JPH06337882A - Failure rate calculating system - Google Patents

Abstract

PURPOSE:To easily calculate the failure rate of the whole constitutional parts even when an environment in which an electronic device is installed is changed. CONSTITUTION:The information of constitutional parts in an electronic device whose failure rate is to be calculated is previously stored in a constitutional parts storing part 21. The reference failure rates of respective constitutional parts are previously stored in a failure rate storing part 23. A parameter file correcting part 28 changes the contents of a parameter file when the environment of the electronic device is changed and a failure rate calculating part 29 calculates the failure rate of the environment. A totalizing part 31 totalizes the failure rate of an individual constitutional part and an output part 32 outputs the totalized result as a totalization list 33. Since it is unnecessary to reset the value of each constitutional part even when an environment is changed, manhour can be reduced.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a failure rate calculation system for calculating a failure rate of electronic equipment such as communication equipment.

[0002]

2. Description of the Related Art Generally, the failure rate of each component of an electronic device such as a communication device is shown in their specifications. Therefore, when designing electronic equipment, input the component name into the computer and extract the failure rate for each,
They were added up for all parts and the failure rate of the electronic device as a whole was integrated.

In such a failure rate calculation method, since the structure of electronic equipment becomes complicated and large-scaled because it relies on human hands, it is easy to miss parts and calculation errors, and Reliability was a problem. There is also a problem that a large number of man-hours and time are required to calculate the failure rate. Therefore, Japanese Patent Laid-Open No. 1-229343 proposes a failure rate calculation system that automates the calculation of the failure rate.

FIG. 6 shows an outline of this conventional failure rate calculation system. This system includes a configuration information storage unit 11 that stores configuration information of a device that includes the names of components that make up an electronic device, and a failure rate storage unit 12 that stores a failure rate corresponding to each component. The component name extraction means 13 is configured to sequentially extract the component names from the configuration information stored in the configuration information storage means 11. The extracted part name is given to the failure rate calculation means 14. The failure rate extraction means 15 extracts the failure rate corresponding to the part name given to the failure rate calculation means 14 from the failure rate storage means 12 and supplies it to the failure rate calculation means 14. The failure rate calculation means 14 adds the failure rates to calculate the failure rate of the electronic device. The calculation result is input to the calculation result output means 16, and the result is printed out here.

[0005]

In this conventionally proposed failure rate calculation system, the extraction of the component name and the extraction and addition of the failure rate for each extracted component name are automatically performed, so that it does not depend on human labor. Moreover, the failure rate of electronic devices can be calculated with high reliability.

However, in the proposed failure rate calculation system, it is not easy to perform a change operation for calculating the failure rate when there is a change in parts or a change in the apparatus configuration, and when such an operation is performed. Had a problem that it required considerable man-hours. Further, when the failure rate is calculated by changing the environment in which the electronic device is placed, it is necessary to change the set value for calculating the failure rate for each component. Conventionally, in addition to requiring a lot of man-hours for changing the set value, the setting of the value may be wrong, which causes a decrease in reliability of the calculation result.

Therefore, an object of the present invention is to provide a failure rate calculation system capable of easily calculating the failure rate of the entire components even if the environment in which the electronic device is placed changes.

[0008]

According to a first aspect of the present invention, a component information storage means for storing information on a component of an electronic device which is a target of failure rate calculation, and a standard failure of each component. Failure rate storage means for storing the failure rate, and failure rate change for changing the standard failure rate stored in the failure rate storage unit to a failure rate according to the environmental conditions in which the electronic device is placed, if necessary. The failure rate calculation system is provided with a means, a failure rate totaling means for totaling the failure rate of each component of the electronic device, and an output means for outputting the totalized failure rate.

That is, according to the first aspect of the invention, the standard failure rate of the component parts is stored in the part failure rate storage means, and when the environmental conditions such as temperature, power supply voltage, quality factor, etc. are different. Decided to change the failure rate by the failure rate changing means. Therefore, it is not necessary to change the value of each component in order to change the environmental condition, the man-hour required for this can be reduced, and the setting error caused by this change work is prevented. There is an advantage that you can.

According to a second aspect of the present invention, the component information storage means according to the first aspect stores the product name and quantity of the component used in a predetermined electronic device, and the failure rate totaling means causes a failure of a single component. We decided to calculate the failure rate for the entire component by multiplying the rate by the number of that component. That is, it is possible to easily calculate the failure rate of the entire component with respect to the change of the quantity including zero.

[0011]

EXAMPLES The present invention will be described in detail below with reference to examples.

FIG. 1 shows the configuration of the failure rate calculation system of this embodiment. This system includes a component information storage unit 21 that stores information on components that make up a communication device as an electronic device. The component information storage unit 22 is configured to store the component information in the component information storage unit 21. The component failure rate storage unit 23 is configured to store the standard failure rate of components. The component failure rate storage unit 24 stores the component failure rate in the component failure rate storage unit 23.
It is designed to be stored in.

The configuration extraction unit 25 extracts an arbitrary communication equipment device to be calculated from the component information storage unit 21, and collates the standard failure rate of the relevant component from the component failure rate storage unit 23. Has become. The extracted component information is stored in the development file 26, and the standard failure rate of the component is stored in the parameter file 27. The parameter file correction unit 28 is adapted to change the set value when the environment is different.

The failure rate calculation unit 29 includes a component failure rate storage unit 2
3, the development file 26 and the parameter file 27 are collated to calculate the failure rate of the component. The totaling unit 31 totals the failure rate calculation results based on the data obtained from the expansion file 26 to total the failure rate of the communication device. The output unit 32 inputs this tabulation result and outputs it as the tabulation list 33. The component information storage unit 21, the component failure rate storage unit 23, the expansion file 26, and the parameter file 27 include a magnetic disk and a large-capacity RAM (random access memory).
And the like.

In the failure rate calculation system having such a configuration,
The component information storage unit 22, the component failure rate storage unit 24, the configuration extraction unit 25, the parameter file correction unit 28, the failure rate calculation unit 29, the counting unit 31, and the output unit 32 are respectively stored in a disk device (not shown). A CPU (Central Processing Unit) (not shown) also realizes these functions by executing the program. These will be specifically described below.

FIG. 2 shows the control of the component information storage unit. In the component information storage unit 22,
Using the input means such as a keyboard (not shown), enter the product name, quantity, and designated number of the part to be used (step S10).
1) These are registered in the component information storage unit 21 (step S102). Such registration work is performed for each communication device.

FIG. 3 shows how the component failure rate storage unit is controlled. The component failure rate storage unit 24 is activated when the communication device that is the target of the failure rate calculation is designated (step S201; Y). Then, first, the product name, quantity, and designated number of the designated component of the communication device are read from the component information storage unit 21 (step S2).
02), the standard failure rates of these parts are read from the parts failure rate storage unit 23 (step S203).
In the component failure rate storage unit 24, the product name, quantity, and designation number of the component parts of the communication device are stored in the development file 26 (step S204), and the standard failure rates of these components are stored in the parameter file 27 ( Step S20
5).

FIG. 4 shows how the parameter file correction unit is controlled. Here, when the environmental conditions such as the temperature, the power supply voltage, the quality factor, and the like that use the communication device are changed (step S301; Y), the failure rate calculation is performed based on the standard failure rate stored in the parameter file 27. Change the set value for (step S30
2). When the change of the environmental condition is completed in this way, the failure rate calculation unit 29 is activated. Failure rate calculator 29
Will execute the calculation of the failure rate of each component with reference to the expansion file 26, the parameter file 27, and the component failure rate storage unit 23.

FIG. 5 shows a state of the counting operation of the counting section. The aggregating unit 31 first obtains the number N of component parts of the communication device that is the target of the failure rate calculation (step S401). Next, the part number i to be totalized is initialized to "1" (step S402). Then, the failure rate and the quantity of parts of the i-th component are read (step S403),
By multiplying these, the failure rate A of the entire part is calculated (step S404). This failure rate A is added to the total failure rate T of the communication device (step S405).

Thereafter, it is checked whether the part number i is equal to the number N of constituent parts (step S406). If the value is still smaller than this value, it means that there are parts that should be integrated for the failure rate. Therefore,
In this case (N), the part number i is incremented by "1" (step S407), and the failure rate A for the next part is calculated and added to the total failure rate T (steps S403 to S403).
406). The same applies hereinafter. In this way, when the failure rates are integrated for all the components (step S40)
6; Y), the total failure rate T is output to the output unit 32 (step S408). The output unit 32 outputs the totalized list 33 according to a predetermined format.

[0021]

As described above, according to the first aspect of the present invention, the standard failure rate of the component is stored in the component failure rate storage means, and the environment such as temperature, power supply voltage, quality factor, etc. is stored. If the conditions are different, the failure rate changing means will change the failure rate. Therefore, it is not necessary to change the value of each component in order to change the environmental condition, the man-hour required for this can be reduced, and the setting error caused by the change work can be prevented. be able to.

Further, according to the second aspect of the invention, since the component parts are managed together with the quantity, even if the number of component parts is increased or decreased or the parts are changed, the entire electronic device is broken down. The rate can be calculated easily.

[Brief description of drawings]

FIG. 1 is a principle diagram of a failure rate calculation system according to an embodiment of the present invention.

FIG. 2 is a flowchart showing how control of a component information storage unit is performed in this embodiment.

FIG. 3 is a flowchart showing how the component failure rate storage unit is controlled in this embodiment.

FIG. 4 is a flowchart showing how the parameter file modification unit is controlled in this embodiment.

FIG. 5 is a flow chart showing a state of a counting operation of a counting unit in the present embodiment.

FIG. 6 is a principle diagram showing an outline of a conventional failure rate calculation system.

[Explanation of symbols]

 21 component part information storage unit 22 component part information storage unit 23 component failure rate storage unit 24 component failure rate storage unit 25 configuration extraction unit 26 expansion file 27 parameter file 28 parameter file correction unit 29 failure rate calculation unit 31 aggregation unit 32 output unit 33 Summary list

Claims (2)

[Claims] 1. A component part information storage means for storing information on a component part of an electronic device for which a failure rate is calculated, and a component failure rate storage part for storing a standard failure rate of each component part. Failure rate changing means for changing the standard failure rate stored in the failure rate storage unit to a failure rate according to the environmental conditions in which the electronic device is placed, and a failure of each component of the electronic device. A failure rate calculation system comprising: failure rate totaling means for totaling the rates; and output means for outputting the totalized failure rates. 2. The component information storage means stores a product name and quantity of a component used in a predetermined electronic device,
2. The failure rate calculation system according to claim 1, wherein the failure rate totaling means calculates the failure rate of the entire component by multiplying the failure rate of the component itself by the number of the component.