JPH06131214A - Test item inportance evaluating device - Google Patents

Abstract

PURPOSE:To provide a test item importance evaluating device which can evaluate the importance of a test item more accurately. CONSTITUTION:A fault information control part 1 controls fault information including the factor and generation date and time of a generated fault. A test information control part 2 controls test item information including the fault factor. A fault generation possibility index calculation part 3 calculates a fault generation possibility index indicating the possibility of fault generation at every fault factor controlled by the fault information control part 1 and weights the generation frequencies of faults caused by the fault factors according to whether the generation date and time are new or old so that a fault factor having a more recent generation date and time has a larger fault generation possibility index. A test item importance calculation part 4 takes test item information out of the test information control part 2 and the fault generation possibility index calculation part 3 finds the fault generation possibility index, thereby setting the importance of a test item, including a fault factor having a larger fault generation possibility index, higher.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test item importance evaluation device for calculating the importance of a test item in order to efficiently determine the order of execution of test items and to select the test items when executing a test. It is a thing.

[0002]

2. Description of the Related Art A conventional test item importance level evaluation apparatus, as disclosed in, for example, Japanese Patent Laid-Open No. 3-257538, obtains the frequency of occurrence of each failure factor from information on failures that have occurred in the past, and It was configured to calculate the importance of the test item based on this. That is, there is no conventional test item importance evaluation device that considers the date and time when a failure occurs, the complexity of the module, and the capability of the module developer.

[0003]

In the above-described conventional test item importance level evaluation device, the importance level of the test item is determined by considering only the occurrence frequency of the failure. Therefore, for example, when developing a program of version 1.0. Failure factor A that caused 10 failures but did not cause one failure when developing the program of version 4.0, and version 1.
There was a failure factor B that did not cause one failure when the 0 program was developed, but caused 10 failures when the version 4.0 program was developed.
When the test item 2 includes the failure factor A and the test item 2 includes the failure factor B, it is considered that the test item 2 is more likely to fail in the next test than the test item 1 is likely to fail. Nevertheless, there is a problem that the test item 1 and the test item 2 are calculated to have the same importance. In addition, since the newly developed program does not store past failure information, there is a problem that the importance of the test item cannot be obtained.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a test item importance evaluation device which can evaluate the importance of a test item more accurately.
It is another object of the present invention to provide a test item importance evaluation device capable of evaluating the importance of a test item even with a newly developed program.

[0005]

According to a first aspect of the present invention, there is provided a fault information management unit for managing fault information including a fault factor and a date and time of occurrence of a fault, and a test for managing test item information including the fault factor. An information management unit and a failure probability index indicating the degree of failure occurrence are calculated for each failure factor managed by the failure information management unit, and at that time, the failure caused by the failure factor is calculated. A failure probability index calculation unit that weights the occurrence frequency of a failure caused by the failure factor by the old and new occurrence times so that the failure probability index becomes larger as the failure factor becomes newer, and the test information management The test item information is extracted from the department and the failure probability index calculation unit is asked to calculate the failure probability index, and the test item including the failure factor with the large failure probability index is more important. It is characterized in that a test item importance degree calculation unit for the set high.

According to the invention of claim 2, the module is managed by the module management section for managing the module and the module name for identifying the module, the test information management section for managing the test item information, and the test information management section. When a test item is executed, the passing module name acquisition unit that obtains the module name of the module that the program passes through, the complexity analysis unit that obtains the complexity of the module, and the test item from the test information management unit All the passing module names of the passing module name are obtained by the passing module name obtaining unit, and the complexity of each module indicated by the passing module names is obtained by the complexity analyzing unit, and the complexity of each module indicated by the passing module name is obtained. Of test items with a higher total of It is characterized by comprising and.

According to a third aspect of the present invention, a test information management section for managing the test item information, and a module name of a module through which the program passes when the test item managed by the test information management section is executed are obtained. A module information management unit that manages module information including a module name acquisition unit, a module name, and a developer name indicating a developer of the module identified by the module name, a developer name, and a developer name. And a developer information management unit that manages developer information including a capability index indicating the capability of the developer identified by, and test items are extracted from the test information management unit, and all the passing module names of those test items are described above. Ask the passage module name acquisition unit to provide the developer name that identifies the developer of the module indicated by the obtained passage module name. Each of them is searched from the module information management unit, and the capability index in the developer information having the searched developer name is searched from the developer information management unit. It is characterized by including a test item importance degree calculation unit that is set high.

[0008]

In the invention of claim 1, the fault information management unit is
Manages failure information including the failure cause and the date and time of the failure that occurred. The test information management unit manages test item information including failure factors. The failure probability index calculation unit calculates a failure probability index indicating the degree of possibility of failure for each failure factor managed by the failure information management unit. The occurrence frequency of the failure caused by the failure factor is weighted by the old and new occurrence times so that the failure occurrence probability index becomes larger as the failure factor has a newer occurrence date and time. The test item importance calculation unit retrieves the test item information from the test information management unit and causes the failure probability index calculation unit to calculate the failure probability index. Set high importance.

In the invention of claim 2, the module management unit manages the module and the module name for identifying the module. The test information management unit manages test item information. The passage module name acquisition unit obtains the module name of the module through which the program passes when the test items managed by the test information management unit are executed. The complexity analysis unit obtains the complexity of the module. The test item importance calculation unit extracts the test items from the test information management unit, causes the pass module name acquisition unit to obtain all the pass module names of those test items, and calculates the complexity of the modules indicated by all the pass module names. The complexity is analyzed by each module, and the higher the total complexity of the modules indicated by the passing module name is, the higher the importance is set.

In the invention of claim 3, the test information management section manages the test item information. The passage module name acquisition unit obtains the module name of the module through which the program passes when the test items managed by the test information management unit are executed. The module information management unit manages, for each module, module information including a module name and a developer name indicating a developer of the module identified by the module name. The developer information management department
It manages developer information including a capability index indicating the capability of the developer identified by the developer name. The test item importance calculation unit retrieves the test items from the test information management unit, causes the pass module name acquisition unit to obtain all pass module names of those test items, and identifies the developers of the modules indicated by the obtained pass module names. Each developer name to be identified is searched from the module information management unit, and the capability index in the developer information having the searched developer name is searched from the developer information management unit. Set high importance.

[0011]

Embodiments of the present invention will now be described in detail with reference to the drawings. (Embodiment 1) FIG. 1 is a block diagram of a test item importance evaluation apparatus according to a first embodiment of the present invention. This test item importance evaluation apparatus includes a failure information management unit 1 and a test information management unit 2.
And a failure probability index calculation unit 3 and a test item importance calculation unit 4. The failure information management unit 1 manages failure information including failure factors and occurrence dates and times of failures that occurred in the past. The test information management unit 2 manages test item information including failure factors. Failure probability index calculation unit 3
When calculating the failure occurrence probability index indicating the degree of failure occurrence for each failure factor managed by the failure information management unit 1, the failure occurrence date and time of the failure caused by the failure factor is new. The failure occurrence probability index is calculated by weighting the occurrence frequency of the failure caused by the failure factor with the old and new occurrence dates so that the failure occurrence probability index increases as the factor increases. The test item importance calculation unit 4 retrieves the test item information from the test information management unit 2 and causes the failure probability index calculation unit 3 to obtain the failure probability index.
A test item including a failure factor having a large failure probability index is set to have a higher degree of importance.

Next, the operation of the test item importance evaluation device will be described with reference to the flowchart of FIG. First, the test item importance calculation unit 4 receives all the test items C1, C2, ..., Cn from the test information management unit 2.
Is taken out (step S1). Next, the test item importance calculator 4 sets i = 0 (step S2). Next, the test item importance calculation unit 4 increases the value of i by 1 (step S3). Next, the test item importance calculation unit 4 extracts all the failure factors F1, F2, ..., Fm included in the test item Ci from the test information management unit 2 (step S4). Next, the test item importance calculation unit 4 sets j =
It is set to 0 (step S5). Next, the test item importance calculation unit 4 increases the value of j by 1 (step S6).
Next, the test item importance calculation unit 4 determines that all the failure factors F
The failure probability index calculation unit 3 is operated so as to obtain the failure probability index Pj corresponding to j (step S
7). Next, the failure probability index calculation unit 3 determines the failure factor F
Dates and times T1, T2 of occurrence of all failures caused by j
..., Tp is taken out from the fault information management unit 1 (step S8). Next, the failure occurrence probability index calculation unit 3 determines the occurrence frequency of the failure due to the failure factor Fj as the date and time of occurrence T1, T2, ...
.., Tp is weighted to obtain the failure occurrence probability index Pj of the failure factor Fj (step S9). Next, the test item importance calculation unit 4 determines whether J = m (step S
10) If J = m is not satisfied, the process returns to step S6. J = m
If so, the test item importance degree calculation unit 4 obtains the test item importance degree Ji for the test item Ci using the sum of the failure occurrence probabilities indexes P1, P2, ..., Pm (step S11). Next, the test item importance calculation unit 4 sets i =
It is determined whether or not n is satisfied (step S12). If i = n is not satisfied, the process returns to step S3. If i = n, this routine ends.

Next, an example of the operation of the test item importance level evaluation apparatus will be specifically described. Now, it is assumed that the failure information management unit 1 manages the failure information as shown in FIG. 3 and the test information management unit 2 manages the test information as shown in FIG. In addition, failure probability index calculation unit 3
Are faults B1, B2, ...
The date and time of occurrence of Bn are T1, T2, ..., Tn
In the case of, the failure occurrence probability index P is calculated based on the following expression 1. However, T0 = 12 December 1989
TU = 1 (month) at 12:00 on the 1st of the month. Further, in the test item importance degree calculation unit 4, the failure factors included in the test item C are F1, F2, ..., Fm, and the failure probability indexes of the respective failure factors are P1, P2 ,. When Pm, the test item importance degree J is calculated based on the following equation 2.

[0014]

[Equation 1]

[0015]

[Equation 2]

First, the test item importance calculation unit 4 receives the test items “C1”, “C2”, and “C” from the test information management unit 2.
3 ”is taken out, and all the failure factors“ F1 ”and“ F ”included in the test item“ C1 ”are extracted from the test information management unit 2.
2 ”, and the failure factor“ F ”is output from the failure information management unit 1.
"1" Occurrence date and time of the failure "January 1, 1990
"12:00", "12:00 on February 1, 1990", "19
"12:00 on April 1, 1990". Then, the failure probability index calculation unit 3 calculates the failure probability index P1 of the failure factor “F1” based on the above equation 1. In this case P
1 = 7. Similarly, the failure probability index calculation unit 3
Calculates the failure possibility index P2 of the failure factor “F2”. In this case, P2 = 11. Then, the test item importance calculator 4 calculates the test item importance J1 for the test item “C1” based on the above equation 2. In this case J
1 = 18. Similarly, the test item importance degree calculation unit 4
Is the test item importance J2 for the test item "C2"
And the test item importance level J for the test item “C3”
Calculate 3. In this case, J2 = 7 and J3 = 11.
Since the test item importances of all the test items have been obtained as described above, the processing is ended.

As described above, since the test item importance is obtained in consideration of not only the frequency of occurrence of failures but also the date and time of occurrence of failures, it is possible to accurately find a test item with a high possibility of failure. The execution order of test items can be efficiently determined and selected. In addition, the above-mentioned Example 1
Then, the failure occurrence probability index P is calculated based on the above equation 1, but it is not always necessary to do so, and for example, if the occurrence date and time is before a certain date and time Tc, it does not contribute to the failure occurrence probability index P. Such a calculation method or a calculation method that greatly contributes to the failure probability index P when the occurrence date and time is within a specific period may be used.

In the first embodiment, the test item importance degree J is calculated based on the above equation 2, but it is not always necessary to do this, and it may be calculated based on the following equation 3, for example, or Value Pc with failure probability index P
A smaller calculation term may be used so that it does not contribute to the test item importance J.

[0019]

[Equation 3]

In the first embodiment, the test item importance is calculated for all the test items managed by the test information management unit 2, but the test item importance may be calculated only for a specific test item. . (Embodiment 2) FIG. 5 is a block diagram of a test item importance evaluation device according to a second embodiment of the present invention. This test item importance evaluation device includes a test information management unit 2 and a test item importance calculation unit 14. The module management unit 6, the passage module name acquisition unit 7, and the complexity degree analysis unit 8 are provided. The test information management unit 2 manages the test item information and the module name of the module through which the program passes when executing the test item. The test item importance calculation unit 14 retrieves the test item from the test information management unit 2, causes the pass module name acquisition unit 7 to obtain all the pass module names of this test item, and shows all the obtained pass module names. The complexity of each module is calculated by the complexity analysis unit 8, and the test item having a higher total module complexity indicated by the passing module name is set to have higher importance. The module management unit 6 manages a module and a module name for identifying the module. The passing module name acquisition unit 7 obtains the module name of the module through which the program passes when executing the test items managed by the test information management unit 2. The complexity analysis unit 8 calculates the complexity of the module.

Next, the operation of the test item importance level evaluation apparatus will be described with reference to the flowchart of FIG. First, the test item importance calculation unit 14 receives all the test items C1, C2, ..., C from the test information management unit 2.
n is taken out (step S21). Next, the test item importance calculator 4 sets i = 0 (step S22). Next, the test item importance calculator 14 increases the value of i by 1 (step S23). Next, the test item importance calculation unit 14 operates the passing module name acquisition unit 7 (step S24). Next, the passing module name acquisition unit 7 passes the module name N, which is the module name of all the modules that the program passes through when executing the test item Ci.
1, N2, ..., Nm are retrieved from the test information management unit 2 (step S25). Next, the test item importance calculator 14 sets j = 0 (step S26). Next, the test item importance calculator 14 increases the value of j by 1 (step S27). Next, the test item importance degree calculation unit 14
Activates the complexity analysis unit 8 (step S28).
Next, the complexity analysis unit 8 searches the module management unit 6 for the module Mj indicated by the module name Nj (step S29). Next, the complexity analysis unit 8 obtains the complexity Xj of the module Mj (step S30). Next, the test item importance calculation unit 14 determines whether J = m (step S31), and if J = m is not satisfied, the process returns to step S27. J
= M, the test item importance calculator 14 obtains the test item importance Ji for the test item Ci (step S32). Next, the test item importance calculation unit 14
= N is determined, and if i = n is not satisfied, the process returns to step S23. If i = n, this routine ends.

Next, an example of the operation of the test item importance level evaluation apparatus will be specifically described. Now, the module management unit 6
It is assumed that the module shown in FIG. 7 is managed and the test information management unit 2 manages the test information shown in FIG. Further, the complexity analysis unit 8 calculates the complexity X based on the following Expression 4. Further, in the test item importance degree calculation unit 14, the modules through which the program passes when the test item C is executed are M1, M2, ..., Mm, and the complexity of these modules is X1, X2, ...
., Xm, the test item importance level J is calculated based on the following equation 5.

[0023]

[Equation 4]

[0024]

[Equation 5]

First, the test item importance calculation section 14 receives all test items “C1” and “C” from the test information management section 2.
2 "and" C3 "are taken out. Further, the test item importance calculation unit 14 activates the passage module name acquisition unit 7, whereby the passage module name acquisition unit 7 causes the test item “C
Passing module names "M1" and "M" when executing "1"
2 ”from the test information management unit 2. Then, the test item importance calculation unit 14 activates the complexity analysis unit 8,
As a result, the complexity analysis unit 8 searches the module management unit 6 for the module indicated by the module name “M1”. Further, the complexity degree analysis unit 8 calculates the complexity degree X1 of the module indicated by the module name “M1” based on the above equation 4.
In this case, X1 = 4. Similarly, the test item importance calculation unit 14 activates the complexity analysis unit 8, whereby the complexity analysis unit 8 sets the complexity X2 of the module indicated by the module name “M2” to the module indicated by the module name “M2”. X2 is calculated. In this case, X2 = 1. Then, the test item importance calculation unit 14 causes the test item “C1”
The test item importance degree J1 is calculated based on the above equation 5. In this case, J1 = 5. Similarly, the test item importance calculation unit 14 calculates the test item importance J2 for the test item “C2” and the test item importance J3 for the test item “C3”. In this case J2 = 4,
J3 = 1.

As described above, since the test item importance can be determined without using past development information such as fault information, the test item importance of the newly developed system can be obtained. In the second embodiment, the module complexity X is calculated based on the above equation 4, but it is not always necessary to do this, and for example, it may be calculated based on the following equation 6, or the following equation 7 It may be calculated based on.

[0027]

[Equation 6]

[0028]

[Equation 7]

In the second embodiment, the test item importance degree J is calculated based on the above equation 5, but it is not always necessary to do so, and it may be calculated based on the following equation 8, or It may be calculated based on the following Expression 9.

[0030]

[Equation 8]

[0031]

[Equation 9]

In the second embodiment, the test item importance levels are calculated for all the test items managed by the test information management section 2, but the test item importance levels may be calculated only for specific test items. . (Embodiment 3) FIG. 9 is a block diagram of a test item importance evaluation apparatus according to a third embodiment of the present invention. This test item importance evaluation apparatus includes a test information management unit 2 and a test item importance calculation unit 24. The module includes a passage module name acquisition unit 7, a module information management unit 10, and a developer information management unit 11. The test information management unit 2 manages the test item information and the module name of the module through which the program passes when executing the test item. Test item importance calculator 24
Retrieves a test item from the test information management unit 2, causes the pass module name acquisition unit 7 to obtain all pass module names of the retrieved test items, and identifies the developer of the module indicated by the obtained pass module name. A test item in which the developer name is searched from the module information management unit 10, the capability index in the developer information having the searched developer name is searched from the developer information management unit 11, and the total of the searched capability indices is low. The higher the importance is set. The passing module name acquisition unit 7 obtains the module name of the module through which the program passes when executing the test items managed by the test information management unit 2. The module information management unit 10 manages module information including a module name and a developer name indicating a developer of the module identified by the module name for each module. Developer Information Management Department 11
Manages developer information including a developer name and a capability index indicating the capability of the developer identified by the developer name.

Next, the operation of the test item importance level evaluation apparatus will be described with reference to the flowchart of FIG. First, the test item importance degree calculation unit 24 receives all test items C1, C2, ..., From the test information management unit 2.
Cn is taken out (step S41). Next, the test item importance calculator 24 sets i = 0 (step S42).
Next, the test item importance degree calculation unit 24 increases the value of i by 1 (step S43). Next, the test item importance calculation section 24 operates the passage module name acquisition section 7 (step S44). Next, the passing module name acquisition unit 7
Is the module name of the module to be passed when executing the test item Ci, the passing module names N1, N2, ...
.., Nm are obtained (step S45). Next, the test item importance calculator 24 sets j = 0 (step S4).
6). Next, the test item importance calculation unit 24 sets the value of j to 1
Only (step S47). Next, the test item importance calculation unit 24 searches the developer information management unit 11 for the developer name Dj that identifies the developer of the module indicated by the passing module name Nj (step S48). Next, the test item importance calculation unit 24 searches the developer information management unit 11 for the capability index Aj of the developer name Dj (step S4).
9). Next, the test item importance calculation section 24 determines whether j = m (step S50), and if j = m is not satisfied, the process returns to step S47. If j = m, the test item importance calculator 24 obtains the test item importance Ji for the test item Ci (step S51). Next, the test item importance calculator 24 determines whether i = n (step S52), and if not i = n, step S43.
Return to. If i = n, this routine ends.

Next, an example of the operation of the test item importance level evaluation apparatus will be specifically described. Now, test information management section 2
11 manages the test information as shown in FIG. 11, the module information management unit 10 manages the module information as shown in FIG. 12, and the developer information management unit 11 manages the developer information as shown in FIG. It is assumed that In addition, the test item importance calculation unit 24 determines that the module names through which the program passes when the test item C is executed are N1, N2, and
, Nm, and the developer's capability index of these module names is A1, A2, ..., Am, the test item importance J is calculated based on the following formula 10. However, A0 = 5.

[0035]

[Equation 10]

First, the test item importance calculating section 24 receives the test items “C1”, “C2”,
Take out "C3". Furthermore, the test item importance calculation unit 2
4 executes the passing module name acquisition unit 7, whereby the passing module name acquisition unit 7 obtains the passing module names “M1” and “M2” when executing the test item “C1” from the test information management unit 2. Search for. Then, the test item importance calculation unit 24 searches the module information management unit 10 for the developer name “Shinkawa” of the module indicated by the passing module name “M1”. Furthermore, the test item importance degree calculation unit 24
Retrieves the capability index A1 = "1" of the developer name "Shinkawa" from the developer information management unit 11. Similarly, the test item importance calculation unit 24 searches for the capability index A2 = “2” of the developer name “Imagawa” of the module indicated by the passing module name “M2”. Further, the test item importance degree calculation unit 24 sets the test item importance degree J1 for the test item “C1” to the above formula 10
Calculate based on. In this case, J1 = 7. Similarly, the test item importance degree calculation unit 24 causes the test item “C
The test item importance J2 for “2” and the test item importance J3 for the test item “C3” are obtained. In this case, J2 = 4 and J3 = 5.

As described above, since the test item importance can be determined without using past development information such as failure information, the test item importance of the newly developed system can be obtained. In the third embodiment, the test item importance level J is calculated based on the above equation 10, but it is not always necessary to do this, and it may be calculated based on the following equation 11, for example, or It may be calculated based on 12.

[0038]

[Equation 11]

[0039]

[Equation 12]

In the third embodiment, the test item importance levels are calculated for all the test items managed by the test information management section 2, but the test item importance levels may be calculated only for specific test items. . In the third embodiment, the test item importance is calculated using only the capability index of the developer of the passing module of the test item, but the test item used in the first embodiment is included. Failure probability index of failure factors and the above-mentioned Example 2
It may be calculated by combining the complexity of the passing module of the relevant test item used in step 2.

[0041]

As described above, according to the present invention, a fault information management unit for managing fault information including a fault factor and a date and time of occurrence of a fault, and a test for managing test item information including a fault factor. An information management unit and a failure probability index indicating the degree of failure probability are calculated for each failure factor managed by the failure information management unit, and at that time,
A failure probability index is calculated by weighting the occurrence frequency of failures caused by the failure factor with the old and new occurrence times so that the failure occurrence date and time of the failure caused by the failure factor becomes larger as the failure factor becomes newer. Section and test item information from the test information management unit, let the failure probability index calculation unit find the failure probability index, and set the test item with a higher failure probability index to have a higher importance Since it has a test item importance calculator that can calculate the test item importance considering not only the frequency of failure occurrence but also the date and time of failure occurrence, the test item with a high probability of failure Can be accurately discovered, and the execution order of test items can be efficiently determined and selected.

When a module management unit that manages a module and a module name that identifies the module, a test information management unit that manages test item information, and a test item managed by the test information management unit are executed. The test items are extracted from the pass module name acquisition unit that obtains the module name of the module through which the program passes, the complexity analysis unit that obtains the module complexity, and the test information management unit, and all pass module names of those test items are obtained. Ask the passing module name acquisition unit to ask the complexity analysis unit for the complexity of all the modules indicated by the passing module names. The higher the total complexity of the modules indicated by the passing module name, the more important the test item is. If you have a test item importance calculator that sets the Since it is possible to determine the test items severity without using development information to, it is possible to obtain the test item importance of the new development system.

Further, a test information management unit for managing the test item information, a passing module name acquisition unit for obtaining the module name of the module through which the program passes when the test items managed by the test information management unit are executed, A module information management unit that manages module information for each module, including a module name and a developer name indicating the developer of the module identified by the module name, a developer name, and a developer identified by the developer name. The developer information management unit that manages the developer information including the capability index that represents the capability of each of the test items, and the test items are retrieved from the test information management unit, and the pass module name acquisition unit is requested to obtain all pass module names of those test items. , Module information management for each developer name that identifies the developer of the module indicated by the required module name Search from the department, and search the capability index in the developer information having the searched developer name from the developer information management department, and set the importance to the test item with the lower total of the searched capability index. If the calculation unit is provided, the test item importance can be determined without using past development information such as failure information. Therefore, the test item importance of the newly developed system can be obtained.

[Brief description of drawings]

FIG. 1 is a configuration diagram of a test item importance evaluation apparatus according to a first embodiment of the present invention.

FIG. 2 is a flowchart illustrating an operation of the test item importance evaluation device according to the first exemplary embodiment of the present invention.

FIG. 3 is an explanatory diagram of fault information managed by a fault information management unit.

FIG. 4 is an explanatory diagram of test information managed by a test information management unit.

FIG. 5 is a configuration diagram of a test item importance evaluation device according to a second embodiment of the present invention.

FIG. 6 is a flowchart illustrating an operation of the test item importance level evaluation apparatus according to the second exemplary embodiment of the present invention.

FIG. 7 is an explanatory diagram of contents of modules managed by a module management unit.

FIG. 8 is an explanatory diagram of test information managed by a test information management unit.

FIG. 9 is a configuration diagram of a test item importance evaluation device according to a third embodiment of the present invention.

FIG. 10 is a flowchart illustrating an operation of the test item importance level evaluation apparatus according to the third exemplary embodiment of the present invention.

FIG. 11 is an explanatory diagram of test information managed by a test information management unit.

FIG. 12 is an explanatory diagram of module information managed by a module information management unit.

FIG. 13 is an explanatory diagram of developer information managed by a developer information management unit.

[Explanation of symbols]

 1 Failure Information Management Section 2 Test Information Management Section 3 Failure Possibility Index Calculation Section 4 Test Item Importance Calculation Section 6 Module Management Section 7 Passed Module Name Acquisition Section 8 Complexity Analysis Section 10 Module Information Management Section 11 Developer Information Management Part 14 Test item importance calculator 24 Test item importance calculator

Claims (3)

[Claims] 1. A failure information management unit that manages failure information including a failure cause and a date and time of occurrence of a failure, a test information management unit that manages test item information including a failure factor, and a possibility of failure. The failure probability index indicating the degree of is calculated for each failure factor managed by the failure information management unit, and at this time, the failure occurrence date and time of the failure caused by the failure factor is more likely to occur. A failure probability index calculation unit that weights the occurrence frequency of the failure caused by the failure factor by the old and new occurrence times so that the sex index becomes large, and retrieves the test item information from the test information management unit,
And a test item importance calculation unit that causes the failure occurrence index calculation unit to obtain a failure probability index, and sets a test item importance level higher for test items including a failure factor with a larger failure occurrence index. Characteristic test item importance evaluation device. 2. A module management unit that manages a module and a module name that identifies the module, a test information management unit that manages test item information, and a test item managed by the test information management unit. If the program passes the module name of the module that passes the module name acquisition unit, the complexity analysis unit that calculates the complexity of the module, the test information management unit from the test items, all the pass modules of those test items Name is obtained by the passage module name acquisition unit, and the complexity of each of the modules indicated by the passage module names is obtained by the complexity analysis unit, and the total sum of the complexity of the modules indicated by the passage module name is high. It is equipped with a test item importance calculator that sets items with higher importance. Test items importance evaluation apparatus according to claim. 3. A test information management unit that manages test item information, and a passage module name acquisition unit that obtains a module name of a module through which a program passes when a test item managed by the test information management unit is executed. , A module information management unit that manages module information for each module, including the module name and a developer name indicating the developer of the module identified by the module name, and the development identified by the developer name and the developer name A developer information management unit that manages developer information including a capability index that represents the capability of each person, and retrieves test items from the test information management unit, and obtains all pass module names of those test items as the pass module name acquisition unit. And the developer name that identifies the developer of the module indicated by the obtained passing module name. Information from the developer information management section, the capability index in the developer information having the retrieved developer name is searched from the developer information management section, and the test items with a lower total of the retrieved capability index are set to have higher importance. A test item importance evaluation device, comprising: