JPH0567690A - Capping device - Google Patents

Capping device

Info

Publication number
JPH0567690A
JPH0567690A JP25575291A JP25575291A JPH0567690A JP H0567690 A JPH0567690 A JP H0567690A JP 25575291 A JP25575291 A JP 25575291A JP 25575291 A JP25575291 A JP 25575291A JP H0567690 A JPH0567690 A JP H0567690A
Authority
JP
Japan
Prior art keywords
cap
optical semiconductor
semiconductor chip
capping
semiconductor element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25575291A
Other languages
Japanese (ja)
Inventor
Kazutomi Yoshida
一臣 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP25575291A priority Critical patent/JPH0567690A/en
Publication of JPH0567690A publication Critical patent/JPH0567690A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To enable a cap and a semiconductor chip to be enhanced in relative positional accuracy by a method wherein the position adjustment of parts is automatically carried out taking advantage of the image data of the parts. CONSTITUTION:When an optical semiconductor element 3 is capped, the images of the optical semiconductor element 3 and a cap 1 are picked up by a camera 9 through a window glass 2, and the images are displayed on a CRT display 10. Then, the displayed image is processed into signals through an image processing device 11, and data that tell how distant time optical semiconductor chip 3 is located from the cap 1 on the basis of the outer periphery of the cap 1 are outputted. A control device 12 drives an upper electrode 4 receiving the data concerned so as to pout the cap 1 in position. After the cap 1 is located at an optimal position, and the cap 1 is welded at a welding point 7. As mentioned above, the position adjustment of the cap 3 is automatically carried out basing on the relative position data of the cap 1 and the optical semiconductor chip 3, so that a capping operation excellent in position accuracy can be easily executed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明はキャッピング装置に関
し、特に、光半導体素子等の製造装置の1つであるキャ
ッピング装置の機構に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a capping device, and more particularly to a mechanism of a capping device which is one of manufacturing devices for optical semiconductor elements and the like.

【0002】[0002]

【従来の技術】図2は、従来のキャッピング装置の構成
を示す図であり、図において、1はこのキャッピングに
おける溶接部品であるキャップ、2は窓ガラス、8は被
溶接部品であるステム、3はステム8上に組み立てられ
た光半導体チップ、4はキャップ1を保持する上電極、
5はステム8を保持する下電極、6はステム8の下電極
5に対する位置を固定するためのガイド、7は溶接部で
ある。
2. Description of the Related Art FIG. 2 is a view showing the structure of a conventional capping device. In the figure, 1 is a cap which is a welding part in this capping, 2 is a window glass, 8 is a stem which is a part to be welded, 3 Is an optical semiconductor chip assembled on the stem 8, 4 is an upper electrode for holding the cap 1,
Reference numeral 5 is a lower electrode that holds the stem 8, 6 is a guide for fixing the position of the stem 8 with respect to the lower electrode 5, and 7 is a welded portion.

【0003】次に動作について説明する。まず、ステム
8を下電極5に、キャップ1を上電極4にセットし、溶
接部7を介してステム8とキャップ1とを接触させる。
この後、上電極4と下電極5間に圧縮エアーなどを利用
して圧力を加えるとともに、コンデンサ放電等により大
電流を印加する。
Next, the operation will be described. First, the stem 8 is set on the lower electrode 5, and the cap 1 is set on the upper electrode 4, and the stem 8 and the cap 1 are brought into contact with each other via the welded portion 7.
Thereafter, pressure is applied between the upper electrode 4 and the lower electrode 5 by using compressed air or the like, and a large current is applied by capacitor discharge or the like.

【0004】上記手順で溶接部7に圧力,電流を印加す
ることにより、該溶接部7を溶接し、光半導体チップ3
のキャッピングを行う。
By applying pressure and current to the welded portion 7 according to the above procedure, the welded portion 7 is welded and the optical semiconductor chip 3
Capping.

【0005】上記のような光半導体チップのキャッピン
グを行う際に重要なことは、光半導体チップ3とキャッ
プ1の位置精度、つまりキャップ1が光半導体チップ3
に対して、所望の位置にあるかどうか、ということであ
る。ここで、光半導体チップ3は、キャッピングを行う
前に、すでにステム8上の所定の位置に組み立てられて
いるため、キャッピングの際には、キャップ1の位置精
度は上電極4,下電極5,ガイド6の寸法精度及び上電
極4,下電極5の相対位置精度により決定し、つまり、
ステム8を基準とした精度として制御されている。
What is important when capping the optical semiconductor chip as described above is the positional accuracy of the optical semiconductor chip 3 and the cap 1, that is, the cap 1 is the optical semiconductor chip 3
In contrast, whether or not it is in the desired position. Here, since the optical semiconductor chip 3 has already been assembled at a predetermined position on the stem 8 before capping, the position accuracy of the cap 1 is high when the capping is performed. Determined by the dimensional accuracy of the guide 6 and the relative positional accuracy of the upper electrode 4 and the lower electrode 5, that is,
The accuracy is controlled based on the stem 8.

【0006】[0006]

【発明が解決しようとする課題】従来のキャッピング装
置は以上のように構成されているので、キャップ1と光
半導体チップ3の相対位置精度の制御はステム8を基準
に行うが、ステム8上に光半導体チップ3を組み立てる
際に生じた両者の位置精度のばらつきのため、ステム8
を基準にキャップ1の位置精度を制御しても、肝心の光
半導体チップ3とキャップ1との位置精度は低く、位置
のばらつきを有しており、また、その位置精度を直接制
御することもできない、すなわち、ステム8などのよう
な加工部品の一部分を基準として位置精度を制御するこ
とができない、などの問題点があった。
Since the conventional capping device is constructed as described above, the relative positional accuracy of the cap 1 and the optical semiconductor chip 3 is controlled with the stem 8 as a reference. Due to the variation in the positional accuracy between the optical semiconductor chip 3 and the stem 8 caused when the optical semiconductor chip 3 is assembled, the stem 8
Even if the position accuracy of the cap 1 is controlled on the basis of, the position accuracy of the essential optical semiconductor chip 3 and the cap 1 is low, and there is variation in position, and the position accuracy can be directly controlled. However, there is a problem in that the position accuracy cannot be controlled with reference to a part of the processed part such as the stem 8 or the like.

【0007】この発明は上記のような問題点を解消する
ためになされたもので、キャップ1と光半導体チップ3
の相対位置精度を制御,向上することのできるキャッピ
ング装置を得ることを目的とする。
The present invention has been made in order to solve the above problems, and it includes a cap 1 and an optical semiconductor chip 3.
It is an object of the present invention to obtain a capping device capable of controlling and improving the relative position accuracy of.

【0008】[0008]

【課題を解決するための手段】この発明に係るキャッピ
ング装置は、光半導体素子を搭載したステムと、ステム
を保持する下電極と、キャップを保持する上電極と、光
半導体素子とキャップとを上方より撮影するカメラの映
像を映し出す表示装置と、その表示装置の画像情報を受
けて光半導体素子とキャップとの相対位置を調整する調
整手段とを備えたものである。
A capping device according to the present invention includes a stem on which an optical semiconductor element is mounted, a lower electrode for holding the stem, an upper electrode for holding a cap, an optical semiconductor element and a cap. It further comprises a display device for displaying an image of a camera for further photographing, and an adjusting means for receiving the image information of the display device and adjusting the relative position between the optical semiconductor element and the cap.

【0009】[0009]

【作用】この発明におけるキャッピング装置は、加工部
品の画像情報を利用して自動的に位置調整を行うので、
位置精度の向上,制御が可能となる。
The capping device according to the present invention automatically adjusts the position by utilizing the image information of the processed parts.
Position accuracy can be improved and controlled.

【0010】[0010]

【実施例】以下、この発明の一実施例を図について説明
する。図1はこの発明の一実施例によるキャッピング装
置の構成を示す図であり、図において、9はステム8と
キャップ1の同心軸上に設けたカメラ、10はCRTデ
ィスプレイ、11は画像処理装置、12は画像処理装置
11によって決定された命令に従って上電極4の位置を
駆動・調整する調整装置である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a configuration of a capping device according to an embodiment of the present invention. In FIG. 1, 9 is a camera provided on the concentric axis of a stem 8 and a cap 1, 10 is a CRT display, 11 is an image processing device, Reference numeral 12 is an adjusting device for driving and adjusting the position of the upper electrode 4 in accordance with a command determined by the image processing device 11.

【0011】次に動作について説明する。光半導体素子
3のキャッピングを行う場合、まず、カメラ9が、窓ガ
ラス2を通した光半導体チップ3とキャップ1の映像を
撮影することにより、その映像がCRTディスプレイ1
0に映し出される。次にCRTディスプレイ10に映し
出された画像は画像処理装置11により信号処理をさ
れ、光半導体チップ3がキャップ1の外周を基準として
どれだけ離れた位置にあるかの情報が出力される。
Next, the operation will be described. When capping the optical semiconductor element 3, first, the camera 9 captures an image of the optical semiconductor chip 3 and the cap 1 which have passed through the window glass 2, so that the image is displayed on the CRT display 1.
It is projected to 0. Next, the image displayed on the CRT display 10 is subjected to signal processing by the image processing device 11, and information about how far the optical semiconductor chip 3 is located with respect to the outer periphery of the cap 1 is output.

【0012】調整装置12はこの情報を受けて、上電極
4を駆動させ、キャップ1が所望の位置にくるようにす
る。こうして、キャップ1を光半導体チップ3へキャッ
ピッグするのに最適な位置に調整した後、その位置状態
で従来例と同様の方法で、溶接部7の溶接を行い、光半
導体チップ3のキャッピングを行う。
The adjusting device 12 receives this information and drives the upper electrode 4 to bring the cap 1 to a desired position. In this way, after adjusting the cap 1 to the optimum position for capping the optical semiconductor chip 3, the welded portion 7 is welded and the optical semiconductor chip 3 is capped in that position in the same manner as in the conventional example. ..

【0013】このように、上記実施例のキャッピング装
置では、キャップ1と光半導体チップ3の画像を画像処
理し、両者の相対位置を情報として得られるようにした
ので、その情報を受けてキャップ1の位置調整が自動的
にでき、位置精度の高いキャッピングを容易に行うこと
ができる。
As described above, in the capping device of the above embodiment, the images of the cap 1 and the optical semiconductor chip 3 are image-processed and the relative positions of the two are obtained as information. The position can be automatically adjusted, and capping with high position accuracy can be easily performed.

【0014】なお、上記実施例では、キャップ1及び光
半導体チップ3の映像情報によりキャップ1の位置調整
を行う例を示したが、光半導体素子が発光素子であった
場合、チップを発光させることにより、キャップ及び光
の映像情報を用いて画像処理を行い、キャップを基準と
して発光点の位置を調整することもできる。
In the above embodiment, the position of the cap 1 is adjusted by the image information of the cap 1 and the optical semiconductor chip 3. However, if the optical semiconductor element is a light emitting element, the chip should emit light. Thus, it is also possible to perform image processing using the image information of the cap and light and adjust the position of the light emitting point with the cap as a reference.

【0015】[0015]

【発明の効果】以上のように、この発明に係るキャッピ
ング装置によれば、被加工部品の画像情報を利用して、
各部品の位置調整を自動的に行うようにしたので、位置
精度の高いキャッピングを容易に行うことのできるキャ
ッピング装置が得られる効果がある。
As described above, according to the capping device of the present invention, the image information of the part to be machined is utilized,
Since the position adjustment of each component is automatically performed, there is an effect that a capping device capable of easily performing capping with high positional accuracy can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】この発明の一実施例によるキャッピング装置の
構造を示す図である。
FIG. 1 is a diagram showing a structure of a capping device according to an embodiment of the present invention.

【図2】従来のキャッピング装置の構造を示す図であ
る。
FIG. 2 is a diagram showing a structure of a conventional capping device.

【符号の説明】[Explanation of symbols]

1 キャップ 2 窓ガラス 3 チップ 4 上電極 5 下電極 6 ガイド 7 溶接部 8 ステム 9 カメラ 10 CRTディスプレイ 11 画像処理装置 12 調整装置 1 Cap 2 Window Glass 3 Chip 4 Upper Electrode 5 Lower Electrode 6 Guide 7 Welding Part 8 Stem 9 Camera 10 CRT Display 11 Image Processing Device 12 Adjustment Device

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 光半導体素子にキャップをキャッピング
するキャッピング装置において、 前記光半導体素子を搭載したステムと、 前記ステムを保持する下電極と、 前記キャップを保持する上電極と、 前記光半導体素子と前記キャップとを上方より撮影する
カメラの映像を映し出す表示装置と、 前記表示装置の画像情報を受けて、前記光半導体素子と
前記キャップとの相対位置を調整する調整手段とを備え
たことを特徴とするキャッピング装置。
1. A capping device for capping an optical semiconductor element with a cap, a stem on which the optical semiconductor element is mounted, a lower electrode holding the stem, an upper electrode holding the cap, and the optical semiconductor element. A display device that displays an image of a camera that captures the cap from above; and an adjusting unit that receives image information of the display device and adjusts a relative position between the optical semiconductor element and the cap. Capping device.
JP25575291A 1991-09-05 1991-09-05 Capping device Pending JPH0567690A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25575291A JPH0567690A (en) 1991-09-05 1991-09-05 Capping device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25575291A JPH0567690A (en) 1991-09-05 1991-09-05 Capping device

Publications (1)

Publication Number Publication Date
JPH0567690A true JPH0567690A (en) 1993-03-19

Family

ID=17283140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25575291A Pending JPH0567690A (en) 1991-09-05 1991-09-05 Capping device

Country Status (1)

Country Link
JP (1) JPH0567690A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012223248A1 (en) 2012-03-26 2013-09-26 Mitsubishi Electric Corporation Cover system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012223248A1 (en) 2012-03-26 2013-09-26 Mitsubishi Electric Corporation Cover system
JP2013201294A (en) * 2012-03-26 2013-10-03 Mitsubishi Electric Corp Capping device
US8686463B2 (en) 2012-03-26 2014-04-01 Mitsubishi Electric Corporation Capping system

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