JPH06203480A - Magneto-optical disk controller - Google Patents

Abstract

PURPOSE:To perform the logical address/physical address conversion at high speed for alternative processing in a magneto-optical controller. CONSTITUTION:The magneto-optical disk controller 4 is provide with a means 20 converting a defective list from a physical address to a logical address, the means 21 converting the defective list from the logical address to the physical address and the means 15 storing the defective list shown by the converted logical address. By such a constitution, the method performing binary reserch by using the target logical address by converting and holding the defective list in the physical address to the logical address and obtaining the physical address at high speed without successively comparing by adding the position of the obtained defective list is provided.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magneto-optical disk controller, and more particularly to a magneto-optical disk controller for performing high speed alternative processing.

[0002]

2. Description of the Related Art A magneto-optical disk is a disk-shaped storage medium having a spiral storage area. The spiral storage area is located in tracks and sectors. A sector is the minimum unit for writing and reading data on a magneto-optical disk, and a track is composed of multiple sectors.
One unit of the magneto-optical disk is used as a unit.

Further, each sector stores ID information and data information, and the ID information stores a track number and a sector number indicating its own physical address. The data information can store the management information of the magneto-optical disk and the data information of the user.

The magneto-optical disk controller selects the above-mentioned track and sector and controls the magneto-optical disk apparatus to read / write data from / to a specific sector. In selecting a track, the optical head for reading and writing is moved, that is, seek, and positioning is performed on a target track. Further, in the sector selection, the ID information of a plurality of sectors on a specific track is sequentially read according to the rotation of the magneto-optical disk, and the ID information of the target sector is compared and detected. As a result, the target sector is specified, and the data information of the specified sector is read or written.

Actually, as a portable medium, for example, ISO
A 90 mm magneto-optical disk is standardized in DIS10090. Hereinafter, description will be given using this standard format.

The magneto-optical disk has one surface, the number of tracks per surface is 10,000, the number of sectors per track is 25, and the number of bytes per sector is 512.
It is determined to be a part-time job.

In this example, the total storage capacity is 1 side * 1000
0 tracks * 25 sectors * 512 bytes, but in practical use, all of the storage area of the magneto-optical disk device
It cannot store data. This is because there may be a defect in which data cannot be stored on the surface of the magneto-optical disk. In this case, the defective sector must be replaced with a normal sector. Further, the user data cannot be stored in the defect list area indicating which defective sector is replaced by which normal sector.

Referring to FIG. 9, the defect list is stored in the defect management areas DMA1, DMA2, DMA3 and DMA4 on the disk, and the same contents are stored in all four. In the defect management area (DMA1 to DMA4), the definition sector DDS of the magneto-optical disk and the initial defect list PDL.
The sub-defect list SDL is stored.

As an alternative processing method, the initial defect list PD
Two methods, a method using L and a method using the sub-defect list SDL, are standardized. Here, a slipping method using the initial defect list PDL will be described as an example. The slipping method is a method in which the defective sector is skipped, the data to be stored in the defective sector is stored in the next normal sector, and then the data is stored in order. Less than,
Unless otherwise specified, the defect list indicates this initial defect list PDL.

Referring to FIG. 10 showing the contents of the defect list, the 0th byte and the 1st byte of this defect list are identification data of the initial defect list PDL. The second and third bytes indicate the number of defects in the defect list. The fourth and subsequent bytes indicate the defective address. One defective address is 3
It is composed of 4 bytes of a track number of 1 byte and a sector number of 1 byte.

For example, as in the example of FIG. 4, it is assumed that the 0th, 2nd, 4th, 5th and 8th sectors of the 100th track are defective. In this case, the defect list is as shown in FIG. In FIG. 5, [n, m] indicates the nth sector and the mth sector of the track.
The same applies to the following description.

Next, an alternative process of the conventional magneto-optical disk control device of this type will be described.

Referring to FIG. 6 which is a block diagram of a conventional magneto-optical disk controller, a magneto-optical disk system includes a magneto-optical disk device 2 controlled by the magneto-optical disk controller 1 and a magneto-optical disk device 2 as an auxiliary storage device. The host system 3 owned by A magneto-optical disk (not shown) is inserted into or ejected from the magneto-optical disk device 2 as a storage medium.

The magneto-optical disk controller 1 includes a conversion means 10 for inputting a logical block from the host system 3 and converting it into a logical address, and a conversion means 11 for inputting a logical address and a defect list and converting it into a physical address. , Write means 12 for writing data to the sector of the magneto-optical disk indicated by the physical address, read means 13 for reading data from the sector of the magneto-optical disk device 2 indicated by the physical address, write means 12 and read means 13.
Defect list creating means 14 for creating a defect list from the physical addresses of the defective sectors obtained in step 5, and storage means 15 for storing the defect list created by the defect list creating means 14 and the defect list read by the reading means 13 from the magneto-optical disk. Consists of. In addition to the above, the magneto-optical disk control device requires an error correction means, etc., but since it does not hinder the description of the present invention, it is omitted.

FIG. 7 and FIG. 8 show a flow of an alternative process of the conventional magneto-optical disk controller 1.

When the magneto-optical disk whose defect list is shown in FIG. 5A is inserted into the magneto-optical disk device 2, the magneto-optical disk control device processes the flow of FIG. 7A.
The read means 13 reads the defect list from the magneto-optical disk (step A11), and stores the defect list in the storage means 15 (step A12). The stored defect list has the same structure as the defect list of the magneto-optical disk, that is, as shown in FIG.

In the magneto-optical disk used for the first time, a defect list is created at the same time as formatting,
The defect list is stored in the magneto-optical disk. Referring to FIG. 7B showing this flow, when the magneto-optical disk is initialized by the write means 12 (step B11) and the ID information cannot be detected due to a defective sector, the defect list creation means 14 causes a defect. A list is created (steps B12 and B13). Then, by the lead means 13,
Verify, that is, it is confirmed whether the data is correctly written on the magneto-optical disk (step B14), and if there is a defect, the defect list creating means 14 creates a defect list (steps B15, B16). The created defect list is stored in the storage means 15 (step B17). Finally, the defect list is stored in the magneto-optical disk by the write means 12 (step B18).

Next, the data reading operation of the magneto-optical disk controller 1 including the defective sector will be described by taking the case of reading from the 1st sector to the 2nd sector of the 100th track of the logical address as an example. . the first,
The host system 3 reads a magneto-optical disk by using accessible logical blocks starting from 0 as a continuous storage area in order to make tracks and sectors accessible without being aware of alternative processing. Here, for simplicity, the number of bytes in one block is 512 bytes. In the example shown in FIG. 9, the sector next to the second defect management area, that is, the logical address [3, 0] is the 0th logical block.

Referring to the flow of FIG. 7C, the logical block number input from the host system 3 is converted into a logical address by the conversion means 10 (step C1).
1, C12). When the block 2426 and the logical block 2427 are input from the host system, the block number, that is, 2426 is divided by the number of sectors per track, 25, and the quotient 97 is added to 3 of the start track to obtain 10
Track 0, start sector 0, add 1 to remainder, then 1
Turn sector is required. Similarly, the 2427th logical block is also converted into the logical address [100, 2].

Next, the conversion means 11 converts the logical address into a physical address (step C13). The read means 13 reads the data from the magneto-optical disk with the obtained physical address (step C14).

First, the physical address for starting the read is obtained by referring to the eighth (a) showing the flow of the means for converting the logical address into the physical address. The logical address [100, 1] is temporarily assigned to the temporary address (step D11).

Subsequently, 1 of the defect list shown in FIG.
Th defective address [100,0] and temporary address [10
0, 1] are compared (step D12). In this case, since the temporary address is larger, one address is added to the temporary address (steps D13 and D14). Then, the defect address [100, 2] and the temporary address [10] of the second defect list are added.
0, 2], the values match, so one address is added to the temporary address (steps D12, D13, D1).
4). Then, the defect address [1
00, 4] is compared with the temporary address [100, 3], the temporary address is smaller, so the logical address / physical address conversion is terminated with the temporary address as the physical address (steps D12, D13, D15). In this way, the physical address [100, 3] at which reading is started is obtained.

Next, a physical address for ending the read is obtained. It can be calculated in the same way as the physical address to start reading, but it will be calculated using the end state.
The logical address [100, 2] at which the reading is ended is subtracted from the logical address [[100, 1] at which the reading is started, and this value is added to the logical address [100, 3] at which the reading is started. Find [100,4].
When the defective address [100, 4] of the third defect list and the temporary address [100, 4] are compared, the values match, so 1 address is added to the temporary address. Then, the defect address [100, 5] and the temporary address [1 in the fourth defect list are added.
[00,5], the values match, so one address is added to the temporary address. Then, the defect address [100,8] and the temporary address [100,6] of the fifth defect list
Comparing with the above, since the temporary address is smaller, the logical address / physical address conversion is ended by using the temporary address as the physical address. In this way, the physical address [100, 6] at which the read is completed is obtained.

As described above, the conventional magneto-optical disk controller performs logical address / physical address conversion. However, in the actual read operation, the physical address [100,
3] to the physical address [100, 6], there is a defective sector, so continuous reading cannot be performed, and the read operation of the physical sector [100, 3] and the physical sector [1
00, 6] read operation.

The above-mentioned conventional magneto-optical disk controller 1
Is a method of successive approximation in which the physical addresses are obtained by comparing the defective addresses in the defect list one by one, the time required for the logical address / physical address conversion is long, and the response speed of the magneto-optical disk device 2 is delayed. There are drawbacks.

In order to remedy this drawback, various measures have heretofore been made. Here, as another conventional example, a method using binary search will be described with reference to the flow shown in FIG. The flow shown in FIG. 7 is
The description is omitted because it is the same.

First, the logical address [100, 1] is searched from the defect list by using the binary search (step D21). In this case, since there is no matching defective address, the next defective address, that is, the second defective address [100, 2] is indicated, and the binary search ends.
The value obtained by subtracting 1 from the position of the defect list where the binary search is completed, that is, 1 is the physical address [100,
It is the value of the defective sector existing up to 1]. The obtained 1 is added to the logical address, and the temporary address [100, 2]
(Step D22).

The subsequent steps are similar to those shown in FIG. 8 (a).
When the second defective address and the tentative address are compared, the values match, so one address is added to the tentative address. Then 3
Comparing the defective address [100, 4] of the second defect list with the temporary address [100, 3], the temporary address is smaller, so the logical address / physical address conversion is terminated using the temporary address as the physical address (step D12 ，
D13, D14, D15). With this, the physical address [100, 3] at which reading is started is obtained.

Next, the physical address for ending the read is obtained. Similarly, when the read range is large, it is faster to use the physical address by using the binary search. However, when the read range is small, the number of comparison targets is small, and thus the above-described sequential comparison process is fast.

[0030]

In the processing by the successive approximation described above, when ISO DIS10090 is taken as an example, a maximum of 2048 defective addresses are compared. In addition, in the method using the binary search, the larger the number of defect lists, the more advantageous it becomes in comparison with the successive comparison.
Widely known.

However, even in the case where the binary search is used, it is necessary to perform the successive approximation after the binary search. In the worst case, the binary search requires a maximum of 12 times, and the sequential comparison requires a maximum of 2047 defective address comparisons. For example, when 2047 sectors are continuously registered in the defect list from the defect address [100,0] and the defect address [100,2], the logical address [100,1] may be converted to the physical address. .

As described above, in the conventional magneto-optical disk control device, in the replacement processing of the defective sector, the sequential comparison is performed for the conversion from the logical address to the physical address, and the response speed of the magneto-optical disk device is slow. Has the drawback.

[0033]

A magneto-optical disk controller according to the present invention creates a defect list 1 indicated by a logical address from physical address information of a defective sector obtained by writing and verifying on a magneto-optical disk. And a second means for reading the defect list 2 indicated by the physical address recorded on the magneto-optical disk and then creating the defect list 1 indicated by the logical address from the defect list 2. The defect list 1 is retained.

Further, the defect list 1 may be held by the third means for converting the defect list 1 indicated by a logical address into the defect list 2 indicated by a physical address.

Further, it is possible to adopt a structure having means for searching the defect list 1 created by the first means and the second means and converting a logical address to be accessed into a physical address.

[0036]

1 is a block diagram of a magneto-optical disk controller according to a first embodiment of the present invention.
The magneto-optical disk controller 4 according to the present invention is a conversion means 2 for converting a defect list from a physical address to a logical address.
The configuration is the same as that of the conventional magneto-optical disk control device except 0, a conversion unit 21 for converting a defect list from a logical address to a physical address, and a conversion unit 22 for inputting a logical address and a defect list to convert it to a physical address. . The same components are designated by the same reference numerals.

Referring also to FIGS. 2 and 3 showing the flow of the alternative processing of the magneto-optical disk controller 4,
When the magneto-optical disk is inserted into the magneto-optical disk apparatus 2, the magneto-optical disk controller 4 reads the defect list from the magneto-optical disk as in the conventional example (step A1).
1). The read defect list is converted by the conversion unit 20 from a physical address to a defect list composed of logical addresses, and the defect list is stored in the storage unit 15 (steps A21 and A12).

In the magneto-optical disk used for the first time, the defect list is simultaneously formed by formatting, and the physical address of the defect list is converted into the logical address.
The defect list is stored in the magneto-optical disk.

The flow is shown in FIG. Similar to the conventional example, the magneto-optical disk is initialized, the defect list detected at the time of writing and at the time of verify is converted into a defect list composed of logical addresses by the conversion means 20, and the created defect list is stored. Stored in the means 15 (steps B21, B
17). Finally, the defect list is converted into a defect list composed of physical addresses by the reverse conversion means 21 and stored in the magneto-optical disk by the write means 12 (step B).
22, B18).

The conversion means 20 subtracts (n-1) from the nth defective address to obtain the nth logical defective address. The inverse conversion means 21 adds (n-1) to the nth logical defect address to obtain the nth defective address.

If the defect list stored in the magneto-optical disk is as shown in FIG.
It is converted as shown in (b). First defective address [1
00, 0] is subtracted (1-1) to obtain the first logical defect address [100, 0]. Similarly, the second defective address [100,1] is subtracted from (2-1) to obtain the second logical defective address [100,1]. Similarly, the third defective address [100, 4] is the logical defective address [100, 2] and the fourth defective address [100, 5].
Is the logical defective address [100, 2], the fifth defective address [100, 8] is the logical defective address [100, 4]
Respectively converted to.

Next, regarding the data read operation of the magneto-optical disk controller 4 including the defective sector as in the conventional example, the case of reading from the 1st sector to the 2nd sector of the 100th track of the logical address will be described. An example will be described.

The logical block number input from the host system 3 is converted into a logical address by the converting means 10 as in the conventional example (steps C11 and C12). When the block 2426 and the logical block 2427 are input from the host system, they are converted into logical addresses [100, 1] and logical addresses [100, 2], respectively.

Next, the conversion means 22 converts the logical address into a physical address (step C23). The read means 13 reads the data from the magneto-optical disk with the obtained physical address (step C14).

Referring to FIG. 3A showing the flow of converting a logical address into a physical address, first, a logical address [100,
1] is searched (step D31). In this case, the binary search ends when it matches the second logical defective address [100, 1]. Then, when the logical address is compared with the third logical defective address [100, 2] in the next defect list, the logical address is smaller, so the comparison is ended (step D32). The value of the position of the defect list after the comparison, that is, two is the logical address [100,
It is the value of the defective sector existing up to 1]. The logical address to start reading is obtained as the physical address [100, 3] by adding the obtained 2 to the logical address.

Next, the physical address for ending the read is obtained. Similarly, when the read range is large, it is faster to use the physical address by using the binary search, but when the read range is small, the sequential comparison process is faster. In this embodiment, in order to understand the binary search using the defect list composed of logical addresses, the binary search is used.

When the logical address [100, 2] is searched using the binary search, the process ends when it coincides with the third logical defective address (steps D31 and D32). Then, the logical address and the next item in the defect list, that is, 4
Compared with the th logical defect address [100, 2],
Since they match, the comparison is continued (steps D33 and D3).
2). Since the logical address is smaller than that of the fifth logical defective address [100, 4], the comparison is completed (steps D33 and D32). The value of the position of the defect list after the comparison, that is, four is the logical address [10
It is the value of the defective sector existing up to 0, 1]. The physical address for ending the read is obtained as the physical address [100, 6] by adding the obtained 4 to the logical address (step D34).

In the first embodiment, when the physical address obtained by the binary search is a defective sector,
Successive comparison is required as in the conventional example. In the case of the successive comparison of the conventional example, the temporary address is increased by 1 until the temporary address becomes smaller than that in the defect list for comparison, whereas the successive comparison in the case of the first embodiment has a defect equal to the logical address. Starting from the list, the process can be completed when a defect list larger than the logical address is found, so that the process can be completed faster than the conventional example.

However, in the worst case, the binary
It is necessary to perform a maximum of 12 searches and a maximum of 2047 defective addresses for successive comparison. For example, in the defect list, the defect address [100,0] and the defect address [1
When 2047 sectors are continuously registered from 00, 2], the logical address [100, 1] may be converted to a physical address. In this case, in the defect list of the logical address, the defective address [100,0] and the defective address [100,1] are continuously 2047.

Therefore, when the physical address obtained after the binary search is a defective sector, a process for searching the discontinuity point of the logical defective address on the defect list is performed, and the line at the searched position is searched. When the value obtained by subtracting 1 is added to the logical address, it can be converted into the physical address.

In this case, although it depends on how to make the processing for searching the discontinuity point, if it is created by applying the binary search method with a value larger than the logical address or less than the logical address, the maximum is 12 times. Can detect continuous points. That is, the physical address can be obtained by comparing the binary search 12 times at maximum, that is, 24 times in total.

Next, a second embodiment of the present invention will be described. The second embodiment solves one of the drawbacks of the first embodiment.

In the first embodiment, when there are a plurality of the same logical defective addresses, the physical address obtained by the binary search by the logical address may be the defective sector, and the physical sector which is not the closest defective sector. Need to find a sector.

Therefore, in the second embodiment, a method in which the physical address obtained by the binary search does not indicate a defective sector will be described. The difference from the first embodiment is the defect list conversion means and the inverse conversion means.

In ISO DIS10090, the number of sectors per track is determined to be 25, so that there are sector numbers 0 to 24. On the other hand, the sector numbers in the defect list can be represented from 0 to 255. Therefore, when the defect list is converted from the physical address to the logical address, the conversion method is changed from the first embodiment to the next conversion method.

After subtracting (n-1) from the nth defective address to convert it to the nth logical defective address, the sector number is doubled to create a defect list as a new logical defective address.

When the defect list is stored in the magneto-optical disk, the defect list indicated by the logical address is created by performing the reverse conversion as in the first embodiment, and the defect list is written in the magneto-optical disk. The reverse conversion is performed by halving the nth logical defective address in which the sector number is doubled (n-1).
Is added to make the nth physical defect address.

In the defect list shown in FIG.
The defect list shown in (c) is created. The first defective address [100,0] is doubled after subtracting (1-1) to obtain the first logical defective address [100,0].
Similarly, the second defective address [100, 2] is (2
-1) is subtracted and then doubled to obtain the second logical defective address [100, 2]. Similarly, the third defective address [100, 4] is the logical defective address [100, 4],
The fourth defective address [100, 5] is the logical defective address [100, 4] and the fifth defective address [100, 5].
8] are converted into logical defective addresses [100, 8], respectively.

Next, the case of reading will be described.

First, when searching for the logical address [100, 1], a binary search is performed with a value obtained by doubling the sector number and adding 1, that is, the address [100, 3]. In this case, since the matching defective address does not always exist, the third address [100, 4] is indicated and the binary search ends (step D41). The value obtained by subtracting 1 from the value of the position of the defect list for which the comparison is completed, that is, 2
One is the value of the defective sector existing up to the logical address [100, 1]. The physical address to start reading is obtained as the physical address [100, 3] by adding the obtained 2 to the logical address (step D42).

Next, the physical address for ending the read is obtained. The logical address [100, 2] has a sector number of 2
It is multiplied by 1 and added to convert it to the address [100, 5] to perform the search. Since there is no matching defective address,
The binary search ends, indicating the fifth address [100,8]. The value obtained by subtracting 1 from the value of the position of the defect list after the comparison, that is, 4 is the logical address [10
0, 2] is the value of the defective sector that exists. The read start physical address is obtained as the physical address [100, 6] by adding the obtained 4 to the logical address.

As described above, according to the second embodiment, the logical address / physical address conversion can be performed without performing the point-in-time comparison, which is the drawback of the first embodiment, and the high-speed magneto-optical disk control device can be realized. Can be realized.

In addition, by creating a defect list with a physical address at the time of formatting, storing the defect list in the magneto-optical disk, and then converting the physical address of the defect list into a logical address, the defect list is reversed to the physical address at the time of formatting. It is also possible to shorten the time without performing the conversion process.

Further, one item of the defect list is composed of 8 bytes, the physical address is stored in the lower 4 bytes, and the upper 4 bytes are converted into a logical address and stored, whereby the logical address of the upper 4 bytes is stored. It is also possible to perform logical address / physical address conversion by performing a search using one of the two and reading the physical address of the lower 4 bytes.

According to the first and second embodiments, even in the method of logical address / physical address / logical address conversion when a defect list is created with logical addresses, the logical address / physical address conversion of the defect list composed of physical addresses is performed. Those skilled in the art can easily infer that various methods can be devised as in the method.

[0066]

As described above, according to the present invention,
In the defective sector replacement process, the logical address to physical address conversion process can be performed faster by using the logical address defect list as compared to the conventional physical address defect list. It is possible to realize a magneto-optical disk control device that operates at high speed.

Further, since the process of converting the defect list of the physical address into the defect list of the logical address is performed as a preparation, the time required for inserting and formatting the magneto-optical disk becomes longer than that of the conventional example. Further, even when the defect list is stored in the magneto-optical disk, the process for converting the defect list into the physical address is performed, so that the storage time of the defect list becomes longer than the conventional example.

However, the defect list is converted when the magneto-optical disk is inserted and formatted, whereas the logical address / physical address conversion is performed by frequent operations such as reading and writing. Therefore, according to the present invention, which speeds up frequent processing, it is possible to realize a magneto-optical disk control device that operates at high speed.

[Brief description of drawings]

FIG. 1 is a block diagram showing a configuration of a magneto-optical disk control device according to a first embodiment of the present invention.

FIG. 2 is a flowchart showing the control of the magneto-optical disk control device of the first embodiment of the present invention.

FIG. 3 is another flowchart showing the control of the magneto-optical disk control device according to the first embodiment of the present invention.

FIG. 4 is a table showing defect states of the 100th track.

FIG. 5 is a table showing the contents of a defect list, (a) is a defect list composed of physical addresses, and (b) is a defect list composed of logical addresses converted according to the first embodiment. (C) is a defect list composed of logical addresses converted by the second embodiment.

FIG. 6 is a block diagram showing a configuration of a conventional magneto-optical disk control device.

FIG. 7 is a flow chart showing control of a conventional magneto-optical disk control device.

FIG. 8 is another flowchart showing the control of the conventional magneto-optical disk controller.

FIG. 9 is a table showing defect management areas.

FIG. 10 is a table showing the contents of an initial defect list.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Conventional magneto-optical disk control apparatus 2 Magneto-optical disk apparatus 3 Host system 4 Magneto-optical disk control apparatus according to the present invention 10 Logical block / logical address conversion means 11, 22 Logical / physical address conversion means 12 Write means 13 Read / verify Means 14 Defect list creation means 15 Defect list storage means 20 Defect list physical / logical conversion means 21 Defect list logical / physical reverse conversion means

Claims (3)

[Claims] 1. A magneto-optical disk controller for controlling a magneto-optical disk apparatus creates a defect list 1 indicated by a logical address from physical address information of a defective sector obtained by writing and verifying on the magneto-optical disk. A first means and a second means for reading the defect list 2 indicated by the green physical address on the magneto-optical disk and then creating the defect list 1 indicated by the logical address from the defect list 2. A magneto-optical disk control device having the defect list 1. 2. The magneto-optical disk controller according to claim 1, further comprising third means for converting the defect list 1 indicated by a logical address into the defect list indicated by a physical address. 3. The logical address to be accessed is converted to a physical address by searching the defect list 1 created by the first means and the second means. The magneto-optical disk controller described.