JPH0544043A - Cvd reactor - Google Patents

Cvd reactor

Info

Publication number
JPH0544043A
JPH0544043A JP3222269A JP22226991A JPH0544043A JP H0544043 A JPH0544043 A JP H0544043A JP 3222269 A JP3222269 A JP 3222269A JP 22226991 A JP22226991 A JP 22226991A JP H0544043 A JPH0544043 A JP H0544043A
Authority
JP
Japan
Prior art keywords
substrate
reaction
region
preheating
reaction chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3222269A
Other languages
Japanese (ja)
Other versions
JP3127011B2 (en
Inventor
Taichi Yamaguchi
太一 山口
Shinya Aoki
伸哉 青木
Akira Kagawa
昭 香川
Tsukasa Kono
宰 河野
Akira Saji
明 佐治
Noboru Kuroda
昇 黒田
Hiroshi Yoshida
弘 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujikura Ltd
Chubu Electric Power Co Inc
Original Assignee
Fujikura Ltd
Chubu Electric Power Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujikura Ltd, Chubu Electric Power Co Inc filed Critical Fujikura Ltd
Priority to JP03222269A priority Critical patent/JP3127011B2/en
Publication of JPH0544043A publication Critical patent/JPH0544043A/en
Application granted granted Critical
Publication of JP3127011B2 publication Critical patent/JP3127011B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E40/00Technologies for an efficient electrical power generation, transmission or distribution
    • Y02E40/60Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment

Landscapes

  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)

Abstract

PURPOSE:To prevent undulations on a formed film surface and cracks from occurring by providing a preheating zone and a slow cooling zone on the front side and the rear side of a reaction zone where the product is deposited on the surface of a substrate respectively and by feeding inert gas to both the zones. CONSTITUTION:A reaction chamber 22 is divided in three: a reaction zone 25a where a substrate 32 is heated to a reaction temp. at which feed gas is given chemical reaction to deposit the product on the surface of the substrate 32; a preheating zone 25b where the substrate 32 is gradually heated provided on the front side of the reaction zone 25a; and a slow cooling zone 25c where the substrate 32 is gradually cooled, provided on the rear side of the reaction zone 25a. Partition plates 27 prevent the atmospheres of three zones from being mixed, and inert gas is fed to the preheating zone 25b and the slow cooling zone 25c, causing the temp. change of the substrate 32 to be relaxed, preventing undulations on the formed film surface of the substrate 32 and cracks on the thin film vapor-deposited on the substrate 32 from occurring.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、基板上に化学気相蒸
着法(CVD法)を用いて被膜層を形成させる際に用い
られるCVD反応装置に係わり、更に詳しくは、超電導
マグネットコイルや電力輸送用などとして応用開発が進
められている長尺の酸化物超電導体をCVD法を用いて
製造する場合に使用されるCVD反応装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a CVD reactor used when a coating layer is formed on a substrate by a chemical vapor deposition method (CVD method). More specifically, the present invention relates to a superconducting magnet coil and electric power. The present invention relates to a CVD reactor used when a long oxide superconductor, which is being applied and developed for transportation, is manufactured by the CVD method.

【0002】[0002]

【従来の技術】従来、長尺の酸化物超電導体をCVD法
を用いて製造する場合、例えば図2に示されるような横
長型の反応チャンバを用いたCVD反応装置が用いられ
ている。このCVD反応装置1は、横長型の反応チャン
バ2、原料ガス供給装置3、排気ポンプ4、基板ヒータ
5、基板移送装置6を主要構成要素として備えて構成さ
れている。
2. Description of the Related Art Conventionally, when a long oxide superconductor is manufactured by a CVD method, for example, a CVD reaction apparatus using a horizontally long reaction chamber as shown in FIG. 2 is used. The CVD reaction apparatus 1 includes a horizontally long reaction chamber 2, a source gas supply device 3, an exhaust pump 4, a substrate heater 5, and a substrate transfer device 6 as main components.

【0003】上記反応チャンバ2の下方側の一端には原
料ガス供給口7が形成され、かつこの原料ガス供給口7
は、原料ガス供給管8を通じて上記原料ガス供給装置3
と接続されている。また、上記反応チャンバ2の下方側
の他端にはガス排出口9が形成され、かつこのガス排出
口9はガス排出管10を通じて排気ポンプ4と接続され
ている。
A raw material gas supply port 7 is formed at one end on the lower side of the reaction chamber 2, and the raw material gas supply port 7 is formed.
Is the source gas supply device 3 through the source gas supply pipe 8.
Connected with. A gas exhaust port 9 is formed at the other end of the reaction chamber 2 on the lower side, and the gas exhaust port 9 is connected to an exhaust pump 4 through a gas exhaust pipe 10.

【0004】また、上記反応チャンバ2内の長尺基板1
1は、基板移送装置6により図中の矢印方向に移動さ
れ、送入されるようになっている。また、さらに上記チ
ャンバ2内の下部には基板ヒータ5が設けられ、反応チ
ャンバ2内に送入される長尺基板11を加熱できるよう
になっている。
The long substrate 1 in the reaction chamber 2 is also used.
1 is moved by the substrate transfer device 6 in the direction of the arrow in the figure and is fed. Further, a substrate heater 5 is further provided in the lower part of the chamber 2 so that the long substrate 11 fed into the reaction chamber 2 can be heated.

【0005】上記従来のCVD反応装置1を用いて長尺
のSC体を作製するには、基板移送装置6によって反応
チャンバ2内に長尺基板11を送入し、さらに原料ガス
供給管8を介して原料ガス供給装置3からチャンバ2内
に原料ガスを導入するとともに、反応チャンバ2内を所
定の原料ガス雰囲気とする。しかる後、直ちに基板ヒー
タ6で上記チャンバ2内の長尺基板11を加熱してこの
長尺基板11表面にSC層を蒸着させ、これによりSC
体を作製することができる。
In order to fabricate a long SC body using the above-mentioned conventional CVD reaction apparatus 1, a long substrate 11 is fed into the reaction chamber 2 by the substrate transfer apparatus 6, and the source gas supply pipe 8 is further connected. A raw material gas is introduced into the chamber 2 from the raw material gas supply device 3 via the raw material gas supply apparatus 3 and the inside of the reaction chamber 2 is set to a predetermined raw material gas atmosphere. Immediately thereafter, the long substrate 11 in the chamber 2 is immediately heated by the substrate heater 6 to deposit the SC layer on the surface of the long substrate 11, and thereby the SC layer is formed.
The body can be made.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、上記従
来のCVD反応装置1を用いた場合、長尺基板11は、
反応チャンバ2の入口Aに導入されると同時に高温で急
激な加熱を受け、また、出口Bから搬出されると同時に
外気により急激に冷却されるため、上記反応チャンバ2
の入口及び出口において急激な温度変化を起こし、かつ
この急激な温度変化に起因する膨張あるいは収縮等の激
しいストレスが負荷される。従って、これにより基板に
「反り」や「撓み」が発生して基板の成膜面に起伏が生
ずる恐れがあるという問題があった。
However, when the conventional CVD reactor 1 is used, the long substrate 11 is
Upon being introduced into the inlet A of the reaction chamber 2, it is rapidly heated at a high temperature, and when it is carried out of the outlet B, it is rapidly cooled by the outside air.
A sudden temperature change is caused at the inlet and the outlet, and severe stress such as expansion or contraction due to the abrupt temperature change is applied. Therefore, there is a problem that "warping" or "bending" occurs in the substrate due to this, and there is a possibility that the film-forming surface of the substrate may be uneven.

【0007】本発明は、上記事情に鑑みなされたもの
で、長尺基板を反応チャンバ内に導入する際、および反
応チャンバから搬出する際に、長尺基板にあるいは基板
上に蒸着されたSC層に起こる温度変化を緩やかにする
ことにより、この温度変化に起因して基板あるいはSC
層に発生する膨張あるいは収縮等のストレスの軽減を図
ることのでき、かつこの長尺基板上に均一かつ安定な組
成のCVD蒸着層を効率的に形成することができるCV
D反応装置の提供を目的とする。
The present invention has been made in view of the above circumstances, and an SC layer vapor-deposited on a long substrate at the time of introducing the long substrate into the reaction chamber and carrying it out of the reaction chamber. By slowing down the temperature change that occurs in the
A CV capable of reducing stress such as expansion or contraction generated in a layer and efficiently forming a CVD vapor deposition layer having a uniform and stable composition on this long substrate.
It is intended to provide a D reactor.

【0008】[0008]

【課題を解決するための手段】上記課題は、原料化合物
ガス等の原料ガスを化学反応せしめて基体表面に生成物
を堆積させるCVD反応を行う横長型の反応チャンバ
と、該反応チャンバ内に原料ガスを供給する原料ガス供
給手段と、該反応チャンバ内のガスを排気するガス排気
手段と、長尺の基体を該反応チャンバの長手方向に沿っ
て一方側に移動させる基体移動手段と、該反応チャンバ
内に配設された横長型の加熱手段とを備えたCVD反応
装置であって、前記加熱手段は、上記原料ガスを化学反
応せしめて上記基体表面に生成物を堆積させる反応温度
に該基体を加熱する反応領域と、該反応領域の基体移動
方向前方側に設けられ、上記基体が該反応領域に達する
までに該反応温度となるように該基体を漸次加熱する予
熱領域と、該反応領域の基体移動方向後方側に設けら
れ、反応温度に加熱された該基体を徐冷する徐冷領域と
を備えてなり、該反応チャンバ内に、上記反応領域両端
部に近接する遮蔽手段を設け、該反応チャンバ内を反応
部と予熱部と徐冷部とに分割し、かつ該予熱部及び該徐
冷部内に不活性ガスを送り込む不活性ガス供給手段を設
けた構成とすることにより解決される。
Means for Solving the Problems The above problem is to provide a horizontally elongated reaction chamber for performing a CVD reaction in which a source gas such as a source compound gas is chemically reacted to deposit a product on the surface of a substrate, and a source material in the reaction chamber. Source gas supply means for supplying gas, gas exhaust means for exhausting gas in the reaction chamber, substrate moving means for moving a long substrate to one side along the longitudinal direction of the reaction chamber, and the reaction A CVD reactor provided with a horizontally-long heating means arranged in a chamber, wherein the heating means chemically reacts the raw material gas to deposit a product on the surface of the base material at a reaction temperature. A reaction region for heating the substrate, a preheating region provided on the front side of the reaction region in the moving direction of the substrate to gradually heat the substrate to reach the reaction temperature before the substrate reaches the reaction region, and the reaction region. A slow cooling region which is provided on the rear side of the substrate in the moving direction of the substrate and gradually cools the substrate heated to the reaction temperature, and a shielding means is provided in the reaction chamber in proximity to both ends of the reaction region, The problem can be solved by dividing the inside of the reaction chamber into a reaction part, a preheating part, and a slow cooling part, and providing an inert gas supply means for feeding an inert gas into the preheating part and the slow cooling part. ..

【0009】[0009]

【作用】上記したように、本発明のCVD反応装置にあ
っては、加熱手段を、上記原料ガスを化学反応せしめて
上記基体表面に生成物を堆積させる反応温度に該基体を
加熱する反応領域と、該反応領域の基体移動方向前方側
に設けられ、上記基体が該反応領域に達するまでに該反
応温度となるように該基体を漸次加熱する予熱領域と、
該反応領域の基体移動方向後方側に設けられ、反応温度
に加熱された該基体を徐冷する徐冷領域とを備えてなる
構成としたので、基体を反応チャンバ内の反応領域に導
入する際、あるいは反応領域から搬出する際に、該基体
に起こる温度変化を緩やかにすることができ、これによ
り、この温度変化に起因して基体あるいはこの基体に蒸
着された薄膜に発生する膨張あるいは収縮等のストレス
が軽減される。
As described above, in the CVD reaction apparatus of the present invention, the heating means is a reaction region for heating the substrate to a reaction temperature at which the raw material gas is chemically reacted to deposit the product on the surface of the substrate. And a preheating region that is provided on the front side of the reaction region in the moving direction of the substrate, and that gradually heats the substrate so that the substrate reaches the reaction temperature before reaching the reaction region,
When the substrate is introduced into the reaction region in the reaction chamber, it is provided on the rear side of the reaction region in the substrate moving direction and has a slow cooling region for gradually cooling the substrate heated to the reaction temperature. Alternatively, the temperature change that occurs in the substrate when it is carried out from the reaction region can be made gradual, and as a result, expansion or contraction that occurs in the substrate or the thin film deposited on the substrate due to this temperature change, etc. Stress is reduced.

【0010】また、反応チャンバ内に、上記反応領域両
端部に近接する遮蔽手段を設け、該反応チャンバ内を反
応部と予熱部と徐冷部とに分割し、かつ該予熱部及び該
徐冷部内に不活性ガスを送り込む不活性ガス供給手段を
設けた構成としたので、反応部のみに原料ガスが供給さ
れ、予熱部及び徐冷部内には不活性ガスが供給される。
このため、良好な薄膜が得られない不十分な加熱条件で
ある予熱領域並びに徐冷領域などの領域上では成膜が行
われないので、基体上に不良薄膜が成膜されることがな
い。
Further, a shielding means is provided in the reaction chamber in the vicinity of both ends of the reaction region, the reaction chamber is divided into a reaction section, a preheating section and a slow cooling section, and the preheating section and the slow cooling section are provided. Since the inert gas supply means for feeding the inert gas is provided in the section, the raw material gas is supplied only to the reaction section, and the inert gas is supplied to the preheating section and the slow cooling section.
For this reason, since a film is not formed on a region such as a preheating region and a gradual cooling region, which are insufficient heating conditions where a good thin film cannot be obtained, a defective thin film is not formed on the substrate.

【0011】[0011]

【実施例】以下、実施例を挙げて本発明を詳細に説明す
る。図1は、本発明のCVD反応装置の一実施例を示す
ものであり、図中符号21はCVD反応装置である。こ
のCVD反応装置21は、横長型の反応チャンバ22、
原料ガス供給装置23、排気ポンプ24、基板加熱装置
25、基板移送装置26を主要構成要素として備えて構
成されている。
The present invention will be described in detail below with reference to examples. FIG. 1 shows an embodiment of a CVD reaction apparatus of the present invention, in which reference numeral 21 is a CVD reaction apparatus. The CVD reactor 21 includes a horizontally long reaction chamber 22,
The raw material gas supply device 23, the exhaust pump 24, the substrate heating device 25, and the substrate transfer device 26 are provided as main components.

【0012】上記反応チャンバ22は、その内部に設け
られた2枚の仕切部材27,27により、反応チャンバ
22の長手方向中央部に位置する反応部22aと、この
反応部22aの基板移動方向前方側に位置する予熱部2
2bと、上記反応部22aの基板移動方向後方側に位置
する徐冷部22cとに分けられている。また、上記反応
部22aの上部には、上方に向けてすぼまりかつその頂
部に原料ガス供給手段23が接続された原料ガス拡散部
28が形成され、予熱部22bの上部および徐冷部22
cの上部には、不活性ガス供給装置29が接続されてい
る。また、上記2枚の仕切部材27,27下端の直下に
は、2つのガス排出口30,30が形成され、かつこれ
ら2つのガス排出口30,30はガス排出管31を通し
て排気ポンプ24に接続されている。
The reaction chamber 22 is provided with two partition members 27, 27 provided therein, and a reaction section 22a located at the center of the reaction chamber 22 in the longitudinal direction and a front side of the reaction section 22a in the substrate moving direction. Preheating part 2 located on the side
2b and a slow cooling part 22c located on the rear side of the reaction part 22a in the substrate moving direction. Further, a raw material gas diffusion portion 28, which is narrowed upward and connected to the raw material gas supply means 23 at the top thereof, is formed in the upper portion of the reaction portion 22a, and the upper portion of the preheating portion 22b and the slow cooling portion 22 are formed.
An inert gas supply device 29 is connected to the upper part of c. Further, two gas discharge ports 30, 30 are formed immediately below the lower ends of the two partition members 27, 27, and these two gas discharge ports 30, 30 are connected to the exhaust pump 24 through a gas discharge pipe 31. Has been done.

【0013】上記反応チャンバ22内の長尺基板32
は、基板移送装置26により図中の矢印方向に移動さ
れ、上記反応チャンバ22内を予熱部22b→反応部2
2a→徐冷部22cの順で通過するようになっている。
また、さらに上記チャンバ22内の下部には予熱部22
bから徐冷部22cに渡る基板加熱装置25が設けら
れ、上記反応チャンバ22内に送入される長尺基板32
を加熱できるようになっている。
Long substrate 32 in the reaction chamber 22
Is moved in the direction of the arrow in the figure by the substrate transfer device 26, and moves in the reaction chamber 22 from the preheating section 22b to the reaction section 2
2a-> the slow cooling part 22c is passed in this order.
In addition, a preheating unit 22 is provided in the lower portion of the chamber 22.
A long substrate 32 is provided with a substrate heating device 25 extending from b to the slow cooling unit 22c and fed into the reaction chamber 22.
It can be heated.

【0014】上記基板加熱装置25は、横長の熱伝導プ
レート33と、この熱伝導プレート33の、中央部の加
熱するヒータ34と、上記熱伝導プレート33の両端を
冷却する冷却器35,35と、上記ヒータ34および冷
却器35,35を制御する温度制御装置36とを備えて
いる。
The substrate heating device 25 includes a horizontally long heat conduction plate 33, a heater 34 for heating the central portion of the heat conduction plate 33, and coolers 35, 35 for cooling both ends of the heat conduction plate 33. , And a temperature controller 36 for controlling the heater 34 and the coolers 35, 35.

【0015】また、上記構成とした基板加熱装置25
は、反応部22a内において、原料ガスを化学反応せし
めて長尺基板32表面上に生成物を堆積させる際の反応
温度で長尺基板32を加熱する反応領域25aと、予熱
部22b内において、上記長尺基板30が反応部22a
内の反応領域25aに到達するまでに、上記反応温度と
なるように長尺基板32を漸次加熱する予熱領域25b
と、徐冷部25cにおいて、反応温度に加熱された上記
長尺基板32を徐冷する徐冷領域25cとを備えてい
る。
Further, the substrate heating device 25 having the above structure
Is a reaction region 25a that heats the long substrate 32 at a reaction temperature when the raw material gas is chemically reacted in the reaction unit 22a to deposit a product on the surface of the long substrate 32, and in the preheating unit 22b, The long substrate 30 is the reaction part 22a.
A preheating region 25b for gradually heating the long substrate 32 so as to reach the above-mentioned reaction temperature before reaching the reaction region 25a therein.
And a slow cooling region 25c for slow cooling the long substrate 32 heated to the reaction temperature in the slow cooling section 25c.

【0016】以上述べたように、本例のCVD反応装置
21にあっては、基板加熱装置25を、原料ガスを化学
反応せしめて長尺基板32表面に生成物を堆積させる反
応温度に長尺基板32を加熱する反応領域25aと、こ
の反応領域25aの基板移動方向前方側に設けられ、上
記長尺基板32が反応領域25aに達するまでに上記反
応温度となるように長尺基板32を漸次加熱する予熱領
域25bと、反応領域25aの基板移動方向後方側に設
けられ、反応温度に加熱された長尺基板32を徐冷する
徐冷領域25cとを備えてなる構成としたので、長尺基
板32を反応チャンバ22内の反応領域25aに導入す
る際、あるいは反応領域25aから搬出する際に、この
長尺基板32に起こる温度変化を緩やかにすることがで
き、これにより、この温度変化に起因して長尺基板32
あるいはこの長尺基板32に蒸着された薄膜に発生する
膨張あるいは収縮等のストレスが軽減される。従って、
これらストレスにより引き起こされる、例えば、基板の
成膜面への起伏の発生や、基板上に蒸着した薄膜へのク
ラックの発生を抑制することができる。また、徐冷部2
2cの領域にO2ガスを導入し、in-situ酸素処理を行う
ことにより、さらに良好な超電導テープを得ることもで
きる。
As described above, in the CVD reaction apparatus 21 of this example, the substrate heating apparatus 25 is set to a long reaction temperature at which the raw material gas is chemically reacted to deposit the product on the surface of the long substrate 32. A reaction region 25a for heating the substrate 32 and a long substrate 32 which is provided on the front side of the reaction region 25a in the substrate moving direction and gradually reaches the reaction temperature until the long substrate 32 reaches the reaction region 25a. Since the preheating region 25b for heating and the slow cooling region 25c provided on the rear side of the reaction region 25a in the substrate moving direction for gradually cooling the long substrate 32 heated to the reaction temperature are provided, When the substrate 32 is introduced into the reaction region 25a in the reaction chamber 22 or is carried out from the reaction region 25a, the temperature change occurring in the long substrate 32 can be moderated. Due to the temperature change long substrate 32
Alternatively, stress such as expansion or contraction generated in the thin film deposited on the long substrate 32 is reduced. Therefore,
It is possible to suppress the occurrence of undulations on the film formation surface of the substrate and the generation of cracks in the thin film deposited on the substrate, which are caused by these stresses. In addition, the slow cooling unit 2
By introducing O 2 gas into the region 2c and performing in-situ oxygen treatment, a more excellent superconducting tape can be obtained.

【0017】また、反応チャンバ22内に、上記反応領
域25a両端部に近接する仕切部材27,27を設け、
反応チャンバ22内を反応部22aと予熱部22bと徐
冷部22cとに分割し、かつ予熱部22b及び徐冷部2
2c内に不活性ガスを送り込む不活性ガス供給装置29
を設けた構成としたので、反応部22aのみに原料ガス
が供給され、予熱部22b及び徐冷部22c内には不活
性ガスが供給される。このため、良好な薄膜が得られな
い不十分な加熱条件である予熱領域25b並びに徐冷領
域25cなどの領域上では成膜が行われないので、長尺
基板32上に不良な薄膜が成膜されるなどの不都合が防
止される。
Further, partition members 27, 27 are provided in the reaction chamber 22 in proximity to both ends of the reaction region 25a,
The inside of the reaction chamber 22 is divided into a reaction part 22a, a preheating part 22b and a slow cooling part 22c, and the preheating part 22b and the slow cooling part 2 are divided.
Inert gas supply device 29 for feeding an inert gas into 2c
Since the structure is provided, the raw material gas is supplied only to the reaction part 22a, and the inert gas is supplied to the preheating part 22b and the slow cooling part 22c. For this reason, since a film is not formed on regions such as the preheating region 25b and the slow cooling region 25c, which are insufficient heating conditions in which a good thin film cannot be obtained, a defective thin film is formed on the long substrate 32. Inconveniences such as being caused are prevented.

【0018】上記本実施例のCVD反応装置21を用
い、長尺のSC体を製造するには、まず、原料ガス供給
装置23から反応部22a内に、原料ガス拡散部27を
介してSC体原料ガスを導入すると同時に、不活性ガス
供給装置29により予熱部22bおよび徐冷部22c内
にはアルゴンなどの不活性ガスを供給する。また、排気
ポンプ24によりチャンバ22の下方側の2つのガス排
出口30,30から反応部22a内の反応残ガスと、予
熱部22bおよび徐冷部22c内の不活性ガスを排気す
る。この時、反応部22a内は、均一なSC体原料ガス
雰囲気となっており、予熱部22bおよび徐冷部22c
内は、不活性ガス雰囲気となっている。
In order to manufacture a long SC body using the CVD reactor 21 of the present embodiment, first, the SC body is introduced from the source gas supply device 23 into the reaction section 22a through the source gas diffusion section 27. At the same time that the source gas is introduced, an inert gas supply device 29 supplies an inert gas such as argon into the preheating section 22b and the slow cooling section 22c. Further, the exhaust pump 24 exhausts the reaction residual gas in the reaction part 22a and the inert gas in the preheating part 22b and the slow cooling part 22c from the two gas outlets 30, 30 on the lower side of the chamber 22. At this time, the inside of the reaction section 22a is in a uniform SC body material gas atmosphere, and the preheating section 22b and the gradual cooling section 22c.
The inside is an inert gas atmosphere.

【0019】次に、長尺基板32を反応チャンバ22内
に送入し、予熱部22b→反応部22a→徐冷部22c
の順で各部内を順次通過させる。まず、はじめに不活性
ガス雰囲気の予熱部22bに入った長尺基板32は、基
板加熱装置25の予熱領域25aにより、長尺基板32
の加熱を受けている部位が、予熱部22bと反応部22
aの境界に達するまでにCVD反応温度となるように漸
次加熱される。続いて原料ガス雰囲気の反応部22aに
挿入された長尺基板32は、次の徐冷部22cに達する
までに基板加熱装置25の反応領域25aによってCV
D反応温度で持続的に加熱され、SC体原料ガスが、加
熱された上記長尺基板32上で反応し、この長尺基板3
2上にSC層が蒸着される。さらに、このSC層が蒸着
された長尺基板32は、徐冷部22cに送入されて基板
加熱装置25の徐冷領域25cによって徐冷される。
Next, the long substrate 32 is fed into the reaction chamber 22, and the preheating section 22b → reaction section 22a → slow cooling section 22c.
Pass through each part in order. First, the long substrate 32 that has entered the preheating section 22b in the inert gas atmosphere is first moved to the long substrate 32 by the preheating region 25a of the substrate heating device 25.
The part that is being heated by the preheating part 22b and the reaction part 22
It is gradually heated to reach the CVD reaction temperature until the boundary of a is reached. Subsequently, the long substrate 32 inserted into the reaction part 22a in the source gas atmosphere is subjected to CV by the reaction region 25a of the substrate heating device 25 before reaching the next slow cooling part 22c.
The SC body material gas, which is continuously heated at the reaction temperature D, reacts on the heated long substrate 32, and the long substrate 3
An SC layer is deposited on top of 2. Further, the long substrate 32 on which the SC layer is deposited is sent to the slow cooling unit 22c and is gradually cooled by the slow cooling region 25c of the substrate heating device 25.

【0020】なお、本発明に係わるCVD反応装置を用
いてSC体を製造する際において好適なSC体原料とし
ては、例えばY−Ba−Cu−O系のSC体を作製する
際は、Y-ビス-2,2,6,6-テトラメチル-3,5-ヘプタンジ
オナート(略称:Y(DPM)3)やBa-ビス-2,2,6,6
-テトラメチル-3,5-ヘプタンジオナート(略称:Ba
(DPM)2)やCu-ビス-2,2,6,6-テトラメチル-3,5-
ヘプタンジオナート(略称:Cu(DPM)2)などの
SC体原料が好適である。
A suitable SC body material for producing an SC body using the CVD reactor according to the present invention is, for example, a Y-Ba-Cu-O-based SC body prepared by using Y- Bis-2,2,6,6-tetramethyl-3,5-heptanedionate (abbreviation: Y (DPM) 3 ) and Ba-bis-2,2,6,6
-Tetramethyl-3,5-heptanedionate (abbreviation: Ba)
(DPM) 2 ) and Cu-bis-2,2,6,6-tetramethyl-3,5-
SC body raw materials such as heptane dionate (abbreviation: Cu (DPM) 2 ) are suitable.

【0021】(実験例1)上述した実施例のCVD反応
装置21を用いてSC体を作製した。まず、原料ガス供
給装置23から反応部22a内に、Y(DPM)3、B
a(DPM)2、Cu(DPM)2より成るSC体原料ガ
スを導入するとともに、不活性ガス供給装置29により
予熱部22bおよび徐冷部22c内にアルゴンガスを供
給した。同時に排気ポンプ24により2つのガス排出口
30,30から所定の速度で反応部22a内のガスと予
熱部22bおよび徐冷部22c内のガスを排気し、反応
部22a内を原料ガス雰囲気とし、予熱部22bおよび
徐冷部22c内をアルゴンガス雰囲気とした。次に、上
述した操作に従って、長さ1m、幅5mm、厚さ0.1
mmの長尺のハステロイC−276を予熱部22b→反
応部22a→徐冷部22cの順で通過させ、上記長尺ハ
ステロイ上にSC層が蒸着されたSC体を作製した。な
お、上記ハステロイの移動速度は1m/hとし、また、
基板加熱装置25のヒータ34の加熱温度を850℃と
し、冷却装置35,35の冷却温度を30とした。
(Experimental Example 1) An SC body was produced by using the CVD reactor 21 of the above-mentioned embodiment. First, from the source gas supply device 23, Y (DPM) 3 , B is introduced into the reaction part 22a.
The SC body material gas composed of a (DPM) 2 and Cu (DPM) 2 was introduced, and the inert gas supply device 29 supplied the argon gas into the preheating section 22b and the slow cooling section 22c. At the same time, the gas in the reaction part 22a and the gas in the preheating part 22b and the slow cooling part 22c are exhausted from the two gas outlets 30, 30 at a predetermined speed by the exhaust pump 24, and the inside of the reaction part 22a is made into a raw material gas atmosphere, The inside of the preheating part 22b and the slow cooling part 22c was made into an argon gas atmosphere. Next, according to the above-mentioned operation, the length is 1 m, the width is 5 mm, and the thickness is 0.1.
mm long Hastelloy C-276 was passed in the order of preheating section 22b → reaction section 22a → slow cooling section 22c to prepare an SC body in which an SC layer was vapor-deposited on the above long Hastelloy. The moving speed of the Hastelloy is 1 m / h, and
The heating temperature of the heater 34 of the substrate heating device 25 was set to 850 ° C., and the cooling temperature of the cooling devices 35 and 35 was set to 30.

【0022】上記操作により、長尺ハステロイ基板上
に、Y−Ba−Cu−O系SC層が形成された長尺SC
体を作製した。また、得られた長尺SC体のSC層は、
約10μmの膜厚で、また、X線回折によりそのSC膜
組成を調べてみたところ、その組成は均一であった。ま
た、その長尺SC体の臨界温度は、85K以上であり、
臨界電流密度は、5000A/cm2(at77K,0
T)であった。
By the above operation, a long SC having a Y-Ba-Cu-O system SC layer formed on a long Hastelloy substrate.
The body was made. Also, the SC layer of the obtained long SC body is
When the SC film composition was examined by X-ray diffraction at a film thickness of about 10 μm, the composition was uniform. Also, the critical temperature of the long SC body is 85 K or higher,
The critical current density is 5000 A / cm 2 (at 77K, 0
T).

【0023】[0023]

【発明の効果】以上述べたように、本発明のCVD反応
装置にあっては、加熱手段を、上記原料ガスを化学反応
せしめて上記基体表面に生成物を堆積させる反応温度に
該基体を加熱する反応領域と、該反応領域の基体移動方
向前方側に設けられ、上記基体が該反応領域に達するま
でに該反応温度となるように該基体を漸次加熱する予熱
領域と、該反応領域の基体移動方向後方側に設けられ、
反応温度に加熱された該基体を徐冷する徐冷領域とを備
えてなる構成としたので、基体を反応チャンバ内の反応
領域に導入する際、あるいは反応領域から搬出する際
に、該基体に起こる温度変化を緩やかにすることがで
き、これにより、この温度変化に起因して基体あるいは
この基体に蒸着された薄膜に発生する膨張あるいは収縮
等のストレスが軽減される。従って、上記ストレスによ
り引き起こされる、基体の成膜面への起伏の発生や、基
体上に蒸着した薄膜へのクラックの発生を抑制すること
ができ、例えば、本発明のCVD反応装置を用いてSC
体を作製すると、臨界電流密度、臨界温度の高い良質の
SC体が得られる。
As described above, in the CVD reactor of the present invention, the heating means heats the substrate to a reaction temperature at which the raw material gas is chemically reacted to deposit the product on the surface of the substrate. Reaction region, a preheating region provided on the front side of the reaction region in the moving direction of the substrate, and a preheating region for gradually heating the substrate so that the substrate reaches the reaction temperature before reaching the reaction region, and the substrate of the reaction region. Provided on the rear side in the moving direction,
Since the structure is provided with a slow cooling region for gradually cooling the substrate heated to the reaction temperature, when the substrate is introduced into the reaction region in the reaction chamber or is carried out from the reaction region, The temperature change that occurs can be moderated, and this reduces the stress such as expansion or contraction that occurs in the substrate or the thin film deposited on the substrate due to this temperature change. Therefore, it is possible to suppress the occurrence of undulations on the film formation surface of the substrate and the generation of cracks in the thin film deposited on the substrate, which are caused by the above-mentioned stress. For example, using the CVD reactor of the present invention, SC
When the body is manufactured, a high-quality SC body having a high critical current density and a high critical temperature can be obtained.

【0024】また、反応チャンバ内に、上記反応領域両
端部に近接する遮蔽手段を設け、該反応チャンバ内を反
応部と予熱部と徐冷部とに分割し、かつ該予熱部及び該
徐冷部内に不活性ガスを送り込む不活性ガス供給手段を
設けた構成としたので、反応部のみに原料ガスが供給さ
れ、予熱部及び徐冷部内には不活性ガスが供給される。
このため、良好な薄膜が得られない不十分な加熱条件で
ある予熱領域並びに徐冷領域などの領域上では成膜が行
われないので、基体上に不良な薄膜が成膜されるなどの
不都合が防止される。従って、例えば、本発明のCVD
反応装置を用いてSC体を作製すると、臨界電流密度、
臨界温度の高い良質のSC体が得られる。
Further, a shielding means is provided in the reaction chamber in the vicinity of both ends of the reaction region, the reaction chamber is divided into a reaction section, a preheating section and a slow cooling section, and the preheating section and the slow cooling section are provided. Since the inert gas supply means for feeding the inert gas is provided in the section, the raw material gas is supplied only to the reaction section, and the inert gas is supplied to the preheating section and the slow cooling section.
For this reason, since a film is not formed on a region such as a preheating region and a gradual cooling region, which is an insufficient heating condition where a good thin film cannot be obtained, there is a problem that a defective thin film is formed on the substrate. Is prevented. Thus, for example, the CVD of the present invention
When an SC body is produced using a reactor, the critical current density,
A good quality SC body with a high critical temperature can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明のCVD反応装置の一実施例を示す図
である。
FIG. 1 is a diagram showing an embodiment of a CVD reaction apparatus of the present invention.

【図2】 従来のCVD反応装置の第1例を示す図であ
る。
FIG. 2 is a diagram showing a first example of a conventional CVD reactor.

【符号の説明】[Explanation of symbols]

21…CVD反応装置、22…反応チャンバ、22a…
反応部、22b予熱部、22c…徐冷部、23…原料ガ
ス供給装置、24…排気ポンプ、25…基板加熱装置、
25a…反応領域、25b…予熱領域、25c…徐冷領
域、26…基板移送装置、27…仕切部材、29…不活
性ガス供給装置、32…長尺基板
21 ... CVD reactor, 22 ... Reaction chamber, 22a ...
Reaction part, 22b preheating part, 22c ... slow cooling part, 23 ... raw material gas supply device, 24 ... exhaust pump, 25 ... substrate heating device,
25a ... Reaction region, 25b ... Preheating region, 25c ... Slow cooling region, 26 ... Substrate transfer device, 27 ... Partition member, 29 ... Inert gas supply device, 32 ... Long substrate

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 39/24 ZAA B 8728−4M // H01B 12/06 ZAA 8936−5G H01L 21/31 B 8518−4M (72)発明者 香川 昭 東京都江東区木場一丁目5番1号 藤倉電 線株式会社内 (72)発明者 河野 宰 東京都江東区木場一丁目5番1号 藤倉電 線株式会社内 (72)発明者 佐治 明 愛知県名古屋市緑区大高町字北関山20番地 の1 中部電力株式会社電力技術研究所内 (72)発明者 黒田 昇 愛知県名古屋市緑区大高町字北関山20番地 の1 中部電力株式会社電力技術研究所内 (72)発明者 吉田 弘 愛知県名古屋市緑区大高町字北関山20番地 の1 中部電力株式会社電力技術研究所内─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 5 Identification number Office reference number FI technical display location H01L 39/24 ZAA B 8728-4M // H01B 12/06 ZAA 8936-5G H01L 21/31 B 8518 -4M (72) Inventor Akira Kagawa 1-5-1, Kiba, Koto-ku, Tokyo Within Fujikura Electric Line Co., Ltd. (72) Inventor, Satoshi Kono 1-5-1, Kiba, Koto-ku, Tokyo Inside Fujikura Electric Line Co., Ltd. (72) Inventor Akira Saji 1 20-20 Kitasekiyama, Otaka-cho, Midori-ku, Aichi Prefecture Chubu Electric Power Co., Inc. Electric Power Research Laboratory (72) Inventor Noboru Kuroda Kita-kanzan, Otaka-cho, Midori-ku, Nagoya City, Aichi Prefecture No. 20 1 Chubu Electric Power Co., Inc. Electric Power Research Laboratory (72) Inventor Hiroshi Yoshida Kitakanyama, Otaka-cho, Midori-ku, Aichi Prefecture Nagoya No. 20 No. 1 Chubu Electric Power Co., Electric Power Research Laboratory

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 原料化合物ガス等の原料ガスを化学反応
せしめて基体表面に生成物を堆積させるCVD反応を行
う横長型の反応チャンバと、該反応チャンバ内に原料ガ
スを供給する原料ガス供給手段と、該反応チャンバ内の
ガスを排気するガス排気手段と、長尺の基体を該反応チ
ャンバの長手方向に沿って一方側に移動させる基体移動
手段と、該反応チャンバ内に配設された横長型の加熱手
段とを備えたCVD反応装置であって、前記加熱手段
は、上記原料ガスを化学反応せしめて上記基体表面に生
成物を堆積させる反応温度に該基体を加熱する反応領域
と、該反応領域の基体移動方向前方側に設けられ、上記
基体が該反応領域に達するまでに該反応温度となるよう
に該基体を漸次加熱する予熱領域と、該反応領域の基体
移動方向後方側に設けられ、反応温度に加熱された該基
体を徐冷する徐冷領域とを備えてなり、該反応チャンバ
内に、上記反応領域両端部に近接する遮蔽手段を設け、
該反応チャンバ内を反応部と予熱部と徐冷部とに分割
し、かつ該予熱部及び該徐冷部内に不活性ガスを送り込
む不活性ガス供給手段を設けたことを特徴とするCVD
反応装置。
1. A horizontally long reaction chamber for performing a CVD reaction in which a raw material gas such as a raw material compound gas is chemically reacted to deposit a product on a substrate surface, and a raw material gas supply means for supplying the raw material gas into the reaction chamber. A gas exhaust means for exhausting the gas in the reaction chamber, a substrate moving means for moving a long substrate to one side along the longitudinal direction of the reaction chamber, and a horizontally long substrate arranged in the reaction chamber. And a reaction region for heating the substrate to a reaction temperature at which the raw material gas is chemically reacted to deposit a product on the surface of the substrate. A preheating region that is provided on the front side of the reaction region in the moving direction of the substrate and that gradually heats the substrate so that the substrate reaches the reaction temperature before reaching the reaction region, and a rear side of the reaction region in the moving direction of the substrate. And a gradual cooling region for gradual cooling of the substrate heated to the reaction temperature, wherein a shielding means is provided in the reaction chamber in proximity to both ends of the reaction region.
A CVD method characterized in that the inside of the reaction chamber is divided into a reaction part, a preheating part and a slow cooling part, and an inert gas supply means for feeding an inert gas into the preheating part and the slow cooling part is provided.
Reactor.
JP03222269A 1991-08-07 1991-08-07 CVD reactor Expired - Lifetime JP3127011B2 (en)

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JPH0544043A true JPH0544043A (en) 1993-02-23
JP3127011B2 JP3127011B2 (en) 2001-01-22

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Country Status (1)

Country Link
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