JPH06349556A - Ic socket - Google Patents

Ic socket

Info

Publication number
JPH06349556A
JPH06349556A JP16605993A JP16605993A JPH06349556A JP H06349556 A JPH06349556 A JP H06349556A JP 16605993 A JP16605993 A JP 16605993A JP 16605993 A JP16605993 A JP 16605993A JP H06349556 A JPH06349556 A JP H06349556A
Authority
JP
Japan
Prior art keywords
spring
contact
lead
contact portion
elastic force
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16605993A
Other languages
Japanese (ja)
Other versions
JP2525119B2 (en
Inventor
Yuji Kato
裕司 加藤
Shunji Abe
俊司 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamaichi Electronics Co Ltd
Original Assignee
Yamaichi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaichi Electronics Co Ltd filed Critical Yamaichi Electronics Co Ltd
Priority to JP5166059A priority Critical patent/JP2525119B2/en
Publication of JPH06349556A publication Critical patent/JPH06349556A/en
Application granted granted Critical
Publication of JP2525119B2 publication Critical patent/JP2525119B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Connecting Device With Holders (AREA)

Abstract

PURPOSE:To provide an IC socket in which any contact part can slide favorably along the surface of an IC lead by the cooperation of the first spring and the second spring held in the contact. CONSTITUTION:A contact 4 has the first spring 6, which pushes the contact 10 against the surface of an IC lead 3, and the second spring 8, which is supported by this first spring 6, and this second spring 8 is provided with the said contact 10. In this IC socket, the elastic force is set so that the second spring 8 may flex with the elastic force of the first spring 6 after the accumulated elastic force of the first spring 6 pushes the contact 10 against the surface of the IC lead, and the contact 10 is arranged so that it may side from above to below on the surface of a lead, accompanying the flexion of this second spring 8.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明はコンタクトの蓄えられ
た弾力をリードの表面に作用させて加圧接触を得るソケ
ットに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a socket in which the elastic force accumulated in a contact acts on the surface of a lead to obtain a pressure contact.

【0002】[0002]

【従来の技術と発明が解決しようとする問題点】特開昭
63−34874号はコンタクトのバネ部の端部に接点
部を設け、このコンタクトをバネ部の弾力に抗し後方へ
変位させて弾力を蓄え、このコンタクトをこの蓄勢弾力
に従い前方へ変位させることにより、上記接点部をリー
ドの表面に加圧接触させている。
2. Description of the Related Art Japanese Unexamined Patent Publication No. 63-34874 discloses that a contact portion is provided at an end of a spring portion of a contact and the contact is displaced rearward against the elasticity of the spring portion. By storing the elastic force and displacing the contact forward according to the stored elastic force, the contact portion is brought into pressure contact with the surface of the lead.

【0003】上記従来例に代表されるソケットはバネ部
の弾力により接点部をリード表面に押し付けた後の有効
なワイピング動作が得られず、接触の信頼性を低下させ
る問題を有している。
The socket typified by the above-mentioned conventional example has a problem that an effective wiping operation cannot be obtained after the contact portion is pressed against the lead surface by the elastic force of the spring portion, and the contact reliability is lowered.

【0004】この問題はリード及びコンタクトが微細化
し、高い接触圧を得ることが困難となるに伴ない益々顕
在化しており、ワイピングの必要性が高まって来てい
る。
This problem becomes more and more apparent as the leads and contacts become finer and it becomes difficult to obtain a high contact pressure, and the need for wiping is increasing.

【0005】この発明は上記ワイピング動作を有効に惹
起させ、比較的小さな接触圧でも健全なる接触が期待で
きるICソケットを提供する。
The present invention provides an IC socket which effectively causes the above wiping operation and can expect a sound contact even with a relatively small contact pressure.

【0006】又上記従来例に代表されるICソケットは
バネ部の弾力により接点部をリードの表面に衝撃的に突
き当て、リードの変形やリード表面に打痕を生じさせる
問題を有している。
Further, the IC socket represented by the above-mentioned conventional example has a problem that the contact portion is impacted against the surface of the lead by the elastic force of the spring portion, and the lead is deformed or a dent is formed on the lead surface. .

【0007】本発明は上記接点部の初期過程におけるリ
ードに対する接触圧を大巾に緩和しつつ、最終的には充
分な接触圧を以ってリード表面に加圧接触することがで
きるようにしたICソケットを提供する。
According to the present invention, the contact pressure of the contact portion with respect to the lead in the initial process is largely relaxed, and finally the contact surface can be pressure-contacted with a sufficient contact pressure. Provide an IC socket.

【0008】[0008]

【問題点を解決するための手段】この発明はコンタクト
の第1バネの蓄勢弾力で接点部をICリードの表面に押
し付けた後第2バネが上記第1バネの上記弾力で撓むよ
うに弾力設定され、上記接点がこの第2バネの撓みに伴
ないリード表面を上位から下位又は下位から上位へ摺動
するように配置したICソケットを構成したものであ
る。
According to the present invention, the elastic force is set so that the second spring is bent by the elastic force of the first spring after the contact portion is pressed against the surface of the IC lead by the elastic force of the first spring of the contact. The contact is arranged so that the lead surface slides from the upper side to the lower side or from the lower side to the upper side in accordance with the bending of the second spring.

【0009】又別の発明は第1バネの蓄勢弾力で上記接
点部をICリードの表面に押し付けた後、第2バネが上
記第1バネの上記弾力で撓むように弾力設定し、この撓
みに伴なって上記第1バネの蓄勢弾力で上記接点部を弾
持する押圧部を具備しているICソケットを構成したも
のである。
According to another invention, after the contact portion is pressed against the surface of the IC lead by the elastic force of the first spring, the elastic force is set so that the second spring bends by the elastic force of the first spring. Along with this, an IC socket having a pressing portion for elastically holding the contact portion by the stored elastic force of the first spring is configured.

【0010】[0010]

【作用】この発明によれば、第1バネの蓄勢弾力により
接点部がICリードの表面への加圧接触を開始した後、
第2バネが第1バネの上記弾力により撓み、この撓み運
動により第2バネに設けた接点部の位置が変化し接点部
がリード表面を上位から下位へ又は下位から上位へ摺動
する。
According to the present invention, after the contact portion starts pressure contact with the surface of the IC lead by the elastic force of the first spring,
The second spring bends due to the elastic force of the first spring, and the position of the contact portion provided on the second spring changes due to this bending movement, and the contact portion slides on the lead surface from the upper side to the lower side or from the lower side to the upper side.

【0011】本発明の上記構造によれば第1バネと第2
バネが協働して上記摺動運動を有効に惹起させ、又第2
バネの弾力をワイピングに適した弾力に設定できてこの
ワイピングを適正に遂行させ、ワイピングの強弱の調整
も容易である。又第1バネに制約されることなく接点部
の摺動位置を任意に設定できる。
According to the above structure of the present invention, the first spring and the second spring
The spring cooperates to effectively induce the sliding motion, and the second
The elastic force of the spring can be set to an elastic force suitable for wiping, and this wiping can be performed properly, and the strength of wiping can be easily adjusted. Further, the sliding position of the contact portion can be arbitrarily set without being restricted by the first spring.

【0012】又別の発明によれば、接点部が第1バネの
弾力によりICリード表面に加圧接触する際の衝撃を第
2バネにより緩和し、接触初期においては接点部をリー
ド表面に柔らかく接触させ、その接触圧を徐々に高め、
前記リード変形や打痕発生の問題を有効に防止する。そ
して最終的には接点部を押圧部で弾持し第1バネによる
弾力を接点部に直接的に与え接触圧を確保することがで
きる。
According to another aspect of the present invention, the impact caused when the contact point is brought into pressure contact with the IC lead surface by the elastic force of the first spring is mitigated by the second spring, and the contact point is softened to the lead surface in the initial stage of contact. Contact, gradually increase the contact pressure,
The problems of lead deformation and dent formation are effectively prevented. Finally, the contact portion can be elastically held by the pressing portion and the elastic force of the first spring can be directly applied to the contact portion to secure the contact pressure.

【0013】[0013]

【実施例】【Example】

実施例1(図1乃至図10参照) ソケット本体1はIC2のリード3に対応して配置され
たコンタクト4を有し、このコンタクト4はソケット本
体1に固装される固定部5を有し、この固定部5の下位
にこの固定部5から延ばされた端子部16a又は16b
を有する。
Example 1 (see FIGS. 1 to 10) The socket body 1 has contacts 4 arranged corresponding to the leads 3 of the IC 2, and the contacts 4 have a fixing portion 5 fixed to the socket body 1. , The terminal portion 16a or 16b extending from the fixed portion 5 below the fixed portion 5.
Have.

【0014】端子部16aは図1に実線で示すように配
線基板の配線パターンの表面に弾力的に加圧接触し、端
子部16bは図1に仮想線で示すように配線基板のスル
ーホールに挿入し接続される。
The terminal portion 16a elastically press-contacts with the surface of the wiring pattern of the wiring board as shown by the solid line in FIG. 1, and the terminal portion 16b is in the through hole of the wiring board as shown by the phantom line in FIG. Inserted and connected.

【0015】又上記固定部5の上位にこの固定部5から
延ばされた第1バネ部6を有する。この第1バネ部6は
ICリード3の下位において下方へ向け湾曲された湾曲
バネより成り、この湾曲バネから成る第1バネ6の端部
より第1バネ6の上方に延ばされた弾性を有する第1ア
ーム7を有する。
A first spring portion 6 extending from the fixed portion 5 is provided above the fixed portion 5. The first spring portion 6 is composed of a bending spring that is bent downward below the IC lead 3, and has elasticity extending above the first spring 6 from an end portion of the first spring 6 formed of the bending spring. It has a first arm 7 having.

【0016】この第1アーム7は略垂直にしてICリー
ド3を支承する台座12の上面を超えIC2の側面と対
向する位置まで上方へ向け延ばしその上端に第2バネ8
を支持する。
The first arm 7 is substantially vertical and extends upward to a position facing the side surface of the IC 2 beyond the upper surface of the pedestal 12 which supports the IC lead 3, and the second spring 8 is provided at the upper end thereof.
Support.

【0017】この第2バネ8は上方へ向け湾曲する湾曲
バネにて形成し、この湾曲バネにより成る第2バネ8の
端部より弾性を有する第2アーム9を第2バネ8の下方
へ向け延ばす。
The second spring 8 is formed by a bending spring that bends upward, and a second arm 9 having elasticity is directed downward from the end of the second spring 8 formed by the bending spring. extend.

【0018】この第2アーム9は略垂直にして下方へ延
ばしその下端に接点部10を設ける。この接点部10は
第2アームの端部から内側へ向け、換言するとICリー
ド3に向け突出した突起にて形成する。
The second arm 9 is made substantially vertical and extends downward, and a contact portion 10 is provided at the lower end thereof. The contact portion 10 is formed by a protrusion that projects inward from the end of the second arm, in other words, projects toward the IC lead 3.

【0019】上記のように第1バネ6と第2バネ8は互
いに逆向きに突出され、同様に第1アーム7と第2アー
ム9とは互いに逆方向に延ばされ、各アームの端部7
a、9aが互いに内外に対向する位置まで延ばされる。
As described above, the first spring 6 and the second spring 8 project in opposite directions, and similarly, the first arm 7 and the second arm 9 extend in opposite directions, and the end portions of the respective arms are extended. 7
a and 9a are extended to a position where they face each other inward and outward.

【0020】即ち、第2アーム9の下端部9aは第1ア
ーム7の上端部7aとその内側において対向する位置ま
で延ばされ、この第2アーム9の下端部9aの内側(I
Cリードと対する側)に上記接点部10を設けると共
に、第1アーム7の上端部7aと第2アーム9の下端部
9aとの間に第2バネ8及び第2アーム9の弾性変位量
を設定する間隔11を設け、第1アーム上端部7aに接
点部10をICリード3に押し付ける押圧部15を形成
する。第1バネ6はその蓄勢弾力で接点部10をICリ
ード3の表面に押し付けながら第2バネ8及び第2アー
ム9を弾性に抗し撓ませる。
That is, the lower end portion 9a of the second arm 9 is extended to a position facing the upper end portion 7a of the first arm 7 on the inner side thereof, and the inner side of the lower end portion 9a of the second arm 9 (I
The contact portion 10 is provided on the side opposite to the C lead), and the elastic displacement of the second spring 8 and the second arm 9 is provided between the upper end portion 7a of the first arm 7 and the lower end portion 9a of the second arm 9. A space 11 to be set is provided, and a pressing portion 15 for pressing the contact portion 10 against the IC lead 3 is formed on the upper end portion 7a of the first arm. The first spring 6 presses the contact portion 10 against the surface of the IC lead 3 by its elastic force, and flexes the second spring 8 and the second arm 9 against elasticity.

【0021】この第2アーム9の撓み運動に伴ない接点
部10はICリード3の表面を上位より下位へ向け摺動
しリード表面を清掃する。この摺動量を上記間隔11に
より設定する。
With the bending movement of the second arm 9, the contact portion 10 slides the surface of the IC lead 3 from the upper side to the lower side to clean the surface of the lead. This sliding amount is set by the interval 11.

【0022】即ち、第2バネ8及び第2アーム9は間隔
11の範囲で撓みが許容され、第2アーム9の下端部
に、上記押圧部15が当接することによって上記撓みを
阻止し(第2バネ8の撓みによる摺動を停止し)、この
当接後押圧部15は接点部10をバックアップし第1バ
ネ6の蓄勢弾力を接点部10に直接的に与えICリード
3に押し付ける。
That is, the second spring 8 and the second arm 9 are allowed to bend within the interval 11, and the lower end of the second arm 9 is brought into contact with the pressing portion 15 to prevent the bending (first After the contact, the pressing portion 15 backs up the contact portion 10 and directly applies the stored elastic force of the first spring 6 to the contact portion 10 to press it against the IC lead 3.

【0023】本発明は上記第1バネ6に第2バネ8を連
設し、第2バネ8の下端部に上記接点部10を設けると
共に、第1バネ6の上端部に上記押圧部15を設け、こ
の第1バネ6と第2バネ8の連設部に後記する引張力を
与える構成を開示している。
In the present invention, the second spring 8 is connected to the first spring 6, the contact portion 10 is provided at the lower end of the second spring 8, and the pressing portion 15 is provided at the upper end of the first spring 6. A configuration is provided in which the tension force described below is applied to the connecting portion of the first spring 6 and the second spring 8 which is provided.

【0024】上記第1バネ6と第2バネ8とは前者の弾
力を強にし、後者の弾力を弱に設定し、第1バネ6の弾
力で第2バネ8が撓むように両者の弾力を設定する。例
えば図示のように第1バネ6の断面積を大にし、第2バ
ネ8の断面積を小にし、上記弾力設定を行なう。
The first spring 6 and the second spring 8 increase the elasticity of the former and weaken the elasticity of the latter, and set the elasticity of both so that the elasticity of the first spring 6 causes the second spring 8 to bend. To do. For example, as shown in the figure, the cross-sectional area of the first spring 6 is made large and the cross-sectional area of the second spring 8 is made small to set the elasticity.

【0025】前記の如く上記第1アーム7はICリード
3を支承するIC支持座12の上面より上方へ超えてリ
ード3と対向する位置まで延ばし、その上端に上記第2
バネ8を支持し、よって第2バネ8をリード3より上方
に配置し、第2アーム9をリード3の上方からリード側
面に向け延ばす。
As described above, the first arm 7 extends above the upper surface of the IC support seat 12 for supporting the IC lead 3 to a position facing the lead 3, and the second arm is provided at the upper end thereof.
The spring 8 is supported, and thus the second spring 8 is arranged above the lead 3, and the second arm 9 is extended from above the lead 3 toward the lead side surface.

【0026】他例としてIC2の本体下面を台座に支承
してICリード3は非支持状態にすることができる。
As another example, the lower surface of the main body of the IC 2 can be supported on the pedestal so that the IC lead 3 is not supported.

【0027】上記第1バネ6と第2バネ8の連設部に作
用してコンタクト4を接触位置と接触解除位置へ変位さ
せるコンタクト開閉レバー13を設ける。図面に示した
実施例においては第1アーム7の上端、即ち第1アーム
7と第2バネ8の連設部に第1アーム7の外側において
下方へ突設されたフック部14を設け、このフック部1
4に上記コンタクト開閉レバー13を係合する。
A contact opening / closing lever 13 is provided which acts on the connecting portion of the first spring 6 and the second spring 8 to displace the contact 4 between the contact position and the contact release position. In the embodiment shown in the drawings, the upper end of the first arm 7, that is, the connecting portion of the first arm 7 and the second spring 8 is provided with a hook portion 14 projecting downward on the outside of the first arm 7. Hook part 1
The contact opening / closing lever 13 is engaged with 4.

【0028】絶縁材製のソケット本体1はその中央部に
IC2が収容可能な上方に開放する略方形のIC収容部
17を有し、このIC収容部17の底部には、前記IC
支持座12を設け、このIC収容部17の対向する二辺
に沿ってICリード3に対応するコンタクト4を並列配
置にし、このコンタクト4をIC収容部17に収容され
たICリード3に接触する位置と、接触解除位置とに変
位せしめるコンタクト開閉部材を備え、このコンタクト
開閉部材としてソケット本体1に軸19により回動可に
支持されたコンタクト開閉レバー13を有する。
The socket main body 1 made of an insulating material has a substantially rectangular IC accommodating portion 17 which is open upward and can accommodate the IC 2 at the center thereof, and the IC accommodating portion 17 has a bottom portion at which the IC
The support seat 12 is provided, the contacts 4 corresponding to the IC leads 3 are arranged in parallel along the two opposite sides of the IC housing portion 17, and the contacts 4 are brought into contact with the IC leads 3 housed in the IC housing portion 17. A contact opening / closing member for displacing the contact opening / closing position and the contact releasing position is provided, and the contact opening / closing lever 13 rotatably supported by the shaft 19 on the socket body 1 is provided as the contact opening / closing member.

【0029】上記コンタクト開閉レバー13は、IC収
容部17の二辺、即ちコンタクト4の列に沿って平行に
延び、レバー13の長手方向両端部より左右に突出する
支持軸19をソケット本体1に設けた軸受け部に回転自
在に支持する。
The contact opening / closing lever 13 extends in parallel along two sides of the IC accommodating portion 17, that is, along the row of contacts 4, and has a support shaft 19 protruding leftward and rightward from both longitudinal ends of the lever 13 in the socket body 1. It is rotatably supported by the provided bearing.

【0030】又コンタクト開閉レバー13はその内端に
弧形に形成された作用部20を有し、レバー外端に受圧
部21を有し、作用部20をフック部14に係合する。
これによりレバー13の受圧部21が下方回動すること
によりコンタクト4の接点部10を第1バネ6の弾力に
抗し外側方へ向け後方変位して接触解除状態を形成し、
コンタクト4が第1バネ6の復元力により内側方へ向け
前方変位することにより上記レバー13の受圧部21を
上方回動し、接点部10をリード3の表面に当接する。
The contact opening / closing lever 13 has an arcuate action portion 20 at its inner end and a pressure receiving portion 21 at the lever outer end to engage the action portion 20 with the hook portion 14.
As a result, the pressure receiving portion 21 of the lever 13 is rotated downward, so that the contact portion 10 of the contact 4 is displaced rearward toward the outer side against the elastic force of the first spring 6 to form a contact release state,
When the contact 4 is displaced forward by the restoring force of the first spring 6, the pressure receiving portion 21 of the lever 13 is rotated upward, and the contact portion 10 is brought into contact with the surface of the lead 3.

【0031】図2で示すように、受圧部21に押下力を
与えてコンタクト開閉レバー13を第1バネ6の弾力に
抗して押し下げると、コンタクト4のフック部14をコ
ンタクト開閉レバー13の作用部20が牽引し接点部1
0を第1バネ6に抗し斜め上後方に引き上げ接触解除位
置に変位する。そして、この状態でIC2をIC収容部
17に落し込むとリード3の先端部がIC支持座12上
に受け止められ、IC2をIC収容部17に収容する。
As shown in FIG. 2, when a pressing force is applied to the pressure receiving portion 21 to push down the contact opening / closing lever 13 against the elasticity of the first spring 6, the hook portion 14 of the contact 4 acts on the contact opening / closing lever 13. The part 20 pulls and the contact part 1
0 is pulled diagonally upward and rearward against the first spring 6, and is displaced to the contact release position. Then, when the IC 2 is dropped into the IC housing portion 17 in this state, the tips of the leads 3 are received on the IC support seat 12, and the IC 2 is housed in the IC housing portion 17.

【0032】この後、上記コンタクト開閉レバー13の
押下力を解除すると、図3に示すようにコンタクト開閉
レバー13の受圧部21が第1バネ6の蓄勢弾力(復元
力)により上方へ移動すると同時に、コンタクト4の接
点部10が上記接触解除位置から接触位置に向けて斜め
下前方に変位し、これにより上記接点部10がリード3
の表面に押し付けられる。
Thereafter, when the pressing force of the contact opening / closing lever 13 is released, the pressure receiving portion 21 of the contact opening / closing lever 13 moves upward due to the elastic force (restoring force) of the first spring 6, as shown in FIG. At the same time, the contact portion 10 of the contact 4 is displaced obliquely downward and forward from the contact release position toward the contact position, whereby the contact portion 10 is moved to the lead 3
Pressed against the surface of.

【0033】上記コンタクト開閉レバー13は自動機械
や手等で直接押し下げるか、又はコンタクト開閉部材と
してコンタクト開閉カバー22をソケット本体1に昇降
可能に組み付け、該コンタクト開閉カバー22を自動機
械や手等で押し下げることにより、押下部23によりコ
ンタクト開閉レバー13の受圧部21を間接的に押し下
げる。
The contact opening / closing lever 13 is directly pushed down by an automatic machine, a hand, or the like, or the contact opening / closing cover 22 is attached to the socket body 1 as a contact opening / closing member so as to be able to move up and down. By pressing down, the pressing portion 23 indirectly presses down the pressure receiving portion 21 of the contact opening / closing lever 13.

【0034】前記のように、第1バネ6の蓄勢弾力によ
り接点部10がリード3の表面に押し付けられた後、第
2バネ8及び第2アーム9は引き続き付加される第1バ
ネ6の蓄勢弾力により押圧部15が接点部10の背面付
近に当接するまで撓み、この撓み運動を生じている間接
点部10を図4、図5及び図6に示すようにリード3の
表面に添い上位より下位へ摺動せしめ、リード表面を清
掃する。所謂ワイピング効果を与える。
As described above, after the contact portion 10 is pressed against the surface of the lead 3 by the elastic force of the first spring 6, the second spring 8 and the second arm 9 are continuously added to the first spring 6. The pressing portion 15 bends until it comes into contact with the vicinity of the back surface of the contact portion 10 due to the elastic force, and the indirect point portion 10 that causes this bending movement is attached to the surface of the lead 3 as shown in FIGS. 4, 5 and 6. Clean the lead surface by sliding it from upper to lower. It gives a so-called wiping effect.

【0035】図4、図6においてP1は接点部10がリ
ード3の表面に加圧接触された最初の位置(摺動開始位
置)を示し、P2は接点部が摺動途中の位置を示し、図
5のP3は摺動を終了した位置を示し、接点部10はP
1点よりP3点へ向け摺動する。
4 and 6, P1 shows the initial position (sliding start position) where the contact portion 10 is pressed against the surface of the lead 3, and P2 shows the position where the contact portion is sliding. P3 in FIG. 5 indicates the position where the sliding is finished, and the contact portion 10 is P
Slide from point 1 to point P3.

【0036】上記押圧部15が接点部10の背面付近、
即ち、第2アーム9の下端外側面に当接することにより
第1バネ6の蓄勢弾力が接点部10に直接的に与えられ
てこの接点部10をICリード3の表面に押し付ける。
The pressing portion 15 is near the back surface of the contact portion 10,
That is, by contacting the outer surface of the lower end of the second arm 9, the spring force of the first spring 6 is directly applied to the contact portion 10 to press the contact portion 10 against the surface of the IC lead 3.

【0037】IC2はその側面から突出したJベンド形
のリード3を有し、上記接点部10はこのJベンド形リ
ード3の上下方向に延びた部分3aの外表面を上位から
下位へ摺動する。
The IC 2 has a J-bend type lead 3 protruding from its side surface, and the contact portion 10 slides from the upper side to the lower side on the outer surface of the vertically extending portion 3a of the J-bend type lead 3. .

【0038】本発明は上記Jベンド形リードに使用でき
る他、ICリードを導電箔で形成してIC2の側面に密
着した形式のICにも実施できる。
The present invention can be applied not only to the J-bend type lead described above, but also to an IC of a type in which the IC lead is formed of a conductive foil and closely attached to the side surface of the IC 2.

【0039】又本発明は図7に示すように、Jベンド形
リード3の上部の曲げ部3bに沿い上位のP1点より下
位のP3点へ摺動させる場合を含む。これはIC2を反
転して装填しJベンド形リードの遊離端の曲げ部表面に
添い摺動させる場合も同様である。
As shown in FIG. 7, the present invention also includes the case of sliding along the upper bent portion 3b of the J-bend type lead 3 to the lower P3 point from the upper P1 point. This is also the case when the IC2 is inverted and loaded, and is slid along the curved surface of the free end of the J-bend type lead.

【0040】又図示しないが本発明はリードを二段曲げ
したガルウィン形リードにも適用できる。即ち、ガルウ
ィン形リードの上下方向に延びた部分の外側面又は上部
曲げ部に沿い接点部10を摺動させる場合を含む。
Although not shown, the present invention can also be applied to a gull-win type lead obtained by bending the lead in two steps. That is, the case where the contact portion 10 is slid along the outer side surface or the upper bent portion of the vertically extending portion of the gull-win type lead is included.

【0041】図8は本発明の実施態様例として接点部1
0の接触面を前傾する斜面10aにし、この斜面10a
がリード3の上部折曲部3bの表面を上位より下位へ摺
動するようにした場合を示している。この場合、リード
3に対する接点部10の加圧接触位置は殆んど変化せ
ず、接点部10の斜面10aが上位より下位へ摺動す
る。
FIG. 8 shows a contact portion 1 as an embodiment of the present invention.
The contact surface of 0 is inclined to the front and is inclined 10a.
Shows the case where the surface of the upper bent portion 3b of the lead 3 is slid from the upper side to the lower side. In this case, the pressure contact position of the contact portion 10 with respect to the lead 3 hardly changes, and the slope 10a of the contact portion 10 slides from the upper position to the lower position.

【0042】図9に示すように、コンタクト4における
接点部10を第1バネ6に抗して押圧した場合、同接点
部10は矢印S1方向に変位し、これに対し図10に示
すように第1バネ6の端部を同バネ6に抗して押圧した
時同端部は矢印S3方向に変位する。又逆に第2バネ8
が復元する時接点部10は図9の矢印S2方向に変位
し、これに対し第1バネ6が復元する時第1バネ6の端
部は矢印S4方向に変位する。そして図9、図10から
理解されるように、第1バネ6の端部、即ち第1バネ6
に支持された押圧部15は図10に示す仮想円軌跡に類
似した軌跡をたどってその上死点内側において変位し、
又第2バネ8の端部、即ち第2バネ8に支持された接点
部10は図9に示す仮想円軌跡に類似した軌跡をたどっ
てその下死点内側において変位する。これによって上記
摺動を惹起する。
As shown in FIG. 9, when the contact point portion 10 of the contact 4 is pressed against the first spring 6, the contact point portion 10 is displaced in the direction of arrow S1, as shown in FIG. When the end portion of the first spring 6 is pressed against the spring 6, the end portion is displaced in the arrow S3 direction. On the contrary, the second spring 8
When the contact point 10 is restored, the contact portion 10 is displaced in the direction of arrow S2 in FIG. 9, while the end portion of the first spring 6 is displaced in the direction of arrow S4 when the first spring 6 is restored. And as understood from FIGS. 9 and 10, the end portion of the first spring 6, that is, the first spring 6
The pressing portion 15 supported by is displaced inside the top dead center by following a locus similar to the virtual circle locus shown in FIG.
Further, the end portion of the second spring 8, that is, the contact portion 10 supported by the second spring 8 follows a locus similar to the virtual circle locus shown in FIG. 9 and is displaced inside the bottom dead center. This causes the sliding.

【0043】第2実施例(図11乃至図15参照) この実施例はコンタクトの接点部10′がリード3の表
面に沿い下位から上位へ摺動しワイピング作用を得るよ
うにした場合を示す。
Second Embodiment (See FIGS. 11 to 15) This embodiment shows a case where the contact portion 10 'of the contact slides along the surface of the lead 3 from the lower side to the upper side to obtain a wiping action.

【0044】コンタクト4′は第1バネ6′と第2バネ
8′を有し、第1バネ6′は上方へ湾曲し、第2バネ
8′は下方へ湾曲する。詳述するとソケット本体1に対
する固定部5′から上方へ立上る支柱24を立設し、こ
の支柱24の上端部に上方へ向け湾曲した第1バネ6′
を連設し、この第1バネ6′の端部から下方へ向かい延
びる弾性を有する第1アーム7′を連設し、この第1ア
ーム7′の下端に下方へ向け湾曲した上記第2バネ8′
を連設し、この第2バネ8′の端部から上方へ向かい延
びる弾性を有する第2アーム9′を連設し、この第2ア
ーム9′の上端にICリード3の表面に向け突出する接
点部10′を設ける。
The contact 4'has a first spring 6'and a second spring 8 ', the first spring 6'bending upward and the second spring 8'bending downward. More specifically, a column 24 that rises upward from the fixed portion 5 ′ for the socket body 1 is provided upright, and the upper end of the column 24 has a first spring 6 ′ that is curved upward.
And a first arm 7'having elasticity extending downward from the end of the first spring 6 ', and the second spring curved downward at the lower end of the first arm 7'. 8 '
And an elastic second arm 9'extending upward from the end of the second spring 8 ', and protruding toward the surface of the IC lead 3 at the upper end of the second arm 9'. A contact portion 10 'is provided.

【0045】上記第1バネ6′は第1実施例とは逆にI
Cリード3の上位に配置され、第2バネ8′はリード3
の下位に配置される。
Contrary to the first embodiment, the first spring 6'is I
The second spring 8'is arranged above the C lead 3, and the second spring 8'is
It is placed below.

【0046】又上記第1アーム7′と第2アーム9′と
は互いに逆方向に延ばされ、第1アーム7′の内側(I
Cリード側)に第2アーム9′を対向させ、この対向間
に前記間隔11′を形成し、接点部10′を設けた第2
アーム9′の端部と対向する第1アーム7′の端部に接
点部10′をICリード3に押し付ける押圧部15′を
形成する。
The first arm 7'and the second arm 9'are extended in opposite directions to each other, and the inside of the first arm 7 '(I
A second arm 9'opposed to the C lead side), and the gap 11 'is formed between the second arms 9', and a contact portion 10 'is provided.
A pressing portion 15 'for pressing the contact portion 10' against the IC lead 3 is formed at the end of the first arm 7'opposed to the end of the arm 9 '.

【0047】又第1バネ6′と第2バネ8′の連設部に
前記フック部14′を形成し前記コンタクト開閉レバー
13′と係合する。
Further, the hook portion 14 'is formed at the connecting portion of the first spring 6'and the second spring 8'and engages with the contact opening / closing lever 13'.

【0048】図12に示すように、コンタクト開閉レバ
ー13′の受圧部21′を軸19′を中心に下方へ回動
すると、作用部20′がコンタクト4′のフック部1
4′に引張力を与え、第1バネ6′を弾力に抗し撓ま
せ、これに伴ない接点部10′を第2バネ8′と一緒に
外側方へ向け後方変位し接点部10′をICリード3と
干渉しない位置に移動し、この状態でIC2をソケット
本体に装填する。次で図13に示すように、コンタクト
開閉レバー13′の受圧部21′への押下力を解除する
と、第1バネ6′は復元し、その蓄勢弾力で接点部1
0′をICリード3の表面に押し付ける。第2バネ8′
はこの第1バネ6′の蓄勢弾力により上記間隔11′に
より許容された範囲で撓みながら接点部10′をICリ
ード3の表面に沿い下位P1点より上位P3点へ向け摺
動せしめる。そして押圧部15′が接点部10′の背面
に当接することによって第2バネ8′の撓みによる上記
摺動を停止し、その後押圧部15′は接点部10′をバ
ックアップし第1バネ6′の蓄勢弾力を直接的に接点部
10′に与えICリード3に押し付ける。
As shown in FIG. 12, when the pressure receiving portion 21 'of the contact opening / closing lever 13' is pivoted downward about the shaft 19 ', the acting portion 20' becomes the hook portion 1 of the contact 4 '.
4'is given a tensile force to bend the first spring 6'against the elastic force, and accordingly, the contact portion 10 'is rearward displaced together with the second spring 8'to move the contact portion 10' rearward. The IC 2 is moved to a position where it does not interfere with the IC lead 3, and the IC 2 is loaded into the socket body in this state. Next, as shown in FIG. 13, when the pressing force of the contact opening / closing lever 13 ′ to the pressure receiving portion 21 ′ is released, the first spring 6 ′ is restored, and the stored elastic force causes the contact portion 1 to move.
0'is pressed against the surface of the IC lead 3. Second spring 8 '
The contact spring 10 'slides along the surface of the IC lead 3 from the lower P1 point to the upper P3 point while flexing within the range allowed by the interval 11' by the stored elastic force of the first spring 6 '. Then, the pressing portion 15 'comes into contact with the back surface of the contact portion 10' to stop the sliding due to the bending of the second spring 8 ', and the pressing portion 15' then backs up the contact portion 10 'and the first spring 6'. The urging force of the above is directly applied to the contact portion 10 'and pressed against the IC lead 3.

【0049】本発明は上記第1バネ6′に第2バネ8′
を連設し、第2バネ8′の上端部に上記接点部10′を
設けると共に、第1バネ6′の下端部に上記押圧部1
5′を設け、この第1バネ6′と第2バネ8′の連設部
に後記する引張力を与える構成を開示している。
In the present invention, the first spring 6'is provided with the second spring 8 '.
And the contact portion 10 'is provided at the upper end of the second spring 8', and the pressing portion 1 is provided at the lower end of the first spring 6 '.
5'is provided to apply a tensile force, which will be described later, to the connecting portion of the first spring 6'and the second spring 8 '.

【0050】上記第1バネ6′は弾力を強くし第2バネ
8′は弾力を弱くして第1バネ6′の弾力で第2バネ
8′が撓むように両者の弾力を設定することは前記と同
様である。
The elastic force of the first spring 6'is set to be strong and the elastic force of the second spring 8'is set to be weak so that the elastic force of the first spring 6'bends the second spring 8'to set both elastic forces. Is the same as.

【0051】その他第1実施例と共通する構成及び作用
の説明は第1実施例の記載を援用する。
The description of the first embodiment is incorporated by reference for the description of the configuration and operation common to those of the first embodiment.

【0052】[0052]

【発明の効果】以上説明したように、この発明によれば
第1バネと第2バネの協働により接点部をICリードの
表面に添い確実に摺動させワイピング効果を得ることが
でき、又第2バネの弾力設定によりワイピングを適正に
遂行させワイピングの強弱の調整も容易に行なえる。
As described above, according to the present invention, the wiping effect can be obtained by the cooperation of the first spring and the second spring so that the contact portion can be reliably slid along the surface of the IC lead. By setting the elasticity of the second spring, wiping can be properly performed and the strength of wiping can be easily adjusted.

【0053】第2バネによる接点部の支持位置を第1バ
ネの制約を受けることなく任意に設定して接点部の摺動
位置を任意に設定できる。
The support position of the contact portion by the second spring can be arbitrarily set without being restricted by the first spring, and the sliding position of the contact portion can be arbitrarily set.

【0054】又別の発明によれば、第1バネによる蓄勢
弾力で接点部がICリードに加圧接触する際の衝撃を、
第2バネにより良好に緩和し、該接触時におけるリード
変形や打痕発生を有効に防止する。
According to another aspect of the invention, the impact generated when the contact portion is brought into pressure contact with the IC lead by the elastic force of the first spring,
The second spring relaxes satisfactorily, and effectively prevents lead deformation and dent formation at the time of contact.

【0055】そして最終的には押圧部で接点部を弾持す
ることにより第1バネによる所定の接触圧を確保するこ
とができる。
Finally, the contact portion is elastically held by the pressing portion, so that a predetermined contact pressure by the first spring can be secured.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の第1実施例を示すICソケット断面
図であり、同断面図は左右対称に表われるので左半分を
省略して示す。
FIG. 1 is a sectional view of an IC socket showing a first embodiment of the present invention. Since the sectional view is symmetrical, the left half is omitted.

【図2】図1におけるコンタクトを図1の状態から接触
解除位置へ変位し、ICを装填した状態を示すICソケ
ット断面図。
2 is an IC socket cross-sectional view showing a state in which the contact in FIG. 1 is displaced from the state of FIG. 1 to a contact release position and an IC is loaded.

【図3】同コンタクトを図2の状態から接触位置へ変位
し、接点部をリード表面へ加圧接触せしめた初期段階を
示すICソケット断面図。
3 is an IC socket cross-sectional view showing an initial stage in which the contact is displaced from the state of FIG. 2 to a contact position and the contact portion is brought into pressure contact with the lead surface.

【図4】接点部が図3の状態からリード表面を摺動する
途中の段階を示すICソケット断面図。
4 is an IC socket cross-sectional view showing a stage in which the contact portion is sliding on the lead surface from the state of FIG.

【図5】接点部が図4の状態を経て摺動を終了し、接点
部を押圧部にてバックアップした状態を示すICソケッ
ト断面図。
5 is an IC socket cross-sectional view showing a state in which the contact portion has finished sliding after passing through the state of FIG. 4 and the contact portion has been backed up by a pressing portion.

【図6】図5におけるICリードに対する接点部の接触
状態とバックアップ状態を示す拡大図。
FIG. 6 is an enlarged view showing a contact state and a backup state of a contact portion with respect to the IC lead in FIG.

【図7】ICリードに対する接点部の摺動態様の他例を
示す拡大図。
FIG. 7 is an enlarged view showing another example of a sliding aspect of a contact portion with respect to an IC lead.

【図8】ICリードに対する接点部の摺動態様の更に他
例を示す拡大図。
FIG. 8 is an enlarged view showing still another example of the sliding aspect of the contact portion with respect to the IC lead.

【図9】第2バネ端部の変位軌跡を説明する図。FIG. 9 is a diagram illustrating a displacement trajectory of a second spring end portion.

【図10】第1バネ端部の変位軌跡を説明する図。FIG. 10 is a diagram illustrating a displacement locus of a first spring end portion.

【図11】この発明の第2実施例を示すICソケットを
コンタクトとICを以って示す側面図であり、同側面図
は左右対称に表われるので左半分を省略して示す。
FIG. 11 is a side view showing an IC socket according to a second embodiment of the present invention with a contact and an IC. Since the side view appears symmetrically, the left half is omitted.

【図12】図11におけるコンタクトを図11の状態か
ら接触解除位置へ変位し、ICを装填した状態を示す同
側面図。
12 is a side view showing a state in which the contact in FIG. 11 is displaced from the state in FIG. 11 to a contact release position and an IC is loaded.

【図13】同コンタクトを図12の状態から接触位置へ
変位し、接点部をリード表面へ加圧接触せしめた初期段
階を示す同側面図。
13 is a side view showing the initial stage in which the contact is displaced from the state of FIG. 12 to a contact position and the contact portion is brought into pressure contact with the lead surface.

【図14】接点部が図13の状態からリード表面を摺動
する途中の段階を示す同側面図。
14 is a side view showing the stage in which the contact portion slides on the lead surface from the state of FIG.

【図15】接点部が図14の状態を経て摺動を終了し、
接点部を押圧部にてバックアップした状態を示す同側面
図。
FIG. 15: The contact point has finished sliding after passing through the state of FIG.
The same side view showing the state where the contact portion was backed up by the pressing portion.

【符号の説明】[Explanation of symbols]

1、1′ ソケット本体 2 IC 3 ICリード 4 コンタクト 6、6′ 第1バネ 8、8′ 第2バネ 10、10′ 接点部 11、11′ 間隔 13、13′ コンタクト開閉レバー 15、15′ 押圧部 1, 1'Socket body 2 IC 3 IC lead 4 Contact 6, 6'First spring 8, 8'Second spring 10, 10 'Contact part 11, 11' Interval 13, 13 'Contact opening / closing lever 15, 15' Pressing Department

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】ICリードに対応し配置されたコンタクト
を有し、このコンタクトはその接点部をICリードの表
面に押し付ける第1バネと、この第1バネに支持された
第2バネを有し、この第2バネに上記接点部が設けられ
たICソケットにおいて、第1バネの蓄勢弾力で上記接
点部をICリードの表面に押し付けた後第2バネが上記
第1バネの上記弾力で撓むように弾力設定され、上記接
点部がこの第2バネの撓みに伴ないリード表面を上位か
ら下位へ摺動するように配置されていることを特徴とす
るICソケット。
1. A contact arranged corresponding to an IC lead, the contact having a first spring for pressing its contact portion against the surface of the IC lead, and a second spring supported by the first spring. In the IC socket in which the contact portion is provided on the second spring, the contact portion is pressed against the surface of the IC lead by the elastic force of the first spring, and then the second spring is bent by the elastic force of the first spring. An IC socket, which is elastically set so that the contact portion is slid from the upper surface to the lower surface along with the bending of the second spring.
【請求項2】ICリードに対応し配置されたコンタクト
を有し、このコンタクトはその接点部をICリードの表
面に押し付ける第1バネと、この第1バネに支持された
第2バネを有し、この第2バネに上記接点部が設けられ
たICソケットにおいて、第1バネの蓄勢弾力で上記接
点部をICリードの表面に押し付けた後第2バネが上記
第1バネの上記弾力で撓むように弾力設定され、上記接
点部がこの第2バネの撓みによってリード表面を下位か
ら上位へ摺動するように配置されていることを特徴とす
るICソケット。
2. A contact arranged corresponding to the IC lead, the contact having a first spring for pressing the contact portion against the surface of the IC lead, and a second spring supported by the first spring. In the IC socket in which the contact portion is provided on the second spring, the contact portion is pressed against the surface of the IC lead by the elastic force of the first spring, and then the second spring is bent by the elastic force of the first spring. An IC socket, which is elastically set so that the contact portion is slid on the lead surface from the lower side to the upper side by the bending of the second spring.
【請求項3】ICリードに対応し配置されたコンタクト
を有し、このコンタクトはその接点部をICリードの表
面に押し付ける第1バネと、この第1バネに支持された
第2バネを有し、この第2バネに上記接点部が設けられ
たICソケットにおいて、第1バネの蓄勢弾力で上記接
点部をICリードの表面に押し付けた後第2バネが上記
第1バネの上記弾力で撓むように弾力設定され、この撓
みに伴なって上記第1バネの蓄勢弾力で上記接点部を弾
持する押圧部を具備していることを特徴とするICソケ
ット。
3. A contact arranged corresponding to the IC lead, the contact having a first spring for pressing the contact portion against the surface of the IC lead, and a second spring supported by the first spring. In the IC socket in which the contact portion is provided on the second spring, the contact portion is pressed against the surface of the IC lead by the elastic force of the first spring, and then the second spring is bent by the elastic force of the first spring. An IC socket characterized in that the elastic force is set so that the elastic force is set so that the elastic force of the first spring elastically holds the contact portion in accordance with this bending.
JP5166059A 1993-06-11 1993-06-11 IC socket Expired - Lifetime JP2525119B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5166059A JP2525119B2 (en) 1993-06-11 1993-06-11 IC socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5166059A JP2525119B2 (en) 1993-06-11 1993-06-11 IC socket

Publications (2)

Publication Number Publication Date
JPH06349556A true JPH06349556A (en) 1994-12-22
JP2525119B2 JP2525119B2 (en) 1996-08-14

Family

ID=15824214

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5166059A Expired - Lifetime JP2525119B2 (en) 1993-06-11 1993-06-11 IC socket

Country Status (1)

Country Link
JP (1) JP2525119B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004028596A (en) * 2002-06-21 2004-01-29 New Japan Radio Co Ltd Electrode apparatus for testing semiconductor device
DE10112593B4 (en) * 2000-03-23 2007-03-22 Honda Giken Kogyo K.K. Display device for vehicles
WO2021260931A1 (en) * 2020-06-26 2021-12-30 株式会社エンプラス Electrical connection socket

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60204384A (en) * 1984-03-30 1985-10-15 Fuji Xerox Co Ltd Paper-treating device
JPH0574534A (en) * 1991-09-13 1993-03-26 Yamaichi Electron Co Ltd Socket for electric parts
JPH0582221A (en) * 1991-09-18 1993-04-02 Texas Instr Japan Ltd Socket

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60204384A (en) * 1984-03-30 1985-10-15 Fuji Xerox Co Ltd Paper-treating device
JPH0574534A (en) * 1991-09-13 1993-03-26 Yamaichi Electron Co Ltd Socket for electric parts
JPH0582221A (en) * 1991-09-18 1993-04-02 Texas Instr Japan Ltd Socket

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10112593B4 (en) * 2000-03-23 2007-03-22 Honda Giken Kogyo K.K. Display device for vehicles
JP2004028596A (en) * 2002-06-21 2004-01-29 New Japan Radio Co Ltd Electrode apparatus for testing semiconductor device
WO2021260931A1 (en) * 2020-06-26 2021-12-30 株式会社エンプラス Electrical connection socket

Also Published As

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