JPH0578885A - Electroplating apparatus - Google Patents

Electroplating apparatus

Info

Publication number
JPH0578885A
JPH0578885A JP27035291A JP27035291A JPH0578885A JP H0578885 A JPH0578885 A JP H0578885A JP 27035291 A JP27035291 A JP 27035291A JP 27035291 A JP27035291 A JP 27035291A JP H0578885 A JPH0578885 A JP H0578885A
Authority
JP
Japan
Prior art keywords
plated
plating
magnetic field
metal ions
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP27035291A
Other languages
Japanese (ja)
Inventor
Takashi Sotodani
高志 外谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp, Omron Tateisi Electronics Co filed Critical Omron Corp
Priority to JP27035291A priority Critical patent/JPH0578885A/en
Publication of JPH0578885A publication Critical patent/JPH0578885A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form a high quality plating film by electroplating at a high speed. CONSTITUTION:An electric conductive body 3 to be plated and an electrode 4 are immersed in a plating soln. 2 in a plating tank 1 so that they confront each other. A DC power source 6 is connected to the body 3 to be plated and the electrode 4 so that the body 3 acts as the cathode and the electrode 4 acts as the anode. Magnetic field generators 8 for applying a magnetic field H are arranged near the body 3 to be plated. Metal ions 5 are trapped near the body 3 by the magnetic field H.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は電解メッキ装置に関す
る。具体的にいうと、本発明は、メッキ液中に浸漬され
た被メッキ物と電極間に電圧を印加することにより被メ
ッキ物にメッキを施す電解メッキ装置に関する。
FIELD OF THE INVENTION The present invention relates to an electrolytic plating apparatus. More specifically, the present invention relates to an electroplating apparatus that performs plating on an object to be plated by applying a voltage between the object to be plated immersed in a plating solution and an electrode.

【0002】[0002]

【従来の技術】図3は従来の電解メッキ装置Bの概略構
成を示す。この電解メッキ装置Bにあっては、メッキ槽
1内に保持されたメッキ液2中に導電性の被メッキ物3
及び電極4を浸漬し、被メッキ物3が陰極となり、電極
4が陽極となるよう被メッキ物3及び電極4に外部から
直流電源6を接続している。
2. Description of the Related Art FIG. 3 shows a schematic structure of a conventional electrolytic plating apparatus B. In this electroplating apparatus B, the electroconductive object 3 to be plated is contained in the plating solution 2 held in the plating tank 1.
A DC power source 6 is externally connected to the object to be plated 3 and the electrode 4 so that the object to be plated 3 serves as a cathode and the electrode 4 serves as an anode.

【0003】しかして、直流電源6から電流を供給する
と、メッキ液2中の金属イオン5は被メッキ物3に引か
れて移動し、被メッキ物3の表面で金属イオン5と直流
電源6から供給された電子が結合してメッキ金属が析出
する。
However, when an electric current is supplied from the DC power source 6, the metal ions 5 in the plating solution 2 are attracted to and moved by the object 3 to be plated, and the metal ions 5 and the DC power source 6 on the surface of the object 3 to be plated. The supplied electrons combine to deposit the plating metal.

【0004】しかしながら、このような電解メッキ装置
Bにあっては、金属イオン5が被メッキ物3の表面に析
出して金属イオン5が消費されるに従い、被メッキ物3
の近傍における金属イオン濃度が低下し、メッキ速度を
低下させる原因となっていた。
However, in such an electrolytic plating apparatus B, as the metal ions 5 are deposited on the surface of the object 3 to be plated and the metal ions 5 are consumed, the object 3 to be plated is consumed.
The concentration of metal ions in the vicinity of was decreased, which caused a decrease in plating rate.

【0005】図4は従来の別な電解メッキ装置Cの概略
構成を示す。この電解メッキ装置Cは、メッキ液2を噴
流によって攪拌するための攪拌翼等の噴流発生装置7を
メッキ槽1内に設けたものである。
FIG. 4 shows a schematic structure of another conventional electrolytic plating apparatus C. The electrolytic plating apparatus C is provided with a jet flow generator 7 such as a stirring blade for stirring the plating liquid 2 by a jet flow in the plating tank 1.

【0006】しかして、噴流によってメッキ液2を攪拌
し、被メッキ物3の近傍の金属イオン5が希薄となった
領域へ金属イオン5を豊富に含んだメッキ液2を常に供
給し、被メッキ物3の近傍における金属イオン濃度の低
下を防止している。
However, the plating solution 2 is agitated by the jet flow, and the plating solution 2 rich in the metal ions 5 is constantly supplied to the region where the metal ions 5 are diluted in the vicinity of the object 3 to be plated, to be plated. The decrease of the metal ion concentration in the vicinity of the object 3 is prevented.

【0007】しかしながら、この噴流式の電解メッキ装
置Cにあっては、メッキ液2を攪拌しているため、メッ
キ液2の流速分布や渦が発生し、その影響でメッキ被膜
の膜厚や膜質にバラツキが生じたり、メッキ被膜の表面
に条痕等の傷が生じ易かった。
However, in this jet type electrolytic plating apparatus C, since the plating solution 2 is agitated, a flow velocity distribution and vortices of the plating solution 2 are generated, and the thickness and quality of the plating film are affected by the vortex distribution. Unevenness and scratches on the surface of the plating film were likely to occur.

【0008】[0008]

【発明が解決しようとする課題】本発明は叙上の従来例
の欠点に鑑みてなされたものであり、その目的とすると
ころは、金属イオン濃度の低下によるメッキ速度の低下
を防止し、メッキ被膜の膜厚や膜質等のバラツキ等を防
止することができる電解メッキ装置を提供することにあ
る。
SUMMARY OF THE INVENTION The present invention has been made in view of the drawbacks of the above conventional examples, and an object of the present invention is to prevent a decrease in plating rate due to a decrease in metal ion concentration and to prevent plating. An object of the present invention is to provide an electrolytic plating apparatus capable of preventing variations in film thickness, film quality and the like.

【0009】[0009]

【課題を解決するための手段】本発明の電解メッキ装置
は、メッキ液中に被メッキ物と電極を浸漬し、被メッキ
物と電極間に電圧を印加することにより被メッキ物にメ
ッキを施す電解メッキ装置において、被メッキ物の近傍
に磁場を印加させるための磁場発生装置を備えたことを
特徴としている。
In the electrolytic plating apparatus of the present invention, an object to be plated and an electrode are immersed in a plating solution, and a voltage is applied between the object to be plated and the electrode to plate the object to be plated. The electrolytic plating apparatus is characterized by including a magnetic field generator for applying a magnetic field near the object to be plated.

【0010】[0010]

【作用】磁場発生装置により被メッキ物近傍に磁場を印
加すると、金属イオンが被メッキ物の近傍で次々にトラ
ップされ、被メッキ物近傍での金属イオン濃度が高くな
る。従って、被メッキ物近傍における金属イオン濃度を
常に高く保つことができ、メッキ速度の低下を防止する
ことができる。しかも、磁場によって金属イオンのみを
運動させることができ、メッキ液自体は攪拌されないの
で、メッキ液の流速分布や渦等が発生せず、メッキ被膜
の膜厚や膜質を均一にすることができる。
When a magnetic field is applied near the object to be plated by the magnetic field generator, metal ions are successively trapped near the object to be plated, and the concentration of metal ions near the object to be plated increases. Therefore, the metal ion concentration in the vicinity of the object to be plated can always be kept high, and a decrease in plating rate can be prevented. Moreover, since only the metal ions can be moved by the magnetic field and the plating solution itself is not agitated, flow velocity distribution of the plating solution, vortices, etc. do not occur, and the film thickness and film quality of the plating film can be made uniform.

【0011】[0011]

【実施例】図1は本発明の一実施例による電解メッキ装
置Aの概略構成を示す。1はメッキ液2を保持するメッ
キ槽であって、導電性の被メッキ物3及び電極4は対向
するようにしてメッキ液2内に浸漬され、被メッキ物3
及び電極4はそれぞれ陰極及び陽極となるようにして外
部の直流電源6を接続されている。また、メッキ槽1の
外側には被メッキ物3の近傍においてメッキ液2に磁場
Hを印加するための永久磁石や電磁石等の磁場発生装置
8を設けてある。磁場発生装置8によって発生させられ
た磁場Hは、被メッキ物3と電極4の間に働く電界の方
向と直交しており、被メッキ物4の表面と平行な方向を
向いている。
FIG. 1 shows a schematic structure of an electrolytic plating apparatus A according to an embodiment of the present invention. Reference numeral 1 denotes a plating tank for holding a plating solution 2 in which the conductive object 3 and the electrode 4 are immersed in the plating solution 2 so as to face each other.
An external DC power source 6 is connected to the electrodes 4 and 4 so as to serve as a cathode and an anode, respectively. A magnetic field generator 8 such as a permanent magnet or an electromagnet for applying a magnetic field H to the plating solution 2 is provided near the object 3 to be plated outside the plating tank 1. The magnetic field H generated by the magnetic field generator 8 is orthogonal to the direction of the electric field acting between the object to be plated 3 and the electrode 4, and is parallel to the surface of the object to be plated 4.

【0012】メッキ液2中においては、金属イオン5は
液中の他の分子やイオンと衝突しながらランダムに移動
(ブラウン運動)している。そして、ランダムに移動し
ている金属イオン5が磁場H中に入ると、図2に示すよ
うに螺旋運動(サイクロトロン運動)しながら移動す
る。たとえ途中で他の分子やイオンに衝突して方向が変
っても、やはり磁場H中で螺旋運動しながら移動する。
その結果、一旦磁場H中に捕獲された金属イオン5は磁
場H中から出ることが困難になる。こうして、磁場H中
に次々と金属イオン5が捕獲されてゆくと、磁場Hの近
傍、すなわち被メッキ物3の近傍で金属イオン濃度が高
くなり、メッキに十分な金属イオン5が供給される。し
たがって、メッキ液2中の金属イオン5が被メッキ物3
と電極4との間の電界に引かれて被メッキ物3の表面に
析出しても、金属メッキ濃度が低下することがない。ま
た、金属イオン5の螺旋運動によって被メッキ物3の近
傍で金属イオン5が均一に攪拌される。
In the plating solution 2, the metal ions 5 randomly move (Brownian motion) while colliding with other molecules and ions in the solution. Then, when the randomly moving metal ions 5 enter the magnetic field H, they move in a spiral motion (cyclotron motion) as shown in FIG. Even if it collides with other molecules or ions on the way and the direction is changed, it still moves while spiraling in the magnetic field H.
As a result, it becomes difficult for the metal ions 5 once trapped in the magnetic field H to leave the magnetic field H. In this way, when the metal ions 5 are successively captured in the magnetic field H, the metal ion concentration increases near the magnetic field H, that is, in the vicinity of the object 3 to be plated, and the metal ions 5 sufficient for plating are supplied. Therefore, the metal ions 5 in the plating solution 2 are not included in the plating target 3
Even if it is attracted to the surface of the object 3 to be plated by the electric field between the electrode 4 and the electrode 4, the metal plating concentration does not decrease. Further, the spiral movement of the metal ions 5 causes the metal ions 5 to be uniformly stirred in the vicinity of the object 3 to be plated.

【0013】しかして、被メッキ物3の近傍でメッキ液
2の金属イオン濃度が低下しにくくなるので、メッキ速
度の低下が防止され、高速でメッキ被膜を形成すること
ができる。しかも、金属イオン5が磁場Hによって運動
させられるだけで、メッキ液2自体は動かないので、メ
ッキ液2の流速分布や渦が発生せず、均一な膜厚及び膜
質のメッキ被膜を形成することができる。
However, since the metal ion concentration of the plating solution 2 is less likely to decrease near the object 3 to be plated, the decrease in plating speed is prevented and the plating film can be formed at high speed. In addition, since the metal ions 5 are only moved by the magnetic field H and the plating solution 2 itself does not move, a flow velocity distribution and vortices of the plating solution 2 do not occur, and a plating film having a uniform film thickness and film quality is formed. You can

【0014】なお、上記実施例では、磁場発生装置は磁
場方向が被メッキ物の表面と平行な(電界と垂直な)方
向を向くように配置したが、被メッキ物の近傍に磁場が
印加されていれば、これ以外の方向でも差し支えない。
例えば、磁場方向が被メッキ物の表面と垂直な(電界と
平行な)方向を向くよう磁場発生装置を配置しても良
い。
In the above embodiment, the magnetic field generator is arranged so that the magnetic field direction is parallel to the surface of the object to be plated (perpendicular to the electric field), but a magnetic field is applied near the object to be plated. If so, it does not matter in other directions.
For example, the magnetic field generator may be arranged so that the magnetic field direction is perpendicular to the surface of the object to be plated (parallel to the electric field).

【0015】[0015]

【発明の効果】本発明によれば、磁場で金属イオンをト
ラップできるので、被メッキ物近傍を常に金属イオンの
豊富な状態とすることができ、メッキ速度の低下を防止
することができる。また、メッキ液を攪拌する方法と異
なり、メッキ液の流速分布や渦等が発生せず、メッキ被
膜の膜厚や膜質のバラツキを低減することができ、条痕
等の傷も発生しない。従って、高速で高品質のメッキ被
膜を形成することができる。
According to the present invention, since the metal ions can be trapped by the magnetic field, the vicinity of the object to be plated can be always rich in metal ions, and the reduction of the plating rate can be prevented. Further, unlike the method of stirring the plating solution, the flow rate distribution of the plating solution, vortices, etc. do not occur, it is possible to reduce variations in the film thickness and film quality of the plating film, and scratches such as scratches do not occur. Therefore, a high quality plating film can be formed at high speed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による電解メッキ装置の概略
構成図である。
FIG. 1 is a schematic configuration diagram of an electrolytic plating apparatus according to an embodiment of the present invention.

【図2】同上の実施例における磁場中の金属イオンの螺
旋運動を示す説明図である。
FIG. 2 is an explanatory diagram showing spiral motion of metal ions in a magnetic field in the example of the same.

【図3】従来例による電解メッキ装置の概略構成図であ
る。
FIG. 3 is a schematic configuration diagram of an electrolytic plating apparatus according to a conventional example.

【図4】別な従来例による電解メッキ装置の概略構成図
である。
FIG. 4 is a schematic configuration diagram of an electrolytic plating apparatus according to another conventional example.

【符号の説明】[Explanation of symbols]

2 メッキ液 3 被メッキ物 4 電極 8 磁場発生装置 2 plating liquid 3 object to be plated 4 electrode 8 magnetic field generator

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 メッキ液中に被メッキ物と電極を浸漬
し、被メッキ物と電極間に電圧を印加することにより被
メッキ物にメッキを施す電解メッキ装置において、 被メッキ物の近傍に磁場を印加させるための磁場発生装
置を備えたことを特徴とする電解メッキ装置。
1. An electrolytic plating apparatus for immersing an object to be plated and an electrode in a plating solution and applying a voltage between the object to be plated and the electrode to plate the object to be plated, wherein a magnetic field is present near the object to be plated. An electrolytic plating apparatus comprising a magnetic field generator for applying a magnetic field.
JP27035291A 1991-09-20 1991-09-20 Electroplating apparatus Pending JPH0578885A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27035291A JPH0578885A (en) 1991-09-20 1991-09-20 Electroplating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27035291A JPH0578885A (en) 1991-09-20 1991-09-20 Electroplating apparatus

Publications (1)

Publication Number Publication Date
JPH0578885A true JPH0578885A (en) 1993-03-30

Family

ID=17485071

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27035291A Pending JPH0578885A (en) 1991-09-20 1991-09-20 Electroplating apparatus

Country Status (1)

Country Link
JP (1) JPH0578885A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001023932A (en) * 1999-07-07 2001-01-26 Nec Corp Manufacture of semiconductor element and manufacturing apparatus
CN106245077A (en) * 2016-07-18 2016-12-21 江苏大学 The localization deposition process device that a kind of taper magnetic field is compound with electric field

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001023932A (en) * 1999-07-07 2001-01-26 Nec Corp Manufacture of semiconductor element and manufacturing apparatus
CN106245077A (en) * 2016-07-18 2016-12-21 江苏大学 The localization deposition process device that a kind of taper magnetic field is compound with electric field
CN106245077B (en) * 2016-07-18 2018-06-26 江苏大学 A kind of taper magnetic field and the compound localization deposition process device of electric field

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