JPH0618556A - Inspection head - Google Patents

Inspection head

Info

Publication number
JPH0618556A
JPH0618556A JP5097885A JP9788593A JPH0618556A JP H0618556 A JPH0618556 A JP H0618556A JP 5097885 A JP5097885 A JP 5097885A JP 9788593 A JP9788593 A JP 9788593A JP H0618556 A JPH0618556 A JP H0618556A
Authority
JP
Japan
Prior art keywords
contact
inspection head
socket
elastic
open top
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5097885A
Other languages
Japanese (ja)
Other versions
JP3395241B2 (en
Inventor
Tetsuya Sakamoto
哲也 坂本
Tsunenori Umetsu
恒徳 梅津
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP09788593A priority Critical patent/JP3395241B2/en
Publication of JPH0618556A publication Critical patent/JPH0618556A/en
Application granted granted Critical
Publication of JP3395241B2 publication Critical patent/JP3395241B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an insulation head wherein contact between a contact pin and a contact is securely and smoothly obtained regardless of irregular height thereof in the case where a conduction check of an open top socket for testing a semiconductor device is perform. CONSTITUTION:Constitution is perform in that a contact 12 in contact with a contact pin 3 of a socket 1 is slidably held through a compression spring 13 within a bracket 14 formed on a holder 16, pressed on the contact pin 3 with spring fort and brought into contact therewith.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体装置をテストす
るオープントップソケットの導通チェックを行う検査ヘ
ッドに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection head for conducting a continuity check of an open top socket for testing a semiconductor device.

【0002】[0002]

【従来の技術】図3は従来のこの種の検査ヘッドを示す
断面図であり、図4は検査ヘッドの斜視図である。これ
らの図において、1はオープントップソケット(以下、
単にソケットという)、2はこのソケット1が取り付け
られた基板、3は前記ソケット1に内装されたコンタク
トピン、4は前記ソケット1の中央部に形成された位置
決め用穴、11は検査ヘッドであり、12は接触子で、
図4に示すように配列され、そのそれぞれがコンタクト
ピン3に押圧接触するようになっている。
2. Description of the Related Art FIG. 3 is a sectional view showing a conventional inspection head of this type, and FIG. 4 is a perspective view of the inspection head. In these figures, 1 is an open top socket (hereinafter,
2 is a substrate to which the socket 1 is attached, 3 is a contact pin embedded in the socket 1, 4 is a positioning hole formed in the central portion of the socket 1, and 11 is an inspection head. , 12 are contacts,
They are arranged as shown in FIG. 4, and each of them is arranged to be in pressure contact with the contact pin 3.

【0003】また、16は前記接触子12を取り付ける
ホルダである。17は把持部、18は前記接触子12に
一端が接続されたケーブル、19はコネクタで、ケーブ
ル18の他端が接続されている。なお、上記接触子1
2,ホルダ16,把持部17をまとめてここでは検査ヘ
ッド11という。
Reference numeral 16 is a holder to which the contact 12 is attached. Reference numeral 17 is a gripping portion, 18 is a cable whose one end is connected to the contactor 12, and 19 is a connector, and the other end of the cable 18 is connected. In addition, the contact 1
2, the holder 16 and the grip 17 are collectively referred to as an inspection head 11 here.

【0004】次に、動作について説明する。ソケット1
上より検査ヘッド11が下降すると、各接触子12はコ
ンタクトピン3にそれぞれ接触し、導通させることがで
きる。
Next, the operation will be described. Socket 1
When the inspection head 11 descends from above, the contacts 12 come into contact with the contact pins 3 and can be made conductive.

【0005】[0005]

【発明が解決しようとする課題】従来の検査ヘッドは以
上のように構成されているので、コンタクトピン3の表
面の高さが全て揃っていないと接触不良を起こし、全て
の接触子12が接触するまで装着動作を数回繰り返す必
要がある。また、ソケット1のコンタクトピン3に加わ
る圧力衝撃により、コントクトピン3が破損する等の不
具合があった。更に、ホルダ16にガイド部が無いので
接触子12とコンタクトピン3とがずれて導通出来ない
場合があった。
Since the conventional inspection head is constructed as described above, if all the heights of the surfaces of the contact pins 3 are not uniform, a contact failure occurs and all the contact pieces 12 come into contact with each other. It is necessary to repeat the mounting operation several times until it is done. Further, there is a problem that the contact pin 3 is damaged by the pressure shock applied to the contact pin 3 of the socket 1. Further, since the holder 16 does not have the guide portion, the contactor 12 and the contact pin 3 may be displaced from each other and may not be electrically connected.

【0006】また、接触子12はI形に配備されている
のでコンタクトピン3の間隔が微少ピッチのものはケー
ブル18との接触部において、はんだ付け等により径が
膨大となりショートする恐れがあり、微少ピッチには適
用出来なかった。
Further, since the contacts 12 are arranged in an I-shape, if the contact pins 3 have a fine pitch, there is a risk of short-circuiting due to an enormous diameter due to soldering at the contact portion with the cable 18. It could not be applied to fine pitch.

【0007】本発明は、上記のような問題点を解消する
ためになされたもので、ソケットのコンタクトピンの高
さが不揃いでも確実に接触子との接触が得られ、また、
微少ピッチのコンタクトピンにも対応出来るとともに、
外部ケーブルとの接続部やケーブルでの断線が無い検査
ヘッドを提供することを目的とする。
The present invention has been made in order to solve the above-mentioned problems, and even if the height of the contact pins of the socket is not uniform, the contact with the contact can be surely obtained, and
In addition to being able to support fine pitch contact pins,
An object of the present invention is to provide an inspection head that does not have a connection portion with an external cable or a break in the cable.

【0008】[0008]

【課題を解決するための手段】本発明に係る検査ヘッド
は、各接触子が弾性を有してそれぞれのコンタクトピン
に接触するように前記各接触子に弾性手段を具備せしめ
たものである。
In the inspection head according to the present invention, each contact has elastic means so that each contact has elasticity and comes into contact with each contact pin.

【0009】また、オープントップソケットの位置決め
穴に挿入されるガイド部を備えたものである。さらに、
外部ケーブルとの接続部に弾性絶縁体を封止したもので
ある。また、接触子をV字形に交互に配列したものであ
る。
Further, it is provided with a guide portion to be inserted into the positioning hole of the open top socket. further,
An elastic insulator is sealed at the connection with the external cable. Further, the contacts are arranged in a V shape alternately.

【0010】[0010]

【作用】本発明においては、接触子がソケットのコンタ
クトピンに弾性を有して接触するので、ソケットのコン
タクトピンが不揃いでも容易に追従し接触させることが
できる。
In the present invention, since the contact element has elasticity and contacts the contact pin of the socket, even if the contact pins of the socket are not aligned, they can easily follow and contact.

【0011】また、本発明によるホルダーにはガイド部
が設けてあり、ソケットの位置決め穴と合わせることに
より高精度な位置決めが出来る。
Further, the holder according to the present invention is provided with the guide portion, and the positioning can be performed with high accuracy by aligning with the positioning hole of the socket.

【0012】さらに、本発明の接触子と外部ケーブル接
続部には、弾性絶縁体を封止しているので、接触子間の
絶縁が行われるとともにケーブルの断線を防止出来る。
Further, since the contactor and the external cable connecting portion of the present invention are sealed with the elastic insulator, the contactor is insulated and the cable disconnection can be prevented.

【0013】また、接触子がV字形に交互に配列されて
いるので、微小ピッチでも外部ケーブルとの接続ができ
る。
Further, since the contacts are alternately arranged in a V shape, connection with an external cable can be made even with a fine pitch.

【0014】[0014]

【実施例】以下、本発明の実施例について説明する。図
1は本発明の検査ヘッドの一実施例を示す断面図であ
る。図1において、11Aは本発明による検査ヘッドを
示し、図3と同一符号は同一構成部分を示している。本
実施例では接触子12としてはピン状のものを用いてい
る。
EXAMPLES Examples of the present invention will be described below. FIG. 1 is a sectional view showing an embodiment of the inspection head of the present invention. In FIG. 1, 11A indicates an inspection head according to the present invention, and the same reference numerals as those in FIG. 3 indicate the same components. In this embodiment, a pin-shaped contactor 12 is used.

【0015】そして、13は圧縮バネ、14は前記ホル
ダ16に形成されたブラケットで、この中に接触子1
2,圧縮バネ13を収納する。15は前記圧縮バネ13
を接触子12との間で保持するリセプタクルである。1
7は把持部であるが、この中にはシリコンゴム等の弾性
絶縁体20が封止されている。そして、ブラケット14
の先端は絞り込んで接触子12が抜けないようになって
いる。
Reference numeral 13 is a compression spring, and 14 is a bracket formed on the holder 16, in which the contact 1
2. The compression spring 13 is stored. 15 is the compression spring 13
Is a receptacle for holding between the contact 12 and the contact. 1
Reference numeral 7 denotes a grip portion, in which an elastic insulator 20 such as silicon rubber is sealed. And the bracket 14
The tip of the contact is squeezed so that the contactor 12 does not come off.

【0016】次に、動作について説明する。検査ヘッド
11Aをソケット1の上から下降させると、ソケット1
の中央部の位置決め用穴4により検査ヘッド11Aのホ
ルダ16のガイド部16aがガイドされて嵌合する。検
査ヘッド11Aをさらに下降すると、接触子12がそれ
ぞれのコンタクトピン3に接触する。さらに下降する
と、接触子12はコンタクトピン3に押され圧縮バネ1
3が縮み、全てのコンタクトピン3の接触が完了する。
Next, the operation will be described. When the inspection head 11A is lowered from above the socket 1, the socket 1
The guide hole 16a of the holder 16 of the inspection head 11A is guided and fitted by the positioning hole 4 in the center of the position. When the inspection head 11A is further lowered, the contacts 12 come into contact with the respective contact pins 3. Further down, the contact 12 is pushed by the contact pin 3 and the compression spring 1
3 contracts, and the contact of all contact pins 3 is completed.

【0017】なお、上記実施例では、接触子12として
コンタクトプローブを使用しているが、この接触子12
としては図2に示すように、バネ性のある板バネ等を用
いてもよく、同様の効果を奏する。そして、図2の実施
例においては、図1の実施例の弾性絶縁体20を具備し
ていないが、この実施例でも弾性絶縁体20を設けても
よいことはもちろんである。
Although a contact probe is used as the contact 12 in the above embodiment, this contact 12
As shown in FIG. 2, a leaf spring having a spring property or the like may be used, and the same effect is obtained. The embodiment of FIG. 2 does not include the elastic insulator 20 of the embodiment of FIG. 1, but it goes without saying that the elastic insulator 20 may be provided in this embodiment as well.

【0018】また、上記各実施例では、ホルダ16には
コンタクトプローブが入るピッチ穴をあけて接触子12
を設けた構成としたが、同一ピッチの角溝またはV溝で
もよく同様の作用を生じる。また、ピッチ穴や角溝ある
いはV溝に交互に斜めに接触子12を配置することによ
り、リードピッチが0.5mmのような微小な場合でも
半田付けするスペースを確保することができる。
Further, in each of the above embodiments, the holder 16 is provided with a pitch hole into which the contact probe is inserted, and the contact 12 is formed.
However, the same effect may be obtained by using square grooves or V grooves having the same pitch. Further, by arranging the contacts 12 alternately in the pitch holes, the square grooves, or the V grooves, it is possible to secure a space for soldering even when the lead pitch is as small as 0.5 mm.

【0019】[0019]

【発明の効果】以上説明したように、本発明によれば、
接触子を弾性手段によりコンタクトピンに圧接する構成
としたので、コンタクトピンの高さに多少の不揃いがあ
っても、接触子とコンタクトピンとの接触がスムーズ
に、かつ確実に行えるとともに、弾性手段が緩衝具の役
目をして接触子とコンタクトピンとの圧接等の際にもコ
ンタクトピンを損傷することもない。したがって、検査
ヘッドの寿命も延びる。
As described above, according to the present invention,
Since the contactor is pressed against the contact pin by the elastic means, even if there is some unevenness in the height of the contact pin, the contactor and the contact pin can be contacted smoothly and reliably, and the elastic means can be used. It also serves as a cushioning tool and does not damage the contact pin even when the contact pin and the contact pin are pressed against each other. Therefore, the life of the inspection head is extended.

【0020】また、ガイド部がソケットの位置決め穴に
挿入L位置決めをガイドするので、高精度な位置決めが
できる。さらに、封止された弾性絶縁体により接触子間
の絶縁とケーブルの断絶を防止する。
Further, since the guide portion guides the insertion L positioning in the positioning hole of the socket, highly accurate positioning can be performed. Furthermore, the sealed elastic insulator prevents insulation between the contacts and disconnection of the cable.

【0021】また、接触子をV字形に交互に並べたこと
により接触子が微小ピッチでも外部ケーブルとの接続が
可能となる等の効果がある。
Further, by arranging the contacts in a V shape alternately, it is possible to connect to the external cable even if the contacts have a fine pitch.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による検査ヘッドを示す断面
側面図である。
FIG. 1 is a sectional side view showing an inspection head according to an embodiment of the present invention.

【図2】本発明の他の実施例を示す断面側面図である。FIG. 2 is a sectional side view showing another embodiment of the present invention.

【図3】従来の検査ヘッドの断面側面図である。FIG. 3 is a sectional side view of a conventional inspection head.

【図4】従来の検査ヘッド部分の斜視図である。FIG. 4 is a perspective view of a conventional inspection head portion.

【符号の説明】[Explanation of symbols]

1 ソケット 2 基板 3 コンタクトピン 4 位置決め用穴 11A 検査ヘッド 12 接触子 13 圧縮バネ 14 ブラケット 15 リセプタクル 16 ホルダ 16a ガイド部 17 把持部 18 ケーブル 19 コネクタ 20 弾性絶縁体 1 Socket 2 Board 3 Contact Pin 4 Positioning Hole 11A Inspection Head 12 Contact 13 Compression Spring 14 Bracket 15 Receptacle 16 Holder 16a Guide 17 Grip 18 Cable 19 Connector 20 Elastic Insulator

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 複数の接触子を備え、オープントップソ
ケットに備えられた複数のコンタクトピンに前記各接触
子をそれぞれ接触せしめて導通チェックを行う検査ヘッ
ドにおいて、前記各接触子がそれぞれのコンタクトピン
に弾性を有して接触するように前記各接触子に弾性手段
を具備せしめたことを特徴とする検査ヘッド。
1. An inspection head having a plurality of contact elements, wherein each contact element is brought into contact with a plurality of contact pins provided in an open top socket to perform continuity check, and each contact element has its own contact pin. An inspection head characterized in that each of the contactors is provided with an elastic means so as to have elastic contact with each other.
【請求項2】 複数の接触子を備え、オープントップソ
ケットに備えられた複数のコンタクトピンに前記各接触
子をそれぞれ接触せしめて導通チェックを行う検査ヘッ
ドにおいて、前記各接触子がそれぞれのコンタクトピン
に弾性を有して接触するように前記各接触子に弾性手段
を具備せしめ、さらに前記オープントップソケットに具
備された位置決め穴に挿入ガイドさせるためのガイド部
を備えたことを特徴とする検査ヘッド。
2. An inspection head having a plurality of contactors, wherein each contactor is brought into contact with a plurality of contact pins provided in an open top socket to perform continuity check, and each contactor has its own contact pin. The inspection head is characterized in that each of the contactors is provided with an elastic means so as to make elastic contact with each other, and further has a guide portion for guiding the insertion into a positioning hole provided in the open top socket. .
【請求項3】 複数の接触子を備え、オープントップソ
ケットに備えられた複数のコンタクトピンに前記各接触
子をそれぞれ接触せしめて導通チェックを行う検査ヘッ
ドにおいて、前記各接触子がそれぞれのコンタクトピン
に弾性を有して接触するように前記各接触子に弾性手段
を具備せしめ、さらに外部ケーブルとの接続部に弾性絶
縁体を封止したことを特徴とする検査ヘッド。
3. An inspection head having a plurality of contact elements, wherein each contact element is brought into contact with a plurality of contact pins provided on an open top socket to perform continuity check, and each contact element has its own contact pin. An inspection head characterized in that each of the contactors is provided with elastic means so as to have elastic contact with each other, and an elastic insulator is sealed at a connection portion with an external cable.
【請求項4】 複数の接触子を備え、オープントップソ
ケットに備えられた複数のコンタクトピンに前記各接触
子をそれぞれ接触せしめて導通チェックを行う検査ヘッ
ドにおいて、前記各接触子がそれぞれのコンタクトピン
に弾性を有して接触するように前記各接触子に弾性手段
を具備せしめ、さらに前記接触子をV字形に交互に複数
並べたことを特徴とする検査ヘッド。
4. An inspection head having a plurality of contact elements, wherein each contact element is brought into contact with a plurality of contact pins provided in an open top socket to perform continuity check, wherein each contact element has a respective contact pin. An inspection head characterized in that each contactor is provided with an elastic means so as to have elastic contact with each other, and a plurality of the contactors are alternately arranged in a V shape.
JP09788593A 1992-04-27 1993-04-23 Inspection head Expired - Fee Related JP3395241B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP09788593A JP3395241B2 (en) 1992-04-27 1993-04-23 Inspection head

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP10758292 1992-04-27
JP4-107582 1992-04-27
JP09788593A JP3395241B2 (en) 1992-04-27 1993-04-23 Inspection head

Publications (2)

Publication Number Publication Date
JPH0618556A true JPH0618556A (en) 1994-01-25
JP3395241B2 JP3395241B2 (en) 2003-04-07

Family

ID=26439029

Family Applications (1)

Application Number Title Priority Date Filing Date
JP09788593A Expired - Fee Related JP3395241B2 (en) 1992-04-27 1993-04-23 Inspection head

Country Status (1)

Country Link
JP (1) JP3395241B2 (en)

Also Published As

Publication number Publication date
JP3395241B2 (en) 2003-04-07

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