JPH07325130A - Automatic test system - Google Patents

Abstract

PURPOSE:To facilitate generation and modification of test data. CONSTITUTION:The automatic test system comprises a first test data conversion means 5 for converting an internal format test data, generated through teaching from a signal control means 2 to a device 1 to be tested, into an external format test data, means 7 for compiling the converted test data artificially, and a second conversion means 6 for converting the compiled test data into the internal format test data. This system shortens the time required for partial correction or modification of an existing test data.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic tester for applying a predetermined input signal to a device under test and testing whether or not a corresponding output signal is output correctly.

[0002]

2. Description of the Related Art FIGS. 6 and 7 are block diagrams showing conventional examples of automatic testers. In these figures, 1 is the device under test, 2 is signal control means, 3 is pass / fail judgment means, and 4 is
Is a test data storage means. That is, as shown in FIG. 6, the test data converting means 5 and 6 and the test data editing means 7 are provided, and an operator gives an instruction from the editing means 7 to perform a test from the storage means 4 via the test data converting means 5. The data is read out, edited by the editing means 7 and subjected to predetermined editing, converted by the test data converting means 6 and stored in the storage means 4, and a test is performed based on this data (called an operator method).

On the other hand, the one shown in FIG. 7 is provided with a test data creating means 8 and, by this, test data is obtained from input signal information input to the device under test 1 and output signal information obtained from the device under test 1. Is automatically created and stored in the storage means 4 for testing (called a teaching method).

[0004]

However, in the operator method as shown in FIG. 6, it is necessary to document the test know-how possessed by the operator, and there is a problem that it takes time to create the test data. Further, in the teaching method shown in FIG. 7, since test data is created in parallel with the test, the test data can be created without documenting the test know-how possessed by the operator, and the test data can be efficiently created. There is an advantage that can be created. But,
The teaching method has a problem that even if a part of the existing test data is modified or partially changed, it must be recreated and it takes time. Therefore, an object of the present invention is to make it possible to easily create and change test data in a short time.

[0005]

In order to solve such a problem, in the present invention, an input signal is applied to a device under test,
As a result, in an automatic tester that compares the output signal obtained from the device under test with a preset correct signal to determine pass / fail, the internal format is calculated from the input signal to the device under test and the output signal of the device under test. And a first test data conversion means for converting the test data in the internal format into the test data in the external format, and a test data editing means for editing the test data in the external format. Second test data conversion means for converting the edited external format test data into internal format test data.

[0006]

[Function] It is possible to manually edit by providing the first test data conversion means for converting the test data in the internal format created by teaching into the test data in the external format, and the test data in the external format after editing is internally stored. By providing the second test data conversion means for converting the test data into the format, the test data is stored in the memory and the test data can be easily created and changed to shorten the creation time.

[0007]

1 is a block diagram showing an embodiment of the present invention. The device under test 1 has input / output terminals for a digital input signal for the push button and a digital output signal for the lamp. Here, only push button and lamp,
The same applies to relays and solenoids.

The signal control means 2 is provided with push buttons and lamps, and these signal lines are connected to the input / output terminals of the device under test 1. Further, one serial transmission line (RS-232C) is output from the signal control means 2, and the pass / fail judgment means 3, the test data storage means 4, the test data conversion means 5, 6, the test data editing means 7 and the test data. A personal computer including the creating means 8 is connected. This serial transmission line is used to send teaching test data to a personal computer and to receive test data from the personal computer to execute an automatic test.
Reference numeral 9 is a communication control unit.

FIG. 2 shows an example of the structure of the test data in the internal format created by the test data creating means. In the same figure, the first 4 bytes indicate the position where the input signal is stored. In other words, it indicates from which byte of the test data in this internal format the input signal is saved,
The example of FIG. 2 shows that the input signal is stored from the 8th byte. The next 4 bytes indicate the position where the output signal is stored. That is, it indicates from which byte of the test data in this internal format the output signal is stored, and in the example of FIG. 2, the output signal is stored from the 72nd byte.

Therefore, the 8th to 71st bytes are input signals, and the 72nd and subsequent bytes are output signals. The input signal and the output signal make up one data in units of 8 bytes. The first 4 bytes are the time when the signal changed, the next 2 bytes are the signal number, and the last 2 bytes are the changed signal. Indicates the value of. Then, this 8-byte unit data is described by the number of times the input signal and the output signal have changed.

FIG. 3 shows the structure of the test data in the external format created by the first test data converting means. In addition,
Here, the text format data is created, but there are some that create graph format data. In this example, 1
The character string "$ input signal;" in the line indicates that the description of the input signal starts from here. The 2nd to 9th lines are the description of the input signal, and this part is obtained by converting the data from the 8th byte to the 71st byte of FIG. 2 into a character string.

The character string "$ output signal;" on the 10th line indicates that the description of the output signal starts from here. 11
The description of the output signal is from the line to the n-1th line, and this portion corresponds to the data of the 72nd byte and subsequent bytes in FIG. The character string "$ END;" on the n-th line indicates that the description of the test data is finished here.

The first test data conversion means 5 in FIG.
The test data in the internal format shown in FIG. 2 is converted into the test data in the external format shown in FIG. 3, and the second test data converting means 6 shows the test data in the external format shown in FIG. 3 in the FIG. This is to convert the test data into the internal format. The test data editing means 7 edits test data in an external format, and a well-known normal editing program (editor program) is used.

FIG. 4 is a flow chart for explaining the operation of the first test data converting means. First, in step S1, the storage position of the input signal is read from the internal format test data, and in step S2, the output signal storage position is also read from the internal format test data. In step S3, a pointer is set to the storage position of the input signal, and in step S4, "$ input signal;" is written in the external format test data.

In step S5, it is checked whether or not the set pointer is at the position of the output signal. If the set pointer is at or above the position of the output signal, go to step S8, otherwise go to step S6. . Step S6
Then, the change time, signal number, and signal value described in the internal format test data at the position of the pointer are converted into a character string and written in the external format test data. After that, the pointer is advanced by 8 (advance by 8 bytes) in step S7, and the process returns to step S5.

In step S8, "$ output signal;" is written in the external format test data. In step S9, it is checked whether the test data in the internal format has been read to the end,
If the internal format test data is read to the end, go to step S12 and add "$ E" to the external format test data.
ND; "is written and the process ends, otherwise step S
Proceed to 10. In step S10, the change time, the signal number and the signal value described in the internal format test data at the position of the pointer are converted into a character string and written in the external format test data. After that, the pointer is advanced by 8 in step S11, and the process returns to step S9.

FIG. 5 is a flow chart for explaining the operation of the second test data converting means. First, in step S1, the pointer indicating the position of the internal format test data is set to "8", and in step S2 the flag is set to the initial state. This flag indicates what kind of internal format test data is currently being read. In step S3, one line of external format test data is read. In step S4, the read character string is examined. If "$ input signal;", go to step S5. If "$ output signal;", go to step S7, " If $ END; ", the process ends, otherwise go to step S9.

In step S5, a flag is set to the input signal, and in step S6, the value of the pointer is written to the storage position of the input signal of the internal format test data. In step S7, the flag is set to the output signal, and in step S8, the value of the pointer is written in the storage position of the output signal of the internal format test data. In step S9, the flag is checked. If the flag is in the initial state, the process proceeds to step S3, if the flag is an input signal, the process proceeds to step S10, and if the flag is an output signal, the process proceeds to step S12.

In step S10, the change time, signal number, and signal value of the read external format test data are converted into numerical values, which are written in the position of the pointer of the internal format test data. In step S11, the pointer is advanced 8 steps. Return to S3. In step S12, the change time, signal number, and signal value of the read external format test data are converted into numerical values and written in the position of the pointer of the internal format test data. In step S13, the pointer is advanced by 8 and returns to step S3. .

[0020]

According to the present invention, the first conversion means for converting the test data in the internal format created by teaching into the data in the external format, and the second conversion means for performing the reverse conversion are provided. Therefore, there is an advantage that the time required for modifying a part of the test data or partially modifying the test data to create new test data can be significantly reduced.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing an embodiment of the present invention.

FIG. 2 is a structural diagram showing test data in an internal format created by the test data creating means in FIG.

FIG. 3 is a structural diagram showing test data in an external format created by the first test data converting means in FIG.

FIG. 4 is a flowchart showing an operation of the first test data converting means.

FIG. 5 is a flowchart showing an operation of the second test data converting means.

FIG. 6 is a configuration diagram showing a conventional example.

FIG. 7 is a configuration diagram showing another conventional example.

[Explanation of symbols]

1 ... Device under test, 2 ... Signal control means, 3 ... Pass / fail judgment means, 4 ... Test data storage means, 5 ... First test data conversion means, 6 ... Second test data conversion means, 7 ... Test data editing means, 8 ... Test data creating means, 9 ... Communication control unit.

Claims (1)

[Claims] 1. An automatic tester for inputting an input signal to a device under test and comparing the output signal obtained from the device under test with a preset correct answer signal to determine pass / fail, comprising: Test data creating means for creating test data in internal format from an input signal to the device and output signal of the device under test, and first test data converting means for converting test data in the internal format into test data in external format. And test data editing means for editing the test data in the external format, and second test data converting means for converting the edited test data in the external format into test data in the internal format. And an automatic testing machine.