JPH0562811A - Function trimming method - Google Patents

Abstract

PURPOSE:To provide a function trimming method coping with low-cost miniaturized hybrid ICs. CONSTITUTION:An output detection part 2 for detecting the level to be adjusted of a hybrid IC 1 undergoing variable-voltage adjustment and a system controller part 3 are provided. A signal representing the difference between actual and desired values is supplied to a current source part 4. As means for tentatively adjusting function before performing resistance trimming. The variable current source part 4 connected to the terminals for adjustment to change the current supply amount is used. A trimming device 6 is operated by the output from the system controller part 3 to trim trimming resistors 9a, 9b.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a function trimming method used as adjusting means for electronic circuits.

[0002]

2. Description of the Related Art In recent years, miniaturization of devices has been promoted in the field of video cameras and the like, and along with this, hybrid ICs have been promoted.
As can be seen from the above, a method of dividing a circuit for each function and guaranteeing the performance of each divided circuit has been actively introduced. That is, in order to compensate for the variation in each circuit block, an adjustment variable resistor (hereinafter abbreviated as VR) or the like is incorporated in each circuit block to individually perform the function adjustment. Hybrid I using an alumina substrate, etc., for which further miniaturization is required
In C, not only the resistance as a normal circuit component,
A film-like component is also used for the resistor as the circuit component for adjusting the function.

A conventional function adjusting means of a circuit using a film resistor, that is, a function trimming method will be described below. An output detection unit 2 for detecting the adjusted level of the hybrid IC 1 and a system controller unit 3 are provided, and the output from the output detection unit 2 is compared with a desired internally set value by the system controller unit 3, and the error is detected. The signal is supplied to the trimming device 6.

The operation of the function trimming method configured as described above will be described. The trimming device 6 is, for example, a trimming device using a laser beam,
The first trimming resistor 9a provided between the adjustment terminal of the circuit and the power supply or the second trimming resistor 9 provided between the circuit adjustment terminal and the ground depending on the error signal.
Any one of b will be selectively trimmed for adjustment.

The above method is the most commonly used function trimming method, and is extremely useful in that the equipment is simple and that it can contribute to downsizing of the hybrid IC.

However, depending on the content of the circuit to be adjusted, there is a circuit such as an AGC circuit whose tracking speed due to the time constant of the circuit is extremely slow with respect to the speed of trimming the resistor. There is a problem that the capacity is lowered and the production cost is increased.

FIG. 4 shows the types of circuit adjustment contents.
One that monotonously increases with respect to the change of the voltage to be adjusted as shown in (a), one that monotonously decreases as shown in FIG. 4 (b), or that the voltage to be adjusted changes as shown in FIG. There is a pattern for adjusting the maximum point and the minimum point of the output, and in the case of the adjustment pattern shown in FIG. 4 (c), the contents are very unsatisfactory in the conventional method. In addition to the trimming resistors 9a and 9b, a resistor for trial trimming is required, which is a constraint condition for downsizing the circuit block.

Further, in the conventional example, since functional trimming is performed depending on the magnitude of the output to be adjusted, trimming is sometimes attempted even for a defect in the hybrid IC1, so that the defect in the hybrid IC1 should be corrected later. There is a problem that it becomes difficult.

To solve these problems, another conventional method as described below has been adopted.

The second conventional example will be described below with reference to the drawings. As shown in FIG. 3, a hybrid IC
The output detection unit 2 for detecting the adjusted level of 1 and the system controller unit 3 are provided, and the output from the output detection unit 2 is
It has a function of comparing with an internally set desired value and supplying the error signal to the electronic VR device 10. The electronic VR device 10 includes an electronic VR and a switch, and has a check land 7, which is provided in advance in the hybrid IC 1.
The open loop lands 11a and 11b are connected to each other.

The operation of the function trimming method configured as described above will be described. At the time of initial measurement, the switches of the electronic VR device 10 are controlled so that the open loop lands 11a and 11b are closed, and the trimmed resistor 9 is controlled by the adjusted output obtained.
Either a or 9b is selected, and then the switch is controlled so that the trimming resistor on the selected side is separated and connected to the electronic VR side in the electronic VR device 10, and the electronic VR is changed to change the circuit. Perform temporary function adjustment. Next, the value of the electronic VR that has undergone the provisional function adjustment is loaded into the control unit 3,
When the actual resistance trimming is performed, the trimming device 6 trims the trimmed resistance so that the value of the electronic VR becomes equal to the value of the trimmed resistance, and the functional trimming is completed. After trimming is completed, the open loop lands 11a and 11b are
The hybrid IC 1 is completed by being closed with solder or the like. According to the above method, the trimming measurement can be performed before the actual resistance trimming.
Therefore, since the trimming measurement process and the resistance trimming process can be separated, there are many useful aspects such as effective utilization of equipment, preliminary check of defective products, and correction of defective products.

[0012]

However, in the above-mentioned conventional configuration, it is necessary to provide an open loop land for connecting the electronic VR device and the hybrid IC in the hybrid IC.
It was a big limitation in downsizing.

As described above, the conventional function trimming method has a problem that it is difficult to achieve both the miniaturization and the reduction in production cost required by the hybrid ICs of recent years.

The present invention solves the above-mentioned conventional problems, and an object of the present invention is to provide a function trimming method capable of coping with cost reduction and size reduction of a hybrid IC.

[0015]

In order to achieve the above object, the function trimming method of the present invention is such that a variable current source is connected to the terminal to be adjusted and the current supply amount is varied to perform temporary function adjustment. Is.

[0016]

According to the present invention, the measuring device can be connected without providing a special space in the hybrid IC,
In addition, before the resistance trimming is performed, provisional function adjustment and defective product detection can be performed, and an inexpensive and small hybrid IC can be realized.

[0017]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

As shown in FIG. 1, an output detection section 2 for detecting the adjusted level of the hybrid IC 1 and a system controller section 3 are provided, and an output from the output detection section 2 and a desired internally set value are set. The system controller section 3 has a function of comparing and supplying the error signal to the current source section 4. The current source unit 4 is configured to be connected in advance via a switch 8 to a check land 7 which is a control terminal communicating with an adjustment terminal in the hybrid IC 1.

The operation of the function trimming method configured as described above will be described. First, at the time of initial measurement, the switch 8 is closed and the output detection unit 2
The adjusted output obtained by the above is taken into the system controller unit 3, and the current source unit 4 is controlled by the error signal obtained by comparing with the desired value set internally, and the checkland 7 is caused by causing the current to flow in or out. The temporary function adjustment is performed by changing the potential of the. Next, the voltage of the check land 7 at the time when the provisional function adjustment is performed is detected by the voltage detection unit 5, the value is taken into the system controller unit 3, and the switch 8 is opened in the actual resistance trimming. Then, either the trimming resistor 9a or 9b is trimmed by the trimming device 6 so that the potential at the check land 7 becomes equal to the obtained voltage for the temporary function adjustment, and the functional trimming is completed. Here, the trimming device 6 uses a laser beam as an example.

Needless to say, if the system controller section 3 has a large storage capacity, the provisional function adjusting step and the resistance trimming step can be separated.

Further, in this embodiment, the variable current source is used as the means for performing the temporary function adjustment, but this may be a variable voltage source.

[0022]

As described above, the present invention is a hybrid I
Without providing a special space in C, it is possible to realize temporary function adjustment and defective product detection before resistance trimming is performed, and defective products can also be corrected, improving yield and productivity, and thus a hybrid IC. It is possible to realize an excellent function trimming method that can further reduce the size and suppress the production cost.

[Brief description of drawings]

FIG. 1 is a block diagram of a function trimming system method according to an embodiment of the present invention.

FIG. 2 is a block diagram of a function trimming system of a first conventional example.

FIG. 3 is a block diagram of a second conventional function trimming system.

FIG. 4 (a) is a monotonically increasing curve diagram of the output response with respect to the adjustment voltage change of the conventional example, (b) is a monotonically decreasing curve diagram of the same output response, and (c) is a curve diagram having a minimum point of the same output response.

[Explanation of symbols]

 1 Hybrid IC (circuit to be adjusted) 2 Output detection unit 3 System controller unit 4 Current source unit 5 Voltage detection unit 6 Trimming device 8 Switch 9a, 9b Trimming resistor

Claims (1)

[Claims] 1. A voltage control type adjusted circuit having functional trimming resistors arranged between a control terminal and a power source and between the control terminal and ground, and an output detection means for detecting an output from the adjusted circuit, System controller means for generating an error output by comparing the output obtained from the output detecting means with a desired value, and a current source for controlling the current supply amount according to the error output or a voltage source changing according to the error output By connecting the output of the current source or the voltage source to the control terminal of the circuit to be adjusted, it is possible to determine the desired potential of the control terminal before performing the function trimming. A function trimming method in which the function trimming resistor is trimmed so that the potential of the control terminal becomes a desired potential after being separated.