JPH0695397B2 - Optical disk defect location search method - Google Patents

Optical disk defect location search method

Info

Publication number
JPH0695397B2
JPH0695397B2 JP30078786A JP30078786A JPH0695397B2 JP H0695397 B2 JPH0695397 B2 JP H0695397B2 JP 30078786 A JP30078786 A JP 30078786A JP 30078786 A JP30078786 A JP 30078786A JP H0695397 B2 JPH0695397 B2 JP H0695397B2
Authority
JP
Japan
Prior art keywords
defect
defective portion
optical disk
optical
recording
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP30078786A
Other languages
Japanese (ja)
Other versions
JPS63152038A (en
Inventor
昭男 森本
活二 中川
和人 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP30078786A priority Critical patent/JPH0695397B2/en
Publication of JPS63152038A publication Critical patent/JPS63152038A/en
Publication of JPH0695397B2 publication Critical patent/JPH0695397B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Manufacturing Optical Record Carriers (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、光ディスクの欠陥位置を検索する方法に関す
るものである。
Description: TECHNICAL FIELD The present invention relates to a method for searching for a defective position on an optical disc.

(従来の技術) 光ディスクの重要な性能の一つである欠陥発生率は、可
能な限り低いことが望まれる。従って、欠陥発生率を低
下するために欠陥発生原因を知る必要が有り、欠陥部分
を顕微鏡(光学顕微鏡や電子顕微鏡等)を用いて観察す
る事が重要な手段の一つになる。
(Prior Art) It is desired that the defect occurrence rate, which is one of the important performances of optical disks, be as low as possible. Therefore, in order to reduce the defect occurrence rate, it is necessary to know the cause of the defect occurrence, and observing the defective portion with a microscope (optical microscope, electron microscope, etc.) is one of the important means.

光ディスクの欠陥部分の判定には、再生光学系を用いて
再生信号処理し、エラー発生の有無により行う。従来
は、このときの欠陥発生位置を次のように観測してい
る。トラックアドレス情報やセクターアドレス情報がす
でに光ディスク上に記録されている場合には、各々のア
ドレス情報を欠陥観測時に読み取る。また、光ディスク
上にアドレス情報がない場合には、再生光学系の再生半
径位置読み取り機構及び光ディスク回転軸上に回転角読
み取り機構を取り付け、欠陥観測時に再生半径及びディ
スク回転角を読み取る。以上のように欠陥発生位置を読
み取ったディスクの欠陥部分を顕微鏡を用いて観測する
場合には、欠陥観測時に読み取った前述のディスク半径
位置及び回転角位置付近を観測して欠陥部分を捜す。
The defective portion of the optical disc is determined by processing a reproduced signal using a reproducing optical system and determining whether or not an error has occurred. Conventionally, the defect occurrence position at this time is observed as follows. When the track address information and the sector address information are already recorded on the optical disc, each address information is read at the time of observing a defect. If there is no address information on the optical disk, a read radius position reading mechanism of the read optical system and a rotation angle reading mechanism on the optical disk rotation axis are attached to read the read radius and the disk rotation angle when a defect is observed. When observing the defective portion of the disk whose defect generation position has been read as described above using a microscope, the defective portion is searched by observing the vicinity of the above-mentioned disk radial position and rotation angle position read at the time of defect observation.

また本発明者らがすでに提案している欠陥位置の検索し
やすい方法として、光ディスクの再生光学系で検出され
る欠陥位置の近傍に、長さが100μmから5cm程度の大き
さの形状変化領域や光学定数変化領域もしくは磁化方向
の異なる領域を光ディスク上に記録し(以下これらの領
域をマーキング領域と称する)、このマーキング領域を
顕微鏡で検索し欠陥位置を検索する方法がある。
In addition, as a method for easily searching for a defect position, which has been already proposed by the present inventors, a shape change region having a length of about 100 μm to 5 cm is provided in the vicinity of a defect position detected by a reproduction optical system of an optical disc. There is a method of recording an optical constant change area or an area having a different magnetization direction on an optical disk (hereinafter, these areas will be referred to as marking areas), and searching the marking area with a microscope to find a defect position.

(発明が解決しようとする問題点) 上記のように、欠陥観測時に読み取ったディスク半径位
置及び回転角位置付近を観測して欠陥部分を捜す方法で
は、位置精度が記録密度ほどに上げにくいため欠陥観測
位置近傍に何種類かの欠陥があるときには区別が出来な
くなる。また、欠陥位置近傍のマーキング領域を検索す
る方法では、欠陥の検索効率は良いが同一光ディスク内
に多種類の欠陥検出を行い、それぞれに欠陥検索用マー
キング領域を記録すると、マーキング領域を検索するだ
けでは、どの種類の欠陥であるか判別が出来ないという
欠点があった。
(Problems to be Solved by the Invention) As described above, in the method of locating a defective portion by observing the vicinity of the disk radial position and the rotation angle position read at the time of defect observation, it is difficult to increase the positional accuracy to the recording density, so When there are several kinds of defects near the observation position, they cannot be distinguished. In addition, in the method of searching the marking area near the defect position, although the defect searching efficiency is good, many kinds of defects are detected in the same optical disc, and if the defect searching marking areas are recorded respectively, only the marking area is searched. Then, there was a drawback that it was not possible to determine which kind of defect it was.

(問題点を解決するための手段) 本発明の要旨とするところは、光ディスクの欠陥部分近
傍に形状変化領域や光学定数変化領域もしくは磁化方向
の異なる領域を記録して欠陥位置の検索を行う方法にお
いて、前記欠陥部分近傍の形状変化領域や光学定数変化
領域もしくは磁化方向の異なる領域の記録に前記欠陥部
分の種類に関する情報を含むことを特徴とする光ディス
ク欠陥位置検索方法である。
(Means for Solving Problems) The gist of the present invention is to perform a search for a defect position by recording a shape change region, an optical constant change region or a region having a different magnetization direction in the vicinity of a defect portion of an optical disk. In the optical disc defect position searching method, the information on the type of the defective portion is included in the recording in the shape change area, the optical constant change area, or the area having a different magnetization direction in the vicinity of the defective portion.

(作用) 以下図面を参照して、本発明を詳細に説明する。(Operation) The present invention will be described in detail below with reference to the drawings.

第1図に、欠陥部分1とマーキング領域2の配置の模式
図を示す。光ディスク再生光学系で光ディスクの欠陥部
分1を検出して欠陥の種類を判定し、その直後に欠陥の
情報により変調された記録レーザ光で一定期間記録を行
いマーキング領域2を作成する。欠陥位置1の検索をす
るときには、先ずマーキング領域2を検索し、マーキン
グ領域2を記録方向と逆方向にさかのぼることにより、
欠陥部分1を見つけることができ、更にその欠陥が再生
光学系と信号処理系でどの様な種類の欠陥であると判定
されたかを知ることが出来る。
FIG. 1 shows a schematic view of the arrangement of the defective portion 1 and the marking area 2. The defect portion 1 of the optical disc is detected by the optical disc reproducing optical system to determine the type of the defect, and immediately after that, recording is performed for a certain period with the recording laser light modulated by the defect information to create the marking area 2. When searching for the defect position 1, first, the marking area 2 is searched, and the marking area 2 is traced in the opposite direction to the recording direction.
It is possible to find the defective portion 1 and to know what kind of defect the defective optical element and the signal processing system have determined to be the defective portion.

(実施例) 本発明の欠陥位置検索方式を用いて記録ビットの抜けの
欠陥部分とエキストラ欠陥部分を検索した顕微鏡写真の
模式図をそれぞれ第2図、第3図に示す。第2図の記録
ビット抜けの欠陥情報は変調パルス幅を長くしてマーキ
ング領域を記録し、第3図のエキストラ欠陥情報は変調
パルス幅を短くしてマーキング領域を記録した。これに
より、マーキング領域を記録した欠陥の種類判別が出来
る。
(Embodiment) FIGS. 2 and 3 are schematic diagrams of micrographs in which a defective portion of a recording bit missing portion and an extra defective portion are searched by using the defect position searching method of the present invention, respectively. The defect information of the recording bit omission shown in FIG. 2 was recorded in the marking area by lengthening the modulation pulse width, and the extra defect information in FIG. 3 was recorded in the marking area by shortening the modulation pulse width. As a result, it is possible to discriminate the type of the defect recorded in the marking area.

(発明の効果) 以上詳細に説明したように、本発明による光ディスク欠
陥位置検索方法を用いることにより、欠陥の種類判別を
行った欠陥観察が可能となる。
(Effects of the Invention) As described in detail above, by using the optical disk defect position searching method according to the present invention, it becomes possible to perform defect observation in which the type of defect is determined.

【図面の簡単な説明】[Brief description of drawings]

第1図は欠陥部分とマーキング領域の配置を示す線図、
第2図、第3図は記録ビットの抜けの欠陥部分とエキス
トラ欠陥部分を検索した顕微鏡写真を模式的に示した線
図である。 図中、1は欠陥部分、2はマーキング領域である。
FIG. 1 is a diagram showing the arrangement of defective portions and marking areas,
FIG. 2 and FIG. 3 are schematic diagrams showing micrographs in which a defective portion of the recording bit missing and an extra defective portion are searched. In the figure, 1 is a defective portion and 2 is a marking area.

フロントページの続き (56)参考文献 特開 昭63−152039(JP,A) 特開 昭63−152041(JP,A) 特開 昭63−117245(JP,A) 特開 昭63−152040(JP,A)Continuation of the front page (56) Reference JP-A 63-152039 (JP, A) JP-A 63-152041 (JP, A) JP-A 63-117245 (JP, A) JP-A 63-152040 (JP , A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】光ディスクの欠陥部分近傍に形状変化領域
や光学定数変化領域もしくは磁化方向の異なる領域を記
録して欠陥位置の検索を行う方法において、前記欠陥部
分近傍の形状変化領域や光学定数変化領域もしくは磁化
方向の異なる領域の記録に前記欠陥部分の種類の識別に
関する情報を含むことを特徴とする光ディスク欠陥位置
検索方法。
1. A method for retrieving a defect position by recording a shape change region, an optical constant change region or a region having a different magnetization direction in the vicinity of a defective portion of an optical disk, wherein the shape change region and the optical constant change near the defective portion are recorded. A method for searching an optical disk defect position, wherein information on identification of the type of the defective portion is included in recording in the area or the area having different magnetization directions.
JP30078786A 1986-12-16 1986-12-16 Optical disk defect location search method Expired - Lifetime JPH0695397B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30078786A JPH0695397B2 (en) 1986-12-16 1986-12-16 Optical disk defect location search method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30078786A JPH0695397B2 (en) 1986-12-16 1986-12-16 Optical disk defect location search method

Publications (2)

Publication Number Publication Date
JPS63152038A JPS63152038A (en) 1988-06-24
JPH0695397B2 true JPH0695397B2 (en) 1994-11-24

Family

ID=17889091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30078786A Expired - Lifetime JPH0695397B2 (en) 1986-12-16 1986-12-16 Optical disk defect location search method

Country Status (1)

Country Link
JP (1) JPH0695397B2 (en)

Also Published As

Publication number Publication date
JPS63152038A (en) 1988-06-24

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