JPH07174978A - Vertical type microscope - Google Patents
Vertical type microscopeInfo
- Publication number
- JPH07174978A JPH07174978A JP32191993A JP32191993A JPH07174978A JP H07174978 A JPH07174978 A JP H07174978A JP 32191993 A JP32191993 A JP 32191993A JP 32191993 A JP32191993 A JP 32191993A JP H07174978 A JPH07174978 A JP H07174978A
- Authority
- JP
- Japan
- Prior art keywords
- observed
- transparent sample
- epi
- light
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Microscoopes, Condenser (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、落射型顕微鏡に係り、
さらに詳しくは、落射照明光による被観察標本の照明方
式を改良した落射型顕微鏡に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an epi-illumination microscope,
More specifically, the present invention relates to an epi-illumination microscope with an improved illumination system for an observation specimen by epi-illumination light.
【０００２】[0002]
【従来の技術】従来から、生物等の透明標本の顕微鏡に
よる観察時には、被観察透明標本を下方から照明するこ
とで、該透明標本の介在による照明の変化を透過光によ
って観察するようにしており、又、金属等の不透明標本
の顕微鏡による観察時には、被観察不透明標本を上方か
ら照明することで、該不透明標本の介在による照明の変
化を反射光によって観察するようにしている。2. Description of the Related Art Conventionally, when observing a transparent specimen such as a living thing with a microscope, a transparent specimen to be observed is illuminated from below so that a change in illumination due to the intervention of the transparent specimen is observed by transmitted light. Further, when observing an opaque sample of metal or the like with a microscope, the observed opaque sample is illuminated from above, and the change in illumination due to the interposition of the opaque sample is observed by reflected light.
【０００３】一方、落射照明光を用いた透明標本の落射
型顕微鏡による観察に関しては、例えば、図３に示され
ているように、観察基台３１上に標本載置用ミラー３２
を据置させた状態で、該標本載置用ミラー３２上にあら
ためて被観察透明標本３３を載置させ、更に、該透明標
本３３上を覆うようにカバーガラス３４を施すことによ
って保持させておき、落射照明光３５の照射によって被
観察標本３３を照明したときの該被観察標本３３の介在
による透過光３６の変化を観察するようにした手段が一
般的である。On the other hand, regarding the observation of a transparent sample with an epi-illumination microscope using epi-illumination light, for example, as shown in FIG. 3, a sample mounting mirror 32 is placed on an observation base 31.
In a state of being placed, the observation transparent sample 33 is newly placed on the sample mounting mirror 32, and further, a cover glass 34 is provided so as to cover the transparent sample 33, thereby holding it. Generally, means for observing the change of the transmitted light 36 due to the interposition of the sample 33 to be observed when the sample 33 to be observed is illuminated by the irradiation of the epi-illumination light 35.
【０００４】[0004]
【発明が解決しようとする課題】しかしながら、前記透
明標本の落射型顕微鏡による観察に際しては、被観察透
明標本３３に対して照射される落射照明光３５が、該透
明標本３３を２回に亘って透過することになる。つま
り、この点について詳述すると、図３の表示からも明ら
かな如く、該落射照明光３５は、照射の当初に透明標本
３３を１次透過（第１回目）した上で、該透明標本３３
を載置している標本載置用ミラー３２面で反射され、こ
の反射光が、再度，該透明標本３３を２次透過（第２回
目）することになる。However, when observing the transparent sample with an epi-illumination microscope, the epi-illumination light 35 applied to the observed transparent sample 33 passes through the transparent sample 33 twice. It will be transparent. That is, when this point is described in detail, as is apparent from the display in FIG. 3, the epi-illumination light 35 firstly transmits (first time) the transparent sample 33 at the beginning of irradiation, and then the transparent sample 33.
Is reflected by the surface of the sample mounting mirror 32 on which is mounted, and the reflected light is secondarily transmitted (second time) through the transparent sample 33 again.
【０００５】従って、このように被観察透明標本３３を
１次，２次の２回に亘って透過した後に、顕微鏡観察さ
れる透過光３６は、２回透過に伴った影響で、その内容
が比較的誇張されたものとなるために、該透過光３６を
何らかの他の手段で変換する等の後処理によって所要の
観察精度を維持しなければならず、又、本観察形式の場
合にあっては、該標本観察の度毎に別部材としての標本
載置用ミラー３２が必要になるという問題点があった。Therefore, after passing through the transparent sample 33 to be observed twice in the primary and secondary manners, the transmitted light 36 observed by a microscope is affected by the two transmissions and its contents are changed. In order to be relatively exaggerated, the required observation accuracy must be maintained by post-processing such as converting the transmitted light 36 by some other means. However, there is a problem that the sample mounting mirror 32 as a separate member is required every time the sample is observed.
【０００６】本発明は、このような従来の問題点を解消
するためになされたもので、その目的とするところは、
被観察透明標本を透過した透過光に対して何らの後処理
をも加えずに観察できるようにし、併せて、透明標本観
察の度毎に別部材を必要としない落射型顕微鏡を提供す
ることである。The present invention has been made to solve the above-mentioned conventional problems, and its purpose is to:
By making it possible to observe transmitted light that has passed through the transparent specimen to be observed without any post-treatment, and at the same time, to provide an epi-illumination microscope that does not require a separate member for each observation of the transparent specimen. is there.
【０００７】[0007]
【課題を解決するための手段】前記目的を達成するため
に、本発明に係る落射型顕微鏡は、被観察透明標本を１
次透過した落射照明の反射光を、該透明標本に２次透過
させて得る透過光により、被観察透明標本の観察を行う
落射型顕微鏡において、前記被観察透明標本を１次透過
する反射光を全面に亘って均一化された反射光に変換す
る光学手段を備えることを特徴とするものである。In order to achieve the above-mentioned object, the epi-illumination microscope according to the present invention comprises a transparent sample to be observed.
In the epi-illumination microscope for observing the transparent sample to be observed, the reflected light of the epi-illumination to be observed is primarily transmitted by the transmitted light obtained by secondly transmitting the reflected light of the epi-illumination to the transparent sample. It is characterized in that it is provided with an optical means for converting into reflected light which is made uniform over the entire surface.
【０００８】[0008]
【作用】従って、本発明においては、落射照明光を光学
手段によって均一化された反射光に変換した後、該変換
された反射光を用い、被観察透明標本を透過させること
で得た透過光を観察するようにしたため、透過の重複に
伴う影響が排除されて正確な観察が可能になる。Therefore, in the present invention, the transmitted light obtained by converting the incident illumination light into the reflected light made uniform by the optical means and then using the converted reflected light to pass through the transparent sample to be observed. Since the observation is performed, the effect of overlapping transmission is eliminated and accurate observation becomes possible.
【０００９】[0009]
【実施例】以下、本発明に係る落射型顕微鏡の実施例に
つき、図１及び図２を参照して詳細に説明する。Embodiments of the epi-illumination microscope according to the present invention will be described below in detail with reference to FIGS.
【００１０】図１は、本発明の一実施例を適用した落射
型顕微鏡の概要を示す構成説明図であり、又、図２は、
同実施例における被観察標本の載置保持部の詳細を拡大
して示す断面図である。FIG. 1 is an explanatory view of the structure of an epi-illumination microscope to which an embodiment of the present invention is applied, and FIG.
FIG. 7 is a cross-sectional view showing, in an enlarged manner, details of a mounting and holding unit for the specimen to be observed in the same Example.
【００１１】これらの実施例各図の構成において、落射
型顕微鏡の標本載置保持部は、観察基台１１上にあっ
て、全反射ミラー１２と光拡散部材１３とを順次に据置
させて構成し、観察対象となる透明標本１４の載置は、
前記光拡散部材１３上にプレパラート１５を介在させる
と共に、該被観察透明標本１４をカバーガラス１６によ
り覆って保持させる。そして、この状態で光源側からの
落射照明光１７は、光軸上に配置されているハーフミラ
ー１８を経て観察光路内に入射され、且つ対物レンズ１
９及び前記カバーガラス１６を介して透明標本１４を落
射照明する。In the structures shown in the respective drawings of these embodiments, the sample placing and holding unit of the epi-illumination microscope is arranged on the observation base 11 and the total reflection mirror 12 and the light diffusing member 13 are sequentially placed. However, the placement of the transparent sample 14 to be observed is
A slide 15 is interposed on the light diffusing member 13, and the transparent sample 14 to be observed is covered and held by a cover glass 16. Then, in this state, the epi-illumination light 17 from the light source side enters the observation optical path through the half mirror 18 arranged on the optical axis, and the objective lens 1
The transparent sample 14 is illuminated by epi-illumination through the cover glass 16 and the cover glass 16.
【００１２】而して、前記落射照明光１７による照明に
際し、被観察透明標本１４を１次透過する光と、該透明
標本１４の周辺該当部を１次透過する光との夫々は、プ
レパラート１５を経た上で、光拡散部材１３面で一部反
射されて反射光２０ａになるか、或は、該光拡散部材１
３内を多方向に向け拡散されながら通過し、且つ全反射
ミラー１２面で全反射されて反射光２０ｂになると共
に、再度，該光拡散部材１３内を通過して拡散作用を受
け、この結果、全面に亘って可及的に均一化された反射
光，ひいては、所期通りの照明光に変換されることにな
り、且つこのように均一化された反射光は、その後、被
観察透明標本１４を２次透過して、前記観察光路内に所
要の正確な透過光２１が得られるのである。Thus, when illuminated by the epi-illumination light 17, the light that is primarily transmitted through the transparent sample 14 to be observed and the light that is primarily transmitted through the peripheral portion of the transparent sample 14 are prepared by the slide 15 respectively. And then partially reflected on the surface of the light diffusing member 13 to be reflected light 20a, or the light diffusing member 1
3 while passing in multiple directions while being diffused, and being totally reflected by the surface of the total reflection mirror 12 to become the reflected light 20b, and again passes through the inside of the light diffusing member 13 to be subjected to a diffusing action. , The reflected light that has been made as uniform as possible over the entire surface, and thus converted into the desired illumination light, and the reflected light that has been made uniform in this way is then observed transparent sample. After passing through 14 secondarily, the required accurate transmitted light 21 is obtained in the observation optical path.
【００１３】従って、本実施例装置の構成では、被観察
透明標本１４を２次透過して観察光路内に得られる透過
光２１が、前段階で均一化された反射光に基づくもので
あるために、先に述べた従来の場合とは全く異なって、
重複透過に伴う誇張された内容等を含んではおらず、結
果的に、該透過光２１に対しては、敢て後処理を施す必
要が全くなくなるものであり、ここでは、常に精度の高
い正確な観察を容易に行なうことができ、しかも、本実
施例の場合には、全反射ミラー１２に重ねて光拡散部材
１３を据置させた方式による構成であるから、ここで
も、従来のように標本観察の度毎に標本載置用ミラーを
準備する等の手間をかけなくてよい等の利点が得られ
る。Therefore, in the configuration of the apparatus of this embodiment, the transmitted light 21 secondarily transmitted through the transparent sample 14 to be observed and obtained in the observation optical path is based on the reflected light that has been homogenized in the previous step. In contrast to the conventional case described above,
It does not include exaggerated contents due to overlapping transmission, and as a result, there is no need to perform post-processing on the transmitted light 21 at all. In this embodiment, since the light diffusing member 13 is placed on top of the total reflection mirror 12, the specimen can be easily observed. It is possible to obtain an advantage that it is not necessary to prepare a sample mounting mirror for each observation.
【００１４】[0014]
【発明の効果】以上、実施例によって詳述したように、
本発明によれば、被観察透明標本を１次透過した落射照
明の反射光を、透明標本に２次透過させて得る透過光に
より、被観察透明標本の観察を行う落射型顕微鏡におい
て、被観察透明標本を１次透過する反射光を全面に亘っ
て均一化された反射光に変換する光学手段を備えて構成
したから、落射照明光を光学手段によって均一化された
反射光に変換した後に、この変換された反射光を用い、
被観察透明標本を透過させて得る透過光で観察するため
に、重複透過に伴う影響が完全に排除されるもので、こ
のようにして常に正確な観察が可能になり、更には、光
学手段を備える構成のために、標本観察の度毎にいちい
ち標本載置用ミラー等を準備する必要がなくて取扱い操
作を簡略化でき、しかも、構成的にも極めて簡単で容易
に実施し得る等の優れた特長を有するものである。As described above in detail with reference to the embodiments,
According to the present invention, in an epi-illumination microscope for observing a transparent sample to be observed, the reflected light of the epi-illumination that has primarily passed through the transparent sample to be observed is secondarily transmitted to the transparent sample to observe the transparent sample to be observed. Since the transparent sample is provided with the optical means for converting the reflected light that is primarily transmitted into the uniformed reflected light over the entire surface, after converting the epi-illumination light into the uniformed reflected light by the optical means, Using this converted reflected light,
Since the transmitted light obtained by passing through the transparent sample to be observed is used, the effect of overlapping transmission is completely eliminated. In this way, accurate observation is always possible. Due to the configuration provided, it is not necessary to prepare a sample mounting mirror or the like every time a sample is observed, and the handling operation can be simplified, and the configuration is extremely simple and easy to perform. It has the following features.
【図１】本発明の一実施例を適用した落射型顕微鏡の概
要を示す構成説明図である。FIG. 1 is a configuration explanatory view showing an outline of an epi-illumination microscope to which an embodiment of the present invention is applied.
【図２】同実施例の落射型顕微鏡における標本載置保持
部の詳細を拡大して示す断面図である。FIG. 2 is an enlarged cross-sectional view showing details of a sample placing and holding unit in the epi-illumination microscope of the same embodiment.
【図３】従来の落射型顕微鏡における標本載置保持部の
詳細を拡大して示す断面図である。FIG. 3 is an enlarged cross-sectional view showing details of a sample placing and holding unit in a conventional epi-illumination microscope.
１１ 観察基台 １２ 全反射ミラー １３ 光拡散部材 １４ 被観察透明標本 １５ プレパラート １６ カバーガラス １７ 落射照明光 １８ ハーフミラー １９ 対物レンズ ２０ａ，２０ｂ 反射光 ２１ 透過光 11 Observation Base 12 Total Reflection Mirror 13 Light Diffusing Member 14 Transparent Sample to Be Observed 15 Preparation 16 Cover Glass 17 Epi-illumination Light 18 Half Mirror 19 Objective Lens 20a, 20b Reflected Light 21 Transmitted Light
Claims (3)
の反射光を、該透明標本に２次透過させて得る透過光に
より、被観察透明標本の観察を行う落射型顕微鏡におい
て、 前記被観察透明標本を１次透過する反射光を全面に亘っ
て均一化された反射光に変換する光学手段を備えること
を特徴とする落射型顕微鏡。1. An epi-illumination microscope for observing a transparent sample to be observed by means of transmitted light obtained by secondary transmission of reflected light of epi-illumination, which is primarily transmitted through the transparent sample to be observed, to the transparent sample. An epi-illumination microscope characterized by comprising optical means for converting reflected light that is primarily transmitted through an observation transparent sample into reflected light that is made uniform over the entire surface.
を特徴とする請求項１記載の落射型顕微鏡。2. The epi-illumination microscope according to claim 1, wherein the optical means is a light diffusing member.
に重ねて据置された全反射ミラーと光拡散部材との組合
せであることを特徴とする請求項１記載の落射型顕微
鏡。3. The epi-illumination microscope according to claim 1, wherein the optical means is a combination of a total reflection mirror and a light diffusing member, which are placed one on top of another on the observation base in order.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32191993A JPH07174978A (en) | 1993-12-21 | 1993-12-21 | Vertical type microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP32191993A JPH07174978A (en) | 1993-12-21 | 1993-12-21 | Vertical type microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07174978A true JPH07174978A (en) | 1995-07-14 |
Family
ID=18137881
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP32191993A Withdrawn JPH07174978A (en) | 1993-12-21 | 1993-12-21 | Vertical type microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07174978A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018047239A1 (en) * | 2016-09-06 | 2018-03-15 | オリンパス株式会社 | Observation device |
-
1993
- 1993-12-21 JP JP32191993A patent/JPH07174978A/en not_active Withdrawn
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018047239A1 (en) * | 2016-09-06 | 2018-03-15 | オリンパス株式会社 | Observation device |
| JPWO2018047239A1 (en) * | 2016-09-06 | 2019-06-24 | オリンパス株式会社 | Observation device |
| US11150456B2 (en) | 2016-09-06 | 2021-10-19 | Olympus Corporation | Observation apparatus |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20010306 |