JPH07282879A - Heat-resistant large-current connecting device - Google Patents

Heat-resistant large-current connecting device

Info

Publication number
JPH07282879A
JPH07282879A JP9705694A JP9705694A JPH07282879A JP H07282879 A JPH07282879 A JP H07282879A JP 9705694 A JP9705694 A JP 9705694A JP 9705694 A JP9705694 A JP 9705694A JP H07282879 A JPH07282879 A JP H07282879A
Authority
JP
Japan
Prior art keywords
contact
pin
socket
shape
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9705694A
Other languages
Japanese (ja)
Other versions
JP2697607B2 (en
Inventor
Toru Nakajima
透 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP6097056A priority Critical patent/JP2697607B2/en
Publication of JPH07282879A publication Critical patent/JPH07282879A/en
Application granted granted Critical
Publication of JP2697607B2 publication Critical patent/JP2697607B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To provide stable contact resistance against overheating due to self- heating by a large current or the heating by increased contact resistance or the exposure in the high-temperature environment. CONSTITUTION:A socket 33 is constituted of a holder 40 made of a conducting metal and contacts 41 made of c conducting shape memory alloy. The contacts 41 are recovered to the original shape as shown by two-dot chain lines and shrunk in inner diameter D at a certain temperature (high temperature) or above. A pin inserted into the contacts 41 is made of a conducting shape memory alloy and formed into a cylindrical body having slits on part of the periphery, it is recovered to the original shape and expanded in outer diameter at a certain temperature (high temperature) or above, and the contact pressure with the contacts 41 is increased.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、形状記憶合金を利用し
た耐熱大電流用接続装置に関し、特に大電流による自己
発熱または接触抵抗による発熱が生じる場合、あるいは
高温環境下に晒される場合でも、一定の接触抵抗および
一定の機械的挿抜力を保持し得るようにした耐熱大電流
用接続装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a heat-resistant large-current connecting device using a shape memory alloy, and particularly when self-heating due to large current or heat generation due to contact resistance occurs, or even when exposed to a high temperature environment. The present invention relates to a heat-resistant high-current connection device capable of maintaining a constant contact resistance and a constant mechanical insertion / removal force.

【0002】[0002]

【従来の技術】従来、この種の耐熱大電流用接続装置と
しては、良好な接触抵抗を得るためにピンとソケットの
クリアランスを縮小して接触圧力を高めるようにした構
造を採用している。しかしながら、このような構造では
常温においては特に問題ないが、高温に達すると部材の
熱膨張の影響で接触抵抗の変化と同時に機械的接触圧力
が変化し、最悪の場合は接続装置の焼き付きや変形を生
じるという問題があった。大電流用接続装置の場合、発
熱が大のため特にこの傾向が大きい。そこで、このよう
な問題を解決する方法として、例えば特開昭63−30
8940号公報、特開昭59−160979号公報等に
見られるように形状記憶合金を用いた接続装置が提案さ
れている。
2. Description of the Related Art Conventionally, as this type of heat-resistant high-current connecting device, a structure has been adopted in which the contact pressure is increased by reducing the clearance between the pin and the socket in order to obtain good contact resistance. However, with such a structure, there is no particular problem at normal temperature, but when the temperature reaches a high temperature, the mechanical contact pressure changes at the same time as the contact resistance changes due to the effect of thermal expansion of the member, and in the worst case, seizure or deformation of the connecting device. There was a problem of causing. In the case of a large current connection device, this tendency is particularly large because of the large heat generation. Therefore, as a method for solving such a problem, for example, Japanese Patent Laid-Open No. 63-30
As disclosed in Japanese Patent No. 8940, Japanese Patent Laid-Open No. 59-160979, etc., a connecting device using a shape memory alloy has been proposed.

【0003】図4(イ),(ロ)は上記特開昭63−3
08940号公報に示されたバーンイン用ICソケット
を示すもので、(イ)は常温時のコンタクトが開いた状
態、(ロ)は高温時のコンタクトが閉じた状態を示す断
面図である。このソケット1は、絶縁体2と、絶縁体2
に収納されたコンタクト3とを備えている。コンタクト
3は、バーンイン用ICソケットにICを実装した時
に、リードフレームと一定の圧力で接触するためのもの
で、二方向性形状記憶合金で構成されている。このコン
タクト3は、40°Cを境として、これ以下の温度では
(イ)で示すような接触部4が開いた状態の形状、すな
わちコンタクト3が上方の一点で接触して、この部分が
ICリードフレームとの接触部4となって接触圧力が小
さい状態となっており、これ以上の温度では(ロ)で示
すような接触部4が閉じた状態の形状、すなわちコンタ
クト3が線状に一定の長さにわたって接触して、この部
分がICリードフレームとの接触部4となって、接触圧
力が強い状態となるような、2つの形状を有するように
構成されている。
4A and 4B show the above-mentioned Japanese Patent Laid-Open No. 63-3.
8A and 8B show a burn-in IC socket disclosed in Japanese Patent Publication No. 08940, wherein (A) is a cross-sectional view showing a state where the contact is open at room temperature and (B) is a state where the contact is closed at high temperature. This socket 1 includes an insulator 2 and an insulator 2
And the contact 3 stored in. The contact 3 is for making contact with the lead frame at a constant pressure when the IC is mounted on the burn-in IC socket, and is made of a bidirectional shape memory alloy. The contact 3 has a shape in which the contact portion 4 is opened at a temperature below 40 ° C. as shown in (a), that is, the contact 3 contacts at one point above, and this portion is the IC. The contact pressure with the lead frame 4 is small, and the contact pressure is small. At a temperature higher than this, the contact part 4 has a closed shape as shown by (B), that is, the contact 3 is linear. Of the IC lead frame, and the contact pressure is strong, so that the contact pressure is strong.

【0004】図5(a)〜(d)は特開昭59−160
979号公報に示された電気的接続装置を示すもので、
形状記憶合金からなる薄板を用い、母相での断面形状を
逆J字状に整形してソケット21を構成したものである
(a)。ピン22とソケット21を接続する場合は、温
度(T)を下げ、M相(マルテンサイト相)の安定な温
度領域、すなわちマルテンサイト逆変態の終了点(Af
)以下の温度領域でピン22をソケット21に差し込
む(b)。すると、ソケット21を構成する形状記憶合
金材はピン22に押し付けられて(b)実線のように変
形するが、この変形に要する応力はあまり大きくない。
次に(c)に示すように温度を形状記憶合金の逆変態の
終了点(Af )より高い温度まで上昇させる。この時、
合金材は(a)に示した母相の形状に戻ろうとするの
で、合金とピンとの間に強い接触圧力が働く。しかし、
ピンに妨げられるので実質的な変形はない。したがっ
て、逆変態の終了点(Af )より高温で動作させれば、
その間接続して信頼性の高い接点を維持できる。そし
て、ソケット21を形状記憶合金のマルテンサイト変態
の終了点(Mf )より低い温度まで冷却し、その温度に
保持しながらピン22をソケット21から抜くと、この
場合も非常に弱い力で抜くことができる(d)。これは
ピン22を挿入した状態で母相からM相への変態を起こ
させるとピン22を抜いてもソケット21のスプリング
バックは非常に小さく、殆ど挿入された状態と同じ形状
を保つためである。また、この装置を再使用するときに
は、ピン22を挿入するときも、抜く時にも最初の抜去
時(c)と同じ状態が実現するので、2回目以降の挿抜
力は非常に小さくてすむ利点を有する。
5 (a) to 5 (d) show Japanese Patent Laid-Open No. 59-160.
979 shows an electrical connecting device disclosed in Japanese Patent Publication No. 979,
A thin plate made of a shape memory alloy is used to form the socket 21 by shaping the cross-sectional shape of the matrix phase into an inverted J shape (a). When the pin 22 and the socket 21 are connected, the temperature (T) is lowered and the stable temperature region of the M phase (martensite phase), that is, the end point of the martensite reverse transformation (Af
) Insert the pin 22 into the socket 21 in the temperature range below (b). Then, the shape memory alloy material forming the socket 21 is pressed against the pin 22 and deforms as shown by the solid line (b), but the stress required for this deformation is not so large.
Next, as shown in (c), the temperature is raised to a temperature higher than the end point (Af) of the reverse transformation of the shape memory alloy. At this time,
Since the alloy material tries to return to the shape of the parent phase shown in (a), a strong contact pressure acts between the alloy and the pin. But,
There is no substantial deformation as it is blocked by the pins. Therefore, if operating at a temperature higher than the end point (Af) of reverse transformation,
During that time, the connection can be maintained to maintain a highly reliable contact. Then, when the socket 21 is cooled to a temperature lower than the end point (Mf) of the martensitic transformation of the shape memory alloy and the pin 22 is pulled out from the socket 21 while maintaining the temperature, the pulling can be performed with a very weak force in this case as well. Can be done (d). This is because when the transformation from the mother phase to the M phase is caused with the pin 22 inserted, the springback of the socket 21 is very small even if the pin 22 is pulled out, and the shape is almost the same as the inserted state. . Further, when this device is reused, the same state as at the time of the first withdrawal (c) is realized when inserting and withdrawing the pin 22, so that the insertion and withdrawal force after the second time is very small. Have.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記し
た従来の接続装置においては、いずれもピンの挿抜力の
改善を主眼とするもので、いわゆる低電流用の接続装置
としてソケット側のみを改善したものである。大電流用
接続装置に関しては、大電流による自己発熱または接触
抵抗増大による発熱あるいは高温環境下に晒されること
による過熱に対してはソケット側のみに形状記憶合金を
用いても接触抵抗の安定化効果は小さいという問題があ
った。
However, in the above-mentioned conventional connecting devices, the main purpose is to improve the insertion / removal force of the pins, and only the socket side is improved as a so-called low-current connecting device. Is. Regarding connection devices for high current, contact resistance stabilization effect even if shape memory alloy is used only on the socket side against self-heating due to large current, heat generation due to increase in contact resistance, or overheating due to exposure to high temperature environment. Had the problem of being small.

【0006】したがって、本発明は上記したような従来
の問題点に鑑みてされたもので、その目的とするところ
は、大電流による自己発熱または接触抵抗増大による発
熱あるいは高温環境下に晒されることによる過熱に対し
て安定した接触抵抗と機械的接触圧力を得ることができ
るようにした耐熱大電流用接続装置を提供することにあ
る。
Therefore, the present invention has been made in view of the above-mentioned conventional problems, and the object thereof is to be exposed to self-heating due to a large current, heat generation due to an increase in contact resistance, or high temperature environment. It is an object of the present invention to provide a heat-resistant high-current connection device capable of obtaining stable contact resistance and mechanical contact pressure against overheating due to heat.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するた
め、請求項1記載の発明は、保持体と、常温にて所要形
状に折り曲げ加工され前記保持体内に配設された導電性
の形状記憶合金からなる複数本のコンタクトとで構成さ
れるソケットと、同じく導電性の形状記憶合金からな
り、前記ソケットに差し込み接続されるピンとを備え、
前記コンタクトと前記ピンは、一定温度以上で接触圧力
が増大する形状を記憶されていることを特徴とする。請
求項2記載の発明は、請求項1記載の発明において、前
記コンタクトは一定温度以上で元の形状に復元して内径
が縮小し、前記ピンは周面に軸線方向のスリットを有す
る筒状体に形成され、一定温度以上で元の形状に復元し
て拡径することを特徴とする。請求項3記載の発明は、
導電性金属からなるコンタクトを有するソケットと、導
電性の形状記憶合金からなり、前記ソケットに差し込み
接続されるピンとを備え、前記ピンは筒状体に形成され
て周面に軸線方向のスリットを有し、一定温度以上で元
の形状に復元することにより拡径して前記コンタクトと
の接触圧力を増大させることを特徴とする。
In order to achieve the above object, the invention according to claim 1 is a holding body and a conductive shape memory which is bent into a required shape at room temperature and arranged in the holding body. A socket composed of a plurality of contacts made of an alloy, and a pin made of the same conductive shape memory alloy and inserted into the socket for connection.
The contact and the pin are memorized in a shape in which the contact pressure increases at a certain temperature or higher. According to a second aspect of the present invention, in the first aspect of the present invention, the contact is restored to its original shape at a certain temperature or higher to reduce the inner diameter, and the pin has a cylindrical body having a slit in the axial direction on the peripheral surface. It is characterized in that it is formed into a shape and is restored to its original shape at a certain temperature or higher to expand its diameter. The invention according to claim 3 is
A socket having a contact made of a conductive metal and a pin made of a conductive shape memory alloy and inserted into and connected to the socket are provided, and the pin is formed in a cylindrical body and has a slit in the axial direction on the peripheral surface. However, it is characterized in that by restoring the original shape at a certain temperature or higher, the diameter is expanded and the contact pressure with the contact is increased.

【0008】[0008]

【作用】本発明において、コンタクトとピンとの接触圧
力は、常温の場合弱くピンの挿抜を容易にする。一定温
度以上になると、コンタクトとピンは元の形状に復元し
て接触圧力を増大させ、常温時に近い接触抵抗と機械的
接触圧力を維持する。したがって、電気的機械的に安定
した接続を維持する。
In the present invention, the contact pressure between the contact and the pin is weak at room temperature, facilitating the insertion and removal of the pin. When the temperature rises above a certain temperature, the contacts and pins restore their original shape and increase the contact pressure, and maintain the contact resistance and the mechanical contact pressure close to normal temperature. Therefore, an electromechanically stable connection is maintained.

【0009】[0009]

【実施例】以下、本発明を図面に示す実施例に基づいて
詳細に説明する。図1(a),(b)は本発明に係る耐
熱大電流用接続装置を構成するソケットの平面図および
断面図、図2(a),(b)はピンの平面図および正面
図、図3は本発明装置を電子ビーム装置に用いた例を示
す概略構成図である。図3において、31は電子ビーム
を発生させるための真空容器、32は一対のソケット3
3を備えた電力供給部、34は一対のピン35とフィラ
メント36を備えた電子銃で、ソケット33とピン35
を接続して大電流をフィラメント36に流すと、フィラ
メント36は加熱されて電子ビームを放射する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail with reference to the embodiments shown in the drawings. 1 (a) and 1 (b) are a plan view and a cross-sectional view of a socket constituting a heat-resistant large-current connecting device according to the present invention, and FIGS. 2 (a) and 2 (b) are a plan view and a front view of a pin. 3 is a schematic configuration diagram showing an example in which the device of the present invention is used in an electron beam device. In FIG. 3, 31 is a vacuum container for generating an electron beam, 32 is a pair of sockets 3.
3, a power supply unit 34, an electron gun 34 having a pair of pins 35 and a filament 36, and a socket 33 and pins 35.
When a large current is supplied to the filament 36 by connecting them, the filament 36 is heated and emits an electron beam.

【0010】図1において、前記ソケット33は、筒状
体からなる保持体40と、保持体40の内周に沿って周
方向に略等間隔をおいて放射状に配設された複数個のコ
ンタクト41とで構成されている。保持体40は導電性
金属によって製作されている。コンタクト41は、Ti
Ni合金等の導電性形状記憶合金によって製作されたワ
イヤからなり、その両端が前記保持体40に溶接、かし
め等によって接合固定されている。また、コンタクト4
1は、常温にて図1(b)実線で示すように中間部が保
持体40の中心方向に向くよう内側に「く」の字状に折
り曲げ加工されて前記保持体40内に配設されており、
屈曲部がピン35との接触部37を形成している。そし
て、このコンタクト41は、常温より高いある一定温度
以上で図1(b)に二点鎖線で示すように、中間部が常
温時よりも保持体40の中心方向に変位するよう内側に
「く」の字状に屈曲した形状を記憶されている。
In FIG. 1, the socket 33 includes a holder 40 made of a cylindrical body and a plurality of contacts radially arranged along the inner circumference of the holder 40 at substantially equal intervals in the circumferential direction. And 41. The holder 40 is made of a conductive metal. Contact 41 is Ti
The wire is made of a conductive shape memory alloy such as Ni alloy, and both ends thereof are joined and fixed to the holding body 40 by welding, caulking or the like. Also, contact 4
1 is disposed in the holder 40 by being bent inward at a room temperature so that the intermediate portion faces the center of the holder 40 as shown by the solid line in FIG. And
The bent portion forms a contact portion 37 with the pin 35. The contact 41 is inwardly bent so that the intermediate portion is displaced toward the center of the holding body 40 at a certain temperature higher than normal temperature or more as shown by a chain double-dashed line in FIG. It is remembered that the shape is bent like a letter.

【0011】図2において、前記ピン35は、円柱状の
基部35aと、基部35aの一方の面の中央に突設され
た円筒状のピン本体35bとからなり、ピン本体35b
の周面の一部にはスリット42が全長にわたって形成さ
れている。このため、ピン本体35bの軸線と直交する
面内の断面形状はC字型とされる。また、ピン35は、
TiNi合金等の導電性形状記憶合金によって製作され
ており、常温にて図2(b)に示す形状に加工されるこ
とにより、ピン本体35bの外径D0 が常温時における
前記コンタクト41の接触部37の径Dより若干大き
く、常温より高いある一定温度以上で図2(b)に二点
鎖線で示すように、拡径した形状を記憶されている。
In FIG. 2, the pin 35 is composed of a cylindrical base portion 35a and a cylindrical pin body 35b projecting from the center of one surface of the base portion 35a.
A slit 42 is formed over a part of the peripheral surface of the. Therefore, the cross-sectional shape in the plane orthogonal to the axis of the pin body 35b is C-shaped. Also, the pin 35 is
It is made of a conductive shape memory alloy such as TiNi alloy, and is processed into the shape shown in FIG. 2B at room temperature, so that the contact portion of the contact 41 when the outer diameter D0 of the pin body 35b is at room temperature. The diameter is larger than the diameter D of 37 and is higher than room temperature. At a certain temperature or higher, as shown by the chain double-dashed line in FIG.

【0012】このような構成からなる接続装置におい
て、ピン35をソケット33に挿入すると、ピン本体3
5aの外周面がコンタクト41の接触部37に接触して
ソケット33とピン35が電気的機械的に接続され、フ
ィラメント36への電流供給を可能にする。この時、ソ
ケット33とピン35は真空容器31内に収納配置され
ているので、電子銃34内の発熱は外部へ空間を通して
熱伝達することなく、ソケット33とピン35を伝達す
ることになる。このため、ソケット33とピン35の温
度が上昇し、一定温度以上になると、コンタクト41は
図1(b)二点鎖線で示す形状に復元、言い換えれば接
触部37の径Dが縮小するよう内側に変形しようとす
る。しかし、ピン35によって妨げられるので、実質的
な変形はない。これに対して、ピン35は図2二点鎖線
で示す元の形状に復元、言い換えれば外径D0 が拡径す
るように変形しようとするので、コンタクト41とピン
35との間に強い接触圧力が働く。この結果、高温並び
に繰り返し挿抜によって低下するコンタクト41とピン
35との接触圧力を正規の値に安定に維持することが可
能となり、熱膨張による接触抵抗の増大と大電流による
加速度的なソケット33とピン35の過熱を防止するこ
とができ、電気的接続を安定化させると同時に、これら
部分の変形、焼き付き等を防止することができる。ま
た、ピン35を差し込む際は常温で、コンタクト41の
接触部37の径Dが大きく、ピン35の外径D0が小さ
く、抜く時も接触部37の径Dが大きく、ピン35の外
径D0が小さくなる常温にまで下がった後抜けばよいの
で、挿抜抵抗が小さく、容易に挿抜することができる。
In the connecting device having such a structure, when the pin 35 is inserted into the socket 33, the pin body 3
The outer peripheral surface of 5a comes into contact with the contact portion 37 of the contact 41 to electrically and mechanically connect the socket 33 and the pin 35, thereby enabling current supply to the filament 36. At this time, since the socket 33 and the pin 35 are housed in the vacuum container 31, the heat generated in the electron gun 34 is transferred to the socket 33 and the pin 35 without being transferred to the outside through the space. Therefore, when the temperature of the socket 33 and the pin 35 rises to a certain temperature or higher, the contact 41 is restored to the shape shown by the two-dot chain line in FIG. 1B, in other words, the diameter D of the contact portion 37 is reduced to the inner side. Try to transform into. However, there is no substantial deformation as it is hindered by the pin 35. On the other hand, the pin 35 is restored to the original shape shown by the chain double-dashed line in FIG. 2, in other words, it is about to be deformed so that the outer diameter D0 is expanded, so that a strong contact pressure is exerted between the contact 41 and the pin 35. Works. As a result, the contact pressure between the contact 41 and the pin 35, which decreases due to high temperature and repeated insertion and removal, can be stably maintained at a regular value, and the contact resistance increases due to thermal expansion and the accelerating socket 33 due to a large current. It is possible to prevent overheating of the pin 35, stabilize the electrical connection, and at the same time prevent deformation and seizure of these parts. In addition, when the pin 35 is inserted, the contact portion 37 of the contact 41 has a large diameter D and the outer diameter D0 of the pin 35 is small at the room temperature. Since it suffices to pull out after the temperature has dropped to room temperature, the insertion resistance is small, and insertion and removal can be easily performed.

【0013】ここで、上記実施例はコンタクト41とし
てワイヤを用いたが、高温時の形状を「く」の字状に記
憶された板状のものであってもよく、その場合は2〜4
つの板状コンタクトを周方向に等配して配設すればよ
い。また、上記実施例ではコンタクト41とピン35を
共に導電性の形状記憶合金によって製作した場合につい
て説明したが、本発明はこれに特定されるものではな
く、ピン35のみを導電性形状記憶合金によって製作
し、コンタクト41を通常の導電性金属によって製作し
ても上記実施例と同様な効果が得られるものである。
Although the wire is used as the contact 41 in the above-mentioned embodiment, it may be a plate-like shape in which the shape at high temperature is memorized in a V shape, in which case 2 to 4 are used.
The two plate contacts may be evenly arranged in the circumferential direction. In the above embodiment, the case where both the contact 41 and the pin 35 are made of a conductive shape memory alloy has been described, but the present invention is not limited to this, and only the pin 35 is made of a conductive shape memory alloy. Even if it is manufactured and the contact 41 is made of an ordinary conductive metal, the same effect as that of the above embodiment can be obtained.

【0014】[0014]

【発明の効果】以上説明したように本発明に係る耐熱大
電流用接続装置は、ソケットのコンタクトとピンを導電
性形状記憶合金によって形成し、常温時においては接触
圧力が弱く、一定温度(高温)以上になると元の形状に
復元して接触圧力を増大させるように構成したので、ピ
ンの挿抜操作が容易で、常温時に近い接触抵抗と機械的
接触圧力を維持することが可能となり、熱膨張による接
触抵抗の増大と大電流による加速度的な過熱を防止する
ことができる。したがって、変形や焼き付き等を防止す
ることができ、高温環境下においても大電流の接続装置
として安定した電気的機械的接続性能が得られ、耐久性
を向上させることができる。また、本発明はソケットの
コンタクトを通常の導電性金属とし、ピンを導電性形状
記憶合金によって形成し、常温時においては接触圧力が
弱く、一定温度(高温)以上になるとピンが元の形状に
復元してコンタクトとの接触圧力を増大させるように構
成したので、ピンの挿抜操作が容易で、常温時に近い接
触抵抗と機械的接触圧力を維持することが可能となり、
熱膨張による接触抵抗の増大と大電流による加速度的な
過熱を防止することができる。したがって、変形、焼き
付き等を防止することができ、高温環境下においても大
電流の接続装置として安定した電気的機械的接続性能が
得られ、耐久性を向上させることができる。また、コン
タクトを通常の導電性金属で製作すればよいので、安価
に提供することができる。
As described above, in the heat-resistant large-current connecting device according to the present invention, the contacts and pins of the socket are made of a conductive shape memory alloy, and the contact pressure is weak at room temperature, and the contact pressure is constant (high temperature). ) When it is above, it is configured to restore the original shape and increase the contact pressure, so it is easy to insert and remove the pin, it is possible to maintain the contact resistance and mechanical contact pressure close to normal temperature, and thermal expansion. It is possible to prevent the contact resistance from increasing and the accelerated overheating due to a large current. Therefore, it is possible to prevent deformation, seizure, etc., and it is possible to obtain stable electromechanical connection performance as a connection device for a large current even in a high temperature environment, and it is possible to improve durability. Further, the present invention uses the contact of the socket as a normal conductive metal, and the pin is made of a conductive shape memory alloy, the contact pressure is weak at normal temperature, and the pin returns to its original shape at a certain temperature (high temperature) or more. Since it is configured to restore and increase the contact pressure with the contact, it is easy to insert and remove the pin, and it is possible to maintain the contact resistance and mechanical contact pressure close to normal temperature,
It is possible to prevent an increase in contact resistance due to thermal expansion and accelerated overheating due to a large current. Therefore, it is possible to prevent deformation, seizure, etc., and it is possible to obtain stable electromechanical connection performance as a connection device with a large current even in a high temperature environment, and it is possible to improve durability. Further, since the contact may be made of a usual conductive metal, it can be provided at a low cost.

【図面の簡単な説明】[Brief description of drawings]

【図1】 (a),(b)は本発明に係る耐熱大電流用
接続装置を構成するソケットの平面図および断面図であ
る。
1 (a) and 1 (b) are a plan view and a cross-sectional view of a socket constituting a heat-resistant large-current connecting device according to the present invention.

【図2】 (a),(b)はピンの平面図および正面図
である。
2A and 2B are a plan view and a front view of a pin.

【図3】 本発明装置を電子ビーム装置に用いた例を示
す概略構成図である。
FIG. 3 is a schematic configuration diagram showing an example in which the device of the present invention is used in an electron beam device.

【図4】 (イ),(ロ)は従来の接続装置のコンタク
トが開いた状態を示す断面図およびコンタクトが閉じた
状態を示す断面図である。
4A and 4B are a cross-sectional view showing a state in which a contact of a conventional connecting device is opened and a cross-sectional view showing a state in which the contact is closed.

【図5】 (a)〜(d)は他の従来の接続装置の断面
図である。
5A to 5D are cross-sectional views of another conventional connecting device.

【符号の説明】[Explanation of symbols]

1…ソケット、2…絶縁体、3…コンタクト、4…接触
部、21…ソケット、22…ピン、33…ソケット、3
5…ピン、37…接触部、40…保持体、41…コンタ
クト、42…スリット。
1 ... Socket, 2 ... Insulator, 3 ... Contact, 4 ... Contact part, 21 ... Socket, 22 ... Pin, 33 ... Socket, 3
5 ... Pin, 37 ... Contact part, 40 ... Holding body, 41 ... Contact, 42 ... Slit.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 保持体と、常温にて所要形状に折り曲げ
加工され前記保持体内に配設された導電性の形状記憶合
金からなる複数本のコンタクトとで構成されるソケット
と、 同じく導電性の形状記憶合金からなり、前記ソケットに
差し込み接続されるピンとを備え、 前記コンタクトと前記ピンは、一定温度以上で接触圧力
が増大する形状を記憶されていることを特徴とする耐熱
大電流用接続装置。
1. A socket comprising a holder and a plurality of contacts made of a conductive shape memory alloy, which is bent into a required shape at room temperature and is disposed in the holder, and a socket having the same conductivity. A heat-resistant high-current connection device comprising a shape memory alloy and a pin inserted into and connected to the socket, wherein the contact and the pin store a shape in which a contact pressure increases at a certain temperature or higher. .
【請求項2】 請求項1記載の耐熱大電流用接続装置に
おいて、 前記コンタクトは一定温度以上で元の形状に復元して内
径が縮小し、 前記ピンは周面に軸線方向のスリットを有する筒状体に
形成され、一定温度以上で元の形状に復元して拡径する
ことを特徴とする耐熱大電流用接続装置。
2. The heat-resistant high-current connecting device according to claim 1, wherein the contact is restored to its original shape at a certain temperature or higher and the inner diameter is reduced, and the pin has a cylindrical slit on its peripheral surface in the axial direction. A heat-resistant large-current connecting device, which is formed into a shape and restores its original shape at a certain temperature or higher to expand its diameter.
【請求項3】 導電性金属からなるコンタクトを有する
ソケットと、 導電性の形状記憶合金からなり、前記ソケットに差し込
み接続されるピンとを備え、 前記ピンは筒状体に形成されて周面に軸線方向のスリッ
トを有し、一定温度以上で元の形状に復元することによ
り拡径して前記コンタクトとの接触圧力を増大させるこ
とを特徴とする耐熱大電流用接続装置。
3. A socket having a contact made of a conductive metal, and a pin made of a conductive shape memory alloy, which is inserted into and connected to the socket, wherein the pin is formed into a cylindrical body and has an axis line on a peripheral surface thereof. A heat-resistant large-current connecting device having a directional slit and expanding the diameter by restoring the original shape at a certain temperature or higher to increase the contact pressure with the contact.
JP6097056A 1994-04-12 1994-04-12 Heat-resistant large current connection device Expired - Lifetime JP2697607B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6097056A JP2697607B2 (en) 1994-04-12 1994-04-12 Heat-resistant large current connection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6097056A JP2697607B2 (en) 1994-04-12 1994-04-12 Heat-resistant large current connection device

Publications (2)

Publication Number Publication Date
JPH07282879A true JPH07282879A (en) 1995-10-27
JP2697607B2 JP2697607B2 (en) 1998-01-14

Family

ID=14182004

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6097056A Expired - Lifetime JP2697607B2 (en) 1994-04-12 1994-04-12 Heat-resistant large current connection device

Country Status (1)

Country Link
JP (1) JP2697607B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020071996A (en) * 2018-10-31 2020-05-07 トヨタ自動車株式会社 Terminal structure for electric supply

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61162849A (en) * 1985-01-14 1986-07-23 Matsushita Electric Ind Co Ltd Device for magnetic recording and reproducing
JPH01187716A (en) * 1988-01-20 1989-07-27 Meidensha Corp Electric contact
JPH0668925A (en) * 1992-05-21 1994-03-11 Elco Europ Gmbh High-current contact device foe electric attachment plug device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61162849A (en) * 1985-01-14 1986-07-23 Matsushita Electric Ind Co Ltd Device for magnetic recording and reproducing
JPH01187716A (en) * 1988-01-20 1989-07-27 Meidensha Corp Electric contact
JPH0668925A (en) * 1992-05-21 1994-03-11 Elco Europ Gmbh High-current contact device foe electric attachment plug device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020071996A (en) * 2018-10-31 2020-05-07 トヨタ自動車株式会社 Terminal structure for electric supply

Also Published As

Publication number Publication date
JP2697607B2 (en) 1998-01-14

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