JPH0658343B2 - Recording method of measured spectrum of double-focusing mass spectrometer - Google Patents

Recording method of measured spectrum of double-focusing mass spectrometer

Info

Publication number
JPH0658343B2
JPH0658343B2 JP59249937A JP24993784A JPH0658343B2 JP H0658343 B2 JPH0658343 B2 JP H0658343B2 JP 59249937 A JP59249937 A JP 59249937A JP 24993784 A JP24993784 A JP 24993784A JP H0658343 B2 JPH0658343 B2 JP H0658343B2
Authority
JP
Japan
Prior art keywords
mass
ion
electric field
magnetic field
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59249937A
Other languages
Japanese (ja)
Other versions
JPS61128156A (en
Inventor
武弘 竹田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59249937A priority Critical patent/JPH0658343B2/en
Publication of JPS61128156A publication Critical patent/JPS61128156A/en
Publication of JPH0658343B2 publication Critical patent/JPH0658343B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Description

【発明の詳細な説明】 イ.産業上の利用分野 本発明は、二重収束型質量分析計における測定スペクト
ルの記録方法に関する。
Detailed Description of the Invention a. BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for recording a measurement spectrum in a double focusing mass spectrometer.

通常、イオン源、電場、磁場、検出器(順配置)または
イオン源、磁場、電場、検出器(逆配置)の順にこれら
を配置してなる二重収束型質量分析計では、電場をイオ
ン加速電圧に応じた一定の値に固定し磁場を走査して、
すなわち磁場をスケールとしてイオン化された試料分子
イオンの質量スペクトルを測定する以外にイオンの開裂
反応を調べることができる。
Normally, in a double-focusing mass spectrometer in which an ion source, an electric field, a magnetic field, and a detector (forward arrangement) or an ion source, a magnetic field, an electric field, and a detector (reverse arrangement) are arranged in this order, the electric field is accelerated by the ions. Fixed to a constant value according to the voltage and scanning the magnetic field,
That is, besides the measurement of the mass spectrum of the ionized sample molecule ions using the magnetic field as a scale, the cleavage reaction of the ions can be investigated.

試料分子のイオン化によって生じたイオンのうち準安定
状態にあって自然に崩壊するイオン或いは外部から導入
した適当な分子との衝突によって活性化されて、更に中
性分子とイオンとに開裂する、このイオンの開裂反応に
おいて、開裂前のもとのイオンを親イオン、開裂によっ
て生じたイオンを娘イオンと呼ぶことにすると、或る質
量の親イオンがどのような娘イオンを生ずるかという特
定の質量の親イオンから生じるすべての娘イオンの質量
スペクトルは、電場をイオン加速電圧に応じた一定の値
に固定し磁場を走査して測定した試料分子イオンの質量
スペクトルと共に試料の分析上重要な情報を与える。
Of the ions generated by the ionization of the sample molecules, the ions are metastable and decay naturally, or are activated by collision with an appropriate molecule introduced from the outside, and are further cleaved into neutral molecules and ions. In the ion cleavage reaction, the original ion before the cleavage is called the parent ion and the ion generated by the cleavage is called the daughter ion, and the specific mass of what kind of daughter ion a certain mass of parent ion produces The mass spectra of all the daughter ions generated from the parent ions of are the mass spectra of the sample molecule ions measured by scanning the magnetic field with the electric field fixed at a constant value according to the ion acceleration voltage, and important information for the analysis of the sample. give.

本発明は、上述した両質量スペクトルの記録方法に関す
る。
The present invention relates to the above-mentioned method for recording both mass spectra.

ロ.従来の技術 イオン源からイオン加速電圧によって所定エネルギーま
で加速されたイオン(親イオン)が電場に入る前に幾つ
かの娘イオンに分解(開裂)した場合、特定の質量Mの
親イオンから生じるすべての娘イオンの質量スペクトル
は、二重収束型質量分析計を用いて電場と磁場の比を一
定に保ちながら電場及び磁場を走査する、いわゆるリン
クドスキャニング法(B/E法)によって測定すること
ができる。
B. 2. Description of the Related Art When an ion (parent ion) accelerated to a predetermined energy by an ion accelerating voltage from an ion source is decomposed (split) into several daughter ions before entering an electric field, all of the ions generated from a parent ion having a specific mass M The mass spectrum of the daughter ions of the above is to be measured by the so-called linked scanning method (B / E method) in which the electric field and the magnetic field are scanned using a double-focusing mass spectrometer while keeping the ratio of the electric field and the magnetic field constant. You can

二重収束質量分析計において、イオン加速電圧をVa
c、磁場をBとするとすると、磁場を通過する通常のイ
オンの質量Mは比例定数をCとして 通常の質量分析では電場Eoを運動のエネルギーeVa
c(eは電子の電荷)を有するイオンが通過するように
設定する。イオン開裂反応では親イオンも娘イオンも同
じ速度を持つているので、親イオンの質量をM,娘イオ
ンの質量をmとし、イオン加速電圧Vacにおける速度
をvとすると、親イオンの運動のエネルギーKoは 娘イオンの運動のエネルギーKは 故に 質量Mの親イオンから生ずる娘イオンの質量スペクトル
を測定する場合を考える。質量mの娘イオンが磁場に入
射するときの運動のエネルギーは上記(2)式で与えら
れ、これは質量mのイオンの加速電圧が(m/M)Va
cになつたのと等価であるから、このイオンが磁場を通
過できるためには磁場B′は前記(1)式によつて またこのイオンが電場を通過するためには、電場Eはエ
ネルギー(m/M)eEoに対応して (3)式は変形して (4)(5)式でE,Eo及びCは定数であり、Mを或る値に
決めると、 E=C′m,B′=C″m となり、E対Bの比を一定に保ちながらE及びBを走査
させることにより質量Mの親イオンから生じる娘イオン
mの走査を行うことができる。
In the double focusing mass spectrometer, the ion acceleration voltage is Va
If c is the magnetic field and B is the magnetic field, the mass M of an ordinary ion passing through the magnetic field is C In ordinary mass spectrometry, the electric field Eo is used as the kinetic energy eVa.
It is set so that ions having c (e is the charge of the electron) pass through. Since the parent ion and the daughter ion have the same velocity in the ion cleavage reaction, if the mass of the parent ion is M, the daughter ion mass is m, and the velocity at the ion acceleration voltage Vac is v, the kinetic energy of the parent ion is Ko is The kinetic energy K of the daughter ion is Therefore Consider the case of measuring a mass spectrum of a daughter ion generated from a parent ion of mass M. The kinetic energy when a daughter ion of mass m is incident on the magnetic field is given by the above equation (2), and the acceleration voltage of the ion of mass m is (m / M) Va
Since it is equivalent to c, the magnetic field B'can be calculated by the above equation (1) in order for this ion to pass through the magnetic field. Also, in order for these ions to pass through the electric field, the electric field E corresponds to the energy (m / M) eEo Equation (3) is transformed In Eqs. (4) and (5), E, Eo, and C are constants, and when M is set to a certain value, E = C'm, B '= C ″ m, and the ratio of E to B is kept constant. While scanning E and B, daughter ions m generated from parent ions of mass M can be scanned.

さて、従来は上述したリンクドスキヤンニングの方法に
よつて得られた娘イオンの質量スペクトルをそれだけで
単独に記録表示していたので、試料についての総合的な
情報を得るためには別に記録されている通常の質量スペ
クトルと突合せて見る必要があつて不便であつた。
In the past, since the mass spectrum of the daughter ion obtained by the above-mentioned linked scanning method was recorded and displayed by itself, it was recorded separately to obtain comprehensive information about the sample. It is inconvenient to see it against the usual mass spectrum.

ハ.発明が解決しようとする問題点 二重収束質量分析計における測定結果の上述した従来の
表示方法の実際活用上の不便さを解消しようとするもの
である。
C. Problems to be Solved by the Invention An object of the present invention is to solve the inconvenience in practical use of the above-mentioned conventional display method of the measurement result in the double-convergence mass spectrometer.

ニ.問題点解決のための手段 通常の質量スペクトルの記録と並べて娘イオンの質量ス
ペクトルを記録するようにした。
D. Means for solving the problem The mass spectrum of the daughter ions was recorded alongside the normal mass spectrum recording.

ホ.実施例 図は本発明の一実施例を示す。この図で横軸の目盛は質
量であり、縦軸はイオンの検出強度を示す。下の横軸ラ
イン上に上向きに延びるスペクトル記録は通常の質量ス
ペクトルを示し、上の横軸ラインから下向きに延びるス
ペクトル記録が娘イオンの質量スペクトルである。前記
(4), (5)式に従つてB/E=一定の関係に保ちながらB
及びEを走査してリンクドスキヤンニングを行うと、E
=Eo, において質量Mの親イオンそのものが検出され、娘イオ
ンは全てMより質量が小さいから、娘イオンの質量スペ
クトルで最大質量のピークは親イオンを表わし、第1図
でMがこの親イオンである。両スペクトルの記録で質量
目盛の位置を一致させておくと、両スペクトルのピーク
が重なつて判り難くなるので、この実施例では娘イオン
スペクトル記録の質量目盛を少し左へずらせて両スペク
トルのピークが重ならぬようにしてある。
E. Embodiment FIG. Shows an embodiment of the present invention. In this figure, the scale on the horizontal axis indicates mass, and the vertical axis indicates the detected intensity of ions. The upwardly extending spectral record on the lower horizontal axis shows the normal mass spectrum, and the downwardly extending spectral record from the upper horizontal line is the mass spectrum of the daughter ion. The above
B / E = B according to Eqs. (4) and (5)
And scan E and perform linked scanning, E
= Eo, Since the parent ion itself having a mass M is detected and all the daughter ions have smaller masses than M, the peak of the maximum mass in the mass spectrum of the daughter ion represents the parent ion, and in FIG. 1, M is this parent ion. If the positions of the mass scales are made to coincide in the recording of both spectra, the peaks of both spectra will be difficult to understand because they overlap, so in this example, the mass scale of the daughter ion spectrum recording is slightly shifted to the left to show the peaks of both spectra. So that they do not overlap.

本発明は上述したようなグラフ表示に限定されないで、
テーブルによる数字表示でもよいことは云うまでもな
い。
The present invention is not limited to the graph display as described above,
It goes without saying that the numbers may be displayed on a table.

ヘ.効 果 本発明によれば一試料に関する二種の質量スペクトルが
並べて表示されているので、二種の質量スペクトルの記
録の整理が楽になり、スペクトル構成の理解が大へん容
易になる。
F. Effect According to the present invention, since two kinds of mass spectra for one sample are displayed side by side, the records of the two kinds of mass spectra can be organized easily, and the understanding of the spectrum structure is greatly facilitated.

【図面の簡単な説明】 図は本発明による測定結果記録の一例を示すものであ
る。
BRIEF DESCRIPTION OF THE DRAWINGS The figure shows an example of a measurement result record according to the present invention.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】イオン源、電場又は磁場、磁場又は電場、
検出器の順にこれらを配置してなる二重収束型質量分析
計において、電場対磁場の比を一定に保ちながら電場及
び磁場を走査して、イオン源からイオン加速電圧によっ
て所定エネルギーまで加速されたイオンが電場に入る前
に開裂反応により分解生成して特定の質量の親イオンか
ら生じるすべての娘イオンのスペクトルを測定し、同じ
試料について電場をイオン加速電圧に応じた一定の値に
固定し磁場を走査して質量スペクトルを測定し、これら
両スペクトルを同じ質量目盛により並べて記録すること
を特徴とする二重収束型質量分析計の測定スペクトル記
録方法。
1. An ion source, an electric field or a magnetic field, a magnetic field or an electric field,
In a double-focusing mass spectrometer in which these are arranged in the order of detectors, the electric field and the magnetic field were scanned while keeping the ratio of the electric field to the magnetic field constant, and the ions were accelerated to a predetermined energy by an ion accelerating voltage. Before the ions enter the electric field, the spectra of all daughter ions generated from the parent ions of a specific mass that are decomposed and produced by the cleavage reaction are measured, and the electric field is fixed to a certain value according to the ion acceleration voltage and the magnetic field is fixed. A method for recording a measured spectrum of a double-convergence type mass spectrometer, characterized in that a mass spectrum is measured by scanning, and both of these spectra are arranged and recorded on the same mass scale.
JP59249937A 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer Expired - Lifetime JPH0658343B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59249937A JPH0658343B2 (en) 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59249937A JPH0658343B2 (en) 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer

Publications (2)

Publication Number Publication Date
JPS61128156A JPS61128156A (en) 1986-06-16
JPH0658343B2 true JPH0658343B2 (en) 1994-08-03

Family

ID=17200385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59249937A Expired - Lifetime JPH0658343B2 (en) 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer

Country Status (1)

Country Link
JP (1) JPH0658343B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7022980B2 (en) * 2004-02-02 2006-04-04 Agilent Technologies, Inc. Spectral axis transform

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075486A (en) * 1973-11-05 1975-06-20

Also Published As

Publication number Publication date
JPS61128156A (en) 1986-06-16

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