JPH0580005A - Differential thermal balance - Google Patents

Differential thermal balance

Info

Publication number
JPH0580005A
JPH0580005A JP26836991A JP26836991A JPH0580005A JP H0580005 A JPH0580005 A JP H0580005A JP 26836991 A JP26836991 A JP 26836991A JP 26836991 A JP26836991 A JP 26836991A JP H0580005 A JPH0580005 A JP H0580005A
Authority
JP
Japan
Prior art keywords
balance
sample
feedback coil
side balance
reference material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26836991A
Other languages
Japanese (ja)
Inventor
Mitsumasa Uchiike
光正 内池
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP26836991A priority Critical patent/JPH0580005A/en
Publication of JPH0580005A publication Critical patent/JPH0580005A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

PURPOSE:To eliminate an influence due to difference in inclination of beam between a sample-side balance and a reference substance side balance. CONSTITUTION:A sensor 10a at a position-detection part of a reference substance side balance is fixed to a beam 4 of a sample side balance. When the weight of a measurement sample changes due to heating of sample pans of both balances, a current corresponding to the weight change flows to a feedback coil 12. However, when the beam 4 is balanced at a slightly inclined position, the sensor 10a at the reference substance side is displaced accordingly and a relative position with a shutter 8a also changes, thus enabling a current of a feedback coil 12a at the reference substance side to be changed and a beam 4a of the reference substance side balance also to be inclined by an amount which is equal to that of the beam 4 of the sample side balance.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は熱分析装置に利用される
熱天秤に関し、特にビームの一端に試料皿、他端にセン
サとシャッタとからなる位置検出部を備え、ビームのバ
ランスをとるフィードバックコイルを備えた天秤が試料
側と基準物質側とにそれぞれ一組ずつ設けられた差動形
熱天秤に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermobalance used in a thermal analysis apparatus, and more particularly to a feedback for balancing a beam, which is provided with a sample plate at one end of the beam and a position detecting section composed of a sensor and a shutter at the other end. The present invention relates to a differential thermal balance in which a balance equipped with a coil is provided on each of a sample side and a reference material side.

【0002】[0002]

【従来の技術】熱天秤から得られる重量変化の信号から
天秤自身に起因する信号のドリフトなどの影響を除くた
め、測定試料を乗せた試料側天秤と、それと同じ構造を
もち試料を乗せない基準物質側天秤をできるだけ同一条
件において、試料側天秤の検出信号から基準物質側天秤
の検出信号を差し引く差動形熱天秤が用いられている。
2. Description of the Related Art In order to eliminate the influence of signal drift caused by the balance itself from the signal of the weight change obtained from a thermobalance, a sample side balance on which a measurement sample is placed, and a standard with the same structure as that for not placing a sample A differential thermobalance is used in which the detection signal of the reference material side balance is subtracted from the detection signal of the sample side balance under the same conditions as possible for the material side balance.

【0003】[0003]

【発明が解決しようとする課題】差動形熱天秤で測定を
行なうと、測定試料の重量変化が生じたとき、位置検出
部のシャッタが変位し、それをセンサが検出してシャッ
タが元の位置に戻るようにビームの傾きをなくすように
フィードバックコイルに電流が流される。その電流が重
量信号として検出される。しかし、傾いたビームはフィ
ードバックコイルに通電することにより元の状態に戻さ
れようとするが、正しく元の状態までは戻らず、僅かに
傾いた状態で停止する。一方、試料を乗せない天秤はビ
ームが傾かないので、試料側天秤のビームと基準物質側
天秤のビームに傾きの差が生じる。天秤の支点としては
例えばトーションバンドや弾性支点が用いられている
が、これらの支点ではビームの傾き角により支点に加わ
る力が変わるので、試料側天秤と基準物質側天秤とでビ
ームの傾きに差が生じているときは、支点での力の影響
が検出信号に誤差として現われることになる。本発明は
試料側天秤と基準物質側天秤とのビームの傾きの差によ
る影響を除くことのできる差動形熱天秤を提供すること
を目的とするものである。
When a differential thermal balance is used for measurement, when the weight of the sample to be measured changes, the shutter of the position detecting section is displaced, and the sensor detects it, and the shutter is released. Current is applied to the feedback coil so as to eliminate the tilt of the beam to return to the position. The current is detected as a weight signal. However, although the tilted beam tries to be returned to the original state by energizing the feedback coil, it does not return to the original state correctly, and stops in a slightly tilted state. On the other hand, since the beam does not tilt in the balance on which the sample is not placed, a difference in tilt occurs between the beam of the sample side balance and the beam of the reference material side balance. As the fulcrum of the balance, for example, a torsion band or an elastic fulcrum is used, but the force applied to the fulcrum changes depending on the tilt angle of the beam at these fulcrums. When occurs, the influence of the force at the fulcrum appears as an error in the detection signal. An object of the present invention is to provide a differential type thermobalance capable of eliminating the influence of the difference in beam tilt between the sample side balance and the reference material side balance.

【0004】[0004]

【課題を解決するための手段】本発明では両天秤のビー
ムの傾きを等しくする。そのため、本発明では、基準物
質側天秤の位置検出部のセンサを試料側天秤のビームに
固定するか、又は基準物質側天秤のフィードバックコイ
ルに接近して試料側天秤のフィードバックコイルに流れ
る電流を試料側天秤とは逆方向に流す第2のフィードバ
ックコイルを設ける。
In the present invention, the tilts of the beams of both balances are made equal. Therefore, in the present invention, the sensor of the position detection unit of the reference material side balance is fixed to the beam of the sample side balance, or the current flowing in the feedback coil of the sample side balance is approached to the feedback coil of the reference material side balance. A second feedback coil is provided that flows in the opposite direction to the side balance.

【0005】[0005]

【作用】基準物質側天秤の位置検出部のセンサを試料側
天秤のビームに固定する発明では、試料側天秤のビーム
が試料の重量変化により傾くとそのビームの傾きに対応
して基準物質側天秤の位置検出部のセンサが変位し、そ
れにつれて基準物質側天秤のビームが試料側天秤のビー
ムと同じ角度だけ傾く。基準物質側天秤のフィードバッ
クコイルに接近して試料側天秤のフィードバックコイル
に流れる電流を試料側天秤とは逆方向に流す第2のフィ
ードバックコイルを設ける発明では、試料の重量変化に
より試料側天秤のビームが傾くと、基準物質側天秤の第
2のフィードバックコイルを通して基準物質側天秤にか
かる力が変化するので、その分だけ基準物質側天秤のビ
ームも傾く。このように、試料の重量変化により試料側
天秤のビームが少し傾いた状態でバランスがとられる
と、基準物質側天秤でも同じ傾きだけビームが傾いた状
態でバランスがとられ、両天秤間でビームの傾きの差の
影響はなくなる。
In the invention in which the sensor of the position detecting section of the reference material side balance is fixed to the beam of the sample side balance, when the beam of the sample side balance tilts due to the weight change of the sample, the reference material side balance corresponds to the tilt of the beam. The sensor of the position detecting section of (1) is displaced, and the beam of the reference material side balance is tilted by the same angle as the beam of the sample side balance accordingly. In the invention in which a second feedback coil is provided which causes a current flowing in the feedback coil of the sample side balance to approach the feedback coil of the reference material side balance in a direction opposite to that of the sample side balance, the beam of the sample side balance is changed by the weight change of the sample. Is tilted, the force applied to the reference material side balance through the second feedback coil of the reference material side balance is changed, so that the beam of the reference material side balance is tilted accordingly. In this way, if the balance of the beam on the sample side balance is slightly tilted due to the weight change of the sample, the balance is also maintained on the reference material side balance with the beam tilted by the same tilt, and the beam between the two balances is balanced. The influence of the difference in the slope of is eliminated.

【0006】[0006]

【実施例】図1は請求項1の発明に対応した一実施例を
表わす。図2は図1の実施例における位置検出部の部分
拡大図である。試料側天秤Sではトーションバンドによ
る支点2を中心に回転するビーム4の一端に試料を乗せ
る試料皿6が固定され、ビーム4の他端にはシャッタ8
が取りつけられている。シャッタ8は天秤装置本体に固
定されたセンサ10と組み合わされて、位置検出部を構
成している。センサ10は例えばLEDとフォトトラン
ジスタからなる光学式のものである。ビーム4の中間位
置にはフィードバックコイル12が取りつけられ、フィ
ードバックコイル12は永久磁石14に挿入されて組み
合わされている。位置検出部のシャッタ8がセンサ10
の一定の位置に来るように、フィードバックコイル12
に電流を流して力を発生させるフィードバックコイル電
流発生回路(図示略)が設けられており、その電流が重
量信号として検出される。
FIG. 1 shows an embodiment corresponding to the invention of claim 1. FIG. 2 is a partially enlarged view of the position detector in the embodiment of FIG. In the sample side balance S, a sample pan 6 on which a sample is placed is fixed to one end of a beam 4 which rotates around a fulcrum 2 by a torsion band, and a shutter 8 is attached to the other end of the beam 4.
Is installed. The shutter 8 is combined with a sensor 10 fixed to the main body of the balance device to form a position detector. The sensor 10 is of an optical type including, for example, an LED and a phototransistor. A feedback coil 12 is attached to an intermediate position of the beam 4, and the feedback coil 12 is inserted into a permanent magnet 14 to be assembled. The shutter 8 of the position detector is a sensor 10
Feedback coil 12 so that it comes to a fixed position in
A feedback coil current generation circuit (not shown) for supplying a current to generate a force is provided, and the current is detected as a weight signal.

【0007】基準物質側天秤Bも同じ構成をとってい
る。ただし、基準物質側天秤Rではその位置検出部のセ
ンサ10aは図2に示されるように固定金具16を介し
て試料側天秤のビーム4に固定されている。基準物質側
天秤Rの各部を試料側天秤Sの各部と区別するために、
基準物質側天秤Rの各部の記号にはaを付けてある。
The reference material side balance B has the same structure. However, in the reference substance side balance R, the sensor 10a of the position detecting portion is fixed to the beam 4 of the sample side balance via the fixing metal fitting 16 as shown in FIG. In order to distinguish each part of the reference material side balance R from each part of the sample side balance S,
The symbol a for each part of the reference substance side balance R is attached.

【0008】測定時は、試料側天秤の試料皿6には測定
試料を乗せ、基準物質側天秤の試料皿6aには何も乗せ
ないで、両試料皿6,6aを同じ加熱炉に挿入して加熱
する。両天秤の試料皿の加熱により、測定試料の重量が
変化すると、フィードバックコイル12に重量変化に応
じた電流が流れるが、ビーム4が僅かに傾いた位置でバ
ランスがとられると、それにつれて基準物質側のセンサ
10aが変位し、シャッタ8aとの相対位置が変化する
ので、基準物質側のフィードバックコイル12aの電流
が変化し、基準物質側天秤のビーム4aも試料側天秤の
ビーム4と同じだけ傾く。
At the time of measurement, the measurement sample is placed on the sample dish 6 of the sample side balance, and nothing is placed on the sample dish 6a of the reference material side balance. To heat. When the weight of the sample to be measured changes due to the heating of the sample pan of the double balance, a current according to the change in weight flows to the feedback coil 12, but when the beam 4 is balanced at a slightly tilted position, the reference material is changed accordingly. Since the sensor 10a on the side is displaced and the relative position to the shutter 8a is changed, the current of the feedback coil 12a on the reference material side is changed, and the beam 4a of the reference material side balance is tilted by the same amount as the beam 4 of the sample side balance. ..

【0009】図3は請求項2に対応した実施例を表わ
す。図3(A)は試料側と基準物質側の両天秤を表わ
し、(B)はフィードバックコイルの結合関係を表わし
ている。両天秤の構造は図1に示されたものと同じであ
るが、基準物質側天秤Rのセンサ10aは試料側天秤の
ビーム4に固定されているのではなく、試料側のセンサ
10と同じく天秤装置本体に固定されている。試料側天
秤のフィードバックコイル12と基準物質側天秤のフィ
ードバックコイル12aはそれぞれのコアに同方向に巻
かれているが、基準物質側天秤のコアにはフィードバッ
クコイル12aの他に反対方向に巻かれた第2のフィー
ドバックコイル20が巻かれている。試料側のフィード
バックコイル12はフィードバックコイル電流発生回路
22に接続されているとともに、基準物質側のコアに巻
かれた第2のフィードバックコイル20と接続されてい
る。24は基準物質側天秤のフィードバックコイル12
aのフィードバックコイル電流発生回路である。
FIG. 3 shows an embodiment corresponding to claim 2. FIG. 3 (A) shows the balance on both the sample side and the reference material side, and FIG. 3 (B) shows the coupling relationship of the feedback coils. The structure of both balances is the same as that shown in FIG. 1, but the sensor 10a of the reference material side balance R is not fixed to the beam 4 of the sample side balance, but is the same as the sample side sensor 10. It is fixed to the device body. The feedback coil 12 of the sample side balance and the feedback coil 12a of the reference material side balance are wound in the same direction on the respective cores, but in the core of the reference material side balance is wound in the opposite direction in addition to the feedback coil 12a. The second feedback coil 20 is wound. The sample side feedback coil 12 is connected to the feedback coil current generation circuit 22 and also connected to the second feedback coil 20 wound around the core on the reference material side. 24 is the feedback coil 12 of the reference material side balance
It is a feedback coil current generation circuit of a.

【0010】図3の実施例では両天秤の構造は図1と同
じであるが、位置検出部のセンサはそれぞれ独立し、そ
の代わりに試料側天秤のフィードバックコイル12に流
れた電流が基準物質側のフィードバックコイル12aに
も流れるようになっている。測定試料が温度により重量
変化を起こしたときに試料側フィードバックコイル12
に電流Isが流れ、基準物質側フィードバックコイル1
2aに電流Irが流れるとする。 Is=Iδw−Iθ である。Iδwは試料の重量変化に対応した電流であ
り、Iθはビーム4の支点の傾きθの影響により流れる
電流である。一方、基準物質側の第2のフィードバック
コイル20には電流Isが逆方向に流れるので、それに
より発生するビーム4aの傾きを打ち消すために、フィ
ードバックコイル12aにはIsと、ビーム4aのバラ
ンス位置における傾きθの影響による電流Iθとの差、
すなわち Ir=Is−Iθ =Iδw−2Iθ が流れる。両天秤の検出信号から重量変化を求めるに
は、試料側の信号Isを2倍に増幅してから基準物質側
の信号Irを引くことにより、ビームの傾きの影響を打
ち消して重量変化の信号Iδwを求めることができる。
In the embodiment of FIG. 3, the structure of both balances is the same as that of FIG. 1, but the sensors of the position detecting section are independent of each other, and instead the current flowing in the feedback coil 12 of the sample side balance is on the reference material side The feedback coil 12a also flows. Feedback coil 12 on the sample side when the measurement sample changes in weight due to temperature
Current Is flows to the reference material side feedback coil 1
It is assumed that the current Ir flows through 2a. Is = Iδw-Iθ. Iδw is a current corresponding to the weight change of the sample, and Iθ is a current flowing due to the influence of the inclination θ of the fulcrum of the beam 4. On the other hand, since the current Is flows in the opposite direction in the second feedback coil 20 on the reference material side, in order to cancel the inclination of the beam 4a generated thereby, Is and the beam 4a at the balance position in the feedback coil 12a are canceled. The difference from the current Iθ due to the influence of the inclination θ,
That is, Ir = Is−Iθ = Iδw−2Iθ flows. In order to obtain the weight change from the detection signal of the two balances, the signal Is on the sample side is amplified twice and then the signal Ir on the reference material side is subtracted to cancel the influence of the tilt of the beam and the signal Iδw of the weight change. Can be asked.

【0011】図4は弾性支点の他の例を表わしたもので
ある。中央に屈曲部26をもち、下側の穴に支持棒が通
されて支持され、上側の穴30にはビームが通されてビ
ームを弾性的に支持する。
FIG. 4 shows another example of the elastic fulcrum. A bent portion 26 is provided at the center, a support rod is inserted into and supported by a lower hole, and a beam is inserted through an upper hole 30 to elastically support the beam.

【0012】[0012]

【発明の効果】本発明では基準物質側天秤の位置検出部
のセンサを試料側天秤のビームに固定するか、又は基準
物質側天秤のフィードバックコイルに接近して試料側天
秤のフィードバックコイルに流れる電流を試料側天秤と
は逆方向に流す第2のフィードバックコイルを設けて、
試料側と基準物質側の両天秤のビームが常に同じ傾きを
もつようにしたので、2つの天秤の検出信号の差をとる
ことにより、ビームの傾きの影響のない測定を行なうこ
とができる。
According to the present invention, the sensor of the position detecting portion of the reference material side balance is fixed to the beam of the sample side balance, or the current flowing in the feedback coil of the sample side balance approaches the feedback coil of the reference material side balance. Is provided with a second feedback coil that flows in the opposite direction to the sample side balance,
Since the beams of both the balance on the sample side and the beam on the reference substance side always have the same inclination, by taking the difference between the detection signals of the two balances, the measurement without the influence of the inclination of the beam can be performed.

【図面の簡単な説明】[Brief description of drawings]

【図1】請求項1に対応する実施例を示す概略斜視図で
ある。
FIG. 1 is a schematic perspective view showing an embodiment corresponding to claim 1. FIG.

【図2】図1の実施例の位置検出部を示す拡大斜視図で
ある。
FIG. 2 is an enlarged perspective view showing a position detector of the embodiment of FIG.

【図3】請求項2に対応した実施例を表わす図であり、
(A)は天秤機構の斜視図、(B)はフィードバックコ
イルの接続関係を示す回路図である。
FIG. 3 is a diagram showing an embodiment corresponding to claim 2;
(A) is a perspective view of the balance mechanism, (B) is a circuit diagram showing the connection relationship of the feedback coil.

【図4】実施例で用いられる支点の一例としての弾性支
点を示す斜視図である。
FIG. 4 is a perspective view showing an elastic fulcrum as an example of a fulcrum used in the embodiment.

【符号の説明】[Explanation of symbols]

S 試料側天秤 R 基準物質側天秤 2,2a 支点 4,4a ビーム 6,6a 試料皿 8,8a シャッタ 10,10a センサ 12,12a フィードバックコイル 14,14a 永久磁石 20 第2のフィードバックコイル S sample side balance R reference material side balance 2,2a fulcrum 4,4a beam 6,6a sample dish 8,8a shutter 10,10a sensor 12,12a feedback coil 14,14a permanent magnet 20 second feedback coil

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ビームの一端に試料皿、他端にセンサと
シャッタとからなる位置検出部を備え、ビームのバラン
スをとるフィードバックコイルを備えた天秤が試料側と
基準物質側とにそれぞれ一組ずつ設けられ、基準物質側
天秤の位置検出部のセンサが試料側天秤のビームに固定
されている差動形熱天秤。
1. A balance having a sample dish at one end of the beam and a position detection unit comprising a sensor and a shutter at the other end, and a balance equipped with a feedback coil for the beam, one set on each of the sample side and the reference substance side. A differential thermobalance, in which the sensors of the position detection part of the reference material side balance are fixed to the beam of the sample side balance.
【請求項2】 ビームの一端に試料皿、他端にセンサと
シャッタとからなる位置検出部を備え、ビームのバラン
スをとるフィードバックコイルを備えた天秤が試料側と
基準物質側とにそれぞれ一組ずつ設けられ、基準物質側
天秤のフィードバックコイルに接近して更に、試料側天
秤のフィードバックコイルに流れる電流を試料側天秤と
は逆方向に流す第2のフィードバックコイルが設けられ
ている差動形熱天秤。
2. A balance having a sample dish at one end of the beam and a position detection unit composed of a sensor and a shutter at the other end, and a feedback coil for balancing the beam, one set each on the sample side and the reference substance side. The differential type heat generator is provided with a second feedback coil that is provided for each of them and that is close to the feedback coil of the reference material side balance and further causes a current flowing in the feedback coil of the sample side balance to flow in the opposite direction to the sample side balance. Balance.
JP26836991A 1991-09-18 1991-09-18 Differential thermal balance Pending JPH0580005A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26836991A JPH0580005A (en) 1991-09-18 1991-09-18 Differential thermal balance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26836991A JPH0580005A (en) 1991-09-18 1991-09-18 Differential thermal balance

Publications (1)

Publication Number Publication Date
JPH0580005A true JPH0580005A (en) 1993-03-30

Family

ID=17457551

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26836991A Pending JPH0580005A (en) 1991-09-18 1991-09-18 Differential thermal balance

Country Status (1)

Country Link
JP (1) JPH0580005A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5638026A (en) * 1994-07-29 1997-06-10 Kabushiki Kaisha Toshiba High input impedance circuit and semiconductor integrated device provided therewith
JP2012525593A (en) * 2009-04-29 2012-10-22 ウオーターズ・テクノロジーズ・コーポレイシヨン Simultaneous differential thermal analysis system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5638026A (en) * 1994-07-29 1997-06-10 Kabushiki Kaisha Toshiba High input impedance circuit and semiconductor integrated device provided therewith
JP2012525593A (en) * 2009-04-29 2012-10-22 ウオーターズ・テクノロジーズ・コーポレイシヨン Simultaneous differential thermal analysis system

Similar Documents

Publication Publication Date Title
JPH0569452B2 (en)
JP2987470B2 (en) Cooking device
JPH031604B2 (en)
JP2637230B2 (en) Electronic scales
JPH0580005A (en) Differential thermal balance
JP2864628B2 (en) Differential differential thermal analyzer
JP3135081B2 (en) Furnace unit of differential scanning calorimeter
JP2012068250A (en) Weighing apparatus, especially weighing apparatus to be actuated by electromagnetic force compensation principle
JPS63277936A (en) Electronic scale
JP2004271193A (en) Weight measuring device and weight measuring method of cooker
JP2503970Y2 (en) Electromagnetic load compensation type electric load weighing device
JP3647022B2 (en) Rotation amount detection device for thermobalance device
JP2724986B2 (en) Differential thermobalance
JPH05264327A (en) Apparatus for thermogravimetry
JP3588941B2 (en) Electronic balance
JPH0334660Y2 (en)
JP3191525B2 (en) Electronic balance
JP2650574B2 (en) Magnetic field mass spectrometer
JPH08184545A (en) Thermobalance
JPH0618268Y2 (en) Displacement meter for measuring test pieces
JPH05302844A (en) Electronic balance
JPS6142110Y2 (en)
JPS61139716A (en) Inclination angle sensor
JPH06221982A (en) Thermogravimetry apparatus
JP3129517B2 (en) Thermobalance