20 is closed, the elemental analysis apparatus is placed under a gas seal, the inside of the apparatus is purged with an inert gas, and the upper and lower electrodes 4, 7 are attached. An electric current is passed to electrically heat the graphite crucible 9 to degas the graphite crucible 9 and measure the blank value of the graphite crucible 9.

次いで第2図(D)に示すように、第1試料投入機10の
第2筒体12をスライドさせて、該第2筒体12の試料投下
孔eを第1筒体11の下孔aに連通位置させ、かつ第2図
(E)に示すように、第1ホッパー13の可動部材13bを
離間移動させて、第1試料n1を黒鉛るつぼ9内に投入す
る。
Next, as shown in FIG. 2 (D), the second cylinder 12 of the first sample inserter 10 is slid so that the sample dropping hole e of the second cylinder 12 is made into the pilot hole a of the first cylinder 11. 2E, the movable member 13b of the first hopper 13 is moved away from the first hopper 13, and the first sample n 1 is charged into the graphite crucible 9.

ここで、前記第1試料n1を黒鉛るつぼ9内で加熱溶融さ
せて該試料中の元素を融解抽出し、その抽出ガスをキャ
リアガスで図外のガス分析計に送り込み、第1試料n1
対する所定のガス分析を行うのである。
Here, the first sample n 1 is heated and melted in the graphite crucible 9 to melt and extract the elements in the sample, and the extracted gas is sent as a carrier gas to a gas analyzer (not shown) to make the first sample n 1 A predetermined gas analysis for

次に、必要に応じて上記の黒鉛るつぼ9を再度脱ガス処
理した上で、第2図(F)に示すように、第2試料投入
機16の可動部材18bを離間移動させて、前記第1試料n1
の分析に使用した黒鉛るつぼ9内に第2試料n2を投入
し、当該第2試料n2を黒鉛るつぼ9内で加熱溶融させて
該試料中の元素を融解抽出し、その抽出ガスをキャリア
ガスで図外のガス分析計に送り込み、第2試料n2に対す
る所定のガス分析を行うのである。
Next, if necessary, the graphite crucible 9 is degassed again, and then the movable member 18b of the second sample feeder 16 is moved away from the first crucible as shown in FIG. 1 sample n 1
The second sample n 2 was placed in a graphite crucible 9 used in the analysis, the second sample n 2 extracts melting element in the sample by heating and melting in the graphite crucible 9, the carrier and the extraction gas The gas is sent to a gas analyzer (not shown) to perform a predetermined gas analysis on the second sample n 2 .

以上をもって2個の試料に対する1面の元素分析を終え
るのであり、而して、上記の元素分析をブランク値が判
明している同一の黒鉛るつぼ9を用いて連続的に行える
上に、前記黒鉛るつぼ9を繰り返し使用することでラン
ニングコストが低減され、かつ、黒鉛るつぼの交換と試
料投入機への試料の供給が半減されることで、そのため
の作業手間と時間が短縮される。
This completes the elemental analysis of one surface of the two samples. Thus, the above-mentioned elemental analysis can be performed continuously using the same graphite crucible 9 whose blank value is known, By repeatedly using the crucible 9, the running cost is reduced, and the replacement of the graphite crucible and the supply of the sample to the sample introduction machine are halved, so that the labor and time required for the operation can be shortened.

そして、前記黒鉛るつぼ9が破損するまでの再使用可能
の回数を勘案して、当該黒鉛るつぼ9が破損するまで上
記黒鉛るつぼ9そのものを再使用して元素分析を繰り返
し行うことで、前記ランニングコストの一層を低減と、
黒鉛るつぼ交換等の時間と手間の一層の低減を達成でき
る。
In consideration of the number of reusable times until the graphite crucible 9 is damaged, the elemental analysis is repeated by reusing the graphite crucible 9 itself until the graphite crucible 9 is damaged. Further reduction of
It is possible to further reduce the time and labor for replacing the graphite crucible.

尚、分析対象の試料として、鉄やニッケルなど黒鉛るつ
ぼ9に対して浸食するものであれば、当該黒鉛るつぼ9
の耐久性が低下するが、銅や錫やセラミックスにど黒鉛
るつぼ9に浸食しないもの或いは浸食し難いものであれ
ば、上記黒鉛るつぼ9の耐久性は高く、合計で10分析程
度の再使用に耐える。
If the graphite crucible 9 such as iron or nickel that corrodes the graphite crucible 9 as the sample to be analyzed, the graphite crucible 9
However, if the graphite crucible 9 does not corrode or is difficult to corrode into copper, tin, or ceramics, the graphite crucible 9 has a high durability and can be reused for a total of about 10 analyzes. Endure.

ところで、上記の実施例では、元素分析装置に2個の試
料投入機10,16を装備させているが、3個以上の試料投
入機を装備させることで上記の元素分析をより一層短時
間で行うことができることは言うまでもなく、あるい
は、各試料投入機に備わっているホッパーのいずれかに
フラックスを供給することによって、必要に応じてフラ
ックスを使用する元素分析を行うことができると共に、
使用後のフラックスが未だ機能的に有効である場合に
は、そのフラックスを再使用して元素分析をすることが
できる。
By the way, in the above-mentioned embodiment, the element analyzer is equipped with the two sample introduction machines 10 and 16, but by equipping three or more sample introduction machines, the element analysis can be performed in a shorter time. Needless to say, or by supplying the flux to one of the hoppers provided in each sample feeder, it is possible to perform elemental analysis using the flux as necessary,
If the used flux is still functionally effective, it can be reused for elemental analysis.

〔発明の効果〕〔The invention's effect〕

以上説明したように本発明によれば、黒鉛るつぼを上下
方向から挟持する上部電極および下部電極を有し、前記
黒鉛るつぼに対する複数個の試料投入機を上下に並置し
てなり、各試料投入機に備わっているホッパーに夫々試
料を供給するとともに、前記各ホッパーへの試料供給孔
を開閉する蓋体を有する元素分析装置を用いたので、同
一の黒鉛るつぼを繰り返し使用して複数個の試料に対す
る元素分析を連続的に行なえ、而して、元素分析のラン
ニングコストの低減はもとより、分析時間の短縮化なら
びに分析手間の簡略化を図ることができ、かつ、同一の
黒鉛るつぼを繰り返し使用することは即ち、使用する黒
鉛るつぼのブランク値が一定であるから分析精度の向上
も達成できる。
As described above, according to the present invention, the graphite crucible has an upper electrode and a lower electrode that sandwich the graphite crucible from above and below, and a plurality of sample feeders for the graphite crucible are vertically arranged side by side. In addition to supplying the samples to the hoppers provided in each, and using the elemental analyzer having a lid that opens and closes the sample supply hole to each of the hoppers, using the same graphite crucible repeatedly for multiple samples Elemental analysis can be performed continuously, and not only the running cost of elemental analysis can be reduced, but also analysis time can be shortened and analysis labor can be simplified, and the same graphite crucible can be used repeatedly. That is, since the blank value of the graphite crucible to be used is constant, improvement in analysis accuracy can be achieved.

更に、前記黒鉛るつぼが破損するまで該黒鉛るつぼをそ
のまま使用して、上記の元素分析を繰り返し行うことも
可能であって、更なるランニングコストの低減と分析時
間の短縮化などを達成できる。
Furthermore, it is possible to use the graphite crucible as it is until the graphite crucible is broken, and repeat the above elemental analysis, thereby further reducing the running cost and the analysis time.

そして本発明の元素分析方法によれば、各試料投入機に
備わっているホッパーのいずれかにフラックスを供給す
ることで、本願発明による元素分析を、フラックスを用
いて行うことができるとともに、必要に応じて該フラッ
クスを再使用することもできる。
Then, according to the elemental analysis method of the present invention, by supplying the flux to any of the hoppers provided in each sample feeder, the elemental analysis according to the present invention can be performed using the flux, and if necessary. The flux can be reused accordingly.

【図面の簡単な説明】[Brief description of drawings]

第1図は元素分析装置の概略縦断側面図、第2図(A)
〜(F)は元素分析の一手順を示す説明図である。 4……上部電極、5……試料投入孔、7……下部電極、
9……黒鉛るつぼ、10,16……試料投入機、13,18……ホ
ッパー、20……蓋体、n1,n2……試料、n1,n2,a,b,c,d,e
……試料供給孔。
FIG. 1 is a schematic vertical sectional side view of an elemental analyzer, and FIG. 2 (A).
(F) is an explanatory view showing one procedure of elemental analysis. 4 ... upper electrode, 5 ... sample injection hole, 7 ... lower electrode,
9 ...... graphite crucible, 10, 16 ...... sample loading machines, 13, 18 ...... hopper, 20 ...... lid, n 1, n 2 ...... Sample, n 1, n 2, a , b, c, d , e
...... Sample supply hole.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】黒鉛るつぼを上下方向から挟持する上部電
極および下部電極を有し、前記黒鉛るつぼに対する複数
個の試料投入機を上下に並置してなり、各試料投入機に
備わっているホッパーに夫々試料を供給するとともに、
前記各ホッパーへの試料供給孔を開閉する蓋体を有する
元素分析装置を用い、前記黒鉛るつぼの電気的に加熱し
て当該黒鉛るつぼに供給された試料を溶融し、該試料中
の元素を分析する方法であって、前記蓋体を開き、か
つ、前記下部電極の電極面上に当該黒鉛るつぼを載置
し、続いて、前記複数個の試料投入機に各試料供給孔を
介して夫々試料を供給した後、前記蓋体を閉じて元素分
析装置をガスシール下に置いた状態で、前記黒鉛るつぼ
を脱ガス処理すると共に、最下位のホッパーをスライド
させて前記黒鉛るつぼに連通する試料投入孔の直上に前
記供給されている試料を位置させ、該試料を当該黒鉛る
つぼに投入して元素分析を行い、続いて、下から2番目
以降のホッパーに供給されている試料を順次投入して元
素分析を行い、もって、上記の黒鉛るつぼを繰り返し使
用して上記各試料の元素分析を行うことを特徴とする元
素分析方法。
1. An upper electrode and a lower electrode that sandwich a graphite crucible from above and below, and a plurality of sample feeders for the graphite crucible are arranged side by side in a vertical direction. While supplying samples respectively,
Using an elemental analyzer having a lid that opens and closes sample supply holes to each hopper, the graphite crucible is electrically heated to melt the sample supplied to the graphite crucible, and the elements in the sample are analyzed. In the method, the lid is opened, and the graphite crucible is placed on the electrode surface of the lower electrode, and then the plurality of sample feeders are respectively fed with sample through the respective sample supply holes. After the above, the lid is closed and the elemental analyzer is placed under a gas seal, and the graphite crucible is degassed, and the sample is introduced by sliding the lowest hopper and communicating with the graphite crucible. The above-supplied sample is positioned immediately above the hole, the sample is put into the graphite crucible for elemental analysis, and subsequently, the samples supplied to the second and subsequent hoppers from the bottom are sequentially introduced. Elemental analysis, Elemental analysis method using repeat the graphite crucible and performing elemental analysis of each sample.
【請求項2】上記脱ガス処理された黒鉛るつぼに対する
2回目以降の試料の投入に先立って、当該黒鉛るつぼを
再度脱ガス処理することを特徴とする請求項(1)に記
載された元素分析方法。
2. The elemental analysis according to claim 1, wherein the graphite crucible is degassed again prior to the second and subsequent introduction of the sample into the degassed graphite crucible. Method.
JP1064061A 1989-03-16 1989-03-16 Elemental analysis method Expired - Lifetime JPH0740027B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1064061A JPH0740027B2 (en) 1989-03-16 1989-03-16 Elemental analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1064061A JPH0740027B2 (en) 1989-03-16 1989-03-16 Elemental analysis method

Publications (2)

Publication Number Publication Date
JPH02242152A JPH02242152A (en) 1990-09-26
JPH0740027B2 true JPH0740027B2 (en) 1995-05-01

Family

ID=13247199

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1064061A Expired - Lifetime JPH0740027B2 (en) 1989-03-16 1989-03-16 Elemental analysis method

Country Status (1)

Country Link
JP (1) JPH0740027B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6291802B1 (en) * 2000-11-03 2001-09-18 Leco Corporation Sample introduction assembly

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS608749A (en) * 1983-06-28 1985-01-17 Horiba Ltd Quantitative analysis of sample such as metal using graphite crucible
JPS61194359A (en) * 1985-02-23 1986-08-28 Horiba Ltd Method for analysis of element in specimen by using crucible

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS608749A (en) * 1983-06-28 1985-01-17 Horiba Ltd Quantitative analysis of sample such as metal using graphite crucible
JPS61194359A (en) * 1985-02-23 1986-08-28 Horiba Ltd Method for analysis of element in specimen by using crucible

Also Published As

Publication number Publication date
JPH02242152A (en) 1990-09-26

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