JPH056144B2 - - Google Patents
Info
- Publication number
- JPH056144B2 JPH056144B2 JP58100320A JP10032083A JPH056144B2 JP H056144 B2 JPH056144 B2 JP H056144B2 JP 58100320 A JP58100320 A JP 58100320A JP 10032083 A JP10032083 A JP 10032083A JP H056144 B2 JPH056144 B2 JP H056144B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ultrasonic
- scanning
- signal
- acoustic lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58100320A JPS59225349A (ja) | 1983-06-07 | 1983-06-07 | 超音波顕微鏡の試料台傾斜調整方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58100320A JPS59225349A (ja) | 1983-06-07 | 1983-06-07 | 超音波顕微鏡の試料台傾斜調整方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59225349A JPS59225349A (ja) | 1984-12-18 |
JPH056144B2 true JPH056144B2 (en:Method) | 1993-01-25 |
Family
ID=14270888
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58100320A Granted JPS59225349A (ja) | 1983-06-07 | 1983-06-07 | 超音波顕微鏡の試料台傾斜調整方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59225349A (en:Method) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61259170A (ja) * | 1985-05-14 | 1986-11-17 | Olympus Optical Co Ltd | 超音波顕微鏡における試料の傾き調整装置 |
JP2008046096A (ja) * | 2006-08-21 | 2008-02-28 | Honda Electronic Co Ltd | 超音波顕微鏡システムの調整方法、及び超音波顕微鏡システム |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0112192Y2 (en:Method) * | 1981-06-03 | 1989-04-10 |
-
1983
- 1983-06-07 JP JP58100320A patent/JPS59225349A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59225349A (ja) | 1984-12-18 |
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