JPH0574695A - Electron-beam plotting device - Google Patents

Electron-beam plotting device

Info

Publication number
JPH0574695A
JPH0574695A JP23594791A JP23594791A JPH0574695A JP H0574695 A JPH0574695 A JP H0574695A JP 23594791 A JP23594791 A JP 23594791A JP 23594791 A JP23594791 A JP 23594791A JP H0574695 A JPH0574695 A JP H0574695A
Authority
JP
Japan
Prior art keywords
sample
electron
moving table
electron beam
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23594791A
Other languages
Japanese (ja)
Inventor
Hiroyuki Sakai
広之 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP23594791A priority Critical patent/JPH0574695A/en
Publication of JPH0574695A publication Critical patent/JPH0574695A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an electron-beam plotting device which is less in vibration by separating a vacuum vessel for housing a driving mechanism and another vacuum vessel for housing a sample moving table from each other and separately fixing the vessels to a stool. CONSTITUTION:A sample chamber 2 provided with an electronic optical system 1 on its upper surface and a sample moving table 5 in its inside and a driving chamber 3 provided with a motor 4, ball screw 6, and nut 7 are separated from each other and separately fixed to a stool 9. The chambers 3 and 2 are connected to each other through bellows 12 and the nut 7 is connected to the table 5 by means of a connecting shaft 13. Therefore, the vibration of the system 1 can be prevented and a highly accurate electron-beam plotting device can be obtained, because vibrations produced by the driving section are damped by the stool having a low natural frequency and hardly transmitted to the chamber 2.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体製造装置に係
り、特に電子線描画装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus, and more particularly to an electron beam drawing apparatus.

【0002】[0002]

【従来の技術】従来装置では、試料移動台に駆動する駆
動機構(モータ,ボールネジ,ボールナット等)を真空
容器内に設けるか、あるいは、もう1つの真空容器を作
り、その容器内に駆動機構を設け、試料移動台を何らか
の連結機構を介して、結合していた。
2. Description of the Related Art In a conventional apparatus, a drive mechanism (motor, ball screw, ball nut, etc.) for driving a sample moving table is provided in a vacuum container, or another vacuum container is made and the drive mechanism is provided in the container. Was provided, and the sample moving table was connected via some coupling mechanism.

【0003】[0003]

【発明が解決しようとする課題】従来装置では、モータ
の回転による振動あるいは、正逆反転時のボールネジと
ボールナットの振動等が、直接試料移動台と収めた真空
容器に伝わり、そのまま、その真空容器上に設けた電子
光学系を振動させ、精度の悪化の原因になっている。
In the conventional apparatus, the vibration due to the rotation of the motor, the vibration of the ball screw and the ball nut at the time of reversing the forward direction, etc. are directly transmitted to the vacuum container in which the sample moving table is housed, and the vacuum is maintained as it is. The electro-optical system provided on the container is vibrated, which causes deterioration of accuracy.

【0004】[0004]

【課題を解決するための手段】本発明では、駆動機構を
収めた真空容器と試料移動台を収めた真空容器とを分離
し、またそれぞれを十分重量のある定盤に固定し、2つ
の真空容器を振動の伝わりにくいベローで連結すること
により、上記問題点を解決した。
According to the present invention, a vacuum container containing a drive mechanism and a vacuum container containing a sample moving table are separated from each other, and each of them is fixed to a surface plate having a sufficient weight, and two vacuum chambers are provided. The above-mentioned problems were solved by connecting the containers with a bellows which does not easily transmit vibration.

【0005】[0005]

【作用】駆動機構側と試料移動台側の真空容器を分離す
ることにより、駆動源で発生する振動を直接試料移動台
側の容器へ、伝えることを防ぎ、十分重量のある定盤
に、発生した移動をすべて伝え、振動を吸収させる。
[Operation] By separating the vacuum container on the side of the drive mechanism from the vacuum container on the side of the sample moving table, it is possible to prevent the vibration generated by the drive source from being directly transmitted to the container on the side of the sample moving table, and to generate it on a surface plate with a sufficient weight. It transmits all the movements made and absorbs vibration.

【0006】また、駆動機構と試料移動台の連結部は、
ベローにより連結し、振動を伝えにくくしている。
The connecting portion between the drive mechanism and the sample moving table is
It is connected by bellows to make it difficult to transmit vibration.

【0007】以上により、駆動源より発生した振動が、
電子光学系へ伝わることがなく、精度の悪化が防げる。
From the above, the vibration generated from the drive source is
It is not transmitted to the electron optical system, and deterioration of accuracy can be prevented.

【0008】[0008]

【実施例】本発明の一実施例を図1及び図2により説明
する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIGS.

【0009】図1は、従来装置の概略図である。試料移
動台5は、試料室2の中に収められており、試料室2の
上に電子光学系1が載っている。試料室2には、駆動室
3が取付けられており、その中にボールネジ6,ナット
7があり、ナット7と試料移動台5とは、連結軸13で
つながれている。駆動室3の外側にモータ4が取り付け
られ、真空シールを介してボールネジ6に連結してい
る。試料室2には、その他試料交換装置8が取り付けら
れており、試料室2と、試料交換装置8は定盤9に固定
され、真空排気装置11により、真空排気される。定盤
9は、空気ばね10により、床振動を伝えにくくされて
いる。
FIG. 1 is a schematic diagram of a conventional device. The sample moving table 5 is housed in the sample chamber 2, and the electron optical system 1 is mounted on the sample chamber 2. A drive chamber 3 is attached to the sample chamber 2, a ball screw 6 and a nut 7 are provided therein, and the nut 7 and the sample moving table 5 are connected by a connecting shaft 13. A motor 4 is attached to the outside of the drive chamber 3 and is connected to the ball screw 6 via a vacuum seal. A sample exchanging device 8 is attached to the sample chamber 2. The sample chamber 2 and the sample exchanging device 8 are fixed to a surface plate 9 and evacuated by a vacuum exhaust device 11. The surface plate 9 is made difficult to transmit floor vibrations by the air spring 10.

【0010】図2に本実施例の概略図を示す。駆動室3
は、試料室2と分離され、互いに定盤9に固定されてい
る。また、連結軸13の通る部分は、ベロー12によっ
て真空シールされている。その連結部の詳細図を図3に
示す。ベロー13にフランジ16を溶接し、フランジ1
6はOリング14で真空シールされ、駆動室3及び試料
室2に取り付けられている。
FIG. 2 shows a schematic diagram of this embodiment. Drive room 3
Are separated from the sample chamber 2 and fixed to the surface plate 9 with each other. The portion through which the connecting shaft 13 passes is vacuum-sealed by the bellows 12. A detailed view of the connecting portion is shown in FIG. Weld flange 16 to bellows 13
6 is vacuum-sealed with an O-ring 14 and is attached to the drive chamber 3 and the sample chamber 2.

【0011】本実施例において、駆動源で発生した振動
は、そのまま、定盤9へ伝わり、定盤の固有振動数は、
5Hz以下と低く、発生した振動50〜200Hzは、
この定盤9によって減衰されてしまい、試料室2へは伝
わらない。よって、電子光学系1も振動することがな
く、精度の悪化が防げる。
In this embodiment, the vibration generated by the driving source is transmitted to the surface plate 9 as it is, and the natural frequency of the surface plate is
As low as 5 Hz or less, the generated vibration of 50 to 200 Hz is
It is attenuated by the surface plate 9 and does not reach the sample chamber 2. Therefore, the electron optical system 1 also does not vibrate, and deterioration of accuracy can be prevented.

【0012】図4に他の実施例を示す。ベロー12のか
わりにOリング15を使ったものであるが、同様の効果
が得られる。この方法であると、装置の小型化及びコス
トの点で、有利であるが、摩擦抵抗や真空シールの信頼
性の点で問題がある。
FIG. 4 shows another embodiment. Although an O-ring 15 is used instead of the bellows 12, the same effect can be obtained. This method is advantageous in terms of downsizing of the apparatus and cost, but there is a problem in terms of friction resistance and vacuum seal reliability.

【0013】[0013]

【発明の効果】本発明によれば、駆動源の振動の影響を
受けない高精度な電子線描画装置が得られる。
According to the present invention, it is possible to obtain a highly accurate electron beam drawing apparatus which is not affected by the vibration of the driving source.

【図面の簡単な説明】[Brief description of drawings]

【図1】従来装置の概略図である。FIG. 1 is a schematic view of a conventional device.

【図2】本発明の実施例の概略図である。FIG. 2 is a schematic diagram of an embodiment of the present invention.

【図3】連結部詳細図である。FIG. 3 is a detailed view of a connecting portion.

【図4】他の実施例を示す図である。FIG. 4 is a diagram showing another embodiment.

【符号の説明】[Explanation of symbols]

1…電子光学系、2…試料室、3…駆動室、4…モー
タ、5…試料移動台、6…ボールネジ、7…ナット、8
…試料交換装置、9…定盤、10…空気バネ、11…真
空排気系、12…ベロー、13…連結軸、14…Oリン
グ、16…フランジ。
DESCRIPTION OF SYMBOLS 1 ... Electro-optical system, 2 ... Sample chamber, 3 ... Drive chamber, 4 ... Motor, 5 ... Sample moving base, 6 ... Ball screw, 7 ... Nut, 8
... sample exchange device, 9 ... surface plate, 10 ... air spring, 11 ... vacuum exhaust system, 12 ... bellows, 13 ... connecting shaft, 14 ... O-ring, 16 ... flange.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】電子線を発生する電子銃と、電子線を縮小
及び試料上に結像させるための電子レンズと電子線を偏
向するための偏向器と試料を移動する試料移動台と、試
料の交換を行う試料交換装置と、真空排気を行う排気装
置と、前記各装置を載せる架台とそれらを制御する制御
装置とからなる電子線描画装置において、試料移動台を
駆動する駆動機構を、試料移動台を収納する真空容器か
ら分離し、もう一つの真空容器内に設けることにより振
動伝達を絶縁したことを特徴とする電子線描画装置。
1. An electron gun for generating an electron beam, an electron lens for reducing the electron beam and forming an image on the sample, a deflector for deflecting the electron beam, a sample moving table for moving the sample, and a sample. In the electron beam drawing apparatus including a sample exchanging device for exchanging the sample, an exhausting device for evacuating the vacuum, a pedestal for mounting each device, and a control device for controlling them, a driving mechanism for driving the sample moving table is An electron beam drawing apparatus characterized in that vibration transmission is insulated by separating it from a vacuum container accommodating a moving table and providing it in another vacuum container.
【請求項2】上記2つの真空容器は、それぞれ十分容量
の大きな、定盤の上に固定され、それぞれは、ベローを
介し連結していることを特徴とする請求項1記載の電子
線描画装置。
2. The electron beam drawing apparatus according to claim 1, wherein the two vacuum vessels are fixed on a surface plate having a sufficiently large capacity, and are connected to each other via a bellows. .
JP23594791A 1991-09-17 1991-09-17 Electron-beam plotting device Pending JPH0574695A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23594791A JPH0574695A (en) 1991-09-17 1991-09-17 Electron-beam plotting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23594791A JPH0574695A (en) 1991-09-17 1991-09-17 Electron-beam plotting device

Publications (1)

Publication Number Publication Date
JPH0574695A true JPH0574695A (en) 1993-03-26

Family

ID=16993578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23594791A Pending JPH0574695A (en) 1991-09-17 1991-09-17 Electron-beam plotting device

Country Status (1)

Country Link
JP (1) JPH0574695A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1577929A2 (en) 2004-03-16 2005-09-21 Canon Kabushiki Kaisha Electron beam exposure apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1577929A2 (en) 2004-03-16 2005-09-21 Canon Kabushiki Kaisha Electron beam exposure apparatus
US7230257B2 (en) 2004-03-16 2007-06-12 Canon Kabushiki Kaisha Electron beam exposure apparatus

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