JPH06141242A - Image pickup device - Google Patents

Abstract

PURPOSE:To correct a picture defect or a sensitivity uneveness by varying the timing of a reading pulse corresponding to the displacing amount of the picture unit of a displayed optical image. CONSTITUTION:A solid image pickup element 2 converts the optical image in which picture elements are arrayed in a horizontal direction and a vertical direction into an electric signal. And also, an optical displacing means 9 is arranged on an optical axis between the image pickup element 2 and an object, and the optical image to be image-formed by the element 2 is displayed in a horizontal picture element direction and a vertical picture element direction to the element 2. At that time, the displacing amount of the optical image displaced by the displacing means 9 is detected by a means 10 which detects the displacing amount, and a timing generating means 5 generates the read pulse for reading the electric signal from the element 2. Then, a control means 7 varies the timing of the read pulse generated by the timing generating circuit 5 corresponding to the displacing amount of the picture unit of the optical image displaced by the displacing means 9. Then, the defective picture element or a picture variation due to the secular change or temperature change of the element 2 can be corrected, and a fixed pattern noise can be reduced.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an image pickup apparatus using a solid-state image pickup device in which pixels are arranged in horizontal and vertical directions.

[0002]

2. Description of the Related Art Solid-state image pickup devices such as CCDs are characterized by their small size, light weight and high reliability as compared with conventional image pickup tubes, and also have many advantages such as no graphic distortion, small afterimage and no image sticking. ing. Therefore, it is widely applied to industrial television cameras, home video cameras, electronic still cameras and the like. On the other hand, due to the structure of the solid-state image pickup element, variations in sensitivity among pixels, defective pixels, and the like cause point noise called fixed pattern noise, vertical stripe noise, and uneven sensitivity. Since this noise is particularly noticeable in a uniform image, some correction is necessary.

As a correction method, there are a method of interpolating with adjacent pixels and a method of correcting a white defect by adding a pseudo black point signal. There are various methods for interpolating with adjacent pixels as shown in FIG. The figure shows the pixel array of the solid-state imaging device, ○ is a normal pixel, × is a defective pixel,
● is a pixel used to interpolate a defective pixel. Of these, the method shown in FIG. 11a requires the addition using the delay elements for two pixels and is the simplest configuration. Interpolation between scanning lines shown in b requires a delay element for two scanning lines, interpolation between fields shown in c requires a delay element for two fields, and a delay element for scanning lines shown in d is required. When interpolation and inter-field interpolation are performed, two scan line intervals and two
Although the delay element for the field is required and the circuit scale becomes large, the accuracy of interpolation becomes closer to the actual level.

FIGS. 12 and 13 show a conventional image pickup device and an image defect correction circuit similar to those shown in "CCD Camera Technology" written by Hiroo Takemura, Radio Technology Co. (pages 66 to 69). Hereinafter, a conventional imaging device will be described with reference to the drawings. FIG. 12 is a block diagram showing the configuration of a conventional image pickup apparatus. In FIG. 12, light from a subject is imaged on the surface of a solid-state image sensor 2 having pixels in horizontal and vertical directions through a lens 1. The optical image of the subject formed on the surface of the solid-state image sensor 2 is converted into an electric signal. On the other hand, when the read pulse generated by the timing generation circuit 5 is amplified by the clock driver 6 and input to the solid-state image sensor 2, an electric signal is read from the solid-state image sensor 2 and amplified by the amplification means 3. The electrical signal is corrected by the image defect correction circuit 31 and is corrected by the signal processing circuit 4.
Is converted into a video signal and output. Further, 30 is a storage means, which stores the position of the defective pixel of the solid-state image pickup device 2 in advance, and outputs the information to the image defect correction circuit 31.

FIG. 13 is a block diagram showing the configuration of an image defect correction circuit of a conventional image pickup apparatus. In FIG. 13, the output signal of the amplification means 3 is clamped by the clamp circuit 32. The output of the clamp circuit 32 is input to one of the delay circuit 33 and the adder circuit 35. The delay output of the delay circuit 33 is given to the switch 36 and also given to the other input of the adder circuit 35 via the delay circuit 34. The addition output of the addition circuit 35 is given to the switch 37. The switch 37 is controlled by the defect correction signal a from the defect correction signal generation circuit 38, and the switch 36 is also controlled by the inverted signal of the defect correction signal a. The switch 3
The output of 6 and the output of the switch 37 are added in the adder circuit 39 to be the output of the image defect correction circuit 31.

Next, the operation will be described. FIG. 14 is a diagram showing the operation of the image defect correction circuit of the conventional image pickup apparatus.
The zero level of the output signal of the amplifier 3 is the clamp circuit 32.
Is clamped to the voltage E by. This is shown in Figure 14b. The clamped signal shown in FIG.
14c, the delayed output signal shown in FIG. 14c is output. When the delayed output signal c is input to the delay circuit 34, the delayed output signal indicated by d is output. Switch 36
Operates to output the clamp potential E when the input terminal 36a is at the low level and to output the signal at the input terminal 36b when the input terminal 36a is at the high level. On the other hand, the switch 37
Operates to output the clamp potential E when the input terminal 37a is at the low level and to output the signal of the input terminal 37b when the input terminal 37a is at the high level.

It is now assumed that the nth signal is a defective pixel signal, as shown in FIG. 14b. The defect correction signal corresponding to the output of the defect correction signal generation circuit 38 is shown in FIG. 14a. The output of the clamp circuit 32 shown in FIG. 14b and the output of the delay circuit 34 shown in d are added by the adder circuit 35. Here, the adder circuit 35
A value obtained by multiplying the sum of two inputs by 1/2 is output. By the way, since the inverted signal of the defect correction signal indicated by a is input to the input terminal 36a of the switch 36, the output thereof is the signal indicated by e. Further, since the defect correction signal indicated by a is input to the input terminal 37a of the switch 37,
The output becomes the signal shown in f. The adder circuit 39 outputs the output signal of the delay circuit 33 shown in FIG. 14e when the defect correction signal a is at a low level, and outputs the output signal of the adder circuit 35 shown in FIG. 14f when the defect correction signal a is at a high level. Output. By the above operation, as shown in FIG.
The signal from the n-th defective pixel is 1/2 of the sum of the signal from the (n-1) -th pixel and the signal from the (n + 1) -th pixel.
Is replaced by

The principle of this image defect correction circuit is based on the principle that the signals of adjacent pixels have substantially the same value due to the correlation of images. The position of the defective pixel is stored in the storage device 30 in advance, and the defect correction signal generation circuit 38 generates the defect correction signal based on the defective pixel information output from the storage device 30.

[0009]

Since the conventional image pickup apparatus is constructed as described above, it has the following problems. First, since the signal due to the defective pixel is corrected by using two adjacent pixels, when there is a sharp change before and after the defective pixel, the correction error becomes large. Secondly, it is necessary to accurately detect and store the position of the defective pixel in advance, and a storage device and an adder circuit for correcting the defective pixel are required. Thirdly, even if the position of the defective pixel is accurately detected and stored in advance, if a new defective pixel is generated due to a change over time or if the sensitivity of the pixel is uneven due to a change in temperature, an image of a conventional image pickup device is displayed. It cannot be corrected by the defect correction circuit.

The inventions of claims 1 and 2 have been made in order to solve the above problems, and there is no loss of image information received by a defective pixel, and there are few errors for interpolation by adjacent pixels, and An object of the present invention is to provide an imaging device that does not require a storage device for storing defective pixels and can correct image defects and sensitivity unevenness even with time and temperature changes.

The inventions of claims 3 to 5 were made in order to realize the correction method of claim 1, and provide an image pickup device which reduces fixed pattern noise caused by image defects and uneven sensitivity with a simple structure. The purpose is to

The inventions of claims 6 to 8 have been made to realize the correction method of claim 2, and provide an image pickup device which has a simple structure and reduces fixed pattern noise caused by image defects or sensitivity unevenness. The purpose is to

The ninth aspect of the invention is to reduce the fixed pattern noise caused by image defects and uneven sensitivity with the simple structure of the first and second aspects of the invention, and then further perform S / N.
It is an object of the present invention to provide an imaging device that improves.

[0014]

According to a first aspect of the present invention, there is provided an image pickup device comprising a solid-state image pickup device in which pixels are arranged in horizontal and vertical directions to convert an optical image into an electric signal, and the solid-state image pickup device and an object. An optical displacement unit disposed on the optical axis for displacing an optical image formed on the solid-state image sensor in the horizontal pixel direction and the vertical pixel direction with respect to the solid-state image sensor, and the optical displacement unit displaced by the optical displacement unit. Means for detecting the amount of displacement of the optical image, timing generation circuit for generating a read pulse for reading an electrical signal from the solid-state image sensor, and corresponding to the amount of displacement in pixel units of the optical image displaced by the optical displacement unit Then, a control means for varying the timing of the read pulse generated by the timing generation circuit is provided.

According to another aspect of the invention, there is provided a solid-state image sensor having pixels arranged in horizontal and vertical directions for converting an optical image into an electric signal, and an optical image formed on the solid-state image sensor. Displacement means connected to the solid-state image sensor, for displacing the solid-state image sensor in the horizontal pixel direction and the vertical pixel direction, means for detecting a displacement amount of the solid-state image sensor displaced by the displacement means, and the solid-state image sensor. A timing generation circuit for generating a read pulse for reading an electric signal from the element, and the timing generation corresponding to the displacement amount of the solid-state image sensor displaced by the displacement means in the pixel unit in the horizontal pixel direction and the vertical pixel direction. It is provided with a control means for changing the timing of the read pulse generated by the circuit.

The image pickup device according to the inventions of claims 3 to 5 is
An optical displacement means for displacing an optical image in the horizontal pixel direction and the vertical pixel direction of the solid-state imaging device, and a drive means for driving the optical displacement means are provided.

The image pickup apparatus according to the inventions of claims 6 to 8 is
It is provided with a displacement means for displacing the solid-state image pickup element in the horizontal pixel direction and the vertical pixel direction with respect to the optical image, and a drive means for driving the displacement means.

According to a ninth aspect of the present invention, in an image pickup device, an amplifying means for amplifying an electric signal read from the solid-state image pickup element by a read pulse generated by the timing generating circuit, and an output of the amplifying means is a video signal. A signal processing circuit for converting into a signal and an integrating means for integrating a video signal output from the signal processing circuit.

[0019]

In the image pickup device according to the invention of claim 1,
An optical image formed on the solid-state image sensor is displaced by the optical displacement means in the horizontal pixel direction and the vertical pixel direction of the solid-state image sensor, and a read pulse for reading an electric signal from the solid-state image sensor is outputted by the control means. By changing the amount according to the amount of displacement of the image, fixed pattern noise caused by defective pixels of the solid-state image pickup device, uneven sensitivity, or the like is reduced.

In the image pickup device according to the second aspect of the present invention, the displacing means displaces the solid-state image pickup element in the horizontal pixel direction and the vertical pixel direction with respect to the optical image formed on the solid-state image pickup element, and by the control means. By changing the read pulse for reading an electric signal from the solid-state image pickup device according to the amount of displacement of the optical image, fixed pattern noise caused by defective pixels or sensitivity unevenness of the solid-state image pickup device is reduced.

In the image pickup device according to the third aspect of the present invention, when the optical image is displaced by the optical means in the horizontal pixel direction and the vertical pixel direction of the solid-state image pickup element, the optical displacement means is driven. The drive waveform is a pulse having two fields as one period, and the vibration amplitude of the optical image displaced by the optical displacement means is equal to the horizontal and vertical pixel array pitches of the solid-state image sensor. The fixed pattern noise caused by defective pixels of the solid-state imaging device, uneven sensitivity, and the like are reduced.

In the image pickup device according to the invention of claim 4, when the optical image is displaced in the horizontal pixel direction and the vertical pixel direction of the solid-state image pickup element, the optical displacement means is driven. The drive waveform has a stepwise wave shape in which one field is one step with a plurality of fields as one cycle, and one step of the vibration amplitude of the optical image displaced by the optical displacement means is a horizontal direction and a vertical direction of the solid-state imaging device. The fixed pattern noise caused by defective pixels, uneven sensitivity, etc. of the solid-state image sensor is reduced by setting the pixel array pitch to be equal to the pixel array pitch.

In the image pickup device according to the invention of claim 5, when the optical image is displaced by the optical displacement means in the horizontal pixel direction and the vertical pixel direction of the solid-state image pickup element, the optical displacement means is driven. Has a triangular waveform having a plurality of fields as one cycle, and the vibration amplitude of the optical image displaced by the optical displacement means is 1/2.
By making the pixel array pitch equal to the number of fields for the period, the fixed pattern noise caused by defective pixels of the solid-state imaging device, uneven sensitivity, and the like can be reduced.

In the image pickup device according to the invention of claim 6, when displacing the solid-state image pickup device in the horizontal pixel direction and the vertical pixel direction with respect to the optical image by the displacement means, a drive for driving the displacement means. The waveform is a pulse having two fields as one cycle, and the vibration amplitude of the solid-state image sensor displaced by the displacement means is equal to the horizontal and vertical pixel array pitches of the solid-state image sensor. Fixed pattern noise caused by defective pixels of the solid-state image sensor, uneven sensitivity, etc. is reduced.

In the image pickup device according to the invention of claim 7, when the displacement means displaces the solid-state image pickup device in the horizontal pixel direction and the vertical pixel direction with respect to the optical image, a drive for driving the displacement means. The waveform has a stepwise wave shape in which one field is one step in a plurality of fields, and one step of the vibration amplitude of the solid-state image sensor displaced by the displacement means is a pixel in the horizontal and vertical directions of the solid-state image sensor. By making the pitch equal to the array pitch, fixed pattern noise caused by defective pixels of the solid-state imaging device, uneven sensitivity, and the like is reduced.

In the image pickup apparatus according to the invention of claim 8, when the displacement means displaces the solid-state image pickup element in the horizontal pixel direction and the vertical pixel direction with respect to the optical image, a drive for driving the displacement means. The waveform has a triangular wave shape having a plurality of fields as one cycle, and when the vibration amplitude of the solid-state image sensor displaced by the displacement means is equal to the number of fields for half a cycle and the same number of pixel array pitches, Fixed pattern noise caused by defective pixels of the solid-state image sensor, uneven sensitivity, etc. is reduced.

In the image pickup device according to the invention of claim 9, the output of the solid-state image pickup device is converted into a video signal by a signal processing circuit, and the output is integrated by an integrating means to obtain defective pixels and uneven sensitivity of the solid-state image pickup device. Fixed pattern noise caused by the above is further reduced.

[0028]

EXAMPLES Example 1. An embodiment of the invention of claim 1 will be described below with reference to the drawings. 1 is a block diagram showing the arrangement of an image pickup apparatus according to an embodiment of the present invention. In FIG. 1, light from a subject is refracted by the optical displacement means 9 and passes through the lens 1 to form an image on the surface of the solid-state image sensor 2 having pixels in horizontal and vertical directions. The optical image of the subject formed on the surface of the solid-state image sensor 2 is converted into an electric signal. On the other hand, when the read pulse generated by the timing generation circuit 5 is amplified by the clock driver 6 and input to the solid-state image sensor 2, an electric signal is read from the solid-state image sensor 2 and amplified by the amplification means 3. The electric signal is converted into a video signal by the signal processing circuit 4 and output.

The optical displacement means 9 refracts the incident light at an arbitrary angle by the drive signal output from the drive means 8,
The optical image formed on the surface of the solid-state image sensor 2 is displaced in the horizontal pixel direction and the vertical pixel direction. Further, the detecting means 10
By detecting the displacement amount of the optical displacement means 9 by
The amount of displacement of the optical image on the surface of the solid-state image sensor 2 can be detected.

The optical displacement means 9 is controlled by the control means 7 outputting a control signal to the drive means 8,
On the other hand, the displacement amount of the optical displacement means 9 detected by the detection means 10 is input to the control means 7.

Further, the control means 7 can change the timing of the read pulse generated by the timing generation circuit 5, and the optical displacement is determined by the displacement amount of the optical displacement means 9 detected by the detection means 10. The amount of displacement of the image on the surface of the solid-state image pickup device 2 is detected, and the timing of the reading pulse is changed correspondingly.

Next, the operation will be described. FIG. 2 is a diagram for explaining the operation of the image pickup apparatus according to the first and second embodiments of the present invention. In FIG. 2, c is a solid-state image sensor, and a and b are pixels, where a is a defective pixel. When the optical image formed on the solid-state image sensor 2 is displaced in the horizontal pixel direction of the solid-state image sensor 2 by the optical displacement means 9, in FIG.
Suppose you have moved from to b. At this time, the timing of the read pulse for reading the electric signal from the solid-state image sensor 2 is set to A
When changing from B to B, the same portion of the optical image that should originally be imaged on the defective pixel a is imaged on the normal pixel b and is converted into an electric signal.

Here, the optical displacement means 9 is, for example, as shown in FIG.
3, the variable prism 21 in FIG. 3 refracts incident light at an arbitrary angle.
The variable prism includes two transparent plates 22 that transmit incident light.
The surrounding area is covered with a stretchable substance 23, and the space between the two transparent plates and the stretchable substance is filled with a liquid 24 having the same refractive index as the transparent plates.

As described above, for example, the optical displacement means 9 operates so that the optical image reciprocates between the pixel a and the pixel b in FIG. 2, and the timing of the read pulse from A to B is adjusted accordingly. If the timing generating circuit 5 generates a read pulse so as to vary between the two, even if there is some defect in the pixel a, the occurrence of fixed pattern noise due to the pixel a is reduced by interpolating at the pixel b. be able to.

Example 2. An embodiment of the invention of claim 1 will be described below with reference to the drawings. 1 is a block diagram showing the arrangement of an image pickup apparatus according to an embodiment of the present invention. In FIG. 1, light from a subject is refracted by the optical displacement means 9 and passes through the lens 1 to form an image on the surface of the solid-state image sensor 2 having pixels in horizontal and vertical directions. The optical image of the subject formed on the surface of the solid-state image sensor 2 is converted into an electric signal. On the other hand, when the read pulse generated by the timing generation circuit 5 is amplified by the clock driver 6 and input to the solid-state image sensor 2, an electric signal is read from the solid-state image sensor 2 and amplified by the amplification means 3. The electric signal is converted into a video signal by the signal processing circuit 4 and output.

The optical displacement means 9 refracts the incident light at an arbitrary angle by the drive signal output from the drive means 8,
The optical image formed on the surface of the solid-state image sensor 2 is displaced in the horizontal pixel direction and the vertical pixel direction. Further, the detecting means 10
By detecting the displacement amount of the optical displacement means 9 by
The amount of displacement of the optical image on the surface of the solid-state image sensor 2 can be detected.

The optical displacement means 9 is controlled by the control means 7 outputting a control signal to the drive means 8,
On the other hand, the displacement amount of the optical displacement means 9 detected by the detection means 10 is input to the control means.

Further, the control means 7 can change the timing of the read pulse generated by the timing generation circuit 5, and inputs the displacement amount of the optical displacement means 9 detected by the detection means 10. , The amount of displacement of the optical image on the surface of the solid-state image pickup device 2 is detected, and the timing of the reading pulse is changed correspondingly.

Next, the operation will be described. FIG. 2 is a view for explaining the operation of the image pickup apparatus according to the first and second embodiments of the invention. In FIG. 2, c is a solid-state image sensor, and a and b are pixels, where a is a defective pixel. An optical image formed on the solid-state image sensor 2 is
When the solid-state imaging device 2 is displaced in the horizontal pixel direction by the optical displacement means 9, it is assumed that a portion having an optical image is moved from a to b in FIG. At this time, if the timing of the read pulse for reading an electric signal from the solid-state image sensor 2 is changed from A to B, the same portion of the optical image that should originally be formed on the defective pixel a is formed on the normal pixel b. Imaged and converted to electrical signals.

Here, the optical displacement means 9 is, for example, as shown in FIG.
4, the movable lens 25 refracts incident light at an arbitrary angle in FIG.
The movable lens is formed by integrating a plurality of lenses that transmit incident light, and is movable at an arbitrary angle to refract incident light.

As described above, for example, the optical displacement means 9 operates so that the optical image reciprocates between the pixel a and the pixel b in FIG. 2, and the timing of the read pulse from A to B is adjusted accordingly. If the timing generating circuit 5 generates a read pulse so as to vary between the two, even if there is some defect in the pixel a, the occurrence of fixed pattern noise due to the pixel a is reduced by interpolating at the pixel b. be able to.

Example 3. An embodiment of the invention of claim 2 will be described below with reference to the drawings. FIG. 5 is a block diagram showing the arrangement of an image pickup apparatus according to an embodiment of the present invention. In FIG. 5, light from a subject passes through a lens 1 and a solid-state image sensor 2 having pixels in horizontal and vertical directions.
Is imaged on the surface of. The optical image of the subject formed on the surface of the solid-state image sensor 2 is converted into an electric signal. on the other hand,
When the read pulse generated by the timing generation circuit 5 is amplified by the clock driver 6 and input to the solid-state image sensor 2, an electric signal is read from the solid-state image sensor 2 and amplified by the amplifying means 3. The signal is converted into a video signal by the signal processing circuit 4 and output.

Displacement means 12 is mechanically connected to the solid-state image pickup device 2, and the displacement means 12 is driven by the drive means 1.
The solid-state image pickup device 2 can be displaced in the horizontal pixel direction and the vertical pixel direction by the drive signal output by 1, and an optical image formed on the surface of the solid-state image pickup device 2 relatively,
It is displaced in the horizontal pixel direction and the vertical pixel direction. Further, by detecting the displacement amount of the displacement unit 12 by the detection unit 13, it is possible to relatively detect the displacement amount of the optical image on the surface of the solid-state imaging device 2.

The displacement means 12 is controlled by the control means 7 outputting a control signal to the drive means 11, while the displacement amount of the displacement means 12 detected by the detection means 13 is transmitted to the control means. Is entered.

Further, the control means 7 can change the timing of the read pulse generated by the timing generation circuit 5, and inputs the displacement amount of the displacement means 12 detected by the detection means 13 for optical The amount of displacement of the image on the surface of the solid-state image pickup device 2 is detected, and the timing of the reading pulse is changed correspondingly.

Next, the operation will be described. FIG. 2 is a diagram for explaining the operation of the image pickup apparatus according to the first and second embodiments of the present invention. In FIG. 2, c is a solid-state image sensor, and a and b are pixels, where a is a defective pixel. When the displacement means 12 displaces the solid-state image sensor 2 in the horizontal pixel direction with respect to the optical image formed on the solid-state image sensor 2, the optical image relatively moves from a to b in FIG. Suppose At this time, if the timing of the read pulse for reading an electric signal from the solid-state image pickup device 2 is changed from A to B, the optical image originally formed on the defective pixel a is formed on the normal pixel b, It is converted into an electric signal.

Here, the displacing means 12 has a structure as shown in FIG. 6, and 12 in FIG. 6 has a shape that changes in accordance with the applied potential, such as a piezoelectric element, or a stepping motor. The displacement means that displaces in accordance with the input electric signal, such as the one in which the rotation amount displaces in response to the input pulse as described above. The displacing means 12 is mechanically connected to the solid-state image sensor 2, and is adapted to displace the solid-state image sensor 2 in arbitrary horizontal pixel directions and vertical pixel directions in response to an input drive pulse. There is.

As described above, for example, the displacement means 12 is arranged so that the optical image reciprocates between the pixel a and the pixel b in FIG.
If the timing generating circuit 5 generates a read pulse so that the read pulse varies between the timings A to B in accordance with that, even if there is some defect in the pixel a, the pixel b will have a defect. By interpolating, the pixel a
It is possible to reduce the occurrence of fixed pattern noise due to.

Example 4. An embodiment of the invention of claim 3 will be described below with reference to the drawings. FIG. 7 shows claims 3 and 6.
FIG. 6 is a diagram for explaining the operation of the image pickup apparatus according to the embodiment of the present invention. In FIG. 7, a is a vertical synchronization pulse for synchronizing the solid-state image sensor in the vertical direction, b is a drive signal input to the drive means 8 for driving the optical displacement means 9, and c is the solid-state image sensor. It is the figure which showed the horizontal 2 pixel arrangement.

Next, the operation will be described. When the drive pulse b is input to the drive means 8, the drive means 8 drives the optical displacement means 9 to form an optical image formed on the surface of the solid-state image sensor 2 in the horizontal pixel direction or the vertical pixel direction. The displacement in the direction is similar to that of the image pickup apparatus according to the first embodiment.

For example, in FIG. 1, the optical displacement means 9
In the case where the optical image is displaced in the horizontal pixel direction of the solid-state image pickup element 2 by means of FIG.
A portion having an optical image is formed on the pixel (1) of c,
At the high level (2), the same portion of the optical image is formed on the pixel (2) of FIG. 7c. As shown in FIG. 7, if the drive signal b is input to the optical displacement means 9 so as to switch between the low level and the high level for each field, the part where the optical image exists is located between the pixel (1) and the pixel (2). It is displaced so that it reciprocates in two fields.

If the pixel (1) is a defective pixel, the portions having the optical image are imaged alternately on the pixel (1) and the pixel (2) in each field as described above. As described in 1, the electric power is read from the pixel (1) when a portion having an optical image is formed on the pixel (1) by the read pulse output from the timing generation circuit 5, and the pixel (1) is read. If an electric signal is read from the pixel (2) when a portion having an optical image is formed in 2), the image by the defective pixel (1) is interpolated by the normal pixel (2), and the fixed pattern noise is It is reduced to 1/2.

In the fourth embodiment, the optical displacement means 9 is used to displace the optical image in the horizontal pixel direction. However, displacement in the vertical pixel direction can also be realized in the same manner.

Example 5. An embodiment of the invention of claim 4 will be described below with reference to the drawings. FIG. 8 shows claims 4 and 8.
FIG. 6 is a diagram for explaining the operation of the image pickup apparatus according to the embodiment of the present invention. In FIG. 8, a is a vertical synchronization pulse for synchronizing the solid-state image sensor in the vertical direction, b is a drive signal input to the drive unit 8 for driving the optical displacement unit 9, and c is the solid-state image sensor 2. FIG. 3 is a diagram showing a pixel array in the horizontal or vertical direction of FIG.

Next, the operation will be described. When the drive signal b is input to the drive means 8, the drive means 8 drives the optical displacement means 9 so that the displacement amount is determined according to the potential of the drive signal b, and the solid-state imaging device 2 The optical image formed on the surface of is displaced in the horizontal pixel direction or the vertical pixel direction, as in the image pickup apparatus of the first embodiment.

In FIG. 1, for example, when the optical image is displaced in the horizontal pixel direction of the solid-state image pickup device 2 by the optical displacement means 9, the drive signal b is level (1), as shown in FIG.
The level (2), the level (3), and the level (4) vary in amplitude in a staircase manner for each field. When the drive signal b is at level (1), a portion having an optical image is imaged on the pixel (1) in FIG. 8c, and when at level (2), FIG.
The same portion of the optical image is formed on the pixel (2) of. Similarly, at the level (3), the same portion of the optical image is formed on the pixel (3) in FIG. 8c and at the level (4) on the pixel (4) in FIG. 8c. As shown in FIG. 8, the drive signal b is changed from level (1) to level (4) and from level (4) to level (1) for each field. If the input signal is input to, the portion having the optical image is displaced so as to reciprocate between the pixel (1) and the pixel (4).

If pixel (1) is a defective pixel and pixel (2), pixel (3), and pixel (4) are normal pixels, as described above, the portion where the optical image is present in each field is Since the image is formed while continuously moving on the pixel between the pixel (1) and the pixel (4), as described in the first embodiment, the read pulse output from the timing generation circuit 5 causes
An electric signal is read from the pixel (1) when a portion having an optical image is formed on the pixel (1), and a pixel (2) is formed when a portion having an optical image is formed on the pixel (2). When an electric signal is read out from a pixel in which a portion having an optical image is formed, such as an electric signal is read out from (1), a defective pixel (1) produces an image with normal pixels (2) and (3). ), (4)
And the fixed pattern noise in a certain part is reduced to 1/4.

As described above, in the fifth embodiment, it was shown that the optical image displaced by the optical displacement means 9 moves between four pixels, but the number of pixels moved is four.
It is not limited to one.

In the fifth embodiment, the optical displacement means 9 is used to displace the optical image in the horizontal pixel direction. However, the displacement in the vertical pixel direction can be similarly realized.

Example 6. An embodiment of the invention of claim 5 will be described below with reference to the drawings. FIG. 9 shows claims 5 and 8.
FIG. 6 is a diagram for explaining the operation of the image pickup apparatus according to the embodiment of the present invention. In FIG. 9, a is a vertical synchronizing pulse for synchronizing the solid-state image sensor in the vertical direction, and b is a displacement means 1.
A drive signal input to the drive means 8 for driving
FIG. 3C is a diagram showing a pixel array in the horizontal direction of the solid-state image sensor 2.

In FIG. 1, for example, when the optical image is displaced in the horizontal pixel direction of the solid-state image pickup device 2 by the optical displacement means 9, the drive signal b has an amplitude from level (1) to level 1 as shown in FIG. In (4), the triangular waveform has a period of 6 fields. The drive signal b has a level (1), a level (2), a level (3), and a level (4), and its amplitude continuously changes for each field. When the drive signal b is at level (1), a portion of the optical image is formed on the pixel (1) in FIG. 9c, and when at level (2), the optical image is formed on the pixel (2) in FIG. 9c. The same part of is imaged. Similarly, at the level (3), the same part of the optical image is formed on the pixel (3) in FIG. 9c and at the level (4) on the pixel (4) in FIG. 9c. As shown in FIG. 9, the drive signal b is changed from level (1) to level (4) and level (4) for each field.
If the signal is input to the optical displacement means 9 so as to continuously change the level from the level (1) to the level (1), a portion of the optical image reciprocates between the pixel (1) and the pixel (4). Displace as you do.

If pixel (1) is a defective pixel and pixel (2), pixel (3), and pixel (4) are normal pixels, as described above, the portion where the optical image is present in each field is Since an image is formed while moving on the pixel between the pixel (1) and the pixel (4), the read pulse output from the timing generating circuit 5 causes the pixel (1) to be optically reflected as described in the first embodiment. An electric signal is read from the pixel (1) when a portion with an image is formed, and an electric signal is read from the pixel (2) when a portion with an optical image is formed on the pixel (2). When an electric signal is read from a pixel on which a portion of an optical image is formed, the defective pixel (1) produces an image with normal pixels (2), (3), (4).
And the fixed pattern noise in a certain part is reduced to 1/4.

As described above, in the fifth embodiment, it has been shown that the optical image displaced by the optical displacement means 9 moves between four pixels, but the number of moved pixels is four.
It is not limited to one.

In the sixth embodiment, the optical displacement means 9 is used to displace the optical image in the horizontal pixel direction. However, displacement in the vertical pixel direction can also be realized in the same manner.

Example 7. An embodiment of the invention of claim 6 will be described below with reference to the drawings. FIG. 7 shows claims 3 and 6.
FIG. 6 is a diagram for explaining the operation of the image pickup apparatus according to the embodiment of the present invention. In FIG. 7, a is a vertical synchronizing pulse for synchronizing the solid-state imaging device in the vertical direction, and b is the displacement means 1.
2 is a diagram showing a driving signal input to the driving means 11 for driving the pixel 2, and c is a pixel array in the horizontal direction of the solid-state image sensor 2. FIG.

Next, the operation will be described. When the driving pulse b is input to the driving means 11, the displacing means 12 is driven by the driving means 11, and the solid-state image sensor 2 is horizontally moved with respect to the optical image formed on the surface of the solid-state image sensor 2. The displacement in the pixel direction or the vertical pixel direction is the same as in the image pickup apparatus of the second embodiment.

For example, in the case of displacing the solid-state image pickup device 2 in the horizontal pixel direction with respect to the optical image by the displacing means 12 in FIG. 5, when the drive signal is at the low level (1), FIG.
It is assumed that a part of the optical image is formed on the pixel (1) of FIG. 7A and the same part of the optical image is formed on the pixel (2) of FIG. 7C at the high level (2). As shown in FIG. 7, if the drive signal b is input to the displacement means 12 so as to switch between the low level and the high level for each field, a portion having an optical image is relatively located between the pixel (1) and the pixel (2). It is displaced so as to reciprocate in two fields.

If the pixel (1) is a defective pixel, the portions having the optical image are imaged alternately on the pixel (1) and the pixel (2) in each field as described above. As described in 1, the electric power is read from the pixel (1) when a portion having an optical image is formed on the pixel (1) by the read pulse output from the timing generation circuit 5, and the pixel (1) is read. If an electric signal is read from the pixel (2) when a portion having an optical image is formed in 2), the image by the defective pixel (1) is interpolated by the normal pixel (2), and the fixed pattern noise is It is reduced to 1/2.

In the seventh embodiment, the displacement means 12
Although it has been shown that the solid-state image pickup element is displaced in the horizontal pixel direction with respect to the optical image, it can be similarly realized when it is displaced in the vertical pixel direction.

Example 8. An embodiment of the invention of claim 7 will be described below with reference to the drawings. FIG. 8 shows claims 4 and 7.
FIG. 6 is a diagram for explaining the operation of the image pickup apparatus according to the embodiment of the present invention. In FIG. 8, a is a vertical synchronizing pulse for synchronizing the solid-state image sensor in the vertical direction, and b is a displacement means 1.
2 is a diagram showing a drive signal input to the drive unit 11 for driving the pixel 2, and c is a pixel array in the horizontal or vertical direction of the solid-state image sensor 2. FIG.

Next, the operation will be described. When the drive signal b is input to the drive unit 11, the displacement unit 12 is driven by the drive unit 11 so that the displacement amount is determined according to the potential of the drive signal b, and the surface of the solid-state image sensor 2 is displayed. The displacement of the solid-state image sensor 2 in the horizontal pixel direction or the vertical pixel direction with respect to the formed optical image is the same as in the image pickup apparatus of the second embodiment.

In FIG. 5, when the solid-state image pickup device 2 is displaced in the horizontal pixel direction with respect to the optical image by the displacement means 12, for example, the drive signal b is level (1) or level (2) as shown in FIG. ), Level (3), level (4)
Then, the amplitude changes stepwise in each field. When the drive signal b is at level (1), a portion of the optical image is formed on the pixel (1) in FIG. 8c, and when at level (2), the optical image is formed on the pixel (2) in FIG. 8c. The same part of is imaged. Similarly, at the level (3), the same portion of the optical image is formed on the pixel (3) in FIG. 8c and at the level (4) on the pixel (4) in FIG. 8c. As shown in FIG. 8, the displacing means 12 changes the drive signal b for each field step by step, such as from level (1) to level (4) and from level (4) to level (1).
If you input it to the pixel (1)
And the pixel (4) are moved back and forth.

If pixel (1) is a defective pixel and pixel (2), pixel (3), and pixel (4) are normal pixels, as described above, the portion having the optical image in each field is Since an image is formed while moving on a pixel between the pixel (1) and the pixel (4), the read pulse output from the timing generation circuit 5 causes the optical signal to be formed on the pixel (1) as described in the second embodiment. An electric signal is read from the pixel (1) when a portion with an image is formed, and an electric signal is read from the pixel (2) when a portion with an optical image is formed on the pixel (2). When an electric signal is read from a pixel on which a portion of an optical image is formed, the defective pixel (1) produces an image with normal pixels (2), (3), (4).
And the fixed pattern noise in a certain part is reduced to 1/4.

As described above, in the eighth embodiment, it is shown that the optical image relatively moves between four pixels by the solid-state image pickup device 2 displaced by the displacement means 12, but it is moved. The number of pixels to be displayed is not limited to four.

In the eighth embodiment, the displacement means 12
Although it has been shown that the solid-state image sensor 2 is displaced in the horizontal pixel direction with respect to the optical image, it can be similarly realized in the case of displacing it in the vertical pixel direction.

Example 9. An embodiment of the invention of claim 8 will be described below with reference to the drawings. FIG. 9 shows claims 5 and 8.
FIG. 6 is a diagram for explaining the operation of the image pickup apparatus according to the embodiment of the present invention. In FIG. 9, a is a vertical synchronizing pulse for synchronizing the solid-state image sensor in the vertical direction, and b is a displacement means 1.
2 is a diagram showing a drive signal input to the drive means 11 for driving the pixel 2, and c is a pixel array in the horizontal or vertical direction of the solid-state image sensor.

Next, the operation will be described. When the drive signal b is input to the drive unit 11, the displacement unit 12 is driven by the drive unit 11 so that the displacement amount is determined according to the potential of the drive signal b, and the surface of the solid-state image sensor 2 is displayed. The displacement of the solid-state image sensor 2 in the horizontal pixel direction or the vertical pixel direction with respect to the formed optical image is the same as in the image pickup apparatus of the second embodiment.

In FIG. 5, for example, when the displacement means 12 displaces the solid-state image pickup device 2 in the horizontal pixel direction with respect to the optical image, the drive signal b has an amplitude from level (1) to level (1) as shown in FIG. In (4), it has a triangular wave shape with a period of 6 fields. The amplitude continuously changes for each field, such as level (1), level (2), level (3), and level (4). When the drive signal b is at level (1), a portion of the optical image is formed on the pixel (1) in FIG. 9c, and when at level (2), the optical image is formed on the pixel (2) in FIG. 9c. The same part of is imaged. Similarly, at the level (3), the same part of the optical image is formed on the pixel (3) in FIG. 9c and at the level (4) on the pixel (4) in FIG. 9c. As shown in FIG. 9, the drive signal b is supplied to the displacement means 12 so as to continuously change the level from the level (1) to the level (4) and from the level (4) to the level (1) for each field. If input, the portion having the optical image is displaced so as to reciprocate between the pixel (1) and the pixel (4).

If pixel (1) is a defective pixel and pixel (2), pixel (3), and pixel (4) are normal pixels, as described above, the portion having the optical image in each field is Since an image is formed while moving on a pixel between the pixel (1) and the pixel (4), the read pulse output from the timing generation circuit 5 causes the optical signal to be formed on the pixel (1) as described in the second embodiment. An electric signal is read from the pixel (1) when a portion with an image is formed, and an electric signal is read from the pixel (2) when a portion with an optical image is formed on the pixel (2). When an electric signal is read from a pixel on which a portion of an optical image is formed, the defective pixel (1) produces an image with normal pixels (2), (3), (4).
And the fixed pattern noise in a certain part is reduced to 1/4.

As described above, in the ninth embodiment, it is shown that the optical image relatively moves between the four pixels by the solid-state image pickup device 2 displaced by the displacement means 12. The number of pixels to be displayed is not limited to four.

In the ninth embodiment, the displacement means 12
Although it has been shown that the solid-state image sensor 2 is displaced in the horizontal pixel direction with respect to the optical image, it can be similarly realized in the case of displacing it in the vertical pixel direction.

Example 10. An embodiment of the invention of claim 9 will be described below with reference to the drawings. FIG. 10 is a block diagram showing the arrangement of an image pickup apparatus according to an embodiment of the present invention. In FIG. 10, 2 is a solid-state image sensor for converting an optical image into an electric signal, 5 is a timing generation circuit for generating a read pulse for reading the electric signal from the solid-state image sensor 2, and 6 is a timing generation circuit. It is a clock driver that amplifies the read pulse and outputs it to the solid-state imaging device 2. The electric signal read from the solid-state image sensor 2 by the timing pulse is amplified by the amplification means 3 and input to the signal processing circuit 4 to be converted into a video signal. The video signal output from the signal processing circuit 4 is integrated by the integrating means 20 and output.

Next, the operation will be described. An electric signal read from the solid-state image pickup device 2 is amplified by the reading pulse generated by the timing generation circuit 5 by the amplification means 3 and processed into a video signal by the signal processing circuit 4. The video signals output from the signal processing circuit 4 are integrated by the integrating means 20.

A video signal which is integrated and averaged for several frames by the integrating means 20 is output. So-called random noise, which is noise that temporally changes in a certain pixel when a still image is captured, can be reduced by the integrating means 20. For example, in the image pickup apparatus according to the first exemplary embodiment, fixed pattern noise caused by a defective pixel is reduced by displacing it to a plurality of pixels. That is, since the fixed pattern noise is converted into the random noise, the fixed pattern noise converted into the random noise by the integrating means 20 can be reduced.

[0085]

As described above, according to the first and second aspects of the present invention, fixed pattern noise due to pixel defects, image unevenness, etc. can be reduced, and the defect which has been a problem in the conventional image defect correction circuit. Even in an image with a sharp change in the vicinity of a pixel, the correction error is small, and a storage device for storing the information of the defective pixel is unnecessary, and even if a new pixel defect or uneven sensitivity occurs due to a change over time, the correction is performed. The effect is that it is possible to do.

As described above, according to the inventions of claims 3 to 8, there is an effect that it is possible to reduce fixed pattern noise due to pixel defects or image unevenness.

As described above, according to the invention of claim 9,
There is an effect that the S / N is further improved by integrating and averaging the fixed pattern noises reduced by the image pickup device according to the first or second aspect.

[Brief description of drawings]

FIG. 1 is a block diagram showing a configuration of an image pickup apparatus according to an embodiment of the present invention.

FIG. 2 is a diagram for explaining the operation of the image pickup apparatus according to an embodiment of the invention of claims 1 and 2.

FIG. 3 is a diagram showing a configuration of an optical displacement means of an image pickup apparatus according to an embodiment of the invention of claim 1;

FIG. 4 is a diagram showing a configuration of an optical displacement means of an image pickup apparatus according to another embodiment of the invention of claim 1;

FIG. 5 is a block diagram showing a configuration of an image pickup apparatus according to an embodiment of the invention of claim 2;

FIG. 6 is a diagram showing a configuration of displacement means of an image pickup apparatus according to an embodiment of the invention of claim 2;

FIG. 7 is a diagram for explaining the operation of the image pickup device according to an embodiment of the inventions of claims 3 and 6;

FIG. 8 is a diagram for explaining the operation of the image pickup apparatus according to an embodiment of the inventions of claims 4 and 7;

FIG. 9 is a diagram for explaining the operation of the image pickup apparatus according to an embodiment of the inventions of claims 5 and 8;

FIG. 10 is a block diagram showing a configuration of an image pickup apparatus according to an embodiment of the invention of claim 9;

FIG. 11 is a diagram showing the principle of a conventional image defect correction device of an image pickup device.

FIG. 12 is a block diagram showing a configuration of a conventional imaging device.

FIG. 13 is a block diagram showing a configuration of an image defect correction device of a conventional image pickup device.

FIG. 14 is a diagram for explaining the operation of a conventional image defect correction device of an image pickup device.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 lens 2 solid-state image sensor 3 amplification means 4 signal processing circuit 5 timing generation circuit 6 clock driver 7 control means 8 drive means 9 optical displacement means 10 detection means 11 drive means 12 displacement means 13 detection means 20 integration means 21 variable prism 22 Transparent plate 23 Stretchable substance 24 Liquid 25 Movable lens 30 Memory device 31 Image defect correction circuit 32 Clamp circuit 33 Delay circuit 34 Delay circuit 35 Addition circuit 36 Switch 37 Switch 38 Defect correction signal generation circuit 39 Addition circuit

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[Procedure amendment]

[Submission date] September 2, 1993

[Procedure Amendment 1]

[Document name to be amended] Statement

[Name of item to be corrected] Claim 3

[Correction method] Change

[Correction content]

[Procedure Amendment 2]

[Document name to be amended] Statement

[Name of item to be corrected] Claim 4

[Correction method] Change

[Correction content]

[Procedure 3]

[Document name to be amended] Statement

[Name of item to be corrected] Claim 5

[Correction method] Change

[Correction content]

[Procedure amendment 4]

[Document name to be amended] Statement

[Name of item to be corrected] Claim 6

[Correction method] Change

[Correction content]

[Procedure Amendment 5]

[Document name to be amended] Statement

[Name of item to be corrected] Claim 7

[Correction method] Change

[Correction content]

[Procedure correction 6]

[Document name to be amended] Statement

[Name of item to be corrected] Claim 8

[Correction method] Change

[Correction content]

[Procedure Amendment 7]

[Document name to be amended] Statement

[Name of item to be corrected] 0003

[Correction method] Change

[Correction content]

As a correction method, there are a method of interpolating with adjacent pixels and a method of correcting a white defect by adding a pseudo black point signal. There are various methods for interpolating with adjacent pixels as shown in FIG. The figure shows the pixel array of the solid-state imaging device, ○ is a normal pixel, × is a defective pixel,
● is a pixel used to interpolate a defective pixel. Of these, the method shown in FIG. 11a requires the addition using the delay elements for two pixels and is the simplest configuration. Doing interpolation between scanning lines shown in b 2 scan line between content of delay elements are required, when the interpolation between fields shown in c 2 field of the delay elements are required, between horizontal pixels shown in d When interpolation and interpolation between fields are performed, delay elements for two pixels and two fields are required and the circuit scale increases, but the accuracy of interpolation approaches actually.

[Procedure Amendment 8]

[Document name to be amended] Statement

[Correction target item name] 0007

[Correction method] Change

[Correction content]

It is now assumed that the nth signal is a defective pixel signal, as shown in FIG. 14b. The defect correction signal corresponding to the output of the defect correction signal generation circuit 38 is shown in FIG. 14a. The output of the delay circuit 34 shown in output and Figure 14 d of the clamp circuit 32 shown in FIG. 14b is added by the adder circuit 35. Here, the adder circuit 3
5 outputs a value obtained by multiplying the sum of two inputs by 1/2. By the way, the input terminal 36a of the switch 36
Since the inverted signal of the defect correction signal shown in FIG. 14a is input, its output becomes the signal shown in FIG. 14e. Further, since the defect correction signal shown in FIG. 14A is input to the input terminal 37a of the switch 37, the output thereof becomes the signal shown in FIG. 14F. The adder circuit 39 outputs the output signal of the delay circuit 33 shown in FIG. 14e when the defect correction signal a is at the low level, and FIG. 14 when the defect correction signal a is at the high level.
The output signal of the adder circuit 35 shown in f is output. By the above operation, as shown in FIG. 14g, the signal from the nth defective pixel is replaced with ½ of the sum of the signal from the n−1th pixel and the signal from the n + 1th pixel.

[Procedure Amendment 9]

[Document name to be amended] Statement

[Correction target item name] 0020

[Correction method] Change

[Correction content]

In the image pickup device according to the second aspect of the present invention, the displacing means displaces the solid-state image pickup element in the horizontal pixel direction and the vertical pixel direction with respect to the optical image formed on the solid-state image pickup element, and by the control means. , by varying the readout pulses from solid-state image capturing device reads the electric signal in accordance with the displacement amount of the solid-state image pickup device, to reduce the fixed pattern noise caused by the defective pixel and the sensitivity unevenness of the solid image pickup device.

[Procedure Amendment 10]

[Document name to be amended] Statement

[Correction target item name] 0021

[Correction method] Change

[Correction content]

In the image pickup device according to the third aspect of the present invention, when the optical image is displaced by the optical means in the horizontal pixel direction and the vertical pixel direction of the solid-state image pickup element, the optical displacement means is driven. The drive waveform is a pulse having two fields as one cycle, and the vibration amplitude of the optical image displaced by the optical displacement means is an integer multiple of the horizontal and vertical pixel array pitches of the solid-state image sensor . By making the width equal to the width, fixed pattern noise caused by defective pixels of the solid-state imaging device, uneven sensitivity, and the like is reduced.

[Procedure Amendment 11]

[Document name to be amended] Statement

[Name of item to be corrected] 0022

[Correction method] Change

[Correction content]

In the image pickup device according to the invention of claim 4, when the optical image is displaced in the horizontal pixel direction and the vertical pixel direction of the solid-state image pickup element, the optical displacement means is driven. The drive waveform has a stepwise wave shape in which one field is one step with a plurality of fields as one cycle, and one step of the vibration amplitude of the optical image displaced by the optical displacement means is a horizontal direction and a vertical direction of the solid-state imaging device. Since the width is equal to an integer multiple of the pixel array pitch, the fixed pattern noise caused by defective pixels of the solid-state imaging device, uneven sensitivity, or the like is reduced.

[Procedure Amendment 12]

[Document name to be amended] Statement

[Name of item to be corrected] 0023

[Correction method] Change

[Correction content]

In the image pickup device according to the invention of claim 5, when the optical image is displaced by the optical displacement means in the horizontal pixel direction and the vertical pixel direction of the solid-state image pickup element, the optical displacement means is driven. Has a triangular waveform having a plurality of fields as one cycle, and the vibration amplitude of the optical image displaced by the optical displacement means is 1/2.
An integer multiple of the pixel array pitch equal to the number of fields for the period
Since the width of the solid-state image sensor is equal to that of the solid-state image sensor, fixed pattern noise caused by defective pixels or uneven sensitivity of the solid-state image sensor is reduced.

[Procedure Amendment 13]

[Document name to be amended] Statement

[Name of item to be corrected] 0024

[Correction method] Change

[Correction content]

In the image pickup device according to the invention of claim 6, when displacing the solid-state image pickup device in the horizontal pixel direction and the vertical pixel direction with respect to the optical image by the displacement means, a drive for driving the displacement means. The waveform is a pulse having two fields as one cycle, and the vibration amplitude of the solid-state image sensor displaced by the displacement means is an integer multiple of the horizontal and vertical pixel array pitches of the solid-state image sensor. The fixed pattern noise caused by defective pixels, sensitivity unevenness, etc. of the solid-state image pickup device is reduced by the same.

[Procedure Amendment 14]

[Document name to be amended] Statement

[Name of item to be corrected] 0025

[Correction method] Change

[Correction content]

In the image pickup device according to the invention of claim 7, when the displacement means displaces the solid-state image pickup device in the horizontal pixel direction and the vertical pixel direction with respect to the optical image, a drive for driving the displacement means. The waveform has a stepwise wave shape in which one field is one step in a plurality of fields, and one step of the vibration amplitude of the solid-state image sensor displaced by the displacement means is a pixel in the horizontal and vertical directions of the solid-state image sensor. By making the width equal to an integer multiple of the array pitch , fixed pattern noise caused by defective pixels, sensitivity unevenness, etc. of the solid-state imaging device is reduced.

[Procedure Amendment 15]

[Document name to be amended] Statement

[Correction target item name] 0026

[Correction method] Change

[Correction content]

In the image pickup apparatus according to the invention of claim 8, when the displacement means displaces the solid-state image pickup element in the horizontal pixel direction and the vertical pixel direction with respect to the optical image, a drive for driving the displacement means. The waveform has a triangular wave shape having a plurality of fields as one cycle, and the vibration amplitude of the solid-state imaging device displaced by the displacement means has a width that is an integral multiple of the pixel array pitch equal to the number of fields for 1/2 cycle. By making them equal, fixed pattern noise caused by defective pixels of the solid-state imaging device, uneven sensitivity, and the like is reduced.

[Procedure Amendment 16]

[Document name to be amended] Statement

[Name of item to be corrected] 0032

[Correction method] Change

[Correction content]

Next, the operation will be described. FIG. 2 is a diagram for explaining the operation of the image pickup apparatus according to the first and second embodiments of the present invention. In FIG. 2, c is a solid-state image sensor, a and b are pixels , d is a read pulse, and a is a defective pixel. When the optical image formed on the solid-state image sensor 2 is displaced in the horizontal pixel direction of the solid-state image sensor 2 by the optical displacement means 9, in FIG. Suppose you have moved. At this time, if the timing of the read pulse d for reading an electric signal from the solid-state image pickup device 2 is changed from A to B, the same portion of the optical image that should be originally formed on the defective pixel a is on the normal pixel b. It forms an image and is converted into an electrical signal.

[Procedure Amendment 17]

[Document name to be amended] Statement

[Correction target item name] 0039

[Correction method] Change

[Correction content]

Next, the operation will be described. FIG. 2 is a view for explaining the operation of the image pickup apparatus according to the first and second embodiments of the invention. In FIG. 2, c is a and b in the pixel in the solid-state image pickup element, d is Ri Oh <br/> a read pulse, where the a is a defective pixel. When the optical image formed on the solid-state image sensor 2 is displaced in the horizontal pixel direction of the solid-state image sensor 2 by the optical displacement means 9, FIG.
In, it is assumed that a portion having an optical image moves from a to b. At this time, if the timing of the read pulse d for reading an electric signal from the solid-state image pickup device 2 is changed from A to B, the same portion of the optical image that should be originally formed on the defective pixel a is on the normal pixel b. It forms an image and is converted into an electrical signal.

[Procedure 18]

[Document name to be amended] Statement

[Correction target item name] 0046

[Correction method] Change

[Correction content]

Next, the operation will be described. FIG. 2 is a diagram for explaining the operation of the image pickup apparatus according to the first and second embodiments of the present invention. In FIG. 2, c is a solid-state image sensor, a and b are pixels , d is a read pulse, and a is a defective pixel. When the displacement means 12 displaces the solid-state image sensor 2 in the horizontal pixel direction with respect to the optical image formed on the solid-state image sensor 2, the optical image relatively moves from a to b in FIG. Suppose At this time, if the timing of the read pulse d for reading an electric signal from the solid-state image pickup device 2 is changed from A to B, the optical image originally formed on the defective pixel a is formed on the normal pixel b. , Converted to electrical signals.

[Procedure Amendment 19]

[Document name to be amended] Statement

[Correction target item name] 0056

[Correction method] Change

[Correction content]

[0056] In FIG. 1, for example, the case of displacing the optical image on the horizontal pixel direction of the solid imaging element 2 by the optical displacement means 9, the driving signal b is level as shown in FIG. 8 (1),
The level (2), the level (3), and the level (4) vary in amplitude in a staircase manner for each field. When the drive signal b is at level (1), a portion having an optical image is imaged on the pixel (1) in FIG. 8c, and when at level (2), FIG.
The same portion of the optical image is formed on the pixel (2) of. Similarly, at the level (3), the same portion of the optical image is formed on the pixel (3) in FIG. 8c and at the level (4) on the pixel (4) in FIG. 8c. As shown in FIG. 8, the drive signal b is changed from level (1) to level (4) and from level (4) to level (1) for each field. If the input signal is input to, the portion having the optical image is displaced so as to reciprocate between the pixel (1) and the pixel (4).

[Procedure amendment 20]

[Document name to be amended] Statement

[Correction target item name] 0062

[Correction method] Change

[Correction content]

If pixel (1) is a defective pixel and pixel (2), pixel (3), and pixel (4) are normal pixels, as described above, the portion where the optical image is present in each field is since imaged while moving on pixels between pixels (1) from the pixel (4), by the pulse reading outputs of said timing generating circuit 5 as described in example 1, the optical to the pixel (1) An electric signal is read from the pixel (1) when a portion with an image is formed, and an electric signal is read from the pixel (2) when a portion with an optical image is formed on the pixel (2). When an electric signal is read from a pixel on which a portion of an optical image is formed, the defective pixel (1) produces an image with normal pixels (2), (3), (4).
And the fixed pattern noise in a certain part is reduced to 1/4.

[Procedure correction 21]

[Document name to be amended] Statement

[Correction target item name] 0066

[Correction method] Change

[Correction content]

Next, the operation will be described. When the driving pulse b is input to the driving means 11, the displacing means 12 is driven by the driving means 11, and the solid-state image sensor 2 is horizontally moved with respect to the optical image formed on the surface of the solid-state image sensor 2. The displacement in the pixel direction or the vertical pixel direction is the same as in the image pickup apparatus of the third embodiment.

[Procedure correction 22]

[Document name to be amended] Statement

[Correction target item name] 0068

[Correction method] Change

[Correction content]

If the pixel (1) is a defective pixel, the portions having the optical image are imaged alternately on the pixel (1) and the pixel (2) in each field as described above.
As described in 3 , the read pulse output from the timing generation circuit 5 reads an electric signal from the pixel (1) when a portion having an optical image is formed on the pixel (1), and the pixel ( If an electric signal is read from the pixel (2) when a portion having an optical image is formed in 2), the image by the defective pixel (1) is interpolated by the normal pixel (2), and the fixed pattern noise is It is reduced to 1/2.

[Procedure amendment 23]

[Document name to be amended] Statement

[Correction target item name] 0071

[Correction method] Change

[Correction content]

Next, the operation will be described. When the drive signal b is input to the drive unit 11, the displacement unit 12 is driven by the drive unit 11 so that the displacement amount is determined according to the potential of the drive signal b, and the surface of the solid-state image sensor 2 is displayed. The displacement of the solid-state image sensor 2 in the horizontal pixel direction or the vertical pixel direction with respect to the formed optical image is the same as in the image pickup apparatus of the third embodiment.

[Procedure correction 24]

[Document name to be amended] Statement

[Correction target item name] 0073

[Correction method] Change

[Correction content]

If pixel (1) is a defective pixel and pixel (2), pixel (3), and pixel (4) are normal pixels, as described above, the portion having the optical image in each field is since imaged while moving on pixels between pixels (1) from the pixel (4), by the pulse reading outputs of said timing generating circuit 5 as described in example 3, the optical to the pixel (1) An electric signal is read from the pixel (1) when a portion with an image is formed, and an electric signal is read from the pixel (2) when a portion with an optical image is formed on the pixel (2). When an electric signal is read from a pixel on which a portion of an optical image is formed, the defective pixel (1) produces an image with normal pixels (2), (3), (4).
And the fixed pattern noise in a certain part is reduced to 1/4.

[Procedure correction 25]

[Document name to be amended] Statement

[Correction target item name] 0077

[Correction method] Change

[Correction content]

Next, the operation will be described. When the drive signal b is input to the drive unit 11, the displacement unit 12 is driven by the drive unit 11 so that the displacement amount is determined according to the potential of the drive signal b, and the surface of the solid-state image sensor 2 is displayed. The displacement of the solid-state image sensor 2 in the horizontal pixel direction or the vertical pixel direction with respect to the formed optical image is the same as in the image pickup apparatus of the third embodiment.

[Procedure Amendment 26]

[Document name to be amended] Statement

[Correction target item name] 0078

[Correction method] Change

[Correction content]

[0078] In FIG. 5, for example, with respect to the optical image by displacement means 12, when displacing the solid-state image capturing device 2 in the horizontal pixel direction, the driving signal b is the amplitude as shown in Figure 9 from the level (1) Level In (4), it has a triangular wave shape with a period of 6 fields. The amplitude continuously changes for each field, such as level (1), level (2), level (3), and level (4). When the drive signal b is at level (1), a portion of the optical image is formed on the pixel (1) in FIG. 9c, and when at level (2), the optical image is formed on the pixel (2) in FIG. 9c. The same part of is imaged. Similarly, at the level (3), the same part of the optical image is formed on the pixel (3) in FIG. 9c and at the level (4) on the pixel (4) in FIG. 9c. As shown in FIG. 9, the driving signal b is supplied to the displacement means 12 so as to continuously change the level from the level (1) to the level (4) and from the level (4) to the level (1) for each field. If input, the portion having the optical image is displaced so as to reciprocate between the pixel (1) and the pixel (4).

[Procedure Amendment 27]

[Document name to be amended] Statement

[Correction target item name] 0079

[Correction method] Change

[Correction content]

If pixel (1) is a defective pixel and pixel (2), pixel (3), and pixel (4) are normal pixels, as described above, the portion having the optical image in each field is Since an image is formed while moving on the pixel between the pixel (1) and the pixel (4), the read pulse output from the timing generation circuit 5 causes the pixel (1) to be optically reflected as described in the third embodiment. An electric signal is read from the pixel (1) when a portion with an image is formed, and an electric signal is read from the pixel (2) when a portion with an optical image is formed on the pixel (2). When an electric signal is read from a pixel on which a portion of an optical image is formed, the defective pixel (1) produces an image with normal pixels (2), (3), (4).
And the fixed pattern noise in a certain part is reduced to 1/4.

[Procedure correction 28]

[Document name to be corrected] Drawing

[Name of item to be corrected] Figure 3

[Correction method] Change

[Correction content]

[Figure 3]

[Procedure correction 29]

[Document name to be corrected] Drawing

[Name of item to be corrected] Figure 5

[Correction method] Change

[Correction content]

[Figure 5]

[Procedure amendment 30]

[Document name to be corrected] Drawing

[Name of item to be corrected] Figure 6

[Correction method] Change

[Correction content]

[Figure 6]

Claims (9)

[Claims] 1. A solid-state imaging device in which pixels are arranged in horizontal and vertical directions to convert an optical image into an electric signal, and the solid-state imaging device and an object are installed on an optical axis to form an image on the solid-state imaging device. Optical displacement means for displacing an optical image in the horizontal pixel direction and the vertical pixel direction with respect to the solid-state image sensor, means for detecting the amount of displacement of the optical image displaced by the optical displacement means, and the solid-state image sensor A timing generation circuit that generates a read pulse for further reading an electrical signal, and a read pulse generated by the timing generation circuit that corresponds to the amount of pixel-by-pixel displacement of the optical image displaced by the optical displacement means. An image pickup apparatus comprising a control means for changing timing. 2. A solid-state imaging device in which pixels are arranged in horizontal and vertical directions to convert an optical image into an electric signal, and the optical image formed on the solid-state imaging device is connected to the solid-state imaging device, Displacement means for displacing the solid-state image sensor in the horizontal pixel direction and the vertical pixel direction, means for detecting a displacement amount of the solid-state image sensor displaced by the displacement means, and a read pulse for reading an electric signal from the solid-state image sensor Of the read pulse generated by the timing generation circuit corresponding to the displacement amount of the pixel unit in the horizontal pixel direction and the vertical pixel direction of the solid-state image sensor displaced by the displacement means. An image pickup apparatus comprising a control means for changing timing. 3. A drive means for driving the optical displacement means is provided, wherein when the optical displacement means displaces the optical image in the horizontal pixel direction and the vertical pixel direction of the solid-state imaging device, the optical displacement means The drive waveform generated by the drive means for driving the displacement means is a pulse having two fields as one cycle, and the vibration amplitude of the optical image displaced by the optical displacement means is the same as that of the solid-state imaging device. 2. The pixel arrangement pitch in the horizontal direction and the pixel arrangement pitch in the vertical direction are equal to each other.
The imaging device described. 4. A drive means for driving the optical displacement means is provided, wherein when the optical displacement means displaces the optical image in the horizontal pixel direction and the vertical pixel direction of the solid-state image sensor, the optical displacement means The drive waveform generated by the drive means for driving the displacement means has a plurality of fields as one cycle.
It is characterized in that it has a stepwise wave shape in one field, and one step of the vibration amplitude of the optical image displaced by the optical displacement means is equal to the pixel array pitch in the horizontal direction and the vertical direction of the solid-state imaging device. The image pickup apparatus according to claim 1. 5. A drive means for driving the optical displacement means is provided, wherein when the optical image is displaced by the optical displacement means in the horizontal pixel direction and the vertical pixel direction of the solid-state image sensor, the optical displacement means The drive waveform generated by the drive means for driving the displacement means has a triangular wave shape having a plurality of fields as one cycle, and the vibration amplitude of the optical image displaced by the optical displacement means corresponds to ½ cycle. 2. The image pickup apparatus according to claim 1, wherein the number of pixels is equal to the number of horizontal and vertical pixel array pitches. 6. A driving means for driving the displacing means, wherein the displacing means drives the displacing means when displacing the solid-state image sensor with respect to the optical image in the horizontal pixel direction and the vertical pixel direction. In order to achieve this, the drive waveform generated by the drive means is a pulse having two fields as one cycle, and the vibration amplitude of the solid-state image sensor displaced by the displacement means is horizontal and vertical. 3. The image pickup apparatus according to claim 2, wherein the image pickup pitch is equal to the pixel array pitch. 7. A driving means for driving the displacement means, wherein the displacement means drives the displacement means when the solid-state image sensor is displaced in the horizontal pixel direction and the vertical pixel direction with respect to the optical image. In order to achieve this, the drive waveform generated by the drive means has a stepped wave shape in which one field is one step with a plurality of fields as one cycle, and one step of the vibration amplitude of the solid-state image sensor displaced by the displacement means is the solid-state image. The image pickup device according to claim 2, wherein the pixel array pitches of the image pickup element in the horizontal and vertical directions are equal to each other. 8. A drive means for driving the displacement means, wherein the displacement means drives the displacement means when the solid-state image sensor is displaced in the horizontal pixel direction and the vertical pixel direction with respect to the optical image. In order to achieve this, the drive waveform generated by the drive means is a triangular wave having a plurality of fields as one cycle, and the vibration amplitude of the solid-state image sensor displaced by the displacement means is equal to the number of fields for ½ cycle. 3. The image pickup apparatus according to claim 2, wherein the pixel array pitches are equal to the horizontal and vertical pixel array pitches. 9. An amplifying means for amplifying an electric signal read from the solid-state image pickup device by a read pulse generated by the timing generating circuit, a signal processing circuit for converting an output of the amplifying means into a video signal, The image pickup apparatus according to claim 1 or 2, further comprising: an integrating unit that integrates a video signal output from the signal processing circuit.