JPH06256957A - Diamond-like carbon thin film forming device - Google Patents
Diamond-like carbon thin film forming deviceInfo
- Publication number
- JPH06256957A JPH06256957A JP5069230A JP6923093A JPH06256957A JP H06256957 A JPH06256957 A JP H06256957A JP 5069230 A JP5069230 A JP 5069230A JP 6923093 A JP6923093 A JP 6923093A JP H06256957 A JPH06256957 A JP H06256957A
- Authority
- JP
- Japan
- Prior art keywords
- diamond
- thin film
- electrode
- carbon thin
- distance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】鞭発明は、ダイヤモャド状炭素陪
膜形成装置に関するものである。特に基板に対する優れ
た密着性を維持しつつ、高い耐摩耗性、高平滑性、高絶
縁性、及び高硬度等の諸物性を有するダイヤモンド状炭
素薄膜を効率よく高速で形成することのできる装置に関
するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a diamond-like carbon thin film forming apparatus. Particularly, the present invention relates to an apparatus capable of efficiently and rapidly forming a diamond-like carbon thin film having various physical properties such as high wear resistance, high smoothness, high insulation, and high hardness while maintaining excellent adhesion to a substrate. It is a thing.
【0002】[0002]
【従来の技術】PVD分野ではスパッタ法、イオン化蒸
着法等が、CVD分野ではプラズマCVD法がその代表
的な形成方法として市販の装置を用いて検討されてい
る。特にプラズマCVD装置に関しては、容量結合型の
高周波グロー放電を利用する場合、その電極間距離は多
少の差はあれ20〜60mm程度であった。市販の高周波
プラズマCVD装置の概略を図1に示す。2. Description of the Related Art In the PVD field, a sputtering method, an ionization vapor deposition method, etc., and in the CVD field, a plasma CVD method has been studied as a typical forming method using a commercially available apparatus. Particularly in the case of the plasma CVD apparatus, when the capacitively coupled high frequency glow discharge was used, the distance between the electrodes was about 20 to 60 mm, although there was some difference. A schematic of a commercially available high frequency plasma CVD apparatus is shown in FIG.
【0003】[0003]
【発明が解決しようとする課題】よって、上記の装置で
は応用する上で要求されるダイヤモンド状炭素薄膜の物
性を得る為に必要とする自己バイアスが低圧領域の動作
圧力もしくは、高電力領域の高周波給電電力等の条件制
限により、前述の基板に対する高い密着性、あるいは高
速で形成する等の実現を阻害するものであった。Therefore, in the above-mentioned device, the self-bias required for obtaining the physical properties of the diamond-like carbon thin film required for application is the operating pressure in the low pressure region or the high frequency in the high power region. Due to the limitation of the conditions such as the power supply power, it is difficult to realize the above-mentioned high adhesion to the substrate or high-speed formation.
【0004】[0004]
【課題を解決するための手段】本発明の着眼点は、まず
ダイヤモンド状炭素薄膜の物性において、形成過程で付
与しなければならない最小の自己バイアス値を市販の装
置により動作圧力、高周波電力、電極面積比等の依存性
から究明し、容量結合を構成する電極の寸法に対する電
極間の距離の最適化を計り、両者に普遍的な相関がある
ことを見いだしたものである。In the physical properties of a diamond-like carbon thin film, the minimum self-bias value that must be imparted during the formation process is the operating pressure, high-frequency power, and electrode of a commercially available device. By investigating from the dependence of the area ratio, etc., we optimized the distance between electrodes with respect to the dimensions of the electrodes that make up the capacitive coupling, and found that there is a universal correlation between the two.
【0005】[0005]
【作用】本発明のダイヤモンド状炭素薄膜形成装置で
は、通常低圧で高い高周波電力を給電した条件範囲でし
か得られない自己バイアスが、電極間距離を狭くするこ
とにより、動作圧力及び高周波電力の単独制御もしく
は、両者の相互制御により容易に効率よく得られる。こ
の効果により、高圧領域での形成が実現でき、同一の自
己バイアスでありながら高速形成が可能となった。ま
た、低電力領域での形成においても、同一の自己バイア
スが得られる為、下地基板へのダメージの低減及び被膜
自体の残留内部応力の低減等被膜の高品質化を促進する
作用がある。In the diamond-like carbon thin film forming apparatus of the present invention, the self-bias, which is usually obtained only in the condition range in which a high frequency power is supplied at a low pressure, reduces operating distance and high frequency power by reducing the distance between the electrodes. It can be easily and efficiently obtained by control or mutual control of both. Due to this effect, formation in a high pressure region can be realized, and high-speed formation can be performed with the same self-bias. Further, even in the formation in the low power region, the same self-bias can be obtained, so that it has an effect of promoting damage to the underlying substrate and reduction of residual internal stress of the film itself to promote high quality of the film.
【0006】[0006]
【実施例】本発明の実施例を図2に基づいて説明する。
容量結合型で平行平板構成の高周波プラズマCVD装置
を使用して、真空容器1内に原料供給系6よりエチレン
ガス及び水素ガスを所定の混合比並びに流量導入し、並
行に配置された高周波給電電極2と対向接地電極3との
間に高周波電源系7より13.56MHzの高周波を印
加し、プラズマ領域10を生成し、下記の反応条件によ
って基板4である厚さ0.5mm、直径6インチのSiウ
ェハー上にダイヤモンド上炭素薄膜を形成した。電極の
寸法は角型で相方共に180×180mmであった。この
時、反応時間を2min としたがSiウェハー上には約
3.4μmのダイヤモンド状炭素薄膜が形成された。こ
のダイヤモンド状炭素薄膜には、ハクリは全く認められ
ず全面に均一に形成されており、ビッカース硬度を測定
したところ非常に明瞭な圧痕が生じ、算式により390
0kg/mm2 の硬度を有するものであった。また、水素ガ
スを200SCCM導入し、高周波電力を2W/cm2 の電力
密度で印加したときの自己バイアス特性を図3に示す。EXAMPLE An example of the present invention will be described with reference to FIG.
Using a capacitively coupled parallel plate high frequency plasma CVD apparatus, ethylene gas and hydrogen gas were introduced into the vacuum container 1 from the raw material supply system 6 at a predetermined mixing ratio and flow rate, and the high frequency power supply electrodes were arranged in parallel. A high frequency power of 13.56 MHz is applied between the high frequency power supply system 7 and the counter ground electrode 3 to generate a plasma region 10, and the substrate 4 having a thickness of 0.5 mm and a diameter of 6 inches is produced according to the following reaction conditions. A carbon thin film on diamond was formed on a Si wafer. The dimensions of the electrodes were square and both sides were 180 × 180 mm. At this time, although the reaction time was set to 2 min, a diamond-like carbon thin film of about 3.4 μm was formed on the Si wafer. In this diamond-like carbon thin film, no peeling was observed and the film was uniformly formed on the entire surface. When the Vickers hardness was measured, a very clear indentation was generated, which was calculated from the formula 390.
It had a hardness of 0 kg / mm 2 . Further, FIG. 3 shows the self-bias characteristics when hydrogen gas was introduced at 200 SCCM and high frequency power was applied at a power density of 2 W / cm 2 .
【0007】〔反応条件〕 反応ガス :エチレン 純度99.99% 200
SCCM 水素 純度99.999% 50SCCM 高周波電力 :2.2W/cm2 動作圧力 :75Pa 電極間距離 :8.5mm 基板温度 :非加熱 反応時間 :2min 自己バイアス:−380V 形成速度 :1.7μm/min 本実施例においては、炭素源気体としてエチレンガスを
用いたが、他の炭化水素化合物であっても同様の効果が
気体できることは言うまでもない。[Reaction conditions] Reaction gas: ethylene Purity 99.99% 200
SCCM hydrogen purity 99.999% 50 SCCM RF power: 2.2 W / cm 2 operating pressure: 75 Pa distance between electrodes: 8.5 mm Substrate temperature: unheated Reaction time: 2min self-bias: -380V formation rate: 1.7 [mu] m / min In the present embodiment, ethylene gas was used as the carbon source gas, but it goes without saying that the same effect can be obtained with other hydrocarbon compounds.
【0008】[0008]
【比較例1】実施例の反応条件において、電極間距離の
みを30mmにしたところ自己バイアスが−230Vに低
下し、得られたダイヤモンド状炭素薄膜は約0.6μm
の膜厚を有していたが、ビッカース硬度は2100kg/
mm2 であった。形成速度、硬度等ともに満足の得られる
値ではなかった。[Comparative Example 1] Under the reaction conditions of Example, when the distance between the electrodes was set to 30 mm, the self-bias decreased to -230 V, and the obtained diamond-like carbon thin film had a thickness of about 0.6 μm.
Had a Vickers hardness of 2100 kg /
It was mm 2 . The formation rate and hardness were not satisfactory values.
【0009】[0009]
【比較例2】実施例の反応条件において、動作圧力のみ
を20Paにしたところ自己バイアスが−520Vとな
り、イオンシース内での電界強度が高くなりデポジショ
ンモードよりエッチングモードが支配的となり、さらに
ダメージを誘発し被膜のハクリが顕著に見られ、被膜自
体の残留内部応力の増加により膜厚及び、ビッカース硬
度等の評価ができず、成膜条件許容範囲から逸脱してい
ることが判明した。[Comparative Example 2] Under the reaction conditions of Example, when the operating pressure was set to 20 Pa, the self-bias became −520 V, the electric field strength in the ion sheath was increased, the etching mode became dominant over the deposition mode, and further damage was caused. It was found that the film thickness and the Vickers hardness could not be evaluated due to the increase of the residual internal stress of the film itself, and that the film thickness deviated from the allowable range of film forming conditions.
【0010】[0010]
【発明の効果】本発明は、高周波プラズマCVD装置に
おいて容量結合を具現化する電極間距離を9mm以下とし
たことによりダイヤモンド状炭素薄膜の形成過程で重要
となる因子である所望の自己バイアスが、グロー放電の
動作圧力が高圧領域あるいは、高周波給電電力が低電力
領域においても効率よく容易に得られるという効果を有
するものであり、高速で高品質のダイヤモンド状炭素薄
膜を簡便に得ることができた。According to the present invention, the desired self-bias, which is an important factor in the process of forming a diamond-like carbon thin film, can be achieved by setting the distance between the electrodes for realizing capacitive coupling in the high frequency plasma CVD apparatus to 9 mm or less. It has an effect that the operating pressure of the glow discharge can be efficiently and easily obtained even in the high pressure region or the high frequency feeding power in the low power region, and the high speed and high quality diamond-like carbon thin film can be easily obtained. .
【図1】従来より用いられている高周波プラズマCVD
装置の内部構造を示す断面図FIG. 1 Conventionally used high-frequency plasma CVD
Sectional view showing the internal structure of the device
【図2】本発明の実施例で用いたダイヤモンド状炭素薄
膜を形成する為の高周波プラズマCVD装置の内部構造
を示す断面図FIG. 2 is a sectional view showing the internal structure of a high-frequency plasma CVD apparatus for forming a diamond-like carbon thin film used in the examples of the present invention.
【図3】自己バイアスの電極間距離及び動作圧力依存性
を示すグラフである。FIG. 3 is a graph showing the inter-electrode distance and operating pressure dependence of self-bias.
1 真空容器 2 高周波給電電極 3 対向接地電極 4 基板 5 圧力計測系 6 原料供給系 7 高周波電源系 8 排気系 9 電極間距離 10 プラズマ領域 11 ブロッキングコンデンサー 12 自己バイアスモニター端子 1 Vacuum container 2 High frequency power supply electrode 3 Opposite ground electrode 4 Substrate 5 Pressure measurement system 6 Raw material supply system 7 High frequency power supply system 8 Exhaust system 9 Electrode distance 10 Plasma area 11 Blocking capacitor 12 Self-bias monitor terminal
Claims (4)
おいて、基板を配置した高周波給電電極と平行かつ並行
に対向する接地電極との電極間距離を9mm以下の容量結
合とし、グロー放電の動作圧力を50Paから100Paの
範囲内の任意の値に数値限定したことを特徴とするダイ
ヤモンド状炭素薄膜形成装置。1. In a parallel plate type high frequency plasma CVD apparatus, the electrode distance between a high frequency power supply electrode on which a substrate is arranged and a ground electrode facing in parallel and in parallel is set to 9 mm or less, and an operating pressure of glow discharge is 50 Pa. To 100 Pa, the diamond-like carbon thin film forming apparatus is numerically limited to an arbitrary value.
向する電極との距離の間には、角型電極では対角寸法の
1/30の電極間距離又は円型電極では直径寸法の1/
20の電極間距離に数値限定したことを特徴とするダイ
ヤモンド状炭素薄膜形成装置。2. The distance between the high-frequency power supply electrode and the facing electrode according to claim 1, wherein the distance between electrodes is 1/30 of a diagonal dimension in a square electrode or 1 / diameter in a circular electrode.
An apparatus for forming a diamond-like carbon thin film, wherein the distance between electrodes is numerically limited.
高周波給電電力は、単位面積あたりの電力密度として2
W/cm2 から3W/cm2 の範囲内の任意の値に数値限定
したことを特徴とするダイヤモンド状炭素薄膜形成装
置。3. The high-frequency power supplied to the film formation according to claim 1, wherein the power density per unit area is 2
Diamond-like carbon film forming apparatus characterized by numerically limited to any value within the range of W / cm 2 of 3W / cm 2.
体としてエチレンガスを用い、膜中に取り込まれる水素
原子の脱水素化を目的に添加する水素ガスの添加量を炭
素源気体に対し、25モル%以下に数値限定したことを
特徴とするダイヤモンド状炭素薄膜形成装置。4. The method according to claim 1, wherein ethylene gas is used as a carbon source gas for forming a film, and the addition amount of hydrogen gas added for the purpose of dehydrogenating hydrogen atoms taken into the film is relative to the carbon source gas. An apparatus for forming a diamond-like carbon thin film, which is numerically limited to 25 mol% or less.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP06923093A JP3471841B2 (en) | 1993-03-04 | 1993-03-04 | Diamond-like carbon film forming equipment |
JP2000058562A JP3472224B2 (en) | 1993-03-04 | 2000-03-03 | Method for forming diamond-like carbon film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP06923093A JP3471841B2 (en) | 1993-03-04 | 1993-03-04 | Diamond-like carbon film forming equipment |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000058562A Division JP3472224B2 (en) | 1993-03-04 | 2000-03-03 | Method for forming diamond-like carbon film |
JP2000058561A Division JP2000256851A (en) | 2000-01-01 | 2000-03-03 | Diamondlike carbon film |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06256957A true JPH06256957A (en) | 1994-09-13 |
JP3471841B2 JP3471841B2 (en) | 2003-12-02 |
Family
ID=13396726
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP06923093A Expired - Fee Related JP3471841B2 (en) | 1993-03-04 | 1993-03-04 | Diamond-like carbon film forming equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3471841B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004072322A1 (en) * | 2003-02-12 | 2004-08-26 | Toyoda Koki Kabushiki Kaisha | Amorphous carbon film forming method and device |
WO2023074377A1 (en) * | 2021-10-26 | 2023-05-04 | 東京エレクトロン株式会社 | Device and method for forming carbon-containing film on substrate |
-
1993
- 1993-03-04 JP JP06923093A patent/JP3471841B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004072322A1 (en) * | 2003-02-12 | 2004-08-26 | Toyoda Koki Kabushiki Kaisha | Amorphous carbon film forming method and device |
EP1598442A1 (en) * | 2003-02-12 | 2005-11-23 | Toyoda Koki Kabushiki Kaisha | Amorphous carbon film forming method and device |
US7803433B2 (en) | 2003-02-12 | 2010-09-28 | Jtekt Corporation | Amorphous carbon film forming method and device |
EP1598442A4 (en) * | 2003-02-12 | 2012-12-19 | Jtekt Corp | Amorphous carbon film forming method and device |
EP2703521A1 (en) | 2003-02-12 | 2014-03-05 | Jtekt Corporation | Forming method and apparatus for amorphous carbon films |
WO2023074377A1 (en) * | 2021-10-26 | 2023-05-04 | 東京エレクトロン株式会社 | Device and method for forming carbon-containing film on substrate |
Also Published As
Publication number | Publication date |
---|---|
JP3471841B2 (en) | 2003-12-02 |
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