JPH0631408Y2 - Automatic recognition device for calibration information of measured object in component analyzer - Google Patents
Automatic recognition device for calibration information of measured object in component analyzerInfo
- Publication number
- JPH0631408Y2 JPH0631408Y2 JP3435788U JP3435788U JPH0631408Y2 JP H0631408 Y2 JPH0631408 Y2 JP H0631408Y2 JP 3435788 U JP3435788 U JP 3435788U JP 3435788 U JP3435788 U JP 3435788U JP H0631408 Y2 JPH0631408 Y2 JP H0631408Y2
- Authority
- JP
- Japan
- Prior art keywords
- light
- measured
- calibration information
- marker
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【考案の詳細な説明】 [産業上の利用分野] この考案は成分分析計における被測定物の較正情報自動
認識装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to an apparatus for automatically recognizing calibration information of an object to be measured in a component analyzer.
[考案の背景] 所定の光波長を有する光を被測定物に照射し、その反射
光の光減衰度を測定して被測定物の水分等の成分を検出
する光学式成分分析計については、被測定物の成分測定
中における分析計等の温度の上昇や、分析計の経時変
化、ドリフト等のより測定値に誤差が生じるため、成分
分析計内部には測定値を較正するためにその被測定物に
合致した較正情報を分析計内部の記憶部に入力してお
き、所定の被測定物毎に前記記憶部より予め入力してあ
る対応する較正情報を取り出し、これをもとに検出値を
演算処理し、被測定物の適正な測定値を求めるものとし
ている。[Background of the Invention] An optical component analyzer for irradiating an object to be measured with light having a predetermined light wavelength and measuring the optical attenuation of the reflected light to detect a component such as moisture of the object to be measured is There is an error in the measured value due to the temperature rise of the analyzer during measurement of the component of the measured object, the change with time of the analyzer, the drift, etc.Therefore, in order to calibrate the measured value inside the component analyzer Calibration information that matches the measurement object is input to the storage unit inside the analyzer, and the corresponding calibration information that has been input in advance is extracted from the storage unit for each predetermined measured object, and the detected value is based on this. Is calculated to obtain an appropriate measurement value of the object to be measured.
ところで従来は、多種類にわたる被測定物を特に連続的
に測定する際に、その被測定物毎に分析計内に記憶して
ある被測定物に対応した較正情報をその都度操作して取
り出すことが必要とされており、そのため被測定物の種
類数が多い場合には、その被測定物に対応するマーカー
対応表を作成し、その対応表に基づいて分析計から対応
する被測定物の較正情報を取り出すこととしていた。By the way, conventionally, when measuring many kinds of DUTs particularly continuously, the calibration information corresponding to the DUTs stored in the analyzer for each DUT is operated and taken out each time. When a large number of types of measured objects are required, a marker correspondence table corresponding to the measured objects is created and the analyzer calibrates the corresponding measured objects based on the correspondence table. I was supposed to retrieve the information.
しかしながら、このような人的作業では照合作業等に長
時間を要してしまうとともに、照合作業に錯誤が生じる
こともあり、被測定物の種類数が大量化するととも、こ
の作業等の自動化が要望されていた。However, such a manual work requires a long time for the collation work, and sometimes the collation work may be erroneous, and the number of types of objects to be measured becomes large, and the automation of this work or the like is not possible. It was requested.
[考案の目的] この考案は前記従来の問題点に鑑みて創案されたもので
あり、測定すべき被測定物の種類数が大量化した場合に
も、その被測定物に合致した較正情報等を自動的に取り
出すことができ、適正な測定値を得ることのできる成分
分析計における被測定物の較正情報自動認識装置を提供
することを目的とするものである。[Object of the Invention] The present invention was devised in view of the above-mentioned conventional problems, and even when the number of types of measured objects to be measured increases, calibration information and the like that match the measured objects. It is an object of the present invention to provide an apparatus for automatically recognizing calibration information of an object to be measured in a component analyzer capable of automatically taking out the measured value and obtaining an appropriate measured value.
[考案の構成] この考案よる成分分析計における被測定物の較正情報自
動認識装置は、 所定の光を発する光源ランプ1と、 該光源ランプ1からの光を被測定物12の所定成分に吸
収されない光波長よりなる基準光7と、被測定物12の
所定の成分に吸収される光波長よりなる測定光8とに分
離形成する光学フィルタ5と、 前記光源ランプ1より基準光7、測定光8を相互に照射
して成分分析しうる被測定物12を載置する測定皿11
と、 を備えた成分分析計において、 側面に形成された平面状側壁部30に、水平方向に等間
隔を有して複数のくぼみ部21を設けると共に、該複数
のくぼみ部21上のいずれかに黒シール22を添着して
複数通りのマーカー部31を作成可能とした測定皿11
・・・を複数用意し、 異なるマーカー部31を有する複数の測定皿11には、
それぞれのマーカー部31に対応するよう種類の異なる
被測定物12をそれぞれ載置してなり、 一方、分析計側には前記測定皿11のマーカー部31に
対向してマーカー検出器23を設け、 検出器23で検出されたマーカー部31に対応する各被
測定物12の較正情報は記憶部20に予め記憶され、 演算処理部24で、記憶部20から取り出された較正情
報が参酌されて被測定物12の成分分析用情報が作成さ
れる、様構成されている。[Configuration of Device] The apparatus for automatically recognizing calibration information of an object to be measured in a component analyzer according to the present invention includes a light source lamp 1 that emits predetermined light, and a predetermined component of an object to be measured 12 that absorbs the light from the light source lamp 1. An optical filter 5 which is separately formed into a reference light 7 having a light wavelength that is not controlled and a measurement light 8 having a light wavelength that is absorbed by a predetermined component of the DUT 12, and the reference light 7 and the measurement light from the light source lamp 1. A measuring dish 11 on which an object to be measured 12 that can be subjected to component analysis by irradiating 8 with each other is placed
And a plurality of indented portions 21 provided at equal intervals in the horizontal direction on the planar side wall portion 30 formed on the side surface, and any one of the indented portions 21 on the plurality of indented portions 21. Measuring plate 11 in which a black seal 22 is attached to a plurality of marker parts 31
... are prepared and a plurality of measurement dishes 11 having different marker portions 31 are provided.
Different types of DUTs 12 are placed so as to correspond to the respective marker portions 31, and a marker detector 23 is provided on the analyzer side so as to face the marker portion 31 of the measurement dish 11, The calibration information of each DUT 12 corresponding to the marker unit 31 detected by the detector 23 is stored in advance in the storage unit 20, and the calibration information extracted from the storage unit 20 is taken into consideration in the arithmetic processing unit 24. It is configured such that the component analysis information of the measurement object 12 is created.
[考案の実施例] 以下この考案を図面に示す実施例に基づいて説明する。[Embodiment of the Invention] The invention will be described below based on an embodiment shown in the drawings.
図面第1図は、この考案における成分分析計の概略を示
す概略図である。FIG. 1 is a schematic diagram showing an outline of a component analyzer according to the present invention.
図面において符号1は光源ランプを示す。In the drawings, reference numeral 1 indicates a light source lamp.
光源ランプ1から発せられた光は集光レンズ2を通過
し、モータ3により回動された回転円盤4に設けられた
光学フィルタ5、6を通過することにより、例えば所定
の被測定物の水分に吸収されない光波長からなる基準光
7と、被測定物の水分に吸収される光波長からなる測定
光8とに分離形成される。The light emitted from the light source lamp 1 passes through the condensing lens 2 and the optical filters 5 and 6 provided on the rotating disk 4 rotated by the motor 3, thereby, for example, moisture of a predetermined object to be measured. The reference light 7 having a light wavelength that is not absorbed by the measurement light and the measurement light 8 having a light wavelength that is absorbed by the moisture of the object to be measured are separately formed.
これら光7、8は、第1反射ミラー9並びに照射レンズ
10を介して、分析計の下面におかれた測定皿11に載
置された被測定物12に照射され、この被測定物12の
水分に吸収されずに反射する基準光7と、水分に吸収さ
れ、光減衰して反射する測定光8は分析計の上部に設け
られた第2集光レンズ13により集光され、受光素子1
4に受光される。These lights 7 and 8 are radiated via the first reflecting mirror 9 and the irradiation lens 10 to the object to be measured 12 placed on the measuring dish 11 placed on the lower surface of the analyzer, and the object to be measured 12 is irradiated. The reference light 7 reflected without being absorbed by moisture and the measurement light 8 absorbed by moisture and attenuated and reflected are condensed by the second condenser lens 13 provided on the upper part of the analyzer, and the light receiving element 1
4 is received.
ところでこの成分分析計により、例えば水分等の成分を
測定するなどの被測定物12の種類は、多種多様にわた
っており、そのため、所定の被測定物12毎に適正な測
定値を検出するための測定値較正情報があらかじめ分析
計の記憶部20に入力されている。By the way, with this component analyzer, there are a wide variety of types of DUTs 12 for measuring components such as water, and therefore, measurement for detecting an appropriate measured value for each predetermined DUT 12 is performed. The value calibration information is previously input to the storage unit 20 of the analyzer.
また、前記測定皿11の一端側に設けられた側面には平
面状側壁部30が形成され、かつその表面には直列に例
えば8個のくぼみ部21・・が設けられている。A flat side wall portion 30 is formed on the side surface provided on one end side of the measuring dish 11, and, for example, eight recess portions 21 ... Are provided in series on the surface thereof.
そして、そのくぼみ部21・・のいずれかの2カ所には
黒シール22・・が添着され、マーカー部31が形成さ
れている。Then, the black seals 22 ... Are attached to any two of the recessed portions 21 ... And the marker portions 31 are formed.
よって、この実施例によれば28の種類、すなわち25
6通りの種類のマーカー部31が作成できることとな
る。Thus, 2 eight According to this embodiment, i.e. 25
Six types of marker parts 31 can be created.
尚、この測定皿11の底面には凸部を設け、また分析計
の底面には前記凸部と嵌まりあう略同一形状の凹部を形
成し、測定皿11は該凹部に嵌まり込み、この嵌め込み
作業だけで前記マーカー部31の検出作業ができるよう
に構成しても構わないものである。In addition, a convex portion is provided on the bottom surface of the measuring dish 11, and a concave portion having substantially the same shape as the convex portion is formed on the bottom surface of the analyzer, and the measuring dish 11 is fitted into the concave portion. The marker part 31 may be detected only by the fitting operation.
ここで、分析計側には前記測定皿11に設けられたくぼ
み部21・・に対向する位置に発光ダイオード等からな
る検出器23が設けられ、この検出器23により黒シー
ルが貼られて形成されたマーカー部31により被測定物
12の種類を検出し、測定皿11に載置された被測定物
12の各較正情報を容易に取り出せるよう構成されてい
る。Here, on the analyzer side, a detector 23 composed of a light emitting diode or the like is provided at a position facing the hollow portion 21 provided on the measuring dish 11, and a black seal is formed by the detector 23. The marker portion 31 thus formed detects the type of the object to be measured 12, and the calibration information of the object to be measured 12 placed on the measuring dish 11 can be easily taken out.
すなわち、第3図に示すように、検出器23により測定
皿11に設けられたマーカー部31を検出することによ
り、その測定皿11に載置された被測定物12の種類が
認識され、その被測定物12の較正情報(較正曲線等)
が記憶部20より取り出されるのである。That is, as shown in FIG. 3, by detecting the marker portion 31 provided on the measurement dish 11 by the detector 23, the type of the object 12 to be measured placed on the measurement dish 11 is recognized, and Calibration information of the DUT 12 (calibration curve, etc.)
Are retrieved from the storage unit 20.
そして、該記憶部20より取り出された各較正情報が演
算処理部24で参酌される。Then, the calibration information retrieved from the storage unit 20 is taken into consideration by the arithmetic processing unit 24.
ここで、該較正情報は、被測定物の成分分析によって得
られた測定値の参考とされ、最終的に適正な測定値が検
出され、被測定物の成分分析用情報が作成されることと
なるのである。Here, the calibration information is used as a reference for the measurement values obtained by the component analysis of the object to be measured, and finally an appropriate measurement value is detected, and the component analysis information of the object to be measured is created. It will be.
[考案の効果] かくしてこの考案は以上の構成よりなる。[Effect of the Invention] Thus, the present invention has the above configuration.
そしてこの考案による成分分析計における被測定物の較
正情報自動認識装置であれば、従来のように手作業で各
種多様な被測定物の較正情報を分析計の記憶部より取り
出す必要がなく、所定の被測定物を載置したマーカー部
付きの測定皿をセットするだけで、成分分析計側では被
測定物の特定ができ、更にはその被測定物の較正情報が
認識できるものとされている。The device for automatically recognizing calibration information of an object to be measured in the component analyzer according to the present invention does not need to manually retrieve various kinds of calibration information of the object to be measured from the storage unit of the analyzer as in the conventional case. It is said that the component analyzer can identify the measured object and that the calibration information of the measured object can be recognized simply by setting the measuring dish with the marker part on which the measured object is placed. .
従って、大量の被測定物において、その種類がすべて異
なる場合に、それら種類の異なる被測定物を測定する際
に、たとえ順番をバラバラにして測定したとしても、マ
ーカー部の検出で被測定物の種類を瞬時に特定すること
ができ、かつその較正情報を参酌でき、もって適正な測
定状態で正確な測定値を得られる成分分析計を提供する
ことができるものとなる。Therefore, in a large amount of DUTs, when the types are all different, when measuring DUTs of different types, even if the measurement is performed in a different order, the DUT is detected by the marker part. It is possible to provide a component analyzer capable of instantaneously specifying the type and taking into account the calibration information thereof, and thus obtaining an accurate measurement value in an appropriate measurement state.
第1図は本考案による成分分析計の概略を示す概略図、
第2図は本考案における成分分析計の概略傾斜図、第3
図は、測定皿と検出器とを示す概略斜視図、第4図は本
考案の構成を示す概略ブロック図である。 1……光源ランプ 2……集光レンズ 3……モータ 4……回転円盤 5……光学フィルタ 6……光学フィルタ 7……基準光 8……測定光 9……第1反射ミラー 10……照射レンズ 11……測定皿 12……被測定皿 13……第2集光レンズ 14……受光素子 20……記憶部 21……くぼみ部 22……黒シール 23……検出器 24……演算処理部 30……平面状側壁部 31……マーカー部FIG. 1 is a schematic diagram showing an outline of a component analyzer according to the present invention,
FIG. 2 is a schematic tilt diagram of the component analyzer according to the present invention, and FIG.
FIG. 4 is a schematic perspective view showing a measuring dish and a detector, and FIG. 4 is a schematic block diagram showing the constitution of the present invention. 1 ... Light source lamp 2 ... Condensing lens 3 ... Motor 4 ... Rotating disk 5 ... Optical filter 6 ... Optical filter 7 ... Reference light 8 ... Measuring light 9 ... First reflection mirror 10 ... Irradiation lens 11 …… Measuring dish 12 …… Measured dish 13 …… Second condensing lens 14 …… Light receiving element 20 …… Storage section 21 …… Dimple section 22 …… Black seal 23 …… Detector 24 …… Calculation Processing part 30 ... Planar side wall part 31 ... Marker part
Claims (1)
成分に吸収されない光波長よりなる基準光(7)と、被
測定物(12)の所定の成分に吸収される光波長よりな
る測定光(8)とに分離形成する光学フィルタ(5)
と、 前記光源ランプ(1)より基準光(7)、測定光(8)
を相互に照射して成分分析しうる被測定物(12)を載
置する測定皿(11)と、 を備えた成分分析計において、 側面に形成された平面状側壁部(30)に、水平方向に
等間隔を有して複数のくぼみ部(21)を設けると共
に、該複数のくぼみ部(21)上のいずれかに黒シール
(22)を添着して複数通りのマーカー部(31)を作
成可能とした測定皿(11)を複数用意し、 異なるマーカー部(31)を有する複数の測定皿(1
1)には、それぞれのマーカー部(31)に対応するよ
う種類の異なる被測定物(12)をそれぞれ載置してな
り、 一方、分析計側には前記測定皿(11)のマーカー部
(31)に対向してマーカー検出器(23)を設け、 検出器(23)で検出されたマーカー部(31)に対応
する各被測定物(12)の較正情報は記憶部(20)に
予め記憶され、 演算処理部(24)で、記憶部(20)から取り出され
た較正情報が参酌されて被測定物(12)の成分分析用
情報が作成される、 ことを特徴とする成分分析計における被測定物の較正情
報自動認識装置。1. A light source lamp (1) which emits a predetermined light, and a reference light (7) having a light wavelength which does not allow the light from the light source lamp (1) to be absorbed by a predetermined component of a DUT (12). Optical filter (5) which is formed separately from the measurement light (8) having a light wavelength absorbed by a predetermined component of the DUT (12).
And reference light (7) and measurement light (8) from the light source lamp (1)
In a component analyzer equipped with a measuring dish (11) on which an object to be measured (12) capable of irradiating each other with each other is placed, and a flat side wall (30) formed on a side surface, A plurality of recesses (21) are provided at equal intervals in the direction, and a black seal (22) is attached to any of the recesses (21) to attach a plurality of marker parts (31). A plurality of measurement dishes (11) that can be prepared are prepared, and a plurality of measurement dishes (1) having different marker parts (31) are prepared.
In (1), objects to be measured (12) of different types are placed so as to correspond to the respective marker parts (31), while the marker part (11) of the measuring dish (11) is provided on the analyzer side. 31) is provided with a marker detector (23) so that the calibration information of each DUT (12) corresponding to the marker part (31) detected by the detector (23) is stored in the storage part (20) in advance. A component analyzer which is stored, and in which the calibration information extracted from the storage unit (20) is taken into consideration in the arithmetic processing unit (24) to create component analysis information of the DUT (12). Automatic recognition device for calibration information of object to be measured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3435788U JPH0631408Y2 (en) | 1988-03-15 | 1988-03-15 | Automatic recognition device for calibration information of measured object in component analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3435788U JPH0631408Y2 (en) | 1988-03-15 | 1988-03-15 | Automatic recognition device for calibration information of measured object in component analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01137458U JPH01137458U (en) | 1989-09-20 |
JPH0631408Y2 true JPH0631408Y2 (en) | 1994-08-22 |
Family
ID=31261068
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3435788U Expired - Lifetime JPH0631408Y2 (en) | 1988-03-15 | 1988-03-15 | Automatic recognition device for calibration information of measured object in component analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0631408Y2 (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59163948U (en) * | 1983-04-20 | 1984-11-02 | 株式会社 イ−オス | Optical component analyzer |
JPH0612334B2 (en) * | 1985-10-28 | 1994-02-16 | 株式会社島津製作所 | Automated spectrophotometer |
JPS62104144U (en) * | 1985-12-19 | 1987-07-02 |
-
1988
- 1988-03-15 JP JP3435788U patent/JPH0631408Y2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH01137458U (en) | 1989-09-20 |
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