JPH0687303B2 - Inspection device for disk type recording media - Google Patents
Inspection device for disk type recording mediaInfo
- Publication number
- JPH0687303B2 JPH0687303B2 JP60272455A JP27245585A JPH0687303B2 JP H0687303 B2 JPH0687303 B2 JP H0687303B2 JP 60272455 A JP60272455 A JP 60272455A JP 27245585 A JP27245585 A JP 27245585A JP H0687303 B2 JPH0687303 B2 JP H0687303B2
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- defect
- disk
- type recording
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Recording Or Reproducing By Magnetic Means (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Measuring Magnetic Variables (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、ディスク型記録媒体の検査を行なう検査装
置に係るものであり、特に、複数のディスク面について
の検査を行なう検査装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection apparatus for inspecting a disk type recording medium, and more particularly to an inspection apparatus for inspecting a plurality of disk surfaces.
磁気ディスクの電磁変換特性の検査を行なう検査装置に
あっては、検査の能率を高めるため、複数の磁気ディス
クの各ディスク面に夫々対応して磁気ヘッドを設け、こ
れらのディスク面について並行して検査を行なうのが一
般である。こうした検査装置では、従来、ディスク面が
欠陥を有するものであるか否かの判定とディスク面上で
の欠陥の大きさ及び位置の検出とを行なう高精度の検査
回路を、各磁気ヘッドに夫々対応して(すなわち検査対
象である磁気ディスクの各ディスク面に夫々対応して)
複数設けるようにしていた。In an inspection device that inspects the electromagnetic conversion characteristics of a magnetic disk, in order to increase the efficiency of the inspection, a magnetic head is provided for each disk surface of a plurality of magnetic disks, and these disk surfaces are arranged in parallel. It is common to conduct an inspection. In such an inspection apparatus, conventionally, each magnetic head is provided with a highly accurate inspection circuit that determines whether or not the disk surface has a defect and detects the size and position of the defect on the disk surface. Corresponding (that is, corresponding to each disk surface of the magnetic disk to be inspected)
I was planning to provide more than one.
しかし、このように高精度の検査回路を複数設けること
は、コスト高になるとともに装置の大型化を招くという
問題があった。更に、各検査回路の判定速度や検出精度
にばらつきが存在する場合には却って検査の信頼性が低
下してしまうという問題があった。However, providing a plurality of highly accurate inspection circuits in this way raises the cost and the size of the apparatus. Further, if there is a variation in the judgment speed or detection accuracy of each inspection circuit, there is a problem that the reliability of the inspection is rather lowered.
この発明は上述の問題点を解決するためになされたもの
である。The present invention has been made to solve the above problems.
この発明に係るディスク型記録媒体の検査装置は、検査
対象であるディスク型記録媒体の複数のディスク面に対
応する複数の読み書きヘッドの読み出し信号に基づき、
該複数のディスク面について、欠陥の有無に関する判定
を並行して行う比較的低精度の第1の検査手段と、前記
第1の検査手段により欠陥を有しないものであると判定
されなかったディスク面に対応する読み書きヘッドの読
出し信号を選択する選択手段と、前記選択手段により選
択された読出し信号に基づき、欠陥を有しないもである
と判定されなかった前記ディスク面について、欠陥の有
無の正確な判定と欠陥の状態に関する検査を行う高精度
の第2の検査手段とを備えたことを特徴としている。A disc-type recording medium inspection apparatus according to the present invention, based on read signals of a plurality of read / write heads corresponding to a plurality of disc surfaces of a disc-type recording medium to be inspected,
A relatively low-precision first inspecting unit that makes a determination as to whether or not there is a defect in parallel with respect to the plurality of disc surfaces, and a disc surface that is not determined to have no defect by the first inspecting unit. Based on the read signal selected by the selecting means for selecting the read signal of the read / write head corresponding to, the disc surface which is not determined to have no defect is accurately determined whether or not there is a defect. It is characterized in that it is provided with a high-precision second inspection means for making a judgment and an inspection regarding the state of defects.
本発明では、まず最初に単に欠陥の有無に関する判定の
みを行う比較的低精度の第1の検査手段によって判定を
行い、その判定の結果、欠陥を明らかに有しないもので
あると判定されなかったディスク面についてのみ、最終
的に1個の高精度の第2の検査手段により欠陥の有無の
正確な判定と欠陥の状態に関する検査を行うようにして
いるので、第1の検査手段をより安価且つ簡易に構成す
ることができると共に高精度の第2の検査手段は1個だ
けなので、全体として検査装置の低コスト化と小型化を
図ることができる。また、欠陥の有無の判定と欠陥の状
態の検査がもとに最終的に1個の第2の検査手段により
行なわれることになるので、各検査手段の判定速度や検
査精度のばらつきによる検査の信頼性の低下のおそれが
なくなる。In the present invention, first, a relatively low-precision first inspecting means that only makes a determination as to the presence or absence of a defect is first used to make a determination, and as a result of the determination, it is not determined that the defect is not apparently present. Only for the disk surface, one highly accurate second inspection means is finally used to accurately determine the presence / absence of a defect and to inspect the state of the defect. Since the number of the second inspection means that can be simply configured and has high accuracy is only one, the cost and size of the inspection apparatus can be reduced as a whole. In addition, since the presence / absence of a defect and the inspection of the state of the defect are finally performed by one second inspection means, the inspection speed depends on the determination speed and the inspection accuracy of each inspection means. There is no fear of deterioration of reliability.
更に、特許請求の範囲第2項記載のように、第2の検査
手段を第1の検査手段の一部として兼用するようにした
場合には、第1の検査手段のハード量をそれだけ減少さ
せることができるので、検査装置の低コスト化と小型化
が更に一層促進される。以下の実施例では、こうした検
査装置を例にとって説明を行なう。Further, when the second inspection means is also used as a part of the first inspection means as described in claim 2, the hardware amount of the first inspection means is reduced accordingly. Therefore, cost reduction and size reduction of the inspection device are further promoted. In the following embodiments, such an inspection device will be described as an example.
以下、添付図面を参照してこの発明の一実施例を詳細に
説明する。An embodiment of the present invention will be described in detail below with reference to the accompanying drawings.
第1図はこの発明の係るディスク型記録媒体の検査装置
の一実施例を示す。この検査装置1は磁気ディスクの電
磁変換特性の検査を行なうものであり、図示しない複数
の被検査磁気ディスクの各ディスク面に1対1に対応し
た図示しない複数の磁気ヘッドの読出し信号(CH(チャ
ンネル)1〜n(但しnは2以上の自然数)の信号と呼
ぶ)がこの検査装置1に与えられる。FIG. 1 shows an embodiment of a disc type recording medium inspection apparatus according to the present invention. This inspection device 1 is for inspecting the electromagnetic conversion characteristics of a magnetic disk, and reads signals from a plurality of magnetic heads (CH (not shown) corresponding to the disk surfaces of a plurality of magnetic disks to be inspected (not shown) on a one-to-one basis. Channels 1 to n (where n is a signal of a natural number of 2 or more) are supplied to the inspection apparatus 1.
装置1にはチャンネル切替回路2が設けられており、CH
1〜nの信号は全てこの回路2に入力する。回路2は、
制御入力に与えられる信号に基づき、複数の入力信号の
中から1つの信号を選択して出力する。回路2の出力
は、装置1に設けられた検査回路3に与えられる。検査
回路3は、磁気ヘッドの読出し信号に基づき、ディスク
面についての欠陥(ミッシングパルスエラー,エクスト
ラパルスエラー,モジュレーションエラー等)の有無の
判定とディスク面上での前記欠陥の大きさ及び位置の検
出とを行なう高精度の検査回路である。The device 1 is provided with a channel switching circuit 2, and CH
All signals 1 to n are input to this circuit 2. Circuit 2 is
One signal is selected from a plurality of input signals and output based on the signal given to the control input. The output of the circuit 2 is given to the inspection circuit 3 provided in the device 1. The inspection circuit 3 judges the presence or absence of defects (missing pulse error, extra pulse error, modulation error, etc.) on the disk surface based on the read signal of the magnetic head, and detects the size and position of the defect on the disk surface. This is a high-precision inspection circuit that performs and.
装置1にはまたCH1〜nよりも1個少ない数の検査回路
4が設けられており、CH1〜nの信号のうち1つの信号
を除いた残りの信号、例えばCH2〜nの信号が、各検査
回路4に1信号ずつ入力する。検査回路4は、磁気ヘッ
ドの読出し信号に基づき、ディスク面について、前記欠
陥を明らかに有しないものかそうでないものかの判定の
みを行なう比較的低精度の検査回路(したがって安価且
つ簡易な構成の検査回路)である。The device 1 is also provided with one less number of test circuits 4 than CH1 to n, and the remaining signals except one of the signals of CH1 to n, for example, the signals of CH2 to n, respectively. One signal is input to the inspection circuit 4. The inspection circuit 4 is a relatively low-precision inspection circuit that determines only whether the disk surface clearly has the defect or not, based on the read signal of the magnetic head. Inspection circuit).
検査回路3の欠陥の有無の判定結果を示す信号S1は、装
置1に設けられたシーケンスコントロール部5に与えら
れる。各検査回路4の判定結果を示す信号S2も、夫々シ
ーケンスコントロール部5に与えられる。シーケンスコ
ントロール部5は、これらの信号S1,S2に基づき、チャ
ンネル切替回路2の選択動作を制御する信号を該回路2
の制御入力に与えるものである。The signal S1 indicating the determination result of the presence or absence of the defect of the inspection circuit 3 is given to the sequence control unit 5 provided in the device 1. The signal S2 indicating the determination result of each inspection circuit 4 is also given to the sequence control unit 5, respectively. The sequence control unit 5 sends a signal for controlling the selection operation of the channel switching circuit 2 based on these signals S1 and S2.
Is given to the control input of.
検査回路3の欠陥の大きさ及び位置の検出結果を示す信
号S3は、図示しない表示手段に与えられて表示される。The signal S3 indicating the detection result of the size and position of the defect of the inspection circuit 3 is given to the display means (not shown) and displayed.
次に、この検査装置1の検査動作の一例を第2図を参照
して説明する。第2図はシーケンスコントロール部5の
実行するコンピュータプログラムの一例を略示するフロ
ーチャートである。被検査ディスクの各ディスク面の読
出しが開始されると、まずチャンネル切替回路2にCH1
の信号を選択出力させる(ステップ101)。これによ
り、CH1〜nの信号が検査回路3,4に与えられ、各ディス
ク面について欠陥の有無に関する判定が検査回路3,4に
より並行して行なわれる。Next, an example of the inspection operation of the inspection device 1 will be described with reference to FIG. FIG. 2 is a flow chart schematically showing an example of a computer program executed by the sequence control unit 5. When the reading of each disk surface of the disk to be inspected is started, CH1 is first transferred to the channel switching circuit 2.
Signal is selectively output (step 101). As a result, the signals of CH1 to CHn are given to the inspection circuits 3 and 4, and the inspection circuits 3 and 4 judge in parallel whether or not there is a defect on each disk surface.
この判定が終了して判定結果を示す信号S1,S2が検査回
路3,4から与えられると、次に、欠陥を明らかに有しな
いものであると判定しなかった検査回路3,4にあたえら
れているCH1〜nの信号を、順次チャンネル切替回路2
に選択出力させる(ステップ102)。これにより、欠陥
を明らかに有しないものであると判定されなかったディ
スク面について、今度は欠陥の有無の精確な判定が検査
回路3により順次行なわれる。その結果欠陥が存在する
と判定されたディスク面については、ディスク面上での
欠陥の大きさ及び位置が同じく検査回路3により検出さ
れ、その検出結果が図示しない表示手段に表示される。When this judgment is completed and the signals S1 and S2 indicating the judgment result are given from the inspection circuits 3 and 4, the inspection circuits 3 and 4 which are not judged to have no defects are given to the inspection circuits 3 and 4. CH1 to n signals that are being transmitted sequentially to the channel switching circuit 2
To be selectively output (step 102). As a result, the inspection circuit 3 sequentially makes an accurate determination of the presence / absence of a defect on the disk surface which is not determined to have no defect. As a result, with respect to the disk surface determined to have a defect, the size and position of the defect on the disk surface are similarly detected by the inspection circuit 3, and the detection result is displayed on the display means (not shown).
このようにこの検査装置1では、安価且つ簡易な構成の
検査回路4と高精度の1個の検査回路3を設け、これら
の検査回路3,4により各ディスク面について欠陥の有無
に関する判定をまず行ない、その結果欠陥を明らかに有
しないものであると判定されなかったディスク面につい
て、欠陥の有無の精確な判定と欠陥の大きさ及び位置の
検出とを最終的に検査回路3により行なうようにしてい
る。従って、各ディスク面に対応した磁気ヘッド毎に検
査回路4のような高精度の検査回路を設けて高精度な検
査を並行して行なう検査装置と異なり、装置の低コスト
化と小型化を図ることができ、且つ、各検査回路の判定
精度や検出精度のばらつきによる検査の信頼性の低下を
防止することができる。As described above, the inspection apparatus 1 is provided with the inspection circuit 4 having a low cost and a simple structure and the highly accurate one inspection circuit 3, and these inspection circuits 3 and 4 first determine the presence or absence of a defect on each disk surface. As a result, the inspection circuit 3 finally performs the accurate determination of the presence / absence of a defect and the detection of the size and position of the defect on the disk surface that is not determined to have no defect as a result. ing. Therefore, unlike a testing apparatus that provides a highly accurate testing circuit such as the testing circuit 4 for each magnetic head corresponding to each disk surface and performs highly accurate testing in parallel, the cost and size of the apparatus are reduced. In addition, it is possible to prevent deterioration of the reliability of the inspection due to the variation of the determination accuracy and the detection accuracy of each inspection circuit.
尚、この実施例では磁気ディスクの検査を行なっている
が、その他のディスク型記録媒体の検査を行なうように
してもよい。Although the magnetic disk is inspected in this embodiment, other disk type recording media may be inspected.
以上の通り、この発明に係るディスク型記録媒体の検査
装置によれば、装置の低コスト化と小型化を図ることが
でき、各検査手段の判定精度や検査精度のばらつきによ
る検査の信頼性の低下を防止することができる。As described above, according to the disc-type recording medium inspection apparatus of the present invention, it is possible to reduce the cost and size of the apparatus, and to improve the reliability of the inspection due to the determination accuracy of each inspection means and the variation of the inspection accuracy. The decrease can be prevented.
更に、特許請求の範囲第2項のように第2の検査手段を
第1の検査手段の一部として兼用した場合には、更に一
層装置の低コスト化と小型化を図ることができる。Further, when the second inspection means is also used as a part of the first inspection means as in claim 2, the cost and size of the apparatus can be further reduced.
第1図はこの発明に係るディスク型記録媒体の検査装置
の一実施例を示す電気的ブロック図、第2図は第1図の
検査装置のシーケンスコントロール部が実行するコンピ
ュータプログラムの一例を略示するフローチャートであ
る。 1……検査装置、2……チャンネル切替回路、3,4……
検査回路、5……シーケンスコントロール部。FIG. 1 is an electrical block diagram showing an embodiment of a disc type recording medium inspection device according to the present invention, and FIG. 2 is a schematic diagram showing an example of a computer program executed by a sequence control unit of the inspection device of FIG. It is a flowchart to do. 1 …… Inspection device, 2 …… Channel switching circuit, 3,4 ……
Inspection circuit, 5 ... Sequence control unit.
Claims (2)
のディスク面に対応する複数の読み書きヘッドの読み出
し信号に基づき、該複数のディスク面について、欠陥の
有無に関する判定を並行して行う比較的低精度の第1の
検査手段と、 前記第1の検査手段により欠陥を有しないものであると
判定されなかったディスク面に対応する読み書きヘッド
の読出し信号を選択する選択手段と、 前記選択手段により選択された読出し信号に基づき、欠
陥を有しないものであると判定されなかった前記ディス
ク面について、欠陥の有無の正確な判定と欠陥の状態に
関する検査を行う高精度の第2の検査手段と を備えたことを特徴とするディスク型記録媒体の検査装
置。1. A method for making a determination as to whether or not there is a defect on a plurality of disk surfaces based on read signals from a plurality of read / write heads corresponding to a plurality of disk surfaces of a disk-type recording medium to be inspected. A low-accuracy first inspection means, a selection means for selecting a read signal of the read / write head corresponding to a disk surface which is not determined to have no defect by the first inspection means, and the selection means High-accuracy second inspection means for accurately determining the presence / absence of a defect and inspecting the defect state of the disk surface that is not determined to have no defect based on the selected read signal. An inspection device for a disk-type recording medium, which is provided.
いて欠陥の有無に関する判定が並行して行われる際、第
1の検査手段の一部として兼用されるものである特許請
求の範囲第1項記載のディスク型記録媒体の検査装置。2. The second inspecting means is also used as a part of the first inspecting means when the determination as to the presence or absence of a defect is made in parallel on a plurality of disk surfaces. An inspection device for a disc-type recording medium according to item 1.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60272455A JPH0687303B2 (en) | 1985-12-05 | 1985-12-05 | Inspection device for disk type recording media |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60272455A JPH0687303B2 (en) | 1985-12-05 | 1985-12-05 | Inspection device for disk type recording media |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62133374A JPS62133374A (en) | 1987-06-16 |
JPH0687303B2 true JPH0687303B2 (en) | 1994-11-02 |
Family
ID=17514155
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60272455A Expired - Fee Related JPH0687303B2 (en) | 1985-12-05 | 1985-12-05 | Inspection device for disk type recording media |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0687303B2 (en) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5253405A (en) * | 1975-10-28 | 1977-04-30 | Tdk Corp | Drop-out tester |
JPS5342002A (en) * | 1976-09-28 | 1978-04-17 | Nec Corp | Method for inspection of magnetic recording medium |
-
1985
- 1985-12-05 JP JP60272455A patent/JPH0687303B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPS62133374A (en) | 1987-06-16 |
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