JPH0646194Y2 - 過熱検出回路 - Google Patents
過熱検出回路Info
- Publication number
- JPH0646194Y2 JPH0646194Y2 JP1985079447U JP7944785U JPH0646194Y2 JP H0646194 Y2 JPH0646194 Y2 JP H0646194Y2 JP 1985079447 U JP1985079447 U JP 1985079447U JP 7944785 U JP7944785 U JP 7944785U JP H0646194 Y2 JPH0646194 Y2 JP H0646194Y2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- temperature sensor
- comparator
- output
- power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 title claims description 15
- 239000004065 semiconductor Substances 0.000 claims description 20
- 238000001816 cooling Methods 0.000 claims description 18
- 238000010438 heat treatment Methods 0.000 description 9
- 230000006378 damage Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000001681 protective effect Effects 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985079447U JPH0646194Y2 (ja) | 1985-05-28 | 1985-05-28 | 過熱検出回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985079447U JPH0646194Y2 (ja) | 1985-05-28 | 1985-05-28 | 過熱検出回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61195723U JPS61195723U (enExample) | 1986-12-06 |
| JPH0646194Y2 true JPH0646194Y2 (ja) | 1994-11-24 |
Family
ID=30624367
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985079447U Expired - Lifetime JPH0646194Y2 (ja) | 1985-05-28 | 1985-05-28 | 過熱検出回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0646194Y2 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101598949B (zh) * | 2009-06-23 | 2012-07-18 | 中兴通讯股份有限公司 | 温度采集控制装置及方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5367366A (en) * | 1976-11-29 | 1978-06-15 | Hitachi Ltd | Detector for overload of semiconductor element |
| JPS54104026U (enExample) * | 1978-01-06 | 1979-07-21 |
-
1985
- 1985-05-28 JP JP1985079447U patent/JPH0646194Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61195723U (enExample) | 1986-12-06 |
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