JPH0690035A - Piezoelectric and its manufacture - Google Patents

Piezoelectric and its manufacture

Info

Publication number
JPH0690035A
JPH0690035A JP23965292A JP23965292A JPH0690035A JP H0690035 A JPH0690035 A JP H0690035A JP 23965292 A JP23965292 A JP 23965292A JP 23965292 A JP23965292 A JP 23965292A JP H0690035 A JPH0690035 A JP H0690035A
Authority
JP
Japan
Prior art keywords
zno
crystal
single crystal
growth
container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23965292A
Other languages
Japanese (ja)
Inventor
Yuji Asai
裕次 浅井
Osamu Imai
今井  修
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Insulators Ltd
Original Assignee
NGK Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Insulators Ltd filed Critical NGK Insulators Ltd
Priority to JP23965292A priority Critical patent/JPH0690035A/en
Priority to US08/112,529 priority patent/US5393444A/en
Priority to CA002105258A priority patent/CA2105258C/en
Priority to EP93307055A priority patent/EP0587407A3/en
Publication of JPH0690035A publication Critical patent/JPH0690035A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an electric conductivity which can be used for an acoustoelectric effect device by doping a single crystal made mainly of ZnO with a specified amount of Li. CONSTITUTION:A growth container 10 is filled with a ZnO sintered body 1, where a baffle plate 3 is installed to partition its inside into a material filled zone 14 and a crystal growth zone 16. ZnO seed crystals 7 are hang on an Ag frame 5, and the frame 5 is arranged in the crystal growth zone 16. The growth container 10 is injected with a solvent made of 3mol/l KOH and 1.5mol/l LiOH. The growth container 10 is installed in an autoclave, which is then injected with distilled water and sealed with water. After heating with the autoclave installed in an electric furnace, ZnO single crystals are taken out. The ZnO single crystals are dipped in an LiOH solution and subjected to diffusion treatment at high temperature in an oxygen stream to dope them with Li. The electric conductivities and Li doping amounts of obtained ZnO single crystals are 10<-3>-10<-6>1/OMEGAcm and 15-120ppm, respectively.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、酸化亜鉛(ZnO)を
主成分とする単結晶から成る圧電性半導体に関し、更に
詳細には、音響電気効果素子として好適に用いることが
できる圧電性半導体及びその製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a piezoelectric semiconductor composed of a single crystal containing zinc oxide (ZnO) as a main component, and more specifically, a piezoelectric semiconductor preferably used as an acoustoelectric effect element and The manufacturing method is related.

【0002】[0002]

【従来の技術】酸化亜鉛(ZnO)は、化学組成がZn
過剰であるn形半導体であり、また、その結晶構造から
圧電体としても注目されてきた物質である。現在、Zn
Oの利用は薄膜によって行われているが、膜が多結晶で
あるため粒界の影響を受け、伝搬損失が大となるため利
用できないという問題があり、このため、高純度ZnO
の単結晶化が重要な課題となっている。
2. Description of the Related Art Zinc oxide (ZnO) has a chemical composition of Zn.
It is an excess n-type semiconductor, and is a substance that has attracted attention as a piezoelectric body due to its crystal structure. Currently Zn
Although the use of O is carried out by a thin film, there is a problem that it cannot be used because the film is polycrystalline and is affected by the grain boundaries and the propagation loss becomes large. Therefore, high-purity ZnO is used.
Single crystallization is an important issue.

【0003】ZnOの単結晶化に関しては、「高純度Z
nO単結晶の水熱育成とストイキオメトリーの評価」
(坂上 登著、昭和63年2月、秋田高専研究紀要第2
3号)が報告されている。この文献には水熱法によるZ
nO単結晶の育成が記載されており、この育成法によれ
ば、ZnO焼結体を結晶育成装置内の下部に、一方、Z
nO種結晶を該育成装置の上部にそれぞれ配置し、次い
で、KOH及びLiOHから成るアルカリ水溶液の溶媒
(以下、「アルカリ溶媒」という。)を充填する。この
状態で、結晶育成装置内を370〜400℃の育成温
度、700〜1000kg/cm2 の圧力で運転を行う
が、ここで、結晶育成装置内の上部と下部で、下部の温
度が上部の温度より10〜15℃高くなるように運転す
ることにより、ZnOの単結晶を育成する。
Regarding the single crystallization of ZnO, "high-purity Z
Hydrothermal growth of nO single crystal and evaluation of stoichiometry ”
(Noboru Sakagami, February 1988, Bulletin of the Akita National College of Technology No. 2
No. 3) has been reported. In this document, hydrothermal method Z
The growth of an nO single crystal is described. According to this growth method, a ZnO sintered body is placed in the lower part of the crystal growth apparatus, while Z
The nO seed crystals are respectively placed on the upper part of the growing apparatus, and then a solvent of an alkaline aqueous solution composed of KOH and LiOH (hereinafter, referred to as “alkali solvent”) is filled. In this state, the inside of the crystal growing apparatus is operated at a growing temperature of 370 to 400 ° C. and a pressure of 700 to 1000 kg / cm 2 , where the upper and lower parts of the crystal growing apparatus are at the lower temperature. A ZnO single crystal is grown by operating at 10 to 15 ° C. higher than the temperature.

【0004】上記のように育成され形成されるZnO単
結晶は、育成溶液としてアルカリ溶媒のみを用いた場合
には、育成環境が還元性雰囲気になり、Zn原子の過剰
量が十数ppmから二十数ppmとなり、電気伝導度も
100 〜10-21/Ω・cmとなる。 従って、このZ
nO単結晶を音響電気効果素子として用いるには、電気
伝導度が大きく不向きである。そこで、育成系内を酸素
雰囲気にするために過酸化水素(H22)を添加し、Z
nO単結晶の高純度化を試みている。
In the ZnO single crystal grown and formed as described above, when only an alkaline solvent is used as a growth solution, the growth environment becomes a reducing atmosphere, and the excess amount of Zn atoms is more than 10 ppm. The electric conductivity is 10 0 to 10 −2 1 / Ω · cm, which is more than 10 ppm. Therefore, this Z
The nO single crystal is not suitable for use as an acoustoelectric effect element because of its large electrical conductivity. Therefore, hydrogen peroxide (H 2 O 2 ) is added to make the growth system an oxygen atmosphere, and Z is added.
We are trying to improve the purity of nO single crystal.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記H
22を作用させて育成したZnO単結晶においても、そ
の電気伝導度は10-8 〜10-101/Ω・cmであり、
音響電気効果素子として用いるには電気伝導度が小さく
適当でないという課題があった。また、H22は、強力
な酸化剤であるため育成容器内を白金で被覆するか又は
育成容器自体を白金で作製する必要があり、コスト的に
不利であるという課題があった。本発明は、このような
従来技術の有する課題に鑑みてなされたものであり、そ
の目的とするところは、音響電気効果素子として用いる
に適当な電気伝導度等の特性を有し、製造コストの低減
した圧電性半導体及びその製造方法を提供することにあ
る。
However, the above-mentioned H
The electrical conductivity of ZnO single crystal grown by the action of 2 O 2 is 10 −8 to 10 −10 1 / Ω · cm,
There is a problem that the electrical conductivity is small and not suitable for use as an acoustoelectric effect element. Further, since H 2 O 2 is a strong oxidizing agent, it is necessary to coat the inside of the growth container with platinum or to make the growth container itself with platinum, which is disadvantageous in terms of cost. The present invention has been made in view of the above problems of the prior art, and the object thereof is to have characteristics such as electric conductivity suitable for use as an acoustoelectric effect element, and to reduce the manufacturing cost. An object of the present invention is to provide a reduced piezoelectric semiconductor and a method for manufacturing the same.

【0006】[0006]

【課題を解決するための手段】本発明者は、上記目的を
達成すべく鋭意研究した結果、ZnO単結晶にLiをド
ープすることにより、上記目的が達成できることを見出
し本発明を完成するに至った。従って、本発明の圧電性
半導体は、ZnOを主成分とする単結晶から成る圧電性
半導体であって、この半導体はLiを15〜120pp
mドープされており、電気伝導度が10-3〜10-61/
Ω・cm、好ましくは10-4〜10-51/Ω・cmであ
ることを特徴とする。また、本発明の圧電性半導体の製
造方法は、ZnO焼結体原料を容器下部の原料充填部
に、ZnO種結晶を容器上部の結晶育成部にそれぞれ配
置するとともに、アルカリ溶媒を容器に収容し、原料充
填部の温度が結晶育成部の温度より高くなるように容器
内温度を調節して水熱条件下でZnO単結晶を育成する
圧電性半導体の製造方法であって、育成したZnO単結
晶に、Liをドープして電気伝導度を制御したことを特
徴とする。
Means for Solving the Problems As a result of earnest studies for achieving the above object, the present inventor has found that the above object can be achieved by doping Li into a ZnO single crystal, and the present invention has been completed. It was Therefore, the piezoelectric semiconductor of the present invention is a piezoelectric semiconductor composed of a single crystal containing ZnO as a main component, and this semiconductor contains Li of 15 to 120 pp.
It is m-doped and has an electric conductivity of 10 -3 to 10 -6 1 /
Ω · cm, preferably 10 −4 to 10 −5 1 / Ω · cm. Further, in the method for manufacturing a piezoelectric semiconductor of the present invention, the ZnO sintered body raw material is placed in the raw material filling portion in the lower portion of the container, the ZnO seed crystal is placed in the crystal growing portion in the upper portion of the container, and the alkaline solvent is placed in the container. A method for manufacturing a piezoelectric semiconductor in which a ZnO single crystal is grown under hydrothermal conditions by adjusting a temperature in a container so that a temperature of a raw material filling portion is higher than a temperature of a crystal growing portion, the grown ZnO single crystal In addition, Li was doped to control electric conductivity.

【0007】また、この圧電性半導体は、音響電気効果
電圧とピエゾ効果電圧の両者を発生する。従って、この
圧電性半導体を音響電気効果素子として利用するために
は、フィルターによりピエゾ効果電圧を除去する必要が
ある。両効果電圧をフィルターで分離するためには、音
響電気効果電圧:ピエゾ効果電圧の電圧比が3:1以上
であることが必要であり、そのためには、モビリティー
(キャリアの移動度)が30cm2/V・sec以上で
あるのが好ましい。更に良好な音響電気効果素子として
の機能を具備させるためには、上記電圧比が9:1以上
であるのが好ましく、そのためにはモビリティーが60
cm2/V・sec以上であるのが好ましい。更に、こ
の圧電性半導体は、音響電気効果特性の均一化を図るた
めにも、電力出力値を安定化させるために、ZnO単結
晶内における電気伝導度のバラツキが1021/Ω・c
m以内であるのが好ましく、1011/Ω・cm以内で
あるのが更に好ましい。
Further, this piezoelectric semiconductor generates both an acoustoelectric effect voltage and a piezo effect voltage. Therefore, in order to use this piezoelectric semiconductor as an acoustoelectric effect element, it is necessary to remove the piezoelectric effect voltage with a filter. In order to separate both effect voltages with a filter, it is necessary that the voltage ratio of acoustoelectric effect voltage: piezoelectric effect voltage is 3: 1 or more, and for that purpose, mobility (mobility of carrier) is 30 cm 2. / V · sec or more is preferable. In order to provide a better function as an acoustoelectric effect element, it is preferable that the above voltage ratio is 9: 1 or more.
It is preferably cm 2 / V · sec or more. Moreover, the piezoelectric semiconductor, in order to achieve uniform acoustoelectric characteristics, in order to stabilize the power output value, variation of the electrical conductivity in the ZnO single crystal 10 2 1 / Ω · c
It is preferably within m, and even more preferably within 10 1 1 / Ω · cm.

【0008】[0008]

【作用】本発明の圧電性半導体においては、Liをドー
プすることにより、電気伝導度を、音響電気効果素子と
して使用するに適当な値に制御した。従って、本発明の
圧電性半導体は、優れた音響電気効果特性を有する。ま
た、この圧電性半導体を製造するに当たっては、従来の
如くH22を使用しなくてもよい。従って、単結晶育成
容器内を高価なPtで被覆したり、育成容器自体をPt
で作製する必要がないため、製造コストを低減すること
ができる。
In the piezoelectric semiconductor of the present invention, by doping with Li, the electrical conductivity is controlled to a value suitable for use as an acoustoelectric effect element. Therefore, the piezoelectric semiconductor of the present invention has excellent acoustoelectric effect characteristics. Further, in manufacturing this piezoelectric semiconductor, it is not necessary to use H 2 O 2 as in the conventional case. Therefore, the inside of the single crystal growth container should be coated with expensive Pt, or the growth container itself should be Pt.
Since it is not necessary to manufacture it in, the manufacturing cost can be reduced.

【0009】次に、本発明の圧電性半導体の製造方法に
ついて説明する。まず、ZnO単結晶を育成する原料と
して用いるZnO焼結体を、常法に従って製造する。得
られた焼結体のうち1〜2mm程度のものを選別するの
がよい。次に、Agを内部に被覆した育成容器内又はA
gで作製した育成容器内に上記ZnO焼結体を充填す
る。そして、所要に応じて、該容器内にバッフル板を設
置して、ZnO焼結体を充填した原料充填部とZnO種
結晶を配置する結晶育成部とに区画する。次いで、Zn
O種結晶を該容器内の上方(バッフル板を用いた場合に
は、結晶育成部)に配置し、2〜6mol/lのKOH
と1〜3mol/lのLiOHとから成るアルカリ溶媒
を該容器に注入する。注入の割合は、該容器のフリー容
積、即ち該容器にZnO焼結体及びバッフル板等を設置
した際に残存する容積の約60〜85%とするのが好ま
しい。
Next, a method of manufacturing the piezoelectric semiconductor of the present invention will be described. First, a ZnO sintered body used as a raw material for growing a ZnO single crystal is manufactured by an ordinary method. It is preferable to select one having a diameter of about 1 to 2 mm from the obtained sintered bodies. Next, in a growth container with Ag coated inside or A
The above-mentioned ZnO sintered body is filled in the growth container manufactured by g. Then, if necessary, a baffle plate is installed in the container to divide into a raw material filling portion filled with a ZnO sintered body and a crystal growth portion in which a ZnO seed crystal is arranged. Then Zn
The O seed crystal is placed above the inside of the container (in the case of using a baffle plate, the crystal growth part), and KOH of 2 to 6 mol / l is placed.
An alkaline solvent consisting of 1 to 3 mol / l LiOH is poured into the container. The injection rate is preferably about 60 to 85% of the free volume of the container, that is, the volume remaining when the ZnO sintered body, the baffle plate and the like are installed in the container.

【0010】次に、該育成容器を他の容器、例えばオー
トクレーブ内に設置し、圧力媒体をこのオートクレーブ
内に充填して該容器を浸漬する。この圧力媒体として
は、高温高圧下で腐食性の弱い物質であればよく、蒸留
水が好ましい。かかる圧力媒体は、育成容器をオートク
レーブ内に設置した際に残存する内容積(以下、「フリ
ー内容積」という。)に対する充填率に応じて、その育
成温度にて圧力を発生するが、この圧力が育成容器内の
圧力と同等あるいは若干高めになるように、圧力媒体の
充填率を調整することにより育成容器を保護する機能を
果たす。上記の溶媒及び溶媒濃度において、圧力媒体と
して蒸留水を用いる場合には、その充填率は、オートク
レーブのフリー内容積の約60〜85%程度とするのが
よい。次に、該オートクレーブを加熱炉内に設置し、上
記育成容器の温度を上昇させて、上記結晶育成部と原料
充填部とを所定温度に加熱する。この際、結晶育成部の
温度を原料充填部の温度より約5〜25℃低くするのが
よい。即ち、結晶育成部の温度は360〜400℃、原
料充填部温度は380〜420℃とするのが好ましい。
そして、この状態のまま10〜30日間定常運転して結
晶を育成し、その後、加熱炉を停止して室温に下げ、Z
nO単結晶を取り出す。
Next, the growing container is placed in another container, for example, an autoclave, a pressure medium is filled in the autoclave, and the container is immersed. The pressure medium may be any substance that is weakly corrosive under high temperature and high pressure, and distilled water is preferable. The pressure medium generates pressure at the growth temperature according to the filling rate with respect to the internal volume (hereinafter, referred to as "free internal volume") remaining when the growth container is installed in the autoclave. Adjusts the filling rate of the pressure medium so that the pressure becomes equal to or slightly higher than the pressure in the growth container, thereby fulfilling the function of protecting the growth container. When distilled water is used as the pressure medium in the above solvent and solvent concentration, its filling rate is preferably about 60 to 85% of the free internal volume of the autoclave. Next, the autoclave is installed in a heating furnace, the temperature of the growth container is raised, and the crystal growth part and the raw material charging part are heated to a predetermined temperature. At this time, it is preferable that the temperature of the crystal growth part is lower by about 5 to 25 ° C. than the temperature of the raw material filling part. That is, it is preferable that the temperature of the crystal growth part is 360 to 400 ° C. and the temperature of the raw material filling part is 380 to 420 ° C.
Then, in this state, a steady operation is performed for 10 to 30 days to grow a crystal, and then the heating furnace is stopped and the temperature is lowered to room temperature.
The nO single crystal is taken out.

【0011】上述の製造方法のZnO焼結体の焼成にお
いては、不純物重金属を予め除去することにより、得ら
れるZnO単結晶のモビリティーを向上させることがで
きる。ZnO単結晶を音響電気効果素子として用いる場
合、モビリティーが所定値以上、即ち30cm2 /V・
sec以上であるのが好ましいが、従来法ではZnO単
結晶中にPb等の不純物重金属が混入し、モビリティー
を下げることがあった。Pbは、ZnO粉末中に約50
ppm含まれているが、例えば、Znの蒸留を繰り返
し、高純度のZnを精製した後、このZnを用いて、高
純度のZnOを製造することができる。更に、ZnO単
結晶内における電気伝導度のバラツキは、上記結晶育成
部と原料充填部との温度差△Tを、育成過程の前半より
後半において小さくすることにより102 1/Ω・cm
以内に抑制することができる。例えば、育成期前半にお
いて、△Tを10〜25℃、後半においては5〜10℃
とすることにより抑制することができる。また、△T
を、このように2段階のみならず、結晶の育成状況に応
じて多段階・連続的に変化させて電気伝導度のバラツキ
を抑制することも可能である。
In the firing of the ZnO sintered body of the above-mentioned manufacturing method, by removing the heavy metal impurities in advance, the mobility of the obtained ZnO single crystal can be improved. When a ZnO single crystal is used as an acoustoelectric effect element, the mobility is a predetermined value or more, that is, 30 cm 2 / V ·
It is preferably not less than sec, but in the conventional method, a heavy metal as an impurity such as Pb is mixed in the ZnO single crystal, which may reduce the mobility. Pb is about 50 in ZnO powder.
Although it is contained in ppm, for example, Zn can be manufactured to produce high-purity ZnO after repeating high-purity Zn by repeating distillation of Zn. Furthermore, ZnO variation in electrical conductivity in the single crystal, the crystal growth part and the temperature difference △ T between the material filling portion, 10 2 1 / Ω · cm by reducing in the second half than the first half of the breeding process
Can be suppressed within. For example, ΔT is 10 to 25 ° C in the first half of the growing period and 5 to 10 ° C in the second half.
It can suppress by setting. Also, ΔT
As described above, it is possible to suppress variations in electric conductivity not only in two stages, but also in multiple stages and continuously in accordance with the crystal growth state.

【0012】次に、本発明の特徴をなすLiドープにつ
いて説明する。このLiドープは、上述の如くして得ら
れたZnO単結晶中のLi濃度が15〜120ppm、
好ましくは30〜90ppmとなるように行うのがよ
い。ドープ方法は、特に限定されるものではなく、Li
OH溶液を用いる浸漬、塗布及び噴霧等を挙げることが
できる。この場合、LiOH溶液の濃度は、処理せんと
する単結晶の大きさ等により適宜変更できるが、例え
ば、5×5×5mmのZnO単結晶を用いる場合には、
50〜200ppmのLiを含有するLiOH溶液5m
lに、単結晶を浸漬すればよい。次いで、この単結晶
を、大気中又はO2 気流中800〜1000℃で100
〜300hr拡散処理することにより、Liドープを行
うことができる。LiOH溶液を用いるのは、アルカリ
溶液であるため、拡散処理において結晶表面の結晶性を
損なうことがないからである。また、Liのみしか結晶
中に入らず制御が容易だからである。上記の条件で拡散
処理を行うのは、結晶表面だけでなく内部にまで均一に
拡散させるためである。
Next, Li doping, which is a feature of the present invention, will be described. This Li-doped has a Li concentration of 15 to 120 ppm in the ZnO single crystal obtained as described above,
It is preferable to carry out the treatment so that the concentration is 30 to 90 ppm. The doping method is not particularly limited, and Li
Examples include dipping using an OH solution, coating and spraying. In this case, the concentration of the LiOH solution can be appropriately changed depending on the size of the single crystal to be treated, and for example, when using a ZnO single crystal of 5 × 5 × 5 mm,
5m LiOH solution containing 50-200ppm Li
The single crystal may be dipped in l. Then, this single crystal is heated to 100 ° C. at 800 to 1000 ° C. in the air or an O 2 stream.
Li doping can be performed by performing a diffusion process for up to 300 hours. The LiOH solution is used because it is an alkaline solution and thus does not impair the crystallinity of the crystal surface during the diffusion treatment. Also, it is because only Li enters the crystal and control is easy. The reason why the diffusion treatment is performed under the above conditions is to uniformly diffuse not only the crystal surface but also the inside.

【0013】[0013]

【実施例】以下、本発明を実施例により詳細に説明する
が、本発明はこれら実施例に限定されるものではない。 (実施例1〜6)(単結晶の育成)Zn蒸留を介して得
られた高純度ZnO粉末500gと蒸留水500gとを
混合し、得られた混合物を直径2〜3mmの球状に成形
し、100℃で2時間乾燥させた。得られた乾燥体を、
酸素雰囲気下、アルミナ容器中1100℃で24時間焼
結し、得られたZnO焼結体から粒径1〜2mmのもの
をふるい分けして選別した。200gのZnO焼結体1
を、図1に示す育成容器10に充填した。この育成容器
10は、熱電対挿入部12、12’を備え、内径30m
m×高さ300mmのほぼ円筒形状をなし、内容積は2
50mlであり、また、その内部にはAgが被覆されて
いる。
The present invention will be described in detail below with reference to examples, but the present invention is not limited to these examples. (Examples 1 to 6) (Growth of single crystal) 500 g of high-purity ZnO powder obtained through Zn distillation and 500 g of distilled water were mixed, and the obtained mixture was molded into a spherical shape having a diameter of 2 to 3 mm. It was dried at 100 ° C. for 2 hours. The obtained dried body,
Sintering was carried out in an alumina container at 1100 ° C. for 24 hours in an oxygen atmosphere, and ZnO sintered bodies having a particle size of 1 to 2 mm were sieved and selected. 200g of ZnO sintered body 1
Was filled in the growth container 10 shown in FIG. This growth container 10 is provided with thermocouple insertion portions 12 and 12 'and has an inner diameter of 30 m.
m × height is 300 mm, and it has a cylindrical shape with an internal volume of 2
The amount is 50 ml, and the inside is coated with Ag.

【0014】次いで、育成容器10内に開孔率5%のバ
ッフル板3を設置して、該容器10内を原料充填部14
と結晶育成部16とに区画した。そして、Agフレーム
5にZnO種結晶7を吊り下げ、このフレーム5を上記
結晶育成部16に配置した。この際、種結晶7に貴金属
線の一例であるAg線9を貫通させ、このAg線9の両
端をフレーム5に締結することにより、種結晶7をフレ
ーム5に固定した。育成容器10に、3mol/lのK
OHと1.5mol/lのLiOHとから成るアルカリ
溶媒を注入した。注入量は育成容器10のフリー容積の
80%とした。
Next, the baffle plate 3 having a porosity of 5% is installed in the growth container 10 and the inside of the container 10 is filled with the raw material filling section 14.
And the crystal growth part 16. Then, the ZnO seed crystal 7 was hung on the Ag frame 5, and the frame 5 was placed in the crystal growth section 16. At this time, the seed crystal 7 was fixed to the frame 5 by penetrating the Ag wire 9 which is an example of a noble metal wire and fastening both ends of the Ag wire 9 to the frame 5. 3 mol / l K in the growth container 10
An alkaline solvent consisting of OH and 1.5 mol / l LiOH was injected. The injection amount was 80% of the free volume of the growth container 10.

【0015】次いで、図2に示すように、育成容器10
をオートクレーブ20内に設置し、熱電対18、18’
配置した後に、オートクレーブ20に蒸留水22を注入
した。注入量はオートクレーブ20のフリー内容積の7
0%とした。次に、オートクレーブ20をキャップ24
により封止し、このオートクレーブ20を電気炉30内
に設置した。この電気炉30は、育成温度の微調整を可
能にすべく上下2段型の構成となっており、かつ、熱電
対32、34を備えている。
Next, as shown in FIG. 2, the growth container 10
Is installed in the autoclave 20 and the thermocouple 18, 18 '
After the placement, distilled water 22 was injected into the autoclave 20. The injection amount is 7 of the free internal volume of the autoclave 20.
It was set to 0%. Next, cap the autoclave 20
Then, the autoclave 20 was installed in an electric furnace 30. The electric furnace 30 has an upper and lower two-stage structure so that the growth temperature can be finely adjusted, and further includes thermocouples 32 and 34.

【0016】次いで、結晶育成部16の温度が、原料充
填部14の温度より常に低くなるようにして昇温し、結
晶育成部を380℃、原料充填部を395℃に昇温し
た。このままの状態で20日間定常運転し、その後に電
気炉を室温に下げてから、ZnO単結晶を取り出した。
なお、電気伝導度のバラツキを抑制すべく、実施例1〜
4においては、表1のように、結晶育成部と原料充填部
との温度差△Tを、育成開始から10日間(前半)よ
り、その後10日間(後半)を小さくした。なお、実施
例5〜6では、△Tは一定とした。
Next, the temperature of the crystal growing portion 16 was raised so that it was always lower than the temperature of the raw material filling portion 14, and the temperature of the crystal growing portion was raised to 380 ° C. and the raw material filling portion was raised to 395 ° C. In this state, steady operation was performed for 20 days, after which the electric furnace was cooled to room temperature, and then the ZnO single crystal was taken out.
In addition, in order to suppress the variation in electrical conductivity,
In Table 4, as shown in Table 1, the temperature difference ΔT between the crystal growth portion and the raw material filling portion was reduced from 10 days (first half) to 10 days (second half) after the start of growth. In Examples 5 and 6, ΔT was constant.

【0017】(Liドープ)上述のようにして得られた
ZnO単結晶を、所定濃度のLiOH溶液に浸漬し、次
いで、O2気流中850℃で240時間拡散処理を行っ
た。LiOH溶液のLi濃度及び単結晶中のLi濃度
(ドープ量)等を表1に示す。
(Li Doping) The ZnO single crystal obtained as described above was dipped in a LiOH solution having a predetermined concentration, and then subjected to a diffusion treatment in an O 2 gas stream at 850 ° C. for 240 hours. Table 1 shows the Li concentration of the LiOH solution and the Li concentration (doping amount) in the single crystal.

【0018】(比較例1〜2)高純度のZnO粉末を用
いず、Liドープを行わず、育成容器の内側被覆をPt
とし、アルカリ溶媒に注入するH22の濃度を0.2m
ol/lとし、かつ△Tの調整をしなかった以外は、実
施例1〜6と同様の操作を行った。 (比較例3〜4)高純度のZnO粉末を用いず、Liド
ープを行わず、アルカリ溶媒にH22を注入せず、かつ
△Tを調整しなかった以外は、実施例1〜6と同様の操
作を行った。
(Comparative Examples 1 and 2) High-purity ZnO powder was not used, Li doping was not performed, and the inner coating of the growth container was Pt.
And the concentration of H 2 O 2 injected into the alkaline solvent is 0.2 m
The same operations as in Examples 1 to 6 were performed except that the ratio was set to ol / l and ΔT was not adjusted. (Comparative Examples 3 to 4) Examples 1 to 6 except that high-purity ZnO powder was not used, Li doping was not performed, H 2 O 2 was not injected into an alkaline solvent, and ΔT was not adjusted. The same operation was performed.

【0019】(性能評価)上記各例で得られたZnO単
結晶につき、電気伝導度及びそのバラツキ、モビリティ
ー、音響電気効果特性を測定し、得られた結果を表1に
示す。なお、音響電気効果特性は下記のようにして評価
した。 (音響電気効果特性)ZnO単結晶を、c面を頂面及び
底面とする5×5×5mmの立方体(その他の面は任
意)に加工し、これら2つのc面に、一定のエネルギー
を有する超音波パルスを垂直に入射し、この際に得られ
る音響電気効果電圧値、及び音響電気効果電圧値とピエ
ゾ効果電圧値との比を測定した。なお、音響電気効果電
圧値、音響電気効果電圧値とピエゾ効果電圧値との比
は、両者共に大きい方が音響電気効果特性として優れて
いる。
(Performance Evaluation) With respect to the ZnO single crystal obtained in each of the above examples, electric conductivity and its variation, mobility and acoustoelectric effect characteristics were measured, and the obtained results are shown in Table 1. The acoustoelectric effect characteristics were evaluated as follows. (Acoustoelectric effect characteristics) A ZnO single crystal is processed into a cube of 5 x 5 x 5 mm with the c-plane as the top surface and the bottom surface (other surfaces are arbitrary), and these two c-planes have constant energy. An ultrasonic pulse was vertically injected, and the acoustoelectric effect voltage value and the ratio of the acoustoelectric effect voltage value and the piezo effect voltage value obtained at this time were measured. The larger the acoustoelectric effect voltage value and the ratio of the acoustoelectric effect voltage value to the piezoelectric effect voltage value, the better the acoustoelectric effect characteristic.

【0020】[0020]

【表1】 [Table 1]

【0021】[0021]

【発明の効果】以上説明したように、本発明によれば、
ZnO単結晶にLiをドープすることとしたため、音響
電気効果素子として用いるに適当な電気伝導度等の特性
を有し、製造コストの低減した圧電性半導体及びその製
造方法を提供することができる。従って、本発明の圧電
性半導体は、音響電気効果型探触子材料として好適に使
用できるほか、超音波増幅材料、弾性表面波フィルタ
ー、圧電トランスデュサー、低速電子線発光用蛍光体等
にも利用することができる。
As described above, according to the present invention,
Since the ZnO single crystal is doped with Li, it is possible to provide a piezoelectric semiconductor that has characteristics such as electric conductivity suitable for use as an acoustoelectric effect element and that has a reduced manufacturing cost, and a manufacturing method thereof. Therefore, the piezoelectric semiconductor of the present invention can be suitably used as an acoustoelectric effect type probe material, and also as an ultrasonic amplification material, a surface acoustic wave filter, a piezoelectric transducer, a phosphor for low-speed electron beam emission, and the like. Can be used.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る育成容器の一例を示す略示的斜視
図である。
FIG. 1 is a schematic perspective view showing an example of a growth container according to the present invention.

【図2】本発明に係る結晶育成装置の一例を示す略示的
断面図である。
FIG. 2 is a schematic sectional view showing an example of a crystal growing apparatus according to the present invention.

【符号の説明】[Explanation of symbols]

1 ZnO焼結体 3 バッフル板 5 フレーム 7 ZnO種結晶 9 Ag線 10 育成容器 12、12’ 熱電対挿入部 14 原料充填部 16 結晶育成部 18、18’ 熱電対 20 オートクレーブ 22 蒸留水 24 キャップ 30 電気炉 32、34 熱電対 1 ZnO Sintered Body 3 Baffle Plate 5 Frame 7 ZnO Seed Crystal 9 Ag Wire 10 Growth Container 12, 12 'Thermocouple Insertion Section 14 Raw Material Filling Section 16 Crystal Growth Section 18, 18' Thermocouple 20 Autoclave 22 Distilled Water 24 Cap 30 Electric furnace 32, 34 thermocouple

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 41/18 41/24 9274−4M H01L 41/22 Z ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Office reference number FI technical display location H01L 41/18 41/24 9274-4M H01L 41/22 Z

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 ZnOを主成分とする単結晶から成る圧
電性半導体であって、この半導体はLiを15〜120
ppmドープされており、電気伝導度が10-3〜10-6
1/Ω・cmであることを特徴とする圧電性半導体。
1. A piezoelectric semiconductor composed of a single crystal containing ZnO as a main component, wherein the semiconductor contains 15 to 120 Li.
It is ppm-doped and has an electric conductivity of 10 −3 to 10 −6.
A piezoelectric semiconductor characterized by being 1 / Ω · cm.
【請求項2】 モビリティーが30cm2 /V・sec
以上であることを特徴とする請求項1記載の圧電性半導
体。
2. Mobility is 30 cm 2 / V · sec
The piezoelectric semiconductor according to claim 1, which is the above.
【請求項3】 単結晶内における電気伝導度のバラツキ
が1021/Ω・cm以内であることを特徴とする請求
項1又は2記載の圧電性半導体。
3. A according to claim 1 or 2, wherein the variation of electrical conductivity in the single crystal is equal to or is within 10 2 1 / Ω · cm piezoelectric semiconductor.
【請求項4】 ZnO焼結体原料を容器下部の原料充填
部に、ZnO種結晶を容器上部の結晶育成部にそれぞれ
配置するとともに、アルカリ溶媒を容器に収容し、原料
充填部の温度が結晶育成部の温度より高くなるように容
器内温度を調節して水熱条件下でZnO単結晶を育成す
る圧電性半導体の製造方法であって、育成したZnO単
結晶に、Liをドープして電気伝導度を制御したことを
特徴とする圧電性半導体の製造方法。
4. A ZnO sintered body raw material is placed in a raw material filling section at the bottom of a container, and a ZnO seed crystal is placed in a crystal growing section at the upper portion of the vessel, and an alkaline solvent is placed in the vessel, and the temperature of the raw material filling section is set to the crystal. A method for manufacturing a piezoelectric semiconductor, in which a ZnO single crystal is grown under hydrothermal conditions by adjusting a temperature inside a container so as to be higher than a temperature of a growing portion, wherein the grown ZnO single crystal is doped with Li to generate an electric charge. A method for manufacturing a piezoelectric semiconductor, characterized by controlling conductivity.
JP23965292A 1992-09-08 1992-09-08 Piezoelectric and its manufacture Pending JPH0690035A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP23965292A JPH0690035A (en) 1992-09-08 1992-09-08 Piezoelectric and its manufacture
US08/112,529 US5393444A (en) 1992-09-08 1993-08-27 Piezoelectric semiconductor
CA002105258A CA2105258C (en) 1992-09-08 1993-08-31 Piezoelectric semiconductor and process for production thereof
EP93307055A EP0587407A3 (en) 1992-09-08 1993-09-07 Piezoelectric semiconductor and process for production thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23965292A JPH0690035A (en) 1992-09-08 1992-09-08 Piezoelectric and its manufacture

Publications (1)

Publication Number Publication Date
JPH0690035A true JPH0690035A (en) 1994-03-29

Family

ID=17047892

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23965292A Pending JPH0690035A (en) 1992-09-08 1992-09-08 Piezoelectric and its manufacture

Country Status (1)

Country Link
JP (1) JPH0690035A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999034037A1 (en) * 1997-12-25 1999-07-08 Japan Energy Corporation Process for the preparation of single crystals of compound semiconductors, equipment therefor, and single crystals of compound semiconductors
EP1266982A3 (en) * 2001-06-12 2006-07-05 National Institute of Advanced Industrial Science and Technology Method for production of zinc oxide single crystal

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999034037A1 (en) * 1997-12-25 1999-07-08 Japan Energy Corporation Process for the preparation of single crystals of compound semiconductors, equipment therefor, and single crystals of compound semiconductors
EP1266982A3 (en) * 2001-06-12 2006-07-05 National Institute of Advanced Industrial Science and Technology Method for production of zinc oxide single crystal

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