JPH0616110B2 - Neutral particle mass energy analyzer - Google Patents

Neutral particle mass energy analyzer

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Publication number
JPH0616110B2
JPH0616110B2 JP62087345A JP8734587A JPH0616110B2 JP H0616110 B2 JPH0616110 B2 JP H0616110B2 JP 62087345 A JP62087345 A JP 62087345A JP 8734587 A JP8734587 A JP 8734587A JP H0616110 B2 JPH0616110 B2 JP H0616110B2
Authority
JP
Japan
Prior art keywords
incident ions
mass
incident
energy
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62087345A
Other languages
Japanese (ja)
Other versions
JPS63252282A (en
Inventor
浩 竹内
好夫 北
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62087345A priority Critical patent/JPH0616110B2/en
Publication of JPS63252282A publication Critical patent/JPS63252282A/en
Publication of JPH0616110B2 publication Critical patent/JPH0616110B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) この発明は核融合装置から発生する中性粒子の質量とエ
ネルギとを分析する質量エネルギ分析装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application] The present invention relates to a mass energy analyzer for analyzing the mass and energy of neutral particles generated from a nuclear fusion device.

(従来の技術) 第1図に従来の中性粒子の質量エネルギ分析装置の構成
図を示す。図示しない核融合装置に真空継手によって直
接接続された真空容器1内にはストリッピングセル2、
偏向電磁石3、静電偏向板4および粒子検出器5が設置
されている。ストリッピングセル2は入射中性粒子6を
セル中に貯えられた中性ガスによって荷電交換し、イオ
ン化して入射イオンに変える機能を有している。偏向電
磁石3は入射されたイオンにラーマ運動をおこさせる機
能を持っている。
(Prior Art) FIG. 1 is a block diagram of a conventional neutral particle mass energy analyzer. A stripping cell 2 is provided in a vacuum vessel 1 directly connected to a fusion device (not shown) by a vacuum joint.
A deflection electromagnet 3, an electrostatic deflection plate 4 and a particle detector 5 are installed. The stripping cell 2 has a function to charge-exchange the incident neutral particles 6 with a neutral gas stored in the cell and ionize the neutral particles 6 to change them into incident ions. The deflecting electromagnet 3 has a function of causing the injected ions to undergo Larmor motion.

したがってこの偏向電磁石3内を通過する入射イオンは
そのエネルギに応じて回転半径の異なる円運動をおこな
う。すなわち偏向電磁石3は入射イオンを運動量弁別す
る働きを有している。静電偏向板4はラーマ運動終了後
の入射イオンに電界を印加することによりその質量の違
いにより紙面に垂直な方向に変位させる働きを持ってい
る。
Therefore, the incident ions passing through the deflecting electromagnet 3 make circular motions having different radii of rotation according to the energy of the incident ions. That is, the deflecting electromagnet 3 has a function of discriminating the momentum of incident ions. The electrostatic deflection plate 4 has a function of displacing in a direction perpendicular to the paper surface by applying an electric field to incident ions after the end of the Larmor motion due to the difference in mass.

このようにして質量とエネルギとのちがいにより異なる
変位量を持って偏向された入射イオンは静電偏向板4の
後方に設置された位置検出型の粒子検出器5によりその
到達場所によりエネルギと質量とが検出される。
In this way, the incident ions deflected with different displacements due to the difference between mass and energy are detected by the position detection type particle detector 5 installed behind the electrostatic deflection plate 4 depending on the arrival position. And are detected.

座標軸x,y,zを図中に示したような方向に定義する
と、入射中性粒子6は偏向電磁石3のz方向に使用する
磁場Bによりラーマ運動をおこし、その進行方向が18
0度回転する。この時の回転直径をXとすると、 となる。
When the coordinate axes x, y and z are defined in the directions shown in the figure, the incident neutral particle 6 causes the Rama motion by the magnetic field B used in the z direction of the deflecting electromagnet 3, and its traveling direction is 18
Rotate 0 degrees. If the rotation diameter at this time is X, Becomes

ただし、mは中性粒子の質量、Vは速度、qは電荷量、
Bは磁場である。
However, m is the mass of the neutral particles, V is the velocity, q is the charge amount,
B is a magnetic field.

次に静電偏向板4内にz方向に印加された電場により、
入射イオンはz方向に印加される。粒子検出器5で検出
されるz方向の変位をZとすると、 となる。ただしlは静電偏向板4を通過する入射イオン
の通過電極長、l′は成分偏向板4と粒子検出器5との
間の距離、Eは静電偏向板4の電場である。
Next, by the electric field applied in the z direction in the electrostatic deflection plate 4,
Incident ions are applied in the z direction. If the displacement in the z direction detected by the particle detector 5 is Z, Becomes Here, 1 is a passage electrode length of incident ions passing through the electrostatic deflector 4, l'is a distance between the component deflector 4 and the particle detector 5, and E is an electric field of the electrostatic deflector 4.

ストリッピングセル2を通過して進行する入射中性粒子
6の進路をfとし、静電偏向板4の粒子入射側の1辺を
jとし、この進路fと1辺jとの交点を0とすれば、第
1図に示すように粒子検出器5の延長線hと静電偏向板
4の後端辺iの延長線が交点0を通るように配置してお
けば、粒子検出器5の位置での入射イオンのz方向の変
位は、質量が同じなら異なった運動量を持った粒子でも
同一になる。
The path of the incident neutral particles 6 traveling through the stripping cell 2 is f, one side of the electrostatic deflector 4 on the particle incident side is j, and the intersection of this path f and one side j is 0. Then, as shown in FIG. 1, if the extension line h of the particle detector 5 and the extension line of the rear end side i of the electrostatic deflection plate 4 pass through the intersection point 0, the particle detector 5 The displacement of incident ions in the z direction at a position is the same for particles having different momentums if the mass is the same.

したがって従来のエネルギ分析装置では静電偏向板4の
形状は第1図に示すように台形状の形状になっていた。
Therefore, in the conventional energy analyzer, the electrostatic deflection plate 4 has a trapezoidal shape as shown in FIG.

(発明が解決しようとする問題点) 第2図は第1図に示したA−A′線に沿って切断した場
合の静電偏向板4の断面構造を示した図である。入射中
性粒子の質量エネルギ分析を高エネルギから低エネルギ
まで広いレンジにわたって行なおうとした場合、従来の
分析装置では特に低エネルギ側で粒子が静電偏向板4を
通過する電極長lが電極間距離Δに比べて小さい時、第
2図に示すように洩れ電場の効果により粒子が本来は軌
道Iを通るべきところを軌道IIを通るように変ってしま
うという問題があった。このため低エネルギ側では粒子
検出器5の検出位置でのZ方向の変位が大きくなり、天
床にあたって検出できなくなったり、あるいは誤差の大
きい検出結果を示すという不都合があった。
(Problems to be Solved by the Invention) FIG. 2 is a view showing a cross-sectional structure of the electrostatic deflection plate 4 when cut along the line AA ′ shown in FIG. When attempting to perform mass energy analysis of incident neutral particles over a wide range from high energy to low energy, in the conventional analyzer, the electrode length l at which the particles pass through the electrostatic deflector 4 is particularly low on the low energy side. When the distance is smaller than the distance Δ, there is a problem that particles are changed from passing through the orbit I to the orbit II due to the effect of the leakage electric field as shown in FIG. For this reason, on the low energy side, the displacement in the Z direction at the detection position of the particle detector 5 becomes large, so that there is a disadvantage that detection cannot be performed when the roof is detected or a detection result with a large error is displayed.

この発明の目的は低エネルギの中性粒子でも十分に測定
が可能な、中性粒子の質量エネルギ分析装置を提供する
にある。
An object of the present invention is to provide a neutral particle mass energy analyzer capable of sufficiently measuring even low-energy neutral particles.

〔発明の構成〕[Structure of Invention]

(問題点を解決するための手段) この発明では上記目的を達成するために、入射中性粒子
をイオン化して入射イオンとするストリッピングセル
と、前記入射イオンに磁界を印加しラーマ運動を起こさ
せ、前記入射イオンのもつエネルギに応じて異なる回転
半径をもって前記入射イオンの進行方向を180度回転
させる偏向電磁石と、ラーマ運動終了後の前記入射イオ
ンに電界を印加し前記入射イオンの質量に応じて異なる
変位をもって進行方向を偏向させる静電偏向板と、前記
入射イオンの到達場所によってそのエネルギと質量とを
検出するよう前記静電偏向板の後方に設置された粒子検
出器とを具備してなる中性粒子の質量エネルギ分析装置
において、前記偏向電磁石と前記静電偏向板との間に前
記入射イオンの進行速度を加速する加速電極を設け、イ
オン通過電極長lをほぼ次式で与えられる形状としかつ
偏向板間隔より十分長くした前記静電偏向板を用いたこ
とを特徴としている。
(Means for Solving the Problems) In order to achieve the above object, the present invention has a stripping cell that ionizes incident neutral particles to make incident ions, and a magnetic field is applied to the incident ions to cause Larmor motion. And a deflection electromagnet for rotating the advancing direction of the incident ion by 180 degrees with a different radius of rotation depending on the energy of the incident ion, and an electric field is applied to the incident ion after the end of the Larmor motion to change the mass of the incident ion. And an electrostatic deflector for deflecting the traveling direction with different displacements, and a particle detector installed behind the electrostatic deflector so as to detect the energy and mass of the incident ions depending on their arrival positions. In the apparatus for analyzing the mass energy of neutral particles, an accelerating electron for accelerating the traveling speed of the incident ions between the deflection electromagnet and the electrostatic deflection plate. It is characterized in that the electrostatic deflector is provided with poles, the ion-passing electrode length l is substantially given by the following equation, and is sufficiently longer than the deflector spacing.

(ただし、 l′…静電偏向板と粒子検出器との間の距離、 q …電荷量、 E…静電偏向板内の電場、 Z…マイクロチャネルプレート検出器でのZ方向変位
量、U…加速電極により入射イオンが得るポテンシャ
ルエネルギ、 B …偏向電磁石による磁場、x…ラーマ直径、 m …中性粒子の質量) (作用) この発明による中性粒子の質量エネルギ分析装置は、変
位電磁石と静電偏向板との間に設けられた加速電極によ
りイオン化した中性粒子にエネルギを与え、イオンが通
過する静電偏向板のイオン通過電極長を偏向板間隔より
十分長くして静電偏向板の洩れ電場による影響を無くす
るようにしている。
(However, l '... distance between the electrostatic deflection plates and the particle detector, q ... charge amount, electric field E 2 ... electrostatic deflection plate, Z-direction displacement amount in the Z 0 ... microchannel plate detector , U 0 ... Potential energy obtained by incident ions by the accelerating electrode, B ... Magnetic field by the deflection electromagnet, x ... Larmor diameter, m ... Mass of neutral particles) (Function) The mass energy analyzer for neutral particles according to the present invention, Energy is given to the ionized neutral particles by the acceleration electrode provided between the displacement electromagnet and the electrostatic deflection plate, and the ion passage electrode length of the electrostatic deflection plate through which the ions pass is made sufficiently longer than the distance between the deflection plates to make it static. The influence of the leakage electric field of the electric deflection plate is eliminated.

(発明の実施例) 以下この発明の実施例を第3図および第4図を用いて詳
細に説明する。
(Embodiment of the Invention) An embodiment of the present invention will be described in detail below with reference to FIGS. 3 and 4.

なお第1図に示したと同一部分には同一符号を付しその
説明は省略する。第3図はこの発明の一実施例を示す構
成図で第4図は第3図に示すB−B′線に沿って切断し
た部分の断面図を示したものである。第1図に示した従
来の装置と比べて、第3図に示した実施例では偏向電磁
石3と静電偏向板4aとの間に、入射イオンの進行速度
を加速するための加速電極7が新らしく追加されてい
る。この加速電極7によって入射イオンが得るポテンシ
ャルエネルギをU、粒子検出器5でのZ方向の変位を
とすると、入射イオンの初速をVとしたときの静
電偏向板4aのイオン通過電極長lは次式で与えられ
る。
The same parts as those shown in FIG. 1 are designated by the same reference numerals and the description thereof will be omitted. FIG. 3 is a block diagram showing an embodiment of the present invention, and FIG. 4 is a sectional view of a portion cut along the line BB 'shown in FIG. Compared with the conventional device shown in FIG. 1, in the embodiment shown in FIG. 3, an accelerating electrode 7 for accelerating the traveling speed of incident ions is provided between the deflecting electromagnet 3 and the electrostatic deflecting plate 4a. It has been newly added. Assuming that the potential energy obtained by the accelerating electrode 7 by the incident ions is U 0 and the displacement in the Z direction at the particle detector 5 is Z 0 , the ion passing through the electrostatic deflection plate 4a when the initial velocity of the incident ions is V 0 The electrode length l is given by the following equation.

ただし、l′は静電偏向板4aと粒子検出器5との間の
距離、xはラーマ直径、Eは静電偏向板4aの間の電
場である。入射イオンのエネルギが小さい場合には(3)
式は、 となる。ここで第1図に示すような従来の装置では加速
電極7が存在しないためU=0なのでイオン通過電極
長lは0となるが第3図に示す実施例ではU>0であ
るからUが十分大きいとイオン通過電極長lは に比例する大きさとなる。したがってl>Δを満足する
ようにポテンシャルエネルギUを与えれば、静電偏向
板4aの洩れ電場の影響による入射イオンの軌道のずれ
を無くすことができる。
However, l 'is the distance between the electrostatic deflection plates 4a and particle detector 5, x is Rama diameter, E 2 is the electric field between the electrostatic deflection plates 4a. When the incident ion energy is small (3)
ceremony, Becomes In the conventional apparatus as shown in FIG. 1, since the acceleration electrode 7 does not exist, U 0 = 0 and therefore the ion passage electrode length 1 becomes 0, but in the embodiment shown in FIG. 3, U 0 > 0. If U 0 is sufficiently large, the ion passing electrode length l will be The size is proportional to. Therefore, if the potential energy U 0 is given so as to satisfy l> Δ, it is possible to eliminate the deviation of the trajectory of the incident ions due to the influence of the leakage electric field of the electrostatic deflection plate 4a.

〔発明の効果〕〔The invention's effect〕

以上実施例に基ずいて詳細に説明したようにこの発明で
は加速電極を用いることによりイオン化した中性粒子に
エネルギを与え、しかもこのイオンが通過する静電偏向
板のイオン通過電極長を偏向板間隔より十分長くするよ
うにしているので静電偏向板の洩れ電場による影響を無
くすことができる。したがって低エネルギの中性粒子の
測定を十分に精度よくおこなうことができる。
As described in detail based on the above embodiments, in the present invention, by using an accelerating electrode, energy is given to ionized neutral particles, and further, the length of the ion passing electrode of the electrostatic deflecting plate through which the ions pass is set to the deflecting plate. Since the distance is made sufficiently longer than the distance, the influence of the electric field of leakage of the electrostatic deflection plate can be eliminated. Therefore, low-energy neutral particles can be measured sufficiently accurately.

【図面の簡単な説明】[Brief description of drawings]

第1図は従来の質量エネルギ分析装置の構成図、第2図
は第1図のA−A′線に沿って切断した断面図、第3図
はこの発明の一実施例を示す構成図、第4図は第3図の
B−B′線に沿って切断した断面図である。 2……ストリッピングセル、3……偏向電磁石、4a…
…静電偏向板、5……粒子検出器、6……中性粒子、7
……加速電極。
FIG. 1 is a block diagram of a conventional mass energy analyzer, FIG. 2 is a sectional view taken along the line AA ′ in FIG. 1, and FIG. 3 is a block diagram showing an embodiment of the present invention. FIG. 4 is a sectional view taken along the line BB ′ in FIG. 2 ... Stripping cell, 3 ... Bending electromagnet, 4a ...
... Electrostatic deflector, 5 ... Particle detector, 6 ... Neutral particles, 7
…… Accelerating electrode.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】入射中性粒子をイオン化して入射イオンと
するストリッピングセルと、前記入射イオンに磁界を印
加しラーマ運動を起こさせ前記入射イオンのもつエネル
ギに応じて異なる回転半径をもって前記入射イオンの進
行方向を180度回転させる偏向電磁石と、ラーマ運動
終了後の前記入射イオンに電界を印加し前記入射イオン
の質量に応じて異なる変位をもって進行方向を偏向させ
る静電偏向板と、前記入射イオンの到達場所によってそ
のエネルギと質量とを検出するよう前記静電偏向板の後
方に設置された粒子検出器とを具備してなる中性粒子の
質量エネルギ分析装置において、前記偏向電磁石と前記
静電偏向板との間に前記入射イオンの進行速度を加速す
る加速電極を設け、イオン通過電極長lをほぼ次式で与
えられる形状としかつ偏向板間隔より十分長くした前記
静電偏向板を用いた事を特徴とする中性粒子の質量エネ
ルギ分析装置。 (ただし、 l′…静電偏向板と粒子検出器との間の距離、 q …電荷量、E…静電偏向板内の電場、 Z…マイクロチャネルプレート検出器でのZ方向変位
量、 U…加速電極により入射イオンが得るポテンシャルエ
ネルギ、 B …偏向電磁石による磁場、 X …ラーマ直径、m…中性粒子の質量)
1. A stripping cell for ionizing incident neutral particles into incident ions, and a magnetic field applied to the incident ions to cause Larmor motion to cause the incident ions with different radii of rotation depending on the energy of the incident ions. A deflection electromagnet that rotates the advancing direction of the ions by 180 degrees, an electrostatic deflection plate that applies an electric field to the incident ions after the end of the Larmor motion, and deflects the advancing directions with different displacements according to the mass of the incident ions, and the incidence. A neutral particle mass energy analyzer comprising a particle detector installed behind the electrostatic deflection plate so as to detect the energy and mass of the ion depending on the arrival location of the ion, in the neutral particle mass energy analyzer. An accelerating electrode for accelerating the advancing velocity of the incident ions is provided between the electrode and the electro-deflecting plate, and the ion-passing electrode length l has a shape given by the following equation. One deflector mass energy spectrometer neutral particles, characterized in than that with sufficiently lengthened the electrostatic deflection plates intervals. (However, l '... distance between the electrostatic deflection plates and the particle detector, q ... charge amount, electric field E 2 ... electrostatic deflection plate, Z-direction displacement amount in the Z 0 ... microchannel plate detector , U 0 ... potential energy obtained by the incident ions by the accelerating electrode, B ... magnetic field by the deflection electromagnet, X ... Larmor diameter, m ... mass of neutral particles)
JP62087345A 1987-04-09 1987-04-09 Neutral particle mass energy analyzer Expired - Lifetime JPH0616110B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62087345A JPH0616110B2 (en) 1987-04-09 1987-04-09 Neutral particle mass energy analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62087345A JPH0616110B2 (en) 1987-04-09 1987-04-09 Neutral particle mass energy analyzer

Publications (2)

Publication Number Publication Date
JPS63252282A JPS63252282A (en) 1988-10-19
JPH0616110B2 true JPH0616110B2 (en) 1994-03-02

Family

ID=13912280

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62087345A Expired - Lifetime JPH0616110B2 (en) 1987-04-09 1987-04-09 Neutral particle mass energy analyzer

Country Status (1)

Country Link
JP (1) JPH0616110B2 (en)

Also Published As

Publication number Publication date
JPS63252282A (en) 1988-10-19

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