JPH0621159A - Tab tape - Google Patents

Tab tape

Info

Publication number
JPH0621159A
JPH0621159A JP17537192A JP17537192A JPH0621159A JP H0621159 A JPH0621159 A JP H0621159A JP 17537192 A JP17537192 A JP 17537192A JP 17537192 A JP17537192 A JP 17537192A JP H0621159 A JPH0621159 A JP H0621159A
Authority
JP
Japan
Prior art keywords
burn
tab tape
tab
test
tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17537192A
Other languages
Japanese (ja)
Inventor
Hisanao Toda
寿直 遠田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP17537192A priority Critical patent/JPH0621159A/en
Publication of JPH0621159A publication Critical patent/JPH0621159A/en
Pending legal-status Critical Current

Links

Landscapes

  • Wire Bonding (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To achieve burn-in test of a TAb packaging product by loading the entire TAB tape into a burn-in device. CONSTITUTION:A TAB tape 1 is loaded into the chamber of a burn-in device by winding it spirally, a signal pin 3 protrudes from the TAB tape, and then a signal pin socket 4 is mounted to it for achieving a burn-in test, thus executing the burn-in test even in a TAB packaging product and assuring a wide range of quality. Also, by winding the TAB tape 1 spirally, a number of TAB packaging products can be loaded into the burn-in chamber, thus reducing the running cost required for the burn-in test.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、IC実装技術のTAB
テープに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to IC mounting technology TAB.
It's about tape.

【0002】[0002]

【従来の技術】従来のTABテープでは、ICへの信号
の取り込みが困難なためバーイン試験が行なわれず、広
範囲な品質保証が出来ない。
2. Description of the Related Art In a conventional TAB tape, since it is difficult to take a signal into an IC, a burn-in test is not performed, and a wide range of quality cannot be guaranteed.

【0003】[0003]

【発明が解決しようとする課題】そこで、本発明はTA
Bテープを渦巻に巻く事により、TABテープをバーイ
ン装置のチャンバーに入るようにし、TABテープより
信号ピンを突出させ、そこに信号ピンソケットを取り付
ける事ににより、バーイン試験を可能としたTABテー
プを提供する事を目的とする。
Therefore, according to the present invention, the TA
By winding the B tape in a spiral, the TAB tape enters the chamber of the burn-in device, the signal pin is projected from the TAB tape, and the signal pin socket is attached to the TAB tape to enable the burn-in test. The purpose is to provide.

【0004】[0004]

【課題を解決するための手段】上記課題を解決するた
め、本発明はTABテープを渦巻に巻く事により、バー
イン装置のチャンバーに入るようにし、TABテープよ
り信号ピンを突出させ、そこに信号ピンソケットを取り
付ける事を特徴とする。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention allows a TAB tape to be wound into a chamber of a burn-in device so that the signal pin protrudes from the TAB tape. It is characterized by attaching a socket.

【0005】[0005]

【作用】本発明は上記の手段により、TAB実装品にお
いてもバーイン試験を可能としたTABテープを提供す
る事が出来る。
By the above means, the present invention can provide a TAB tape which enables a burn-in test even in a TAB mounted product.

【0006】[0006]

【実施例】以下に本発明の実施例を図面にもとづいて説
明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0007】図1は、本発明においてバーイン装置のチ
ャンバーに入るようにTABテープを渦巻に巻いた図、
図2は、本発明においてTABテープより信号ピンを突
出させ、そこに信号ピンソケットを取り付けた図であ
る。
FIG. 1 is a view in which a TAB tape is spirally wound so as to enter a chamber of a burn-in apparatus according to the present invention.
FIG. 2 is a view in which the signal pin is projected from the TAB tape and the signal pin socket is attached thereto in the present invention.

【0008】図1において、バーイン・チャンバーに多
数のTAB実装品を入れる事を可能にするため、TAB
テープ1を渦巻状に巻く。
In FIG. 1, in order to allow a large number of TAB mounted products to be put in the burn-in chamber,
Wrap tape 1 in a spiral.

【0009】また、これによりTABテープ1全体の大
きさが縮小され、バーイン・チャンバーに複数個のTA
Bテープ1を入れる事が可能となる。
As a result, the size of the TAB tape 1 as a whole is reduced, and a plurality of TAs are placed in the burn-in chamber.
It is possible to insert B tape 1.

【0010】よって、バーイン・チャンバーに多数のT
AB実装品を入れる事ができ、バーイン試験にかかるラ
ンニング・コストの低減になる。
Therefore, a large number of T's are provided in the burn-in chamber.
The AB mounting product can be inserted, and the running cost for the burn-in test can be reduced.

【0011】図2において、バーイン試験に必要な信号
をTAB実装のICパッケージ2に与えるため、TAB
テープ1に実装された各ICパッケージ2より信号ピン
3を突出させる。
In FIG. 2, in order to apply a signal necessary for the burn-in test to the TAB-mounted IC package 2,
The signal pin 3 is projected from each IC package 2 mounted on the tape 1.

【0012】その信号ピン3に信号ピンソケット4を取
り付けてバーイン装置からの信号をICパッケージ2に
伝達し、バーイン試験を行う。
A signal pin socket 4 is attached to the signal pin 3 to transmit a signal from the burn-in device to the IC package 2 to perform a burn-in test.

【0013】この方法により、多数のTAB実装品をバ
ーイン試験し、現状では無かった広範囲な品質を保証す
る事が可能である。
By this method, it is possible to perform a burn-in test on a large number of TAB-mounted products and guarantee a wide range of quality which has not been available at present.

【0014】[0014]

【発明の効果】以上述べたように本発明によれば、TA
B実装品においてもバーイン試験を可能としたTABテ
ープを提供する事が出来る。
As described above, according to the present invention, TA
It is possible to provide a TAB tape that enables a burn-in test even for a B-mounted product.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明においてバーイン装置のチャンバーに入
るようにTABテープを渦巻に巻いた図である。
FIG. 1 is a view in which a TAB tape is wound so as to enter a chamber of a burn-in device in the present invention.

【図2】本発明においてTABテープより信号ピンを突
出させ、そこに信号ピンソケットを取り付けた図であ
る。
FIG. 2 is a view in which a signal pin is projected from a TAB tape and a signal pin socket is attached thereto in the present invention.

【符号の説明】[Explanation of symbols]

1・・・TABテープ 2・・・ICパッケージ 3・・・信号ピン 4・・・信号ピンソケット 5・・・ケーブル 1 ... TAB tape 2 ... IC package 3 ... Signal pin 4 ... Signal pin socket 5 ... Cable

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 TABテープを渦巻に巻く事により、T
ABテープをバーイン装置のチャンバーに入るように
し、TABテープより信号ピンを突出させ、そこに信号
ピンソケットを取り付ける事によりバーイン試験を可能
としたことを特徴とするTABテープ。
1. By winding a TAB tape in a spiral, T
A TAB tape that allows a burn-in test by allowing the AB tape to enter the chamber of the burn-in device, projecting the signal pin from the TAB tape, and attaching the signal pin socket thereto.
JP17537192A 1992-07-02 1992-07-02 Tab tape Pending JPH0621159A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17537192A JPH0621159A (en) 1992-07-02 1992-07-02 Tab tape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17537192A JPH0621159A (en) 1992-07-02 1992-07-02 Tab tape

Publications (1)

Publication Number Publication Date
JPH0621159A true JPH0621159A (en) 1994-01-28

Family

ID=15994931

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17537192A Pending JPH0621159A (en) 1992-07-02 1992-07-02 Tab tape

Country Status (1)

Country Link
JP (1) JPH0621159A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6265525B1 (en) 1997-11-28 2001-07-24 Hitachi, Ltd. Method and device for manufacturing polycarbonate
US6399739B1 (en) 2001-08-22 2002-06-04 General Electric Company Preparation of polycarbonate having a predetermined molecular weight and level of endcapping
US6753403B2 (en) 1997-11-28 2004-06-22 Hitachi, Ltd. Process and apparatus for producing polycarbonate

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6265525B1 (en) 1997-11-28 2001-07-24 Hitachi, Ltd. Method and device for manufacturing polycarbonate
US6329495B2 (en) 1997-11-28 2001-12-11 Hitachi, Ltd. Process and apparatus for producing polycarbonate
US6753403B2 (en) 1997-11-28 2004-06-22 Hitachi, Ltd. Process and apparatus for producing polycarbonate
US6399739B1 (en) 2001-08-22 2002-06-04 General Electric Company Preparation of polycarbonate having a predetermined molecular weight and level of endcapping

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