JPH07235710A - Magnetoresistive - Google Patents

Magnetoresistive

Info

Publication number
JPH07235710A
JPH07235710A JP6024196A JP2419694A JPH07235710A JP H07235710 A JPH07235710 A JP H07235710A JP 6024196 A JP6024196 A JP 6024196A JP 2419694 A JP2419694 A JP 2419694A JP H07235710 A JPH07235710 A JP H07235710A
Authority
JP
Japan
Prior art keywords
magnetoresistive element
pattern
magnetic sensitive
magnetic
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6024196A
Other languages
Japanese (ja)
Other versions
JP3456247B2 (en
Inventor
Toshikazu Takeda
敏和 竹田
Atsuo Senda
厚生 千田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP02419694A priority Critical patent/JP3456247B2/en
Publication of JPH07235710A publication Critical patent/JPH07235710A/en
Application granted granted Critical
Publication of JP3456247B2 publication Critical patent/JP3456247B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To reduce variations of resistance of a magnetic sensitive part by bonding on a magnetic substrate a magnetoresistive device pattern having a pair of magnetic sensitive parts and an auxiliary pattern with a resin layer. CONSTITUTION:A lead electrode 8 of a magnetoresistive device pattern 2a including a pair of magnetic sensitive parts 5, 5 is disposed at a location held between the pair of the magnetic sensitive parts 5, 5. External connection terminals 4, 4, 4 connected with a connection electrode and a lead electrode 8 are led from the same end surface. When the magnetoresistive device pattern 2a formed with etching is bonded with a magnetic substrate 1 through a resin layer 10, the amount of resin entering between the magnetic sensitive parts is reduced so that contraction stress due to hardening and contraction of the resin layer 10 can be moderated. For this, pattern deformation of the magnetoresistive, device pattern 2a is reduced to prevent the pattern from being broken and hence reduce variations of resistance of the magnetic sensitive part.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】磁性体基板上に半導体からなる感
磁部をもつ磁気抵抗素子に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magnetoresistive element having a magnetic sensitive section made of a semiconductor on a magnetic substrate.

【0002】[0002]

【従来の技術】従来より、磁気抵抗素子やホ−ル素子が
InSb化合物半導体を用いて構成されている。従来の
磁気抵抗素子を図8、図9、図10を用いて説明する。
図8は従来の磁気抵抗素子の外観斜視図、図9は図8の
直線A−Aで示す切断位置における断面図、図10は磁
気抵抗素子を構成する磁気抵抗素子パタ−ンを示す平面
図である。
2. Description of the Related Art Conventionally, magnetoresistive elements and hole elements have been constructed using InSb compound semiconductors. A conventional magnetoresistive element will be described with reference to FIGS. 8, 9 and 10.
8 is an external perspective view of a conventional magnetoresistive element, FIG. 9 is a cross-sectional view taken along the line AA in FIG. 8, and FIG. 10 is a plan view showing a magnetoresistive element pattern forming a magnetoresistive element. Is.

【0003】磁気抵抗素子60は磁性体基板1、磁気抵
抗素子パタ−ン2、保護膜3、外部接続端子4、4、4
を備えた構造となっている。磁気抵抗素子パタ−ン2は
互いに対称な一対の感磁部5、5と、各感磁部5、5の
一端側にそれぞれ接続された接続電極6、6と、各感磁
部5、5の他端側同士を接続する連結電極7と、連結電
極7に接続された引出電極8とが一体化された構造を有
しており、前記磁性体基板1に樹脂層10により構成さ
れている。
The magnetoresistive element 60 comprises a magnetic substrate 1, a magnetoresistive element pattern 2, a protective film 3, and external connection terminals 4, 4, and 4.
It has a structure with. The magnetoresistive element pattern 2 includes a pair of magnetically sensitive portions 5 and 5, which are symmetrical to each other, connection electrodes 6 and 6 respectively connected to one end side of the magnetically sensitive portions 5 and 5, and the magnetically sensitive portions 5 and 5, respectively. Has a structure in which a connecting electrode 7 connecting the other end sides of the connecting electrode 7 and an extraction electrode 8 connected to the connecting electrode 7 are integrated, and is composed of a resin layer 10 on the magnetic substrate 1. .

【0004】前記感磁部5、5はミアンダライン状に形
成されたInSb薄膜5a、5aと、前記InSb薄膜
5a、5aに折り返し部分と途中の何ヶ所かに所定の間
隔をおいて形成されたAl、Tiからなる短絡膜5bか
ら構成されている。また前記接続電極6、6、連結電極
7、引出電極8は前記InSb薄膜5a、5aに連続し
たInSb薄膜(図示せず)とこれらに形成されたA
l、Tiからなる金属膜6b、6b、7b、8bとから
構成されている。前記保護膜3は、接続電極6、6と引
出電極8の一部を除いて、磁気抵抗素子パタ−ン2を覆
うように形成されている。外部接続端子4、4、4は接
続電極6、6と引出電極8の露出部分に接続されてい
る。
The magnetically sensitive portions 5 and 5 are formed by forming InSb thin films 5a and 5a formed in a meandering line shape, and folding portions of the InSb thin films 5a and 5a and a predetermined interval at several points in the middle. It is composed of a short-circuit film 5b made of Al and Ti. Further, the connection electrodes 6, 6, the connection electrode 7, and the extraction electrode 8 are InSb thin films (not shown) continuous with the InSb thin films 5a, 5a and A formed thereon.
It is composed of metal films 6b, 6b, 7b and 8b made of 1 and Ti. The protective film 3 is formed so as to cover the magnetoresistive element pattern 2 except for a part of the connection electrodes 6, 6 and the extraction electrode 8. The external connection terminals 4, 4, 4 are connected to the exposed portions of the connection electrodes 6, 6 and the extraction electrode 8.

【0005】上述した磁気抵抗素子60は、このような
構造により一対の感磁部5、5の抵抗値の差を、引出電
極8と接続電極6とで取り出すことにより外部磁界の変
化を検知する。
The above-described magnetoresistive element 60 detects the change in the external magnetic field by taking out the difference in the resistance values of the pair of magnetic sensitive parts 5 and 5 by the extraction electrode 8 and the connection electrode 6 by such a structure. .

【0006】以下に従来の磁気抵抗素子60の製造工程
を順に説明する。
The manufacturing process of the conventional magnetoresistive element 60 will be described below in order.

【0007】まずマイカ基板上にInSb薄膜を三温度
法による蒸着で作成する。このInSb薄膜をフォトリ
ソグラフィ−とエッチングにより一対の対称なミアンダ
ライン形状を持つInSb薄膜5a、5aと、これに連
続するInSb薄膜(図示せず)とを形成する。エッチ
ングはInSb薄膜層の形状が完全に形成されるまで、
エッチング液である塩化第二鉄水溶液に含浸して行う。
つぎに真空蒸着法とフォトリソグラフィ−によりAl、
Tiからなる短絡膜5bと金属膜6b、7b、8bをI
nSb薄膜の上に形成し磁気抵抗素子パタ−ン2を得
る。そして磁気抵抗素子パタ−ン2を磁性体基板1に樹
脂層10を介して配置した後、熱処理により樹脂層10
を硬化して磁性体基板1と磁気抵抗素子パタ−ン2とを
接着する。そしてマイカ基板を剥離除去したのち磁気抵
抗素子パタ−ン2を保護するための保護膜3を、外部接
続端子4、4、4を接続する接続電極6、6および引出
電極8の接続部分を除く磁気抵抗素子パタ−ン2の上面
に形成する。そして外部接続端子4、4、4を接続電極
6、6、引出電極8に熱圧着法などにより接続して磁気
抵抗素子60を得る。
First, an InSb thin film is formed on a mica substrate by vapor deposition by a three-temperature method. This InSb thin film is formed by photolithography and etching to form a pair of symmetrical InSb thin films 5a and 5a and a continuous InSb thin film (not shown). Etching is performed until the shape of the InSb thin film layer is completely formed.
It is performed by impregnating it with an aqueous ferric chloride solution which is an etching solution.
Next, by vacuum deposition and photolithography, Al,
The short-circuit film 5b made of Ti and the metal films 6b, 7b, 8b are I
A magnetoresistive element pattern 2 is obtained by forming it on the nSb thin film. Then, after the magnetoresistive element pattern 2 is arranged on the magnetic substrate 1 with the resin layer 10 interposed therebetween, the resin layer 10 is heat-treated.
Is cured to bond the magnetic substrate 1 and the magnetoresistive element pattern 2 together. After peeling and removing the mica substrate, the protective film 3 for protecting the magnetoresistive element pattern 2 is removed except for the connection portions of the connection electrodes 6, 6 connecting the external connection terminals 4, 4, 4 and the extraction electrode 8. It is formed on the upper surface of the magnetoresistive element pattern 2. Then, the external connection terminals 4, 4, 4 are connected to the connection electrodes 6, 6, and the extraction electrode 8 by a thermocompression bonding method or the like to obtain the magnetoresistive element 60.

【0008】[0008]

【発明が解決しようとする課題】ところがこのような構
成の磁気抵抗素子60を、ピッチの大きな被検出体に適
用する場合は一対の感磁部5、5間の間隔を大きくする
必要がある。
However, when the magnetoresistive element 60 having such a structure is applied to an object to be detected having a large pitch, it is necessary to increase the distance between the pair of magnetic sensitive parts 5, 5.

【0009】このような構成を採用した場合、中央部分
の全面に形成したInSb薄膜のエッチングされる量が
多くなるため各感磁部5、5の中央側の側面が余分にエ
ッチングされて感磁部5、5の形状が痩せてしまうこと
があった。このために感磁部5、5の抵抗値のバラツキ
が大きくなる。また磁気抵抗素子パタ−ン2の形成面を
樹脂層10により磁性体基板1に接着する際、感磁部間
に入り込む樹脂量が多いので樹脂層10の硬化時に発生
する収縮力が大きくなる。従って収縮力による引張り応
力によって磁気抵抗素子パタ−ンの形状が崩れたり、パ
タ−ンが破壊する事もある。
If such a structure is adopted, the amount of etching of the InSb thin film formed on the entire surface of the central portion is increased, so that the side surfaces of the magnetic sensitive portions 5 and 5 on the central side are excessively etched and the magnetic sensitivity is increased. The shapes of the parts 5 and 5 were sometimes thin. For this reason, the variations in the resistance values of the magnetically sensitive portions 5 and 5 become large. Further, when the surface on which the magnetoresistive element pattern 2 is formed is adhered to the magnetic substrate 1 by the resin layer 10, a large amount of resin enters between the magnetic sensitive parts, so that the shrinkage force generated during curing of the resin layer 10 becomes large. Accordingly, the shape of the magnetoresistive element pattern may be collapsed or the pattern may be destroyed by the tensile stress due to the contracting force.

【0010】本発明の目的は上記問題点を解決するため
のものであり、感磁部の抵抗値のバラツキが小さく信頼
性の高い磁気抵抗素子を提供することにある。
An object of the present invention is to solve the above-mentioned problems, and it is an object of the present invention to provide a highly reliable magnetoresistive element with a small variation in the resistance value of the magnetic sensing part.

【0011】[0011]

【課題を解決するための手段】本発明の磁気抵抗素子
は、一対の感磁部を有する磁気抵抗素子パタ−ンと補助
パタ−ンとが、樹脂層によって磁性体基板上に接着され
たことを特徴とする。
In the magnetoresistive element of the present invention, a magnetoresistive element pattern having a pair of magnetic sensitive parts and an auxiliary pattern are adhered on a magnetic substrate by a resin layer. Is characterized by.

【0012】また本発明の磁気抵抗素子は、一対の感磁
部間に補助パタ−ンが配置された事を特徴とする。
The magnetoresistive element of the present invention is characterized in that an auxiliary pattern is arranged between a pair of magnetic sensitive sections.

【0013】[0013]

【作用】磁気抵抗素子パタ−ンに補助パタ−ンを設けて
InSb薄膜層をエッチングする面積を減らすことによ
り、サイドエッチ量が減りパタ−ン全体のエッチング精
度が向上する。また樹脂により基板に接着するときパタ
−ン間に入り込む樹脂量が減るので樹脂の収縮応力が緩
和される。
By providing an auxiliary pattern on the magnetoresistive element pattern to reduce the area for etching the InSb thin film layer, the side etching amount is reduced and the etching accuracy of the entire pattern is improved. Further, when the resin is adhered to the substrate, the amount of the resin that enters between the patterns is reduced, so that the shrinkage stress of the resin is relieved.

【0014】[0014]

【実施例】【Example】

(実施例1)本発明の実施例1に係る磁気抵抗素子20
を図1〜図4を用いて詳細に説明する。図1は磁気抵抗
素子20の外観斜視図、図2は磁気抵抗素子20を図1
に示す直線A−Aで切断した時の断面図、図3は磁気抵
抗素子20を構成する磁気抵抗素子パタ−ン2aの平面
図、図4は磁気抵抗素子20の平面図を示す。また従来
例と同一の部分には同一の符号を付し、その説明を省略
する。
(Example 1) A magnetoresistive element 20 according to Example 1 of the present invention.
Will be described in detail with reference to FIGS. 1 is an external perspective view of the magnetoresistive element 20, and FIG.
3 is a sectional view taken along the line AA shown in FIG. 3, FIG. 3 is a plan view of the magnetoresistive element pattern 2a constituting the magnetoresistive element 20, and FIG. 4 is a plan view of the magnetoresistive element 20. Further, the same parts as those of the conventional example are designated by the same reference numerals, and the description thereof will be omitted.

【0015】本実施例の磁気抵抗素子20の特徴は、一
対の感磁部5、5を備えた磁気抵抗素子パタ−ン2aの
引出電極8が一対の感磁部5、5に挟まれた部分に配置
された構造を有するところにある。すなわち引出電極8
は長方形形状をしており、磁気抵抗素子20の一方の側
面1a近傍の上面に形成された磁気抵抗素子パタ−ン2
aの連結電極7から相対する他方の側面1b近傍まで延
び、一対の感磁部5、5に挟まれた部分に配置されてい
る。また接続電極6、6と引出電極8に接続される外部
接続端子4、4、4は同一端面から引き出されている。
The characteristic of the magnetoresistive element 20 of this embodiment is that the extraction electrode 8 of the magnetoresistive element pattern 2a having the pair of magnetic sensitive portions 5 and 5 is sandwiched between the pair of magnetic sensitive portions 5 and 5. It has a structure arranged in parts. That is, the extraction electrode 8
Has a rectangular shape, and the magnetoresistive element pattern 2 is formed on the upper surface of the magnetoresistive element 20 in the vicinity of one side surface 1a.
It extends from the connecting electrode 7 of a to the vicinity of the other opposite side surface 1b, and is arranged in a portion sandwiched by the pair of magnetic sensitive portions 5, 5. The external connection terminals 4, 4, 4 connected to the connection electrodes 6, 6 and the extraction electrode 8 are drawn out from the same end face.

【0016】そのため一対の感磁部5、5間のエッチン
グにより除去する部分の面積が減り磁気抵抗素子パタ−
ン2a全体を均一にエッチングできるようになるので、
磁気抵抗素子パタ−ン2aの精度が向上する。またエッ
チングにより形成した磁気抵抗素子パタ−ン2aを樹脂
層10で磁性体基板1に接着するとき、感磁部間に入る
樹脂量が減るので樹脂層10の硬化収縮による収縮応力
を緩和できるため磁気抵抗素子パタ−ン2aのパタ−ン
崩れが減少し、パタ−ンが破壊することがなくなる。
Therefore, the area of the portion between the pair of magnetic sensitive portions 5 and 5 to be removed by etching is reduced, and the magnetoresistive element pattern is formed.
Since it becomes possible to uniformly etch the whole 2a,
The accuracy of the magnetoresistive element pattern 2a is improved. Further, when the magnetoresistive element pattern 2a formed by etching is bonded to the magnetic substrate 1 by the resin layer 10, the amount of resin entering between the magnetic sensitive parts is reduced, so that shrinkage stress due to curing shrinkage of the resin layer 10 can be relaxed. The pattern collapse of the magnetoresistive element pattern 2a is reduced, and the pattern is not destroyed.

【0017】上記実施例磁気抵抗素子20を従来技術で
示した製造工程と同一の工程で製造し、磁気抵抗素子パ
タ−ン2aの形状とフォトマスク上の同じ位置の形状か
らの痩せ(サイドエッチング幅)とを光学顕微鏡により
比較測定したところ、測定限界値以下であった。また樹
脂層10により磁気抵抗素子パタ−ン2aを磁性体基板
1に接着した時、感磁部5、5の形状崩れは確認できな
かった。
The magnetoresistive element 20 of the above-mentioned embodiment is manufactured by the same process as the manufacturing process shown in the prior art, and the shape of the magnetoresistive element pattern 2a and the shape at the same position on the photomask are thinned (side etching). (Width) was compared and measured by an optical microscope, and was below the measurement limit value. Further, when the magnetoresistive element pattern 2a was adhered to the magnetic substrate 1 by the resin layer 10, no deformation of the magnetic sensitive parts 5, 5 could be confirmed.

【0018】完成した前記磁気抵抗素子20をCuによ
り配線されたプリント基板上に市販のクリ−ム半田を用
いて実装し、評価試験を行った。その結果、25℃、3
000Gにおける磁界での磁気抵抗変化率は3.3であ
った。また−40℃と120℃との間を10回昇降温す
る熱衝撃試験において、抵抗値変動は3%以下で従来の
設計による磁気抵抗素子の磁気抵抗変化率の1/3以下
であった。以上の値はともに規格を満足する値である。
The completed magnetoresistive element 20 was mounted on a printed circuit board wired with Cu using a commercially available cream solder, and an evaluation test was conducted. As a result, 25 ℃, 3
The rate of change in magnetoresistance under a magnetic field at 000 G was 3.3. In a thermal shock test in which the temperature was raised and lowered 10 times between −40 ° C. and 120 ° C., the resistance variation was 3% or less, which was 1/3 or less of the magnetoresistance change rate of the magnetoresistive element according to the conventional design. The above values are values that satisfy the standards.

【0019】(実施例2)本発明の実施例に係る磁気抵
抗素子を図5を用いて詳細に説明する。図5は磁気抵抗
素子を構成する磁気抵抗素子パタ−ン30aの平面図で
ある。また従来例と同一の部分には同一の符号を付し、
その説明を省略する。
(Embodiment 2) A magnetoresistive element according to an embodiment of the present invention will be described in detail with reference to FIG. FIG. 5 is a plan view of a magnetoresistive element pattern 30a forming the magnetoresistive element. The same parts as those of the conventional example are designated by the same reference numerals,
The description is omitted.

【0020】本実施例の磁気抵抗素子の特徴は、補助パ
タ−ン15が一対の感磁部5、5に挟まれた部分に配置
された構造を有するところにある。すなわち補助パタ−
ン15は長方形形状をしており、磁気抵抗素子の一方の
側面1a近傍の上面に形成された磁気抵抗素子パタ−ン
30aの連結電極7から相対する他方の側面1b近傍ま
で延び、一対の感磁部5、5に挟まれた部分に配置され
ている。
A characteristic of the magnetoresistive element of the present embodiment is that the auxiliary pattern 15 is arranged in a portion sandwiched by a pair of magnetic sensitive portions 5, 5. That is, the auxiliary pattern
The rectangular shape 15 has a rectangular shape and extends from the connecting electrode 7 of the magnetoresistive element pattern 30a formed on the upper surface in the vicinity of one side surface 1a of the magnetoresistive element to the vicinity of the other side surface 1b which faces the side surface 1a. It is arranged in the portion sandwiched by the magnetic portions 5, 5.

【0021】そのため一対の感磁部5、5間のエッチン
グにより除去する部分の面積が減り磁気抵抗素子パタ−
ン30a全体を均一にエッチングできるようになるの
で,磁気抵抗素子パタ−ン30aの精度が向上する。ま
たエッチングにより形成した磁気抵抗素子パタ−ン30
aを樹脂層で磁性体基板1に接着するとき、感磁部間に
入る樹脂量が減るので樹脂層の硬化収縮による収縮応力
を緩和できるため磁気抵抗素子パタ−ン30aのパタ−
ン崩れが減少する。
Therefore, the area of the portion between the pair of magnetic sensitive portions 5 and 5 to be removed by etching is reduced, and the magnetoresistive element pattern is formed.
Since the entire pattern 30a can be uniformly etched, the accuracy of the magnetoresistive element pattern 30a is improved. Further, the magnetoresistive element pattern 30 formed by etching
When a is adhered to the magnetic substrate 1 with a resin layer, the amount of resin entering between the magnetic sensitive parts is reduced, so that the contraction stress due to the curing contraction of the resin layer can be relaxed, so that the pattern of the magnetoresistive element pattern 30a can be reduced.
The collapse is reduced.

【0022】本実施例による磁気抵抗素子においても実
施例1と同様の方法で評価した結果、光学顕微鏡による
パタ−ン形状の観察では形状崩れは確認できず、評価試
験や熱衝撃試験においても同等の結果が得られた。
The magnetoresistive element according to the present example was also evaluated by the same method as in Example 1. As a result, the shape collapse could not be confirmed by observing the pattern shape with an optical microscope, and the same result was obtained in the evaluation test and the thermal shock test. The result was obtained.

【0023】(実施例3)本発明の実施例に係る磁気抵
抗素子を図6を用いて詳細に説明する。図6は磁気抵抗
素子を構成する磁気抵抗素子パタ−ン40aの平面図で
ある。また従来例と同一の部分には同一の符号を付し、
その説明を省略する。
(Embodiment 3) A magnetoresistive element according to an embodiment of the present invention will be described in detail with reference to FIG. FIG. 6 is a plan view of a magnetoresistive element pattern 40a forming the magnetoresistive element. The same parts as those of the conventional example are designated by the same reference numerals,
The description is omitted.

【0024】本実施例の磁気抵抗素子の特徴は、一対の
感磁部5、5を備えた磁気抵抗素子パタ−ン40aの引
出電極8が一対の感磁部5、5に挟まれた部分に配置さ
れるとともに、各接続電極6、6が各感磁部5、5と磁
気抵抗素子の側面1c、1dとの間にそれぞれ延設され
た構造を有するところにある。すなわち引出電極8は長
方形形状をしており、磁気抵抗素子の一方の側面1a近
傍の上面に形成された磁気抵抗素子パタ−ン40aの連
結電極7から相対する他方の側面1b近傍まで延び、一
対の感磁部5、5に挟まれた部分に配置されている。ま
た各接続電極6、6は各感磁部5、5と磁気抵抗素子の
側面1c、1dとの間で磁気抵抗素子の一方の側面1
a、1b近傍まで延設されている。さらに接続電極6、
6と引出電極8に接続される外部接続端子4、4、4は
同一端面から引き出されている。
The feature of the magnetoresistive element of this embodiment is that the extraction electrode 8 of the magnetoresistive element pattern 40a having the pair of magnetic sensitive portions 5 and 5 is sandwiched between the pair of magnetic sensitive portions 5 and 5. And has a structure in which the connection electrodes 6, 6 are respectively extended between the magnetic sensitive portions 5, 5 and the side surfaces 1c, 1d of the magnetoresistive element. That is, the extraction electrode 8 has a rectangular shape and extends from the connecting electrode 7 of the magnetoresistive element pattern 40a formed on the upper surface in the vicinity of one side surface 1a of the magnetoresistive element to the vicinity of the other side surface 1b which faces the magnetoresistive element. It is arranged in a portion sandwiched between the magnetic sensitive portions 5 and 5. Further, each of the connection electrodes 6, 6 is located between one of the magnetic sensitive portions 5, 5 and the side surface 1c, 1d of the magnetoresistive element and one side surface 1 of the magnetoresistive element.
It is extended to the vicinity of a and 1b. Furthermore, the connection electrode 6,
External connection terminals 4, 4, 4 connected to 6 and the extraction electrode 8 are drawn out from the same end face.

【0025】以上の構造を持つ磁気抵抗素子パタ−ン4
0aは、一対の感磁部5、5間のエッチングにより除去
する部分の面積が減るので、磁気抵抗素子パタ−ン40
a全体を均一にエッチングできるようになるので、磁気
抵抗素子パタ−ン40aの精度が向上する。またエッチ
ングにより形成した磁気抵抗素子パタ−ン40aを樹脂
層で磁性体基板1に接着するとき、感磁部間に入る樹脂
量が減るので樹脂層の硬化収縮による収縮応力を緩和で
きるため磁気抵抗素子パタ−ン40aのパタ−ン崩れが
減少する。
Magnetoresistive element pattern 4 having the above structure
In the case of 0a, the area of the portion to be removed by etching between the pair of magnetic sensitive portions 5 and 5 is reduced, so that the magnetoresistive element pattern 40 is formed.
Since the entire a can be etched uniformly, the accuracy of the magnetoresistive element pattern 40a is improved. Further, when the magnetoresistive element pattern 40a formed by etching is adhered to the magnetic substrate 1 with the resin layer, the amount of resin entering between the magnetic sensitive parts is reduced, so that the shrinkage stress due to the curing shrinkage of the resin layer can be relaxed, so that the magnetic resistance is reduced. The pattern collapse of the element pattern 40a is reduced.

【0026】本実施例による磁気抵抗素子においても実
施例1と同様の方法で評価した結果、光学顕微鏡による
パタ−ン形状の観察では形状崩れは確認できず、評価試
験や熱衝撃試験においても同等の結果が得られた。
The magnetoresistive element according to this example was also evaluated in the same manner as in Example 1. As a result, the shape collapse could not be confirmed by observing the pattern shape with an optical microscope, and the same result was obtained in the evaluation test and the thermal shock test. The result was obtained.

【0027】(実施例4)本発明の実施例に係る磁気抵
抗素子を図7を用いて詳細に説明する。図7は磁気抵抗
素子を構成する磁気抵抗素子パタ−ン50aの平面図で
ある。また従来例と同一の部分には同一の符号を付し、
その説明を省略する。
(Embodiment 4) A magnetoresistive element according to an embodiment of the present invention will be described in detail with reference to FIG. FIG. 7 is a plan view of a magnetoresistive element pattern 50a constituting the magnetoresistive element. The same parts as those of the conventional example are designated by the same reference numerals,
The description is omitted.

【0028】本実施例の磁気抵抗素子の特徴は、磁気抵
抗素子パタ−ン50aを除くほぼ全面に補助パタ−ン1
5が配置された構造を有するところにある。すなわち補
助パタ−ン15が各感磁部5、5のミアンダライン間、
各感磁部5、5間、各感磁部5、5と磁気抵抗素子の各
側面1a、1b、1c、1d間に設けられている。
The magnetoresistive element of this embodiment is characterized in that the auxiliary pattern 1 is formed on almost the entire surface except for the magnetoresistive element pattern 50a.
5 has the structure arranged. That is, the auxiliary pattern 15 is arranged between the meander lines of the magnetic sensitive parts 5 and 5,
It is provided between the magnetic sensitive portions 5 and 5, and between the magnetic sensitive portions 5 and 5 and the side surfaces 1a, 1b, 1c and 1d of the magnetoresistive element.

【0029】以上の構造を持つ磁気抵抗素子パタ−ン5
0aは、一対の感磁部5、5間のエッチングにより除去
する部分の面積が減るので磁気抵抗素子パタ−ン50a
全体を均一にエッチングできるようになるので、磁気抵
抗素子パタ−ン50aの精度が向上する。またエッチン
グにより形成した磁気抵抗素子パタ−ン50aを樹脂層
で磁性体基板1に接着するとき、感磁部間に入る樹脂量
が減るので樹脂層の硬化収縮による収縮応力を緩和でき
るため磁気抵抗素子パタ−ン50aのパタ−ン崩れが減
少する。
Magnetoresistive element pattern 5 having the above structure
In the case of 0a, the area of the portion to be removed by etching between the pair of magnetic sensitive portions 5 and 5 is reduced, so that the magnetoresistive element pattern 50a.
Since the whole can be etched uniformly, the accuracy of the magnetoresistive element pattern 50a is improved. Further, when the magnetoresistive element pattern 50a formed by etching is adhered to the magnetic substrate 1 with the resin layer, the amount of the resin entering between the magnetic sensitive parts is reduced, so that the shrinkage stress due to the curing shrinkage of the resin layer can be relaxed, so that the magnetic resistance can be reduced. The pattern collapse of the element pattern 50a is reduced.

【0030】本実施例による磁気抵抗素子においても実
施例1と同様の方法で評価した結果、光学顕微鏡による
パタ−ン形状の観察では形状崩れは確認できず、評価試
験や熱衝撃試験においても同等の結果が得られた。
The magnetoresistive element according to this example was also evaluated in the same manner as in Example 1. As a result, the shape collapse could not be confirmed by observing the pattern shape with an optical microscope, and the same result was obtained in the evaluation test and the thermal shock test. The result was obtained.

【0031】以上のように本発明の磁気抵抗素子を実施
例1〜4をもちいて説明したが、本発明はこれに限定さ
れるものではなく、本発明の範囲内で種々の変形を加え
る事ができる。上述した実施例では外部接続端子4、
4、4をもちいて接続するような構造としたが、面実装
するために素子の端部に外部接続用電極を設けるように
しても良い。
The magnetoresistive element of the present invention has been described above with reference to Examples 1 to 4, but the present invention is not limited to this, and various modifications can be made within the scope of the present invention. You can In the embodiment described above, the external connection terminal 4,
Although the structure for connecting by using 4 and 4 is adopted, an electrode for external connection may be provided at the end of the element for surface mounting.

【0032】[0032]

【発明の効果】本発明における磁気抵抗素子は一対の感
磁部を有する磁気抵抗素子パタ−ンと補助パタ−ンと
が、樹脂層によって磁性体基板上に接着された構造を有
している。したがって磁気抵抗素子パタ−ンをエッチン
グする時のサイドエッチ量がへりパタ−ンの精度が向上
する。また磁気抵抗素子パタ−ンを基板に接着する時の
樹脂の収縮力による引張応力が緩和されるのでパタ−ン
の崩れや破壊を防止する事ができる。
The magnetoresistive element according to the present invention has a structure in which a magnetoresistive element pattern having a pair of magnetic sensitive portions and an auxiliary pattern are bonded to a magnetic substrate by a resin layer. . Therefore, the side etching amount at the time of etching the magnetoresistive element pattern is improved, and the precision of the pattern is improved. Further, since the tensile stress due to the contracting force of the resin when the magnetoresistive element pattern is bonded to the substrate is relaxed, it is possible to prevent the pattern from collapsing or breaking.

【0033】よって本発明の磁気抵抗素子によれば感磁
部の抵抗値のバラツキが小さく信頼性を向上することが
できる。
Therefore, according to the magnetoresistive element of the present invention, the variation in the resistance value of the magnetic sensitive portion is small and the reliability can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例1に係る磁気抵抗素子を示す外
観斜視図である。
FIG. 1 is an external perspective view showing a magnetoresistive element according to a first embodiment of the present invention.

【図2】本発明の実施例1に係る磁気抵抗素子を示す断
面図である。
FIG. 2 is a sectional view showing a magnetoresistive element according to Example 1 of the present invention.

【図3】本発明の実施例1に係る磁気抵抗素子の磁気抵
抗素子パタ−ンおよび補助パタ−ンを示す平面図であ
る。
FIG. 3 is a plan view showing a magnetoresistive element pattern and an auxiliary pattern of the magnetoresistive element according to the first embodiment of the present invention.

【図4】本発明の実施例1に係る磁気抵抗素子を示す平
面図である。
FIG. 4 is a plan view showing a magnetoresistive element according to Example 1 of the present invention.

【図5】本発明の実施例2に係る磁気抵抗素子の磁気抵
抗素子パタ−ンおよび補助パタ−ンを示す平面図であ
る。
FIG. 5 is a plan view showing a magnetoresistive element pattern and an auxiliary pattern of a magnetoresistive element according to Example 2 of the present invention.

【図6】本発明の実施例3に係る磁気抵抗素子の磁気抵
抗素子パタ−ンおよび補助パタ−ンを示す平面図であ
る。
FIG. 6 is a plan view showing a magnetoresistive element pattern and an auxiliary pattern of a magnetoresistive element according to a third embodiment of the present invention.

【図7】本発明の実施例4に係る磁気抵抗素子の磁気抵
抗素子パタ−ンおよび補助パタ−ンを示す平面図であ
る。
FIG. 7 is a plan view showing a magnetoresistive element pattern and an auxiliary pattern of a magnetoresistive element according to Example 4 of the present invention.

【図8】従来の磁気抵抗素子を示す外観斜視図である。FIG. 8 is an external perspective view showing a conventional magnetoresistive element.

【図9】従来の磁気抵抗素子を示す断面図である。FIG. 9 is a cross-sectional view showing a conventional magnetoresistive element.

【図10】従来の磁気抵抗素子の磁気抵抗素子パタ−ン
を示す平面図である。
FIG. 10 is a plan view showing a magnetoresistive element pattern of a conventional magnetoresistive element.

【符号の説明】[Explanation of symbols]

1 磁性体基板 1a、1b、1c、1d 側面 2、2a、30a,40a、50a 磁気抵抗素
子パタ−ン 3 保護膜 4 外部接続端
子 5 感磁部 5a InSb薄
膜 5b 短絡膜 6 接続電極 6b、7b、8b 金属膜 7 連結電極 8 引出電極 10 樹脂層 15 補助パタ−
ン 20 磁気抵抗素
1 Magnetic Substrate 1a, 1b, 1c, 1d Side Surfaces 2, 2a, 30a, 40a, 50a Magnetoresistive Element Pattern 3 Protective Film 4 External Connection Terminal 5 Magnetosensitive Section 5a InSb Thin Film 5b Short Circuit Film 6 Connection Electrode 6b, 7b , 8b Metal film 7 Connection electrode 8 Extraction electrode 10 Resin layer 15 Auxiliary pattern
20 Magnetoresistive element

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】一対の感磁部を有する磁気抵抗素子パタ−
ンと補助パタ−ンとが、樹脂層によって磁性体基板上に
接着されたことを特徴とする磁気抵抗素子。
1. A magnetoresistive element pattern having a pair of magnetically sensitive portions.
A magnetoresistive element in which an auxiliary pattern and an auxiliary pattern are adhered on a magnetic substrate by a resin layer.
【請求項2】前記一対の感磁部間に前記補助パタ−ンが
配置された請求項1に記載の磁気抵抗素子。
2. The magnetoresistive element according to claim 1, wherein the auxiliary pattern is arranged between the pair of magnetic sensitive portions.
JP02419694A 1994-02-22 1994-02-22 Method of manufacturing magnetoresistive element Expired - Lifetime JP3456247B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP02419694A JP3456247B2 (en) 1994-02-22 1994-02-22 Method of manufacturing magnetoresistive element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02419694A JP3456247B2 (en) 1994-02-22 1994-02-22 Method of manufacturing magnetoresistive element

Publications (2)

Publication Number Publication Date
JPH07235710A true JPH07235710A (en) 1995-09-05
JP3456247B2 JP3456247B2 (en) 2003-10-14

Family

ID=12131580

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02419694A Expired - Lifetime JP3456247B2 (en) 1994-02-22 1994-02-22 Method of manufacturing magnetoresistive element

Country Status (1)

Country Link
JP (1) JP3456247B2 (en)

Also Published As

Publication number Publication date
JP3456247B2 (en) 2003-10-14

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