JPH07221152A - Migration tester - Google Patents

Migration tester

Info

Publication number
JPH07221152A
JPH07221152A JP4463594A JP4463594A JPH07221152A JP H07221152 A JPH07221152 A JP H07221152A JP 4463594 A JP4463594 A JP 4463594A JP 4463594 A JP4463594 A JP 4463594A JP H07221152 A JPH07221152 A JP H07221152A
Authority
JP
Japan
Prior art keywords
substrate
water
migration
frame
constant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4463594A
Other languages
Japanese (ja)
Inventor
Yoshinobu Abe
可伸 安部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP4463594A priority Critical patent/JPH07221152A/en
Publication of JPH07221152A publication Critical patent/JPH07221152A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To provide a migration tester, which improves the reproducibility of a water section area over between electrodes and can measure accurately an migration even in a practical substrate. CONSTITUTION:A frame 3 which is mounted at a migration measurement site on a substrate 2, power terminals 5 and 6 formed of an insoluble metal and a hot plate 1 for keeping the temperature of the substrate 2 constant are provided. Accordingly, a measurement of a migration can be made accurately in a practical substrate.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は電子機器に用いられるプ
リント配線基板等の基板において、電圧が印加された状
態でしばしば発生する主として陰極側から伸びるデンド
ライト状の金属が折出するマイグレーション現象の試験
器に関する。さらに詳しく説明すると、マイグレーショ
ン現象の試験方法には水滴を基板に滴下して電圧を印加
する方法と基板を高温高湿度雰囲気中へ置き電圧を印加
する方法とがあるが本発明は前者に属する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is a test for a migration phenomenon in which a dendrite-like metal extending mainly from the cathode side is often generated on a substrate such as a printed wiring board used in electronic equipment when a voltage is applied. Regarding vessels. More specifically, the migration phenomenon testing method includes a method of applying a voltage by dropping a water droplet on a substrate and a method of applying a voltage by placing the substrate in a high temperature and high humidity atmosphere, but the present invention belongs to the former.

【0002】[0002]

【従来の技術】従来は、例えば電極間隔0、32ミリの
Y型の導体をもつ試験専用基板上に蒸留水0、2ccを
垂らし、直流定電圧1、5Vを印加し、リーク電流を測
定、又は直流定電流40マイクロアンペアを流電し降下
電圧を測定するなどの方法でマイグレーション現象の試
験を行なっていた。Y型の導体をもつ試験専用基板とし
たのは基板導体部へ直流電源を印加する端子が水に濡れ
ると、この端子を構成する金属が電気化学的に溶出する
のを防止するためわざわざY型の導体とし、水に濡れな
いよう離れた場所で接続していた。又従来、水滴を基板
に滴下して電圧を印加する方法によるマイグレーション
現象の試験器は市販されてなかった。
2. Description of the Related Art Conventionally, for example, 0 or 2 cc of distilled water is dropped on a test-dedicated substrate having a Y-shaped conductor with an electrode interval of 0 and 32 mm, and a constant DC voltage of 1 or 5 V is applied to measure a leak current. Alternatively, the migration phenomenon was tested by a method in which a DC constant current of 40 microamperes was applied and the drop voltage was measured. The purpose of the test-dedicated board with the Y-type conductor is to purposely prevent the metal that composes this terminal from electrochemically eluting when the terminal that applies the DC power to the board conductor gets wet with water. It was used as a conductor of and was connected at a remote place so as not to get wet with water. Conventionally, a tester for migration phenomenon by a method of applying a voltage by dropping a water drop on a substrate has not been commercially available.

【0003】[0003]

【発明が解決しょうとする課題】水滴滴下電圧印加によ
るマイグレーション試験を行なう場合、水滴の量よりも
むしろ電極間の水の断面積が重要となる。即ち、定電圧
マイグレーション試験の場合電極間のオーム損である電
圧降下は電流と液抵抗の積となるが液抵抗は電極間の水
の断面積に反比例する。即ち、オーム損は水の断面積に
反比例する。従って、たとえ一定量の水を滴下しても水
に濡れやすい基板の場合広く広がり水の断面積が小さく
なる。従って、再現性のあるマイグレーション試験を行
なうには水の断面積を一定とする必要がある。又、Y型
の導体7を使えば、水に濡れないよう離れた場所で接続
できるが、実際問題として、通常の電気機器に使用する
実用基板で水滴滴下電圧印加によるマイグレーション試
験を行なう場合は、端子部が水で濡れる恐れがあり、端
子部が水で濡れると端子金属が電気化学的に溶出し、正
確な試験を行なうことができないという欠点があった。
また試験は同一温度で行う方が正確なことはいうまでも
ない。
When carrying out a migration test by applying a water drop voltage, the cross-sectional area of water between electrodes becomes more important than the amount of water drops. That is, in the constant voltage migration test, the voltage drop, which is the ohmic loss between the electrodes, is the product of the current and the liquid resistance, but the liquid resistance is inversely proportional to the cross-sectional area of water between the electrodes. That is, ohmic loss is inversely proportional to the cross-sectional area of water. Therefore, even if a certain amount of water is dropped, a substrate that is easily wetted by water will spread widely and the cross-sectional area of water will become small. Therefore, in order to perform a reproducible migration test, it is necessary to make the cross-sectional area of water constant. In addition, if the Y-shaped conductor 7 is used, it can be connected at a remote place so as not to get wet with water. However, as a practical matter, when performing a migration test by applying a water drop dripping voltage on a practical substrate used for ordinary electric equipment, There is a possibility that the terminal portion may get wet with water, and if the terminal portion gets wet with water, the terminal metal may be electrochemically eluted and an accurate test cannot be performed.
Needless to say, it is more accurate to carry out the test at the same temperature.

【0004】[0004]

【課題を解決するための手段】本発明は上記の問題点を
解決すべく提案されたもので、ピペット等により滴下量
を一定量とするのは当然のことであるが、水を滴下する
前に予め基板上に非導電性でかつ非透水性でかつ非漏水
性の材料で形成された枠を装着する。又端子ニードルは
電気化学的に金属イオンの溶出しない不溶性金属で形成
する。更に、試験基板を一定温度に加熱できるホットプ
レートを備える。
The present invention has been proposed in order to solve the above-mentioned problems, and it is natural to make the dropping amount constant with a pipette or the like, but before dropping water. In advance, a frame formed of a non-conductive, water-impermeable, non-leakable material is mounted on the substrate. Further, the terminal needle is formed of an insoluble metal that electrochemically does not elute metal ions. Further, a hot plate capable of heating the test substrate to a constant temperature is provided.

【0005】[0005]

【作用】水を滴下する前に予め基板上に非導電性でかつ
非透水性でかつ非漏水性の材料で形成された枠を装着し
た後、一定量の水を滴下すると水はこの枠内にほぼ均一
に広がり水の断面積が常にほぼ一定となる。又、端子ニ
ードルを電気化学的に金属イオンの溶出しない不溶性金
属で形成したことにより、たとえ端子ニードル間が水で
連続的につながった状態で両端子に電圧が印加されても
されても両端子ニードルから金属イオンは溶出しない。
更に試験基板の下に一定温度に加熱できるホットプレー
トを備えたことにより試験基板温度が試験中一定温度と
なる。
[Function] Before the water is dropped, a frame made of a non-conductive, water-impermeable, non-leakable material is mounted on the substrate in advance, and a certain amount of water is dropped into the frame. Spreads almost uniformly over the water and the cross-sectional area of water is almost constant. In addition, since the terminal needle is made of an insoluble metal that electrochemically does not elute metal ions, even if a voltage is applied to both terminals even if the terminals are continuously connected with water, No metal ions are eluted from the needle.
Furthermore, by providing a hot plate under the test substrate that can be heated to a constant temperature, the test substrate temperature becomes a constant temperature during the test.

【0006】[0006]

【実施例】図2に示す通り、まず基板2を一定の温度に
加熱できるホットプレート1上に載せ、次に基板2上に
ゴム製の枠3を装着する。枠の装着は枠の裏面に粘着剤
や接着剤を予め塗布しておき枠を基板に張り付けてもよ
いし、枠をバネやクランプその他の方法で押し付けても
よい。この枠の内側へピペット4で一定量の水を注入す
る。次にチタン上に白金めっきした電源端子ニードル
5、6を枠の内側または外側の電極部8、9へ接触固定
させる。次に電源を印加し、定電圧の場合はリーク電流
を、定電流の場合は電圧降下を測定しレコーダで記録す
る。
EXAMPLE As shown in FIG. 2, a substrate 2 is first placed on a hot plate 1 which can be heated to a constant temperature, and then a rubber frame 3 is mounted on the substrate 2. To mount the frame, an adhesive or an adhesive may be applied to the back surface of the frame in advance and the frame may be attached to the substrate, or the frame may be pressed by a spring, a clamp, or another method. A certain amount of water is injected into the inside of this frame with the pipette 4. Next, the platinum-plated power supply terminal needles 5 and 6 on titanium are fixed in contact with the electrode portions 8 and 9 inside or outside the frame. Next, a power supply is applied, and in the case of a constant voltage, the leak current is measured, and in the case of a constant current, the voltage drop is measured and recorded by a recorder.

【0007】[0007]

【発明の効果】水を滴下する前に予め基板2上に非導電
性でかつ非透水性でかつ非漏水性の材料で形成された枠
3を装着した後、一定量の水を滴下すると水はこの枠内
にほぼ均一に広がり水の断面積が常にほぼ一定となるこ
とから、電極8、9間のオーム損の再現性が向上し、正
確な測定が可能となる。又、端子ニードル5、6を電気
化学的に金属イオンの溶出しない不溶性金属で形成した
ことにより、たとえ端子ニードル5、6間が水で連続的
につながった状態で両端子5、6に電圧が印加されても
されても両端子ニードル5、6から金属イオンは溶出し
ないことから、実用基板等において端子ニードル5、6
を水中に浸漬して接触させることも可能となり、どのよ
うな基板でもマイグレーション試験が可能となる。更に
試験基板2の下に一定温度に加熱できるホットプレート
1を備えたことにより試験基板2の温度が試験中一定温
度となることから、正確な測定が可能となる。
EFFECTS OF THE INVENTION After a frame 3 made of a non-conductive, non-water-permeable and non-leakable material is mounted on the substrate 2 before dropping water, a predetermined amount of water is dropped. Spreads almost uniformly within this frame, and the cross-sectional area of water is almost constant at all times. Therefore, the reproducibility of the ohmic loss between the electrodes 8 and 9 is improved, and accurate measurement is possible. In addition, since the terminal needles 5 and 6 are formed of an insoluble metal that electrochemically does not elute metal ions, voltage is applied to both terminals 5 and 6 even when the terminal needles 5 and 6 are continuously connected with water. Since metal ions do not elute from both terminal needles 5 and 6 when applied or applied, the terminal needles 5 and 6 cannot be used on a practical substrate or the like.
It is also possible to immerse them in water and bring them into contact with each other, and a migration test can be performed on any substrate. Further, since the hot plate 1 that can be heated to a constant temperature is provided below the test substrate 2, the temperature of the test substrate 2 becomes a constant temperature during the test, so that accurate measurement is possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】従来、水滴滴下電圧印加マイグレーション試験
を行なう場合のY型導体図である。
FIG. 1 is a Y-shaped conductor diagram in the case of performing a conventional water drop dropping voltage application migration test.

【図2】本発明の実施例における斜視図である。FIG. 2 is a perspective view of an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 ホットプレート 2 試験基板 3 枠 4 ピペット 5 チタン上に白金めっきした電源端子ニードル(陽
極側) 6 チタン上に白金めっきした電源端子ニードル(陰
極側) 7 Y型導体 8 電極(陽極側) 9 電極(陰極側)
1 Hot Plate 2 Test Substrate 3 Frame 4 Pipette 5 Platinum Plated Power Terminal Needle (Anode Side) 6 Platinum Plated Power Terminal Needle (Cathode Side) 7 Y-type Conductor 8 Electrode (Anode Side) 9 Electrode (Cathode side)

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】基板上に非導電性でかつ非透水性でかつ非
漏水性の材料で形成された枠を装着し、この枠の内側へ
ピペットなど一定量の水を注入できる装置を備えたこと
を特徴とする定電圧式および定電流式マイグレーション
試験器
1. A device provided with a frame, which is made of a non-conductive, water-impermeable and non-leakable material, mounted on a substrate and which can inject a fixed amount of water into the inside of the frame. Constant voltage type and constant current type migration tester characterized by
【請求項2】基板上の2箇所の導体部へ、電気化学的に
陽極に使用しても金属イオンの溶出しない不溶性金属で
形成された2本のニードルを接触させることを特徴とす
る定電圧式および定電流式マイグレーション試験器
2. A constant voltage, characterized in that two needles made of an insoluble metal that does not elute metal ions electrochemically when used as an anode are brought into contact with two conductors on a substrate. And constant current migration testers
【請求項3】試験基板の下部に、試験基板温度を常に一
定温度とできる加熱装置を設けたことを特徴とした請求
項1、2記載のマイグレーション試験器
3. The migration tester according to claim 1, further comprising a heating device provided below the test substrate to keep the temperature of the test substrate constant.
JP4463594A 1994-02-07 1994-02-07 Migration tester Pending JPH07221152A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4463594A JPH07221152A (en) 1994-02-07 1994-02-07 Migration tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4463594A JPH07221152A (en) 1994-02-07 1994-02-07 Migration tester

Publications (1)

Publication Number Publication Date
JPH07221152A true JPH07221152A (en) 1995-08-18

Family

ID=12696896

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4463594A Pending JPH07221152A (en) 1994-02-07 1994-02-07 Migration tester

Country Status (1)

Country Link
JP (1) JPH07221152A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013145194A (en) * 2012-01-16 2013-07-25 Advantest Corp Detection device and detection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013145194A (en) * 2012-01-16 2013-07-25 Advantest Corp Detection device and detection method

Similar Documents

Publication Publication Date Title
US7655128B2 (en) Electrochemical test strip
US3710237A (en) Probe for a conductivity testing device
ATE93320T1 (en) METHOD OF DETECTING AND/OR IDENTIFYING A BIOLOGICAL SUBSTANCE BY ELECTRICAL MEASUREMENTS AND DEVICE FOR PERFORMING SUCH PROCEDURE.
CA2132380A1 (en) Measuring device for removable sensors
MX9603543A (en) Method of making sensor electrodes.
CN206618831U (en) A kind of new alternating temperature Hall effect tester
JPH07221152A (en) Migration tester
US7119556B2 (en) Probe for surface-resistivity measurement and method for measuring surface resistivity
US3335365A (en) Method of measuring interface resistance in electrical connections
US6084414A (en) Testing for leakage currents in planar lambda probes
Seger New method of measuring electrode resistance for quality control
US4360774A (en) Apparatus for measuring the surface insulation characteristics of coatings on magnetic materials
JP2853045B2 (en) PCB prober
DE10122036B4 (en) Substrate holding device for probes for testing circuit arrangements on disc-shaped substrates
EP0711997B1 (en) Electrochemical surface analysis using deoxygenated gel electrolyte
KR100313105B1 (en) Method for measuring contact resistance between liquid crystal display panel and drive device thereof
SU1572170A1 (en) Method of inspection of dielectric film thickness on electrically conducting substrate
JP3067921B2 (en) Soil detection sensor
SU1045177A1 (en) Device for testing protective dielectric coating of semiconductor devices
JP2922909B2 (en) Electrode device for resistance measurement
RU2020461C1 (en) Method of electrochemical determination of rate of corrosion of metal with dielectric coating and device for its accomplishment
KR100678564B1 (en) PTC thin film heater
JPS63154970A (en) Terminal for measuring resistance
SU1359658A1 (en) Reference specimen
JPH11132988A (en) Probe of gauge for measuring crack