JPH06274784A - Plant monitoring diagnostic device and its abnormal sign identification method - Google Patents

Plant monitoring diagnostic device and its abnormal sign identification method

Info

Publication number
JPH06274784A
JPH06274784A JP5065134A JP6513493A JPH06274784A JP H06274784 A JPH06274784 A JP H06274784A JP 5065134 A JP5065134 A JP 5065134A JP 6513493 A JP6513493 A JP 6513493A JP H06274784 A JPH06274784 A JP H06274784A
Authority
JP
Japan
Prior art keywords
plant
measurement signal
abnormality
control device
abnormal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP5065134A
Other languages
Japanese (ja)
Inventor
Hiroshi Horiuchi
宏 堀内
Masatake Wake
正剛 和気
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asahi Chemical Industry Co Ltd
Original Assignee
Asahi Chemical Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Chemical Industry Co Ltd filed Critical Asahi Chemical Industry Co Ltd
Priority to JP5065134A priority Critical patent/JPH06274784A/en
Publication of JPH06274784A publication Critical patent/JPH06274784A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Alarm Systems (AREA)

Abstract

PURPOSE:To identify the abnormal sign of plant and its type and contents by identifying a pattern showing the abnormal sign in the change pattern of the measurement signals, set signals and control signals fluctuated in the normal fluctuation area of the measurement signal by matching. CONSTITUTION:Plural types of change pattern in time series showing the abnormal sign of a plant 30 and a plant controller 20 are set in the normal fluctuation area of the measurement signal corresponding to the normal operation range of a plant 30. The measurement signal and the set and control signals of the plant controller 20 are inputted in time series to a plant monitoring diagnosis device 10 which judges whether the change patterns shown by the measurement signal, set signal and control signal coincide with any set change patterns. Thus, the abnormal signs can be detected during the plant 30 is operated in the normal range. The type of abnormal signs can be identified from the change pattern contents.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、正常作動範囲内にある
プラントの作動状態を監視して異常徴候を検出するプラ
ント監視診断装置およびその異常徴候識別方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plant monitoring / diagnosing apparatus for monitoring an operating state of a plant within a normal operating range to detect an abnormal sign and a method for identifying an abnormal sign.

【0002】[0002]

【従来の技術】プラントの作動状態を示す物性値、例え
ば温度や圧力を計測し、その計測結果及び制御する物性
値の制御指示に基づいてプラントの操作量を自動設定す
るプラント制御装置が知られている。このようなプラン
ト制御装置では上記計測結果から異常およびその異常内
容の診断まで実行することが可能になってきた。プラン
ト制御装置において用いられている異常検出方法には各
種の提案がなされているが、以下の共通点がある。すな
わち、計測信号に対して統計処理を施してプラントの作
動状態を表す特徴パラメータを作成し、パラメータ値が
予め定めた許容範囲内にあるときには正常と判断し、パ
ラメータ値が許容範囲を超えた時には異常と判断する点
である。このような異常検出方法の中で、異常の早期発
見を目的とするものには、例えば、特開平4−3057
94号等がある。この提案には指令信号の標準偏差と、
計測信号の標準偏差との差を算出し、差が一定値を越え
た時には異常の発生と判断するようにした異常検出方法
が開示されている。
2. Description of the Related Art There is known a plant control device which measures a physical property value indicating an operating state of a plant, for example, temperature or pressure, and automatically sets a manipulated variable of the plant based on the measurement result and a control instruction of the physical property value to be controlled. ing. In such a plant control device, it has become possible to execute from the measurement result to the diagnosis of the abnormality and the details of the abnormality. Although various proposals have been made for the abnormality detection method used in the plant control device, they have the following common points. That is, statistical processing is performed on the measurement signal to create a characteristic parameter that represents the operating state of the plant, and when the parameter value is within a predetermined allowable range, it is determined to be normal, and when the parameter value exceeds the allowable range. This is a point to judge as abnormal. Among such abnormality detection methods, those for the purpose of early detection of abnormality are disclosed in, for example, JP-A-4-3057.
There is No. 94 etc. In this proposal, the standard deviation of the command signal and
An abnormality detection method is disclosed in which a difference from the standard deviation of a measurement signal is calculated, and when the difference exceeds a certain value, it is determined that an abnormality has occurred.

【0003】多くのプラントにおいて、プラントの状態
を示す測定信号をプラント制御装置に入力し、その測定
信号が予め定めた基準値を逸脱した場合、異常と判定す
るリミットチェック法が採用されている。
In many plants, a limit check method is adopted in which a measurement signal indicating the state of the plant is input to a plant control device, and when the measurement signal deviates from a predetermined reference value, it is determined to be abnormal.

【0004】プラント制御装置で異常を検出した場合、
その異常に対して適切な処置をとることが重要である。
多くのプラント、とくに化学プラントにおいては安全の
最優先を図るため、その異常を検出した装置や系などを
自動的に停止させるインタ−ロックシステムが組み込ま
れている。
When an abnormality is detected by the plant control device,
It is important to take appropriate measures against the abnormality.
In many plants, especially chemical plants, in order to give the highest priority to safety, an interlock system that automatically shuts down an apparatus or system in which an abnormality is detected is incorporated.

【0005】大規模化学プラントの場合、ひとつのプラ
ントの停止が、パイプラインで接続されている複数のプ
ラントの停止を誘発する可能性があり、極めて高い信頼
性と安全性が要求される為、インターロックシステムが
作動する異常検出以前に異常の徴候を検出し、その原因
究明と対応処置を講ずることがもとめられている。
In the case of a large-scale chemical plant, the shutdown of one plant may induce the shutdown of a plurality of plants connected by a pipeline, which requires extremely high reliability and safety. It is required to detect a symptom of abnormality before detecting the abnormality that the interlock system operates, and to investigate the cause and take corrective action.

【0006】そこで、本願出願人はプラントが正常範囲
で作動している間に正常範囲内に設けた異常徴候検出領
域にプラント状態が位置していることを測定信号により
判別し、異常徴候を検出するプラント監視診断装置を本
願の出願と同時に提案している。
Therefore, the applicant of the present application detects the abnormal sign by determining that the plant state is located in the abnormal sign detection area provided in the normal range while the plant is operating in the normal range by the measurement signal. At the same time as filing the application of the present application, a plant monitoring / diagnosing device that does this is proposed.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、異常領
域に向う測定信号の変化パターンは図2,図3,図4に
示すように各種あり、変化パターンに応じて、異常原因
も異なる。そこで、異常徴候の種類内容を識別する点に
おいて、上記提案には改善の余地があった。
However, there are various change patterns of the measurement signal toward the abnormal area, as shown in FIGS. 2, 3, and 4, and the cause of the abnormality is different depending on the change pattern. Therefore, there is room for improvement in the above proposal in terms of identifying the types of abnormal signs.

【0008】そこで、本発明の目的は、上述の点に鑑み
て、測定信号及びプラント制御装置の設定信号及び操作
信号から異常徴候の変化パターンを識別することの可能
なプラント監視診断装置およびその異常徴候識別方法を
提供することにある。
In view of the above points, an object of the present invention is to provide a plant monitoring and diagnosing device capable of identifying a change pattern of an abnormality sign from a measurement signal and a setting signal and an operation signal of the plant control device, and an abnormality thereof. It is to provide a symptom identification method.

【0009】このような目的を達成するために、請求項
1の発明は、プラントの正常作動範囲に対応した測定信
号の正常変動領域内でプラント及びプラント制御装置の
異常徴候を示す時系列的な変化パターン複数種を予め定
めておき、前記測定信号及びプラント制御装置の設定信
号及び操作信号をプラント監視診断装置に時系列で入力
し、前記測定信号、前記設定信号、前記操作信号の示す
変化パターンが前記複数種のいずれに合致するかを前記
プラント監視診断装置において判別することにより、プ
ラントの異常徴候およびその種類内容を識別することを
特徴とする。
In order to achieve such an object, the invention of claim 1 is a time-series system showing an abnormal sign of a plant and a plant control device within a normal fluctuation region of a measurement signal corresponding to a normal operating range of the plant. A plurality of types of change patterns are defined in advance, the measurement signal, the setting signal of the plant control device, and the operation signal are input in time series to the plant monitoring and diagnosis device, and the measurement signal, the setting signal, and the change pattern of the operation signal. It is characterized in that the plant monitoring and diagnosing device discriminates which one of the plurality of types matches the above, thereby identifying the abnormal sign of the plant and its type content.

【0010】請求項2の発明は、さらに、前記変化パタ
ーンに、異常発生に至るまでの緊急度を示す情報を帯同
させ、前記プラント及びプラント制御装置の異常徴候の
識別結果に該緊急度を示す情報を付加することを特徴と
する。
According to a second aspect of the present invention, the change pattern is further accompanied by information indicating the degree of urgency up to the occurrence of an abnormality, and the urgency is indicated in the identification result of the abnormality sign of the plant and the plant control device. It is characterized by adding information.

【0011】請求項3の発明は、プラントの正常作動範
囲に対応した測定信号の正常変動領域内で、該プラント
及びプラント制御装置の異常徴候を示す時系列的な変化
パターン複数種を記憶した記憶手段と、前記測定信号及
びプラント制御装置の設定信号及び操作信号を時系列的
に入力する入力手段と、当該入力した測定信号、設定信
号、操作信号の示す変化パターンに合致する変化パター
ンを前記記憶手段から抽出し、その抽出結果を、異常徴
候の種類内容として出力するパターン検出手段とを具え
たことを特徴とする。
According to a third aspect of the present invention, a plurality of types of time-series change patterns that indicate abnormal signs of the plant and the plant control device are stored in a normal fluctuation region of the measurement signal corresponding to the normal operating range of the plant. Means, input means for time-sequentially inputting the measurement signal and the setting signal and operation signal of the plant control device, and the change pattern that matches the change pattern indicated by the input measurement signal, setting signal, and operation signal And a pattern detecting means for outputting the extraction result as the type content of the abnormality sign.

【0012】[0012]

【作用】請求項1,3の発明は、測定信号の正常変動領
域内で変動する測定信号及び設定信号、操作信号の変化
パターンの中から異常徴候を示すパターンをパターンマ
ッチングにより識別する。
According to the first and third aspects of the present invention, a pattern indicating an abnormal sign is identified by pattern matching from the change patterns of the measurement signal, the setting signal, and the operation signal that fluctuate within the normal fluctuation region of the measurement signal.

【0013】請求項2の発明は、変化パターンに緊急度
情報を付加し、ユーザに緊急度を知らせ、異常の発生に
備える。
According to the second aspect of the present invention, urgency level information is added to the change pattern to notify the user of the urgency level to prepare for the occurrence of an abnormality.

【0014】[0014]

【実施例】以下、図面を参照して本発明の実施例を詳細
に説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0015】本発明の異常徴候識別方法の原理を説明す
る。
The principle of the abnormal sign identifying method of the present invention will be described.

【0016】図1は、測定信号の変化および異常徴候の
検出のために設けた領域を示す。図1において、Sは、
プラントの状態量、例えば、温度の制御目標となる制御
設定レベルを示す。XH,XLは、異常徴候検出用の第
1上限しきい値および第1下限しきい値であり、固定し
きい値である。
FIG. 1 shows the areas provided for the detection of changes in the measurement signal and abnormal signs. In FIG. 1, S is
The control setting level that is the control target of the state quantity of the plant, for example, the temperature is shown. XH and XL are a first upper limit threshold value and a first lower limit threshold value for detecting abnormal signs, which are fixed threshold values.

【0017】VH,VLは異常徴候検出用の第2上限し
きい値および第2下限しきい値であり、変動しきい値で
ある。変動しきい値は周知のように現時点から一定期間
前での測定値の平均(移動平均と呼ばれる)に一定値を
加/減算したものである。YH,YLは異常検出用の上
限しきい値および下限しきい値である。また、レベルY
H以上、レベルYH以下を異常領域と呼び、レベルYH
〜XHの間、レベルYL〜XLの間を高レベル突変領域
と呼ぶことにする。また、レベルXH〜XLの間を低レ
ベル突変領域と呼ぶことにする。
VH and VL are a second upper limit threshold value and a second lower limit threshold value for detecting abnormal signs, which are fluctuation threshold values. As is well known, the fluctuation threshold value is obtained by adding / subtracting a constant value to the average (called a moving average) of the measured values from the present time to a fixed period before. YH and YL are an upper limit threshold and a lower limit threshold for abnormality detection. Also, level Y
Areas above H and below level YH are called abnormal areas
-XH and levels YL-XL are called high-level sudden change regions. Further, the area between the levels XH and XL will be referred to as a low level sudden change area.

【0018】本実施例では、測定値が変動しきい値V
H,VL又は、XH,XLを越えたときに異常徴候が発
生したとみなし、このときの測定値の位置が、低レベル
突変領域にあるか、高レベル突変領域にあるかの位置判
別を行う。
In this embodiment, the measured value is the fluctuation threshold V.
It is considered that an abnormal sign has occurred when H, VL or XH, XL is exceeded, and the position of the measured value at this time is located in the low level sudden change region or the high level sudden change region. I do.

【0019】また、隣接する2つの測定値の大小によ
り、測定信号の変化方向判別を行って、位置の判別結果
と、変化方向判別の結果に基づき測定信号の変化パター
ンが図1〜図4のいずれに対応するかの識別を行う。
Further, the change direction of the measurement signal is discriminated based on the magnitude of two adjacent measurement values, and the change pattern of the measurement signal is shown in FIGS. 1 to 4 based on the result of the position discrimination and the result of the change direction discrimination. Identify which one corresponds.

【0020】このために以下に述べる特徴パラメータD
V.TRS,DV.ABSが算出され、これらの特徴パ
ラメータを選択的な組み合わせにより、変化パターンが
判別される。DV.TRSの算出に用いる変数およびそ
の算出式は以下の通りである。
For this purpose, the characteristic parameter D described below
V. TRS, DV. The ABS is calculated, and the change pattern is determined by selectively combining these characteristic parameters. DV. The variables used in the calculation of TRS and their formulas are as follows.

【0021】[0021]

【数1】時刻tの偏差DV(t) =時刻tの測定値PV(t) −
時刻tの制御設定値SV(t)
[Equation 1] Deviation DV (t) at time t = Measured value PV (t) at time t −
Control set value SV (t) at time t

【0022】[0022]

【数2】時刻tの変動上限しきい値VH(t) =時刻tでの
測定値の移動平均値+一定値
[Formula 2] Upper fluctuation threshold value VH (t) at time t = moving average of measured values at time t + constant value

【0023】[0023]

【数3】時刻tの変動下限しきい値VL(t) =時刻tでの
測定値の移動平均値−一定値 時刻(t)での偏差DV(t)と変動しきい値VH
(t),VL(t)との間の関係を表わす状態値DV.
TRSは、
## EQU00003 ## Lower fluctuation threshold VL (t) at time t = moving average value of measured values at time t-constant value Deviation DV (t) at time (t) and fluctuation threshold VH
(T) and VL (t), the state value DV.
TRS is

【0024】[0024]

【数4】DV.TRS(t) =もしVL(t) ≦DV(t) ≦VH(t) のと
き NOR (異常徴候無し) もしVH(t) <DV(t) のとき UP (低レベル上
昇の異常徴候) もしVL(t) >DV(t) のとき DOWN(低レベル下
降の異常徴候) の論理関係式から求まる。(数4)からも判るように特
徴パラメータDV.TRSは測定値が変動しきい値で挾まれる
範囲を越えたこと、また越えた場合はその方向を示すパ
ラメータである。DV.TRSがUP,DOWNとなっ
たときには異常徴候発生と判断する。
[Equation 4] DV.TRS (t) = If VL (t) ≤ DV (t) ≤ VH (t) NOR (no abnormal sign) If VH (t) <DV (t) UP (low level) Abnormal sign of rise) If VL (t)> DV (t), it can be obtained from the logical relational expression of DOWN (abnormal sign of low level drop). As can be seen from (Equation 4), the characteristic parameter DV.TRS is a parameter that indicates that the measured value exceeds the range between the fluctuation thresholds and, if it exceeds, the direction. DV. When TRS becomes UP or DOWN, it is determined that an abnormal sign has occurred.

【0025】特徴パラメータDV.ABSは以下の数式
から求められる。
Characteristic parameter DV. ABS is calculated from the following mathematical formula.

【0026】[0026]

【数5】DV.ABS(t) =もしXH≧DV(t) ≧XLのとき NOR
(異常徴候無し) もしXH<DV(t) のとき HIGH(高レベル上昇の異常
徴候) もしXL>DV(t) のとき LOW (低レベル下降の異常
徴候) ここで、XH,XLは異常徴候検出用第1しきい値(図
1参照)である。DV.ABS(t)がHIGHまたは
LOWになったときは測定値が図1の高レベル突変領域
に位置していることを示す。
[Equation 5] DV.ABS (t) = If XH ≥ DV (t) ≥ XL, NOR
(No abnormal sign) If XH <DV (t) HIGH (abnormal sign of high level rise) If XL> DV (t) LOW (abnormal sign of low level fall) Here, XH and XL are abnormal signs It is the first threshold value for detection (see FIG. 1). DV. When ABS (t) becomes HIGH or LOW, it indicates that the measured value is located in the high level sudden change region of FIG.

【0027】このような特徴パラメータと測定値の偏差
状態(本発明の変化パターン)の関係を図5(a)に示
す。したがって、上記特徴パラメータの示す値が図5
(a)のどのような組み合わせになるかを判別すること
により、測定値の偏差状態が正常〜高レベル突変のいず
れかの変化パターンに合致するかを検出することができ
る。
FIG. 5A shows the relationship between the characteristic parameters and the deviation state (change pattern of the present invention) between the measured values. Therefore, the values indicated by the characteristic parameters are shown in FIG.
It is possible to detect whether the deviation state of the measured values matches any change pattern from normal to high level sudden change by determining what kind of combination (a) is.

【0028】次に、上述の異常徴候の種類識別方法を用
いて異常徴候の検出,診断を行うプラント制御システム
を説明する。プラント制御システムの回路構成を図6に
示す。
Next, a plant control system for detecting and diagnosing abnormal signs by using the above-described method for identifying abnormal sign types will be described. The circuit configuration of the plant control system is shown in FIG.

【0029】図6においてプラント30はプラント制御
装置(DCS)20から操作制御信号を受け、所定の操
作量で運転される。プラント30の作動状態を示す温
度、圧力等の状態量(以下、制御量と称す)は計測器に
より測定され、その測定結果を示す測定信号がDCS2
0に出力される。DCS20は制御量が予め定められた
応答特性(固定設定値を含む)に沿って変動するよう
に、測定信号に基づき操作量を可変設定する。プラント
監視診断装置10はプラント制御装置の中の異常徴候検
出装置、異常徴候診断装置、異常検出装置として動作す
る。
In FIG. 6, the plant 30 receives an operation control signal from the plant controller (DCS) 20 and is operated with a predetermined operation amount. State quantities such as temperature and pressure (hereinafter referred to as control quantities) indicating the operating state of the plant 30 are measured by a measuring instrument, and a measurement signal indicating the measurement result is DCS2.
It is output to 0. The DCS 20 variably sets the manipulated variable based on the measurement signal so that the controlled variable fluctuates along a predetermined response characteristic (including a fixed set value). The plant monitoring / diagnosing device 10 operates as an abnormal sign detecting device, an abnormal sign diagnostic device, and an abnormal detecting device in the plant control device.

【0030】プラント監視診断装置10内では以下の構
成部が共通バスに接続されている。
In the plant monitoring / diagnosing device 10, the following components are connected to a common bus.

【0031】中央演算処理装置(CPU)11:システ
ムメモリ12に格納されたシステムプログラムに基づき
異常徴候検出処理、異常徴候診断処理、異常検出処理を
実行する。後述するがCPU11が本発明の異常徴候の
パターン識別手段として動作する。
Central processing unit (CPU) 11: executes abnormality sign detection processing, abnormality sign diagnosis processing, and abnormality detection processing based on the system program stored in the system memory 12. As will be described later, the CPU 11 operates as an abnormal sign pattern identifying means of the present invention.

【0032】システムメモリ12:CPU11が実行す
る処理手順を規定したシステムプログラムをその処理内
容毎に格納する。また、演算処理に関わるワークデータ
をも一時記憶する。本発明に関わる異常識別検出のため
のプログラムおよび図5(a)に示す測定値の変化パタ
ーンと特徴パラメータの値の組み合わせもシステムメモ
リ12に格納され、システムメモリ12が本発明の記憶
手段に相当する。
System memory 12: A system program that defines the processing procedure executed by the CPU 11 is stored for each processing content. It also temporarily stores work data related to arithmetic processing. A program for detecting an anomaly according to the present invention and a combination of the change pattern of the measured value and the value of the characteristic parameter shown in FIG. 5A are also stored in the system memory 12, and the system memory 12 corresponds to the storage means of the present invention. To do.

【0033】キーボード13:CPU11に対する動作
指示を入力する。
Keyboard 13: Inputs operation instructions to the CPU 11.

【0034】表示装置14:キーボードからの入力情報
やCPU11の演算結果をCPU11の制御の下に表示
する。
Display device 14: Displays input information from the keyboard and calculation results of the CPU 11 under the control of the CPU 11.

【0035】通信インターフェース(I/F)15:C
PU11とDCS20との間で本発明の入力手段として
信号の転送を行う。DCS20からは制御量の測定信
号、設定信号、操作信号を受信し、DCS20に対し
て、新たな、設定信号または新たな操作信号を送信す
る。
Communication interface (I / F) 15: C
Signals are transferred between the PU 11 and the DCS 20 as an input means of the present invention. A control amount measurement signal, a setting signal, and an operation signal are received from the DCS 20, and a new setting signal or a new operation signal is transmitted to the DCS 20.

【0036】外部記憶装置16:フロッピーディスク
(FD)またはハードディスク(HD)に対してプラン
ト測定結果及び異常徴候診断結果を記憶する。
External storage device 16: Stores plant measurement results and abnormality sign diagnosis results in a floppy disk (FD) or hard disk (HD).

【0037】このような回路構成において実行される異
常徴候識別関連処理を図7を用いて説明する。図7はC
PU11が実行する異常検出処理および異常徴候識別処
理の処理手順を示し、プログラム言語形態で予めシステ
ムメモリ12に格納されている。この処理手順は一定時
間毎に割り込み処理でCPU11において実行される。
The abnormality sign identification related processing executed in such a circuit configuration will be described with reference to FIG. Figure 7 is C
The processing procedure of the abnormality detection processing and the abnormality symptom identification processing executed by the PU 11 is shown, and is stored in the system memory 12 in advance in the form of a programming language. This processing procedure is executed by the CPU 11 by interrupt processing at regular intervals.

【0038】あるサンプリング時刻になると、CPU1
1はI/F 15を介して、プラント測定信号、設定信
号、操作信号を入力し、外部記憶装置16に記憶する
(S10)。次に、CPU11は数1式〜数5式を用い
た演算を行い特徴パラメータDV.TRS,DV.AB
Sの値を求める(S20)。
At a certain sampling time, the CPU 1
1 inputs the plant measurement signal, the setting signal, and the operation signal via the I / F 15 and stores them in the external storage device 16 (S10). Next, the CPU 11 performs a calculation using the equations 1 to 5 and the characteristic parameter DV. TRS, DV. AB
The value of S is obtained (S20).

【0039】次に、CPU11は2つの特徴パラメータ
の値の組み合わせに対応する偏差状態(すなわち、変化
パターン)を図5(a)のテーブルから取得する(S3
0)。識別された変化パターンに対応する異常徴候の故
障原因およびその対応処理がCPU11によりシステム
メモリ12から読出されDCS20に送られる(S4
0)。
Next, the CPU 11 obtains the deviation state (that is, the change pattern) corresponding to the combination of the values of the two characteristic parameters from the table of FIG. 5A (S3).
0). The cause of failure of the abnormal sign corresponding to the identified change pattern and the corresponding processing are read from the system memory 12 by the CPU 11 and sent to the DCS 20 (S4).
0).

【0040】以下、CPU11は一定時間毎に上記処理
手順を実行し、測定信号、設定信号、操作信号の変化状
態の識別を繰り返す。
Thereafter, the CPU 11 executes the above processing procedure at regular intervals, and repeats the identification of the change state of the measurement signal, the setting signal, and the operation signal.

【0041】本実施例の他に、次の例を実施できる。In addition to this embodiment, the following example can be implemented.

【0042】1)測定値の位置が図1の異常領域に近ず
く程、異常に対処すべき緊急度が高まる。そこで、図8
に示すように、異常徴候に段階を設け、段階に応じた異
常対処に対する緊急度をCPU11により判定し、判定
結果を表示装置14に表示してユーザに緊急度を報らせ
ることもできる。さらに、この緊急度は、測定値の偏差
だけでなく、変化パターンと組み合わせて定めてもよ
い。緊急度を示す情報は予め用意した変化パターンに帯
同し、変化パターンの識別結果と共に表示する。
1) The closer the position of the measured value is to the abnormal area in FIG. 1, the higher the urgency with which the abnormality must be dealt with. Therefore, FIG.
As shown in, it is possible to set a stage for the abnormality sign, determine the degree of urgency for dealing with the abnormality according to the stage by the CPU 11, and display the determination result on the display device 14 to inform the user of the degree of urgency. Furthermore, this urgency may be determined not only in the deviation of the measured value, but also in combination with the change pattern. The information indicating the degree of urgency is attached to the change pattern prepared in advance and is displayed together with the identification result of the change pattern.

【0043】2)本実施例ではリアルタイム的にプラン
ト制御を実行するために、四則演算で実行可能なパター
ン認識手法を用いて測定信号の変化パターンを識別して
いるが、本実施例に限らず、他の認識手法を用いること
ができる。例えば、現時点と前時点の操作信号の変化率
(または変化量)を変動しきい値と比較した結果(図5
の(b)のΔMV.TRS)を特徴パラメータDV.T
RSと同時に用い、固定しきい値と比較した結果(図5
の(b)のΔMV.ABS)を特徴パラメータDV.A
BSと同時に用いると、測定信号のみを監視している場
合と比較して、より早期に異常徴候を検出することがで
きる。
2) In the present embodiment, in order to execute the plant control in real time, the change pattern of the measurement signal is identified by using the pattern recognition method that can be executed by the four arithmetic operations, but the present invention is not limited to this embodiment. , Other recognition techniques can be used. For example, the result of comparing the change rate (or change amount) of the operation signal at the present time point and the previous time point with the change threshold value (FIG. 5).
(B) ΔMV. TRS) to the characteristic parameter DV. T
Results of comparison with a fixed threshold value used with RS (Fig. 5)
(B) ΔMV. ABS) as the characteristic parameter DV. A
When used at the same time as the BS, the abnormal sign can be detected earlier than when only the measurement signal is monitored.

【0044】3)さらに、サンプリング間隔を長くとれ
る場合には、異常徴候の変化状態を示す曲線と時系列的
な測定値の示す曲線のパターンマッチング処理を行っ
て、類似の変化パターンを検出するようにすることも可
能である。
3) Further, in the case where the sampling interval can be made long, the pattern matching processing of the curve showing the change state of the abnormal sign and the curve showing the time-series measurement value is performed to detect a similar change pattern. It is also possible to

【0045】[0045]

【発明の効果】以上説明したように、本発明によれば、
プラントが正常範囲で作動している間に異常徴候を検出
できるだけでなく、その変化パターン内容から異常徴候
の種類を識別でき、また緊急度をも知ることができるの
でユーザは、好適な準備をして異常の発生に備えること
ができる。
As described above, according to the present invention,
Not only can the abnormal signs be detected while the plant is operating in the normal range, the type of abnormal signs can be identified from the change pattern contents, and the urgency can also be known, so the user should make appropriate preparations. It is possible to prepare for the occurrence of abnormality.

【0046】例えば、測定信号と操作信号に対し同時に
本発明を適用すれば、測定信号のみに適用している場合
と比較して、より早期に異常徴候を検出することができ
る。また、測定信号と設定信号に対し同時に本発明を適
用すれば、オペレータ等の操作による当然の変動は、一
旦は異常徴候として検出しても棄却することができる。
For example, if the present invention is applied to the measurement signal and the operation signal at the same time, the abnormal sign can be detected earlier than in the case of applying the measurement signal only. Further, if the present invention is applied to the measurement signal and the setting signal at the same time, a natural fluctuation due to an operation of an operator or the like can be discarded even if it is once detected as an abnormal sign.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明実施例の異常徴候および異常徴候処理を
示す波形図である。
FIG. 1 is a waveform diagram showing an abnormal sign and an abnormal sign process according to an embodiment of the present invention.

【図2】本発明実施例の異常徴候および異常徴候処理を
示す波形図である。
FIG. 2 is a waveform diagram showing an abnormal sign and an abnormal sign process according to an embodiment of the present invention.

【図3】本発明実施例の異常徴候および異常徴候処理を
示す波形図である。
FIG. 3 is a waveform diagram showing an abnormal sign and an abnormal sign process of an embodiment of the present invention.

【図4】本発明実施例の異常徴候および異常徴候処理を
示す波形図である。
FIG. 4 is a waveform diagram showing an abnormal sign and an abnormal sign process of an embodiment of the present invention.

【図5】変化パターンのマッチングに用いるテーブル内
容を示す図である。
FIG. 5 is a diagram showing the contents of a table used for matching change patterns.

【図6】本発明実施例のシステム構成を示すブロック図
である。
FIG. 6 is a block diagram showing a system configuration of an embodiment of the present invention.

【図7】図6のCPU11が実行する処理手順を示すフ
ローチャートである。
FIG. 7 is a flowchart showing a processing procedure executed by the CPU 11 of FIG.

【図8】図5のテーブルの他の形態を示す図である。8 is a diagram showing another form of the table of FIG.

【符号の説明】[Explanation of symbols]

10 プラント監視診断装置 11 CPU 12 システムメモリ 13 キーボード 14 表示装置 15 I/F 16 外部記憶装置 20 DCS 30 プラント 10 Plant Monitoring / Diagnostic Device 11 CPU 12 System Memory 13 Keyboard 14 Display Device 15 I / F 16 External Storage Device 20 DCS 30 Plant

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 プラントの正常作動範囲に対応した測定
信号の正常変動領域内で該プラント及びプラント制御装
置の異常徴候を示す時系列的な変化パターン複数種を予
め定めておき、 前記測定信号及びプラント制御装置の設定信号及び操作
信号を時系列でプラント監視診断装置に入力し、 前記測定信号、前記設定信号、前記操作信号の示す変化
パターンが前記複数種のいずれに合致するかを前記プラ
ント監視診断装置において判別することにより、プラン
トの異常徴候およびその種類内容を識別することを特徴
とするプラント及びプラント制御装置の異常徴候識別方
法。
1. A plurality of types of time-series change patterns indicating abnormal signs of the plant and a plant control device are predetermined in a normal fluctuation region of the measurement signal corresponding to a normal operating range of the plant, and the measurement signal and The setting signal and the operation signal of the plant control device are input to the plant monitoring and diagnosing device in time series, and the plant monitoring is performed to determine which of the plurality of types the change pattern indicated by the measurement signal, the setting signal, and the operation signal matches. An abnormality symptom identification method for a plant and a plant control device, characterized by identifying an abnormality symptom of a plant and its type contents by making a determination in a diagnostic device.
【請求項2】 前記変化パターンに、異常発生に至るま
での緊急度を示す情報を帯同させ、前記プラント、及び
プラント制御装置の異常徴候の識別結果に該緊急度を示
す情報を付加することを特徴とする請求項1に記載のプ
ラント及びプラント制御装置の異常徴候識別方法。
2. The change pattern is accompanied by information indicating the degree of urgency until the occurrence of an abnormality, and information indicating the degree of urgency is added to the identification result of the abnormality symptom of the plant and the plant control device. The method for identifying abnormal signs of a plant and a plant controller according to claim 1.
【請求項3】 プラントの正常作動範囲に対応した測定
信号の正常変動領域内で、該プラント及びプラント制御
装置の異常徴候を示す時系列的な変化パターン複数種を
記憶した記憶手段と、 前記測定信号及びプラント制御装置の設定信号及び操作
信号を時系列的に入力する入力手段と、 当該入力した測定信号、設定信号、操作信号の示す変化
パターンに合致する変化パターンを前記記憶手段から抽
出し、その抽出結果を、異常徴候の種類内容として出力
するパターン識別手段とを具えたことを特徴とするプラ
ント監視診断装置。
3. Storage means for storing a plurality of types of time-series change patterns indicating abnormal signs of the plant and the plant control device within a normal fluctuation region of a measurement signal corresponding to a normal operating range of the plant; Input means for inputting signals and setting signals and operation signals of the plant control device in a time series, and change patterns matching the change patterns indicated by the input measurement signals, setting signals, and operation signals are extracted from the storage means, A plant monitoring and diagnosing device, comprising: a pattern identifying means for outputting the extraction result as the type content of the abnormality sign.
JP5065134A 1993-03-24 1993-03-24 Plant monitoring diagnostic device and its abnormal sign identification method Withdrawn JPH06274784A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5065134A JPH06274784A (en) 1993-03-24 1993-03-24 Plant monitoring diagnostic device and its abnormal sign identification method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5065134A JPH06274784A (en) 1993-03-24 1993-03-24 Plant monitoring diagnostic device and its abnormal sign identification method

Publications (1)

Publication Number Publication Date
JPH06274784A true JPH06274784A (en) 1994-09-30

Family

ID=13278110

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5065134A Withdrawn JPH06274784A (en) 1993-03-24 1993-03-24 Plant monitoring diagnostic device and its abnormal sign identification method

Country Status (1)

Country Link
JP (1) JPH06274784A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08234832A (en) * 1995-02-24 1996-09-13 Toshiba Corp Device and method for monitoring and diagnostic plant
JP2002099319A (en) * 2000-09-21 2002-04-05 Toshiba Corp Plant diagnosing device
JP2003271233A (en) * 2002-03-19 2003-09-26 Hitachi Ltd Power supply facility and management method therefor
JP4846954B2 (en) * 2000-03-09 2011-12-28 スマートシグナル・コーポレーション Complex signal decomposition and modeling
US9250625B2 (en) 2011-07-19 2016-02-02 Ge Intelligent Platforms, Inc. System of sequential kernel regression modeling for forecasting and prognostics
US9256224B2 (en) 2011-07-19 2016-02-09 GE Intelligent Platforms, Inc Method of sequential kernel regression modeling for forecasting and prognostics

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08234832A (en) * 1995-02-24 1996-09-13 Toshiba Corp Device and method for monitoring and diagnostic plant
JP4846954B2 (en) * 2000-03-09 2011-12-28 スマートシグナル・コーポレーション Complex signal decomposition and modeling
JP2002099319A (en) * 2000-09-21 2002-04-05 Toshiba Corp Plant diagnosing device
JP2003271233A (en) * 2002-03-19 2003-09-26 Hitachi Ltd Power supply facility and management method therefor
US9250625B2 (en) 2011-07-19 2016-02-02 Ge Intelligent Platforms, Inc. System of sequential kernel regression modeling for forecasting and prognostics
US9256224B2 (en) 2011-07-19 2016-02-09 GE Intelligent Platforms, Inc Method of sequential kernel regression modeling for forecasting and prognostics

Similar Documents

Publication Publication Date Title
JP4071449B2 (en) Sensor abnormality detection method and sensor abnormality detection device
EP1792241B1 (en) System and method for detecting an abnormal situation associated with a reactor
JP4046309B2 (en) Plant monitoring device
JPS59229622A (en) Diagnosing device of plant
JPH07200040A (en) Method for control of manufacturing process
US20150276557A1 (en) State monitoring system, state monitoring method and medium
US20090259331A1 (en) Automated system for checking proposed human adjustments to operational or planning parameters at a plant
JPH06274784A (en) Plant monitoring diagnostic device and its abnormal sign identification method
JP3394817B2 (en) Plant diagnostic equipment
JPH06274778A (en) Plant monitoring/diagnosing device and its fault sign detecting method
JPH06281544A (en) Plant monitor and diagnostic apparatus and abnormality indication judgment method
JP4402613B2 (en) Plant abnormality monitoring system and plant abnormality monitoring method
JPH04152220A (en) Method and device for failure sensing
CN113721557B (en) Petrochemical device operation process parameter monitoring method and device based on associated parameters
US20210157298A1 (en) Program restart assisting apparatus
JPH0217511A (en) Plant monitoring device
WO2020204043A1 (en) Blast furnace abnormality assessment device, blast furnace abnormality assessment method, and blast furnace operation method
JPS58119008A (en) Automatic deciding device for cause of accident
JPH0399234A (en) Diagnosing method for abnormality of rotary machine
JP3402728B2 (en) Monitoring method for power plant abnormalities
JPH0926819A (en) Plant abnormality diagnostic device
JPH05149762A (en) Malfunction diagnostic device
JPS61112214A (en) Output device for estimated guidance
JP2002006929A (en) Progress forecasting system
CN112783935A (en) Analysis device

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 20000530