JPH06136526A - Sputtering target for forming ground surface of magnetic thin film and its production - Google Patents

Sputtering target for forming ground surface of magnetic thin film and its production

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Publication number
JPH06136526A
JPH06136526A JP4287410A JP28741092A JPH06136526A JP H06136526 A JPH06136526 A JP H06136526A JP 4287410 A JP4287410 A JP 4287410A JP 28741092 A JP28741092 A JP 28741092A JP H06136526 A JPH06136526 A JP H06136526A
Authority
JP
Japan
Prior art keywords
phosphorus
raw material
thin film
magnetic thin
nickel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4287410A
Other languages
Japanese (ja)
Inventor
Taku Meguro
卓 目黒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Proterial Ltd
Original Assignee
Hitachi Metals Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Metals Ltd filed Critical Hitachi Metals Ltd
Priority to JP4287410A priority Critical patent/JPH06136526A/en
Publication of JPH06136526A publication Critical patent/JPH06136526A/en
Pending legal-status Critical Current

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  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Thin Magnetic Films (AREA)
  • Powder Metallurgy (AREA)
  • Physical Vapour Deposition (AREA)
  • Magnetic Record Carriers (AREA)

Abstract

PURPOSE:To produce the sputtering target for forming the ground surface of a magnetic thin film by compounding a low phosphorus-side raw material and a high phosphorus side raw material in such a manner that nickel and phosphorus attain desired compounding ratios, then sintering these materials. CONSTITUTION:The low phosphorus-side raw material is obtd. by heating the powder of the nickel alone or >=1 kinds of the powders selected from the powders of compds. or alloys of <=25atm.% content of phosphorus in a reducing atmosphere. The high phosphorus-side raw material is obtd. by subjecting the >=1 kinds of powders selected from the compds. or alloys of >=33.3atm.% content of phosphorus to a heat treatment in the reducing atmosphere. Both raw materials are then so compounded that the nickel and the phosphorus attain the desired compsn. ratios. The raw material mixture is then sintered, by which the sputtering target for forming the ground surface of the magnetic thin film substantially consisting of the nickel and the phosphorus and having <=200ppm content of oxygen which is the impurity and >=97% density ratio is produced. The magnetic thin film having a high coercive force is stably formed by using the target.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、ハードディスクなどの
磁気記録媒体等に用いられる磁性薄膜の下地となる膜を
形成するために用いられるスパッタリングターゲットと
その製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sputtering target used for forming an underlying film of a magnetic thin film used in a magnetic recording medium such as a hard disk and a method for manufacturing the same.

【0002】[0002]

【従来の技術】コンピュータの外部記録媒体として使用
されるハードディスクなどの磁気記録媒体は、アルミニ
ウム上にニッケルとリンで構成される硬質層を設けた基
板あるいはセラミックスなどの基板の上に、磁性薄膜の
磁化容易軸を揃えることのできるクロム等の下地膜、C
o−Ni−Cr、Co−Ni−Ptなどの磁性薄膜、潤
滑層となるカーボン膜の順で積層した構造を有するもの
である。最近、特開昭63−217525号公報、ある
いはIEEE TRANSACTION ON MAGNETICS,VOL.27,No.6 NOVE
MBER 1991,P4729-4742に記載されるように基板に形成す
る下地膜として、ニッケルとリンよりなる膜(以下ニッ
ケル−リン下地膜と称する)をスパッタリングにより形
成することにより、クロムを下地膜とするよりも高品質
の磁気特性を有し、小さいビットシフト、高い解像度、
低いノイズ、およびディスク全面にわたっての高い均一
性を有する磁性薄膜が得られることがわかってきた。
2. Description of the Related Art A magnetic recording medium such as a hard disk used as an external recording medium of a computer has a magnetic thin film formed on a substrate such as a substrate provided with a hard layer made of nickel and phosphorus on aluminum or a substrate such as ceramics. A base film of chromium or the like, which can align the axes of easy magnetization, C
It has a structure in which a magnetic thin film such as o-Ni-Cr or Co-Ni-Pt and a carbon film to be a lubricating layer are laminated in this order. Recently, JP-A-63-217525, or IEEE TRANSACTION ON MAGNETICS, VOL.27, No.6 NOVE
As described in MBER 1991, P4729-4742, as a base film formed on the substrate, a film made of nickel and phosphorus (hereinafter referred to as a nickel-phosphorus base film) is formed by sputtering, and chromium is used as the base film. With higher quality magnetic properties, smaller bit shift, higher resolution,
It has been found that a magnetic thin film having low noise and high uniformity over the entire surface of the disk can be obtained.

【0003】ニッケル−リン下地膜をスパッタリングで
形成すると、アモルファスもしくはほとんどアモルファ
スの膜となる。このニッケル−リン下地膜は、基板表面
の不均一性が磁性薄膜に伝達されるのを防ぐ層となり、
かつアモルファスまたはほとんどアモルファスであるた
めに磁性薄膜の結晶が成長する核となる部分が無数に存
在し、磁性薄膜が均一微細に結晶成長することになるた
め、上述した効果が得られると考えられている。また、
ニッケル−リン下地膜用ターゲットの製造方法として
は、リンの蒸気圧が大きいために、溶解−鋳造法では主
成分の1つであるリンの組成制御が難しいことから、粉
末焼結法を用いて製造されている。
When the nickel-phosphorus base film is formed by sputtering, it becomes an amorphous or almost amorphous film. This nickel-phosphorus base film serves as a layer that prevents the non-uniformity of the substrate surface from being transmitted to the magnetic thin film,
And since it is amorphous or almost amorphous, there are innumerable nuclei where the crystals of the magnetic thin film grow, and the magnetic thin film grows uniformly and finely, so it is considered that the above-mentioned effects can be obtained. There is. Also,
As a method of manufacturing a target for a nickel-phosphorus base film, it is difficult to control the composition of phosphorus, which is one of the main components in the melting-casting method, because the vapor pressure of phosphorus is large. Being manufactured.

【0004】[0004]

【発明が解決しようとする課題】上述したように、ニッ
ケル−リン下地膜はハードディスク等の磁気記録媒体を
構成する上で、磁性薄膜の下地膜として非常に有望な特
性を持つものである。しかし、リンは非常に酸化しやす
い物質であり、スパッタリングに使用するターゲットの
酸素濃度は、3000ppm以上となっていた。このような酸
素濃度の高いターゲットを用いて、ニッケル−リン下地
膜を形成すると、下地膜表面に酸素が多く存在すること
になり、磁性膜がニッケル−リン下地膜に対してエピタ
キシャルに成長できなくなる。エピタキシャルに成長で
きない磁性膜は、その磁化容易軸が面内方向に揃ってお
らず、結果として磁性薄膜に要求される基本的特性であ
る保磁力が低下することになる。
As described above, the nickel-phosphorus base film has very promising properties as a base film of a magnetic thin film when forming a magnetic recording medium such as a hard disk. However, phosphorus is a substance that is easily oxidized, and the oxygen concentration of the target used for sputtering was 3000 ppm or more. When a nickel-phosphorus underlayer film is formed using such a target having a high oxygen concentration, a large amount of oxygen exists on the surface of the underlayer film, and the magnetic film cannot grow epitaxially on the nickel-phosphorus underlayer film. . In a magnetic film that cannot be grown epitaxially, the axes of easy magnetization are not aligned in the in-plane direction, and as a result, the coercive force, which is a basic characteristic required for a magnetic thin film, is reduced.

【0005】本発明者等は、このような問題点を解決す
るために、原料粉末を還元処理してから焼結することに
より、低い酸素濃度のニッケル−リンからなるターゲッ
トを見出し、特願平4-178752号として出願した。本発明
者等がこのターゲットをさらに詳細に検討したところ、
特にリン組成が25at%を越え、33.3at%未満の平衡論的に
Ni52ないしNi125の相が焼結体の主相となる領域
で、圧密不十分となり易いという問題を見出した。圧密
が不十分な密度の低いターゲットをスパッタリングに供
すると、ポアの存在によって刻々スパッタリングレート
が変動したり、放電の異常によって膜中に異物が多発し
て均一な膜組成が困難となってビットエラーやノイズの
発生など磁性薄膜の均一性を損なう。本発明の目的は、
保磁力が高い磁性薄膜を安定して形成できるニッケル−
リン下地膜形成用のスパッタリングターゲットとその製
造方法を提供することである。
In order to solve such a problem, the present inventors have found a target made of nickel-phosphorus having a low oxygen concentration by subjecting a raw material powder to a reduction treatment and then sintering the powder. Filed as No. 4-178752. When the present inventors examined this target in more detail,
In particular, in the region where the phosphorus composition exceeds 25 at% and is less than 33.3 at% in the equilibrium theory, the Ni 5 P 2 or Ni 12 P 5 phase is the main phase of the sintered body, the problem is that the consolidation tends to be insufficient. It was When a low-density target with insufficient consolidation is subjected to sputtering, the sputtering rate fluctuates momentarily due to the presence of pores, and foreign matter frequently occurs in the film due to abnormal discharge, making it difficult to achieve a uniform film composition and bit errors. And the uniformity of the magnetic thin film is impaired due to noise and noise. The purpose of the present invention is to
Nickel that enables stable formation of magnetic thin films with high coercive force
It is an object of the present invention to provide a sputtering target for forming a phosphorus base film and a manufacturing method thereof.

【0006】[0006]

【課題を解決するための手段】本発明者は、ニッケルと
リンでなり、2000ppm以下の低酸素含有量であり、しか
も97%以上の高密度を有し、低酸素のニッケル−リン下
地膜を安定して得ることができる従来にないスパッタリ
ングターゲットを見出した。同時に、そのスパッタリン
グターゲットを得る具体的手段として焼結の前段階とし
て行なう粉末の還元処理において、焼結性の悪いNi5
2ないしNi125の相を発生させないように、リンの含
有量が25at%以下の低リン側原料とリンの含有量が33.3a
t%以上の高リン側原料に分けて還元処理を行ない、その
後それらを混合し、焼結すれば良いことを知見した。
Means for Solving the Problems The present inventor has proposed a low oxygen nickel-phosphorus underlayer film consisting of nickel and phosphorus, having a low oxygen content of 2000 ppm or less, and having a high density of 97% or more. We have found a sputtering target that has not been available in the past and that can be stably obtained. At the same time, as a specific means for obtaining the sputtering target, in the powder reduction treatment performed as a pre-stage of sintering, Ni 5 P having poor sinterability is used.
In order to prevent the formation of 2 to Ni 12 P 5 phases, the low phosphorus side raw material with a phosphorus content of 25 at% or less and the phosphorus content of 33.3a
It has been found that the reduction treatment may be performed by dividing the raw material on the high phosphorus side of t% or more, and then mixing and sintering them.

【0007】すなわち、本発明のターゲットの製造方法
は、ニッケル単体粉末またはリンの含有量が25at%以下
の化合物または合金の粉末から選ばれる一種以上の粉末
を還元性雰囲気で加熱処理して得た低リン側原料と、リ
ンの含有量が33.3at%以上の化合物または合金から選ば
れる一種以上の粉末を還元性雰囲気で加熱処理して得た
高リン側原料とを、所望のニッケルとリンの組成比に配
合し、焼結することを特徴とする磁性薄膜の下地形成用
スパッタリングターゲットの製造方法であり、好ましく
は前記低リン側原料と高リン側原料を、混合粉砕する
か、個々に粉砕してから焼結することを特徴とする磁性
薄膜の下地形成用スパッタリングターゲットの製造方法
である。また焼結は、液相発現温度未満で行なうことが
より好ましい。
That is, the method for producing a target of the present invention was obtained by heat-treating, in a reducing atmosphere, one or more powders selected from a powder of nickel alone or a powder of a compound or alloy having a phosphorus content of 25 at% or less. Low phosphorus-side raw material, high phosphorus-side raw material obtained by heat-treating one or more powders selected from compounds or alloys having a phosphorus content of 33.3 at% or more in a reducing atmosphere, of desired nickel and phosphorus A method for producing a sputtering target for forming an underlayer of a magnetic thin film, which is compounded in a composition ratio and sintered, preferably the low phosphorus-side raw material and the high phosphorus-side raw material are mixed and pulverized or individually pulverized. A method of manufacturing a sputtering target for forming an underlayer of a magnetic thin film, the method comprising the steps of: Further, it is more preferable that the sintering is performed below the liquidus temperature.

【0008】[0008]

【作用】本発明のターゲットは、酸素含有量が2000ppm
以下で、密度比 97%以上という従来にない低い酸素含有
量と高い密度比の組合せからなるスパッタリングターゲ
ットであり、本発明の製造方法によれば酸素含有量が20
00ppm以下の低酸素の下地膜を安定して得ることが可能
となる。したがって、磁性薄膜は酸素に阻害されること
なく、エピタキシャル成長が可能となり、形成された磁
性薄膜の保磁力は最低でも1200 Oe以上となり、ビット
エラーやノイズの少ない健全なものとなる。本発明の製
造方法の最大の特徴の一つは、酸素を低減するために実
施する還元性雰囲気の中の加熱処理でNi52ないしNi
125といったリンの含有量が25at%ないし33.3at%で主
相となる化合物を生成させないために、リンの含有量が
25at%以下の低リン側原料と33.3at%以上の高リン側原料
に分けて還元雰囲気中の加熱処理したことである。
Function: The target of the present invention has an oxygen content of 2000 ppm.
Below is a sputtering target consisting of a combination of a low density of 97% or more, which is unprecedented, and a high density, and according to the production method of the present invention, the oxygen content is 20% or less.
It is possible to stably obtain a low-oxygen base film of 00 ppm or less. Therefore, the magnetic thin film can be epitaxially grown without being obstructed by oxygen, and the coercive force of the formed magnetic thin film is at least 1200 Oe or more, which is sound and has few bit errors and noise. One of the most important features of the production method of the present invention is a heat treatment in a reducing atmosphere for reducing oxygen, which is Ni 5 P 2 or Ni.
Since the content of phosphorus such as 12 P 5 is 25 at% to 33.3 at% and the compound forming the main phase is not formed, the content of phosphorus is
That is, the heat treatment was performed in a reducing atmosphere separately for the low phosphorus side raw material of 25 at% or less and the high phosphorus side raw material of 33.3 at% or more.

【0009】還元処理において、Ni52ないしNi12
5の生成を抑えることにより、焼結密度を著しく高める
ことができ、しかも低い酸素含有量となる。上述した加
熱処理は、粉末の種類ごとに行なっても良いし、低リン
側原料となる粉末同士あるいは高リン側原料となる粉末
同士を混合して加熱処理してもよい。 本発明で実施す
る還元雰囲気での加熱処理の温度は、好ましくは600℃
から1000℃の範囲とする。還元は温度が高いほど効果的
だが、1000℃以上ではリンが蒸発してターゲットの組成
が変動すること、および粉末の焼結が進行して粉末の凝
集が甚だしくなり、加熱処理後の粉砕も困難となって粉
末の充填が不十分となるためである。また、600℃以下
では還元効果が少ない。
In the reduction treatment, Ni 5 P 2 to Ni 12 P
By suppressing the formation of 5, the sintered density can be remarkably increased and the oxygen content becomes low. The heat treatment described above may be performed for each type of powder, or the powders that are low phosphorus side raw materials or the powders that are high phosphorus side raw materials may be mixed and heat treated. The temperature of the heat treatment in the reducing atmosphere carried out in the present invention is preferably 600 ° C.
To 1000 ° C. Reduction is more effective at higher temperatures, but above 1000 ° C, phosphorus evaporates and the composition of the target fluctuates, and the sintering of the powder progresses and powder agglomeration becomes severe, making it difficult to pulverize after heat treatment. This is because the powder filling becomes insufficient. Further, at 600 ° C or lower, the reducing effect is small.

【0010】本発明において、好ましくは還元性雰囲気
中で加熱処理した後、あるいは所望のニッケルとリンの
組成比に配合して混合後に粉末を粉砕する。水素を含む
雰囲気中で加熱処理中に粉末粒子が一部焼結し凝集して
粉末充填が不十分となり、加圧焼結が行ない難いのを防
止すること、成分偏析を解消して組成分布を均一にする
ためである。本発明で行なう粉砕は、粉末の凝集を解い
て凝集前の粒径に戻すことを主眼とする。操作は、ボー
ルミル、アトライター、遊星ボールミル、振動ボールミ
ルなどが使用できる。粉砕中に酸素が吸着することによ
る酸素含有量の増加を防ぐために、真空中あるいはアル
ゴンガス等の不活性ガス雰囲気中で行なうことが好まし
い。
In the present invention, the powder is preferably crushed after being heat-treated in a reducing atmosphere or after being mixed in a desired composition ratio of nickel and phosphorus and mixed. It prevents powder particles from partially sintering and agglomerating during heat treatment in an atmosphere containing hydrogen, resulting in insufficient powder filling and pressure sintering, and eliminating composition segregation by eliminating component segregation. This is to make it uniform. The main purpose of the pulverization carried out in the present invention is to release the agglomeration of the powder and restore the particle size before the agglomeration. For the operation, a ball mill, an attritor, a planetary ball mill, a vibrating ball mill or the like can be used. In order to prevent the oxygen content from increasing due to the adsorption of oxygen during the pulverization, it is preferable to carry out in a vacuum or in an atmosphere of an inert gas such as argon gas.

【0011】なお、上記の加熱処理による還元の後、該
個別粉末を所望のニッケルとリンの組成比に配合して混
合後粉砕するか、該個別粉末を粉砕した後所望の組成比
に混合するかは、どちらも可能だが、加熱処理による粉
末の凝集度合いが個別の粉末によって差がある場合は、
後者が好ましいし、差がない場合は前者が効率的であ
る。ニッケル−リン系では、リンを含む原料自体が比較
的酸素含有量が高いこと、およびリンが酸化し易いこと
から、粉末表面の酸化膜が焼結を阻害するために圧密化
が困難な場合がある。したがって、熱間静水圧プレス
(以下HIPと称す)やホットプレスなどによって、加
圧下で焼結することが好ましい。
After the reduction by the above heat treatment, the individual powder is blended in a desired composition ratio of nickel and phosphorus and mixed, or pulverized, or the individual powder is pulverized and then mixed in a desired composition ratio. Both are possible, but if the degree of aggregation of the powder due to heat treatment differs depending on the individual powder,
The latter is preferable, and the former is more efficient when there is no difference. In the nickel-phosphorus system, since the raw material itself containing phosphorus has a relatively high oxygen content and the phosphorus is easily oxidized, the oxide film on the powder surface may hinder sintering due to the inhibition of sintering. is there. Therefore, it is preferable to sinter under pressure by hot isostatic pressing (hereinafter referred to as HIP), hot pressing, or the like.

【0012】焼結温度は、混合粉末が焼結中に液相を発
現しない温度であることが好ましい。すなわち、配合組
成としてリン含有量 33.3at%を境として、これ以下のリ
ン含有量ではNiとNi3Pの共晶温度 880℃以下で、こ
れを越えるリン含有量ではNi2PとNi54の共晶温度
830℃以下である。好ましくは、共晶温度より30℃低い
温度、(共晶温度−30℃)以下とする。これは、液相発現
温度を局部的にも越えるとホットプレスのダイやHIP
の鉄製缶と、ニッケルおよびリンが反応し、ターゲット
が汚染する恐れがあるためである。また、組成分布の均
一性の確保、組成分布の不均一性に基づく密度むらや局
部的な脆化の発生の防止の観点からも固相焼結が好まし
いのである。
The sintering temperature is preferably a temperature at which the mixed powder does not develop a liquid phase during sintering. That is, with the phosphorus content of 33.3 at% as the boundary composition, the eutectic temperature of Ni and Ni 3 P is 880 ° C. or less at the phosphorus content below this, and the Ni 2 P and Ni 5 P at the phosphorus content above this. Eutectic temperature of 4
It is below 830 ℃. Preferably, the temperature is lower than the eutectic temperature by 30 ° C. or lower (eutectic temperature −30 ° C.). This is because hot press dies and HIPs are used when the liquidus temperature is locally exceeded.
This is because the iron can and the nickel and phosphorus react with each other and the target may be contaminated. Solid phase sintering is also preferable from the viewpoint of ensuring the uniformity of the composition distribution and preventing the occurrence of uneven density and local embrittlement due to the non-uniformity of the composition distribution.

【0013】[0013]

【実施例】【Example】

(実施例1)平均粒径 12μm、酸素含有量 5600ppmの純
Ni原料粉末を、600℃の純水素雰囲気中で2時間加熱
し、低リン側原料を得た。加熱後の粉末は一部凝集して
いたが、酸素含有量は1150ppmであった。一方、平均粒
径 30μm、酸素含有量 3700ppmのNi2P原料粉末(Ni
−33.4at%P粉末)を800℃の純水素雰囲気中で2時間加
熱し高リン側原料を得た。加熱後の粉末は一部凝集して
いたが、酸素含有量は1250ppmであった。上記仮焼状態
となった2種の粉末を各々個別に、粗粉砕後、ボールミ
ルに移し、ボールミル内をアルゴンガスで置換してから
2時間粉砕した。次いで、これら2種の粉末をNi−30
at%P(18.44wt%P)となるよう、Ni粉末 15.0%、Ni2
P粉末 85.0%に配合し、V型ブレンダーで混合した。得
られた混合粉末を軟鉄製のHIP用の缶に充填し、1200
kgf/cm2、840℃でHIPを行ない、得られた焼結体を機
械加工によりφ200mm×4mmtのターゲットとした(試料N
o.1)。
Example 1 Pure Ni raw material powder having an average particle diameter of 12 μm and an oxygen content of 5600 ppm was heated in a pure hydrogen atmosphere at 600 ° C. for 2 hours to obtain a low phosphorus-side raw material. The powder after heating was partially agglomerated, but the oxygen content was 1150 ppm. On the other hand, a Ni 2 P raw material powder (Ni having an average particle size of 30 μm and an oxygen content of 3700 ppm (Ni
−33.4 at% P powder) was heated in a pure hydrogen atmosphere at 800 ° C. for 2 hours to obtain a high phosphorus-side raw material. The powder after heating was partially agglomerated, but the oxygen content was 1250 ppm. The above-mentioned two kinds of powders in the calcined state were individually coarsely crushed, transferred to a ball mill, replaced with argon gas in the ball mill, and then pulverized for 2 hours. Next, these two kinds of powders are mixed with Ni-30.
Ni powder 15.0%, Ni 2 so that at% P (18.44 wt% P)
P powder was mixed with 85.0% and mixed with a V-type blender. The obtained mixed powder is filled in a can for HIP made of soft iron, and 1200
HIP was carried out at kgf / cm 2 and 840 ° C., and the obtained sintered body was machined into a target of φ200 mm × 4 mmt (Sample N
o.1).

【0014】比較例として、上記2種の原料粉末を、水
素雰囲気中の加熱処理を施さずに、そのまま上記割合で
配合し、V型ブレンダーで混合した。この混合粉末の酸
素含有量は4080ppmであった。この粉末をX線回折した
ところ、原料のNi,Ni2Pの存在のみが確認された。
この粉末を上記同様にHIPを施し、機械加工により同
一寸法のターゲットとした(試料No.2)。比較例とし
て、上記2種の原料粉末の純Ni、Ni2Pを、上記割合
で配合し、V型ブレンダーで混合した。この混合粉末を
800℃の純水素雰囲気中で2時間加熱した。加熱後の粉
末は一部凝集していたが、酸素含有量は1180ppmであっ
た。この粉末をX線回折したところ、ごくわずかにNi2
Pの存在が確認されたが、回折パターンはNi125
存在が優勢であり、配合組成 Ni−30at%Pに相応する
相構成であることが確認された。この粉末も前記同様に
HIPを施した。しかし、HIP缶を除去後の焼結体は
金属光沢が鈍く、圧密が不十分であった(試料No.3)。
As a comparative example, the above-mentioned two kinds of raw material powders were blended in the above proportion as they were without heat treatment in a hydrogen atmosphere and mixed in a V-type blender. The oxygen content of this mixed powder was 4080 ppm. When this powder was subjected to X-ray diffraction, only the presence of the raw materials Ni and Ni 2 P was confirmed.
This powder was subjected to HIP in the same manner as above, and was machined into a target of the same size (Sample No. 2). As a comparative example, the above-mentioned two kinds of raw material powders of pure Ni and Ni 2 P were blended in the above proportions and mixed by a V-type blender. This mixed powder
It was heated in a pure hydrogen atmosphere at 800 ° C. for 2 hours. The powder after heating was partly aggregated, but the oxygen content was 1180 ppm. When this powder was subjected to X-ray diffraction, a slight amount of Ni 2
Although the presence of P was confirmed, the diffraction pattern confirmed that the presence of Ni 12 P 5 was predominant, and that the phase composition corresponded to the blended composition Ni-30 at% P. This powder was also subjected to HIP as described above. However, the sintered compact after removing the HIP can had a dull metallic luster and was insufficiently compacted (Sample No. 3).

【0015】以上によって得られた3種のターゲットの
破片をX線回折した結果、ともにほとんどNi12
5で、ごくわずかにNi2Pが存在しており、配合組成 N
i−30at%Pに相応する相構成であった。ターゲットの
密度比(真密度に対する相対密度)とターゲット中に含
まれる酸素含有量を表1に示す。表示のように、焼結直
前の原料として、Ni125を含まないように原料粉末
を個別に水素中で加熱し、還元してから混合した本発明
のターゲット(試料No.1)は、比較例のターゲットに比
べて密度比が高く、酸素が低いことがわかる。
As a result of X-ray diffraction of the fragments of the three types of targets obtained as described above, almost all of them were Ni 12 P.
5 , Ni 2 P was present in a very small amount, and the composition was N
The phase composition corresponded to i-30 at% P. Table 1 shows the density ratio of the target (relative density to the true density) and the oxygen content contained in the target. As shown, the target (sample No. 1) of the present invention in which the raw material powders were individually heated in hydrogen so as not to contain Ni 12 P 5 as a raw material immediately before sintering, and reduced and then mixed, It can be seen that the density ratio is higher and the oxygen content is lower than the target of the comparative example.

【0016】[0016]

【表1】 [Table 1]

【0017】(実施例2)平均粒径 10μm、酸素含有量
1550ppmの純Ni原料粉末を、600℃の純水素雰囲気中で
2時間加熱し低リン側原料を得た。加熱後の粉末は一部
凝集していたが、酸素含有量は540ppmであった。一方、
平均粒径 8μm、酸素含有量 2850ppmのNi2P原料粉末
(Ni−33.4at%P粉末)を800℃の純水素雰囲気中で2時
間加熱し高リン側原料を得た。加熱後の粉末は一部凝集
していたが、酸素含有量は820ppmであった。また、平均
粒径 8μm、酸素含有量 3600ppmのNi2P−Ni54
晶合金の原料粉末(Ni−40.5at%P粉末)を800℃の純
水素雰囲気中で2時間加熱し別の高リン側原料を得た。
加熱後の粉末は一部凝集していたが、酸素含有量は1280
ppmであった。
(Example 2) Average particle size 10 μm, oxygen content
1550ppm pure Ni raw material powder in pure hydrogen atmosphere at 600 ℃
After heating for 2 hours, a low phosphorus-side raw material was obtained. The powder after heating was partly aggregated, but the oxygen content was 540 ppm. on the other hand,
A Ni 2 P raw material powder (Ni-33.4 at% P powder) having an average particle diameter of 8 μm and an oxygen content of 2850 ppm was heated in a pure hydrogen atmosphere at 800 ° C. for 2 hours to obtain a high phosphorus-side raw material. The powder after heating was partially agglomerated, but the oxygen content was 820 ppm. In addition, a raw material powder (Ni-40.5at% P powder) of a Ni 2 P-Ni 5 P 4 eutectic alloy having an average particle size of 8 μm and an oxygen content of 3600 ppm was heated for 2 hours in a pure hydrogen atmosphere at 800 ° C. A high phosphorus side raw material was obtained.
The powder after heating was partially agglomerated, but the oxygen content was 1280.
It was ppm.

【0018】上記仮焼状態となった3種の粉末を各々個
別に、粗粉砕後、ボールミルに移し、ボールミル内をア
ルゴンガスで置換してから2時間粉砕した。次いで、こ
れら3種の粉末を表2に示す組合せで、Ni-20at%P(1
1.65wt%P)となるよう、配合し、V型ブレンダーで混合
した。得られた混合粉末を軟鉄製のHIP用の缶に充填
し、1200kgf/cm2、840℃でHIPを行ない、得られた焼
結体を機械加工によりφ200mm×4mmtの本発明のターゲ
ットとした(試料No.4,5,6)。比較例として、上記3種
の原料と同様の粉末を、水素雰囲気中の加熱処理を施さ
ずに、そのまま表2に示す3種の割合で配合し、V型ブ
レンダーで混合した。酸素含有量は表2に示す通りであ
った。これら粉末も前記同様にHIPを施し、機械加工
により同一寸法のターゲットとした(試料No.7,8,9)。
以上によって、得られた焼結後のターゲットの破片をX
線回折した結果、いずれもNi−Ni3Pの過共晶で、
配合組成Ni−20at%Pに相応する相構成であった。
The three kinds of powders in the calcined state were individually crushed, transferred to a ball mill, replaced with argon gas in the ball mill, and crushed for 2 hours. Then, these 3 kinds of powders were combined in the combination shown in Table 2 to obtain Ni-20at% P (1
1.65 wt% P), and mixed with a V-type blender. The obtained mixed powder was filled in a can for HIP made of soft iron, HIP was performed at 1200 kgf / cm 2 and 840 ° C., and the obtained sintered body was machined to be a target of φ200 mm × 4 mmt of the present invention ( Sample No.4,5,6). As a comparative example, powders similar to the above three types of raw materials were blended in the V type blender in the proportions of the three types shown in Table 2 as they were without performing heat treatment in a hydrogen atmosphere. The oxygen content was as shown in Table 2. HIP was applied to these powders in the same manner as described above, and targets having the same dimensions were machined (Samples No. 7, 8, 9).
From the above, the obtained target fragments after sintering are X-rayed.
As a result of line diffraction, both were hypereutectic Ni-Ni 3 P,
The phase composition corresponded to the compounding composition Ni-20 at% P.

【0019】[0019]

【表2】 [Table 2]

【0020】表2の混合粉末をHIPして得られたター
ゲットの密度比(真密度に対する相対密度)とターゲッ
ト中に含まれる酸素含有量を表3に示す。表に示すよう
に、本発明の水素中で加熱し還元した混合粉末によるタ
ーゲットは、比較例のターゲットに比べて密度比が高
く、酸素が低いことがわかる。
Table 3 shows the density ratio (relative density to the true density) of the target obtained by HIPing the mixed powder of Table 2 and the oxygen content contained in the target. As shown in the table, it is understood that the target of the present invention, which is a mixture of powders heated and reduced in hydrogen, has a higher density ratio and a lower oxygen content than the target of the comparative example.

【0021】[0021]

【表3】 [Table 3]

【0022】(実施例3)15μmの膜厚さで表面にテク
スチャー処理を施してあるニッケル−リンの無電解メッ
キ層を有するアルミニウム基板上に、実施例1,2で製
造した本発明のターゲットを用いて、ニッケル−リン下
地膜をスパッタリングにより300Åの膜厚に形成した。
この下地膜上にat%で80Co−10Cr−10Ptの磁性膜
をスパッタリングにより500Åの膜厚に形成した。な
お、実施例1の試料No.3のターゲットは密度比が低い
ため、スパッタリングの対象から除外した。さらに、磁
性膜上にスパッタリングにより200Åのカーボン膜を形
成し、ハードディスクを形成した。
(Example 3) The target of the present invention produced in Examples 1 and 2 was placed on an aluminum substrate having a nickel-phosphorous electroless plating layer having a thickness of 15 µm and having a textured surface. A nickel-phosphorus base film was formed by sputtering to have a film thickness of 300 Å.
A magnetic film of 80Co-10Cr-10Pt at at% was formed on the base film by sputtering to have a film thickness of 500Å. The target of the sample No. 3 of Example 1 had a low density ratio, and thus was excluded from the target of sputtering. Further, a 200 Å carbon film was formed on the magnetic film by sputtering to form a hard disk.

【0023】このハードディスクのニッケル−リン下地
膜の酸素含有量、磁性膜の保磁力、磁性膜の平均結晶粒
径およびトラック幅 13μm、ギャップ長 0.46μmのMI
Gヘッドを用いて、周速 7m/s、浮上量 0.1μm、記録周
波数 5MHz、記録密度 36kfciで計測したときのS/N比
を表4に示す。表4中の試料番号は実施例1、2の試料
番号に対応するものである。表4より、本発明のターゲ
ットを用いることにより、従来の酸素含有量の多いター
ゲットを用いる場合に比べて、低酸素の下地膜が得ら
れ、その低酸素の下地膜を形成することにとより、磁性
薄膜の保磁力が上がると共に、平均結晶粒径が小さくな
り、ノイズの少ない優れたハードディスクが得られたこ
とがわかる。
The oxygen content of the nickel-phosphorus underlayer of this hard disk, the coercive force of the magnetic layer, the average crystal grain size of the magnetic layer, the track width of 13 μm, and the MI of the gap length of 0.46 μm.
Table 4 shows the S / N ratio when measured with a G head at a peripheral speed of 7 m / s, a flying height of 0.1 μm, a recording frequency of 5 MHz, and a recording density of 36 kfci. The sample numbers in Table 4 correspond to the sample numbers of Examples 1 and 2. From Table 4, by using the target of the present invention, a low-oxygen underlayer film is obtained as compared with the case of using a conventional target with a high oxygen content, and it is possible to form the low-oxygen underlayer film. It can be seen that, as the coercive force of the magnetic thin film increased, the average crystal grain size decreased, and an excellent hard disk with less noise was obtained.

【0024】[0024]

【表4】 [Table 4]

【0025】[0025]

【発明の効果】本発明によれば、低酸素で高密度のニッ
ケルとリンで構成されたターゲットが製造できるため、
このターゲットを用いて磁性薄膜の結晶の面内配向性を
高上でき、結果として磁気記録媒体用の磁性薄膜に要求
される基本特性である保磁力を向上できる。また、高い
密度比のターゲットによって薄膜を形成すること、下地
膜の酸素含有量を低減することは、S/N比を向上させ
る点でも効果がある。
According to the present invention, a target composed of low oxygen and high density nickel and phosphorus can be manufactured.
By using this target, the crystal in-plane orientation of the magnetic thin film can be improved, and as a result, the coercive force, which is a basic characteristic required for the magnetic thin film for the magnetic recording medium, can be improved. Further, forming a thin film with a target having a high density ratio and reducing the oxygen content of the base film are also effective in improving the S / N ratio.

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 G11B 5/84 Z 7303−5D H01F 10/26 41/18 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification number Office reference number FI technical display location G11B 5/84 Z 7303-5D H01F 10/26 41/18

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 実質的にニッケルとリンからなり、不純
物である酸素含有量が2000ppm以下で、密度比97%以上で
あることを特徴とする磁性薄膜の下地形成用スパッタリ
ングターゲット。
1. A sputtering target for forming an underlayer of a magnetic thin film, which is essentially composed of nickel and phosphorus, has an oxygen content of 2000 ppm or less, and has a density ratio of 97% or more.
【請求項2】 ニッケル単体粉末またはリンの含有量が
25at%以下の化合物または合金の粉末から選ばれる一種
以上の粉末を還元性雰囲気で加熱処理して得た低リン側
原料と、リンの含有量が33.3at%以上の化合物または合
金から選ばれる一種以上の粉末を還元性雰囲気で加熱処
理して得た高リン側原料とを、所望のニッケルとリンの
組成比に配合し、焼結することを特徴とする磁性薄膜の
下地形成用スパッタリングターゲットの製造方法。
2. The content of nickel simple substance powder or phosphorus
Low phosphorus side raw material obtained by heat-treating one or more powders selected from compound or alloy powders of 25 at% or less in a reducing atmosphere, and one selected from compounds or alloys having a phosphorus content of 33.3 at% or more A high-phosphorus-side raw material obtained by heating the above powders in a reducing atmosphere, is mixed in a desired composition ratio of nickel and phosphorus, and sintered to form a sputtering target for forming an underlayer of a magnetic thin film. Production method.
【請求項3】 前記低リン側原料と高リン側原料を、混
合粉砕するか、個々に粉砕してから焼結することを特徴
とする請求項2に記載の磁性薄膜の下地形成用スパッタ
リングターゲットの製造方法。
3. The sputtering target for forming an underlayer of a magnetic thin film according to claim 2, wherein the low phosphorus-side raw material and the high phosphorus-side raw material are mixed and pulverized, or pulverized individually and then sintered. Manufacturing method.
【請求項4】 焼結は、液相発現温度未満で行なうこと
を特徴とする請求項2に記載の磁性薄膜の下地形成用ス
パッタリングターゲットの製造方法。
4. The method for producing a sputtering target for forming an underlayer of a magnetic thin film according to claim 2, wherein the sintering is performed at a temperature lower than a liquidus temperature.
JP4287410A 1992-10-26 1992-10-26 Sputtering target for forming ground surface of magnetic thin film and its production Pending JPH06136526A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4287410A JPH06136526A (en) 1992-10-26 1992-10-26 Sputtering target for forming ground surface of magnetic thin film and its production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4287410A JPH06136526A (en) 1992-10-26 1992-10-26 Sputtering target for forming ground surface of magnetic thin film and its production

Publications (1)

Publication Number Publication Date
JPH06136526A true JPH06136526A (en) 1994-05-17

Family

ID=17716975

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4287410A Pending JPH06136526A (en) 1992-10-26 1992-10-26 Sputtering target for forming ground surface of magnetic thin film and its production

Country Status (1)

Country Link
JP (1) JPH06136526A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015146604A1 (en) * 2014-03-27 2015-10-01 Jx日鉱日石金属株式会社 SPUTTERING TARGET COMPRISING Ni-P ALLOY OR Ni-Pt-P ALLOY AND PRODUCTION METHOD THEREFOR

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015146604A1 (en) * 2014-03-27 2015-10-01 Jx日鉱日石金属株式会社 SPUTTERING TARGET COMPRISING Ni-P ALLOY OR Ni-Pt-P ALLOY AND PRODUCTION METHOD THEREFOR
CN106133185A (en) * 2014-03-27 2016-11-16 捷客斯金属株式会社 Comprise Ni P alloy or the sputtering target of Ni Pt P alloy and manufacture method thereof
KR20160135319A (en) * 2014-03-27 2016-11-25 제이엑스금속주식회사 SPUTTERING TARGET COMPRISING Ni-P ALLOY OR Ni-Pt-P ALLOY AND PRODUCTION METHOD THEREFOR
JP6037422B2 (en) * 2014-03-27 2016-12-07 Jx金属株式会社 Method for producing sputtering target made of Ni-P alloy or Ni-Pt-P alloy
US20170121811A1 (en) * 2014-03-27 2017-05-04 Jx Nippon Mining & Metals Corporation Sputtering Target Comprising Ni-P Alloy or Ni-Pt-P Alloy and Production Method Therefor
TWI628292B (en) * 2014-03-27 2018-07-01 Jx日鑛日石金屬股份有限公司 Sputter target composed of nickel-phosphorus alloy or nickel-platinum-phosphorus alloy and manufacturing method thereof
US10337100B2 (en) 2014-03-27 2019-07-02 Jx Nippon Mining & Metals Corporation Sputtering target comprising Ni—P alloy or Ni—Pt—P alloy and production method therefor

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